Literatura académica sobre el tema "Long-term electrical reliability"
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Artículos de revistas sobre el tema "Long-term electrical reliability"
Xie, Jingsong, Ming Sun, Michael Pecht y David F. Barbe. "Why Gold Flash Can Be Detrimental to Long-Term Reliability". Journal of Electronic Packaging 126, n.º 1 (1 de marzo de 2004): 37–40. http://dx.doi.org/10.1115/1.1646425.
Texto completoLenner, Miklos, Andreas Frank, Lin Yang, Tomas Mikael Roininen y Klaus Bohnert. "Long-Term Reliability of Fiber-Optic Current Sensors". IEEE Sensors Journal 20, n.º 2 (15 de enero de 2020): 823–32. http://dx.doi.org/10.1109/jsen.2019.2944346.
Texto completoPeterson, D. K., M. L. Nochomovitz, T. A. Stellato y J. T. Mortimer. "Long-term intramuscular electrical activation of the phrenic nerve: safety and reliability". IEEE Transactions on Biomedical Engineering 41, n.º 12 (1994): 1115–26. http://dx.doi.org/10.1109/10.335860.
Texto completoMiyake, Takuma, Yoshihiro Arata, Tatsuya Sakoda, Masahisa Otsubo, Yasufumi Sonoda y Hiroshi Yamaguchi. "Assessing Long-term Reliability of Polymeric Housing Materials". IEEJ Transactions on Power and Energy 131, n.º 6 (2011): 530–31. http://dx.doi.org/10.1541/ieejpes.131.530.
Texto completoPlumbridge, W. J. "Long term mechanical reliability with lead‐free solders". Soldering & Surface Mount Technology 16, n.º 2 (agosto de 2004): 13–20. http://dx.doi.org/10.1108/09540910410537291.
Texto completoKim, Bal-Ho H. "A Study on Reliability Differentiated Pricing of Long-Term Transactions". Journal of Electrical Engineering and Technology 6, n.º 1 (1 de enero de 2011): 8–13. http://dx.doi.org/10.5370/jeet.2011.6.1.008.
Texto completoGolovanov, Igor', Pavel Maslihov, Uulu Turatbek y Natal'ya Bel'dyagina. "STUDY OF THE RELIABILITY OF ELECTRICAL EQUIPMENT OF THE ELECTRICAL POWER SUPPLY SYSTEM, HAVING A LARGE PERIOD OF WORKING". Bulletin of the Angarsk State Technical University 1, n.º 12 (18 de diciembre de 2018): 29–31. http://dx.doi.org/10.36629/2686-777x-2018-1-12-29-31.
Texto completoPecht, Judy, Michael Pecht y Anthony J. Rafanelli. "Long-Term Non-Operating Reliability of Electronic Products". Journal of Electronic Packaging 119, n.º 2 (1 de junio de 1997): 145–46. http://dx.doi.org/10.1115/1.2792222.
Texto completoMatsumoto, Michito, Tadashi Haibara, Yutaka Katsuyama, Masamitsu Tokuda, Tadatoshi Tanifuji, Regular Members y Mitsuru Miyauchi, Regular Member. "Long-term reliability assurance for arc-fusion spliced fiber". Electronics and Communications in Japan (Part I: Communications) 68, n.º 2 (febrero de 1985): 73–81. http://dx.doi.org/10.1002/ecja.4410680210.
Texto completoKaga, T. y T. Hagiwara. "Short- and long-term reliability of nitrided oxide MISFETs". IEEE Transactions on Electron Devices 35, n.º 7 (julio de 1988): 929–34. http://dx.doi.org/10.1109/16.3347.
Texto completoLibros sobre el tema "Long-term electrical reliability"
F, Nelson C., Sandia National Laboratories y U.S. Nuclear Regulatory Commission. Office of Nuclear Regulatory Research. Division of Engineering Technology., eds. Long-term aging and loss-of-coolant accident (LOCA) testing of electrical cables: U.S./French Cooperative Research Program. Washington, DC: U.S. Nuclear Regulatory Commission, 1996.
Buscar texto completoPowers, Charles E. Long-term life testing of geostationary operational environmental satellite (GOES) encoder lamps. [Washington, DC]: National Aeronautics and Space Administration, Office of Management, Scientific and Technical Information Program, 1992.
Buscar texto completoPowers, Charles E. Long-term life testing of geostationary operational environmental satellite (GOES) encoder lamps. [Washington, DC]: National Aeronautics and Space Administration, Office of Management, Scientific and Technical Information Program, 1992.
Buscar texto completoPowers, Charles E. Long-term life testing of Geostationary Operational Environmental Satellite (GOES) encoder lamps. Greenbelt, Md: Goddard Space Flight Center, 1992.
Buscar texto completoPowers, Charles E. Long-term life testing of geostationary operational environmental satellite (GOES) encoder lamps. Washington, D.C: National Aeronautics and Space Administration, Office of Management, Scientific and Technical Information Program, 1992.
Buscar texto completoPowers, Charles E. Long-term life testing of geostationary operational environmental satellite (GOES) encoder lamps. National Aeronautics and Space Administration, Office of Management, Scientific and Technical Information Program, 1992.
Buscar texto completoCapítulos de libros sobre el tema "Long-term electrical reliability"
Pecht, Judy y Michael Pecht. "Electrical Failure Mechanisms". En Long-Term Non-Operating Reliability of Electronic Products, 23–28. CRC Press, 2019. http://dx.doi.org/10.1201/9781351074179-3.
Texto completoSovcik, Michal, Lukas Nagy, Viera Stopjakova y Daniel Arbet. "Digital On-Chip Calibration of Analog Systems towards Enhanced Reliability". En Practical Applications in Reliability Engineering. IntechOpen, 2021. http://dx.doi.org/10.5772/intechopen.96609.
Texto completoQamber, Isa S. y Mohamed Y. Alhamad. "Smart Grid-Integrated Electric Vehicle Charging Infrastructure". En Developing Charging Infrastructure and Technologies for Electric Vehicles, 1–24. IGI Global, 2022. http://dx.doi.org/10.4018/978-1-7998-6858-3.ch001.
Texto completoWang, Lizhi y Nan Kong. "Security Constrained Economic Dispatch". En Innovations in Information Systems for Business Functionality and Operations Management, 306–21. IGI Global, 2012. http://dx.doi.org/10.4018/978-1-4666-0933-4.ch018.
Texto completoActas de conferencias sobre el tema "Long-term electrical reliability"
Heo, J. H., H. G. Park, E. C. Lee, C. S. Oh, S. W. Kim, S. W. Lee, J. S. Lim, K. H. Lee y S. H. Choi. "Evaluation of long-term reliability of power cable including nano-conductive layer". En 2017 International Symposium on Electrical Insulating Materials (ISEIM). IEEE, 2017. http://dx.doi.org/10.23919/iseim.2017.8166572.
Texto completoNakanishi, Takahiro, Ken Suzuki y Hideo Miura. "Improvement of the Long-Term Reliability of Interconnection by Controlling the Crystallinity of Grain Boundaries". En ASME 2015 International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems collocated with the ASME 2015 13th International Conference on Nanochannels, Microchannels, and Minichannels. American Society of Mechanical Engineers, 2015. http://dx.doi.org/10.1115/ipack2015-48200.
Texto completoWood, R. A. y T. E. Salem. "Long-term operation and reliability study of a 1200-V, 880-A all-SiC dual module". En 2012 International Symposium on Power Electronics, Electrical Drives, Automation and Motion (SPEEDAM 2012). IEEE, 2012. http://dx.doi.org/10.1109/speedam.2012.6264530.
Texto completoRuiz Flores, Luis Ivan, Rafael Castellanos Bustamante y Jorge Guillermo Calderon Guizar. "Operational Reliability and Modernization of Refineries in Mexico: How?, Why? and Where?" En ASME 2016 Power Conference collocated with the ASME 2016 10th International Conference on Energy Sustainability and the ASME 2016 14th International Conference on Fuel Cell Science, Engineering and Technology. American Society of Mechanical Engineers, 2016. http://dx.doi.org/10.1115/power2016-59146.
Texto completoHung, Tzu-Chieh y Kuei-Yuan Chan. "Probability-Based Power Dispatch in Wind-Integrated Electrical Grid for Energy Storage Capacity Determination". En ASME 2016 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference. American Society of Mechanical Engineers, 2016. http://dx.doi.org/10.1115/detc2016-59809.
Texto completoMohammedjawad Almukharriq, Ali, Ahmed Ali Khalaf, Saud Abdulaziz Alquwizani y Francis Eugene Dominguez. "A Comprehensive ESP Preventive Maintenance Program for Long-Term Reliability, Better Life Cycle and Maximum Availability". En SPE/IATMI Asia Pacific Oil & Gas Conference and Exhibition. SPE, 2021. http://dx.doi.org/10.2118/205751-ms.
Texto completoRuiz Flores, Luis Ivan y Francisco Cuauhtémoc Poujol Galván. "Reliability of Power Electric Systems in Pemex Refining: Experiences and Realities". En ASME 2014 Power Conference. American Society of Mechanical Engineers, 2014. http://dx.doi.org/10.1115/power2014-32210.
Texto completoMarzinotto, M. y G. Mazzanti. "Some hints at the combined effects of load cycles and electrothermal stress on HVDC extruded cable reliability in the long term prequalification test". En 2012 IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP 2012). IEEE, 2012. http://dx.doi.org/10.1109/ceidp.2012.6378802.
Texto completoFernandez, Charles, Shashi Bhushan Kumar, Wai Lok Woo, Rosemary Norman y Arun Kr. Dev. "Real-Time Prediction of Reliability of Dynamic Positioning Sub-Systems for Computation of Dynamic Positioning Reliability Index (DP-RI) Using Long Short Term Memory (LSTM)". En ASME 2020 39th International Conference on Ocean, Offshore and Arctic Engineering. American Society of Mechanical Engineers, 2020. http://dx.doi.org/10.1115/omae2020-18844.
Texto completoSpinner, Stefan, Michael Doelle, Patrick Ruther, Oliver Paul, Ilia Polian y Bernd Becker. "A System for Electromechanical Reliability Testing of MEMS Devices". En ISTFA 2006. ASM International, 2006. http://dx.doi.org/10.31399/asm.cp.istfa2006p0147.
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