Artículos de revistas sobre el tema "Dielectric breakdown in Mott insulators"
Crea una cita precisa en los estilos APA, MLA, Chicago, Harvard y otros
Consulte los 50 mejores artículos de revistas para su investigación sobre el tema "Dielectric breakdown in Mott insulators".
Junto a cada fuente en la lista de referencias hay un botón "Agregar a la bibliografía". Pulsa este botón, y generaremos automáticamente la referencia bibliográfica para la obra elegida en el estilo de cita que necesites: APA, MLA, Harvard, Vancouver, Chicago, etc.
También puede descargar el texto completo de la publicación académica en formato pdf y leer en línea su resumen siempre que esté disponible en los metadatos.
Explore artículos de revistas sobre una amplia variedad de disciplinas y organice su bibliografía correctamente.
Eckstein, Martin y Philipp Werner. "Dielectric breakdown of Mott insulators – doublon production and doublon heating". Journal of Physics: Conference Series 427 (27 de marzo de 2013): 012005. http://dx.doi.org/10.1088/1742-6596/427/1/012005.
Texto completoSchilirò, Emanuela, Raffaella Lo Nigro, Fabrizio Roccaforte y Filippo Giannazzo. "Recent Advances in Seeded and Seed-Layer-Free Atomic Layer Deposition of High-K Dielectrics on Graphene for Electronics". C — Journal of Carbon Research 5, n.º 3 (2 de septiembre de 2019): 53. http://dx.doi.org/10.3390/c5030053.
Texto completoJunge, Paul, Moritz Greinacher, Delf Kober, Patrick Stargardt y Christian Rupprecht. "Metastable Phase Formation, Microstructure, and Dielectric Properties in Plasma-Sprayed Alumina Ceramic Coatings". Coatings 12, n.º 12 (29 de noviembre de 2022): 1847. http://dx.doi.org/10.3390/coatings12121847.
Texto completoRosch, A. "Breakdown of Luttinger's theorem in two-orbital Mott insulators". European Physical Journal B 59, n.º 4 (octubre de 2007): 495–502. http://dx.doi.org/10.1140/epjb/e2007-00312-3.
Texto completoTaguchi, Y., T. Matsumoto y Y. Tokura. "Dielectric breakdown of one-dimensional Mott insulatorsSr2CuO3andSrCuO2". Physical Review B 62, n.º 11 (15 de septiembre de 2000): 7015–18. http://dx.doi.org/10.1103/physrevb.62.7015.
Texto completoYamakawa, H., T. Miyamoto, T. Morimoto, T. Terashige, H. Yada, N. Kida, M. Suda et al. "Mott transition by an impulsive dielectric breakdown". Nature Materials 16, n.º 11 (21 de agosto de 2017): 1100–1105. http://dx.doi.org/10.1038/nmat4967.
Texto completoKumagai, Shohei, Hiroaki Iguchi, Masahiro Yamashita y Shinya Takaishi. "Thermally induced electron–hole dissociation dynamics in quasi-one-dimensional bromo-bridged palladium(iii) Mott-insulator [Pd(en)2Br](Suc-Cn)2·H2O (Cn-Y = dialkylsulfosuccinate; n = 5 and 6)". Physical Chemistry Chemical Physics 24, n.º 13 (2022): 7978–82. http://dx.doi.org/10.1039/d2cp00051b.
Texto completoTerasaki, I., T. Takayanagi, M. Kogure y T. Mizuno. "Out-of-plane dielectric response of the two-dimensional Mott insulators". Physica C: Superconductivity 357-360 (septiembre de 2001): 96–98. http://dx.doi.org/10.1016/s0921-4534(01)00174-5.
Texto completoAbou-Kandil, Ahmed I., Loai Nasrat y EmanL Fareed. "High temperature vulcanized ethylene propylene diene rubber nanocomposites as high voltage insulators: Dielectric breakdown measurements and evaluation". Polymers and Polymer Composites 30 (enero de 2022): 096739112211325. http://dx.doi.org/10.1177/09673911221132593.
Texto completoFuertes, V., M. J. Cabrera, J. Seores, D. Muñoz, J. F. Fernández y E. Enríquez. "Microstructural study of dielectric breakdown in glass-ceramics insulators". Journal of the European Ceramic Society 39, n.º 2-3 (febrero de 2019): 376–83. http://dx.doi.org/10.1016/j.jeurceramsoc.2018.08.044.
Texto completoKim, Taeyong, Simpy Sanyal, Seongho Jeon y Junsin Yi. "Prediction of Dielectric Breakdown of OHTL Insulators Using Contact Angle Measurements". ECS Journal of Solid State Science and Technology 10, n.º 12 (1 de diciembre de 2021): 123010. http://dx.doi.org/10.1149/2162-8777/ac3ff6.
Texto completoZulkifeli, M. A., S. N. Sabki, S. Taking, N. A. Azmi y S. S. Jamuar. "The Effect of Different Dielectric Materials in Designing High-Performance Metal-Insulator-Metal (MIM) Capacitors". International Journal of Electrical and Computer Engineering (IJECE) 7, n.º 3 (1 de junio de 2017): 1554. http://dx.doi.org/10.11591/ijece.v7i3.pp1554-1561.
Texto completoKolodzey, J., E. A. Chowdhury, T. N. Adam, Guohua Qui, I. Rau, J. O. Olowolafe, J. S. Suehle y Yuan Chen. "Electrical conduction and dielectric breakdown in aluminum oxide insulators on silicon". IEEE Transactions on Electron Devices 47, n.º 1 (2000): 121–28. http://dx.doi.org/10.1109/16.817577.
Texto completoCorraze, B., E. Janod, L. Cario, P. Moreau, L. Lajaunie, P. Stoliar, V. Guiot et al. "Electric field induced avalanche breakdown and non-volatile resistive switching in the Mott Insulators AM4Q8". European Physical Journal Special Topics 222, n.º 5 (julio de 2013): 1046–56. http://dx.doi.org/10.1140/epjst/e2013-01905-1.
Texto completoSohail, Muhammad, Salman Amin, Yasir Butt y Muhammad Bin Zubaid Ramay. "Aging Performance of Low-Density Polyethylene/Silicone Rubber Blends Insulators Under Contaminated Conditions". Pakistan Journal of Engineering and Technology 5, n.º 1 (10 de marzo de 2022): 29–34. http://dx.doi.org/10.51846/vol5iss1pp29-34.
Texto completoLockwitz, S. y H. Jostlein. "A study of dielectric breakdown along insulators surrounding conductors in liquid argon". Journal of Instrumentation 11, n.º 03 (22 de marzo de 2016): P03026. http://dx.doi.org/10.1088/1748-0221/11/03/p03026.
Texto completoTanaka, Yasuhiro y Kenji Yonemitsu. "Current-voltage characteristics and breakdown mechanism in one-dimensional band and mott insulators attached to electrodes". Journal of the Korean Physical Society 62, n.º 12 (junio de 2013): 2164–67. http://dx.doi.org/10.3938/jkps.62.2164.
Texto completoUGAJIN, R., S. HIRATA y Y. MORI. "FERROMAGNETIC AND MOTT TRANSITIONS MODULATED BY VARYING FRACTAL DIMENSIONS IN FRACTAL–SHAPED NANOSTRUCTURES". International Journal of Modern Physics B 15, n.º 14 (10 de junio de 2001): 2025–44. http://dx.doi.org/10.1142/s0217979201006550.
Texto completoMorita, Kenji, Hiroshi Nozaki y Kisato Tone. "The Dielectric Breakdown Mechanism of Suspension Insulators due to the Steep Impulse Voltage". IEEJ Transactions on Power and Energy 116, n.º 11 (1996): 1415–21. http://dx.doi.org/10.1541/ieejpes1990.116.11_1415.
Texto completoNeusel, C., H. Jelitto y G. A. Schneider. "Electrical conduction mechanism in bulk ceramic insulators at high voltages until dielectric breakdown". Journal of Applied Physics 117, n.º 15 (21 de abril de 2015): 154902. http://dx.doi.org/10.1063/1.4917208.
Texto completoLefort Borges, Cícero y Manuel Luís Barreira Martinez. "Using radio frequency and ultrasonic antennas for inspecting pin-type insulators on medium-voltage overhead distribution lines". Ingeniería e Investigación 33, n.º 2 (1 de mayo de 2013): 63–69. http://dx.doi.org/10.15446/ing.investig.v33n2.39519.
Texto completoNeff, H., A. N. Lima, E. K. Melcher, C. Moreira, A. S. Barreto Neto y J. Precker. "An electro-thermal approach to dielectric breakdown in solids: application to crystalline polymer insulators". IEEE Transactions on Dielectrics and Electrical Insulation 17, n.º 3 (junio de 2010): 872–80. http://dx.doi.org/10.1109/tdei.2010.5492261.
Texto completoSUÑE, JORDI, DAVID JIMENEZ y ENRIQUE MIRANDA. "BREAKDOWN MODES AND BREAKDOWN STATISTICS OF ULTRATHIN SiO2 GATE OXIDES". International Journal of High Speed Electronics and Systems 11, n.º 03 (septiembre de 2001): 789–848. http://dx.doi.org/10.1142/s0129156401001003.
Texto completoKhan, Saadat Ullah, Muhammad Rafiq y Kashif Imdad. "Temporal Effects of Thermal Stresses on Solid Dielectric Materials under Diverse Voltage Conditions". Pakistan Journal of Engineering and Technology 5, n.º 2 (15 de junio de 2022): 11–16. http://dx.doi.org/10.51846/vol5iss2pp11-15.
Texto completoNesenyuk, T. A. "TESTING OF PROTOTYPE SIGNALING DEVICES FOR INSULATOR CONTROL". World of Transport and Transportation 16, n.º 3 (28 de junio de 2018): 36–49. http://dx.doi.org/10.30932/1992-3252-2018-16-3-4.
Texto completoStark, S. "On the size dependence of the dielectric breakdown strength of solid insulators at room temperature". Journal of the European Ceramic Society 42, n.º 2 (febrero de 2022): 462–71. http://dx.doi.org/10.1016/j.jeurceramsoc.2021.10.023.
Texto completoYoneda, Kenji, Yoshihiro Todokoro y Morio Inoue. "Thin silicon dioxide and nitrided oxide using rapid thermal processing for trench capacitors". Journal of Materials Research 6, n.º 11 (noviembre de 1991): 2362–70. http://dx.doi.org/10.1557/jmr.1991.2362.
Texto completoMitrovic, Ivona Z., Harry Finch, Leanne A. H. Jones, Vinod R. Dhanak, Adrian N. Hannah, Reza Valizadeh, Arne Benjamin B. Renz, Vishal Ajit Shah, Peter Michael Gammon y P. A. Mawby. "(Invited) Rare Earth Oxides on Wide Band Gap Semiconductors". ECS Meeting Abstracts MA2022-01, n.º 19 (7 de julio de 2022): 1072. http://dx.doi.org/10.1149/ma2022-01191072mtgabs.
Texto completoCajetan, Okolo Chidiebere, Ezechukwu O.A., Olisakwe C.O., Ezendokwelu C.E. y Umunna Chike. "CHARACTERIZATION OF ELECTRICAL PORCELAIN INSULATORS FROM LOCAL CLAYS". International Journal of Research -GRANTHAALAYAH 3, n.º 1 (31 de enero de 2015): 26–36. http://dx.doi.org/10.29121/granthaalayah.v3.i1.2015.3050.
Texto completoMitra, Kalyan Yoti, Enrico Sowade, Christoph Sternkiker, Carme Martínez-Domingo, Eloi Ramon, Jordi Carrabina y Reinhard R. Baumann. "Investigation on Electrical Stress over Metal-Insulator-Metal (MIM) Structures Based on Compound Dielectrics for the Inkjet-Printed OTFT Stability". Applied Mechanics and Materials 748 (abril de 2015): 129–33. http://dx.doi.org/10.4028/www.scientific.net/amm.748.129.
Texto completoLima, A. M. N., A. G. S. Barreto Neto, E. U. K. Melcher y H. Neff. "Refined dielectric breakdown model for crystalline organic insulators: electro-thermal instability coupled to interband impact ionization". IEEE Transactions on Dielectrics and Electrical Insulation 18, n.º 4 (agosto de 2011): 1038–45. http://dx.doi.org/10.1109/tdei.2011.5976093.
Texto completoZhang, Jianwei, Hongguang Wang, Yongdong Li, Chunliang Liu, Wei Luo y Jiawei Zhang. "Evolution of vacuum surface flashover for angled dielectric insulators with particle-in-cell simulation". Physics of Plasmas 29, n.º 4 (abril de 2022): 043506. http://dx.doi.org/10.1063/5.0082530.
Texto completoKovalchuk, N. S., A. A. Omelchenko, V. A. Pilipenko, V. A. Solodukha, S. V. Demidovich, V. V. Kolos, V. A. Filipenia y D. V. Shestovski. "Research of Electrophysical Properties of Thin Gate Dielectrics Obtained by Rapid Thermal Processing Method". Doklady BGUIR 20, n.º 4 (29 de junio de 2022): 44–52. http://dx.doi.org/10.35596/1729-7648-2022-20-4-44-52.
Texto completoMuangpratoom, Pichai, Issaraporn Khonchaiyaphum y Wanwilai Vittayakorn. "Improvement of the Electrical Performance of Outdoor Porcelain Insulators by Utilization of a Novel Nano-TiO2 Coating for Application in Railway Electrification Systems". Energies 16, n.º 1 (3 de enero de 2023): 561. http://dx.doi.org/10.3390/en16010561.
Texto completoWajanasoonthon, Kanin y Amnart Suksri. "Long Term Thermal Performance of Palm Oil and Nano Graphene Filler in Nanofluids Application on Transformer Insulating Oil and Electrical Breakdown Voltage". Key Engineering Materials 931 (9 de septiembre de 2022): 9–15. http://dx.doi.org/10.4028/p-bhz05b.
Texto completoGolovko, Sergey Vladimirovich y Julia Aleksandrovna Golovko. "Software and hardware complex based on technical vision for diagnosing electrical insulators". Vestnik of Astrakhan State Technical University. Series: Management, computer science and informatics 2022, n.º 3 (29 de julio de 2022): 30–37. http://dx.doi.org/10.24143/2072-9502-2022-3-30-37.
Texto completoSe-Ondoua, MuD Malec, N. Zebouchi y Hoang-The-Giam. "Study of space charge effect on dielectric DC breakdown of synthetic insulators with the pressure wave propagation method". Journal of Electrostatics 40-41 (junio de 1997): 355–61. http://dx.doi.org/10.1016/s0304-3886(97)00070-3.
Texto completoZheng, Jianjun, Shaojian He, Jiaqi Wang, Wenxuan Fang, Yang Xue, Liming Xie y Jun Lin. "Performance of Silicone Rubber Composites Filled with Aluminum Nitride and Alumina Tri-Hydrate". Materials 13, n.º 11 (29 de mayo de 2020): 2489. http://dx.doi.org/10.3390/ma13112489.
Texto completoEckstein, J. N., I. Bozovic y G. F. Virshup. "Atomic Layer-by-Layer Engineering of High Tc Materials and Heterostructure Devices". MRS Bulletin 19, n.º 9 (septiembre de 1994): 44–50. http://dx.doi.org/10.1557/s0883769400047989.
Texto completoMukherjee, Kalparupa, Carlo De Santi, Matteo Borga, Shuzhen You, Karen Geens, Benoit Bakeroot, Stefaan Decoutere, Gaudenzio Meneghesso, Enrico Zanoni y Matteo Meneghini. "Use of Bilayer Gate Insulator in GaN-on-Si Vertical Trench MOSFETs: Impact on Performance and Reliability". Materials 13, n.º 21 (23 de octubre de 2020): 4740. http://dx.doi.org/10.3390/ma13214740.
Texto completoLiu, Chang, Yiwen Xu, Daoguang Bi, Bing Luo, Fuzeng Zhang, Tingting Wang, Yingbang Yao, Shengguo Lu y Wenrong Xu. "The Effects of Aluminum-Nitride Nano-Fillers on the Mechanical, Electrical, and Thermal Properties of High Temperature Vulcanized Silicon Rubber for High-Voltage Outdoor Insulator Applications". Materials 12, n.º 21 (30 de octubre de 2019): 3562. http://dx.doi.org/10.3390/ma12213562.
Texto completoLucchini, Francesco, Nicolò Marconato y Paolo Bettini. "Automatic Optimization of Gas Insulated Components Based on the Streamer Inception Criterion". Electronics 10, n.º 18 (17 de septiembre de 2021): 2280. http://dx.doi.org/10.3390/electronics10182280.
Texto completoKannan, V. C. "Fresnel fringe contrast in the TEM: Application to study the microstructure of amorphous silicon". Proceedings, annual meeting, Electron Microscopy Society of America 49 (agosto de 1991): 1000–1001. http://dx.doi.org/10.1017/s0424820100089317.
Texto completoXayyavong, Mingkhouan, Kittipong Tonmitr, Norrawit Tonmitr y Eiji Kaneko. "The Scrutiny of the Insulation Breakdown Strength for the Nanocomposite Oxide Doped Epoxy Resin Insulator with Different Electrodes by Using Positive Impulse Voltage". Key Engineering Materials 705 (agosto de 2016): 63–67. http://dx.doi.org/10.4028/www.scientific.net/kem.705.63.
Texto completoLiu, Yunpeng, Wanxian Wang, Hechen Liu, Mingjia Zhang, Jie Liu y Junwei Qi. "Blending Modification of Alicyclic Resin and Bisphenol A Epoxy Resin to Enhance Salt Aging Resistance for Composite Core Rods". Polymers 14, n.º 12 (13 de junio de 2022): 2394. http://dx.doi.org/10.3390/polym14122394.
Texto completoPinterić, M., T. Ivek, M. Čulo, O. Milat, M. Basletić, B. Korin-Hamzić, E. Tafra, A. Hamzić, M. Dressel y S. Tomić. "What is the origin of anomalous dielectric response in 2D organic dimer Mott insulators κ-(BEDT-TTF)2Cu[N(CN)2]Cl and κ-(BEDT-TTF)2Cu2(CN)3". Physica B: Condensed Matter 460 (marzo de 2015): 202–7. http://dx.doi.org/10.1016/j.physb.2014.11.071.
Texto completoRenz, Arne Benjamin Benjamin, Oliver J. Vavasour, Peter Michael Gammon, Fan Li, Tianxiang Dai, Guy W. C. Baker, Nicholas E. Grant et al. "(Invited, Digital Presentation) Improved Reliability of 4H-SiC Metal-Oxide-Semiconductor Devices Utilising Atomic Layer Deposited Layers with Enhanced Interface Quality". ECS Meeting Abstracts MA2022-01, n.º 19 (7 de julio de 2022): 1065. http://dx.doi.org/10.1149/ma2022-01191065mtgabs.
Texto completoRashid, Arooj, Jawad Saleem, Muhammad Amin y Sahibzada Muhammad Ali. "Long-term aging characteristics of co-filled nano-silica and micro-ATH in HTV silicone rubber composite insulators". Polymers and Polymer Composites 29, n.º 1 (26 de enero de 2020): 40–56. http://dx.doi.org/10.1177/0967391120901421.
Texto completoRaicevic, Nebojsa B. y Nikola Raicevic. "Reducing the impact of ELF electromagnetic fields of HV power cables on the environment by modeling the cable accessories". COMPEL: The International Journal for Computation and Mathematics in Electrical and Electronic Engineering 34, n.º 4 (6 de julio de 2015): 1016–28. http://dx.doi.org/10.1108/compel-10-2014-0251.
Texto completoSchadler, Linda S., Wei Chen, L. Catherine Brinson, Ravishankar Sundararaman, Prajakta Prabhune y Akshay Iyer. "(Invited) Combining Machine Learning, DFT, EFM, and Modeling to Design Nanodielectric Behavior". ECS Meeting Abstracts MA2022-01, n.º 19 (7 de julio de 2022): 1068. http://dx.doi.org/10.1149/ma2022-01191068mtgabs.
Texto completo