Libros sobre el tema "Legal analysis of (x)"
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Jacobson, M. H. Sam. Legal analysis & communication. 2a ed. Bloomington, IN: AuthorHouse, 2009.
Buscar texto completoBarrett, Charles S., Paul K. Predecki y Donald E. Leyden, eds. Advances in X-Ray Analysis. Boston, MA: Springer US, 1985. http://dx.doi.org/10.1007/978-1-4613-2471-3.
Texto completoMueller, William M., ed. Advances in X-Ray Analysis. Boston, MA: Springer US, 1995. http://dx.doi.org/10.1007/978-1-4684-7401-5.
Texto completoBarrett, Charles S., John V. Gilfrich, Ron Jenkins, John C. Russ, James W. Richardson y Paul K. Predecki, eds. Advances in X-Ray Analysis. Boston, MA: Springer US, 1988. http://dx.doi.org/10.1007/978-1-4613-1035-8.
Texto completoGilfrich, John V., Ting C. Huang, I. Cev Noyan, Paul K. Predecki, Charles C. Goldsmith, Ron Jenkins y Deane K. Smith, eds. Advances in X-Ray Analysis. Boston, MA: Springer US, 1994. http://dx.doi.org/10.1007/978-1-4615-2528-8.
Texto completoGilfrich, John V., Camden R. Hubbard, Ron Jenkins, Deane K. Smith, Ting C. Huang, Michael R. James, Gerald R. Lachance y Paul K. Predecki, eds. Advances in X-Ray Analysis. Boston, MA: Springer US, 1993. http://dx.doi.org/10.1007/978-1-4615-2972-9.
Texto completoPredecki, Paul K., D. Keith Bowen, John V. Gilfrich, Charles C. Goldsmith, Ting C. Huang, Ron Jenkins, I. Cev Noyan y Deane K. Smith, eds. Advances in X-Ray Analysis. Boston, MA: Springer US, 1995. http://dx.doi.org/10.1007/978-1-4615-1797-9.
Texto completoGilfrich, John V., Ron Jenkins, Robert L. Snyder, Mary Ann Zaitz, I. Cev Noyan, Ting C. Huang, Deane K. Smith y Paul K. Predecki, eds. Advances in X-Ray Analysis. Boston, MA: Springer US, 1998. http://dx.doi.org/10.1007/978-1-4615-5377-9.
Texto completoMueller, William M., ed. Advances in X-Ray Analysis. Boston, MA: Springer US, 1995. http://dx.doi.org/10.1007/978-1-4684-8631-5.
Texto completoMueller, William M., Gavin R. Mallett y Marie Fay, eds. Advances in X-Ray Analysis. Boston, MA: Springer New York, 1995. http://dx.doi.org/10.1007/978-1-4684-8637-7.
Texto completoMueller, William M., Gavin Mallet y Marie Fay, eds. Advances in X-Ray Analysis. Boston, MA: Springer US, 1995. http://dx.doi.org/10.1007/978-1-4684-8673-5.
Texto completoNewkirk, John B., Gavin R. Mallett y Heinz G. Pfeiffer, eds. Advances in X-ray Analysis. Boston, MA: Springer US, 1995. http://dx.doi.org/10.1007/978-1-4684-8676-6.
Texto completoBarrett, Charles S., John V. Gilfrich, Ting C. Huang, Ron Jenkins, Gregory J. McCarthy, Paul K. Predecki, Richard Ryon y Deane K. Smith, eds. Advances in X-Ray Analysis. Boston, MA: Springer US, 1992. http://dx.doi.org/10.1007/978-1-4615-3460-0.
Texto completoBarrett, Charles S., John V. Gilfrich, Ron Jenkins, Donald E. Leyden, John C. Russ y Paul K. Predecki, eds. Advances in X-Ray Analysis. Boston, MA: Springer US, 1987. http://dx.doi.org/10.1007/978-1-4613-1935-1.
Texto completoBarrett, Charles S., John V. Gilfrich, I. C. Noyan, Ting C. Huang y Paul K. Predecki, eds. Advances in X-Ray Analysis. Boston, MA: Springer US, 1991. http://dx.doi.org/10.1007/978-1-4615-3744-1.
Texto completoBarrett, Charles S., John V. Gilfrich, Ting C. Huang, Ron Jenkins y Paul K. Predecki, eds. Advances in X-Ray Analysis. Boston, MA: Springer US, 1990. http://dx.doi.org/10.1007/978-1-4613-9996-4.
Texto completoBarrett, Charles S., John V. Gilfrich, Ron Jenkins, Ting C. Huang y Paul K. Predecki, eds. Advances in X-Ray Analysis. Boston, MA: Springer US, 1989. http://dx.doi.org/10.1007/978-1-4757-9110-5.
Texto completoMueller, William M. y Marie Fay, eds. Advances in X-Ray Analysis. Boston, MA: Springer US, 1995. http://dx.doi.org/10.1007/978-1-4684-8783-1.
Texto completoNewkirk, John B. y Gavin R. Mallett, eds. Advances in X-Ray Analysis. Boston, MA: Springer US, 1995. http://dx.doi.org/10.1007/978-1-4684-7835-8.
Texto completoA, Janssens Koen H., Adams F. 1938- y Rindby Anders, eds. Microscopic x-ray fluorescence analysis. Chichester: Wiley, 2000.
Buscar texto completoConference on Applications of X-ray Analysis (41st 1992 Colorado Springs, Colo.). Advances in x-ray analysis. New York: Plenum, 1993.
Buscar texto completoV, Gilfrich John y Conference on Applications of X-Ray Analysis, (42nd : 1993 : Denver, Colo.), eds. Advances in x-ray analysis. New York: Plenum Press, 1994.
Buscar texto completoLegal writing and analysis. 3a ed. New York: Aspen Publishers, 2011.
Buscar texto completoH, Putman William, ed. Legal analysis and writing. 2a ed. Clifton Park, NY: Thomson/Delmar Learning, 2003.
Buscar texto completoPutman, William H. Legal analysis and writing. 3a ed. Clifton Park, NY: Delmar Cengage Learning, 2009.
Buscar texto completoEdwards, Linda Holdeman. Legal writing and analysis. 2a ed. New York, NY: Aspen Publishers, 2007.
Buscar texto completoWellford, Robin S. Legal analysis and writing. [United States?]: Lexis-Nexis, 1997.
Buscar texto completoLegal analysis and writing. 4a ed. Clifton Park, NY: Delmar Cengage Learning, 2013.
Buscar texto completoHallam, DeSanctis Christy, ed. Legal writing and analysis. New York, NY: Thomson Reuters/Foundation Press, 2009.
Buscar texto completoSpindura, Jillian. Rapid X-ray analysis by X-ray powder diffraction. Manchester: UMIST, 1994.
Buscar texto completoKaye, T. J. Rapid x-ray analysis by x-ray powder diffraction. Manchester: UMIST, 1993.
Buscar texto completoLegal risk analysis: A proactive legal method. [Stockholm]: Stiftelsen Skrifter utgivna av Juridiska fakulteten vid Stockholms universitet, 2013.
Buscar texto completoGama, João, Elizabeth Bradley y Jaakko Hollmén, eds. Advances in Intelligent Data Analysis X. Berlin, Heidelberg: Springer Berlin Heidelberg, 2011. http://dx.doi.org/10.1007/978-3-642-24800-9.
Texto completoEnergy dispersive x-ray fluorescence analysis. Warszawa: PWN, 1989.
Buscar texto completoObservatory, Smithsonian Astrophysical y United States. National Aeronautics and Space Administration., eds. VETA-I X-ray test analysis. [Washington, DC: National Aeronautics and Space Administration, 1992.
Buscar texto completoKlockenkämper, R. Total-reflection X-ray fluorescence analysis. New York: Wiley, 1997.
Buscar texto completoObservatory, Smithsonian Astrophysical y United States. National Aeronautics and Space Administration., eds. VETA-I X-ray test analysis. [Washington, DC: National Aeronautics and Space Administration, 1992.
Buscar texto completoTotal reflection X-ray fluorescence analysis. New York: Wiley, 1997.
Buscar texto completoLawrence, Bragg William. The development of x-ray analysis. New York: Dover Publications, 1992.
Buscar texto completoObservatory, Smithsonian Astrophysical y United States. National Aeronautics and Space Administration., eds. VETA-I X-ray test analysis. [Washington, DC: National Aeronautics and Space Administration, 1992.
Buscar texto completoInc, SPSS, ed. SPSS-X trends. Chicago, Ill: SPSS, 1988.
Buscar texto completoBellack-Viner, Wendy. Advanced legal research, analysis & writing. Toronto]: Faculty of Law, University of Toronto, 2006.
Buscar texto completoBellack-Viner, Wendy. Advanced legal research, analysis & writing. [Toronto]: Faculty of Law, University of Toronto, 2006.
Buscar texto completoKuney, George W. Mastering legal analysis and drafting. Durham, N.C: Carolina Academic Press, 2009.
Buscar texto completoHirata, Hayato y Katsumi Nitta. Analysis of Legal Argumentation Documents. Singapore: Springer Nature Singapore, 2022. http://dx.doi.org/10.1007/978-981-19-2928-1.
Texto completoFish, Bonnie E. Advanced legal research, analysis & writing. [Toronto]: Faculty of Law, University of Toronto, 2006.
Buscar texto completoLegal research, analysis, and writing. Clifton Park, NY: Thomson/Delmar Learning, 2004.
Buscar texto completoFish, Bonnie E. Advanced legal research, analysis & writing. Toronto]: Faculty of Law, University of Toronto, 2010.
Buscar texto completoFish, Bonnie E. Advanced legal research, analysis & writing. [Toronto]: Faculty of Law, University of Toronto, 2007.
Buscar texto completoRoger, Mccormick y Stears Chris. Part X Conclusions, 33 A Convergence of Agendas. Oxford University Press, 2018. http://dx.doi.org/10.1093/law/9780198749271.003.0034.
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