Literatura académica sobre el tema "Leakage Current Density"
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Artículos de revistas sobre el tema "Leakage Current Density"
Kawahara, Takamitsu, Naoki Hatta, Kuniaki Yagi, Hidetsugu Uchida, Motoki Kobayashi, Masayuki Abe, Hiroyuki Nagasawa, Bernd Zippelius y Gerhard Pensl. "Correlation between Leakage Current and Stacking Fault Density of p-n Diodes Fabricated on 3C-SiC". Materials Science Forum 645-648 (abril de 2010): 339–42. http://dx.doi.org/10.4028/www.scientific.net/msf.645-648.339.
Texto completoTamada, Minoru, Yuji Noguchi y Masaru Miyayama. "Defects and Leakage Current in PbTiO3 Single Crystals". Key Engineering Materials 350 (octubre de 2007): 77–80. http://dx.doi.org/10.4028/www.scientific.net/kem.350.77.
Texto completoKim, Hyung Chul, Moon Seob Han, Hyun June Park, Dong Uk Jang, Gyung Suk Kil y Nirmal Kumar Nair. "Consideration of Uncertainty in Diagnosis for Railway Arrester". Key Engineering Materials 321-323 (octubre de 2006): 1507–12. http://dx.doi.org/10.4028/www.scientific.net/kem.321-323.1507.
Texto completoIshikawa, Tsuyoshi, T. Katsuno, Y. Watanabe, H. Fujiwara y T. Endo. "Critical Density of Nanoscale Pits for Suppressing Variability in Leakage Current of a SiC Schottky Barrier Diode". Materials Science Forum 717-720 (mayo de 2012): 371–74. http://dx.doi.org/10.4028/www.scientific.net/msf.717-720.371.
Texto completoHirokazu, Fujiwara, T. Katsuno, Tsuyoshi Ishikawa, H. Naruoka, Masaki Konishi, T. Endo, Y. Watanabe et al. "Impact of Surface Morphology above Threading Dislocations on Leakage Current in 4H-SiC Diodes". Materials Science Forum 717-720 (mayo de 2012): 911–16. http://dx.doi.org/10.4028/www.scientific.net/msf.717-720.911.
Texto completoUno, Shigeyasu, Kazuaki Deguchi, Yoshinari Kamakura y Kenji Taniguchi. "Trap Density Dependent Inelastic Tunneling in Stress-Induced Leakage Current". Japanese Journal of Applied Physics 41, Part 1, No. 4B (30 de abril de 2002): 2645–49. http://dx.doi.org/10.1143/jjap.41.2645.
Texto completoKim, Hyojung, Jongwoo Park, Junehwan Kim, Nara Lee, Gaeun Lee, Soonkon Kim, Pyungho Choi, Dohyun Beak, Jangkun Song y Byoungdeog Choi. "Leakage Current Analysis Method for Metal Insulator Semiconductor Capacitors Through Low-Frequency Noise Measurement". Journal of Nanoscience and Nanotechnology 21, n.º 3 (1 de marzo de 2021): 1966–70. http://dx.doi.org/10.1166/jnn.2021.18901.
Texto completoNegara, I. Made Yulistya, I. G. N. Satriyadi Hernanda, Dimas Anton Asfani, Mira Kusuma Wardani, Bonifacius Kevin Yegar y Reynaldi Syahril. "Effect of Seawater and Fly Ash Contaminants on Insulator Surfaces Made of Polymer Based on Finite Element Method". Energies 14, n.º 24 (20 de diciembre de 2021): 8581. http://dx.doi.org/10.3390/en14248581.
Texto completoGeng, Kuiwei, Ditao Chen, Quanbin Zhou y Hong Wang. "AlGaN/GaN MIS-HEMT with PECVD SiNx, SiON, SiO2 as Gate Dielectric and Passivation Layer". Electronics 7, n.º 12 (10 de diciembre de 2018): 416. http://dx.doi.org/10.3390/electronics7120416.
Texto completoAlbertin, Katia F., M. A. Valle y I. Pereyra. "Study Of MOS Capacitors With TiO2 And SiO2/TiO2 Gate Dielectric". Journal of Integrated Circuits and Systems 2, n.º 2 (18 de noviembre de 2007): 89–93. http://dx.doi.org/10.29292/jics.v2i2.272.
Texto completoTesis sobre el tema "Leakage Current Density"
Kumar, Manish. "High density and high reliability thin film embedded capacitors on organic and silicon substrates". Thesis, Atlanta, Ga. : Georgia Institute of Technology, 2008. http://hdl.handle.net/1853/26655.
Texto completoCommittee Chair: Tummala Rao; Committee Member: Pulugurtha Raj; Committee Member: Wong C P. Part of the SMARTech Electronic Thesis and Dissertation Collection.
Tewg, Jun-Yen. "Zirconium-doped tantalum oxide high-k gate dielectric films". Diss., Texas A&M University, 2004. http://hdl.handle.net/1969.1/1346.
Texto completoHeideklang, René. "Data Fusion for Multi-Sensor Nondestructive Detection of Surface Cracks in Ferromagnetic Materials". Doctoral thesis, Humboldt-Universität zu Berlin, 2018. http://dx.doi.org/10.18452/19586.
Texto completoFatigue cracking is a dangerous and cost-intensive phenomenon that requires early detection. But at high test sensitivity, the abundance of false indications limits the reliability of conventional materials testing. This thesis exploits the diversity of physical principles that different nondestructive surface inspection methods offer, by applying data fusion techniques to increase the reliability of defect detection. The first main contribution are novel approaches for the fusion of NDT images. These surface scans are obtained from state-of-the-art inspection procedures in Eddy Current Testing, Thermal Testing and Magnetic Flux Leakage Testing. The implemented image fusion strategy demonstrates that simple algebraic fusion rules are sufficient for high performance, given adequate signal normalization. Data fusion reduces the rate of false positives is reduced by a factor of six over the best individual sensor at a 10 μm deep groove. Moreover, the utility of state-of-the-art image representations, like the Shearlet domain, are explored. However, the theoretical advantages of such directional transforms are not attained in practice with the given data. Nevertheless, the benefit of fusion over single-sensor inspection is confirmed a second time. Furthermore, this work proposes novel techniques for fusion at a high level of signal abstraction. A kernel-based approach is introduced to integrate spatially scattered detection hypotheses. This method explicitly deals with registration errors that are unavoidable in practice. Surface discontinuities as shallow as 30 μm are reliably found by fusion, whereas the best individual sensor requires depths of 40–50 μm for successful detection. The experiment is replicated on a similar second test specimen. Practical guidelines are given at the end of the thesis, and the need for a data sharing initiative is stressed to promote future research on this topic.
"High Power Density, High Efficiency Single Phase Transformer-less Photovoltaic String Inverters". Doctoral diss., 2017. http://hdl.handle.net/2286/R.I.45041.
Texto completoDissertation/Thesis
Doctoral Dissertation Electrical Engineering 2017
Thapliyal, Prashant. "High-K Dielectrics–Studies on (Ta2O5)1-x– (TiO2)x, (0 ≤ x ≤ 0.11), Thin Films". Thesis, 2021. https://etd.iisc.ac.in/handle/2005/5579.
Texto completoCapítulos de libros sobre el tema "Leakage Current Density"
Monazzah, Amir Mahdi Hosseini, Amir M. Rahmani, Antonio Miele y Nikil Dutt. "Exploiting Memory Resilience for Emerging Technologies: An Energy-Aware Resilience Exemplar for STT-RAM Memories". En Dependable Embedded Systems, 505–26. Cham: Springer International Publishing, 2020. http://dx.doi.org/10.1007/978-3-030-52017-5_21.
Texto completoMalavena, Gerardo. "Modeling of GIDL–Assisted Erase in 3–D NAND Flash Memory Arrays and Its Employment in NOR Flash–Based Spiking Neural Networks". En Special Topics in Information Technology, 43–53. Cham: Springer International Publishing, 2022. http://dx.doi.org/10.1007/978-3-030-85918-3_4.
Texto completoLi, Qiangqiang, Yanghui Zhang, Lili Shen, Ning Zhao, Tao Zhang y Xiaoxia Sun. "The Effect of Leakage Current on the Performance of Proton-Conducting Solid Oxide Fuel Cells". En Advances in Energy Research and Development. IOS Press, 2022. http://dx.doi.org/10.3233/aerd220024.
Texto completoZhou, Yingjian y Wei Chen. "Analysis and Optimization of Low-Voltage and High-Current Matrix Current-Doubler Rectifiers Integrated Magnetic Components". En Advances in Transdisciplinary Engineering. IOS Press, 2022. http://dx.doi.org/10.3233/atde221039.
Texto completoPreethi, Sapna R. y Mohammed Mujeer Ulla. "Low-Power Methodologies and Strategies in VLSI Circuits". En Advances in Computer and Electrical Engineering, 1–16. IGI Global, 2022. http://dx.doi.org/10.4018/978-1-6684-4974-5.ch001.
Texto completoStevic, Zoran y Ilija Radovanovic. "Supercapacitors: The Innovation of Energy Storage". En Updates on Supercapacitors [Working Title]. IntechOpen, 2022. http://dx.doi.org/10.5772/intechopen.106705.
Texto completoKumar, Sunil y Balwinder Raj. "Simulations and Modeling of TFET for Low Power Design". En Advances in Systems Analysis, Software Engineering, and High Performance Computing, 640–67. IGI Global, 2016. http://dx.doi.org/10.4018/978-1-4666-8823-0.ch021.
Texto completo"Chapter 9 Effect of current leakage on electro-adhesion forces in rolling friction and magnetic flux density distribution on track surfaces of rolling-element bearings". En Tribology in Electrical Environments, 179–209. Elsevier, 2006. http://dx.doi.org/10.1016/s0167-8922(06)80022-2.
Texto completoActas de conferencias sobre el tema "Leakage Current Density"
Uno, Shigeyasu, Kazuaki Deguchi, Yoshinari Kamakura y Kenji Taniguchi. "Trap Density Dependent Inelastic Tunneling in Stress-Induced Leakage Current". En 2001 International Conference on Solid State Devices and Materials. The Japan Society of Applied Physics, 2001. http://dx.doi.org/10.7567/ssdm.2001.c-9-1.
Texto completoOleinik, G. M., V. V. Aleksandrov, A. V. Branitskii, I. N. Frolov, E. V. Grabovskii, E. I. Predkova, O. B. Reshetnjak y S. I. Tkachenko. "Leakage of current from MITL with ceramic coating cathode". En 8th International Congress on Energy Fluxes and Radiation Effects. Crossref, 2022. http://dx.doi.org/10.56761/efre2022.s2-o-009807.
Texto completoHeydari, H., S. H. Pedramrazi y F. Faghihi. "The effects of windings current density values on leakage reactance in a 25 kA current injection transformer". En 2005 International Power Engineering Conference. IEEE, 2005. http://dx.doi.org/10.1109/ipec.2005.206988.
Texto completoAkashe, Shyam, Sushil Bhushan y Sanjay Sharma. "High density and low leakage current based 5T SRAM cell using 45 nm technology". En International Conference on Nanoscience, Engineering and Technology (ICONSET 2011). IEEE, 2011. http://dx.doi.org/10.1109/iconset.2011.6167978.
Texto completoSchmidt, Christian, Cheryl Hartfield, Stephen T. Kelly, Luke England y Sukeshwar Kannan. "Nanoscale 3D X-ray Microscopy for High Density Multi-Chip Packaging FA". En ISTFA 2018. ASM International, 2018. http://dx.doi.org/10.31399/asm.cp.istfa2018p0424.
Texto completoMatsuda, K., S. Tada, M. Nagata, Y. Li, T. Sugawara, M. Iwamoto, K. Ohta, K. Sakiyama y N. Miura. "An Information Leakage Sensor Based on Measurement of Laser-Induced Opto-Electric Bulk Current Density". En 2019 International Conference on Solid State Devices and Materials. The Japan Society of Applied Physics, 2019. http://dx.doi.org/10.7567/ssdm.2019.m-1-03.
Texto completoTian, Lixin, Fei Yang, Zhanwei Shen, Feng Zhang, Xingfang Liu, Guoguo Yan, Wanshun Zhao et al. "Low leakage current and high unipolar current density in a 4H-SiC trench gate MOSFET with integrated Schottky barrier diode". En 2020 17th China International Forum on Solid State Lighting & 2020 International Forum on Wide Bandgap Semiconductors China (SSLChina: IFWS). IEEE, 2020. http://dx.doi.org/10.1109/sslchinaifws51786.2020.9308886.
Texto completoSerincan, Mustafa F., Ugur Pasaogullari y Nigel M. Sammes. "A Computational Analysis to Identify the Current Density Characteristics of a Micro-Tubular Solid Oxide Fuel Cell". En ASME 2008 6th International Conference on Fuel Cell Science, Engineering and Technology. ASMEDC, 2008. http://dx.doi.org/10.1115/fuelcell2008-65199.
Texto completoGao, Kai, Maoxin Ren, Haifeng Jin, Haoyang Tian, Jianming He y Lijun Jin. "Pollution Flashover Prediction of Insulators Based on Combined Probability Density of Infrared Image Temperature and Leakage Current". En 2022 IEEE 5th International Electrical and Energy Conference (CIEEC). IEEE, 2022. http://dx.doi.org/10.1109/cieec54735.2022.9846194.
Texto completoBanik, Apu, Sovan Dalai y Biswendu Chatterjee. "Studies the effect of Equivalent Salt Deposit Density on leakage current and flashover voltage of artificially contaminated disc insulators". En 2015 1st Conference on Power, Dielectric and Energy Management at NERIST (ICPDEN). IEEE, 2015. http://dx.doi.org/10.1109/icpden.2015.7084495.
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