Artículos de revistas sobre el tema "Focused Ion Beam machining"
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Allen, D. M., P. Shore, R. W. Evans, C. Fanara, W. O’Brien, S. Marson y W. O’Neill. "Ion beam, focused ion beam, and plasma discharge machining". CIRP Annals 58, n.º 2 (2009): 647–62. http://dx.doi.org/10.1016/j.cirp.2009.09.007.
Texto completoHung, N. P., Y. Q. Fu y M. Y. Ali. "Focused ion beam machining of silicon". Journal of Materials Processing Technology 127, n.º 2 (septiembre de 2002): 256–60. http://dx.doi.org/10.1016/s0924-0136(02)00153-x.
Texto completoYoung, Richard J. "Micro-machining using a focused ion beam". Vacuum 44, n.º 3-4 (marzo de 1993): 353–56. http://dx.doi.org/10.1016/0042-207x(93)90182-a.
Texto completoChen, Yan, Li Bao An y Xiao Xia Yang. "Recent Development of Focused Ion Beam System and Application". Advanced Materials Research 753-755 (agosto de 2013): 2578–81. http://dx.doi.org/10.4028/www.scientific.net/amr.753-755.2578.
Texto completoSun, Ji Ning, Xi Chun Luo, Wen Long Chang y James M. Ritchie. "Fabrication of Freeform Micro Optics by Focused Ion Beam". Key Engineering Materials 516 (junio de 2012): 414–19. http://dx.doi.org/10.4028/www.scientific.net/kem.516.414.
Texto completoAtiqah, N., I. H. Jaafar, Mohammad Yeakub Ali y B. Asfana. "Application of Focused Ion Beam Micromachining: A Review". Advanced Materials Research 576 (octubre de 2012): 507–10. http://dx.doi.org/10.4028/www.scientific.net/amr.576.507.
Texto completoTaniguchi, Jun, Shin-ichi Satake, Takaki Oosumi, Akihisa Fukushige y Yasuo Kogo. "Dwell time adjustment for focused ion beam machining". Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 307 (julio de 2013): 248–52. http://dx.doi.org/10.1016/j.nimb.2013.02.039.
Texto completoKitamura, Masaru, Eijiro Koike, Noboru Takasu y Tetsuro Nishimura. "Focused Ion Beam Machining for Optical Microlens Fabrication". Japanese Journal of Applied Physics 41, Part 1, No. 6A (15 de junio de 2002): 4019–21. http://dx.doi.org/10.1143/jjap.41.4019.
Texto completoDavies, ST y B. Khamsehpour. "Focused ion beam machining and deposition for nanofabrication". Vacuum 47, n.º 5 (mayo de 1996): 455–62. http://dx.doi.org/10.1016/0042-207x(95)00235-9.
Texto completoJiang, Xiao Xiao, Feng Wen Wang, Zhen He Ma, Qiong Chan Gu, Jiang Tao Lv y Guang Yuan Si. "Arbitrary Structures Fabricated by Focused Ion Beam Milling". Advanced Materials Research 661 (febrero de 2013): 66–69. http://dx.doi.org/10.4028/www.scientific.net/amr.661.66.
Texto completoHUNG, WEN-CHANG, A. ADAWI, A. TAHRAOUI y A. G. CULLIS. "ORGANIC SEMICONDUCTOR MICRO-PILLAR PROCESSED BY FOCUSED ION BEAM MILLING". International Journal of Quantum Information 03, supp01 (noviembre de 2005): 223–28. http://dx.doi.org/10.1142/s0219749905001407.
Texto completoPellerin, J. G. "Focused ion beam machining of Si, GaAs, and InP". Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 8, n.º 6 (noviembre de 1990): 1945. http://dx.doi.org/10.1116/1.584880.
Texto completoDravid, Vinayak P., Steven Kim y Luke N. Brewer. "Focused Ion Beam (FIB): More than Just a Fancy Ion Beam Thinner". Microscopy and Microanalysis 6, S2 (agosto de 2000): 504–5. http://dx.doi.org/10.1017/s1431927600035017.
Texto completoHosokawa, Hiroyuki, Takeshi Nakajima y Koji Shimojima. "Focused Ion Beam Micro-Machining Properties on WC-Co Alloys". Journal of the Japan Society of Powder and Powder Metallurgy 53, n.º 2 (2006): 187–91. http://dx.doi.org/10.2497/jjspm.53.187.
Texto completoYoshida, Y., W. Okazaki y T. Uchida. "Laser and focused ion beam combined machining for micro dies". Review of Scientific Instruments 83, n.º 2 (febrero de 2012): 02B901. http://dx.doi.org/10.1063/1.3662018.
Texto completoThaus, D. M. "Development of focused ion-beam machining techniques for Permalloy structures". Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 14, n.º 6 (noviembre de 1996): 3928. http://dx.doi.org/10.1116/1.588697.
Texto completoLee, Hiwon, Jin Han, Byung-Kwon Min y Sang Jo Lee. "Geometric Compensation of Focused Ion Beam Machining Using Image Processing". Applied Physics Express 1 (5 de diciembre de 2008): 127002. http://dx.doi.org/10.1143/apex.1.127002.
Texto completoGuénolé, J., A. Prakash y E. Bitzek. "Atomistic simulations of focused ion beam machining of strained silicon". Applied Surface Science 416 (septiembre de 2017): 86–95. http://dx.doi.org/10.1016/j.apsusc.2017.04.027.
Texto completoDravid, Vinayak P. "Focused Ion Beam (FIB): More than Just a Fancy Ion Beam Thinner". Microscopy and Microanalysis 7, S2 (agosto de 2001): 926–27. http://dx.doi.org/10.1017/s1431927600030701.
Texto completoOKUMOTO, Takashi, Kousuke SAWAI, Jun TANIGUCHI, Takaki OOSUMI, Shin-ichi SATAKE, Shun YAMASHINA y Yasuo KOGO. "A31 Focused ion beam machining of silicon carbide(M4 processes and micro-manufacturing for science)". Proceedings of International Conference on Leading Edge Manufacturing in 21st century : LEM21 2009.5 (2009): 623–26. http://dx.doi.org/10.1299/jsmelem.2009.5.623.
Texto completoYOSHIDA, Yoshikazu. "102 Laser and focused ion beam combined machining for micro dies". Proceedings of Yamanashi District Conference 2012 (2012): 4–5. http://dx.doi.org/10.1299/jsmeyamanashi.2012.4.
Texto completoMasuzawa, Tsuneaki, Yoshikazu Yoshida, Hiromichi Ikeda, Keigo Oguchi, Hikaru Yamagishi y Yuji Wakabayashi. "Development of a local vacuum system for focused ion beam machining". Review of Scientific Instruments 80, n.º 7 (julio de 2009): 073708. http://dx.doi.org/10.1063/1.3186060.
Texto completoDi Maio, D. y S. G. Roberts. "Measuring fracture toughness of coatings using focused-ion-beam-machined microbeams". Journal of Materials Research 20, n.º 2 (1 de febrero de 2005): 299–302. http://dx.doi.org/10.1557/jmr.2005.0048.
Texto completoKim, Y., A. Y. Abuelfilat, S. P. Hoo, A. Al-Abboodi, B. Liu, Tuck Ng, P. Chan y J. Fu. "Tuning the surface properties of hydrogel at the nanoscale with focused ion irradiation". Soft Matter 10, n.º 42 (2014): 8448–56. http://dx.doi.org/10.1039/c4sm01061b.
Texto completoWang, Houxiao, Wei Zhou y Er Ping Li. "Focused Ion Beam Assisted Interface Detection for Fabricating Functional Plasmonic Nanostructures". Journal of Nanomaterials 2015 (2015): 1–9. http://dx.doi.org/10.1155/2015/468069.
Texto completoMiura, Kohichi, Syou Satoh, Takazo Yamada y Hwa Soo Lee. "Effect of Machining of Small Tools by Means of Focused Ion Beam". Advanced Materials Research 565 (septiembre de 2012): 588–93. http://dx.doi.org/10.4028/www.scientific.net/amr.565.588.
Texto completoWang, Hou Xiao, Wei Zhou y Er Ping Li. "Focused Ion Beam Nano-Precision Machining for Analyzing Photonic Structures in Butterfly". Key Engineering Materials 447-448 (septiembre de 2010): 174–77. http://dx.doi.org/10.4028/www.scientific.net/kem.447-448.174.
Texto completoITO, Hiroaki, Kohshi ITO, Masahiro ARAI, Kohichi SUGIMOTO, Toshiaki MATSUKURA y Ryutaro MAEDA. "Focused Ion Beam Machining of Precision Die for Micro Optical Lens Molding". Journal of the Japan Society for Precision Engineering, Contributed Papers 70, n.º 12 (2004): 1549–53. http://dx.doi.org/10.2493/jspe.70.1549.
Texto completoLalev, G., S. Dimov, J. Kettle, F. van Delft y R. Minev. "Data preparation for focused ion beam machining of complex three-dimensional structures". Proceedings of the Institution of Mechanical Engineers, Part B: Journal of Engineering Manufacture 222, n.º 1 (enero de 2008): 67–76. http://dx.doi.org/10.1243/09544054jem864.
Texto completoSabouri, Aydin, Carl J. Anthony, Philip D. Prewett, James Bowen y Haider Butt. "Effects of current on early stages of focused ion beam nano-machining". Materials Research Express 2, n.º 5 (11 de mayo de 2015): 055005. http://dx.doi.org/10.1088/2053-1591/2/5/055005.
Texto completoPicard, Y. N., D. P. Adams, M. J. Vasile y M. B. Ritchey. "Focused ion beam-shaped microtools for ultra-precision machining of cylindrical components". Precision Engineering 27, n.º 1 (enero de 2003): 59–69. http://dx.doi.org/10.1016/s0141-6359(02)00188-5.
Texto completoKim, Sang-Jae y Koji Iwasaki. "Development of Focused Ion Beam Machining Systems for Fabricating Three-Dimensional Structures". Japanese Journal of Applied Physics 47, n.º 6 (20 de junio de 2008): 5120–22. http://dx.doi.org/10.1143/jjap.47.5120.
Texto completoSabouri, A., C. J. Anthony, J. Bowen, V. Vishnyakov y P. D. Prewett. "The effects of dwell time on focused ion beam machining of silicon". Microelectronic Engineering 121 (junio de 2014): 24–26. http://dx.doi.org/10.1016/j.mee.2014.02.025.
Texto completoWollschläger, Nicole, Werner Österle, Ines Häusler y Mark Stewart. "Ga+implantation in a PZT film during focused ion beam micro-machining". physica status solidi (c) 12, n.º 3 (9 de febrero de 2015): 314–17. http://dx.doi.org/10.1002/pssc.201400096.
Texto completoSrinivasan, Dheepa y GE Power. "Cold Spray: Advanced Characterization Methods—Focused Ion Beam Machining and Electron Probe Microanalysis". AM&P Technical Articles 175, n.º 4 (1 de mayo de 2017): 42–43. http://dx.doi.org/10.31399/asm.amp.2017-04.p042.
Texto completoDeinhart, Victor, Lisa-Marie Kern, Jan N. Kirchhof, Sabrina Juergensen, Joris Sturm, Enno Krauss, Thorsten Feichtner et al. "The patterning toolbox FIB-o-mat: Exploiting the full potential of focused helium ions for nanofabrication". Beilstein Journal of Nanotechnology 12 (6 de abril de 2021): 304–18. http://dx.doi.org/10.3762/bjnano.12.25.
Texto completoRussell, P. E., T. J. Stark, D. P. Griffis y J. C. Gonzales. "Chemically Assisted Focused ION Beam Micromachining: Overview, Recent Developments and Current Needs". Microscopy and Microanalysis 7, S2 (agosto de 2001): 928–29. http://dx.doi.org/10.1017/s1431927600030713.
Texto completoBauer, Jens, Melanie Ulitschka, Frank Frost y Thomas Arnold. "Figuring of optical aluminium devices by reactive ion beam etching". EPJ Web of Conferences 215 (2019): 06002. http://dx.doi.org/10.1051/epjconf/201921506002.
Texto completoJoe, Hang-Eun, Won-Sup Lee, Martin B. G. Jun, No-Cheol Park y Byung-Kwon Min. "Material interface detection based on secondary electron images for focused ion beam machining". Ultramicroscopy 184 (enero de 2018): 37–43. http://dx.doi.org/10.1016/j.ultramic.2017.10.012.
Texto completoTAKAHASHI, Nobuhiko, Hayato YOSHIOKA y Hidenori SHINNO. "Study on Nano-Machining of Hard and Brittle Material with Focused Ion Beam". Journal of the Japan Society for Precision Engineering 74, n.º 5 (2008): 491–97. http://dx.doi.org/10.2493/jjspe.74.491.
Texto completoSun, J., J. Li, R. R. J. Maier, D. P. Hand, W. N. MacPherson, M. K. Miller, J. M. Ritchie y X. Luo. "Fabrication of a side aligned optical fibre interferometer by focused ion beam machining". Journal of Micromechanics and Microengineering 23, n.º 10 (5 de septiembre de 2013): 105005. http://dx.doi.org/10.1088/0960-1317/23/10/105005.
Texto completoJakubéczyová, Dagmar y Beáta Ballóková. "The Analyse of Nanocomposite Thin Coatings Using Specimens Prepared by Focused Ion Beam Milling". Materials Science Forum 891 (marzo de 2017): 579–85. http://dx.doi.org/10.4028/www.scientific.net/msf.891.579.
Texto completoAhn, Sung-Hoon, Hae-Sung Yoon, Ki-Hwan Jang, Eun-Seob Kim, Hyun-Taek Lee, Gil-Yong Lee, Chung-Soo Kim y Suk-Won Cha. "Nanoscale 3D printing process using aerodynamically focused nanoparticle (AFN) printing, micro-machining, and focused ion beam (FIB)". CIRP Annals 64, n.º 1 (2015): 523–26. http://dx.doi.org/10.1016/j.cirp.2015.03.007.
Texto completoScott, Simon y Zulfiqur Ali. "Fabrication Methods for Microfluidic Devices: An Overview". Micromachines 12, n.º 3 (18 de marzo de 2021): 319. http://dx.doi.org/10.3390/mi12030319.
Texto completoXia, Xinyi, Nahid Al-Mamun, Warywoba Daudi, Fan Ren, Aman Haque y Stephen J. Pearton. "Ga+ Focused Ion Beam Damage in n-type Ga2O3 and Its Recovery after Annealing Treatment". ECS Meeting Abstracts MA2022-02, n.º 34 (9 de octubre de 2022): 1245. http://dx.doi.org/10.1149/ma2022-02341245mtgabs.
Texto completoKawasegi, Noritaka, Tomoyuki Niwata, Noboru Morita, Kazuhito Nishimura y Hideki Sasaoka. "Improving machining performance of single-crystal diamond tools irradiated by a focused ion beam". Precision Engineering 38, n.º 1 (enero de 2014): 174–82. http://dx.doi.org/10.1016/j.precisioneng.2013.09.001.
Texto completoDing, X., D. L. Butler, G. C. Lim, C. K. Cheng, K. C. Shaw, K. Liu, W. S. Fong y H. Y. Zheng. "Machining with micro-size single crystalline diamond tools fabricated by a focused ion beam". Journal of Micromechanics and Microengineering 19, n.º 2 (14 de enero de 2009): 025005. http://dx.doi.org/10.1088/0960-1317/19/2/025005.
Texto completoKawasegi, Noritaka, Kazuma Ozaki, Noboru Morita, Kazuhito Nishimura, Makoto Yamaguchi y Noboru Takano. "Nanopatterning on Nano-Polycrystalline Diamond and Cubic Boron Nitride Using Focused Ion Beam and Heat Treatment to Fabricate Textured Cutting Tools". Materials Science Forum 874 (octubre de 2016): 543–48. http://dx.doi.org/10.4028/www.scientific.net/msf.874.543.
Texto completoYang, Liangliang, Jiangtao Wei, Zhe Ma, Peishuai Song, Jing Ma, Yongqiang Zhao, Zhen Huang, Mingliang Zhang, Fuhua Yang y Xiaodong Wang. "The Fabrication of Micro/Nano Structures by Laser Machining". Nanomaterials 9, n.º 12 (16 de diciembre de 2019): 1789. http://dx.doi.org/10.3390/nano9121789.
Texto completoJoe, Hang-Eun, Jae-Hyeong Park, Seong Hyeon Kim, Gyuho Kim, Martin B. G. Jun y Byung-Kwon Min. "Effects of coating material on the fabrication accuracy of focused ion beam machining of insulators". Japanese Journal of Applied Physics 54, n.º 9 (28 de agosto de 2015): 096602. http://dx.doi.org/10.7567/jjap.54.096602.
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