Libros sobre el tema "FIELD EMISSION OF ELECTRONS"

Mesi︠a︡t︠s︡, G. A. Explosive electron emission. Ekaterinburg: URO-Press, 1998.

Egorov, Nikolay y Evgeny Sheshin. Field Emission Electronics. Cham: Springer International Publishing, 2017. http://dx.doi.org/10.1007/978-3-319-56561-3.

Brodusch, Nicolas, Hendrix Demers y Raynald Gauvin. Field Emission Scanning Electron Microscopy. Singapore: Springer Singapore, 2018. http://dx.doi.org/10.1007/978-981-10-4433-5.

Fleck, Roland A. y Bruno M. Humbel. Biological Field Emission Scanning Electron Microscopy. Chichester, UK: John Wiley & Sons, Ltd, 2019. http://dx.doi.org/10.1002/9781118663233.

Tan ji bo mo zhi bei ji chang zhi dian zi fa she: Tanji bomo zhibei ji changzhi dianzi fashe. Zhengzhou Shi: Zhengzhou da xue chu ban she, 2009.

Fursey, George. Field emission in vacuum microelectronics. New York, NY: Kluwer Academic/Plenum Publishers, 2004.

Archer, Anthony David. Spectroscopic studies of field-induced electron emission from isolated microstructures. Birmingham: Aston University. Department of Electrical Engineering and Applied Physics, 1992.

Prasad, Ghatak Kamakhya, ed. Fowler-Nordheim field emission: Effects in semiconductor nanostructures. Heidelberg: Springer, 2012.

Kapustin, Vladimir, Aleksandr Sigov, Illarion Li y Vladimir Mel'nikov. Point defects in oxides and emission properties. ru: INFRA-M Academic Publishing LLC., 2022. http://dx.doi.org/10.12737/1846464.

Hill, D. A. Detection of quasi-static electric fields radiated by electrically small emitters. [Gaithersburg, Md.]: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 2000.

1938-, Cavcey Kenneth H. y National Institute of Standards and Technology (U.S.), eds. Detection of quasi-static electric fields radiated by electrically small emitters. [Gaithersburg, Md.]: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 2000.

Hill, D. A. Detection of quasi-static electric fields radiated by electrically small emitters. [Gaithersburg, Md.]: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 2000.

Hill, D. A. Detection of quasi-static electric fields radiated by electrically small emitters. [Gaithersburg, Md.]: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 2000.

Hill, D. A. Detection of quasi-static electric fields radiated by electrically small emitters. [Gaithersburg, Md.]: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 2000.

Hill, D. A. Detection of quasi-static electric fields radiated by electrically small emitters. [Gaithersburg, Md.]: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 2000.

1938-, Cavcey Kenneth H. y National Institute of Standards and Technology (U.S.), eds. Detection of quasi-static electric fields radiated by electrically small emitters. [Gaithersburg, Md.]: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 2000.

Hill, D. A. Detection of quasi-static electric fields radiated by electrically small emitters. [Gaithersburg, Md.]: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 2000.

Fielding, Trevor Joseph. An investigation of the field electron emission processes responsible for the flashover of high voltage vacuum devices. Birmingham: Aston University. Department of Electrical and Electronic Engineering, 1986.

United States. General Accounting Office., ed. Protest Of NASA Contract Award For Field Emission Scanning Electron Microscope... 158967, B-277160... U.S. GAO... July 2, 1997. [S.l: s.n., 1998.

1945-, Hasselkamp D., ed. Particle induced electron emission II. Berlin: Springer-Verlag, 1992.

Jahnke, J. A. Continuous emission monitoring. New York: Van Nostrand Reinhold, 1993.

Gomer, Robert. Field emission and field ionization. New York: American Institute of Physics, 1993.

Gomer, R. Field emission and field ionization. New York: American Institute of Physics, 1993.

Ion-induced electron emission from crystalline solids. Berlin: Springer, 2002.

Bhattacharya, Sitangshu y Kamakhya Prasad Ghatak. Fowler-Nordheim Field Emission. Berlin, Heidelberg: Springer Berlin Heidelberg, 2012. http://dx.doi.org/10.1007/978-3-642-20493-7.

1951-, DuBois R. D. y Rivarola R. D. 1949-, eds. Electron emission in heavy-ion-atom collisions. Berlin: Springer, 1997.

S, MacRae Gregory y United States. National Aeronautics and Space Administration., eds. Requirements for long-life operation of inert gas hollow cathodes--preliminary report. [Washington, DC: National Aeronautics and Space Administration, 1990.

Thierry, Lemogne, Montes Henri y United States. National Aeronautics and Space Administration., eds. Aluminum work function: Effect of oxidation, mechanical scraping, and ion bombardment. [Washington, DC]: National Aeronautics and Space Administration, 1985.

Vsesoi͡uznai͡a konferent͡sii͡a po ėmissionnoĭ ėlektronike (10th 1987 Kiev, Ukraine). Tezisy dokladov XX Vsesoi͡uznoĭ konferent͡sii po ėmissionnoĭ ėlektronike. Kiev: In-t fiziki AN USSR, 1987.

S, MacRae Gregory y United States. National Aeronautics and Space Administration., eds. Requirements for long-life operation of inert gas hollow cathodes--preliminary report. [Washington, DC: National Aeronautics and Space Administration, 1990.

S, MacRae Gregory y United States. National Aeronautics and Space Administration., eds. Requirements for long-life operation of inert gas hollow cathodes--preliminary report. [Washington, DC: National Aeronautics and Space Administration, 1990.

International Vacuum Microelectronics Conference (11th 1998 Asheville, North Carolina). IVMC'98: Eleventh International Vacuum Microelectronics Conference : July 19-24, 1998, the Grove Park Inn, Asheville, NC, USA. Piscataway, New Jersey: IEEE, 1998.

Lazutin, Leonid L. X-Ray Emission of Auroral Electrons and Magnetospheric Dynamics. Editado por Theodore J. Rosenberg. Berlin, Heidelberg: Springer Berlin Heidelberg, 1986. http://dx.doi.org/10.1007/978-3-642-70398-0.

X-ray emission of auroral electrons and magnetospheric dynamics. Berlin: Springer-Verlag, 1986.

Brodie, Ivor y Paul Schwoebel, eds. Field Emission in Vacuum Microelectronics. Boston, MA: Springer US, 2005. http://dx.doi.org/10.1007/b139052.

Field emission in vacuum microelectronics. New York: Kluwer Academic/Plenum Publishers, 2003.

Praprotnik, Boštjan. Emissionsverhalten von Flüssigmetall-Ionen-\-Elektronen-Emittern. Berlin: Köster, 1995.

Evtukh, Anatoliy. Vacuum nanoelectronic devices: Novel electron sources and applications. Chichester, West Sussex, United Kingdom: John Wiley & Sons, Inc., 2015.

International Field Emission Symposium (38th 1991 Vienna). Field emission '91: Proceedings of the 38th International Field Emission Symposium, Vienna, Austria, 5-9 August 1991. Editado por Mitterauer Johannes. Amsterdam: North-Holland, 1992.

Gundel, Hartmut W. Electron emission from ferroelectrics: A new generation of pulsed electron beam sources. Aachen: Shaker, 1996.

Fīrudo emisshon disupurei: Development of field emission display. Tōkyō: Shīemushī Shuppan, 2009.

Atomic and free electrons in a strong light field. Singapore: World Scientific, 1997.

Egorov, Nikolay y Evgeny Sheshin. Field Emission Electronics. Springer, 2018.

Field Emission Electronics. Springer, 2017.

Liang, Shi-Dong. Quantum Tunneling and Field Electron Emission Theories. World Scientific Publishing Co Pte Ltd, 2013.

Field, Thermionic and Secondary Electron Emission Spectroscopy. Springer, 2013.

Fleck, Roland A. y Bruno M. Humbel. Biological Field Emission Scanning Electron Microscopy. Wiley & Sons, Incorporated, John, 2019.

Fleck, Roland A. y Bruno M. Humbel. Biological Field Emission Scanning Electron Microscopy. Wiley & Sons, Limited, John, 2019.

Fleck, Roland A. y Bruno M. Humbel. Biological Field Emission Scanning Electron Microscopy. Wiley & Sons, Limited, John, 2019.

Fleck, Roland A. y Bruno M. Humbel. Biological Field Emission Scanning Electron Microscopy. Wiley & Sons, Incorporated, John, 2019.