Libros sobre el tema "Calibration standard"
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Field, Bruce F. Standard cell calibrations. Gaithersburg, MD: U.S. Dept. of Commerce, National Bureau of Standards, 1987.
Buscar texto completoInstitute, American National Standards. American national standard for calibration systems. Milwaukee, Wis: ASQC, 1987.
Buscar texto completoF, Strouse Gregory y National Institute of Standards and Technology (U.S.), eds. Standard reference material 1750: Standard platinum resistance thermometers, 13.8033 K to 429.7485 K. Gaithersburg, Md: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 2001.
Buscar texto completoTurgel, R. S. NBS 50 kHz phase angle calibration standard. Gaithersburg, MD: U.S. Dept. of Commerce, National Bureau of Standards, 1986.
Buscar texto completoSolid-state DC voltage standard calibrations. Gaithersburg, MD: U.S. Dept. of Commerce, National Bureau of Standards, 1988.
Buscar texto completoG, Voris Paul y National Institute of Standards and Technology (U.S.), eds. Coaxial reference standard for microwave power. [Gaithersburg, Md.?]: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1993.
Buscar texto completoJohnson, Aaron N. Gas flowmeter calibrations with the 26 m³ PVTt standard. Gaithersburg, Md.]: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 2011.
Buscar texto completoNational Institute of Standards and Technology (U.S.), ed. Standard platinum resistance thermometer calibrations from the Ar TP to the Ag FP. Gaithersburg, Md: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 2008.
Buscar texto completoField, Bruce F. Solid-state voltage standard performance and design guidelines. Gaithersburg, MD: U.S. Dept. of Commerce, National Bureau of Standards, 1987.
Buscar texto completoField, Bruce F. Solid-state voltage standard performance and design guidelines. Gaithersburg, MD: U.S. Dept. of Commerce, National Bureau of Standards, 1987.
Buscar texto completoField, Bruce F. Solid-state voltage standard performance and design guidelines. Gaithersburg, MD: U.S. Dept. of Commerce, National Bureau of Standards, 1987.
Buscar texto completoField, Bruce F. Solid-state voltage standard performance and design guidelines. Gaithersburg, MD: U.S. Dept. of Commerce, National Bureau of Standards, 1987.
Buscar texto completoField, Bruce F. Solid-state voltage standard performance and design guidelines. Gaithersburg, MD: U.S. Dept. of Commerce, National Bureau of Standards, 1987.
Buscar texto completoField, Bruce F. Solid-state voltage standard performance and design guidelines. Gaithersburg, MD: U.S. Dept. of Commerce, National Bureau of Standards, 1987.
Buscar texto completoField, Bruce F. Solid-state voltage standard performance and design guidelines. Gaithersburg, MD: U.S. Dept. of Commerce, National Bureau of Standards, 1987.
Buscar texto completoVezzetti, Carol F. Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems: Standard reference materials. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1992.
Buscar texto completoN, Varner Ruth, Potzick James E y National Institute of Standards and Technology (U.S.), eds. Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems: Standard reference materials. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1992.
Buscar texto completoVezzetti, Carol F. Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems: Standard reference materials. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1992.
Buscar texto completoN, Varner Ruth, Potzick James E y National Institute of Standards and Technology (U.S.), eds. Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems: Standard reference materials. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1992.
Buscar texto completoN, Varner Ruth, Potzick James E y National Institute of Standards and Technology (U.S.), eds. Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems: Standard reference materials. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1992.
Buscar texto completoN, Varner Ruth, Potzick James E y National Institute of Standards and Technology (U.S.), eds. Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems: Standard reference materials. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1992.
Buscar texto completoN, Varner Ruth, Potzick James E y National Institute of Standards and Technology (U.S.), eds. Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems: Standard reference materials. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1992.
Buscar texto completoN, Varner Ruth, Potzick James E y National Institute of Standards and Technology (U.S.), eds. Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems: Standard reference materials. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1992.
Buscar texto completoF, Strouse Gregory, Meyer C. W y National Institute of Standards and Technology (U.S.), eds. A revised assessment of calibration uncertainties for capsule type standard platinum and rhodium-iron resistance thermometers. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1998.
Buscar texto completoEhrstein, James R. Preparation and certification of SRM's for calibration of spreading resistance probes. Gaithersburg, Md: National Bureau of Standards, 1985.
Buscar texto completoEhrstein, James R. Preparation and certification of SRM's for calibration of spreading resistance probes. [Gaithersburg, MD]: U.S. Dept. of Commerce, National Bureau of Standards, 1985.
Buscar texto completoEhrstein, James R. Preparation and certification of SRM's for calibration of spreading resistance probes. [Gaithersburg, MD]: U.S. Dept. of Commerce, National Bureau of Standards, 1985.
Buscar texto completoR, Weidner Victor y United States. National Bureau of Standards., eds. Holmium oxide solution: Wavelength standard from 240 to 640 nm--SRM 2034. Gaithersburg, MD: U.S. Dept. of Commerce, National Bureau of Standards, 1986.
Buscar texto completoN, Varner Ruth, Potzick James E y National Institute of Standards and Technology (U.S.), eds. Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1992.
Buscar texto completoN, Varner Ruth, Potzick James E y National Institute of Standards and Technology (U.S.), eds. Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1992.
Buscar texto completoSayers, M. W. The international road roughness experiment: Establishing correlation and a calibration standard for measurements. Washington, D.C: World Bank, 1986.
Buscar texto completoSecondary standard dosimetry laboratories: Development and trends. Vienna: International Atomic Energy Agency, 1985.
Buscar texto completoPotzick, James E. Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1997.
Buscar texto completoPotzick, James E. Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1997.
Buscar texto completoPotzick, James E. Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1997.
Buscar texto completoNational Institute of Standards and Technology (U.S.), ed. Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1997.
Buscar texto completoNational Institute of Standards and Technology (U.S.), ed. Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1997.
Buscar texto completoPotzick, James E. Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1997.
Buscar texto completoNational Institute of Standards and Technology (U.S.), ed. Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1997.
Buscar texto completoPotzick, James E. Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1997.
Buscar texto completoWilliamson, Mark P. Calibration of NIST standard reference material for 3202 for 18-track, parallel, and 36-track, parallel serpentine, 12.65mm (0.5 in), 1491cpmm (37871 cpi), magnetic tape cartridge. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1992.
Buscar texto completoVezzetti, Carol F. Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1992.
Buscar texto completoVezzetti, Carol F. Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1992.
Buscar texto completoVezzetti, Carol F. Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1992.
Buscar texto completoVezzetti, Carol F. Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1992.
Buscar texto completoVezzetti, Carol F. Bright-chromium linewidth standard, SRM 476, for calibration of optical microscope linewidth measuring systems. Gaithersburg, Md: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1991.
Buscar texto completoVezzetti, Carol F. Bright-chromium linewidth standard, SRM 476, for calibration of optical microscope linewidth measuring systems. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1991.
Buscar texto completoVezzetti, Carol F. Bright-chromium linewidth standard, SRM 476, for calibration of optical microscope linewidth measuring systems. Gaithersburg, Md: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1991.
Buscar texto completoVezzetti, Carol F. Bright-chromium linewidth standard, SRM 476, for calibration of optical microscope linewidth measuring systems. Gaithersburg, Md: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1991.
Buscar texto completoVezzetti, Carol F. Antireflecting-Chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems. Gaithersburg, Md: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1992.
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