Libros sobre el tema "Integrated measurements"
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Oettinger, Frank F. Thermal resistance measurements. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1990.
Buscar texto completoOettinger, Frank F. Thermal resistance measurements. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1990.
Buscar texto completoWiesław, Marciniak y Przewłocki Henryk M, eds. Diagnostic measurements in LSI/VLSI integrated circuits production. Singapore: World Scientific, 1991.
Buscar texto completoMagrab, Edward B. Computer integrated experimentation. Berlin: Springer-Verlag, 1991.
Buscar texto completo1954-, Rubio Antonio, ed. Thermal testing of integrated circuits. Boston: Kluwer Academic Publishers, 2002.
Buscar texto completoEisenstadt, William Richard. High frequency measurements of integrated circuit devices and interconnect. Stanford, CA: StanfordUniversity, 1986.
Buscar texto completoCorporation, Psychological, ed. Integrated assessment system.: Swinging. San Antonio, Tex: Psychological Corporation, 1992.
Buscar texto completoAltet, Josep. Thermal Testing of Integrated Circuits. Boston, MA: Springer US, 2002.
Buscar texto completoMagrab, Edward B. Computer Integrated Experimentation. Berlin, Heidelberg: Springer Berlin Heidelberg, 1991.
Buscar texto completoHoy, Bennett Marylyn, Society of Photo-optical Instrumentation Engineers., Semiconductor Equipment and Materials International. y SPIE Symposium on Microlithography (1994 : San Jose, Calif.), eds. Integrated circuit metrology, inspection, and process control VIII: 28 February-2 March, San Jose, California. Bellingham, Wash., USA: SPIE, 1994.
Buscar texto completoHoy, Bennett Marylyn, Society of Photo-optical Instrumentation Engineers., Semiconductor Equipment and Materials International. y SPIE Symposium on Microlithography (1994 : San Jose, Calif.), eds. Integrated circuit metrology, inspection, and process control VIII: 28 February-2 March, San Jose, California. Bellingham, Wash., USA: SPIE, 1994.
Buscar texto completoCorporation, Psychological, ed. Integrated assessment system.: Paper clips. San Antonio, Tex: Psychological Corporation, 1992.
Buscar texto completoCorporation, Psychological, ed. Integrated assessment system.: Roller coasters. San Antonio, Tex: Psychological Corporation, 1992.
Buscar texto completoUniversity of Wisconsin--Madison. Water Resources Center. y Geological Survey (U.S.). Water Resources Division. Wisconsin District., eds. An integrated water-monitoring network for Wisconsin. Madison, WI: Wisconsin Water Resources Center, University of Wisconsin-Madison, 1998.
Buscar texto completoCorporation, Psychological, ed. Integrated assessment system.: Clean water. San Antonio, Tex: Psychological Corp., 1992.
Buscar texto completoCorporation, Psychological, ed. Integrated assessment system.: Spinning tops. San Antonio, Tex: Psychological Corporation, 1992.
Buscar texto completoCorporation, Psychological, ed. Integrated assessment system.: Send it flying. San Antonio, Tex: Psychological Corporation, 1992.
Buscar texto completoCorporation, Psychological, ed. Integrated assessment system.: Animals of long ago. San Antonio, Tex: Psychological Corporation, 1992.
Buscar texto completoHoy, Bennett Marylyn, Society of Photo-optical Instrumentation Engineers. y Semiconductor Equipment and Materials International., eds. Integrated circuit metrology, inspection, and process control IX: 20-22 February 1995, Santa Clara, California. Bellingham, Wash., USA: SPIE, 1995.
Buscar texto completoN, Varner Ruth, Potzick James E y National Institute of Standards and Technology (U.S.), eds. Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1992.
Buscar texto completoN, Varner Ruth, Potzick James E y National Institute of Standards and Technology (U.S.), eds. Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1992.
Buscar texto completoHarald, Bosse, Bodermann Bernd, Silver Richard M, Wissenschaftliche Gesellschaft Lasertechnik, SPIE Europe, European Optical Society y Society of Photo-optical Instrumentation Engineers., eds. Modeling aspects in optical metrology: 18-19 June 2007, Munich, Germany. Bellingham, Wash: SPIE, 2007.
Buscar texto completoEurope, SPIE, European Optical Society, Wissenschaftliche Gesellschaft Lasertechnik y SPIE (Society), eds. Modeling aspects in optical metrology II: 15-16 June 2009, Munich, Germany. Bellingham, Wash: SPIE, 2009.
Buscar texto completoIEEE International Symposium on Virtual and Intelligent Measurement Systems (7th 2002 Girdwood, Anchorage, Alaska). VIMS 2002: 2002 IEEE International Symposium on Virtual and Intelligent Measurement Systems : Distributed intelligent sensing for advanced integrated virtual environments : Alyeska resort, Girdwood, Alaska, USA, 19-20 May 2002. Piscataway, N.J: IEEE, 2002.
Buscar texto completoDickey, Donyall D. The integrated approach to student achievement: A results-driven model for improving performance, leadership, and the culture of instruction at your school. Highlands, TX: aha Process, Inc., 2010.
Buscar texto completoVezzetti, Carol F. Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1992.
Buscar texto completoVezzetti, Carol F. Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1992.
Buscar texto completoVezzetti, Carol F. Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1992.
Buscar texto completoVezzetti, Carol F. Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1992.
Buscar texto completoXuping, Zhang, Zhongguo yi qi yi biao xue hui, Zhongguo guang xue xue hui, SPIE (Society) y Zhongguo yi qi yi biao xue hui. Optoelectronic-Mechanic Technology and System Integration Chapter, eds. 2009 International Conference on Optical Instruments and Technology: Optoelectronic devices and integration : 19-21 October 2009, Shanghai, China. Bellingham, Wash: SPIE, 2009.
Buscar texto completoVezzetti, Carol F. Antireflecting-Chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems. Gaithersburg, Md: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1992.
Buscar texto completoE, Martner Brooks y Wave Propagation Laboratory, eds. A Field evaluation of remote sensor measurements of wind, temperature, and moisture for ARM integrated sounding system research. Boulder, Colo: United States Dept. of Commerce, National Oceanic and Atmospheric Administration, Environmental Research Laboratories, Wave Propagation Laboratory, 1991.
Buscar texto completoGiannetti, Rosario. Turning up the heat!: A unit of study investigating heat energy : an integrated unit for grade 7. [Ontario: s.n.], 2001.
Buscar texto completoVezzetti, Carol F. Bright-chromium linewidth standard, SRM 476, for calibration of optical microscope linewidth measuring systems. Gaithersburg, Md: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1991.
Buscar texto completoVezzetti, Carol F. Bright-chromium linewidth standard, SRM 476, for calibration of optical microscope linewidth measuring systems. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1991.
Buscar texto completoVezzetti, Carol F. Bright-chromium linewidth standard, SRM 476, for calibration of optical microscope linewidth measuring systems. Gaithersburg, Md: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1991.
Buscar texto completoVezzetti, Carol F. Bright-chromium linewidth standard, SRM 476, for calibration of optical microscope linewidth measuring systems. Gaithersburg, Md: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1991.
Buscar texto completoSeaward, P. Gareth R. Integrated maternal serum screening and nuchal skin fold thickness measurements in the second trimester prenatal diagnosis of fetal down syndrome. Ottawa: National Library of Canada, 2003.
Buscar texto completoPeters, Norman E. Hydrologic data from the Integrated-Lake Watershed Acidification Study in the west-central Adirondack Mountains, New York, October 1977 through January 1982. Denver, Colo: U.S. Dept. of the Interior, U.S. Geological Survey, 1987.
Buscar texto completoPeters, Norman E. Hydrologic data from the Integrated-Lake Watershed Acidification Study in the west-central Adirondack Mountains, New York, October 1977 through January 1982. Denver, Colo: U.S. Dept. of the Interior, U.S. Geological Survey, 1987.
Buscar texto completoS, Murdoch Peter, Dalton Frank N, University of Virginia y Geological Survey (U.S.), eds. Hydrologic data from the Integrated-Lake Watershed Acidification Study in the west-central Adirondack Mountains, New York, October 1977 through January 1982. Denver, Colo: U.S. Dept. of the Interior, U.S. Geological Survey, 1987.
Buscar texto completoRincón-Mora, Gabriel A. Voltage references: From diodes to precision high-order bandgap circuits. Piscataway, NJ: IEEE Press, 2002.
Buscar texto completoUnited States. National Aeronautics and Space Administration, ed. Final report entitled Comparison of long-wave and shortwave irradiances at satellite altitude with integrated scanner measurements using the nimbus 7 ERB data set. [Washington, D.C: National Aeronautics and Space Administration, 1986.
Buscar texto completoHouse, Frederick Bishop. Final report entitled Comparison of long-wave and shortwave irradiances at satellite altitude with integrated scanner measurements using the nimbus 7 ERB data set. [Washington, D.C: National Aeronautics and Space Administration, 1986.
Buscar texto completoS, Heyman Joseph y Electronics Reliability and Measurement Technology Workshop (1986 : NASA Langley Research Center), eds. Electronics reliability and measurement technology: Nondestructive evaluation. Park Ridge, N.J., U.S.A: Noyes Data Corp., 1988.
Buscar texto completoKourtev, Ivan S. Timing Optimization Through Clock Skew Scheduling. Boston, MA: Springer US, 2000.
Buscar texto completoDartman, Torbjo rn. Procams integrated ego-meter system: The computer system : computerised garment distribution system for taking individual measurements of customers in shops connected on-line to garment manufacturing factories. [Go teborg?]: Chalmers Teknicka Ho gakda, 1987.
Buscar texto completoIEEE International Conference on Microelectronic Test Structures (1997 Monterey, Calif.). 1997 IEEE International Conference on Microelectronic Test Structures proceedings: March 17-20, 1997, Monterey, California. Piscataway, NJ: IEEE Service Center, 1997.
Buscar texto completoPiziali, Andrew. Functional verification coverage measurement and analysis. Boston: Kluwer Academic Publishers, 2004.
Buscar texto completoPiziali, Andrew. Functional verification coverage measurement and analysis. Boston: Kluwer Academic Publishers, 2004.
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