Literatura académica sobre el tema "FIB"
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Artículos de revistas sobre el tema "FIB"
Liu, Ta-Wei, Chung-Feng Huang, Ming-Lun Yeh, Pei-Chien Tsai, Tyng-Yuan Jang, Jee-Fu Huang, Chia-Yen Dai, Wan-Long Chuang y Ming-Lung Yu. "Less liver fibrosis marker increment in overweight chronic hepatitis B patients observed by age-adjusted Fibrosis-4 Index". BMJ Open Gastroenterology 7, n.º 1 (diciembre de 2020): e000543. http://dx.doi.org/10.1136/bmjgast-2020-000543.
Texto completoHaub, Michael, Thomas Guenther, Martin Bogner y André Zimmermann. "Use of PtC Nanotips for Low-Voltage Quantum Tunneling Applications". Micromachines 13, n.º 7 (28 de junio de 2022): 1019. http://dx.doi.org/10.3390/mi13071019.
Texto completoKamada, Yoshihiro, Kensuke Munekage, Takashi Nakahara, Hideki Fujii, Yoshiyuki Sawai, Yoshinori Doi, Hideyuki Hyogo et al. "The FIB-4 Index Predicts the Development of Liver-Related Events, Extrahepatic Cancers, and Coronary Vascular Disease in Patients with NAFLD". Nutrients 15, n.º 1 (23 de diciembre de 2022): 66. http://dx.doi.org/10.3390/nu15010066.
Texto completoHu, Fupin, Jessica A. O'Hara, Jesabel I. Rivera y Yohei Doi. "Molecular Features of Community-Associated Extended-Spectrum-β-Lactamase-Producing Escherichia coli Strains in the United States". Antimicrobial Agents and Chemotherapy 58, n.º 11 (18 de agosto de 2014): 6953–57. http://dx.doi.org/10.1128/aac.03321-14.
Texto completoHaub, Michael, Thomas Günther, Martin Bogner y André Zimmermann. "Investigation of Focused Ion and Electron Beam Platinum Carbon Nano-Tips with Transmission Electron Microscopy for Quantum Tunneling Vacuum Gap Applications". Applied Sciences 11, n.º 24 (11 de diciembre de 2021): 11793. http://dx.doi.org/10.3390/app112411793.
Texto completoTashima, Janet y Jay Lindquist. "Combining Focused Ion Beam and Scanning Electron Microscopy for IC Fab Support and Defect Review". Microscopy Today 4, n.º 3 (abril de 1996): 18–19. http://dx.doi.org/10.1017/s1551929500067961.
Texto completoDonoso N., Tania y María Isabel Villegas T. "Percepción materna del ajuste socioemocional de sus hijos preescolares: Estudio descriptivo y comparativo de familias separadas e intactas con alto y bajo nivel de ajuste marital". Revista de Psicología 9, n.º 1 (1 de enero de 2000): 29. http://dx.doi.org/10.5354/0719-0581.2000.18544.
Texto completoSteinbaum, Ellen. "A Fib". JAMA 325, n.º 11 (16 de marzo de 2021): 1114. http://dx.doi.org/10.1001/jama.2020.25268.
Texto completoCórdoba, Rosa. "Editorial for the Special Issue on Nanofabrication with Focused Electron/Ion Beam Induced Processing". Micromachines 12, n.º 8 (28 de julio de 2021): 893. http://dx.doi.org/10.3390/mi12080893.
Texto completoPhaneuf, Michael W. y Jian Li. "FIB Techniques for Analysis of Metallurgical Specimens". Microscopy and Microanalysis 6, S2 (agosto de 2000): 524–25. http://dx.doi.org/10.1017/s143192760003511x.
Texto completoTesis sobre el tema "FIB"
Ostřížek, Petr. "Elektrotransportní vlastnosti nanostruktur připravených metodou FIB". Master's thesis, Vysoké učení technické v Brně. Fakulta strojního inženýrství, 2011. http://www.nusl.cz/ntk/nusl-229474.
Texto completoMucke, S. "Herstellung von Nanometer-Strukturen mittels feinfokussiertem Ionenstrahl (FIB)". Forschungszentrum Dresden, 2010. http://nbn-resolving.de/urn:nbn:de:bsz:d120-qucosa-28940.
Texto completoMucke, S. "Herstellung von Nanometer-Strukturen mittels feinfokussiertem Ionenstrahl (FIB)". Forschungszentrum Rossendorf, 2004. https://hzdr.qucosa.de/id/qucosa%3A21721.
Texto completoClaude, Jean-Benoît. "Etude des mécanismes de nanogravure par FIB-LMAIS". Thesis, Aix-Marseille, 2017. http://www.theses.fr/2017AIXM0445/document.
Texto completoThe reduction of device sizes represents a major issue in microelectronic industry which motivates several teams of researchers to develop nanopatterning with atomic resolution. In this context, maskless nanostructuration techniques are well-adapted and have an important potential for the nearest future in labs and industry. The aim of the project I worked on is the connection in a Ultra-High-Vacuum (UHV) environment between a Dual-Beam, equipped with a FIB (Focused Ion Beam) and a SEM (Scanning Electron Microscopy) and a MBE (Molecular Beam Epitaxy) cluster, which is the highest-controlled deposition technique. The UHV environment is the solution for an absolute cleanliness and represents a relevant way to fabricate functionalized devices for micro-nanoelectronics, optoelectronics, photovoltaic, spintronic, plasmonic, etc… This UHV connection combining FIB nanostructuration and epitaxy growth technique provides a unique platform to elaborate tridimensional structures with milling/deposition steps. Among different applications, we decided to focus on silicon based nanostructures. Regarding silicon nanostructures. The main challenge for microelectronics industry and for the researchers in this field is the realization of optoelectronics devices fully integrated in silicon systems. This requires to convert silicon based materials into absorber/emitter of light. One of the most promising way to change the electronic structure and to get a direct bandgap is the combination of chemical functionalization and quantum confinement into silicon based nano-objects
Guellil, Imene. "Nano-fonctionnalisation par FIB haute résolution de silicium". Electronic Thesis or Diss., Aix-Marseille, 2022. http://www.theses.fr/2022AIXM0361.
Texto completoThe goal of this work is to develop a process for the elaboration of silicon-germanium (SiGe) quantum dots (QDs) with compositions ranging from Si to pure Ge, and allowing to obtain semiconducting QDs with sufficiently small sizes to obtain quantum confinement. For this purpose, we have used a combination of different techniques: molecular beam epitaxy, focused ion beam lithography (FIBL) and heterogeneous solid state dewetting. In this context, the aim of this research is on the one hand to develop a new FIB that can be coupled to the ultra-high vacuum molecular beam epitaxy growth chamber, and on the other hand to realize two applications: (i) nanopatterns for the self-organisation of Si and Ge QDs and (ii) nano-implantations of Si and Ge. We used FIBL with energy-filtered liquid metal alloy ion sources (LMAIS) using non-polluting ions (Si and Ge) for the milling of conventional microelectronic substrates such as SiGe on silicon-on-insulator (SGOI). The nanopatterns must be totally free of pollution and with variable and perfectly controlled characteristics (size, density, depth). The morphology of the nanopatterns is then characterized in-situ by scanning electron microscopy (SEM), and the depth is determined ex-situ by atomic force microscopy (AFM). The nanopatterns made by FIBL were compared on the one hand to plasma etchings with He and Ne and on the other hand to the etchings obtained by electronic lithography (EBL). Nanoimplantations of Si and Ge ions were realised in diamond and in ultra-thin SGOI for the fabrication of local defects
Claude, Jean-Benoît. "Etude des mécanismes de nanogravure par FIB-LMAIS". Electronic Thesis or Diss., Aix-Marseille, 2017. http://www.theses.fr/2017AIXM0445.
Texto completoThe reduction of device sizes represents a major issue in microelectronic industry which motivates several teams of researchers to develop nanopatterning with atomic resolution. In this context, maskless nanostructuration techniques are well-adapted and have an important potential for the nearest future in labs and industry. The aim of the project I worked on is the connection in a Ultra-High-Vacuum (UHV) environment between a Dual-Beam, equipped with a FIB (Focused Ion Beam) and a SEM (Scanning Electron Microscopy) and a MBE (Molecular Beam Epitaxy) cluster, which is the highest-controlled deposition technique. The UHV environment is the solution for an absolute cleanliness and represents a relevant way to fabricate functionalized devices for micro-nanoelectronics, optoelectronics, photovoltaic, spintronic, plasmonic, etc… This UHV connection combining FIB nanostructuration and epitaxy growth technique provides a unique platform to elaborate tridimensional structures with milling/deposition steps. Among different applications, we decided to focus on silicon based nanostructures. Regarding silicon nanostructures. The main challenge for microelectronics industry and for the researchers in this field is the realization of optoelectronics devices fully integrated in silicon systems. This requires to convert silicon based materials into absorber/emitter of light. One of the most promising way to change the electronic structure and to get a direct bandgap is the combination of chemical functionalization and quantum confinement into silicon based nano-objects
Rose, Philip David. "High-resolution in situ FIB lithography of MBE GaAs". Thesis, University of Cambridge, 1998. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.624802.
Texto completoKonečný, Martin. "Aplikace KPM na povrchu grafén/Si modifikovaném metodou FIB". Master's thesis, Vysoké učení technické v Brně. Fakulta strojního inženýrství, 2013. http://www.nusl.cz/ntk/nusl-230836.
Texto completoElFallagh, Fathi Ali. "3D Analysis of Indentation Damage by FIB tomography and TEM". Thesis, University of Sheffield, 2008. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.500111.
Texto completoHouel, Arnaud. "Ecriture directe de motifs nanométriques assistée par STM et FIB". Aix-Marseille 2, 2002. http://www.theses.fr/2002AIX22063.
Texto completoLibros sobre el tema "FIB"
Wang, Zhiming M., ed. FIB Nanostructures. Cham: Springer International Publishing, 2013. http://dx.doi.org/10.1007/978-3-319-02874-3.
Texto completoill, Swanson Maggie y Wetzel Rick ill, eds. The fib. Waterbury, CT: Letter People Co., 2002.
Buscar texto completoThe big fib. London: Puffin, 2011.
Buscar texto completoillustrator, Hedderwick Mairi, ed. The big fib. Edinburgh: Barrington Stoke, 2015.
Buscar texto completoAnderson, Melissa. The big fib. Salt Lake City, Utah: Shadow Mountain, 2010.
Buscar texto completoLayton, George. The fib: And other stories. London: HarperCollins, 1994.
Buscar texto completoFarrell, Darren. Doug-Dennis and the flyaway fib. New York: Dial Books for Young Readers, 2010.
Buscar texto completoAyatrohaedi. FS-FIB UI di mata Ayatrohaedi. Depok: Fakultas Ilmu Pengetahuan Budaya, Universitas Indonesia, 2007.
Buscar texto completofib. fib Model Code for Concrete Structures 2010. Weinheim, Germany: Wiley-VCH Verlag GmbH & Co. KGaA, 2013. http://dx.doi.org/10.1002/9783433604090.
Texto completoIan, Hislop, ed. Lord Gnome's complete fib and lie diet. London: Private Eye, 1991.
Buscar texto completoCapítulos de libros sobre el tema "FIB"
Labille, Jérôme, Natalia Pelinovskaya, Céline Botta, Jean-Yves Bottero, Armand Masion, Dilip S. Joag, Richard G. Forbes et al. "FIB-SEM". En Encyclopedia of Nanotechnology, 824. Dordrecht: Springer Netherlands, 2012. http://dx.doi.org/10.1007/978-90-481-9751-4_100246.
Texto completoBauch, Jürgen y Rüdiger Rosenkranz. "FIB - Ionenfeinstrahltechnik". En Physikalische Werkstoffdiagnostik, 14–15. Berlin, Heidelberg: Springer Berlin Heidelberg, 2017. http://dx.doi.org/10.1007/978-3-662-53952-1_7.
Texto completoPrieto, Gonzalo. "FIB-SEM Tomography". En Encyclopedia of Membranes, 770–72. Berlin, Heidelberg: Springer Berlin Heidelberg, 2016. http://dx.doi.org/10.1007/978-3-662-44324-8_2211.
Texto completoPrieto, Gonzalo. "FIB-SEM Tomography". En Encyclopedia of Membranes, 1–3. Berlin, Heidelberg: Springer Berlin Heidelberg, 2015. http://dx.doi.org/10.1007/978-3-642-40872-4_2211-1.
Texto completoGiannuzzi, Lucille A. "FIB-SEM for Biomaterials". En Biological Field Emission Scanning Electron Microscopy, 517–32. Chichester, UK: John Wiley & Sons, Ltd, 2019. http://dx.doi.org/10.1002/9781118663233.ch24.
Texto completoLi, Jian y Pei Liu. "On FIB Milling Parameters". En The Minerals, Metals & Materials Series, 3–9. Cham: Springer International Publishing, 2018. http://dx.doi.org/10.1007/978-3-319-72484-3_1.
Texto completo"Fibs Don't Fib". En Technical Analysis of the Currency Market, 99–112. Hoboken, NJ, USA: John Wiley & Sons, Inc., 2015. http://dx.doi.org/10.1002/9781119201496.ch7.
Texto completo"FIB-SEM". En Encyclopedia of Biophysics, 759. Berlin, Heidelberg: Springer Berlin Heidelberg, 2013. http://dx.doi.org/10.1007/978-3-642-16712-6_100318.
Texto completo"FIB-SEM". En Encyclopedia of Nanotechnology, 1169. Dordrecht: Springer Netherlands, 2016. http://dx.doi.org/10.1007/978-94-017-9780-1_100332.
Texto completoFine, Michael, James W. Peters y Robert S. Lawrence. "A. FIB". En The Nature of Health, 127–30. CRC Press, 2018. http://dx.doi.org/10.1201/9781315365398-19.
Texto completoActas de conferencias sobre el tema "FIB"
Michael, Joseph. "Introduction to FIB and applications: Plasma FIB and laser." En Proposed for presentation at the CCEM Lecture Series on Electron and Ion Microscopy held June 7-11, 2021 in Hamilton , Ontario, Canado. US DOE, 2021. http://dx.doi.org/10.2172/1870975.
Texto completoStegmann, Heiko, Hubert Schulz y James Whitby. "FIB-SIMS in FIB-SEMs—Practical Aspects for Physical Failure Analysis". En ISTFA 2022. ASM International, 2022. http://dx.doi.org/10.31399/asm.cp.istfa2022p0257.
Texto completoGadkari, Kaustubh, M. Lawrence Weikum, Dan Massey y Christos Papadopoulos. "Pragmatic router FIB caching". En 2015 IFIP Networking Conference (IFIP Networking). IEEE, 2015. http://dx.doi.org/10.1109/ifipnetworking.2015.7145296.
Texto completoSuzuki, Eiji, Josh Adams, Calvin Ball, Tim McCready y Sonya Robinson. "FIB on Test Board". En ISTFA 2016. ASM International, 2016. http://dx.doi.org/10.31399/asm.cp.istfa2016p0402.
Texto completoBonifacio, C. S., P. Nowakowski, M. J. Campin, M. L. Ray y P. E. Fischione. "Low Energy Ar Ion Milling of FIB TEM Specimens from 14 nm and Future FinFET Technologies". En ISTFA 2018. ASM International, 2018. http://dx.doi.org/10.31399/asm.cp.istfa2018p0241.
Texto completoMoore, Thomas M. "Nanomechanical Characterization in the FIB". En ISTFA 2005. ASM International, 2005. http://dx.doi.org/10.31399/asm.cp.istfa2005p0209.
Texto completoSarrar, Nadi, Robert Wuttke, Stefan Schmid, Marcin Bienkowski y Steve Uhlig. "Leveraging locality for FIB aggregation". En GLOBECOM 2014 - 2014 IEEE Global Communications Conference. IEEE, 2014. http://dx.doi.org/10.1109/glocom.2014.7037090.
Texto completoYun-Ru Wu, Shu-Yi Kao y Shih-Arn Hwang. "Minimizing ECO routing for FIB". En 2010 International Symposium on VLSI Design, Automation and Test (VLSI-DAT). IEEE, 2010. http://dx.doi.org/10.1109/vdat.2010.5496675.
Texto completoGiannuzzi, Lucille A. "Multi-signal FIB/SEM tomography". En SPIE Defense, Security, and Sensing. SPIE, 2012. http://dx.doi.org/10.1117/12.919821.
Texto completoKaufmann, Henry C., William B. Thompson y Gregory J. Dunn. "Fib Mask Repair With Microtrim". En 1986 Microlithography Conferences, editado por Phillip D. Blais. SPIE, 1986. http://dx.doi.org/10.1117/12.963669.
Texto completoInformes sobre el tema "FIB"
Shul, Randy J., Michael J. Rye, Greg Salazar y Steve Ball. FEI FIB/SEM Failure Analysis. Office of Scientific and Technical Information (OSTI), enero de 2019. http://dx.doi.org/10.2172/1492079.
Texto completoCampbell, A. N., D. M. Tanner, J. M. Soden, E. Adams, M. Gibson, M. Abramo, A. Doyle y D. K. Stewart. Electrical and chemical characterization of FIB-deposited insulators. Office of Scientific and Technical Information (OSTI), octubre de 1997. http://dx.doi.org/10.2172/532558.
Texto completoOgura, K. S., S. B. Donald y B. W. Chung. Improving Microstructural Quantification in 3D FIB-SEM Tomography. Office of Scientific and Technical Information (OSTI), septiembre de 2019. http://dx.doi.org/10.2172/1566797.
Texto completoTrotter, G. Terminology for Forwarding Information Base (FIB) based Router Performance. RFC Editor, diciembre de 2001. http://dx.doi.org/10.17487/rfc3222.
Texto completoHarmer, M. P. A Focused-Ion Beam (FIB) Nano-Fabrication and Characterization Facility. Fort Belvoir, VA: Defense Technical Information Center, noviembre de 2002. http://dx.doi.org/10.21236/ada408750.
Texto completoTegtmeier, Eric y Caitlin Taylor. Single Crystal UO2 cube creation using a Xe Plasma FIB. Office of Scientific and Technical Information (OSTI), octubre de 2020. http://dx.doi.org/10.2172/1688725.
Texto completoBradley, J., Z. Dai, G. Graham y N. Teslich. Final Report - SRNL Agreement #AC51296V SEM, FIB, TEM Studies of CZT Samples. Office of Scientific and Technical Information (OSTI), agosto de 2007. http://dx.doi.org/10.2172/924965.
Texto completoWall, M., M. Fluss y C. Schaldach. Dual Beam FIB for Imaging, Nano-Sectioning and Sample Preparation of Spores: Initial Results. Office of Scientific and Technical Information (OSTI), abril de 2004. http://dx.doi.org/10.2172/892791.
Texto completoGillor, Osnat, Stefan Wuertz, Karen Shapiro, Nirit Bernstein, Woutrina Miller, Patricia Conrad y Moshe Herzberg. Science-Based Monitoring for Produce Safety: Comparing Indicators and Pathogens in Water, Soil, and Crops. United States Department of Agriculture, mayo de 2013. http://dx.doi.org/10.32747/2013.7613884.bard.
Texto completoIto, Takatoshi y Masahiro Yamada. Did the Reform Fix the London Fix Problem? Cambridge, MA: National Bureau of Economic Research, abril de 2017. http://dx.doi.org/10.3386/w23327.
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