Literatura académica sobre el tema "Field emission gun (FEG)"
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Artículos de revistas sobre el tema "Field emission gun (FEG)"
Joy, David C. "Microanalysis with a 200keV FEG TEM". Proceedings, annual meeting, Electron Microscopy Society of America 49 (agosto de 1991): 700–701. http://dx.doi.org/10.1017/s0424820100087811.
Texto completoBrock, Judith M., Max T. Otten y Marc J. C. de Jong. "Performance and applications of a field-emission gun TEM/STEM". Proceedings, annual meeting, Electron Microscopy Society of America 50, n.º 2 (agosto de 1992): 942–43. http://dx.doi.org/10.1017/s0424820100129346.
Texto completoTomita, T., S. Katoh, H. Kitajima, Y. Kokubo y Y. Ishida. "Development of Field-Emission Gun for High-Voltage Electron Microscope". Proceedings, annual meeting, Electron Microscopy Society of America 48, n.º 2 (12 de agosto de 1990): 94–95. http://dx.doi.org/10.1017/s0424820100134065.
Texto completoMul, P. M., B. J. M. Bormans y L. Schaap. "Design of a Field-Emission Gun for the Phillips CM20/STEM microscope". Proceedings, annual meeting, Electron Microscopy Society of America 48, n.º 2 (12 de agosto de 1990): 100–101. http://dx.doi.org/10.1017/s0424820100134090.
Texto completoMurakoshi, H., M. Ichihashi, T. Komoda, S. Isakozawa y T. Kubo. "Field-emission gun and illuminating lens system for 200kV FE-TEM". Proceedings, annual meeting, Electron Microscopy Society of America 47 (6 de agosto de 1989): 110–11. http://dx.doi.org/10.1017/s0424820100152525.
Texto completoOlson, N. H., U. Lücken, S. B. Walker, M. T. Otten y T. S. Baker. "Cryoelectron microscopy and image reconstruction of spherical viruses with spot scan and FEG technologies". Proceedings, annual meeting, Electron Microscopy Society of America 53 (13 de agosto de 1995): 1086–87. http://dx.doi.org/10.1017/s0424820100141809.
Texto completoOhi, M., K. Harasawa, T. Niikura, H. Okazaki, Y. Ishimori, T. Miyokawa y S. Nakagawa. "Development of a New Digital Fe SEM". Proceedings, annual meeting, Electron Microscopy Society of America 48, n.º 1 (12 de agosto de 1990): 432–33. http://dx.doi.org/10.1017/s0424820100180914.
Texto completoTroyon, Michel y He Ning Lei. "Electron Trajectories Calculations of an Energy - Filtering Field-Emission Gun". Proceedings, annual meeting, Electron Microscopy Society of America 48, n.º 1 (12 de agosto de 1990): 192–93. http://dx.doi.org/10.1017/s0424820100179713.
Texto completoKaneyama, T., M. Kawasaki, T. Tomita, T. Honda y M. Kersker. "The information limit of a 200kv field emission TEM". Proceedings, annual meeting, Electron Microscopy Society of America 53 (13 de agosto de 1995): 586–87. http://dx.doi.org/10.1017/s0424820100139305.
Texto completoCoened, W. M. J., A. J. E. M. Janssend, M. Op de Beeck, D. Van Dyck, E. J. Van Zwet y H. W. Zandbergen. "Focus-variation image reconstruction in field-emission TEM". Proceedings, annual meeting, Electron Microscopy Society of America 51 (1 de agosto de 1993): 1070–71. http://dx.doi.org/10.1017/s0424820100151180.
Texto completoTesis sobre el tema "Field emission gun (FEG)"
Dylewski, Benoît. "Caractérisation expérimentale multi-échelles et multi-techniques du rail prélevé en service : de la déformation plastique sévère et des évolutions de microstructure à l'amorçage de fissures par Fatigue de Contact de Roulement". Electronic Thesis or Diss., Compiègne, 2016. http://www.theses.fr/2016COMP2324.
Texto completoThis work is dedicated to the characterization of severe plastic deformation and microstructure evolution induced in rails in service, leading to cracks initiation by Rolling Contact Fatigue. Initiation of these surface cracks and in-depth propagation involve several phenomena at the microstructure scale which can lead to surface spalling at the macroscopic scale or even to brutal failure of the rail during its service. To improve understanding of these various phenomena beneath the rail surface, an experimental, multi-scales and multi-techniques methodology has been followed on rails removed from service. In the first part of results, the presence of a three-dimensional gradient of microstructure, of crystallography and of mechanical properties induced by the repeated contacts with wheels has been highlighted in a rail head during its service. Then, by means of a field analysis campaign of rails removed from service at several accumulated loads, the different stages of in-depth gradients development and plastic deformation accumulated in the rail head have been estimated in relation with total accumulated tonnage and cracks initiation. This study contributes to improve the understanding of the damage mechanisms in rolling contact fatigue of rails in service and the modeling of rail plasticity and crack propagation by including anisotropy of the running band and effect of in-depth microstructure evolution
Liška, Ivo. "Coulomb Interactions in Electron Beams in the Vicinity of a Schottky and Cold Field Emission Sources". Doctoral thesis, Vysoké učení technické v Brně. Fakulta strojního inženýrství, 2010. http://www.nusl.cz/ntk/nusl-233896.
Texto completoBrenac, Ariel. "Développements instrumentaux pour la photoémission inverse". Grenoble 1, 1987. http://www.theses.fr/1987GRE10010.
Texto completoLiao, Po-Hsinag y 廖柏翔. "Development of Field Emission Electron Gun for Desktop Electron Microscope". Thesis, 2018. http://ndltd.ncl.edu.tw/handle/3d5ybg.
Texto completo國立清華大學
工程與系統科學系
106
With the development of technology, electron microscope has become an important observational tool in different major such as physics, chemistry, biology, and materials engineering. The source of electron microscope, it usually divide into two types, thermionic type and field emission type. Field emission type electron source usually have smaller tip radius than thermal type, so it can produce smaller electron source. Then, electron beam pass by condenser lens, a small spot size source is formed. Therefore, the brightness of the electron gun is much brighter than thermal type source. In addition, field emission source spectral energy distribution is close to monochromatic, and has smaller energy spread. So field emission source has better coherence that lead it obtain higher resolution. Although field-emission type electron gun have above advantages, but it need to maintain in high vacuum condition. Because the tip of the field emission electron gun can easily react with impurities in the air, and lead the needle tip blunt. When the needle tip is blunt, it will cause the field emission gun poor efficiency. So the field emission type electron gun needs lots of high vacuum equipment to maintain it stay in high vacuum condition and high efficiency. The purpose of this research is using cheaper and more convenient ways to produce a field emission electron gun tip. And then set it up on our lab’s group made Desktop Electron Microscope to improve the resolution. In this paper, we successfully fabricated a field electron gun tip using electrolytic machining. The radius of curvature of the electron gun tip is about 100 nm or less, and its reproduction rate is also high. Finally, we also tried to deposit ZrO on the tip to make thermionic (Schottky) type field electron gun. After that, we also design some components installed on our Desktop Electron Microscope to finish field emission microscope.
YIN, k. M. y 殷開明. "Field emission gun TEM research for Cu-Bi alloys in grain boundary segregation". Thesis, 1996. http://ndltd.ncl.edu.tw/handle/21098675102269389780.
Texto completoChang, Holin y 張豪麟. "Failure Analysis of Diffusion Barrier Layer in VLSI Deviceby Field Emission Gun Energy Filter TEM". Thesis, 1996. http://ndltd.ncl.edu.tw/handle/75194869367329745607.
Texto completoCapítulos de libros sobre el tema "Field emission gun (FEG)"
Lich, Ben, Faysal Boughorbel, Pavel Potocek y Emine Korkmaz. "FEG-SEM for Large Volume 3D Structural Analysis in Life Sciences". En Biological Field Emission Scanning Electron Microscopy, 103–15. Chichester, UK: John Wiley & Sons, Ltd, 2019. http://dx.doi.org/10.1002/9781118663233.ch6.
Texto completoBrodusch, Nicolas, Hendrix Demers y Raynald Gauvin. "Developments in Field Emission Gun Technologies and Advanced Detection Systems". En Field Emission Scanning Electron Microscopy, 5–12. Singapore: Springer Singapore, 2017. http://dx.doi.org/10.1007/978-981-10-4433-5_2.
Texto completoMook, H. W. y P. Kruit. "Electrostatic in-line monochromator for Schottky Field Emission Gun". En Electron Microscopy and Analysis 1997, 81–84. Boca Raton: CRC Press, 2022. http://dx.doi.org/10.1201/9781003063056-19.
Texto completoActas de conferencias sobre el tema "Field emission gun (FEG)"
Chen, Tao, Chen Xue-dong, Xiao-ming Lian y Zhi-chao Fan. "Effect of Ti Additions on Microstructure and Mechanical Properties of Centrifugally Cast 25Cr-35Ni-Nb Alloy". En ASME 2016 Pressure Vessels and Piping Conference. American Society of Mechanical Engineers, 2016. http://dx.doi.org/10.1115/pvp2016-63411.
Texto completoSpathis, V. y M. C. Price. "Experiments using a light gas gun to investigate the impact melting of gunshot residue analogues". En 2019 15th Hypervelocity Impact Symposium. American Society of Mechanical Engineers, 2019. http://dx.doi.org/10.1115/hvis2019-030.
Texto completoWang, L., R. J. K. Wood, H. E. G. Powrie, E. Streit y I. Care. "Performance Evaluation of Hybrid (Ceramic on Steel) Bearings With Advanced Aircraft Engine Oils for Lubrication". En ASME Turbo Expo 2004: Power for Land, Sea, and Air. ASMEDC, 2004. http://dx.doi.org/10.1115/gt2004-53418.
Texto completoLin, Kun-Lin, Jian-Shing Luo, Hsiu-Ting Lee y Jeremy D. Russell. "Localized Epoxy Layer Formation on Surface Defect Using a Micro-Brush in a Plucking System". En ISTFA 2009. ASM International, 2009. http://dx.doi.org/10.31399/asm.cp.istfa2009p0126.
Texto completoHawco, Jessica, Elliott Burden, Edison Sripal y Lesley James. "Evaluating the Prospect of Oil Production in Tight Winterhouse Formation Rocks in Western Newfoundland". En SPE Canadian Energy Technology Conference. SPE, 2022. http://dx.doi.org/10.2118/208908-ms.
Texto completoLuan, B. F., R. S. Qiu, Z. Zhou, K. L. Murty, J. Zhou y Q. Liu. "Characterization of Hot Deformation Behavior of Zr-1.0Sn-0.3Nb-0.3Fe-0.1Cr Using Processing Map". En 2013 21st International Conference on Nuclear Engineering. American Society of Mechanical Engineers, 2013. http://dx.doi.org/10.1115/icone21-15186.
Texto completoLewis, Samantha M., Julian Merrick, Mohamed A. K. Othman, Andrew Haase, Sami Tantawi y Emilio A. Nanni. "A THz-Driven Field Emission Electron Gun". En 2020 45th International Conference on Infrared, Millimeter and Terahertz Waves (IRMMW-THz). IEEE, 2020. http://dx.doi.org/10.1109/irmmw-thz46771.2020.9370485.
Texto completoShao, J. H., S. Antipov, S. V. Baryshev, H. B. Chen, M. E. Conde, D. S. Doran, W. Gai et al. "Field emission study using an L-band photocathode gun". En ADVANCED ACCELERATOR CONCEPTS 2016: 16th Advanced Accelerator Concepts Workshop. Author(s), 2016. http://dx.doi.org/10.1063/1.4965637.
Texto completoGetty, Stephanie A., Todd T. King, Rachael A. Bis, Hollis H. Jones, Federico Herrero, Bernard A. Lynch, Patrick Roman y Paul Mahaffy. "Performance of a carbon nanotube field emission electron gun". En Defense and Security Symposium, editado por Thomas George y Zhongyang Cheng. SPIE, 2007. http://dx.doi.org/10.1117/12.720995.
Texto completoEroshkin, Pavel A. y Evgeny P. Sheshin. "Electron gun with field emission cathode for x-ray tube". En 2014 Tenth International Vacuum Electron Sources Conference (IVESC). IEEE, 2014. http://dx.doi.org/10.1109/ivesc.2014.6891972.
Texto completoInformes sobre el tema "Field emission gun (FEG)"
Thangaraj, Charles. Gated Field-Emission Cathode Radio-Frequency (RF) Gun. Office of Scientific and Technical Information (OSTI), noviembre de 2016. http://dx.doi.org/10.2172/1433861.
Texto completoJay L. Hirshfield. Rf Gun with High-Current Density Field Emission Cathode. Office of Scientific and Technical Information (OSTI), diciembre de 2005. http://dx.doi.org/10.2172/861455.
Texto completoMcGuire, Gary, Allen Martin y John Noonan. Final Technical Report- Back-gate Field Emission-based Cathode RF Electron Gun. Office of Scientific and Technical Information (OSTI), octubre de 2010. http://dx.doi.org/10.2172/991655.
Texto completoZhai, Tongguang, Chi-Sing Man y James Morris. Field Emission Gun Scanning Electron Microscopy with Electron Back Scatter Diffraction for Texture, Formability and Fatigue Studies of Advanced Materials. Fort Belvoir, VA: Defense Technical Information Center, mayo de 2007. http://dx.doi.org/10.21236/ada484492.
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