Literatura académica sobre el tema "Electronic Microscope and microscopy"
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Artículos de revistas sobre el tema "Electronic Microscope and microscopy"
Chen, Xiaodong, Bin Zheng y Hong Liu. "Optical and Digital Microscopic Imaging Techniques and Applications in Pathology". Analytical Cellular Pathology 34, n.º 1-2 (2011): 5–18. http://dx.doi.org/10.1155/2011/150563.
Texto completoDaberkow, I. y M. Schierjott. "Possibilities And Examples For Remote Microscopy Including Digital Image Acquisition, Transfer, and Archiving". Microscopy and Microanalysis 4, S2 (julio de 1998): 2–3. http://dx.doi.org/10.1017/s1431927600020134.
Texto completoLiu, J. y J. R. Ebner. "Nano-Characterization of Industrial Heterogeneous Catalysts". Microscopy and Microanalysis 4, S2 (julio de 1998): 740–41. http://dx.doi.org/10.1017/s1431927600023825.
Texto completoKordesch, Martin E. "Introduction to emission electron microscopy for the in situ study of surfaces". Proceedings, annual meeting, Electron Microscopy Society of America 51 (1 de agosto de 1993): 506–7. http://dx.doi.org/10.1017/s0424820100148368.
Texto completoVilà, Anna, Sergio Moreno, Joan Canals y Angel Diéguez. "A Compact Raster Lensless Microscope Based on a Microdisplay". Sensors 21, n.º 17 (3 de septiembre de 2021): 5941. http://dx.doi.org/10.3390/s21175941.
Texto completoKondo, Y., K. Yagi, K. Kobayashi, H. Kobayashi y Y. Yanaka. "Construction Of UHV-REM-PEEM for Surface Studies". Proceedings, annual meeting, Electron Microscopy Society of America 48, n.º 1 (12 de agosto de 1990): 350–51. http://dx.doi.org/10.1017/s0424820100180501.
Texto completoKatoh, Kazuo. "Software-Based Three-Dimensional Deconvolution Microscopy of Cytoskeletal Proteins in Cultured Fibroblast Using Open-Source Software and Open Hardware". Journal of Imaging 5, n.º 12 (23 de noviembre de 2019): 88. http://dx.doi.org/10.3390/jimaging5120088.
Texto completoSchwarzer, Robert. "Orientation Microscopy Using the Analytical Scanning Electron Microscope". Practical Metallography 51, n.º 3 (17 de marzo de 2014): 160–79. http://dx.doi.org/10.3139/147.110280.
Texto completoDantas de Oliveira, Allisson, Carles Rubio Maturana, Francesc Zarzuela Serrat, Bruno Motta Carvalho, Elena Sulleiro, Clara Prats, Anna Veiga et al. "Development of a low-cost robotized 3D-prototype for automated optical microscopy diagnosis: An open-source system". PLOS ONE 19, n.º 6 (21 de junio de 2024): e0304085. http://dx.doi.org/10.1371/journal.pone.0304085.
Texto completoFaruqi, A. R. y Sriram Subramaniam. "CCD detectors in high-resolution biological electron microscopy". Quarterly Reviews of Biophysics 33, n.º 1 (febrero de 2000): 1–27. http://dx.doi.org/10.1017/s0033583500003577.
Texto completoTesis sobre el tema "Electronic Microscope and microscopy"
Yu, Enhua. "Crossed and uncrossed retinal fibres in normal and monocular hamsters : light and electron microscopic studies /". [Hong Kong : University of Hong Kong], 1990. http://sunzi.lib.hku.hk/hkuto/record.jsp?B13014316.
Texto completoMorgan, Scott Warwick. "Gaseous secondary electron detection and cascade amplification in the environmental scanning electron microscope /". Electronic version, 2005. http://adt.lib.uts.edu.au/public/adt-NTSM20060511.115302/index.html.
Texto completoHarland, C. J. "Detector and electronic developments for scanning electron microscopy". Thesis, University of Sussex, 1985. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.370435.
Texto completo于恩華 y Enhua Yu. "Crossed and uncrossed retinal fibres in normal and monocular hamsters: light and electron microscopic studies". Thesis, The University of Hong Kong (Pokfulam, Hong Kong), 1990. http://hub.hku.hk/bib/B31232449.
Texto completoBélisle, Jonathan. "Design and assembly of a multimodal nonlinear laser scanning microscope". Thesis, McGill University, 2006. http://digitool.Library.McGill.CA:80/R/?func=dbin-jump-full&object_id=100765.
Texto completoEl, Hajraoui Khalil. "Études in-situ dans un microscope électronique en transmission des réactions à l’état solide entre métal et nanofil de Ge". Thesis, Université Grenoble Alpes (ComUE), 2017. http://www.theses.fr/2017GREAY012/document.
Texto completoSemiconductor nanowires (NWs) are promising candidates for many device applications ranging from electronics and optoelectronics to energy conversion and spintronics. However, typical NW devices are fabricated using electron beam lithography and therefore source, drain and channel length still depend on the spatial resolution of the lithography. In this work we show fabrication of NW devices in a transmission electron microscope (TEM) where we can obtain atomic resolution on the channel length using in-situ propagation of a metallic phase in the semiconducting NW independent of the lithography resolution. We show results on semiconducting NW devices fabricated on two different electron transparent Si3N4 membranes: a planar membrane and a membrane where devices are suspended over holes. First we show the process of making lithographically defined reliable electrical contacts on individual NWs. Second we show first results on in-situ propagation of a metal-semiconductor phase in Ge NWs by joule heating, while measuring the current through the device. Two different devices are studied: one with platinum metal contacts and one with copper contacts. Different phenomena can occur in CuGe NWs during phase propagation
Romero, Leiro Freddy José. "Poly-articulated microrobotics for correlative AFM-in-SEM microscopy". Electronic Thesis or Diss., Sorbonne université, 2023. https://accesdistant.sorbonne-universite.fr/login?url=https://theses-intra.sorbonne-universite.fr/2023SORUS520.pdf.
Texto completoCorrelative microscopy is the result of the combination of two or more microscopy techniques to provide complementary information on a sample. When using a scanning electron microscope (SEM) and an atomic force microscope (AFM), AFM-in-SEM correlative microscopy not only enables the 3D characterization of samples observed inside a SEM, but also the manipulation of micro- and nanostructures with an extremely high precision. This technique can be applied to various samples in biology, electronics and materials science. Although existing AFM-in-SEM solutions in the current state of the art are powerful, they require expert users; they are not versatile enough to be used for different types of tasks; and they use Cartesian AFM robots that severely limit the dexterity and performance of the imaging system. The aim of this thesis is to study and experiment an original concept of an AFM based on poly- articulated robotics for AFM-in-SEM correlative microscopy. A homemade 6 DoF (3 translations and 3 rotations) robotic AFM system is developed and integrated inside a SEM. The ability to control 3 positions and 3 rotations of a micrometer sized AFM probe while keeping the center of rotation at the close proximity of a micro-structure is very challenging. This is mainly due to the uncertainties inherent to the assembly of micro-robotic systems and clearances in the joints of the robot that are of the same order of magnitude as the required AFM probe positioning accuracy. Robot calibration methods and control theory can however overcome these limitations as demonstrated in the thesis. Control strategies and a user interface are studied to operate the multi DoF correlative imaging system in a versatile and intuitive way for low-level end users while keeping it enough powerful for high-level end users. Several key features that go beyond the state of the art are implemented, including - Vision based control for fast and automated landing of an AFM probe on a micrometer sized sample with robustness with respect to the SEM magnification. The user can select any region of interest (ROI) on a sample by simply performing a mouse click on the SEM screen. Whatever the SEM magnification, the control algorithm ensures a safe landing of the AFM probe on the ROI. The surface of the sample can be as high as several square centimeters and the positioning can be achieved with a micrometric precision. - In-plane and out-of-plane rotation of a sample relatively to the AFM probe while keeping the center of rotation around the tip of the AFM. The center of rotation is defined by the user with a mouse click on the SEM screen. This feature is useful for manipulation and topography tasks, as well as for multi-angle observations of a sample inside a SEM. - Trajectory/speed selection modes. Low speed AFM mode for a detailed topography imaging. Fast AFM mode (4fps) for dynamic observations at the nanoscale. The users also have access to the control parameters. They can be modified to suit their needs. - Mosaic AFM mode to extend the topography scanning area inside a SEM. All these features rely on research works in robotics, mechatronics and control made during the thesis. The latter has the potential to opens the door to a new era of poly-articulated atomic force microscopes used in correlative microscopy
Leane, Robert B. "Scanning tunnelling microscopy". Thesis, University of Cambridge, 1990. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.291716.
Texto completoMarturi, Naresh. "Vison and visual servoing for nanomanipulation and nanocharacterization using scanning electron microscope". Thesis, Besançon, 2013. http://www.theses.fr/2013BESA2014/document.
Texto completoWith the latest advances in nanotechnology, it became possible to design novel nanoscale devicesand systems with increasing efficiency. The consequence of this fact is an increase in the need for developing reliable and cutting edge processes for nanomanipulation and nanocharacterization. Since the human direct sensing is not a feasible option at this particular scale, the tasks are usually performedby an expert human operator using a scanning electron microscope (SEM) equipped withmicro-nanorobotic devices. However, due to the lack of effective processes, these tasks are always challenging and often tiresome to perform. Through this work we show that, this problem can be tackle deffectively up to an extent using the microscopic vision information. It is concerned about using the SEM vision to develop reliable automated methods in order to perform accurate and efficient nanomanipulation and nano characterization. Since, SEM imaging is affected by the non-linearities and instabilities present in the electron column, real time methods to monitor the imaging quality and to compensate the time varying distortion were developed. Later, these images were used in the development of visual servoing control laws. The developed visual servoing-based autofocusing method ensures a constant focus throughout the process and was used for estimating the inter-object depth that is highly challenging to compute using a SEM. Two visual servoing schemes were developed toperform accurate nanopositioning using a nanorobotic station positioned inside SEM. They are basedon the direct use of global pixel intensities and Fourier spectral information respectively. The positioning accuracies achieved by both the methods at different experimental conditions were satisfactory.The achieved results facilitate in developing accurate and reliable applications such as topographic analysis, nanoprobing and sample lift-out using SEM
Tomic, Aleksandra T. "Scanning tunneling microscopy of complex electronic materials". Diss., Connect to online resource - MSU authorized users, 2008.
Buscar texto completoTitle from PDF t.p. (viewed on Mar. 27, 2009) Includes bibliographical references (p. 95-102). Also issued in print.
Libros sobre el tema "Electronic Microscope and microscopy"
The principles and practice of electron microscopy. Cambridge [Cambridgeshire]: Cambridge University Press, 1985.
Buscar texto completoDoane, Frances W. Canadian contributions to microscopy: An historical account of the development of the first electron microscope in North America and the first 20 years of the Microscopical Society of Canada/Société de microscopie du Canada. Toronto: Microscopical Society of Canada, 1993.
Buscar texto completoW, Doane F., Simon G. T y Watson J. H. L, eds. Canadian contributions to microscopy: An historical account of the development of the first electron microscope in North America and the first 20 years of the Microscopical Society of Canada / Société de Microscopie du Canada. Toronto, Ont: Microscopial Society of Canada, 1993.
Buscar texto completoReimer, Ludwig. Scanning electron microscopy: Physics of image formation and microanalysis. 2a ed. Berlin: Springer, 1998.
Buscar texto completoScanning electron microscopy: Physics of image formation and microanalysis. Berlin: Springer-Verlag, 1985.
Buscar texto completoJ, Goodhew Peter, ed. Thin foil preparation for electron microscopy. Amsterdam: Elsevier, 1985.
Buscar texto completoHayat, M. A. Basic techniques for transmission electron microscopy. Orlando: Academic Press, 1985.
Buscar texto completoChampness, P. E. Electron diffraction in the transmission electron microscope. Oxford: BIOS Scientific Publishers, 2001.
Buscar texto completoR, Lewis P., ed. Biological specimen preparation for transmission electron microscopy. Princeton, N.J: Princeton University Press, 1998.
Buscar texto completoAyache, Jeanne. Sample preparation handbook for transmission electron microscopy: Techniques. New York: Springer, 2010.
Buscar texto completoCapítulos de libros sobre el tema "Electronic Microscope and microscopy"
Badiye, Ashish, Neeti Kapoor y Ritesh K. Shukla. "Forensic Applications of Electron Microscope". En Forensic Microscopy, 251–70. Boca Raton: CRC Press, 2022. http://dx.doi.org/10.4324/9781003120995-20.
Texto completoMilne, R. H. "Reflection Microscopy in a Scanning Transmission Electron Microscope". En NATO ASI Series, 317–28. Boston, MA: Springer US, 1988. http://dx.doi.org/10.1007/978-1-4684-5580-9_23.
Texto completoSims, Paul, Ralph Albrecht, James B. Pawley, Victoria Centonze, Thomas Deerinck y Jeff Hardin. "When Light Microscope Resolution Is Not Enough:Correlational Light Microscopy and Electron Microscopy". En Handbook Of Biological Confocal Microscopy, 846–60. Boston, MA: Springer US, 2006. http://dx.doi.org/10.1007/978-0-387-45524-2_49.
Texto completoWilliams, David B. y C. Barry Carter. "The Transmission Electron Microscope". En Transmission Electron Microscopy, 3–22. Boston, MA: Springer US, 2009. http://dx.doi.org/10.1007/978-0-387-76501-3_1.
Texto completoWilliams, David B. y C. Barry Carter. "The Transmission Electron Microscope". En Transmission Electron Microscopy, 3–17. Boston, MA: Springer US, 1996. http://dx.doi.org/10.1007/978-1-4757-2519-3_1.
Texto completoGerber, Ch, G. Binnig, H. Fechs, O. Marti y H. Rohrer. "Scanning tunneling microscope combined with a scanning electron microscope". En Scanning Tunneling Microscopy, 79–82. Dordrecht: Springer Netherlands, 1986. http://dx.doi.org/10.1007/978-94-011-1812-5_8.
Texto completoReimer, Ludwig. "Electron Optics of a Scanning Electron Microscope". En Scanning Electron Microscopy, 13–56. Berlin, Heidelberg: Springer Berlin Heidelberg, 1985. http://dx.doi.org/10.1007/978-3-662-13562-4_2.
Texto completoReimer, Ludwig. "Elements of a Transmission Electron Microscope". En Transmission Electron Microscopy, 79–142. Berlin, Heidelberg: Springer Berlin Heidelberg, 1997. http://dx.doi.org/10.1007/978-3-662-14824-2_4.
Texto completoReimer, Ludwig. "Elements of a Transmission Electron Microscope". En Transmission Electron Microscopy, 86–135. Berlin, Heidelberg: Springer Berlin Heidelberg, 1993. http://dx.doi.org/10.1007/978-3-662-21556-2_4.
Texto completoReimer, Ludwig. "Elements of a Transmission Electron Microscope". En Transmission Electron Microscopy, 86–135. Berlin, Heidelberg: Springer Berlin Heidelberg, 1989. http://dx.doi.org/10.1007/978-3-662-21579-1_4.
Texto completoActas de conferencias sobre el tema "Electronic Microscope and microscopy"
Monachon, C., M. S. Zielinski, D. Gachet, S. Sonderegger, S. Muckenhirn, J. Berney, D. Poppitz, A. Graff, S. Breuer y L. Kirste. "Failure Analysis and Defect Inspection of Electronic Devices by High-Resolution Cathodoluminescence". En ISTFA 2017. ASM International, 2017. http://dx.doi.org/10.31399/asm.cp.istfa2017p0349.
Texto completoYatagai, Toyohiko, Katsuyuki Ohmura y Shigeo Iwasaki. "Phase sensitive analysis of electron holograms". En Holography. Washington, D.C.: Optica Publishing Group, 1986. http://dx.doi.org/10.1364/holography.1986.wb3.
Texto completoBaibyrin, V. B., P. I. Anisimov, N. P. Konnov, A. A. Shcherbakov y U. P. Volkov. "Near field scanning optical microscope for biological applications". En Laser Applications to Chemical and Environmental Analysis. Washington, D.C.: Optica Publishing Group, 1996. http://dx.doi.org/10.1364/lacea.1996.lwd.9.
Texto completoWebb, Robert H. "Microlaser microscope". En OSA Annual Meeting. Washington, D.C.: Optica Publishing Group, 1990. http://dx.doi.org/10.1364/oam.1990.mpp4.
Texto completoVillarraga-Gómez, Herminso, Kyle Crosby, Masako Terada y Mansoureh Norouzi Rad. "Assessing Electronics with Advanced 3D X-ray Microscopy Techniques and Electron Microscopy". En ISTFA 2023. ASM International, 2023. http://dx.doi.org/10.31399/asm.cp.istfa2023p0554.
Texto completoSandoz, P., J. L. Pretet, R. Zeggari, L. Froehly, C. Mougin y M. P. Bernal. "Micro-patterned microscope slides for position referencing in optical microscopy". En 2007 European Conference on Lasers and Electro-Optics and the International Quantum Electronics Conference. IEEE, 2007. http://dx.doi.org/10.1109/cleoe-iqec.2007.4386655.
Texto completoLarkin, Kieran G., Carol J. Cogswell, John W. O'Byrne y Matthew R. Arnison. "High-resolution, multiple optical mode confocal microscope: II. Theoretical aspects of confocal transmission microscopy". En IS&T/SPIE 1994 International Symposium on Electronic Imaging: Science and Technology, editado por Carol J. Cogswell y Kjell Carlsson. SPIE, 1994. http://dx.doi.org/10.1117/12.172106.
Texto completoPostek, Michael T., András E. Vladár, William Keery, Michael Bishop, Benjamin Bunday y John Allgair. "NEW scanning electron microscope magnification calibration reference material (RM) 8820". En Scanning Microscopy 2010, editado por Michael T. Postek, Dale E. Newbury, S. Frank Platek y David C. Joy. SPIE, 2010. http://dx.doi.org/10.1117/12.859118.
Texto completoMiyasaka, C. y B. R. Tittmann. "Application of Scanning Acoustic Microscopy to Electric and Electronic Parts". En ISTFA 2000. ASM International, 2000. http://dx.doi.org/10.31399/asm.cp.istfa2000p0303.
Texto completoSchmahl, Gunter. "X-ray microscopy studies of biological specimens in their natural state". En OSA Annual Meeting. Washington, D.C.: Optica Publishing Group, 1991. http://dx.doi.org/10.1364/oam.1991.tuee1.
Texto completoInformes sobre el tema "Electronic Microscope and microscopy"
De Lozanne, Alejandro. Nanofabrication of Electronic Devices With the Scanning Tunneling Microscope. Fort Belvoir, VA: Defense Technical Information Center, octubre de 1994. http://dx.doi.org/10.21236/ada292463.
Texto completoCobden, David. Combined microscopy studies of complex electronic materials. Final report. Office of Scientific and Technical Information (OSTI), octubre de 2019. http://dx.doi.org/10.2172/1570390.
Texto completoLeRoy, Brian. Understanding and Controlling the Electronic Properties of Graphene Using Scanning Probe Microscopy. Fort Belvoir, VA: Defense Technical Information Center, julio de 2014. http://dx.doi.org/10.21236/ada612223.
Texto completoYazdani, Ali. Probing Electronic States of Magnetic Semiconductors Using Atomic Scale Microscopy & Spectroscopy. Fort Belvoir, VA: Defense Technical Information Center, diciembre de 2013. http://dx.doi.org/10.21236/ada614343.
Texto completoDavis, Seamus y Paul L. McEuen. Electronic Wavefunction Imaging and Spectroscopy in Metallic and Magnetic Nanostructures by Millikelvin Scanning Tunneling Microscopy. Fort Belvoir, VA: Defense Technical Information Center, mayo de 2002. http://dx.doi.org/10.21236/ada414343.
Texto completoWilliams, Clayton y Christoph Boehme. Room Temperature Single-Spin Tunneling Force Microscopy for Characterization of Paramagnetic Defects in Electronic Materials. Fort Belvoir, VA: Defense Technical Information Center, abril de 2014. http://dx.doi.org/10.21236/ada604959.
Texto completoBarbara, Paul F. Ultrafast Near-Field Scanning Optical Microscopy (NSOM) of Emerging Display Technology Media: Solid State Electronic Structure and Dynamics,. Fort Belvoir, VA: Defense Technical Information Center, mayo de 1995. http://dx.doi.org/10.21236/ada294879.
Texto completoWolf, E. L. Control of the Residual Sub-Electronic Charge on a Mesoscopic Conductor by Means of a Scanning Tunneling Microscope Tip. Fort Belvoir, VA: Defense Technical Information Center, marzo de 1994. http://dx.doi.org/10.21236/ada277290.
Texto completoCrewe, A. V. y O. H. Kapp. Electron microscope studies. Office of Scientific and Technical Information (OSTI), junio de 1991. http://dx.doi.org/10.2172/6000131.
Texto completoCrewe, A. V. y O. H. Kapp. Electron microscope studies. Office of Scientific and Technical Information (OSTI), julio de 1992. http://dx.doi.org/10.2172/7015892.
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