Artículos de revistas sobre el tema "Linear integrated circuits"
Crea una cita precisa en los estilos APA, MLA, Chicago, Harvard y otros
Consulte los 50 mejores artículos de revistas para su investigación sobre el tema "Linear integrated circuits".
Junto a cada fuente en la lista de referencias hay un botón "Agregar a la bibliografía". Pulsa este botón, y generaremos automáticamente la referencia bibliográfica para la obra elegida en el estilo de cita que necesites: APA, MLA, Harvard, Vancouver, Chicago, etc.
También puede descargar el texto completo de la publicación académica en formato pdf y leer en línea su resumen siempre que esté disponible en los metadatos.
Explore artículos de revistas sobre una amplia variedad de disciplinas y organice su bibliografía correctamente.
Silva, M. M. "Linear integrated circuits". Proceedings of the IEEE 73, n.º 8 (1985): 1340. http://dx.doi.org/10.1109/proc.1985.13290.
Texto completoBARNABY, H. J. "TOTAL DOSE EFFECTS IN LINEAR BIPOLAR INTEGRATED CIRCUITS". International Journal of High Speed Electronics and Systems 14, n.º 02 (junio de 2004): 519–41. http://dx.doi.org/10.1142/s0129156404002491.
Texto completoRax, B. G., A. H. Johnston y C. I. Lee. "Proton damage effects in linear integrated circuits". IEEE Transactions on Nuclear Science 45, n.º 6 (1998): 2632–37. http://dx.doi.org/10.1109/23.736507.
Texto completoRax, B. G., A. H. Johnston y T. Miyahira. "Displacement damage in bipolar linear integrated circuits". IEEE Transactions on Nuclear Science 46, n.º 6 (1999): 1660–65. http://dx.doi.org/10.1109/23.819135.
Texto completoJantos, P., D. Grzechca y J. Rutkowski. "Evolutionary algorithms for global parametric fault diagnosis in analogue integrated circuits". Bulletin of the Polish Academy of Sciences: Technical Sciences 60, n.º 1 (1 de marzo de 2012): 133–42. http://dx.doi.org/10.2478/v10175-012-0019-4.
Texto completoAbraitis, Vidas y Žydrūnas Tamoševičius. "Transition Test Patterns Generation for BIST Implemented in ASIC and FPGA". Solid State Phenomena 144 (septiembre de 2008): 214–19. http://dx.doi.org/10.4028/www.scientific.net/ssp.144.214.
Texto completoVosper, J. V. "Book Review: Linear Integrated Circuits: Operation and Applications". International Journal of Electrical Engineering & Education 23, n.º 2 (abril de 1986): 184. http://dx.doi.org/10.1177/002072098602300223.
Texto completoJain, L. C. "Book Review: Operational Amplifiers and Linear Integrated Circuits:". International Journal of Electrical Engineering & Education 29, n.º 2 (abril de 1992): 162. http://dx.doi.org/10.1177/002072099202900212.
Texto completoBuchner, Stephen y Dale McMorrow. "Single-Event Transients in Bipolar Linear Integrated Circuits". IEEE Transactions on Nuclear Science 53, n.º 6 (diciembre de 2006): 3079–102. http://dx.doi.org/10.1109/tns.2006.882497.
Texto completoJohnston, A. H. y R. E. Plaag. "Models for Total Dose Degradation of Linear Integrated Circuits". IEEE Transactions on Nuclear Science 34, n.º 6 (1987): 1474–80. http://dx.doi.org/10.1109/tns.1987.4337502.
Texto completoSun, Zhi, Weijia Wei, Mingyue Zhang, Wenjia Shi, Yeqing Zong, Yihua Chen, Xiaojing Yang, Bo Yu, Chao Tang y Chunbo Lou. "Synthetic robust perfect adaptation achieved by negative feedback coupling with linear weak positive feedback". Nucleic Acids Research 50, n.º 4 (15 de febrero de 2022): 2377–86. http://dx.doi.org/10.1093/nar/gkac066.
Texto completoZikumaru, Yushi. "NQR Spectrometer with a Two Integrated Circuits Radio Frequency Head". Zeitschrift für Naturforschung A 45, n.º 3-4 (1 de abril de 1990): 591–94. http://dx.doi.org/10.1515/zna-1990-3-467.
Texto completoZhang, Xiao Feng, Fo Chang Xie, Guo Wei Yang y Wei Zhang. "The Transceiver Circuit Design of Digital Ultrasonic System". Advanced Materials Research 834-836 (octubre de 2013): 968–73. http://dx.doi.org/10.4028/www.scientific.net/amr.834-836.968.
Texto completoParandin, Fariborz, Saeed Olyaee, Reza Kamarian y Mohamadreza Jomour. "Design and Simulation of Linear All-Optical Comparator Based on Square-Lattice Photonic Crystals". Photonics 9, n.º 7 (29 de junio de 2022): 459. http://dx.doi.org/10.3390/photonics9070459.
Texto completoWidemann, C., S. Stegemann, W. John y W. Mathis. "Analytic investigations on the susceptibility of nonlinear analog circuits to substrate noise". Advances in Radio Science 11 (4 de julio de 2013): 171–75. http://dx.doi.org/10.5194/ars-11-171-2013.
Texto completoSingh, Jagmeet, Hugh Morison, Zhimu Guo, Bicky A. Marquez, Omid Esmaeeli, Paul R. Prucnal, Lukas Chrostowski, Sudip Shekhar y Bhavin J. Shastri. "Neuromorphic photonic circuit modeling in Verilog-A". APL Photonics 7, n.º 4 (1 de abril de 2022): 046103. http://dx.doi.org/10.1063/5.0079984.
Texto completoMukherjee, Parijat, G. Peter Fang, Rod Burt y Peng Li. "Efficient Identification of Unstable Loops in Large Linear Analog Integrated Circuits". IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 31, n.º 9 (septiembre de 2012): 1332–45. http://dx.doi.org/10.1109/tcad.2012.2194492.
Texto completoJohnston, A. H., G. M. Swift y B. G. Rax. "Total dose effects in conventional bipolar transistors and linear integrated circuits". IEEE Transactions on Nuclear Science 41, n.º 6 (diciembre de 1994): 2427–36. http://dx.doi.org/10.1109/23.340598.
Texto completoJohnston, A. H., B. G. Rax y C. I. Lee. "Enhanced damage in linear bipolar integrated circuits at low dose rate". IEEE Transactions on Nuclear Science 42, n.º 6 (1995): 1650–59. http://dx.doi.org/10.1109/23.488762.
Texto completoLubecke, V. M., W. r. McGrath, Yu-Chong Tai y D. B. Rutledge. "Microfabrication of linear translator tuning elements in submillimeter-wave integrated circuits". Journal of Microelectromechanical Systems 7, n.º 4 (1998): 404–10. http://dx.doi.org/10.1109/84.735348.
Texto completoJohnston, A. H. y B. G. Rax. "Testing and Qualifying Linear Integrated Circuits for Radiation Degradation in Space". IEEE Transactions on Nuclear Science 53, n.º 4 (agosto de 2006): 1779–86. http://dx.doi.org/10.1109/tns.2006.878291.
Texto completoLiu, Zhuang Jian, Yong Wei Zhang, Ji Zhou Song, Dae Hyeong Kim, Yong Gang Huang y John Rogers. "Numerical Simulation of Stretchable and Foldable Silicon Integrated Circuits". Advanced Materials Research 74 (junio de 2009): 197–200. http://dx.doi.org/10.4028/www.scientific.net/amr.74.197.
Texto completoNeudeck, Philip G., David J. Spry, Liang Yu Chen, Carl W. Chang, Glenn M. Beheim, Robert S. Okojie, Laura J. Evans et al. "Prolonged 500 °C Operation of 6H-SiC JFET Integrated Circuitry". Materials Science Forum 615-617 (marzo de 2009): 929–32. http://dx.doi.org/10.4028/www.scientific.net/msf.615-617.929.
Texto completoSavchenko, Andrey, A. Kulay, I. Strukov, K. Chubur, Sergey Grechanyy y Konstantin Zolnikov. "A PHYSICAL MODEL FOR ESTIMATING THE INTENSITY OF SINGLE EVENTS WHEN EXPOSED TO INDIVIDUAL NUCLEAR PARTICLES". Modeling of systems and processes 12, n.º 4 (23 de enero de 2020): 78–83. http://dx.doi.org/10.12737/2219-0767-2020-12-4-78-83.
Texto completoBAUMGARTNER, C. y O. A. PALUSINSKI. "METHODOLOGY FOR FORMULATION OF CIRCUIT EQUATIONS FOR SPECTRAL ANALYSIS". Journal of Circuits, Systems and Computers 02, n.º 02 (junio de 1992): 187–206. http://dx.doi.org/10.1142/s0218126692000131.
Texto completoShaw, Brian M. "Book Review: Op-Amps and Linear Integrated Circuits (3rd Edition): A. GAYAKWAD". International Journal of Electrical Engineering & Education 32, n.º 2 (abril de 1995): 190–91. http://dx.doi.org/10.1177/002072099503200220.
Texto completoJohnston, Allan H. y B. G. Rax. "Failure Modes and Hardness Assurance for Linear Integrated Circuits in Space Applications". IEEE Transactions on Nuclear Science 57, n.º 4 (agosto de 2010): 1966–72. http://dx.doi.org/10.1109/tns.2010.2049583.
Texto completoGorelick, J. L., R. Ladbury y L. Ka. "The effects of neutron irradiation on gamma sensitivity of linear integrated circuits". IEEE Transactions on Nuclear Science 51, n.º 6 (diciembre de 2004): 3679–85. http://dx.doi.org/10.1109/tns.2004.839245.
Texto completoEranosyan, V. Ts. "Automated installation for measuring low-frequency noise parameters of linear integrated circuits". Measurement Techniques 30, n.º 6 (junio de 1987): 570–72. http://dx.doi.org/10.1007/bf00866854.
Texto completoKAMEDA, SEIJI, AKIRA HONDA y TETSUYA YAGI. "REAL TIME IMAGE PROCESSING WITH AN ANALOG VISION CHIP SYSTEM". International Journal of Neural Systems 09, n.º 05 (octubre de 1999): 423–28. http://dx.doi.org/10.1142/s0129065799000423.
Texto completoWang, Han, Yi Cheng Zeng y Zhi Jun Li. "Current Mode Maximum and Minimum Circuit". Applied Mechanics and Materials 577 (julio de 2014): 478–81. http://dx.doi.org/10.4028/www.scientific.net/amm.577.478.
Texto completoPiqueira, José R. C., Maurízio Q. de Oliveira y Luiz H. A. Monteiro. "Linear Approach for Synchronous State Stability in Fully Connected PLL Networks". Mathematical Problems in Engineering 2008 (2008): 1–13. http://dx.doi.org/10.1155/2008/364084.
Texto completoSaleh, Alaa, Abdel Kader El Rafei, Mountakha Dieng, Tibault Reveyrand, Raphael Sommet, Jean-Michel Nebus y Raymond Quere. "Compact RF non-linear electro thermal model of SiGe HBT for the design of broadband ADC's". International Journal of Microwave and Wireless Technologies 4, n.º 6 (29 de agosto de 2012): 569–78. http://dx.doi.org/10.1017/s1759078712000566.
Texto completoDimopoulos, K. Z., J. N. Avaritsiotis y S. J. White. "Electrical Modelling of Multilevel On-Chip Interconnections for High-Speed Integrated Circuits". Active and Passive Electronic Components 14, n.º 4 (1992): 199–218. http://dx.doi.org/10.1155/1992/13545.
Texto completoZhao, San Ping. "A Pressure Sensor with Electrical Readout Based on IL Electrofluidic Circuit". Applied Mechanics and Materials 66-68 (julio de 2011): 1936–41. http://dx.doi.org/10.4028/www.scientific.net/amm.66-68.1936.
Texto completoDeval, Y., H. Lapuyade, R. Fouillat, H. Barnaby, F. Darracq, R. Briand, D. Lewis y R. D. Schrimpf. "Evaluation of a design methodology dedicated to dose-rate-hardened linear integrated circuits". IEEE Transactions on Nuclear Science 49, n.º 3 (junio de 2002): 1468–73. http://dx.doi.org/10.1109/tns.2002.1039685.
Texto completoBorys, Andrzej. "On Definition of Operator o for Weakly Nonlinear Circuits". International Journal of Electronics and Telecommunications 62, n.º 3 (1 de septiembre de 2016): 253–59. http://dx.doi.org/10.1515/eletel-2016-0034.
Texto completoWeng, T., S. Stegemann, W. John y W. Mathis. "An identification procedure of multi-input Wiener models for the distortion analysis of nonlinear circuits". Advances in Radio Science 11 (4 de julio de 2013): 165–70. http://dx.doi.org/10.5194/ars-11-165-2013.
Texto completoMcMORROW, DALE, JOSEPH S. MELINGER y ALVIN R. KNUDSON. "SINGLE-EVENT EFFECTS IN III-V SEMICONDUCTOR ELECTRONICS". International Journal of High Speed Electronics and Systems 14, n.º 02 (junio de 2004): 311–25. http://dx.doi.org/10.1142/s0129156404002375.
Texto completoPrakht, V. A., V. V. Goman y A. S. Paramonov. "Design Optimization of Secondary Element of Single-Sided Linear Induction Motors Using a Genetic Algorithm". ENERGETIKA. Proceedings of CIS higher education institutions and power engineering associations 64, n.º 6 (6 de diciembre de 2021): 505–16. http://dx.doi.org/10.21122/1029-7448-2021-64-6-505-516.
Texto completoCaselli, Michele, Marco Ronchi y Andrea Boni. "Power Management Circuits for Low-Power RF Energy Harvesters". Journal of Low Power Electronics and Applications 10, n.º 3 (19 de septiembre de 2020): 29. http://dx.doi.org/10.3390/jlpea10030029.
Texto completoWang, San-Fu. "A 5 V-to-3.3 V CMOS Linear Regulator with Three-Output Temperature-Independent Reference Voltages". Journal of Sensors 2016 (2016): 1–7. http://dx.doi.org/10.1155/2016/1436371.
Texto completoLiu, Lun Cai, Xiao Zong Huang y Wen Gang Huang. "An Integrated Optical Sensor Receiver with the Sensitivity of 0.7 μA Fabricated with Standard CMOS Process". Applied Mechanics and Materials 251 (diciembre de 2012): 206–9. http://dx.doi.org/10.4028/www.scientific.net/amm.251.206.
Texto completoDaems, W., W. Verhaegen, P. Wambacq, G. Gielen y W. Sansen. "Evaluation of error-control strategies for the linear symbolic analysis of analog integrated circuits". IEEE Transactions on Circuits and Systems I: Fundamental Theory and Applications 46, n.º 5 (mayo de 1999): 594–606. http://dx.doi.org/10.1109/81.762925.
Texto completoKoga, R., S. H. Penzin, K. B. Crawford, W. R. Crain, S. C. Moss, S. D. Pinkerton, S. D. LaLumondiere y M. C. Maher. "Single event upset (SEU) sensitivity dependence of linear integrated circuits (ICs) on bias conditions". IEEE Transactions on Nuclear Science 44, n.º 6 (1997): 2325–32. http://dx.doi.org/10.1109/23.659055.
Texto completoFlament, O., J. L. Autran, P. Roche, J. L. Leray, O. Musseau, R. Truche y E. Orsier. "Enhanced total dose damage in junction field effect transistors and related linear integrated circuits". IEEE Transactions on Nuclear Science 43, n.º 6 (1996): 3060–67. http://dx.doi.org/10.1109/23.556905.
Texto completoRizkalla, Shrief, Ralph Prestros y Christoph F. Mecklenbrauker. "Optimal Card Design for Non-Linear HF RFID Integrated Circuits With Guaranteed Standard-Compliance". IEEE Access 6 (2018): 47843–56. http://dx.doi.org/10.1109/access.2018.2867290.
Texto completoBoch, J., F. Saigne, R. D. Schrimpf, J. R. Vaille, L. Dusseau, S. Ducret, M. Bernard, E. Lorfevre y C. Chatry. "Estimation of low-dose-rate degradation on bipolar linear integrated circuits using switching experiments". IEEE Transactions on Nuclear Science 52, n.º 6 (diciembre de 2005): 2616–21. http://dx.doi.org/10.1109/tns.2005.860711.
Texto completoBülow, H., F. Buchali, W. Baumert, R. Ballentin y T. Wehren. "PMD mitigation at 10 Gbit/s using linear and nonlinear integrated electronic equaliser circuits". Electronics Letters 36, n.º 2 (2000): 163. http://dx.doi.org/10.1049/el:20000175.
Texto completoSun, Shaofei, Hongxin Zhang, Xiaotong Cui, Qiang Li, Liang Dong y Xing Fang. "Analysis of Electromagnetic Information Leakage Based on Cryptographic Integrated Circuits". Entropy 23, n.º 11 (13 de noviembre de 2021): 1508. http://dx.doi.org/10.3390/e23111508.
Texto completo