Literatura académica sobre el tema "FDSOI-28nm technology"
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Artículos de revistas sobre el tema "FDSOI-28nm technology"
Singh, Rana Udayveer, Charu Madhu, Garima Joshi y Mehak Godara. "Performance Analysis of FDSOI based Gate Diffusion Input Logic Gates at 28nm Technology Node". IOP Conference Series: Materials Science and Engineering 1033 (19 de enero de 2021): 012020. http://dx.doi.org/10.1088/1757-899x/1033/1/012020.
Texto completoMakovejev, S., B. Kazemi Esfeh, V. Barral, N. Planes, M. Haond, D. Flandre, J. P. Raskin y V. Kilchytska. "Wide frequency band assessment of 28nm FDSOI technology platform for analogue and RF applications". Solid-State Electronics 108 (junio de 2015): 47–52. http://dx.doi.org/10.1016/j.sse.2014.12.007.
Texto completoBravaix, A., G. Hamparsoumian, J. Sonzogni, H. Pitard, T. Garba-Seybou, E. Kussener, X. Federspiel y F. Cacho. "CMOS Scaling Challenges for High Performance and Low Power applications facing Reliability Criteria towards the Decananometer range". Journal of Physics: Conference Series 2548, n.º 1 (1 de julio de 2023): 012003. http://dx.doi.org/10.1088/1742-6596/2548/1/012003.
Texto completoTesis sobre el tema "FDSOI-28nm technology"
Biswas, Avishek Ph D. Massachusetts Institute of Technology. "Energy-efficient SRAM design in 28nm FDSOI Technology". Thesis, Massachusetts Institute of Technology, 2014. http://hdl.handle.net/1721.1/91095.
Texto completo48
Cataloged from PDF version of thesis.
Includes bibliographical references (pages 75-81).
As CMOS scaling continues to sub-32nm regime, the effects of device variations become more prominent. This is very critical in SRAMs, which use very small transistor dimensions to achieve high memory density. The conventional 6T SRAM bit-cell, which provides the smallest cell-area, fails to operate at lower supply voltages (Vdd). This is due to the significant degradation of functional margins as the supply voltage is scaled down. However, Vdd scaling is crucial in reducing the energy consumption of SRAMs, which is a significant portion of the overall energy consumption in modern micro-processors. Energy savings in SRAM is particularly important for batteryoperated applications, which run from a very constrained power-budget. This thesis focuses on energy-efficient 6T SRAM design in a 28nm FDSOI technology. Significant savings in energy/access of the SRAM is achieved using two techniques: Vdd scaling and data prediction. A 200mV improvement in the minimum SRAM operating voltage (Vdd,min) is achieved by using dynamic forward body-biasing (FBB) on the NMOS devices of the bit-cell. The overhead of dynamic FBB is reduced by implementing it row-wise. Layout modifications are proposed to share the body terminals (n-wells) horizontally, along a row. Further savings in energy/access is achieved by incoporating data-prediction in the 6T read path, which reduces bitline switching. The proposed techniques are implemented for a 128Kb 6T SRAM, designed in a 28nm FDSOI technology. This thesis also presents a reconfigurable fully-integrated switched-capacitor based step-up DC-DC converter, which can be used to generate the body-bias voltage for a SRAM. 3 reconfigurable conversion ratios of 5/2, 2/1 and 3/2 are implemented in the converter. It provides a wide range of output voltage, 1.2V-2.4V, from a fixed input of 1V. The converter achieves a peak efficiency of 88%, using only on-chip MOS and MOM capacitors, for a high density implementation.
by Avishek Biswas.
S.M.
Mahmoud, Doaa. "Convertisseur analogique-numérique de type Sigma-Delta Passe-Bande avec résonateurs à un et deux amplificateurs". Electronic Thesis or Diss., Sorbonne université, 2021. http://www.theses.fr/2021SORUS288.
Texto completoSoftware defined radio receiver is a promising technique for future receivers which provides a variety of protocols. It digitizes the RF signal directly to low-frequency. We propose an SDR receiver based on a bandpass sigma delta modulator. The most essential element is the loop filter, there are two main configurations, an LC tank resonator and an active RC resonator. We focus on the active RC resonators for a low chip area. We target applications in the vicinity of 400 MHz, namely Advanced Research and Global Observation Satellite, Medical Implant Communication Service. We introduce a new comparison between the two-op-amp resonator CT BP sigma delta modulator and the one-op-amp resonator CT BP sigma delta modulator. We study the sensitivity of the quality factor and the signal to noise ratio to the DC-gain op-amps in two-op-amp resonator sigma delta modulator. It also shows how, in one-op-amp resonator sigma delta modulator, the quality factor and the signal to noise ratio, are very sensitive to any variations in the capacitors values for limited DC-gain op-amps. We establish a mathematical model of the thermal-noise behaviour for two-op-amp resonator CT BP sigma delta modulator. This model matches the circuit simulator results with a good accuracy. Furthermore, we demonstrate that a high quality factor (>100) of the two-op-amp resonators can be achieved by selecting the proper value of the integrator gain at a moderate DC-gain op-amp (35dB). Both sigma delta modulators are designed using flipped-well devices on fully depleted silicon on insulator technology, where we use body biasing to compensate the process, voltage and temperature variations
Fonseca, Alexandre. "Conception et réalisation de circuits de génération de fréquence en technologie FDSOI 28nm". Thesis, Nice, 2015. http://www.theses.fr/2015NICE4100/document.
Texto completoThe large-scale deployment of IoT requires the development of more efficient energy radio systems, within which the frequency generation circuit is known to be particularly energy-consuming. The objective of this thesis is firstly to develop a very low consumption frequency synthesis and secondly to demonstrate the performance of the FDSOI technology for analog and RF applications.In the first chapter are the specifications of the chosen standard -the BLE-, the specifications of the FDSOI technology and state of the art of low power radio frequency synthesizers architecture. We have chosen from this comparison the Fractional Phase Divider architecture. The second chapter presents the results of three types of system simulations of the PLL; 1 - the operation of its components and the key points to be respected for its implementation, 2 - the phase noise behavior for the definition of specifications, and 3 - the impact of architecture on the generation of spurious. This study allowed us to set the specifications of VCROs developed in the next chapter. The third chapter is dedicated to the design, implementation and testing of four topologies of VCROs and a test circuit in FDSOI 28nm technology. The first measurement results are encouraging but they need to be complemented by an integrated fractional PLL measurement. Indeed, the sensitivity of the circuits to the supply voltage (pushing of about 5 GHz/V) made measurements of phase noise very delicate. The measured consumption is less than 0.8 mA and the surface of the circuits is of the order of 600 µm².In the fourth and final chapter we present the implementation at circuit-level of a phase synchronization PLL
Daubriac, Richard. "Caractérisation de techniques d'implantations ioniques alternatives pour l'optimisation du module source-drain de la technologie FDSOI 28nm". Thesis, Toulouse, INSA, 2018. http://www.theses.fr/2018ISAT0031/document.
Texto completoDuring the past few decades, the emergence of new architectures (FDSOI, FinFETs or NW-FETs) and the use of new materials (like silicon/germanium alloys) allowed to go further in MOS devices scaling by solving short channel effect issues. However, new architectures suffer from contact resistance degradation with size reduction. This resistance strongly depends on two parameters: the active dopant concentration close to the semi-conductor surface and the Schottky barrier height of the silicide contact. Many solutions have been proposed to improve both of these physical parameters: pre-amorphisation, laser annealing, dopant segregation and others. In order to optimize the experimental conditions of these fabrication techniques, it is mandatory to measure precisely and reliably their impact on cited parameters.Within the scope of this thesis, two parts are dedicated to each lever of the contact resistance, each time precising the developed characterization method and concrete application studies. The first part concerns the study of the active dopant concentration close to the semi-conductor surface. In this axis, we developed a Differential Hall Effet method (DHE) which can provide accurate depth profiles of active dopant concentration combining successive etching processes and conventional Hall Effect measurements. To do so, we validated layer chemical etching and precise electrical characterization method for doped Si and SiGe. Obtained generated profiles have a sub-1nm resolution and allowed to scan the first few nanometers of layers fabricated by advanced ion implantation and annealing techniques, like solid-phase epitaxy regrowth activated by laser annealing. In the second part, we focused on the measurement of Schottky barrier height of platinum silicide contact. We transferred a characterization method based on back-to-back diodes structure to measure platinum silicide contacts with different dopant segregation conditions. The electrical measurements were then fitted with physical models to extract Schottky barrier height with a precision of about 10meV. This combination between measurements and simulations allowed to point out the best ion implantation and annealing conditions for Schottky barrier height reduction.To conclude, thanks to this project, we developed highly sensitive characterization methods for nanoelectronics application. Moreover, we brought several clarifications on the impact of alternative ion implantation and annealing processes on Si and SiGe ultra-thin layers in the perspective of contact resistance reduction in FDSOI source-drain module
González, Santos Ángel de Dios. "Circuits de traitement de signal numérique en temps continu ultra-faible consommation en technologie 28nm FDSOI pour applications audio". Thesis, Lille 1, 2020. http://www.theses.fr/2020LIL1I047.
Texto completoThe focus of this work is the study and development of a feature extraction system using Continuous-Time Digital Signal Processing (CT DSP) techniques, to mitigate the drawbacks of existing implementations based on traditional analog and digital solutions of always-on monitoring sensors for the Internet of Things (IoT). The target is to extract the spectral content of an audio signal using a novel architecture based on a cascade of configurable CT DSP Finite Impulse Response (FIR) filters. An efficient cascade scheme is enabled by the proposed glitch elimination and delta encoding techniques. Additionally, this work introduces a CT function to estimate the instantaneous power within selected frequency bands to build an output spectrogram. The proposed 12-band system has been validated using behavioral simulations. The key element for the implementation of this system is the digital delay element. A new delay element has been designed and fabricated in 28nm FDSOI technology and achieves a record tuning range from 30 ns to 97 µs with a power consumption of 15 fJ/event. By extrapolating this result, the system would have an overall peak power consumption of 2.85 µW when processing typical female speech, while consuming approximately 100 nW when no events are generated. Thus, the average system power consumption outperforms state-of-the-art feature extraction circuits
Bernard, Sébastien. "Bascules à impulsion robustes en technologie 28nm FDSOI pour circuits numériques basse consommation à très large gamme de tension d'alimentation". Thesis, Grenoble, 2014. http://www.theses.fr/2014GRENT071/document.
Texto completoThe explosion market of the mobile application and the paradigm of the Internet of Things lead to a huge demand for energy-efficient systems. To overcome the limit of Moore's law due to bulk technology, a new transistor technology has appeared recently in industrial process: the fully-depleted silicon on insulator, or FDSOI.In modern ASIC designs, a large portion of the total power consumption is due to the leaves of the clock tree: the flip-flops. Therefore, the appropriate flip-flop architecture is a major choice to reach the speed and energy constraints of mobile and ultra-low power applications. After a thorough overview of the literature, the explicit pulse-triggered flip-flop topology is pointed out as a very interesting flip-flop architecture for high-speed and low-power systems. However, it is today only used in high-performances circuits mainly because of its poor robustness at ultra-low voltage.In this work, explicit pulse-triggered flip-flops architecture design is developed and studied in order to improve their robustness and their energy-efficiency. A large comparison of resettable and scannable latch architecture is performed in the energy-delay domain by modifying the sizing of the transistors, both at nominal and ultra-low voltage. Then, it is shown that the back biasing technique allowed by the FDSOI technology provides better energy and delay performances than the sizing methodology. As the pulse generator is the main cause of functional failure, we proposed a new architecture which provides both a good robustness at ultra-low voltage and an energy efficiency. A selected topology of explicit pulse-triggered flip-flop was implemented in a 16x32b register file which exhibits better speed, energy consumption and area performances than a version with master-slave flip-flops, mainly thanks to the sharing of the pulse generator over several latches
Sarimin, Nuraishah. "Transmitter design in the 60 GHz frequency band". Thesis, Paris 6, 2017. http://www.theses.fr/2017PA066638.
Texto completoWith the proliferation of portable and mobile electronic devices, there is a strong need to exchange data quickly and conveniently between devices encouraging to overcome challenges in bandwidth shortages and congestion in the lower frequencies spectrum. Millimeter-wave (Mm-wave) technology is considered as one of the future key technologies to enable high data rates wireless applications due to its large abundant spectrum. Advanced CMOS technology nodes comes with high ft and fmax, enable low cost and widespread use of this spectrum. However, many associated challenges ranging from device, circuit and system perspectives for the implementation of a highly integrated mm-wave transceiver especially the power amplifier (PA) which identified to be the most challenging RF block to be designed. The system level concept of low power architecture is firstly studied and key blocks such as 60 GHz antenna and OOK modulateur in 130nm CMOS technology were presented. This thesis also explores the design challenges of mm-wave power amplifier in 28nm UTBB-FDSOI technology. Three different designs of 60 GHz power amplifier were demonstrated in 28nm LVT FDSOI : 1) A two-stage cascode PA, 2) A two-stage differential PA with low-km TMN, 3) A power combined two-stage differential PA with low-km TMN. The simulated performance including the consideration of key layout parasitics were presented. Future work will include for on-chip integration with the PA
Sourikopoulos, Ilias. "Techniques de traitement numérique en temps continu appliquées à l'égalisation de canal pour communications millimétriques à faible consommation". Thesis, Lille 1, 2015. http://www.theses.fr/2015LIL10189/document.
Texto completoReceivers for 60GHz wireless communications have been profiting from innovation in wired links in order to meet a power budget that will enable integration in next‐generation high-speed portable wireless terminals. Mixed‐signal implementations of the Decision Feedback Equalizer (DFE) have been proposed to alleviate overall system consumption. In this thesis, power minimization is pursued by removing the clock from the feedback path of the DFE. Inspired by recent developments in Continuous‐Time Digital Signal Processing, a continuous‐time digital delay line is used. The design aims at mitigating wireless channel impairments caused by signal reflections in typical Line‐of‐Sight, indoors deployment conditions. The system is shown theoretically to achieve channel‐dependent power consumption within acceptable Bit Error Rate performance for decoding. Moreover, a programmable digital delay element is proposed as the granular element of the delay line that exploits body biasing to achieve a coarse/fine functionality. Prototype DFE and delay lines have been fabricated and characterized in 28nm Fully Depleted Silicon Over Insulator technology (FDSOI)
Sarimin, Nuraishah. "Transmitter design in the 60 GHz frequency band". Electronic Thesis or Diss., Paris 6, 2017. http://www.theses.fr/2017PA066638.
Texto completoWith the proliferation of portable and mobile electronic devices, there is a strong need to exchange data quickly and conveniently between devices encouraging to overcome challenges in bandwidth shortages and congestion in the lower frequencies spectrum. Millimeter-wave (Mm-wave) technology is considered as one of the future key technologies to enable high data rates wireless applications due to its large abundant spectrum. Advanced CMOS technology nodes comes with high ft and fmax, enable low cost and widespread use of this spectrum. However, many associated challenges ranging from device, circuit and system perspectives for the implementation of a highly integrated mm-wave transceiver especially the power amplifier (PA) which identified to be the most challenging RF block to be designed. The system level concept of low power architecture is firstly studied and key blocks such as 60 GHz antenna and OOK modulateur in 130nm CMOS technology were presented. This thesis also explores the design challenges of mm-wave power amplifier in 28nm UTBB-FDSOI technology. Three different designs of 60 GHz power amplifier were demonstrated in 28nm LVT FDSOI : 1) A two-stage cascode PA, 2) A two-stage differential PA with low-km TMN, 3) A power combined two-stage differential PA with low-km TMN. The simulated performance including the consideration of key layout parasitics were presented. Future work will include for on-chip integration with the PA
Actas de conferencias sobre el tema "FDSOI-28nm technology"
Kheirallah, Rida, Nadine Azemard y Gilles Ducharme. "Energy study for 28nm FDSOI technology". En 2015 International Workshop on CMOS Variability (VARI). IEEE, 2015. http://dx.doi.org/10.1109/vari.2015.7456558.
Texto completoHutin, Louis, Olivier Rozeau, Veronique Carron, Jean-Michel Hartmann, Laurent Grenouillet, Julien Borrel, Fabrice Nemouchi et al. "Junction technology outlook for sub-28nm FDSOI CMOS". En 2014 14th International Workshop on Junction Technology (IWJT). IEEE, 2014. http://dx.doi.org/10.1109/iwjt.2014.6842050.
Texto completode Albuquerque, T. Chaves, F. Calmon, R. Clerc, P. Pittet, Y. Benhammou, D. Golanski, S. Jouan, D. Rideau y A. Cathelin. "Integration of SPAD in 28nm FDSOI CMOS technology". En 48th European Solid-State Device Research Conference (ESSDERC 2018). IEEE, 2018. http://dx.doi.org/10.1109/essderc.2018.8486852.
Texto completoLee, K., W. J. Kim, J. H. Lee, B. J. Bae, J. H. Park, I. H. Kim, B. Y. Seo et al. "1Gbit High Density Embedded STT-MRAM in 28nm FDSOI Technology". En 2019 IEEE International Electron Devices Meeting (IEDM). IEEE, 2019. http://dx.doi.org/10.1109/iedm19573.2019.8993551.
Texto completoJi, Y., H. J. Goo, J. Lim, S. B. Lee, S. Lee, T. Uemura, J. C. Park et al. "Reliability of 8Mbit Embedded-STT-MRAM in 28nm FDSOI Technology". En 2019 IEEE International Reliability Physics Symposium (IRPS). IEEE, 2019. http://dx.doi.org/10.1109/irps.2019.8720429.
Texto completoKadura, L., O. Rozeau, L. Grenouillet, D. Blachier, N. Rambal, A. Chelnokov y M. Vinet. "1T Linear-Log Response Pixel Sensor in 28nm FDSOI Technology". En 2018 International Conference on Solid State Devices and Materials. The Japan Society of Applied Physics, 2018. http://dx.doi.org/10.7567/ssdm.2018.j-6-03.
Texto completoPlanes, N., O. Weber, V. Barral, S. Haendler, D. Noblet, D. Croain, M. Bocat et al. "28nm FDSOI technology platform for high-speed low-voltage digital applications". En 2012 IEEE Symposium on VLSI Technology. IEEE, 2012. http://dx.doi.org/10.1109/vlsit.2012.6242497.
Texto completoAragones, Xavier, Alex Alvarez, Juan Pablo Rovayo, Josep Altet y Diego Mateo. "Design of ULV ULP LNAs Exploiting FBB in FDSOI 28nm Technology". En 2019 XXXIV Conference on Design of Circuits and Integrated Systems (DCIS). IEEE, 2019. http://dx.doi.org/10.1109/dcis201949030.2019.8959894.
Texto completoAmara, Amara, Navneet Gupta, Khaja Ahmad Shaik, Costin Anghel y Kiyoo Itoh. "Energy efficiency optimization for digital applications in 28nm UTBB FDSOI technology". En 2015 MIXDES - 22nd International Conference "Mixed Design of Integrated Circuits & Systems". IEEE, 2015. http://dx.doi.org/10.1109/mixdes.2015.7208472.
Texto completoArnaud, F. "Enhanced low voltage digital & analog mixed-signal with 28nm FDSOI technology". En 2015 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S). IEEE, 2015. http://dx.doi.org/10.1109/s3s.2015.7333503.
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