Artículos de revistas sobre el tema "Reference-free X-ray fluorescence"
Crea una cita precisa en los estilos APA, MLA, Chicago, Harvard y otros
Consulte los 28 mejores artículos de revistas para su investigación sobre el tema "Reference-free X-ray fluorescence".
Junto a cada fuente en la lista de referencias hay un botón "Agregar a la bibliografía". Pulsa este botón, y generaremos automáticamente la referencia bibliográfica para la obra elegida en el estilo de cita que necesites: APA, MLA, Harvard, Vancouver, Chicago, etc.
También puede descargar el texto completo de la publicación académica en formato pdf y leer en línea su resumen siempre que esté disponible en los metadatos.
Explore artículos de revistas sobre una amplia variedad de disciplinas y organice su bibliografía correctamente.
Wählisch, André, Cornelia Streeck, Philipp Hönicke y Burkhard Beckhoff. "Validation of secondary fluorescence excitation in quantitative X-ray fluorescence analysis of thin alloy films". Journal of Analytical Atomic Spectrometry 35, n.º 8 (2020): 1664–70. http://dx.doi.org/10.1039/d0ja00171f.
Texto completoBeckhoff, B., M. Kolbe, O. Hahn, A. G. Karydas, Ch Zarkadas, D. Sokaras y M. Mantler. "Reference-free x-ray fluorescence analysis of an ancient Chinese ceramic". X-Ray Spectrometry 37, n.º 4 (julio de 2008): 462–65. http://dx.doi.org/10.1002/xrs.1073.
Texto completoUnterumsberger, Rainer, Philipp Hönicke, Yves Kayser, Beatrix Pollakowski-Herrmann, Saeed Gholhaki, Quanmin Guo, Richard E. Palmer y Burkhard Beckhoff. "Interaction of nanoparticle properties and X-ray analytical techniques". Journal of Analytical Atomic Spectrometry 35, n.º 5 (2020): 1022–33. http://dx.doi.org/10.1039/d0ja00049c.
Texto completoUnterumsberger, Rainer, Philipp Hönicke, Julien L. Colaux, Chris Jeynes, Malte Wansleben, Matthias Müller y Burkhard Beckhoff. "Accurate experimental determination of gallium K- and L3-shell XRF fundamental parameters". Journal of Analytical Atomic Spectrometry 33, n.º 6 (2018): 1003–13. http://dx.doi.org/10.1039/c8ja00046h.
Texto completoSoltwisch, Victor, Philipp Hönicke, Yves Kayser, Janis Eilbracht, Jürgen Probst, Frank Scholze y Burkhard Beckhoff. "Element sensitive reconstruction of nanostructured surfaces with finite elements and grazing incidence soft X-ray fluorescence". Nanoscale 10, n.º 13 (2018): 6177–85. http://dx.doi.org/10.1039/c8nr00328a.
Texto completoCara, Eleonora, Luisa Mandrile, Alessio Sacco, Andrea M. Giovannozzi, Andrea M. Rossi, Federica Celegato, Natascia De Leo et al. "Towards a traceable enhancement factor in surface-enhanced Raman spectroscopy". Journal of Materials Chemistry C 8, n.º 46 (2020): 16513–19. http://dx.doi.org/10.1039/d0tc04364h.
Texto completoKolbe, Michael, Burkhard Beckhoff, Michael Krumrey y Gerhard Ulm. "Comparison of reference-free X-ray fluorescence analysis and X-ray reflectometry for thickness determination in the nanometer range". Applied Surface Science 252, n.º 1 (septiembre de 2005): 49–52. http://dx.doi.org/10.1016/j.apsusc.2005.01.112.
Texto completoBeckhoff, Burkhard, Rolf Fliegauf, Michael Kolbe, Matthias Müller, Jan Weser y Gerhard Ulm. "Reference-Free Total Reflection X-ray Fluorescence Analysis of Semiconductor Surfaces with Synchrotron Radiation". Analytical Chemistry 79, n.º 20 (octubre de 2007): 7873–82. http://dx.doi.org/10.1021/ac071236p.
Texto completoReinhardt, Falk, János Osán, Szabina Török, Andrea Edit Pap, Michael Kolbe y Burkhard Beckhoff. "Reference-free quantification of particle-like surface contaminations by grazing incidence X-ray fluorescence analysis". J. Anal. At. Spectrom. 27, n.º 2 (2012): 248–55. http://dx.doi.org/10.1039/c2ja10286b.
Texto completoKolbe, M., B. Beckhoff, M. Krumrey y G. Ulm. "F15 Thickness Determination of Copper and Nickel Nanolayers: Comparison of Completely Reference-Free X-ray Fluorescence Analysis and X-ray Reflectometry". Powder Diffraction 20, n.º 2 (junio de 2005): 174. http://dx.doi.org/10.1154/1.1979030.
Texto completoKolbe, Michael, Burkhard Beckhoff, Michael Krumrey, Michael A. Reading, Jaap Van den Berg, Thierry Conard y Stefan De Gendt. "Characterisation of High-k Containing Nanolayers by Reference-Free X-Ray Fluorescence Analysis with Synchrotron Radiation". ECS Transactions 25, n.º 3 (17 de diciembre de 2019): 293–300. http://dx.doi.org/10.1149/1.3204419.
Texto completoKolbe, Michael, Burkhard Beckhoff, Michael Krumrey y Gerhard Ulm. "Thickness determination for Cu and Ni nanolayers: Comparison of completely reference-free fundamental parameter-based X-ray fluorescence analysis and X-ray reflectometry". Spectrochimica Acta Part B: Atomic Spectroscopy 60, n.º 4 (abril de 2005): 505–10. http://dx.doi.org/10.1016/j.sab.2005.03.018.
Texto completoNoro, Junji, Takashi Korenaga, Masaru Kozaki, Satoshi Kawada, Kazuhiko Kurusu, Manabu Mizuhira, Akihiro Ono et al. "Development of Lead-Free Solder Alloy Certified Reference Materials (JSAC 0131-0134) for X-Ray Fluorescence Analysis". BUNSEKI KAGAKU 59, n.º 2 (2010): 107–16. http://dx.doi.org/10.2116/bunsekikagaku.59.107.
Texto completoHönicke, Philipp, Ina Holfelder, Michael Kolbe, Janin Lubeck, Beatrix Pollakowski-Herrmann, Rainer Unterumsberger, Jan Weser y Burkhard Beckhoff. "Determination of SiO2and C layers on a monocrystalline silicon sphere by reference-free x-ray fluorescence analysis". Metrologia 54, n.º 4 (28 de junio de 2017): 481–86. http://dx.doi.org/10.1088/1681-7575/aa765f.
Texto completoHönicke, Philipp, Blanka Detlefs, Matthias Müller, Erik Darlatt, Emmanuel Nolot, Helen Grampeix y Burkhard Beckhoff. "Reference-free, depth-dependent characterization of nanolayers and gradient systems with advanced grazing incidence X-ray fluorescence analysis". physica status solidi (a) 212, n.º 3 (4 de febrero de 2015): 523–28. http://dx.doi.org/10.1002/pssa.201400204.
Texto completoStreeck, C., B. Beckhoff, F. Reinhardt, M. Kolbe, B. Kanngießer, C. A. Kaufmann y H. W. Schock. "Elemental depth profiling of Cu(In,Ga)Se2 thin films by reference-free grazing incidence X-ray fluorescence analysis". Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 268, n.º 3-4 (febrero de 2010): 277–81. http://dx.doi.org/10.1016/j.nimb.2009.09.051.
Texto completoLopez-Astacio, Hiram J., Lisandro Cunci y Christopher Pollock. "Development and Improvement of an Electrochemical Cell for X-Ray Fluorescence and Absorption Spectroscopy". ECS Meeting Abstracts MA2022-02, n.º 60 (9 de octubre de 2022): 2472. http://dx.doi.org/10.1149/ma2022-02602472mtgabs.
Texto completoHönicke, Philipp, Blanka Detlefs, Emmanuel Nolot, Yves Kayser, Uwe Mühle, Beatrix Pollakowski y Burkhard Beckhoff. "Reference-free grazing incidence x-ray fluorescence and reflectometry as a methodology for independent validation of x-ray reflectometry on ultrathin layer stacks and a depth-dependent characterization". Journal of Vacuum Science & Technology A 37, n.º 4 (julio de 2019): 041502. http://dx.doi.org/10.1116/1.5094891.
Texto completoWendeln, Christian, Edith Steinhäuser, Lutz Stamp, Bexy Dosse-Gomez, Elisa Langhammer, Sebastian Reiber, Sebastian Dünnebeil y Sandra Röseler. "Novel formaldehyde-free electroless copper for plating on next-generation substrates". International Symposium on Microelectronics 2018, n.º 1 (1 de octubre de 2018): 000628–33. http://dx.doi.org/10.4071/2380-4505-2018.1.000628.
Texto completoDemirsar Arli, Belgin, Gulsu Simsek Franci, Sennur Kaya, Hakan Arli y Philippe Colomban. "Portable X-ray Fluorescence (p-XRF) Uncertainty Estimation for Glazed Ceramic Analysis: Case of Iznik Tiles". Heritage 3, n.º 4 (10 de noviembre de 2020): 1302–29. http://dx.doi.org/10.3390/heritage3040072.
Texto completoAffoué Delphine KOUASSI, Fatou Diane Micheline BAGUIA-BROUNE, Kohué Christelle Chantal N’GAMAN-KOUASSI, Janat Akhanovna MAMYRBEKOVA-BEKRO y Yves-Alain BEKRO. "Mineral and phenolic compositions, antioxidant activity and GC-MS analysis of the leaves of Anchomanes difformis (Blume) Engl. from Côte d’Ivoire". GSC Advanced Research and Reviews 10, n.º 1 (30 de enero de 2022): 145–55. http://dx.doi.org/10.30574/gscarr.2022.10.1.0035.
Texto completoSomlyo, A. P. "Where Art Thou, Calcium?" Microscopy and Microanalysis 3, S2 (agosto de 1997): 913–14. http://dx.doi.org/10.1017/s1431927600011454.
Texto completoSichov, Mikhail, Kostiantyn Boriak y Leonid Kolomiets. "Technology for obtaining high-pure magnesium compounds using the hydrolytic processes of sedimentation". Eastern-European Journal of Enterprise Technologies 1, n.º 6(115) (28 de febrero de 2022): 43–52. http://dx.doi.org/10.15587/1729-4061.2022.253544.
Texto completoMénesguen, Yves y Marie-Christine Lépy. "Reference‐Free Combined X‐Ray Reflectometry−Grazing Incidence X‐Ray Fluorescence at the French Synchrotron SOLEIL". physica status solidi (a), 8 de agosto de 2021, 2100423. http://dx.doi.org/10.1002/pssa.202100423.
Texto completo"Nanolayer Characterisation by Reference-free X-ray Fluorescence Analysis with Synchrotron Radiation". ECS Meeting Abstracts, 2009. http://dx.doi.org/10.1149/ma2009-02/22/1975.
Texto completoZech, Claudia, Marco Evertz, Markus Börner, Yves Kayser, Philipp Hönicke, Martin Winter, Sascha Nowak y Burkhard Beckhoff. "Quantitative manganese dissolution investigation in lithium-ion batteries by means of X-ray spectrometry techniques". Journal of Analytical Atomic Spectrometry, 2021. http://dx.doi.org/10.1039/d0ja00491j.
Texto completoTack, Pieter, Ella De Pauw, Beverley Tkalcec, Miles Lindner, Benjamin Bazi, Bart Vekemans, Frank Brenker et al. "Rare earth element identification and quantification in millimetre-sized Ryugu rock fragments from the Hayabusa2 space mission". Earth, Planets and Space 74, n.º 1 (28 de septiembre de 2022). http://dx.doi.org/10.1186/s40623-022-01705-3.
Texto completoJones, Cerys, Nathan S. Daly, Catherine Higgitt y Miguel R. D. Rodrigues. "Neural network-based classification of X-ray fluorescence spectra of artists’ pigments: an approach leveraging a synthetic dataset created using the fundamental parameters method". Heritage Science 10, n.º 1 (13 de junio de 2022). http://dx.doi.org/10.1186/s40494-022-00716-3.
Texto completo