Artículos de revistas sobre el tema "Field emission gun (FEG)"
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Joy, David C. "Microanalysis with a 200keV FEG TEM". Proceedings, annual meeting, Electron Microscopy Society of America 49 (agosto de 1991): 700–701. http://dx.doi.org/10.1017/s0424820100087811.
Texto completoBrock, Judith M., Max T. Otten y Marc J. C. de Jong. "Performance and applications of a field-emission gun TEM/STEM". Proceedings, annual meeting, Electron Microscopy Society of America 50, n.º 2 (agosto de 1992): 942–43. http://dx.doi.org/10.1017/s0424820100129346.
Texto completoTomita, T., S. Katoh, H. Kitajima, Y. Kokubo y Y. Ishida. "Development of Field-Emission Gun for High-Voltage Electron Microscope". Proceedings, annual meeting, Electron Microscopy Society of America 48, n.º 2 (12 de agosto de 1990): 94–95. http://dx.doi.org/10.1017/s0424820100134065.
Texto completoMul, P. M., B. J. M. Bormans y L. Schaap. "Design of a Field-Emission Gun for the Phillips CM20/STEM microscope". Proceedings, annual meeting, Electron Microscopy Society of America 48, n.º 2 (12 de agosto de 1990): 100–101. http://dx.doi.org/10.1017/s0424820100134090.
Texto completoMurakoshi, H., M. Ichihashi, T. Komoda, S. Isakozawa y T. Kubo. "Field-emission gun and illuminating lens system for 200kV FE-TEM". Proceedings, annual meeting, Electron Microscopy Society of America 47 (6 de agosto de 1989): 110–11. http://dx.doi.org/10.1017/s0424820100152525.
Texto completoOlson, N. H., U. Lücken, S. B. Walker, M. T. Otten y T. S. Baker. "Cryoelectron microscopy and image reconstruction of spherical viruses with spot scan and FEG technologies". Proceedings, annual meeting, Electron Microscopy Society of America 53 (13 de agosto de 1995): 1086–87. http://dx.doi.org/10.1017/s0424820100141809.
Texto completoOhi, M., K. Harasawa, T. Niikura, H. Okazaki, Y. Ishimori, T. Miyokawa y S. Nakagawa. "Development of a New Digital Fe SEM". Proceedings, annual meeting, Electron Microscopy Society of America 48, n.º 1 (12 de agosto de 1990): 432–33. http://dx.doi.org/10.1017/s0424820100180914.
Texto completoTroyon, Michel y He Ning Lei. "Electron Trajectories Calculations of an Energy - Filtering Field-Emission Gun". Proceedings, annual meeting, Electron Microscopy Society of America 48, n.º 1 (12 de agosto de 1990): 192–93. http://dx.doi.org/10.1017/s0424820100179713.
Texto completoKaneyama, T., M. Kawasaki, T. Tomita, T. Honda y M. Kersker. "The information limit of a 200kv field emission TEM". Proceedings, annual meeting, Electron Microscopy Society of America 53 (13 de agosto de 1995): 586–87. http://dx.doi.org/10.1017/s0424820100139305.
Texto completoCoened, W. M. J., A. J. E. M. Janssend, M. Op de Beeck, D. Van Dyck, E. J. Van Zwet y H. W. Zandbergen. "Focus-variation image reconstruction in field-emission TEM". Proceedings, annual meeting, Electron Microscopy Society of America 51 (1 de agosto de 1993): 1070–71. http://dx.doi.org/10.1017/s0424820100151180.
Texto completoNeves, F., A. Cunha, I. Martins, J. B. Correia, M. Oliveira y E. Gaffet. "Ni4Ti3 Precipitation during Ageing of MARES NiTi Shape Memory Alloys Studied by FEG-SEM". Microscopy and Microanalysis 14, S3 (septiembre de 2008): 13–16. http://dx.doi.org/10.1017/s1431927608089241.
Texto completoHombourger, C. y M. Outrequin. "Quantitative Analysis and High-Resolution X-ray Mapping with a Field Emission Electron Microprobe". Microscopy Today 21, n.º 3 (mayo de 2013): 10–15. http://dx.doi.org/10.1017/s1551929513000515.
Texto completoOtten, Max T. y Wim M. J. Coene. "Principle and practice of high-resolution imaging with a field-emission TEM". Proceedings, annual meeting, Electron Microscopy Society of America 50, n.º 1 (agosto de 1992): 138–39. http://dx.doi.org/10.1017/s0424820100121090.
Texto completoGarratt-Reed, Anthony J. y Sebastian von Harrach. "Early experience with a 300kV FEG STEM". Proceedings, annual meeting, Electron Microscopy Society of America 49 (agosto de 1991): 348–49. http://dx.doi.org/10.1017/s0424820100086040.
Texto completoCui, Wen y Shao Jun Qi. "The Effect of Surface Finish on Zinc Whisker Growth". Advanced Materials Research 472-475 (febrero de 2012): 2756–59. http://dx.doi.org/10.4028/www.scientific.net/amr.472-475.2756.
Texto completoKrivanek, Ondrej L., James H. Paterson y Helmut R. Poppa. "Performance of the Gatan PEELS™ on the VG HB501 STEM". Proceedings, annual meeting, Electron Microscopy Society of America 47 (6 de agosto de 1989): 410–11. http://dx.doi.org/10.1017/s0424820100154020.
Texto completoVeiss, J. K. y R. W. Carpenter. "A study of small probe formation in a field emission gun TEM/STEM". Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 510–11. http://dx.doi.org/10.1017/s0424820100104613.
Texto completoCoene, W., A. F. de Jong, H. Lichte, M. Op de Beeck, H. Tietz y D. Van Dyck. "FEG - TEM: The route to HREM". Proceedings, annual meeting, Electron Microscopy Society of America 50, n.º 1 (agosto de 1992): 100–101. http://dx.doi.org/10.1017/s0424820100120904.
Texto completoIshikawa, I., K. Kaneyama, T. Tomita, T. Honda y M. Kersker. "Information limit of a 300kV field emission TEM". Proceedings, annual meeting, Electron Microscopy Society of America 53 (13 de agosto de 1995): 588–89. http://dx.doi.org/10.1017/s0424820100139317.
Texto completoHarada, Ken, Haruto Nagata, Ryuichi Shimizu, Takayoshi Tanji y Keiji Yada. "<310> Single-Crystal LaB6 as Thermal Field Emitter for Electron Microscope". Proceedings, annual meeting, Electron Microscopy Society of America 48, n.º 1 (12 de agosto de 1990): 196–97. http://dx.doi.org/10.1017/s0424820100179737.
Texto completoXavier, Camila Soares, Ana Paula de Moura, Elson Longo, José Arana Varela y Maria Aparecida Zaghete. "Synthesis and Optical Property of MgMoO4 Crystals". Advanced Materials Research 975 (julio de 2014): 243–47. http://dx.doi.org/10.4028/www.scientific.net/amr.975.243.
Texto completoHowe, J. M., S. P. Ringer, B. C. Muddle y I. J. Polmear. "Analytical Electron Microscopy of nanometer-size precipitates in al alloys with a 200-kV field-emission TEM". Proceedings, annual meeting, Electron Microscopy Society of America 54 (11 de agosto de 1996): 574–75. http://dx.doi.org/10.1017/s0424820100165331.
Texto completoSun, H. P., H. Li, H. D. Li, G. T. Zou, Z. Zhang y X. Q. Pan. "Electron Beam Irradiation Induced Structural Modulation and Damage in GaN Nano Crystals". Microscopy and Microanalysis 7, S2 (agosto de 2001): 492–93. http://dx.doi.org/10.1017/s1431927600028531.
Texto completoStark, H., E. Beckmann, R. Henderson y F. Zemlin. "SOPHIE, a helium cooled superconducting Electron Microscope with a Schottky field emitter". Proceedings, annual meeting, Electron Microscopy Society of America 53 (13 de agosto de 1995): 72–73. http://dx.doi.org/10.1017/s0424820100136738.
Texto completoNavarro da Rocha, Daniel, Leila Rosa de Oliveira Cruz, João Luiz do Prado Neto, Nadia Mohammed Elmassalami Ayad, Luciano de Andrade Gobbo y Marcelo Henrique Prado da Silva. "Production and Characterization of Hydroxyapatite/Niobo Phosphate Glass Scaffold". Key Engineering Materials 587 (noviembre de 2013): 128–31. http://dx.doi.org/10.4028/www.scientific.net/kem.587.128.
Texto completoWatanabe, M., D. W. Ackland, A. Burrows, C. J. Kiely, D. B. Williams, O. L. Krivanek, N. Dellby, M. F. Murfitt y Z. Szilagyi. "Improvements in the X-Ray Analytical Capabilities of a Scanning Transmission Electron Microscope by Spherical-Aberration Correction". Microscopy and Microanalysis 12, n.º 6 (11 de octubre de 2006): 515–26. http://dx.doi.org/10.1017/s1431927606060703.
Texto completoOhye, Toshimi, Yoshiki Uchikawa, Chiaki Morita y Hiroshi Shimoyama. "Aberrations of Accelerating Tube for High-Voltage Electron Microscope". Proceedings, annual meeting, Electron Microscopy Society of America 48, n.º 1 (12 de agosto de 1990): 194–95. http://dx.doi.org/10.1017/s0424820100179725.
Texto completoOikawa, T., M. Kawasaki, T. Kaneyama, Y. Ohkura y M. Naruse. "The New EF-TEM with OMEGA and FEG". Microscopy and Microanalysis 7, S2 (agosto de 2001): 1128–29. http://dx.doi.org/10.1017/s1431927600031718.
Texto completoNavarro da Rocha, Daniel, Leila Rosa de Oliveira Cruz, Luciano de Andrade Gobbo y Marcelo Henrique Prado da Silva. "Bioactivity Assessment of Niobate Apatite". Key Engineering Materials 614 (junio de 2014): 3–6. http://dx.doi.org/10.4028/www.scientific.net/kem.614.3.
Texto completoSandim, Hugo Ricardo Zschommler y Dierk Raabe. "An EBSD Study on Orientation Effects during Recrystallization of Coarse-Grained Niobium". Materials Science Forum 467-470 (octubre de 2004): 519–24. http://dx.doi.org/10.4028/www.scientific.net/msf.467-470.519.
Texto completoVronka, Marek y Miroslav Karlík. "Microstructure and Mechanical Properties of Al-Mn Sheets with Zr Addition". Key Engineering Materials 606 (marzo de 2014): 19–22. http://dx.doi.org/10.4028/www.scientific.net/kem.606.19.
Texto completoToptan, F., Ayfer Kilicarslan y Isil Kerti. "The Effect of Ti Addition on the Properties of Al-B4C Interface: A Microstructural Study". Materials Science Forum 636-637 (enero de 2010): 192–97. http://dx.doi.org/10.4028/www.scientific.net/msf.636-637.192.
Texto completoPezzotti, Giuseppe. "Interfacial Residual Stresses in Semiconductor Devices Measured on the Nano-Scale by Cathodoluminescence Piezospectroscopy". Solid State Phenomena 127 (septiembre de 2007): 123–28. http://dx.doi.org/10.4028/www.scientific.net/ssp.127.123.
Texto completoNavarro da Rocha, Daniel, Leila Rosa de Oliveira Cruz, Dindo Q. Mijares, Rubens Lincoln Santana Blazutti Marçal, José Brant de Campos, Paulo G. Coelho y Marcelo Henrique Prado da Silva. "Bioactivity Assessment of Calcium Phosphate Coatings". Key Engineering Materials 720 (noviembre de 2016): 193–96. http://dx.doi.org/10.4028/www.scientific.net/kem.720.193.
Texto completoNenadovic, Milos, Danilo Kisic, Miljana Mirkovic, Snezana Nenadovic y Ljiljana Kljajevic. "Structural and optical properties of HDPE implanted with medium fluences silver ions". Science of Sintering 53, n.º 2 (2021): 187–98. http://dx.doi.org/10.2298/sos2102187n.
Texto completoTakeguchi, M., T. Honda, Y. Ishida, M. Kersker, M. Tanaka y K. Furuya. "Ultrahigh-Vacuum Field-Emission Electron Microscope as Applied to Observation and Analysis of Crystal Surface". Microscopy and Microanalysis 3, S2 (agosto de 1997): 597–98. http://dx.doi.org/10.1017/s1431927600009879.
Texto completoKrause, S. J., W. W. Adams, S. Kumar, T. Reilly y T. Suziki. "Low-voltage, high-resolution scanning electron microscopy of polymers". Proceedings, annual meeting, Electron Microscopy Society of America 45 (agosto de 1987): 466–67. http://dx.doi.org/10.1017/s0424820100127037.
Texto completoBentley, J. "Interfacial Segregation Studied With Modern AEM Techniques". Microscopy and Microanalysis 3, S2 (agosto de 1997): 533–34. http://dx.doi.org/10.1017/s1431927600009557.
Texto completoLanteri, S., D. Gendt, P. Barges y G. Petitgand. "Comparison of Particle Size Analyses from FEG-SEM and TEM Images". Microscopy and Microanalysis 6, S2 (agosto de 2000): 380–81. http://dx.doi.org/10.1017/s1431927600034395.
Texto completoPezzotti, Giuseppe. "Nano-Scale Stress Microscopy of Ceramic Materials Using Their Cathodoluminescence Emission". Materials Science Forum 502 (diciembre de 2005): 263–68. http://dx.doi.org/10.4028/www.scientific.net/msf.502.263.
Texto completoNavarro da Rocha, Daniel, Leila Rosa de Oliveira Cruz, Dindo Q. Mijares, Rubens Lincoln Santana Blazutti Marçal, José Brant de Campos, Paulo G. Coelho y Marcelo Henrique Prado da Silva. "Temperature Influence on the Calcium Phosphate Coatings by Chemical Method". Key Engineering Materials 720 (noviembre de 2016): 197–200. http://dx.doi.org/10.4028/www.scientific.net/kem.720.197.
Texto completoPezzotti, Giuseppe, Andrea Leto, Kiyotaka Yamada y Alessandro Alan Porporati. "Electro-Stimulated Piezo-Spectroscopy for Measuring Nano-Scale Residual Stress Fields in Ceramics". Advances in Science and Technology 45 (octubre de 2006): 1658–63. http://dx.doi.org/10.4028/www.scientific.net/ast.45.1658.
Texto completoWang, Z. L. y J. Bentley. "In situ REM imaging of surface processes on ceramic bulk crystals from 300 to 1670 K in a conventional TEM". Proceedings, annual meeting, Electron Microscopy Society of America 49 (agosto de 1991): 660–61. http://dx.doi.org/10.1017/s0424820100087616.
Texto completoCliff, G. y P. B. Kenway. "The future of AEM: Toward atom analysis". Proceedings, annual meeting, Electron Microscopy Society of America 47 (6 de agosto de 1989): 200–201. http://dx.doi.org/10.1017/s0424820100152975.
Texto completoCzernuszka, J. T., N. J. Long y P. B. Hirsch. "Electron channelling contrast imaging of dislocations". Proceedings, annual meeting, Electron Microscopy Society of America 48, n.º 4 (agosto de 1990): 410–11. http://dx.doi.org/10.1017/s0424820100175181.
Texto completoGoldstein, J. I., C. E. Lyman y J. Zhang. "Spatial Resolution and Detectability Limits in Thin-Film X-ay Microanalysis". Proceedings, annual meeting, Electron Microscopy Society of America 48, n.º 2 (12 de agosto de 1990): 450–51. http://dx.doi.org/10.1017/s042482010013585x.
Texto completoWang, Z. L., A. Goyal y D. M. Kroeger. "Interface microstructures in melt-textured YBa2Cu3O7-δ on Ag-Pd and flux pinning centers introduced by Y2BaCuO5 particles". Proceedings, annual meeting, Electron Microscopy Society of America 50, n.º 1 (agosto de 1992): 72–73. http://dx.doi.org/10.1017/s042482010012076x.
Texto completoWatanabe, M., D. W. Ackland y D. B. Williams. "Practical Estimation of Analytical Sensitivity for EDS in an Intermediate Voltage FEG-STEM". Microscopy and Microanalysis 3, S2 (agosto de 1997): 965–66. http://dx.doi.org/10.1017/s1431927600011715.
Texto completoPezzotti, Giuseppe, Atsuo Matsutani, Maria Chiara Munisso y Wen Liang Zhu. "Advanced Nano-Scale Metrology for the Characterization of Ceramic Materials in the Scanning Electron Microscope". Materials Science Forum 606 (octubre de 2008): 93–101. http://dx.doi.org/10.4028/www.scientific.net/msf.606.93.
Texto completoYang, J. C., A. Singhal, S. Bradley y J. M. Gibson. "Nano-Sized Catalytic Materials Investigated by a STEM-Based Mass Spectroscopic Technique". Microscopy and Microanalysis 3, S2 (agosto de 1997): 443–44. http://dx.doi.org/10.1017/s1431927600009107.
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