Literatura académica sobre el tema "ESD physics"
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Artículos de revistas sobre el tema "ESD physics"
Jauhariyah, M. N. R., B. K. Prahani, K. Syahidi, U. A. Deta, N. A. Lestari y E. Hariyono. "ESD for physics: how to infuse education for sustainable development (ESD) to the physics curricula?" Journal of Physics: Conference Series 1747, n.º 1 (1 de febrero de 2021): 012032. http://dx.doi.org/10.1088/1742-6596/1747/1/012032.
Texto completoKrabbenborg, Benno, Reinier Beltman, Philip Wolbert y Ton Mouthaan. "Physics of electro-thermal effects in ESD protection devices". Journal of Electrostatics 28, n.º 3 (septiembre de 1992): 285–99. http://dx.doi.org/10.1016/0304-3886(92)90077-7.
Texto completoAlvarez, D., M. J. Abou-Khalil, C. Russ, K. Chatty, R. Gauthier, D. Kontos, J. Li, C. Seguin y R. Halbach. "Analysis of ESD failure mechanism in 65nm bulk CMOS ESD NMOSFETs with ESD implant". Microelectronics Reliability 46, n.º 9-11 (septiembre de 2006): 1597–602. http://dx.doi.org/10.1016/j.microrel.2006.07.041.
Texto completoPaul, Milova, Christian Russ, B. Sampath Kumar, Harald Gossner y Mayank Shrivastava. "Physics of Current Filamentation in ggNMOS Devices Under ESD Condition Revisited". IEEE Transactions on Electron Devices 65, n.º 7 (julio de 2018): 2981–89. http://dx.doi.org/10.1109/ted.2018.2835831.
Texto completoSinha, Dheeraj Kumar y Amitabh Chatterjee. "SPICE level implementation of physics of filamentation in ESD protection devices". Microelectronics Reliability 79 (diciembre de 2017): 239–47. http://dx.doi.org/10.1016/j.microrel.2017.05.022.
Texto completoXu, Ke, Xing Chen y Zhenzhen Chen. "A Physics-based Transient Simulation and Modeling Method for Wide-frequency Electrical Overstress Including ESD". Applied Computational Electromagnetics Society 36, n.º 5 (14 de junio de 2021): 505–12. http://dx.doi.org/10.47037/2020.aces.j.360503.
Texto completoLiu, Xiao Yu, Jiang Shao, Xing Hao Wang y Feng Ming Lu. "Research Progress on Electrostatic Discharge Failure Models in Semiconductor Materials". Advanced Materials Research 548 (julio de 2012): 527–31. http://dx.doi.org/10.4028/www.scientific.net/amr.548.527.
Texto completoRushby, Nick. "Editorial: Recent references". Education and Self Development 17, n.º 1 (31 de marzo de 2022): 6–7. http://dx.doi.org/10.26907/esd.17.1.01.
Texto completoRushby, Nick. "Editorial: Recent references". Education and Self Development 17, n.º 1 (31 de marzo de 2022): 8–9. http://dx.doi.org/10.26907/esd.17.1.01r.
Texto completoStadler, Wolfgang, Tilo Brodbeck, Reinhold Gärtner y Harald Gossner. "Do ESD fails in systems correlate with IC ESD robustness?" Microelectronics Reliability 49, n.º 9-11 (septiembre de 2009): 1079–85. http://dx.doi.org/10.1016/j.microrel.2009.07.029.
Texto completoTesis sobre el tema "ESD physics"
Chen, Tze Wee. "A physics-based design methodology for digital systems robust to ESD-CDM events /". May be available electronically:, 2009. http://proquest.umi.com/login?COPT=REJTPTU1MTUmSU5UPTAmVkVSPTI=&clientId=12498.
Texto completoErtenberg, Randolph. "CoGe&esc;b1&esc;s&&dotb;esc;b5&esc;sSe&esc;b1&esc;s&&dotb;esc;b5&esc;s [electronic resource] : structural and transport properties characterization / by Randolph Ertenberg". University of South Florida, 2003. http://purl.fcla.edu/fcla/etd/SFE0000130.
Texto completoDocument formatted into pages; contains 43 pages.
Thesis (M.S.)--University of South Florida, 2003.
Includes bibliographical references.
Text (Electronic thesis) in PDF format.
ABSTRACT: Skutterudites have been of great interest for thermoelectric applications over the last ten years. Scientific interest has focused on the unique transport properties Skutterudites possess due to the unique crystal structure. Technical interest has grown since it was discovered that some compounds rival the current best thermoelectric materials. To further the understanding of this material system, and optimize its thermoelectric properties, the synthesis and characterization of polycrystalline n- and p-type CoGe&esc;b1&esc;s&&dotb;esc;b5&esc;sSe&esc;b1&esc;s&&dotb;esc;b5&esc;s was undertaken. Structural, morphological, chemical, electrical, thermal and magnetic properties were studied. These data are compared to those of the binary Skutterudite CoSb3. The results of this study show a very sensitive dependence of the physical properties on stoichiometry.
ABSTRACT: While the thermoelectric figure of merit is low in these materials, it is apparent that optimization via doping and "void filling" will lead to improved thermoelectric properties.
System requirements: World Wide Web browser and PDF reader.
Mode of access: World Wide Web.
Xu, Chen. "Advanced Topographic Characterization of Variously Prepared Niobium Surfaces and Linkage to RF Losses". W&M ScholarWorks, 2013. https://scholarworks.wm.edu/etd/1539623621.
Texto completoBertin, Mathieu. "Processus induits par les électrons de basse énergie (0-20 eV) dans les systèmes condensés". Phd thesis, Université Paris Sud - Paris XI, 2007. http://tel.archives-ouvertes.fr/tel-00280603.
Texto completoWeidong, Yang. "Pupil phase apodization for achromatic imaging of extra-solar planets". Available online. Click here, 2004. http://services.lib.mtu.edu/etd/DISS/2004/Physics/yangw/diss.pdf.
Texto completoVoyantzis, Mitchell D. "CloudMEMS Platform for Design and Simulation of MEMS: Physics Modules & End-to-End Testing". University of Toledo / OhioLINK, 2018. http://rave.ohiolink.edu/etdc/view?acc_num=toledo1533226484963866.
Texto completode, la Puente Alejandro M. "Kaon photoproduction of the proton: contribution of higher angular momentum and energy resonances to the cross-section and polarization asymmetries through an effective Lagrangian model". FIU Digital Commons, 2008. http://digitalcommons.fiu.edu/etd/3014.
Texto completoDominquez, Alberto Luis. "Meson-meson scattering in 2+1 dimensional lattice quantum electrodynamics". FIU Digital Commons, 1994. http://digitalcommons.fiu.edu/etd/3634.
Texto completoFaxas, Miguel A. Jr. "Experiments in the dissociative recombination of xenon and krypton". FIU Digital Commons, 2005. http://digitalcommons.fiu.edu/etd/3288.
Texto completoKhammang, Alex. "Investigating Mechanical Properties of Metallic Nanowires using Molecular Dynamics". VCU Scholars Compass, 2014. http://scholarscompass.vcu.edu/etd/3409.
Texto completoLibros sobre el tema "ESD physics"
Voldman, Steven Howard. ESD Physics and Devices. New York: John Wiley & Sons, Ltd., 2005.
Buscar texto completoCharged device model (CDM) ESD in ICs: Physics, modeling, and circuit simulation. Konstanz: Hartung-Gorre, 2006.
Buscar texto completoJ, Mergens Markus P. On-chip ESD protection in integrated circuits: Device physics, modeling, circuit simulation. Konstanz: Hartung-Gorre, 2001.
Buscar texto completoHow experiments end. Chicago: University of Chicago Press, 1987.
Buscar texto completoSaini, Rakesh. Human hand/metal ESD and its physical simulation. Ottawa: National Library of Canada, 1995.
Buscar texto completoGalison, Peter Louis. How experiments end. Chicago: University of Chicago Press, 1987.
Buscar texto completoThe end of time: The next revolution in physics. Oxford: Oxford University Press, 2000.
Buscar texto completoundifferentiated, David Lindley. The end ofphysics: The myth of a unified theory. New York: BasicBooks, 1993.
Buscar texto completoSaint-Aubin, Yvan y Luc Vinet, eds. Theoretical Physics at the End of the Twentieth Century. New York, NY: Springer New York, 2002. http://dx.doi.org/10.1007/978-1-4757-3671-7.
Texto completoYvan, Saint-Aubin y Vinet Luc, eds. Theoretical physics at the end of the twentieth century: Lecture notes of the CRM summer school, Banff, Alberta. New York: Springer, 2002.
Buscar texto completoCapítulos de libros sobre el tema "ESD physics"
Kolyer, John M. y Donald E. Watson. "Basic Physics". En ESD from A to Z, 3–13. Boston, MA: Springer US, 1996. http://dx.doi.org/10.1007/978-1-4613-1177-5_2.
Texto completoVinson, James E., Joseph C. Bernier, Gregg D. Croft y Juin J. Liou. "Physics and Models of an ESD Event". En ESD Design and Analysis Handbook, 1–64. Boston, MA: Springer US, 2003. http://dx.doi.org/10.1007/978-1-4615-0321-7_1.
Texto completoMeneghini, M., G. Meneghesso y E. Zanoni. "Electrical Properties, Reliability Issues, and ESD Robustness of InGaN-Based LEDs". En Topics in Applied Physics, 197–229. Dordrecht: Springer Netherlands, 2013. http://dx.doi.org/10.1007/978-94-007-5863-6_8.
Texto completoMeneghini, M., G. Meneghesso y E. Zanoni. "Electrical Properties, Reliability Issues, and ESD Robustness of InGaN-Based LEDs". En Topics in Applied Physics, 363–95. Singapore: Springer Singapore, 2017. http://dx.doi.org/10.1007/978-981-10-3755-9_13.
Texto completoIoannou, D. E., Z. Chbili, A. Z. Badwan, Q. Li, Y. Yang y A. A. Salman. "Physics and Design of Nanoscale Field Effect Diodes for Memory and ESD Protection Applications". En Future Trends in Microelectronics, 73–80. Hoboken, NJ, USA: John Wiley & Sons, Inc., 2013. http://dx.doi.org/10.1002/9781118678107.ch4.
Texto completoSimons, B. D. y A. Altland. "Mesoscopic Physics". En Theoretical Physics at the End of the Twentieth Century, 451–566. New York, NY: Springer New York, 2002. http://dx.doi.org/10.1007/978-1-4757-3671-7_6.
Texto completoWang, Rui-Wu. "The Unity of Life and Physics". En The End of Rationality and Selfishness, 165–82. Singapore: Springer Nature Singapore, 2023. http://dx.doi.org/10.1007/978-981-19-9752-5_11.
Texto completoHafemeister, David. "Enhanced End-Use Efficiency". En Physics of Societal Issues, 465–506. New York, NY: Springer New York, 2013. http://dx.doi.org/10.1007/978-1-4614-9272-6_14.
Texto completoMiyamoto, Kenro. "Open End System". En Plasma Physics for Controlled Fusion, 423–38. Berlin, Heidelberg: Springer Berlin Heidelberg, 2016. http://dx.doi.org/10.1007/978-3-662-49781-4_18.
Texto completoNicholls, David A. "Physical therapies before 1894". En The End of Physiotherapy, 19–41. Abingdon, Oxon; New York, NY: Routledge, 2017. |: Routledge, 2017. http://dx.doi.org/10.4324/9781315561868-2.
Texto completoActas de conferencias sobre el tema "ESD physics"
Khandelwal, S. y D. Bavi. "ASM-ESD – A comprehensive physics-based compact model for ESD Diodes". En 2022 IEEE International Reliability Physics Symposium (IRPS). IEEE, 2022. http://dx.doi.org/10.1109/irps48227.2022.9764453.
Texto completoLin, I.-Cheng, Che-Yuan Jao, Rei-Fu Huang, Cheng-Hsing Chien, Chien-Hui Chuang, Chen-Feng Chiang y Bo-Shih Huang. "Latchup test failure from ESD protection circuit activation beyond ESD stress condition". En 2009 IEEE International Reliability Physics Symposium. IEEE, 2009. http://dx.doi.org/10.1109/irps.2009.5173345.
Texto completoReinvuo, Tuomas, Timo Tarvainen y Toni Viheriakoski. "Simulation and physics of charged board model for ESD". En 2007 29th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD). IEEE, 2007. http://dx.doi.org/10.1109/eosesd.2007.4401769.
Texto completoDuvvury, C., R. N. Rountree, H. J. Stiegler, T. Polgreen y D. Corum. "ESD Phenomena in Graded Junction Devices". En 27th International Reliability Physics Symposium. IEEE, 1989. http://dx.doi.org/10.1109/irps.1989.363364.
Texto completoDuvvury, Charvaka. "Paradigm shift in ESD qualification". En 2008 IEEE International Reliability Physics Symposium (IRPS). IEEE, 2008. http://dx.doi.org/10.1109/relphy.2008.4558855.
Texto completoYen, Cheng-Cheng y Ming-Dou Ker. "Failure of On-Chip Power-Rail ESD Clamp Circuits During System-Level ESD Test". En 2007 IEEE International Reliability Physics Symposium Proceedings. IEEE, 2007. http://dx.doi.org/10.1109/relphy.2007.369969.
Texto completoLin, D. L. "Thermal Breakdown of VLSI by ESD Pulses". En 28th International Reliability Physics Symposium. IEEE, 1990. http://dx.doi.org/10.1109/irps.1990.363534.
Texto completoAur, S., A. Chatterjee y T. Polgreen. "Hot Electron Reliability and ESD Latent Damage". En 26th International Reliability Physics Symposium. IEEE, 1988. http://dx.doi.org/10.1109/irps.1988.362193.
Texto completoFong, Y. y C. Hu. "Internal ESD Transients in Input Protection Circuits". En 27th International Reliability Physics Symposium. IEEE, 1989. http://dx.doi.org/10.1109/irps.1989.363365.
Texto completoGossner, H. y J. Schneider. "Novel devices in ESD protection". En 2007 International Workshop on Physics of Semiconductor Devices. IEEE, 2007. http://dx.doi.org/10.1109/iwpsd.2007.4472458.
Texto completoInformes sobre el tema "ESD physics"
Matthews, W. Internet end-to-end performance monitoring for the High Energy Nuclear and Particle Physics community. Office of Scientific and Technical Information (OSTI), febrero de 2000. http://dx.doi.org/10.2172/753304.
Texto completoBaldin, Boris y Lou DalMonte. Scintillation counter and wire chamber front end modules for high energy physics experiments. Office of Scientific and Technical Information (OSTI), enero de 2011. http://dx.doi.org/10.2172/1005351.
Texto completoBlack, Kevin. Exotic Physics with the Top Quark at the LHC. End of grant report. Office of Scientific and Technical Information (OSTI), julio de 2013. http://dx.doi.org/10.2172/1088779.
Texto completoTywoniak, Jan, Kateřina Sojková y Zdenko Malík. Building Physics in Living Lab. Department of the Built Environment, 2023. http://dx.doi.org/10.54337/aau541565072.
Texto completoPerdigão, Rui A. P. Earth System Dynamic Intelligence - ESDI. Meteoceanics, abril de 2021. http://dx.doi.org/10.46337/esdi.210414.
Texto completoZhang, Fan, Ying Zhang, Liuyan Huang y Wenqin Zhou. Interventions for promoting physical activity in patients with end stage renal disease receiving hemodialysis. INPLASY - International Platform of Registered Systematic Review Protocols, marzo de 2020. http://dx.doi.org/10.37766/inplasy2020.3.0013.
Texto completoBretherton, Christopher, Po-Lun Ma y Peter Caldwell. Transforming ESM Physical Parameterization Development Using Machine Learning Trained on Global Cloud-Resolving Models and Process Observations. Office of Scientific and Technical Information (OSTI), abril de 2021. http://dx.doi.org/10.2172/1769790.
Texto completoPerdigão, Rui A. P. Beyond Quantum Security with Emerging Pathways in Information Physics and Complexity. Synergistic Manifolds, junio de 2022. http://dx.doi.org/10.46337/220602.
Texto completoSecond Physical Activity Almanac. Chair Andrea Ramírez Varela. Ediciones Uniandes, noviembre de 2021. http://dx.doi.org/10.51572/202102.
Texto completoSharp, Jeremy, Locke Williams, Duncan Bryant, Jake Allgeier, Kevin Pigg, Gary Bell y Dana Moses. Rough River Outlet Works physical model study. Engineer Research and Development Center (U.S.), junio de 2021. http://dx.doi.org/10.21079/11681/41043.
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