Artículos de revistas sobre el tema "Atomic-resolution TEM"
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Bell, David C., Christopher J. Russo y Dmitry V. Kolmykov. "40keV atomic resolution TEM". Ultramicroscopy 114 (marzo de 2012): 31–37. http://dx.doi.org/10.1016/j.ultramic.2011.12.001.
Texto completoYagi, K., H. Sato, K. Kobayashi, Y. Nishiyama y Y. Tanaka. "TEM study of Si surfaces". Proceedings, annual meeting, Electron Microscopy Society of America 50, n.º 1 (agosto de 1992): 280–81. http://dx.doi.org/10.1017/s0424820100121806.
Texto completoLee, Yangjin, Jun-Yeong Yoon, Hu Young Jeong y Kwanpyo Kim. "Atomic-Resolution TEM Imaging of Phosphorene Protected by Graphene". Microscopy and Microanalysis 25, S2 (agosto de 2019): 1696–97. http://dx.doi.org/10.1017/s1431927619009218.
Texto completoHashimoto, Hatsujiro. "Contribution of Atomic-Level TEM to Resolution of Structure". Proceedings, annual meeting, Electron Microscopy Society of America 48, n.º 1 (12 de agosto de 1990): 4–5. http://dx.doi.org/10.1017/s042482010017877x.
Texto completoCochrane, Heather D., John L. Hutchison y Donald White. "Surface studies of catalytic ceria using atomic-resolution tem". Ultramicroscopy 31, n.º 1 (septiembre de 1989): 138–42. http://dx.doi.org/10.1016/0304-3991(89)90044-2.
Texto completoKrakow, William, David P. Divincenzo, Peter A. Bancel, Eric Cockayne y Veit Elser. "High-resolution TEM of Al-Cu-Fe quasicrystals". Proceedings, annual meeting, Electron Microscopy Society of America 50, n.º 1 (agosto de 1992): 118–19. http://dx.doi.org/10.1017/s0424820100120990.
Texto completoZhang, Xiao Feng y Takeo Kamino. "Imaging Gas-Solid Interactions in an Atomic Resolution Environmental TEM". Microscopy Today 14, n.º 5 (septiembre de 2006): 16–19. http://dx.doi.org/10.1017/s1551929500058600.
Texto completoKujawa, S., B. Freitag y D. Hubert. "An Aberration Corrected (S)TEM Microscope for Nanoresearch". Microscopy Today 13, n.º 4 (julio de 2005): 16–21. http://dx.doi.org/10.1017/s1551929500053608.
Texto completoZhang, Xiao Feng. "Enabling Lab-in-Gap Transmission Electron Microscopy at Atomic Resolution". Microscopy Today 24, n.º 1 (enero de 2016): 24–29. http://dx.doi.org/10.1017/s1551929515000930.
Texto completoHasegawa, Tsuyoshi, Kunio Kobayashi, Nobuyuki Ikarashi, Kunio Takayanagi y Katsumichi Yagi. "Atomic Resolution TEM Images of the Au(001) Reconstructed Surface". Japanese Journal of Applied Physics 25, Part 2, No. 5 (20 de mayo de 1986): L366—L368. http://dx.doi.org/10.1143/jjap.25.l366.
Texto completoTakeda, Seiji y Hideto Yoshida. "Atomic-resolution environmental TEM for quantitativein-situmicroscopy in materials science". Microscopy 62, n.º 1 (16 de enero de 2013): 193–203. http://dx.doi.org/10.1093/jmicro/dfs096.
Texto completoKohno, Y., S. Morishita y N. Shibata. "New STEM/TEM Objective Lens for Atomic Resolution Lorentz Imaging". Microscopy and Microanalysis 23, S1 (julio de 2017): 456–57. http://dx.doi.org/10.1017/s1431927617002963.
Texto completoSuenaga, K., T. Sasaki y H. Sawada. "Low-Voltage TEM/STEM for Atomic Resolution Imaging and Spectroscopy". Microscopy and Microanalysis 19, S2 (agosto de 2013): 1220–21. http://dx.doi.org/10.1017/s143192761300809x.
Texto completoO'Keefe, MA, LF Allard, SJ Pennycook y DA Blom. "Transcending the One-Ångström Atomic Resolution Barrier in the TEM". Microscopy and Microanalysis 12, S02 (31 de julio de 2006): 162–63. http://dx.doi.org/10.1017/s1431927606069625.
Texto completoTai, Kuo-Lun, Guan-Min Huang, Chun-Wei Huang, Tsung-Chun Tsai, Shih-Kuang Lee, Ting-Yi Lin, Yu-Chieh Lo y Wen-Wei Wu. "Observing phase transformation in CVD-grown MoS2via atomic resolution TEM". Chemical Communications 54, n.º 71 (2018): 9941–44. http://dx.doi.org/10.1039/c8cc05129a.
Texto completoKisielowski, Christian. "What Are Present Limits of Quantitative High Resolution Tem?" Microscopy and Microanalysis 3, S2 (agosto de 1997): 935–36. http://dx.doi.org/10.1017/s1431927600011569.
Texto completoBoyes, E. D., J. Ringnalda, M. A. J. van der Stam, T. F. Fliervoet y E. Van Cappellen. "A 2-2-2 200kv Field Emission STEM/TEM System". Microscopy and Microanalysis 7, S2 (agosto de 2001): 232–33. http://dx.doi.org/10.1017/s1431927600027239.
Texto completoJosé-Yacamán, M., M. Marín-Almazo y J. A. Ascencio. "High Resolution TEM Studies On Palladium, Rhodium Nanoparticles". Microscopy and Microanalysis 7, S2 (agosto de 2001): 1100–1101. http://dx.doi.org/10.1017/s1431927600031573.
Texto completoHowe, J. M. "High-resolution tem of transformation interfaces in metals". Proceedings, annual meeting, Electron Microscopy Society of America 45 (agosto de 1987): 284–87. http://dx.doi.org/10.1017/s0424820100126287.
Texto completoMurakoshi, H., M. Ichihashi y H. Kakibayashi. "A 300-kV field-emission Transmission Electron Microscope". Proceedings, annual meeting, Electron Microscopy Society of America 50, n.º 2 (agosto de 1992): 936–37. http://dx.doi.org/10.1017/s0424820100129310.
Texto completoMehraeen, Shareghe, Joseph T. McKeown, Pushkarraj V. Deshmukh, James E. Evans, Patricia Abellan, Pinghong Xu, Bryan W. Reed, Mitra L. Taheri, Paul E. Fischione y Nigel D. Browning. "A (S)TEM Gas Cell Holder with Localized Laser Heating forIn SituExperiments". Microscopy and Microanalysis 19, n.º 2 (4 de marzo de 2013): 470–78. http://dx.doi.org/10.1017/s1431927612014419.
Texto completoBalmes, Olivier, Jan-Olle Malm, Niklas Pettersson, Gunnel Karlsson y Jan-Olov Bovin. "Imaging Atomic Structure in Metal Nanoparticles Using High-Resolution Cryo-TEM". Microscopy and Microanalysis 12, n.º 2 (9 de diciembre de 2005): 145–50. http://dx.doi.org/10.1017/s1431927606060119.
Texto completoKim, S., W. Wang, J. Phillips y X. Pan. "Atomic Resolution TEM Study on Quantum Dots in ZnSe/ZnTe Heterostructure". Microscopy and Microanalysis 17, S2 (julio de 2011): 1646–47. http://dx.doi.org/10.1017/s143192761100910x.
Texto completoHashimoto, Ai, Hideki Sako, Junichiro Sameshima, Masayuki Nakamura, Takayuki Kobayashi, Shinichi Motoyama y Yuji Otsuka. "Structural Characterization of a Ga2O3 Epitaxial Layer Grown on a Sapphire Substrate Using Cross-Sectional and Plan-View TEM/STEM Analysis". Materials Science Forum 1004 (julio de 2020): 505–11. http://dx.doi.org/10.4028/www.scientific.net/msf.1004.505.
Texto completoSchamp, C. T. "High-Resolution Metrology in the TEM". Microscopy Today 20, n.º 3 (mayo de 2012): 46–49. http://dx.doi.org/10.1017/s1551929512000363.
Texto completoKlie, Robert F., Craig Johnson y Yimei Zhu. "Atomic-Resolution STEM in the Aberration-Corrected JEOL JEM2200FS". Microscopy and Microanalysis 14, n.º 1 (3 de enero de 2008): 104–12. http://dx.doi.org/10.1017/s1431927608080136.
Texto completoKryshtab, T., H. A. Calderon y A. Kryvko. "Microstructure Characterization of Metal Mixed Oxides". MRS Advances 2, n.º 64 (2017): 4025–30. http://dx.doi.org/10.1557/adv.2017.591.
Texto completoRadmilovic, Velimir y Michael A. O'Keefe. "Fresnel effect in high-resolution TEM imaging of small particles". Proceedings, annual meeting, Electron Microscopy Society of America 53 (13 de agosto de 1995): 564–65. http://dx.doi.org/10.1017/s0424820100139196.
Texto completoCho, Philip, Aihua Wood, Krishnamurthy Mahalingam y Kurt Eyink. "Defect Detection in Atomic Resolution Transmission Electron Microscopy Images Using Machine Learning". Mathematics 9, n.º 11 (27 de mayo de 2021): 1209. http://dx.doi.org/10.3390/math9111209.
Texto completoZhang, Daliang, Yihan Zhu, Lingmei Liu, Xiangrong Ying, Chia-En Hsiung, Rachid Sougrat, Kun Li y Yu Han. "Atomic-resolution transmission electron microscopy of electron beam–sensitive crystalline materials". Science 359, n.º 6376 (18 de enero de 2018): 675–79. http://dx.doi.org/10.1126/science.aao0865.
Texto completoMartis, Joel, Ze Zhang, Hao-Kun Li, Ann Marshall, Roy Kim y Arun Majumdar. "Design and Construction of an Optical TEM Specimen Holder". Microscopy Today 29, n.º 5 (septiembre de 2021): 40–44. http://dx.doi.org/10.1017/s1551929521001103.
Texto completoZhang, Zhenyu, Junfeng Cui, Bo Wang, Haiyue Jiang, Guoxin Chen, Jinhong Yu, Chengte Lin et al. "In situ TEM observation of rebonding on fractured silicon carbide". Nanoscale 10, n.º 14 (2018): 6261–69. http://dx.doi.org/10.1039/c8nr00341f.
Texto completoTakeguchi, M., T. Honda, Y. Ishida, M. Kersker, M. Tanaka y K. Furuya. "Ultrahigh-Vacuum Field-Emission Electron Microscope as Applied to Observation and Analysis of Crystal Surface". Microscopy and Microanalysis 3, S2 (agosto de 1997): 597–98. http://dx.doi.org/10.1017/s1431927600009879.
Texto completoLee, M. R. "Transmission electron microscopy (TEM) of Earth and planetary materials: A review". Mineralogical Magazine 74, n.º 1 (febrero de 2010): 1–27. http://dx.doi.org/10.1180/minmag.2010.074.1.1.
Texto completoLinck, Martin, Peter Hartel, Stephan Uhlemann, Frank Kahl, Heiko Müller, Joachim Zach, Johannes Biskupek, Marcel Niestadt, Ute Kaiser y Max Haider. "Performance of the SALVE-microscope: Atomic-resolution TEM Imaging at 20 kV". Microscopy and Microanalysis 22, S3 (julio de 2016): 878–79. http://dx.doi.org/10.1017/s1431927616005237.
Texto completoSchabes-Retchkiman, P. S. y L. Rendon. "Observation of catalytic Cu in methanol synthesis catalysts by atomic-resolution TEM". Proceedings, annual meeting, Electron Microscopy Society of America 48, n.º 4 (agosto de 1990): 284–85. http://dx.doi.org/10.1017/s0424820100174552.
Texto completoGao, Wenpei, Jianbo Wu, Xiaofeng Zhang, Aram Yoon, J. Mabon, W. Swiech, W. L. Wilson, H. Yang y Jian-Min Zuo. "Surface Atomic Diffusion Processes Observed at Milliseconds Time Resolution using Environmental TEM". Microscopy and Microanalysis 20, S3 (agosto de 2014): 1590–91. http://dx.doi.org/10.1017/s1431927614009684.
Texto completoVan Aert, S., A. J. den Dekker y D. Van Dyck. "How to optimize the experimental design of quantitative atomic resolution TEM experiments?" Micron 35, n.º 6 (agosto de 2004): 425–29. http://dx.doi.org/10.1016/j.micron.2004.01.007.
Texto completoJinschek, Joerg R., Emrah Yucelen, Bert Freitag, Hector A. Calderon y Andy Steinbach. "Still “Plenty of Room at the Bottom” for Aberration-Corrected TEM". Microscopy Today 19, n.º 3 (28 de abril de 2011): 10–14. http://dx.doi.org/10.1017/s155192951100023x.
Texto completoLechner, Lorenz, Johannes Biskupek y Ute Kaiser. "Improved Focused Ion Beam Target Preparation of (S)TEM Specimen—A Method for Obtaining Ultrathin Lamellae". Microscopy and Microanalysis 18, n.º 2 (21 de marzo de 2012): 379–84. http://dx.doi.org/10.1017/s1431927611012499.
Texto completoGai, PL. "Atomic Resolution In-situ Environmental (Scanning) TEM (ES/TEM) for Probing Gas-Solid Reactions: Applications and Opportunities". Microscopy and Microanalysis 12, S02 (31 de julio de 2006): 48–49. http://dx.doi.org/10.1017/s1431927606069546.
Texto completoChen, James. "Advancing Single-Particle EM towards Atomic Resolution". Acta Crystallographica Section A Foundations and Advances 70, a1 (5 de agosto de 2014): C854. http://dx.doi.org/10.1107/s2053273314091451.
Texto completoIsabell, T., J. Brink, M. Kawasaki, B. Armbruster, I. Ishikawa, E. Okunishi, H. Sawada et al. "Development of a 200kV Atomic Resolution Analytical Electron Microscope". Microscopy Today 17, n.º 3 (mayo de 2009): 8–11. http://dx.doi.org/10.1017/s1551929500050045.
Texto completoYu, Rong, Wei Zhan, Mo-Rigen He, Sirong Lu y Jing Zhu. "Direct Atomic Imaging of Oxide Surfaces". Acta Crystallographica Section A Foundations and Advances 70, a1 (5 de agosto de 2014): C1614. http://dx.doi.org/10.1107/s2053273314083855.
Texto completoKrakow, William. "In situ evaporation in a high-resolution TEM". Proceedings, annual meeting, Electron Microscopy Society of America 49 (agosto de 1991): 446–47. http://dx.doi.org/10.1017/s0424820100086532.
Texto completoQian, M., M. Sarikaya y E. A. Stern. "Local Temperature Determination Using Elfs Spectroscopy". Microscopy and Microanalysis 3, S2 (agosto de 1997): 997–98. http://dx.doi.org/10.1017/s1431927600011879.
Texto completoCarlino, Elvio. "In-Line Holography in Transmission Electron Microscopy for the Atomic Resolution Imaging of Single Particle of Radiation-Sensitive Matter". Materials 13, n.º 6 (20 de marzo de 2020): 1413. http://dx.doi.org/10.3390/ma13061413.
Texto completoIshida, Y., Y. Bando, Y. Kitami, T. Tomita y M. Kersker. "Development of a 300 kV field emission TEM". Proceedings, annual meeting, Electron Microscopy Society of America 51 (1 de agosto de 1993): 1080–81. http://dx.doi.org/10.1017/s0424820100151234.
Texto completoDeRose, J. A. y J. P. Revel. "Examination of Atomic (Scanning) Force Microscopy Probe Tips with the Transmission Electron Microscope". Microscopy and Microanalysis 3, n.º 3 (mayo de 1997): 203–13. http://dx.doi.org/10.1017/s143192769797015x.
Texto completoDeng, Yu, Ruopeng Zhang, Jim Ciston, Karen C. Bustillo, Colin Ophus y Andrew Minor. "Atomic-resolution Probing of Anion Migration in Perovskites with In-situ (S)TEM". Microscopy and Microanalysis 27, S1 (30 de julio de 2021): 170–71. http://dx.doi.org/10.1017/s1431927621001215.
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