Artículos de revistas sobre el tema "HIGH-RESOLUTION TRANSMISSION ELECTON MICROSCOPE"
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Feuer, Helmut, Lothar Schröpfer, Hartmut Fuess y David A. Jefferson. "High resolution transmission electron microscope study of exsolution in synthetic pigeonite". European Journal of Mineralogy 1, n.º 4 (31 de agosto de 1989): 507–16. http://dx.doi.org/10.1127/ejm/1/4/0507.
Texto completoKersker, M., C. Nielsen, H. Otsuji, T. Miyokawa y S. Nakagawa. "The JSM-890 ultra high resolution Scanning Electron Microscope". Proceedings, annual meeting, Electron Microscopy Society of America 47 (6 de agosto de 1989): 88–89. http://dx.doi.org/10.1017/s0424820100152410.
Texto completoMöller, Lars, Gudrun Holland y Michael Laue. "Diagnostic Electron Microscopy of Viruses With Low-voltage Electron Microscopes". Journal of Histochemistry & Cytochemistry 68, n.º 6 (21 de mayo de 2020): 389–402. http://dx.doi.org/10.1369/0022155420929438.
Texto completoGibson, J. M. "High Resolution Transmission Electron Microscopy". MRS Bulletin 16, n.º 3 (marzo de 1991): 27–33. http://dx.doi.org/10.1557/s0883769400057377.
Texto completoGamm, Björn, Holger Blank, Radian Popescu, Reinhard Schneider, André Beyer, Armin Gölzhäuser y Dagmar Gerthsen. "Quantitative High-Resolution Transmission Electron Microscopy of Single Atoms". Microscopy and Microanalysis 18, n.º 1 (12 de diciembre de 2011): 212–17. http://dx.doi.org/10.1017/s1431927611012232.
Texto completoSharma, Renu, Karl Weiss, Michael McKelvy y William Glaunsinger. "Gas reaction chamber for gas-solid interaction studies by high-resolution TEM". Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 494–95. http://dx.doi.org/10.1017/s0424820100170207.
Texto completoO'Keefe, Michael A., John H. Turner, John A. Musante, Crispin J. D. Hetherington, A. G. Cullis, Bridget Carragher, Ron Jenkins et al. "Laboratory Design for High-Performance Electron Microscopy". Microscopy Today 12, n.º 3 (mayo de 2004): 8–17. http://dx.doi.org/10.1017/s1551929500052093.
Texto completoTonomura, Akira. "1-MV Field-Emission Transmission Electron Microscope". Microscopy and Microanalysis 7, S2 (agosto de 2001): 918–19. http://dx.doi.org/10.1017/s143192760003066x.
Texto completoHiguchi, Tomohiro, Boping Liu, Hisayuki Nakatani, Nobuo Otsuka y Minoru Terano. "High resolution transmission electron microscope observation of α-TiCl3". Applied Surface Science 214, n.º 1-4 (mayo de 2003): 272–77. http://dx.doi.org/10.1016/s0169-4332(03)00517-8.
Texto completoSchatten, G., J. Pawley y H. Ris. "Integrated microscopy resource for biomedical research at the university of wisconsin at madison". Proceedings, annual meeting, Electron Microscopy Society of America 45 (agosto de 1987): 594–97. http://dx.doi.org/10.1017/s0424820100127451.
Texto completoO'Keefe, Michael A. "Letter to the Editor: Image Formation in the High-Resolution Transmission Electron Microscope". Microscopy and Microanalysis 10, n.º 4 (agosto de 2004): 397–99. http://dx.doi.org/10.1017/s1431927604211059.
Texto completoO'Keefe, Michael A. "The Optimum CS Condition for High-Resolution Transmission Electron Microscopy". Microscopy and Microanalysis 6, S2 (agosto de 2000): 1036–37. http://dx.doi.org/10.1017/s1431927600037673.
Texto completoTAKAYANAGI, KUNIO, YOSHITAKA NAITOH, YOSHIFUMI OSHIMA y MASANORI MITOME. "SURFACE TRANSMISSION ELECTRON MICROSCOPY ON STRUCTURES WITH TRUNCATION". Surface Review and Letters 04, n.º 04 (agosto de 1997): 687–94. http://dx.doi.org/10.1142/s0218625x97000687.
Texto completoSchneider, G. "High Resolution X-ray Microscopy of Frozen Hydrated Samples". Microscopy and Microanalysis 4, S2 (julio de 1998): 350–51. http://dx.doi.org/10.1017/s1431927600021875.
Texto completoNagatani, T. "High-resolution scanning electron microscopy". Proceedings, annual meeting, Electron Microscopy Society of America 45 (agosto de 1987): 530–33. http://dx.doi.org/10.1017/s0424820100127244.
Texto completoO’Keefe, Michael A. "Alpha-Null Defocus: an Optimum Defocus Condition with Relevance for Focal-Series Reconstruction". Microscopy and Microanalysis 7, S2 (agosto de 2001): 916–17. http://dx.doi.org/10.1017/s1431927600030658.
Texto completoIshikawa, Ryo, Yu Jimbo, Mitsuhisa Terao, Masashi Nishikawa, Yujiro Ueno, Shigeyuki Morishita, Masaki Mukai, Naoya Shibata y Yuichi Ikuhara. "High spatiotemporal-resolution imaging in the scanning transmission electron microscope". Microscopy 69, n.º 4 (3 de abril de 2020): 240–47. http://dx.doi.org/10.1093/jmicro/dfaa017.
Texto completoMartone, Maryann E. "Bridging the Resolution Gap: Correlated 3D Light and Electron Microscopic Analysis of Large Biological Structures". Microscopy and Microanalysis 5, S2 (agosto de 1999): 526–27. http://dx.doi.org/10.1017/s1431927600015956.
Texto completoWells, Oliver C. y P. C. Cheng. "High-resolution backscattered electron images in the scanning electron microscope". Proceedings, annual meeting, Electron Microscopy Society of America 50, n.º 2 (agosto de 1992): 1608–9. http://dx.doi.org/10.1017/s0424820100132674.
Texto completoLentzen, M., B. Jahnen, C. L. Jia y K. Urban. "High-Resolution Imaging with an Aberration-Corrected Transmission Electron Micrscope". Microscopy and Microanalysis 7, S2 (agosto de 2001): 904–5. http://dx.doi.org/10.1017/s1431927600030592.
Texto completoLentzen, M., B. Jahnen, C. L. Jia, A. Thust, K. Tillmann y K. Urban. "High-resolution imaging with an aberration-corrected transmission electron microscope". Ultramicroscopy 92, n.º 3-4 (agosto de 2002): 233–42. http://dx.doi.org/10.1016/s0304-3991(02)00139-0.
Texto completoMitome, Masanori, Yoshio Bando, Dmitri Golberg, Keiji Kurashima, Yoshihiro Okura, Toshikatsu Kaneyama, Mikio Naruse y Yoshiaki Honda. "Nanoanalysis by a high-resolution energy filtering transmission electron microscope". Microscopy Research and Technique 63, n.º 3 (2004): 140–48. http://dx.doi.org/10.1002/jemt.20025.
Texto completoPonce, F. A., S. Suzuki, H. Kobayashi, Y. Ishibashi, Y. Ishida y T. Eto. "Ultra-high-vacuum, high-resolution Transmission Electron Microscopy at 400 kV". Proceedings, annual meeting, Electron Microscopy Society of America 44 (agosto de 1986): 606–9. http://dx.doi.org/10.1017/s0424820100144498.
Texto completoTakayanagi, Kunio. "High-Resolution UHV Electron Microscopy of Reconstructed and Adsorbed Surfaces". Proceedings, annual meeting, Electron Microscopy Society of America 48, n.º 1 (12 de agosto de 1990): 298–99. http://dx.doi.org/10.1017/s0424820100180240.
Texto completoGoode, Angela E., Alexandra E. Porter, Mary P. Ryan y David W. McComb. "Correlative electron and X-ray microscopy: probing chemistry and bonding with high spatial resolution". Nanoscale 7, n.º 5 (2015): 1534–48. http://dx.doi.org/10.1039/c4nr05922k.
Texto completoZhang, Zhen, Man Ping Liu, Ying Da Yu, Pål C. Skaret y Hans Jørgen Roven. "Microstructural Characterization of an Al-Mg-Si Aluminum Alloy Processed by Equal Channel Angular Pressing". Materials Science Forum 745-746 (febrero de 2013): 303–8. http://dx.doi.org/10.4028/www.scientific.net/msf.745-746.303.
Texto completoCosandey, F. "High Spatial Resolution EBSD Study of Nanosized Epitaxial Particles". Microscopy and Microanalysis 3, S2 (agosto de 1997): 559–60. http://dx.doi.org/10.1017/s1431927600009685.
Texto completovan der Krift, Theo, Ulrike Ziese, Willie Geerts y Bram Koster. "Computer-Controlled Transmission Electron Microscopy: Automated Tomography". Microscopy and Microanalysis 7, S2 (agosto de 2001): 968–69. http://dx.doi.org/10.1017/s1431927600030919.
Texto completoMori, Hideharu, Tomohiro Higuchi, Nobuo Otsuka y Minoru Terano. "High resolution transmission electron microscope observation of industrial high performance Ziegler catalysts". Macromolecular Chemistry and Physics 201, n.º 18 (1 de diciembre de 2000): 2789–98. http://dx.doi.org/10.1002/1521-3935(20001201)201:18<2789::aid-macp2789>3.0.co;2-i.
Texto completoPonce, F. A. y M. A. O'Keefe. "Achieving atomic resolution in the Transmission Electron Microscope". Proceedings, annual meeting, Electron Microscopy Society of America 44 (agosto de 1986): 522–25. http://dx.doi.org/10.1017/s0424820100144127.
Texto completoCarmichael, Stephen W. "Sub-Ångstrom Resolution". Microscopy Today 11, n.º 6 (diciembre de 2003): 3–7. http://dx.doi.org/10.1017/s1551929500053372.
Texto completoIshizuka, Kazuo. "New form of Transmission Cross Coefficient for High-Resolution Imaging". Proceedings, annual meeting, Electron Microscopy Society of America 48, n.º 1 (12 de agosto de 1990): 60–61. http://dx.doi.org/10.1017/s0424820100179051.
Texto completoZaluzec, Nestor J. "The Scanning Confocal Electron Microscope". Microscopy Today 11, n.º 6 (diciembre de 2003): 8–13. http://dx.doi.org/10.1017/s1551929500053384.
Texto completoXin, Yan, John Kynoch, Ke Han, Zhiyong Liang, Peter J. Lee, David C. Larbalestier, Yi-Feng Su, Kohei Nagahata, Toshihiro Aoki y Paolo Longo. "Facility Implementation and Comparative Performance Evaluation of Probe-Corrected TEM/STEM with Schottky and Cold Field Emission Illumination". Microscopy and Microanalysis 19, n.º 2 (5 de marzo de 2013): 487–95. http://dx.doi.org/10.1017/s1431927612014298.
Texto completoScheinfein, M. R., J. S. Drucker y J. K. Weiss. "The origins of high-resolution secondary-electron microscopy". Proceedings, annual meeting, Electron Microscopy Society of America 51 (1 de agosto de 1993): 766–67. http://dx.doi.org/10.1017/s0424820100149660.
Texto completoYoung, Richard, Todd Templeton, Laurent Roussel, Ingo Gestmann, Gerard van Veen, Trevor Dingle y Sander Henstra. "Extreme High-Resolution SEM: A Paradigm Shift". Microscopy Today 16, n.º 4 (julio de 2008): 24–29. http://dx.doi.org/10.1017/s1551929500059745.
Texto completoShimojo, Masayuki, Kazutaka Mitsuishi, M. Tanaka, M. Song y Kazuo Furuya. "Electron Beam-Induced Nano-Deposition Using a Transmission Electron Microscope". Materials Science Forum 480-481 (marzo de 2005): 129–32. http://dx.doi.org/10.4028/www.scientific.net/msf.480-481.129.
Texto completoMacLaren, Ian, Magnus Nord, Chengge Jiao y Emrah Yücelen. "Liftout of High-Quality Thin Sections of a Perovskite Oxide Thin Film Using a Xenon Plasma Focused Ion Beam Microscope". Microscopy and Microanalysis 25, n.º 1 (30 de enero de 2019): 115–18. http://dx.doi.org/10.1017/s1431927618016239.
Texto completoSinclair, Robert. "In situ High-Resolution Electron Microscopy". Proceedings, annual meeting, Electron Microscopy Society of America 47 (6 de agosto de 1989): 638–39. http://dx.doi.org/10.1017/s0424820100155165.
Texto completoVanderlinde, William. "Breaking the Resolution Barrier in the Scanning Electron Microscope". Microscopy Today 16, n.º 6 (noviembre de 2008): 28–35. http://dx.doi.org/10.1017/s1551929500062350.
Texto completoDeRose, J. A. y J. P. Revel. "Examination of Atomic (Scanning) Force Microscopy Probe Tips with the Transmission Electron Microscope". Microscopy and Microanalysis 3, n.º 3 (mayo de 1997): 203–13. http://dx.doi.org/10.1017/s143192769797015x.
Texto completoBleeker, Arno J. y J. Murray Gibson. "Objective-lens design for high resolution ultra high vacuum EM". Proceedings, annual meeting, Electron Microscopy Society of America 50, n.º 1 (agosto de 1992): 292–93. http://dx.doi.org/10.1017/s0424820100121867.
Texto completoSmith, David J., M. Gajdardziska-Josifovska y M. R. McCartney. "Surface studies with a UHV-TEM". Proceedings, annual meeting, Electron Microscopy Society of America 50, n.º 1 (agosto de 1992): 326–27. http://dx.doi.org/10.1017/s0424820100122034.
Texto completoHowe, J. M. "Quantitative in situ hot-stage high-resolution Transmission Electron Microscopy". Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 758–59. http://dx.doi.org/10.1017/s0424820100171523.
Texto completoBentley, J., N. D. Evans y E. A. Kenik. "Measurement of Scanning Electron Microscope resolution". Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 1044–45. http://dx.doi.org/10.1017/s0424820100172954.
Texto completoChapman, J. N. "High resolution imaging of magnetic structures in the transmission electron microscope". Materials Science and Engineering: B 3, n.º 4 (septiembre de 1989): 355–58. http://dx.doi.org/10.1016/0921-5107(89)90140-2.
Texto completoKuramochi, K., T. Yamazaki, N. Nakanishi, I. Hashimoto y K. Watanabe. "Shape effect of microtwins on high-resolution transmission electron microscope images". physica status solidi (a) 205, n.º 7 (26 de mayo de 2008): 1602–5. http://dx.doi.org/10.1002/pssa.200723491.
Texto completoMorishita, Shigeyuki, Ryo Ishikawa, Yuji Kohno, Hidetaka Sawada, Naoya Shibata y Yuichi Ikuhara. "Attainment of 40.5 pm spatial resolution using 300 kV scanning transmission electron microscope equipped with fifth-order aberration corrector". Microscopy 67, n.º 1 (22 de diciembre de 2017): 46–50. http://dx.doi.org/10.1093/jmicro/dfx122.
Texto completoNguyen, Thao A., Linn W. Hobbs y Peter R. Buseck. "High-Resolution Observation of Twinning in Fe1-XS Crystals". Proceedings, annual meeting, Electron Microscopy Society of America 43 (agosto de 1985): 224–25. http://dx.doi.org/10.1017/s0424820100118047.
Texto completoGnauck, Peter, Claus Burkhardt, Erich Plies y Wilfried Nisch. "In-Situ Ion Milling in the Transmission Electron Microscope (TEM) Outlook to a New Preparation Technique". Microscopy and Microanalysis 7, S2 (agosto de 2001): 932–33. http://dx.doi.org/10.1017/s1431927600030737.
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