Artículos de revistas sobre el tema "Hardware Under Test"
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Pomeranz, Irith. "Test Compaction by Test Removal Under Transparent Scan". IEEE Transactions on Very Large Scale Integration (VLSI) Systems 27, n.º 2 (febrero de 2019): 496–500. http://dx.doi.org/10.1109/tvlsi.2018.2878067.
Texto completoYin, Jiao, Hu Liu, Jun Wang y Ke Li. "Control System Design of Pneumatic Conveying in Sand/Dust Environment Simulation Test". Applied Mechanics and Materials 442 (octubre de 2013): 424–29. http://dx.doi.org/10.4028/www.scientific.net/amm.442.424.
Texto completoWan Jamaludin, Wan Shahmisufi, Tan Wei Ren, Bakhtiar Affendi Rosdi, Dahaman Ishak, Noor Hafizi Hanafi y Muhammad Nasiruddin Mahyuddin. "Adopting Hardware-In-the-Loop for Testing Vehicle Instrument Panel using Economical Approach". Indonesian Journal of Electrical Engineering and Computer Science 10, n.º 1 (1 de abril de 2018): 50. http://dx.doi.org/10.11591/ijeecs.v10.i1.pp50-58.
Texto completoZhang, Peng, Hou Jun Wang, Li Li y Ping Wang. "Design and Implementation of Intermediate Frequency Generation and Analysis Module for Avionics Test". Advanced Materials Research 1049-1050 (octubre de 2014): 1147–53. http://dx.doi.org/10.4028/www.scientific.net/amr.1049-1050.1147.
Texto completoTian, Zeng Hao. "MIMO Channel Research and Hardware Implementation". Applied Mechanics and Materials 543-547 (marzo de 2014): 2581–84. http://dx.doi.org/10.4028/www.scientific.net/amm.543-547.2581.
Texto completoLarsson, E. y S. Edbom. "Test data truncation for test quality maximisation under ATE memory depth constraint". IET Computers & Digital Techniques 1, n.º 1 (2007): 27. http://dx.doi.org/10.1049/iet-cdt:20050209.
Texto completoShi, Zhendong, Haocheng Ma, Qizhi Zhang, Yanjiang Liu, Yiqiang Zhao y Jiaji He. "Test Generation for Hardware Trojan Detection Using Correlation Analysis and Genetic Algorithm". ACM Transactions on Embedded Computing Systems 20, n.º 4 (junio de 2021): 1–20. http://dx.doi.org/10.1145/3446837.
Texto completoHan, Gu Jing, Meng Zou y Wu Zhi Min. "Research on Deadbeat Control for Three-Phase Grid-Connected Inverter in Model Based Design". Applied Mechanics and Materials 241-244 (diciembre de 2012): 1159–63. http://dx.doi.org/10.4028/www.scientific.net/amm.241-244.1159.
Texto completoAlymova, E. V. y O. V. Khachkinaev. "Automation of Software and Hardware Systems Acceptance Testing in the Paradigm of Behavior-Driven Development". Informacionnye Tehnologii 29, n.º 4 (18 de abril de 2023): 186–96. http://dx.doi.org/10.17587/it.29.189-196.
Texto completoWang, Zhi Shen y Gang Yan Li. "Compensation Control Network and Test of Bus Air Brake System in Under-Pressure State". Applied Mechanics and Materials 711 (diciembre de 2014): 342–46. http://dx.doi.org/10.4028/www.scientific.net/amm.711.342.
Texto completoPikuza, M. O. y S. Yu Mikhnevich. "Testing a hardware random number generator using NIST statistical test suite". Doklady BGUIR 19, n.º 4 (1 de julio de 2021): 37–42. http://dx.doi.org/10.35596/1729-7648-2021-19-4-37-42.
Texto completoPomeranz, I. y S. M. Reddy. "Test compaction methods for transition faults under transparent-scan". IET Computers & Digital Techniques 3, n.º 4 (2009): 315. http://dx.doi.org/10.1049/iet-cdt.2008.0115.
Texto completoPomeranz, Irith. "Reducing the input test data volume under transparent scan". IET Computers & Digital Techniques 8, n.º 1 (enero de 2014): 1–10. http://dx.doi.org/10.1049/iet-cdt.2013.0067.
Texto completoLi Jiang, Qiang Xu, K. Chakrabarty y T. M. Mak. "Integrated Test-Architecture Optimization and Thermal-Aware Test Scheduling for 3-D SoCs Under Pre-Bond Test-Pin-Count Constraint". IEEE Transactions on Very Large Scale Integration (VLSI) Systems 20, n.º 9 (septiembre de 2012): 1621–33. http://dx.doi.org/10.1109/tvlsi.2011.2160410.
Texto completoCHEN, CHENG-HSIEN y CHEN-YI LEE. "REDUCE THE MEMORY BANDWIDTH OF 3D GRAPHICS HARDWARE WITH A NOVEL RASTERIZER". Journal of Circuits, Systems and Computers 11, n.º 04 (agosto de 2002): 377–91. http://dx.doi.org/10.1142/s0218126602000525.
Texto completoVannahme, Anna, Jonas Busch, Mathias Ehrenwirth y Tobias Schrag. "Experimental Study of District Heating Substations in a Hardware-in-the-Loop Test Rig". Resources 12, n.º 4 (26 de marzo de 2023): 43. http://dx.doi.org/10.3390/resources12040043.
Texto completoParlato, Aldo, Elio Tomarchio, Cristiano Calligaro y Calogero Pace. "The methodology for active testing of electronic devices under the radiations". Nuclear Technology and Radiation Protection 33, n.º 1 (2018): 53–60. http://dx.doi.org/10.2298/ntrp1801053p.
Texto completoKerzérho, V., P. Cauvet, S. Bernard, F. Azaïs, M. Renovell, M. Comte y O. Chakib. "ADC Production Test Technique Using Low-Resolution Arbitrary Waveform Generator". VLSI Design 2008 (30 de abril de 2008): 1–8. http://dx.doi.org/10.1155/2008/482159.
Texto completoQian, Zheng Xiang y Yong Xin Shi. "Design and Realization of Test System for UAV Aeronautic Electronic Equipment". Applied Mechanics and Materials 644-650 (septiembre de 2014): 1158–61. http://dx.doi.org/10.4028/www.scientific.net/amm.644-650.1158.
Texto completoNiu, Ruibin. "Mechanical Vibration Test Based on the Wireless Vibration Monitoring System". Security and Communication Networks 2022 (25 de agosto de 2022): 1–8. http://dx.doi.org/10.1155/2022/9022128.
Texto completoLv, Zhao, Shuming Chen y Yaohua Wang. "Simulation-Based Hardware Verification with a Graph-Based Specification". Mathematical Problems in Engineering 2018 (2018): 1–10. http://dx.doi.org/10.1155/2018/6398616.
Texto completoHazen, John y L. Scorsone. "Infrared Sensor Calibration Facility". Journal of the IEST 35, n.º 1 (1 de enero de 1992): 33–40. http://dx.doi.org/10.17764/jiet.2.35.1.d536816582691754.
Texto completoZhi, Chuan. "Research on the Physical Training under the Internet Environment". Applied Mechanics and Materials 687-691 (noviembre de 2014): 2875–78. http://dx.doi.org/10.4028/www.scientific.net/amm.687-691.2875.
Texto completoSalman, Muhammad, Antoine Ligot y Mauro Birattari. "Concurrent design of control software and configuration of hardware for robot swarms under economic constraints". PeerJ Computer Science 5 (30 de septiembre de 2019): e221. http://dx.doi.org/10.7717/peerj-cs.221.
Texto completoSiddiqui, Atif, Muhammad Yousuf Irfan Zia y Pablo Otero. "A Universal Machine-Learning-Based Automated Testing System for Consumer Electronic Products". Electronics 10, n.º 2 (10 de enero de 2021): 136. http://dx.doi.org/10.3390/electronics10020136.
Texto completoSiddiqui, Atif, Muhammad Yousuf Irfan Zia y Pablo Otero. "A Universal Machine-Learning-Based Automated Testing System for Consumer Electronic Products". Electronics 10, n.º 2 (10 de enero de 2021): 136. http://dx.doi.org/10.3390/electronics10020136.
Texto completoTang, Yan Kun, Kun Yang, Yan Nan Zhai y Hui Zhang. "A Design of Safety Lock Testing Instrument Based on 89S52 Singlechip and LabVIEW". Applied Mechanics and Materials 347-350 (agosto de 2013): 1549–52. http://dx.doi.org/10.4028/www.scientific.net/amm.347-350.1549.
Texto completoBai, Yang, Xin Zhang, Qiang Yang, Yong Yang, Weibo Deng y Di Yao. "Multi-Channel Data Acquisition Card under New Acquisition and Transmission Architecture of High Frequency Ground Wave Radar". Sensors 21, n.º 4 (5 de febrero de 2021): 1128. http://dx.doi.org/10.3390/s21041128.
Texto completoTestori, Marcello, Olivier Lamquet y Giuliano Matli. "Real-Time hardware-in-the-loop grid simulator to test generating units’ speed governors under islanding operating conditions". IFAC-PapersOnLine 49, n.º 27 (2016): 188–94. http://dx.doi.org/10.1016/j.ifacol.2016.10.681.
Texto completoEdemsky, Dmitry, Alexei Popov, Igor Prokopovich y Vladimir Garbatsevich. "Airborne Ground Penetrating Radar, Field Test". Remote Sensing 13, n.º 4 (12 de febrero de 2021): 667. http://dx.doi.org/10.3390/rs13040667.
Texto completoSchoberer, Thomas, Jan Weyr, Gernot Steindl, Gregor Görtler y Werner Stutterecker. "Comparison of the Energy Performance of a Heat Pump under Various Conditions by Using a Hardware-in-the-Loop (HIL) Test Method". Applied Mechanics and Materials 887 (enero de 2019): 622–32. http://dx.doi.org/10.4028/www.scientific.net/amm.887.622.
Texto completoHoren, Y., A. Kuperman, Z. Vainer, S. Tapuchi y M. Averbukh. "Emulating time varying nonlinear uncertainties and disturbances in linear time invariant systems". SIMULATION 88, n.º 12 (26 de septiembre de 2012): 1499–507. http://dx.doi.org/10.1177/0037549712459788.
Texto completoWeyr, Jan, Thomas Schoberer y Werner Stutterecker. "Communication Analysis of Hardware-in-the-Loop Test Method for Heat Pumps and Chillers". Applied Mechanics and Materials 887 (enero de 2019): 587–96. http://dx.doi.org/10.4028/www.scientific.net/amm.887.587.
Texto completoMarinissen, E. J., B. Vermeulen, H. Hollmann y R. G. Bennetts. "Minimizing pattern count for interconnect test under a ground bounce constraint". IEEE Design & Test of Computers 20, n.º 2 (marzo de 2003): 8–18. http://dx.doi.org/10.1109/mdt.2003.1188257.
Texto completoPorobic, Vlado, Evgenije Adzic y Milan Rapaic. "HIL evaluation of control unit in grid-tied coverters". Thermal Science 20, suppl. 2 (2016): 393–406. http://dx.doi.org/10.2298/tsci150928025p.
Texto completoWang, Weizheng, Zhuo Deng y Jin Wang. "Enhancing Sensor Network Security with Improved Internal Hardware Design". Sensors 19, n.º 8 (12 de abril de 2019): 1752. http://dx.doi.org/10.3390/s19081752.
Texto completoWang, Jun y Xiao Lu Li. "Dynamic Temperature Test for PTC Material Used to Heat Diesel". Applied Mechanics and Materials 321-324 (junio de 2013): 158–62. http://dx.doi.org/10.4028/www.scientific.net/amm.321-324.158.
Texto completoPomeranz, I. y S. M. Reddy. "Test generation for embedded circuits under the transparent-scan approach". IEE Proceedings - Computers and Digital Techniques 152, n.º 6 (2005): 713. http://dx.doi.org/10.1049/ip-cdt:20045151.
Texto completoLiu, Mengnan, Chuiquan Wei y Liyou Xu. "Development of Cooperative Controller for Dual-Motor Independent Drive Electric Tractor". Mathematical Problems in Engineering 2020 (11 de noviembre de 2020): 1–12. http://dx.doi.org/10.1155/2020/4826904.
Texto completoAbdurakhmanov, Sh, Zh Chyngysheva, B. Musaliev y E. Tilekov. "Results of the Controlled Clinical Test of Intraoperative Blood Reinfusion Hardware, Assembled From the Abdominal Cavity in Conditions of Slow and Fast Modes". Bulletin of Science and Practice 6, n.º 2 (15 de febrero de 2020): 111–17. http://dx.doi.org/10.33619/2414-2948/51/08.
Texto completoZhang, Wei Xin, Wei Bing Bai, Chao Xu, Wei Yuan Chen y Rui Jiang. "A Facial Recognition System Based on Integral Image". Applied Mechanics and Materials 687-691 (noviembre de 2014): 3905–8. http://dx.doi.org/10.4028/www.scientific.net/amm.687-691.3905.
Texto completoKladovščikov, Leonid, Marijan Jurgo y Romualdas Navickas. "Design of an Oscillation-Based BIST System for Active Analog Integrated Filters in 0.18 µm CMOS". Electronics 8, n.º 7 (20 de julio de 2019): 813. http://dx.doi.org/10.3390/electronics8070813.
Texto completoLeibfritz, M. M., M. D. Blech, F. M. Landstorfer y T. F. Eibert. "A comparison of software- and hardware-gating techniques applied to near-field antenna measurements". Advances in Radio Science 5 (12 de junio de 2007): 43–48. http://dx.doi.org/10.5194/ars-5-43-2007.
Texto completoLiu, Yanjiang, Yiqiang Zhao, Jiaji He y Ruishan Xin. "A Statistical Test Generation Based on Mutation Analysis for Improving the Hardware Trojan Detection". Journal of Circuits, Systems and Computers 29, n.º 03 (3 de junio de 2019): 2050049. http://dx.doi.org/10.1142/s0218126620500498.
Texto completoHIGAMI, Yoshinobu, Hiroshi TAKAHASHI, Shin-ya KOBAYASHI y Kewal K. SALUJA. "Test Generation for Delay Faults on Clock Lines under Launch-on-Capture Test Environment". IEICE Transactions on Information and Systems E96.D, n.º 6 (2013): 1323–31. http://dx.doi.org/10.1587/transinf.e96.d.1323.
Texto completoBalike, M., S. Rakheja y S. V. Hoa. "STUDY OF AN ENERGY DISSIPATING UNDER-RIDE GUARD USING HARDWARE-IN-THE-LOOP SIMULATION". Transactions of the Canadian Society for Mechanical Engineering 23, n.º 2 (junio de 1999): 307–20. http://dx.doi.org/10.1139/tcsme-1999-0021.
Texto completoMuhammad, Moiz, Holger Behrends, Stefan Geißendörfer, Karsten von Maydell y Carsten Agert. "Power Hardware-in-the-Loop: Response of Power Components in Real-Time Grid Simulation Environment". Energies 14, n.º 3 (25 de enero de 2021): 593. http://dx.doi.org/10.3390/en14030593.
Texto completoDelgado, María Luisa, Jorge E. Jiménez-Hornero y Francisco Vázquez. "Design, Implementation and Validation of a Hardware-in-the-Loop Test Bench for Heating Systems in Conventional Coaches". Applied Sciences 13, n.º 4 (9 de febrero de 2023): 2212. http://dx.doi.org/10.3390/app13042212.
Texto completoIman-Eini, Hossein y Sarath B. Tennakoon. "Investigation of a cascaded H-bridge photovoltaic inverter under non-uniform insolation conditions by hardware-in-the-loop test". International Journal of Electrical Power & Energy Systems 105 (febrero de 2019): 330–40. http://dx.doi.org/10.1016/j.ijepes.2018.08.017.
Texto completoGarzia, Fabio, Johannes Rossouw van der Merwe, Alexander Rügamer, Santiago Urquijo y Wolfgang Felber. "HDDM Hardware Evaluation for Robust Interference Mitigation". Sensors 20, n.º 22 (13 de noviembre de 2020): 6492. http://dx.doi.org/10.3390/s20226492.
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