Libros sobre el tema "Metrology of electromagnetism"
Crea una cita precisa en los estilos APA, MLA, Chicago, Harvard y otros
Consulte los 18 mejores mejores libros para su investigación sobre el tema "Metrology of electromagnetism".
Junto a cada fuente en la lista de referencias hay un botón "Agregar a la bibliografía". Pulsa este botón, y generaremos automáticamente la referencia bibliográfica para la obra elegida en el estilo de cita que necesites: APA, MLA, Harvard, Vancouver, Chicago, etc.
También puede descargar el texto completo de la publicación académica en formato pdf y leer en línea su resumen siempre que esté disponible en los metadatos.
Explore libros sobre una amplia variedad de disciplinas y organice su bibliografía correctamente.
G, Bradford Ann y National Institute of Standards and Technology (U.S.), eds. Metrology for electromagnetic technology: A bibliography of NIST publications. Washington, DC: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1997.
Buscar texto completoInternational Symposium on Electromagnetic Metrology (1989 Beijing, China). Electromagnetic metrology: Proceedings of International Symposium on Electromagnetic Metrology, ISEM '89, August 19-22, 1989, Beijing, China. Beijing: International Academic Publishers, 1989.
Buscar texto completoMotohisa, Kanda y United States. National Bureau of Standards, eds. Electromagnetic compatibility and interference metrology: M.T. Ma, M. Kanda. Gaithersburg, Md: National Bureau of Standards, 1986.
Buscar texto completoE, DeWeese Mary y National Institute of Standards and Technology (U.S.), eds. Metrology for electromagnetic technology: A bibliography of NIST publications. Boulder, Colo: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1991.
Buscar texto completoE, Bailey A. y International Union of Radio Science., eds. URSI register of national standards laboratories for electromagnetic metrology. Bristol: A. Hilger, 1990.
Buscar texto completoE, DeWeese Mary y United States. National Bureau of Standards, eds. Metrology for electromagnetic technology: A bibliography of NBS publications. Boulder, Colo: U.S. Dept. of Commerce, National Bureau of Standards, 1988.
Buscar texto completoM, Butler Chalmers y National Institute of Standards and Technology (U.S.), eds. EMI/EMC metrology challenges for industry: A workshop on measurements, standards, calibrations, and accreditation. Boulder, Colo: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1997.
Buscar texto completoNational Institute of Standards and Technology (U.S.), ed. METROLOGY FOR ELECTROMAGNETIC TECHNOLOGY: A BIBLIOGRAPHY OF NIST PUBLICATIONS... NIST 5064 ... U.S. DEPARTMENT OF COMMERCE... 1997. [S.l: s.n., 1998.
Buscar texto completoElectromagnetic compatibility and interference metrology. Gaithersburg, Md: National Bureau of Standards, 1986.
Buscar texto completoBeijing, China) International Symposium on Electromagnetic Metrology (1989 :. Electromagnetic Metrology: Proceedings of International Symposium on Electromagnetic Metrology, Isem '89, August 19-22, 1989 Beijing, China. International Academic Publishers, 1990.
Buscar texto completoBeijing, China) International Symposium on Electromagnetic Metrology (1989 :. Electromagnetic Metrology: Proceedings of International Symposium on Electromagnetic Metrology, Isem '89, August 19-22, 1989 Beijing, China. International Academic Publishers, 1990.
Buscar texto completoMetrology for electromagnetic technology: A bibliography of NIST publications. Boulder, Colo: U.S. Dept. of Commerce, National Institute of Standards, 1989.
Buscar texto completoMetrology for electromagnetic technology: A bibliography of NBS publications. [Washington, D.C.]: U.S. Dept. of Commerce, National Bureau of Standards, 1987.
Buscar texto completoBuchwald, Jed Z. y Robert Fox, eds. The Oxford Handbook of the History of Physics. Oxford University Press, 2017. http://dx.doi.org/10.1093/oxfordhb/9780199696253.001.0001.
Texto completoHami, Abdelkhalak El, Philippe Pougnet y Pierre-Richard Dahoo. Applications and Metrology at Nanometer Scale 1: Smart Materials, Electromagnetic Waves and Uncertainties. Wiley & Sons, Incorporated, John, 2021.
Buscar texto completoHami, Abdelkhalak El, Philippe Pougnet y Pierre-Richard Dahoo. Applications and Metrology at Nanometer Scale 1: Smart Materials, Electromagnetic Waves and Uncertainties. Wiley & Sons, Incorporated, John, 2021.
Buscar texto completoHami, Abdelkhalak El, Philippe Pougnet y Pierre-Richard Dahoo. Applications and Metrology at Nanometer Scale 1: Smart Materials, Electromagnetic Waves and Uncertainties. Wiley & Sons, Incorporated, John, 2021.
Buscar texto completoHami, Abdelkhalak El, Philippe Pougnet y Pierre-Richard Dahoo. Applications and Metrology at Nanometer Scale 1: Smart Materials, Electromagnetic Waves and Uncertainties. Wiley & Sons, Incorporated, John, 2021.
Buscar texto completo