Literatura académica sobre el tema "Electron microscope"
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Artículos de revistas sobre el tema "Electron microscope"
Möller, Lars, Gudrun Holland y Michael Laue. "Diagnostic Electron Microscopy of Viruses With Low-voltage Electron Microscopes". Journal of Histochemistry & Cytochemistry 68, n.º 6 (21 de mayo de 2020): 389–402. http://dx.doi.org/10.1369/0022155420929438.
Texto completoGauvin, Raynald y Steve Yue. "The Observation of NBC Precipitates In Steels In The Nanometer Range Using A Field Emission Gun Scanning Electron Microscope". Microscopy and Microanalysis 3, S2 (agosto de 1997): 1243–44. http://dx.doi.org/10.1017/s1431927600013106.
Texto completoRoss, Frances M. "Materials Science in the Electron Microscope". MRS Bulletin 19, n.º 6 (junio de 1994): 17–21. http://dx.doi.org/10.1557/s0883769400036691.
Texto completoKordesch, Martin E. "Introduction to emission electron microscopy for the in situ study of surfaces". Proceedings, annual meeting, Electron Microscopy Society of America 51 (1 de agosto de 1993): 506–7. http://dx.doi.org/10.1017/s0424820100148368.
Texto completoO'Keefe, Michael A., John H. Turner, John A. Musante, Crispin J. D. Hetherington, A. G. Cullis, Bridget Carragher, Ron Jenkins et al. "Laboratory Design for High-Performance Electron Microscopy". Microscopy Today 12, n.º 3 (mayo de 2004): 8–17. http://dx.doi.org/10.1017/s1551929500052093.
Texto completoKONNO, Mitsuru, Toshie YAGUCHI y Takahito HASHIMOTO. "Transmission Electron Microscop and Scanning Transmission Electron Microscope". Journal of the Japan Society of Colour Material 79, n.º 4 (2006): 147–51. http://dx.doi.org/10.4011/shikizai1937.79.147.
Texto completoWatson, John H. L. "In the beginning there were electrons". Proceedings, annual meeting, Electron Microscopy Society of America 50, n.º 2 (agosto de 1992): 1068–69. http://dx.doi.org/10.1017/s0424820100129978.
Texto completoAi, R. "A Microscope-Compatible Auger Electron Spectrometer". Proceedings, annual meeting, Electron Microscopy Society of America 49 (agosto de 1991): 992–93. http://dx.doi.org/10.1017/s0424820100089275.
Texto completoKersker, M., C. Nielsen, H. Otsuji, T. Miyokawa y S. Nakagawa. "The JSM-890 ultra high resolution Scanning Electron Microscope". Proceedings, annual meeting, Electron Microscopy Society of America 47 (6 de agosto de 1989): 88–89. http://dx.doi.org/10.1017/s0424820100152410.
Texto completoSchatten, G., J. Pawley y H. Ris. "Integrated microscopy resource for biomedical research at the university of wisconsin at madison". Proceedings, annual meeting, Electron Microscopy Society of America 45 (agosto de 1987): 594–97. http://dx.doi.org/10.1017/s0424820100127451.
Texto completoTesis sobre el tema "Electron microscope"
Morgan, Scott Warwick. "Gaseous secondary electron detection and cascade amplification in the environmental scanning electron microscope /". Electronic version, 2005. http://adt.lib.uts.edu.au/public/adt-NTSM20060511.115302/index.html.
Texto completoMartin, Geoffrey Clive. "Virtual Scanning Electron Microscope : a web-based teaching and training solution for the Scanning Electron Microscope". Thesis, University of Cambridge, 2008. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.611878.
Texto completoDuckett, Gordon Richard. "Electron microscope studies of organic pigments". Thesis, University of Glasgow, 1987. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.305588.
Texto completoSkoupý, Radim. "Quantitative Imaging in Scanning Electron Microscope". Doctoral thesis, Vysoké učení technické v Brně. Fakulta strojního inženýrství, 2020. http://www.nusl.cz/ntk/nusl-432610.
Texto completoLöfgren, André. "Detection of electron vortex beams : Using a scanning transmission electron microscope". Thesis, Uppsala universitet, Materialteori, 2015. http://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-255330.
Texto completoElektronvirvelstrålar (EVS) är elektronstrålar med en munk-liknande intensitetsprofil. Dessa bär på rörelsemängdsmoment på grund av sin fasdistribution. När de används i ett elektronmikroskop förväntas de vara effektiva för detektering av magnetiska signaler. I denna uppsats har jag undersökt high angle annular dark field (HAADF) bilder som erhållits med hjälp av EVS. Detta gjordes för 300 K och 5K. För 5 K, jämförde jag även HAADF bilder från en vanlig elektronstråle med HAADF bilder från en elektronvirvelstråle. Vad jag fann var att EVS producerade en munkformad intensitetsfördelning runt atomerna. Men när hänsyn till storleken på elektronkällan togs i beaktande kunde inte detta fenomen observeras längre. När bilder från EVS jämfördes med bilder från vanliga elektronstrålar, fann jag att intensiteten av spridda elektroner runt atomkolumnerna var bredare för EVS. Detta kunde observeras även efter att jag tagit hänsyn till elektronkällans storlek.
Chen, Li. "Fabrication of electron sources for a miniature scanning electron microscope". Thesis, University of York, 1999. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.313904.
Texto completoJohnson, Lars. "Nanoindentation in situ a Transmission Electron Microscope". Thesis, Linköping University, Department of Physics, Chemistry and Biology, 2007. http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-8333.
Texto completoThe technique of Nanoindentation in situ Transmission Electron Microscope has been implemented on a Philips CM20. Indentations have been performed on Si and Sapphire (α-Al2O3) cut from wafers; Cr/Sc multilayers and Ti3SiC2 thin films. Different sample geometries and preparation methods have been evaluated. Both conventional ion and Focused Ion Beam milling were used, with different ways of protecting the sample during milling. Observations were made of bending and fracture of samples, dislocation nucleation and dislocation movement. Basal slip was observed upon unloading in Sapphire. Dislocation movement constricted along the basal planes were observed in Ti3SiC2. Post indentation electron microscopy revealed kink formation in Ti3SiC2 and layer rotation and slip across layers in Cr/Sc multilayer stacks. Limitations of the technique are presented and discussed.
Lyster, Martin. "Electron microscope studies of cadmium mercury telluride". Thesis, University of Oxford, 1989. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.238271.
Texto completoDellith, Meike. "Electron microscope investigations of defects in DRAMs". Thesis, University of Oxford, 1993. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.334379.
Texto completoChristensen, K. N. "Electron microscope studies of oxygen implanted silicon". Thesis, University of Oxford, 1990. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.292615.
Texto completoLibros sobre el tema "Electron microscope"
Thomas, Mulvey y Sheppard C. J. R, eds. Advances inoptical and electron microscopy. London: Academic, 1990.
Buscar texto completoChampness, P. E. Electron diffraction in the transmission electron microscope. Oxford: BIOS Scientific Publishers, 2001.
Buscar texto completoHayat, M. A. Basic techniques for transmission electron microscopy. Orlando: Academic Press, 1985.
Buscar texto completoReimer, Ludwig. Scanning electron microscopy: Physics of image formation and microanalysis. 2a ed. Berlin: Springer, 1998.
Buscar texto completoJ, Goodhew Peter, ed. Thin foil preparation for electron microscopy. Amsterdam: Elsevier, 1985.
Buscar texto completoTomb, Howard. Microaliens: Dazzling journeys with an electron microscope. New York: Farrar, Straus and Giroux, 1993.
Buscar texto completoEgerton, Ray F. Electron Energy-Loss Spectroscopy in the Electron Microscope. Boston, MA: Springer US, 1995. http://dx.doi.org/10.1007/978-1-4615-6887-2.
Texto completoEgerton, R. F. Electron Energy-Loss Spectroscopy in the Electron Microscope. Boston, MA: Springer US, 1996. http://dx.doi.org/10.1007/978-1-4757-5099-7.
Texto completoEgerton, R. F. Electron Energy-Loss Spectroscopy in the Electron Microscope. Boston, MA: Springer US, 2011. http://dx.doi.org/10.1007/978-1-4419-9583-4.
Texto completoEgerton, R. F. Electron energy-loss spectroscopy in the electron microscope. 2a ed. New York: Plenum Press, 1996.
Buscar texto completoCapítulos de libros sobre el tema "Electron microscope"
Gooch, Jan W. "Electron Microscope". En Encyclopedic Dictionary of Polymers, 889. New York, NY: Springer New York, 2011. http://dx.doi.org/10.1007/978-1-4419-6247-8_13623.
Texto completoWeik, Martin H. "electron microscope". En Computer Science and Communications Dictionary, 505. Boston, MA: Springer US, 2000. http://dx.doi.org/10.1007/1-4020-0613-6_6014.
Texto completoSchmitt, Robert. "Scanning Electron Microscope". En CIRP Encyclopedia of Production Engineering, 1–5. Berlin, Heidelberg: Springer Berlin Heidelberg, 2017. http://dx.doi.org/10.1007/978-3-642-35950-7_6595-4.
Texto completoStaufer, U., L. P. Muray, D. P. Kern y T. H. P. Chang. "Miniaturized Electron Microscope". En Nanosources and Manipulation of Atoms Under High Fields and Temperatures: Applications, 101–10. Dordrecht: Springer Netherlands, 1993. http://dx.doi.org/10.1007/978-94-011-1729-6_9.
Texto completoDijkstra, Jeanne y Cees P. de Jager. "Electron Microscope Serology". En Practical Plant Virology, 380–91. Berlin, Heidelberg: Springer Berlin Heidelberg, 1998. http://dx.doi.org/10.1007/978-3-642-72030-7_59.
Texto completoSchmitt, Robert. "Scanning Electron Microscope". En CIRP Encyclopedia of Production Engineering, 1501–5. Berlin, Heidelberg: Springer Berlin Heidelberg, 2019. http://dx.doi.org/10.1007/978-3-662-53120-4_6595.
Texto completoGooch, Jan W. "Scanning Electron Microscope". En Encyclopedic Dictionary of Polymers, 647. New York, NY: Springer New York, 2011. http://dx.doi.org/10.1007/978-1-4419-6247-8_10317.
Texto completoMitome, Masanori. "Transmission Electron Microscope". En Compendium of Surface and Interface Analysis, 775–81. Singapore: Springer Singapore, 2018. http://dx.doi.org/10.1007/978-981-10-6156-1_124.
Texto completoKinoshita, Toyohiko. "Photoemission Electron Microscope". En Compendium of Surface and Interface Analysis, 465–69. Singapore: Springer Singapore, 2018. http://dx.doi.org/10.1007/978-981-10-6156-1_76.
Texto completoSchmitt, Robert. "Scanning Electron Microscope". En CIRP Encyclopedia of Production Engineering, 1085–89. Berlin, Heidelberg: Springer Berlin Heidelberg, 2014. http://dx.doi.org/10.1007/978-3-642-20617-7_6595.
Texto completoActas de conferencias sobre el tema "Electron microscope"
Yatagai, Toyohiko, Katsuyuki Ohmura y Shigeo Iwasaki. "Phase sensitive analysis of electron holograms". En Holography. Washington, D.C.: Optica Publishing Group, 1986. http://dx.doi.org/10.1364/holography.1986.wb3.
Texto completoLarionov, Yu V. y Yu A. Novikov. "Virtual scanning electron microscope". En International Conference on Micro-and Nano-Electronics 2012, editado por Alexander A. Orlikovsky. SPIE, 2013. http://dx.doi.org/10.1117/12.2016977.
Texto completoPostek, Michael T. "Scanning electron microscope metrology". En Critical Review Collection. SPIE, 1994. http://dx.doi.org/10.1117/12.187461.
Texto completoMačák, Martin. "Electrohydrodynamic Model Of Electron Microscope". En STUDENT EEICT 2021. Brno: Fakulta elektrotechniky a komunikacnich technologii VUT v Brne, 2021. http://dx.doi.org/10.13164/eeict.2021.209.
Texto completoKrysztof, Michał, Marcin Białas y Tomasz Grzebyk. "Imaging Using Mems Electron Microscope". En 2023 IEEE 36th International Vacuum Nanoelectronics Conference (IVNC). IEEE, 2023. http://dx.doi.org/10.1109/ivnc57695.2023.10188948.
Texto completoKrysztof, Michal, Tomasz Grzebyk, Piotr Szyszka, Karolina Laszczyk, Anna Gorccka-Drzazza y Jan Dziuban. "Electron Transparent Anode for MEMS Transmission Electron Microscope". En 2018 XV International Scientific Conference on Optoelectronic and Electronic Sensors (COE). IEEE, 2018. http://dx.doi.org/10.1109/coe.2018.8435173.
Texto completoSimonaitis, John W., Maurice A. R. Krielaart, Stewart A. Koppell, Benjamin J. Slayton, Joseph Alongi, William P. Putnam, Karl K. Berggren y Phillip D. Keathley. "Electron-Photon Interactions in a Scanning Electron Microscope". En 2023 IEEE 36th International Vacuum Nanoelectronics Conference (IVNC). IEEE, 2023. http://dx.doi.org/10.1109/ivnc57695.2023.10188999.
Texto completoDemarest, James, Chris Deeb, Thomas Murray y Hong-Ying Zhai. "Energy-Dispersive X-ray Spectrometry Performance on Multiple Transmission Electron Microscope Platforms". En ISTFA 2010. ASM International, 2010. http://dx.doi.org/10.31399/asm.cp.istfa2010p0301.
Texto completoIvanov, S. N., S. N. Shilimanov y Sergei I. Shkuratov. "Design of field electron emission spectrometer, field ion microscope, and field electron emission microscope combination". En XVI International Symposium on Discharges and Electrical Insulation in Vacuum, editado por Gennady A. Mesyats. SPIE, 1994. http://dx.doi.org/10.1117/12.174564.
Texto completoAksenov, Y. Y., E. G. I. Reinders, Jan Greve, C. van Blitterswijk, J. de Bruijn y Cees Otto. "Integration of a confocal Raman microscope in an electron microscope". En EOS/SPIE European Biomedical Optics Week, editado por Karsten Koenig, Hans J. Tanke y Herbert Schneckenburger. SPIE, 2000. http://dx.doi.org/10.1117/12.410628.
Texto completoInformes sobre el tema "Electron microscope"
Crewe, A. V. y O. H. Kapp. Electron microscope studies. Office of Scientific and Technical Information (OSTI), junio de 1991. http://dx.doi.org/10.2172/6000131.
Texto completoCrewe, A. V. y O. H. Kapp. Electron microscope studies. Office of Scientific and Technical Information (OSTI), julio de 1992. http://dx.doi.org/10.2172/7015892.
Texto completoKenik, E. (Intermediate voltage electron microscope). Office of Scientific and Technical Information (OSTI), noviembre de 1989. http://dx.doi.org/10.2172/5356814.
Texto completoRen, Z. F. Purchase of Transmission Electron Microscope. Fort Belvoir, VA: Defense Technical Information Center, enero de 2001. http://dx.doi.org/10.21236/ada392051.
Texto completoHadjipansyis, George C. DURIP 00 Scanning Electron Microscope (SEM). Fort Belvoir, VA: Defense Technical Information Center, marzo de 2001. http://dx.doi.org/10.21236/ada388472.
Texto completoStirling, J. A. R. y G. J. Pringle. Tools of investigation: the electron microprobe and scanning electron microscope. Natural Resources Canada/ESS/Scientific and Technical Publishing Services, 1996. http://dx.doi.org/10.4095/210959.
Texto completoMarder, A., K. Barmak y D. Williams. Environmental scanning electron microscope (ESEM). Final report. Office of Scientific and Technical Information (OSTI), noviembre de 1998. http://dx.doi.org/10.2172/676882.
Texto completoCollins, Kimberlee Chiyoko, Albert Alec Talin, David W. Chandler y Joseph R. Michael. Development of Scanning Ultrafast Electron Microscope Capability. Office of Scientific and Technical Information (OSTI), noviembre de 2016. http://dx.doi.org/10.2172/1331925.
Texto completoFraser, Hamish L. Request for an Analytical Transmission Electron Microscope. Fort Belvoir, VA: Defense Technical Information Center, octubre de 1987. http://dx.doi.org/10.21236/ada189111.
Texto completoRuggiero, S. T. Single-electron tunneling. [Microwave scanning tunneling microscope]. Office of Scientific and Technical Information (OSTI), enero de 1993. http://dx.doi.org/10.2172/6854553.
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