Literatura académica sobre el tema "HIGH-RESOLUTION TRANSMISSION ELECTON MICROSCOPE"
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Artículos de revistas sobre el tema "HIGH-RESOLUTION TRANSMISSION ELECTON MICROSCOPE"
Feuer, Helmut, Lothar Schröpfer, Hartmut Fuess y David A. Jefferson. "High resolution transmission electron microscope study of exsolution in synthetic pigeonite". European Journal of Mineralogy 1, n.º 4 (31 de agosto de 1989): 507–16. http://dx.doi.org/10.1127/ejm/1/4/0507.
Texto completoKersker, M., C. Nielsen, H. Otsuji, T. Miyokawa y S. Nakagawa. "The JSM-890 ultra high resolution Scanning Electron Microscope". Proceedings, annual meeting, Electron Microscopy Society of America 47 (6 de agosto de 1989): 88–89. http://dx.doi.org/10.1017/s0424820100152410.
Texto completoMöller, Lars, Gudrun Holland y Michael Laue. "Diagnostic Electron Microscopy of Viruses With Low-voltage Electron Microscopes". Journal of Histochemistry & Cytochemistry 68, n.º 6 (21 de mayo de 2020): 389–402. http://dx.doi.org/10.1369/0022155420929438.
Texto completoGibson, J. M. "High Resolution Transmission Electron Microscopy". MRS Bulletin 16, n.º 3 (marzo de 1991): 27–33. http://dx.doi.org/10.1557/s0883769400057377.
Texto completoGamm, Björn, Holger Blank, Radian Popescu, Reinhard Schneider, André Beyer, Armin Gölzhäuser y Dagmar Gerthsen. "Quantitative High-Resolution Transmission Electron Microscopy of Single Atoms". Microscopy and Microanalysis 18, n.º 1 (12 de diciembre de 2011): 212–17. http://dx.doi.org/10.1017/s1431927611012232.
Texto completoSharma, Renu, Karl Weiss, Michael McKelvy y William Glaunsinger. "Gas reaction chamber for gas-solid interaction studies by high-resolution TEM". Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 494–95. http://dx.doi.org/10.1017/s0424820100170207.
Texto completoO'Keefe, Michael A., John H. Turner, John A. Musante, Crispin J. D. Hetherington, A. G. Cullis, Bridget Carragher, Ron Jenkins et al. "Laboratory Design for High-Performance Electron Microscopy". Microscopy Today 12, n.º 3 (mayo de 2004): 8–17. http://dx.doi.org/10.1017/s1551929500052093.
Texto completoTonomura, Akira. "1-MV Field-Emission Transmission Electron Microscope". Microscopy and Microanalysis 7, S2 (agosto de 2001): 918–19. http://dx.doi.org/10.1017/s143192760003066x.
Texto completoHiguchi, Tomohiro, Boping Liu, Hisayuki Nakatani, Nobuo Otsuka y Minoru Terano. "High resolution transmission electron microscope observation of α-TiCl3". Applied Surface Science 214, n.º 1-4 (mayo de 2003): 272–77. http://dx.doi.org/10.1016/s0169-4332(03)00517-8.
Texto completoSchatten, G., J. Pawley y H. Ris. "Integrated microscopy resource for biomedical research at the university of wisconsin at madison". Proceedings, annual meeting, Electron Microscopy Society of America 45 (agosto de 1987): 594–97. http://dx.doi.org/10.1017/s0424820100127451.
Texto completoTesis sobre el tema "HIGH-RESOLUTION TRANSMISSION ELECTON MICROSCOPE"
Chand, Gopal. "Aberration determination and compensation in high resolution transmission electron microscopy". Thesis, University of Cambridge, 1995. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.362968.
Texto completoPRAVEEN. "STUDY OF THIN FILM AND BULK SEMICONDUCTING MATERIALS FOR INTERFACE STRUCTURE AND OTHER PROPERTIES". Thesis, DELHI TECHNOLOGICAL UNIVERSITY, 2021. http://dspace.dtu.ac.in:8080/jspui/handle/repository/18645.
Texto completoAlexander, Jessica Anne. "High-Resolution Electron Energy-Loss Spectroscopy of Beam-Sensitive Functional Materials". The Ohio State University, 2018. http://rave.ohiolink.edu/etdc/view?acc_num=osu1531309653616002.
Texto completoKawasaki, T., K. Ueda, H. Tanaka, T. Tanji y M. Ichihashi. "In-situ Observation of Gold Nano-particle Catalysts by High-Resolution Closed-type Environmental-Cell Transmission Electron Microscope". Cambridge University Press, 2007. http://hdl.handle.net/2237/10509.
Texto completoTao, Shizhong. "High-resolution transmission electron microscopy of copper-oxide compounds /". [S.l.] : [s.n.], 1994. http://e-collection.ethbib.ethz.ch/show?type=diss&nr=10775.
Texto completoKong, Lisa (Lisa Fanzhen). "High-resolution transmission electron microscopy of III-V FinFETs". Thesis, Massachusetts Institute of Technology, 2018. http://hdl.handle.net/1721.1/119065.
Texto completoCataloged from PDF version of thesis.
Includes bibliographical references (pages 47-50).
III-V materials have great potential for integration into future complementary metal-oxide-semiconductor technology due to their outstanding electron transport properties. InGaAs n-channel metal-oxide-semiconductor field-effect transistors have already demonstrated promising characteristics, and the antimonide material system is emerging as a candidate for p-channel devices. As transistor technology scales down to the sub-10-nm regime, only devices with a 3D configuration can deliver the necessary performance. III-V fin field-effect transistors (finFETs) have displayed impressive characteristics but have shown degradation in performance as the fin width is scaled to the sub-10-nm regime. In this work, we use high-resolution transmission electron microscopy (HRTEM) in an effort to understand how interfacial properties between the channel and high-k dielectric affect device performance. At the interface between the channel material, such as InGaSb or InGaAs, and the high-k gate dielectric, properties of interest include defect density, interdiffusion between the semiconductor and dielectric, and roughness of the dielectric - semiconductor interface. Using HRTEM, we can directly study this interface and try to understand how it is affected by different processing conditions and its correlation with device characteristics. In this thesis, we have analyzed both InGaAs and InGaSb finFETs with state-of-the-art fin widths. Analysis of TEM images was combined with electrical data to correlate interfacial properties with device performance. We compared the materials properties of InGaAs and InGaSb and also explored the impact of processing steps on interfacial properties.
by Lisa Kong.
S.B.
Pierce, William Renton. "High-resolution transmission electron microscopy and electron energy loss spectroscopy of doped nanocarbons". Thesis, University of Manchester, 2014. https://www.research.manchester.ac.uk/portal/en/theses/highresolution-transmission-electron-microscopy-and-electron-energy-loss-spectroscopy-of-doped-nanocarbons(dd1340ba-4a31-49e5-a421-9dd47ea35256).html.
Texto completoLandauer, Matthew Noah. "Indirect modes of coherent imaging in high-resolution transmission electron microscopy". Thesis, University of Cambridge, 1996. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.627491.
Texto completoHaibo, E. "Quantitative analysis of core-shell nanoparticle catalysts by scanning transmission electron microscopy". Thesis, University of Oxford, 2013. http://ora.ox.ac.uk/objects/uuid:19c3b989-0ffb-487f-8cb3-f6e9dea83e63.
Texto completoGilkes, Kai William Reginald. "Tetrahedral carbon : studies using high resolution transmission electron microscopy and neutron scattering". Thesis, University of Cambridge, 1992. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.281952.
Texto completoLibros sobre el tema "HIGH-RESOLUTION TRANSMISSION ELECTON MICROSCOPE"
Peter, Buseck, Cowley J. M. 1923- y Eyring LeRoy, eds. High-resolution transmission electron microscopy and associated techniques. New York: Oxford University Press, 1988.
Buscar texto completoExperimental high-resolution electron microscopy. 2a ed. New York: Oxford University Press, 1988.
Buscar texto completoInc, ebrary, ed. High-resolution electron microscopy. New York: Oxford University Press, 2009.
Buscar texto completoHoriuchi, S. Fundamentals of high-resolution transmission electron microscopy. Amsterdam: North-Holland, 1994.
Buscar texto completoManfred, Rühle y Ernst F. 1938-, eds. High-resolution imaging and spectrometry of materials. Berlin: Springer, 2003.
Buscar texto completoManfred, Rühle y Ernst F. 1938-, eds. High-resolution imaging and spectrometry of materials. Berlin: Springer, 2003.
Buscar texto completoStructure analysis of advanced nanomaterials: Nanoworld by high-resolution electron microscopy. Berlin: De Gruyter, 2014.
Buscar texto completoTitchmarsh, J. M., C. M. Shepherd y I. A. Vatter. The Measurement of Chemical Composition with High Spatial Resolution Using a Dedicated Scanning Transmission Electron Microscope. AEA Technology Plc, 1987.
Buscar texto completo(Editor), Peter Buseck, John Cowley (Editor) y LeRoy Eyring (Editor), eds. High-Resolution Transmission Electron Microscopy: And Associated Techniques. Oxford University Press, USA, 1989.
Buscar texto completoSpence, John C. H. High-Resolution Electron Microscopy. Oxford University Press, 2008.
Buscar texto completoCapítulos de libros sobre el tema "HIGH-RESOLUTION TRANSMISSION ELECTON MICROSCOPE"
Howe, J. M. "Characterization of Heterophase Transformation Interfaces by High-Resolution Transmission Electron Microscope Techniques". En Impact of Electron and Scanning Probe Microscopy on Materials Research, 63–108. Dordrecht: Springer Netherlands, 1999. http://dx.doi.org/10.1007/978-94-011-4451-3_4.
Texto completoAkatsu, Hiroyuki, Yasuyuki Sumi y Iwao Ohdomari. "High-Resolution Transmission Electron Microscope Image of the SiO2/(001)Si Interface". En The Physics and Chemistry of SiO2 and the Si-SiO2 Interface 2, 247–56. Boston, MA: Springer US, 1993. http://dx.doi.org/10.1007/978-1-4899-1588-7_26.
Texto completoWilliams, David B. y C. Barry Carter. "High-Resolution TEM". En Transmission Electron Microscopy, 483–509. Boston, MA: Springer US, 2009. http://dx.doi.org/10.1007/978-0-387-76501-3_28.
Texto completoWilliams, David B. y C. Barry Carter. "High-Resolution TEM". En Transmission Electron Microscopy, 457–82. Boston, MA: Springer US, 1996. http://dx.doi.org/10.1007/978-1-4757-2519-3_28.
Texto completoDimitrijev, Sima, Jisheng Han y Jin Zou. "Investigation of SiO2-SiC Interface by High-Resolution Transmission Electron Microscope". En Silicon Carbide and Related Materials 2005, 975–78. Stafa: Trans Tech Publications Ltd., 2006. http://dx.doi.org/10.4028/0-87849-425-1.975.
Texto completoWilliams, David B. y C. Barry Carter. "Lenses, Apertures, and Resolution". En Transmission Electron Microscopy, 91–114. Boston, MA: Springer US, 2009. http://dx.doi.org/10.1007/978-0-387-76501-3_6.
Texto completoWilliams, David B. y C. Barry Carter. "Lenses, Apertures, and Resolution". En Transmission Electron Microscopy, 85–104. Boston, MA: Springer US, 1996. http://dx.doi.org/10.1007/978-1-4757-2519-3_6.
Texto completoKohler-Redlich, P. y J. Mayer. "Quantitative Analytical Transmission Electron Microscopy". En High-Resolution Imaging and Spectrometry of Materials, 119–87. Berlin, Heidelberg: Springer Berlin Heidelberg, 2003. http://dx.doi.org/10.1007/978-3-662-07766-5_4.
Texto completoWilliams, David B. y C. Barry Carter. "Spatial Resolution and Minimum Detection". En Transmission Electron Microscopy, 663–77. Boston, MA: Springer US, 2009. http://dx.doi.org/10.1007/978-0-387-76501-3_36.
Texto completoWilliams, David B. y C. Barry Carter. "Spatial Resolution and Minimum Detectability". En Transmission Electron Microscopy, 621–35. Boston, MA: Springer US, 1996. http://dx.doi.org/10.1007/978-1-4757-2519-3_36.
Texto completoActas de conferencias sobre el tema "HIGH-RESOLUTION TRANSMISSION ELECTON MICROSCOPE"
Young, Richard J., Michael P. Bernas, Mary V. Moore, Young-Chung Wang, Jay P. Jordan, Ruud Schampers y Ian van Hees. "In-Situ Sample Preparation and High-Resolution SEM-STEM Analysis". En ISTFA 2004. ASM International, 2004. http://dx.doi.org/10.31399/asm.cp.istfa2004p0331.
Texto completoEyring, LeRoy. "High-Resolution Transmission Electron Microscopy of Thin Films". En Optical Interference Coatings. Washington, D.C.: Optica Publishing Group, 1988. http://dx.doi.org/10.1364/oic.1988.tua1.
Texto completoVanderlinde, William E. "STEM (Scanning Transmission Electron Microscopy) in a SEM (Scanning Electron Microscope) for Failure Analysis and Metrology". En ISTFA 2002. ASM International, 2002. http://dx.doi.org/10.31399/asm.cp.istfa2002p0077.
Texto completoThompson, William B., John Notte, Larry Scipioni, Mohan Ananth, Lewis Stern, Colin Sanford y Shinichi Ogawa. "The Helium Ion Microscope for High Resolution Imaging, Materials Analysis, Circuit Edit and FA Applications". En ISTFA 2009. ASM International, 2009. http://dx.doi.org/10.31399/asm.cp.istfa2009p0339.
Texto completoCoyne, Edward. "A Working Method for Adapting the (SEM) Scanning Electron Microscope to Produce (STEM) Scanning Transmission Electron Microscope Images". En ISTFA 2002. ASM International, 2002. http://dx.doi.org/10.31399/asm.cp.istfa2002p0093.
Texto completoWang, Wen-Sheng, Chia Ho y Tien-Ming Chuang. "Formation of high-performance PtSi/p-Si Schottky barrier detector using high-resolution transmission electron microscope". En Asia Pacific Symposium on Optoelectronics '98, editado por Marek Osinski y Yan-Kuin Su. SPIE, 1998. http://dx.doi.org/10.1117/12.311006.
Texto completoJi, Hongjun, Mingyu Li, Younggak Kweon, Woongseong Chang y Chunqing Wang. "Observation of Ultrasonic Al-Si Wire Wedge Bond Interface Using High Resolution Transmission Electron Microscope". En 2007 8th International Conference on Electronic Packaging Technology. IEEE, 2007. http://dx.doi.org/10.1109/icept.2007.4441433.
Texto completoWang, Yafei, Songyan Hu, Guangxu Cheng, Zaoxiao Zhang y Jianxiao Zhang. "Influence of Quenching-Tempering on the Carbide Precipitation of 2.25Cr-1Mo-0.25V Steel Used in Reactor Pressure Vessels". En ASME 2019 Pressure Vessels & Piping Conference. American Society of Mechanical Engineers, 2019. http://dx.doi.org/10.1115/pvp2019-93054.
Texto completoHubbard, William A., Ho Leung Chan y B. C. Regan. "High-Resolution Conductivity Mapping with STEM EBIC". En ISTFA 2022. ASM International, 2022. http://dx.doi.org/10.31399/asm.cp.istfa2022p0251.
Texto completoRarback, Harvey, Christopher Jacobsen, John Kenney, Janos Kirz y Roy Rosser. "X-ray microscopy with synchrotron radiation". En OSA Annual Meeting. Washington, D.C.: Optica Publishing Group, 1985. http://dx.doi.org/10.1364/oam.1985.wl1.
Texto completoInformes sobre el tema "HIGH-RESOLUTION TRANSMISSION ELECTON MICROSCOPE"
Aksay, Ilhan A. y Mehmet Sarikaya. Acquisition of a High Voltage/High resolution Transmission Electron Microscope. Fort Belvoir, VA: Defense Technical Information Center, agosto de 1988. http://dx.doi.org/10.21236/ada200794.
Texto completoPennycook, S. J. y A. R. Lupini. Image Resolution in Scanning Transmission Electron Microscopy. Office of Scientific and Technical Information (OSTI), junio de 2008. http://dx.doi.org/10.2172/939888.
Texto completoRuben, G. C. High resolution transmission electron microscopy of melamine-formaldehyde aerogels and silica aerogels. Office of Scientific and Technical Information (OSTI), septiembre de 1991. http://dx.doi.org/10.2172/6186167.
Texto completoMarra, J. C., N. E. Bibler, J. R. Harbour y M. H. Tosten. Transmission electron microscopy of simulated DWPF high level nuclear waste glasses following gamma irradiation. Office of Scientific and Technical Information (OSTI), abril de 1994. http://dx.doi.org/10.2172/10142979.
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