Literatura académica sobre el tema "ANALYSIS OF CMOS"
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Artículos de revistas sobre el tema "ANALYSIS OF CMOS"
LIAO, HAIFANG, WAYNE WEI-MING DAI y RUI WANG. "A NEW CMOS DRIVER MODEL FOR TRANSIENT ANALYSIS AND POWER DISSIPATION ANALYSIS". International Journal of High Speed Electronics and Systems 07, n.º 02 (junio de 1996): 269–85. http://dx.doi.org/10.1142/s0129156496000116.
Texto completoCheyette, Oren. "OAS Analysis for CMOs". Journal of Portfolio Management 20, n.º 4 (31 de julio de 1994): 53–66. http://dx.doi.org/10.3905/jpm.1994.409485.
Texto completoJomaah, Jalal, Majida Fadlallah y Gerard Ghibaudo. "Low Frequency Noise Analysis in Advanced CMOS Devices". Advanced Materials Research 324 (agosto de 2011): 441–44. http://dx.doi.org/10.4028/www.scientific.net/amr.324.441.
Texto completoSheikh, Shireen T. "Comparative Analysis of CMOS OTA". IOSR journal of VLSI and Signal Processing 1, n.º 3 (2012): 01–05. http://dx.doi.org/10.9790/4200-0130105.
Texto completoSchmitt-Landsiedel, D. "Yield Analysis of CMOS Ics". Solid State Phenomena 57-58 (julio de 1997): 327–36. http://dx.doi.org/10.4028/www.scientific.net/ssp.57-58.327.
Texto completoDimitrijev, S. y N. Stojadinović. "Analysis of CMOS transistor instabilities". Solid-State Electronics 30, n.º 10 (octubre de 1987): 991–1003. http://dx.doi.org/10.1016/0038-1101(87)90090-6.
Texto completoGajare, Milind y Shedge D.K. "CMOS Trans Conductance based Instrumentation Amplifier for Various Biomedical Signal Analysis". NeuroQuantology 20, n.º 5 (30 de abril de 2022): 53–60. http://dx.doi.org/10.14704/nq.2022.20.5.nq22148.
Texto completoYao, Hong Tao, Zi Qiang Wang, Yuan Bao Gu y Zhen Gang Jiang. "Analysis of Black Level Calibration Algorithm for CIS". Applied Mechanics and Materials 599-601 (agosto de 2014): 1397–402. http://dx.doi.org/10.4028/www.scientific.net/amm.599-601.1397.
Texto completoPrajapati, Pankaj P., Anilkumar J. Kshatriya, Sureshbhai L. Bharvad y Abhay B. Upadhyay. "Performance analysis of CMOS based analog circuit design with PVR variation". Bulletin of Electrical Engineering and Informatics 12, n.º 1 (1 de febrero de 2023): 141–48. http://dx.doi.org/10.11591/eei.v12i1.4357.
Texto completoCho, Won-ho y Ki-sang Hong. "Affine Motion Based CMOS Distortion Analysis and CMOS Digital Image Stabilization". IEEE Transactions on Consumer Electronics 53, n.º 3 (agosto de 2007): 833–41. http://dx.doi.org/10.1109/tce.2007.4341553.
Texto completoTesis sobre el tema "ANALYSIS OF CMOS"
Rabe, Dirk. "Accurate power analysis of integrated CMOS circuits on gate level". [S.l.] : [s.n.], 2001. http://deposit.ddb.de/cgi-bin/dokserv?idn=962733520.
Texto completoChan, Na-Han. "Rapid current analysis for CMOS digital circuits". Thesis, McGill University, 1994. http://digitool.Library.McGill.CA:80/R/?func=dbin-jump-full&object_id=26380.
Texto completoExtension tests on benchmark circuits containing up to 555 gates, which were analysed with CUREST using thousands of primary input patterns, demonstrate that the current analysis time is in the range of 1ms per gate per input pattern, using a SUN4/490 workstation with 32 Mb of main memory, running the SUN OS 4.103 operating system. The peak value of the total supply current, the current rise-time, and the time at which the peak occurs are usually computed to within 10% of HSPICE. However, appreciable errors often occur in the average current. This is because at the moment we do not have a good model for dealing with incomplete transitions associated with glitches in a CMOS gate.
Ruiz, Amador Dolly Natalia. "Multilevel aging phenomena analysis in complex ultimate CMOS designs". Thesis, Grenoble, 2012. http://www.theses.fr/2012GRENT002/document.
Texto completoIntegrated circuits evolution is driven by the trend of increasing operating frequencies and downscaling of the device size, while embedding more and more complex functionalities in a single chip. However, the continuation of the device-scaling race generates a number of technology challenges. For instance, the downscaling of transistor channel lengths induce short-channel effects (drain-induced barrier lowering and punch-through phenomena); high electric field in the devices tend to increase Hot electron effect (or Hot Carrier) and Oxide Dielectric Breakdown; higher temperatures in IC products generates an increase of the Negative Bias Temperature Instability (NBTI) effect on pMOS devices. Today, it is considered that the above reliability mechanisms are ones of the main causes of circuit degradation performance in the field. This dissertation will address the Hot Carrier (HC) and NBTI impacts on CMOS product electrical performances. A CAD bottom-up approach will be proposed and analyzed, based on the Design–in Reliability (DiR) methodology. With this purpose, a detailed analysis of the NBTI and the HC behaviours and their impact at different abstraction level is provided throughout this thesis. First, a physical framework presenting the NBTI and the HC mechanisms is given, focusing on electrical parameters weakening of nMOS and pMOS transistors. Moreover, the main analytical HC and NBTI degradation models are treated in details. In the second part, the delay degradation of digital standard cells due to NBTI, HCI is shown; an in-depth electrical CAD analysis illustrates the combined effects of design parameters and HCI/NBTI on the timing performance of standard cells. Additionally, a gate level approach is developed, in which HC and NBTI mechanisms are individually addressed. The consequences of the degradation at system level are presented in the third part of the thesis. With this objective, data extracted from silicon measures are compared against CAD estimations on two complexes IPs fabricated on STCMOS 45nm technologies. It is expected that the findings of this thesis highly contribute to the understanding of the NBTI and HC reliability wearout mechanisms at the system level.STAR
Ranjan, Mahim. "Analysis and design of CMOS ultra wideband receivers". Connect to a 24 p. preview or request complete full text in PDF format. Access restricted to UC campuses, 2006. http://wwwlib.umi.com/cr/ucsd/fullcit?p3220380.
Texto completoTitle from first page of PDF file (viewed September 8, 2006). Available via ProQuest Digital Dissertations. Vita. Includes bibliographical references (p. 121-123).
Rodnunsky, Nelson Lawrence. "Analysis of power dissipations in CMOS circuit designs". Thesis, National Library of Canada = Bibliothèque nationale du Canada, 1998. http://www.collectionscanada.ca/obj/s4/f2/dsk2/tape17/PQDD_0005/MQ34409.pdf.
Texto completoPhang, Khoman S. "CMOS optical preamplifier design using graphical circuit analysis". Thesis, National Library of Canada = Bibliothèque nationale du Canada, 2001. http://www.collectionscanada.ca/obj/s4/f2/dsk3/ftp04/NQ58961.pdf.
Texto completoYee, Gaylin Mildred. "An integrated micromachined CMOS spectrometer for biochemical analysis /". May be available electronically:, 2007. http://proquest.umi.com/login?COPT=REJTPTU1MTUmSU5UPTAmVkVSPTI=&clientId=12498.
Texto completoSullivan, Patrick J. "Analysis and experimental results of RF CMOS mixers /". Diss., Connect to a 24 p. preview or request complete full text in PDF format. Access restricted to UC campuses, 1998. http://wwwlib.umi.com/cr/ucsd/fullcit?p9835390.
Texto completoMuir, Keith Ross. "Mixed-mode microsystems for biological cell actuation and analysis". Thesis, University of Edinburgh, 2017. http://hdl.handle.net/1842/28879.
Texto completoBasedau, Philipp Michael. "Analysis and design of CMOS LC and crystal oscillators /". Zürich, 1999. http://e-collection.ethbib.ethz.ch/show?type=diss&nr=13216.
Texto completoLibros sobre el tema "ANALYSIS OF CMOS"
Yusuf, Leblebici, ed. CMOS digital integrated circuits: Analysis and design. 2a ed. Boston, MA: McGraw-Hill, 1998.
Buscar texto completoYusuf, Leblebici, ed. CMOS digital integrated circuits: Analysis and design. 3a ed. Boston: McGraw-Hill, 2003.
Buscar texto completoKang, Sung-Mo. CMOS digital integrated circuits: Analysis and design. New York: McGraw-Hill, 1996.
Buscar texto completoKang, Sung-Mo. CMOS digital integrated circuits: Analysis and design. 2a ed. Boston, Mass: McGraw-Hill, 1999.
Buscar texto completoLi, Xiaopeng. Multi-standard CMOS wireless receivers: Analysis and design. Boston: Kluwer Academic Publishers, 2002.
Buscar texto completoLi, Xiaopeng. Multi-standard CMOS wireless receivers: Analysis and design. Boston: Kluwer Academic Publishers, 2002.
Buscar texto completoBasedau, Philipp Michael. Analysis and design of CMOS, LC, and crystal oscillators / Philipp Michael Basedau. Konstanz: Hartung-Gorre Verlag, 1999.
Buscar texto completoCMOS voltage reference: An analytical and practical perspective. Hoboken: IEEE ; Wiley, 2013.
Buscar texto completoMadrid, Philip E. Device design and process window analysis of a deep submicron CMOS VLSI technology. Reading, Mass: Addison-Wesley, 1992.
Buscar texto completoNance, James Milton. Cmas tutorial workbook. Galveston, TX: National Oceanic and Atmospheric Administration, National Marine Fisheries Service, Southeast Fisheries Center, Galveston Laboratory, 1990.
Buscar texto completoCapítulos de libros sobre el tema "ANALYSIS OF CMOS"
Veendrick, Harry J. M. "Testing, Yield, Packaging, Debug and Failure Analysis". En Nanometer CMOS ICs, 495–571. Cham: Springer International Publishing, 2017. http://dx.doi.org/10.1007/978-3-319-47597-4_10.
Texto completoVeendrick, H. J. M. "Testing, yield, packaging, debug and failure analysis". En Nanometer CMOS ICs, 589–686. Dordrecht: Springer Netherlands, 2008. http://dx.doi.org/10.1007/978-1-4020-8333-4_10.
Texto completoGharavi, Sam y Babak Heydari. "mm-Wave CMOS Noise Analysis". En Ultra High-Speed CMOS Circuits, 35–45. New York, NY: Springer New York, 2011. http://dx.doi.org/10.1007/978-1-4614-0305-0_4.
Texto completoBhushan, Manjul y Mark B. Ketchen. "Data Analysis". En Microelectronic Test Structures for CMOS Technology, 317–58. New York, NY: Springer New York, 2011. http://dx.doi.org/10.1007/978-1-4419-9377-9_10.
Texto completoHehn, Thorsten y Yiannos Manoli. "Analysis of Different Interface Circuits". En CMOS Circuits for Piezoelectric Energy Harvesters, 41–56. Dordrecht: Springer Netherlands, 2014. http://dx.doi.org/10.1007/978-94-017-9288-2_3.
Texto completoHehn, Thorsten y Yiannos Manoli. "Performance Analysis of the PSCE Chip". En CMOS Circuits for Piezoelectric Energy Harvesters, 129–85. Dordrecht: Springer Netherlands, 2014. http://dx.doi.org/10.1007/978-94-017-9288-2_6.
Texto completoVillar Piqué, Gerard y Eduard Alarcón. "3-Level Buck Converter Analysis and Specific Components Models". En CMOS Integrated Switching Power Converters, 133–70. New York, NY: Springer New York, 2011. http://dx.doi.org/10.1007/978-1-4419-8843-0_5.
Texto completoRishab Mehra, Sarita Kumari y Aminul Islam. "Cross-Coupled Dynamic CMOS Latches: Scalability Analysis". En Advances in Intelligent Systems and Computing, 307–15. Singapore: Springer Singapore, 2016. http://dx.doi.org/10.1007/978-981-10-2035-3_31.
Texto completoAlioto, Massimo, Elio Consoli y Gaetano Palumbo. "Analysis and Comparison in the Energy-Delay-Area Domain". En Flip-Flop Design in Nanometer CMOS, 119–73. Cham: Springer International Publishing, 2014. http://dx.doi.org/10.1007/978-3-319-01997-0_5.
Texto completoBoukhayma, Assim. "Detailed Noise Analysis in Low-Noise CMOS Image Sensors". En Ultra Low Noise CMOS Image Sensors, 61–83. Cham: Springer International Publishing, 2017. http://dx.doi.org/10.1007/978-3-319-68774-2_4.
Texto completoActas de conferencias sobre el tema "ANALYSIS OF CMOS"
Abbas, Haider Muhi, Mark Zwolinski y Basel Halak. "An application-specific NBTI ageing analysis method". En 2015 International Workshop on CMOS Variability (VARI). IEEE, 2015. http://dx.doi.org/10.1109/vari.2015.7456553.
Texto completoAbuayob, Eli, Evgeny Nisenboim, Amir Raveh, Baohua Niu y Tom Tong. "Complex Waveform Analysis for Advanced CMOS ICs". En ISTFA 2016. ASM International, 2016. http://dx.doi.org/10.31399/asm.cp.istfa2016p0068.
Texto completoKentaro Doi, Koichi Nakamura y Akitomo Tachibana. "Local-property analysis for modeling of gate insulator materials". En 2006 International Workshop on Nano CMOS (IWNC). IEEE, 2006. http://dx.doi.org/10.1109/iwnc.2006.4570993.
Texto completoNobuo Tanaka, Jun Yamasaki, Shin Inamoto y Koh Saitoh. "High-resolution TEM/STEM analysis of SiO2/Si(100) and La2O3/Si(100) interfaces". En 2006 International Workshop on Nano CMOS (IWNC). IEEE, 2006. http://dx.doi.org/10.1109/iwnc.2006.4570981.
Texto completoAlioto, Massimo, Elio Consoli y Gaetano Palumbo. "Analysis and comparison of variations in double edge triggered flip-flops". En 2014 5th European Workshop on CMOS Variability (VARI). IEEE, 2014. http://dx.doi.org/10.1109/vari.2014.6957076.
Texto completoGarcia-Redondo, Fernando, Marisa Lopez-Vallejo, Pablo Royer y Javier Agustin. "A tool for the automatic analysis of single events effects on electronic circuits". En 2014 5th European Workshop on CMOS Variability (VARI). IEEE, 2014. http://dx.doi.org/10.1109/vari.2014.6957082.
Texto completoRoger, Frederic, Anderson Singulani, Sara Carniello, Lado Filipovic y Siegfried Selberherr. "Global statistical methodology for the analysis of equipment parameter effects on TSV formation". En 2015 6th International Workshop on CMOS Variability (VARI). IEEE, 2015. http://dx.doi.org/10.1109/vari.2015.7456561.
Texto completoHatakeyama, Tomoyuki, Kazuyoshi Fushinobu y Ken Okazaki. "Effect of the Device Structure in Electro-Thermal Analysis of Si CMOS". En ASME 2005 Pacific Rim Technical Conference and Exhibition on Integration and Packaging of MEMS, NEMS, and Electronic Systems collocated with the ASME 2005 Heat Transfer Summer Conference. ASMEDC, 2005. http://dx.doi.org/10.1115/ipack2005-73151.
Texto completoLee, Ji Soo. "Improved analysis of CMOS photodiode". En Opto-Canada: SPIE Regional Meeting on Optoelectronics, Photonics, and Imaging, editado por John C. Armitage. SPIE, 2017. http://dx.doi.org/10.1117/12.2283941.
Texto completoKupreyev, Dmitriy. "Noise analysis of CMOS-memristive and CMOS-resistive current mirrors". En 2018 International Conference on Computing and Network Communications (CoCoNet). IEEE, 2018. http://dx.doi.org/10.1109/coconet.2018.8476814.
Texto completoInformes sobre el tema "ANALYSIS OF CMOS"
Nguyen, Du Van. An ASIC Power Analysis System for Digital CMOS Design. Portland State University Library, enero de 2000. http://dx.doi.org/10.15760/etd.7249.
Texto completoBalaban, Harold S., Paul M. Kodzwa, Andrew S. Rehwinkel, Gregory A. Davis y Patricia F. Bronson. Root Cause Analysis for the ATIRCM/CMWS Program. Fort Belvoir, VA: Defense Technical Information Center, junio de 2010. http://dx.doi.org/10.21236/ada555310.
Texto completoBenmerrouche, Mo. 11-BM CMS Beamline Radiation Shielding Analysis. Office of Scientific and Technical Information (OSTI), agosto de 2016. http://dx.doi.org/10.2172/1493166.
Texto completoEchevarria-Doyle, Waleska, S. McKay y Susan Bailey. Sensitivity of sediment transport analyses in dam removal applications. Engineer Research and Development Center (U.S.), septiembre de 2023. http://dx.doi.org/10.21079/11681/47595.
Texto completoAbercrombie, Daniel Robert, Hamed Bakhshiansohi, Sharad Agarwal, Jennifer Adelman-McCarthy, Andres Vargas Hernandez, Weinan Si, Lukas Layer y Jean-Roch Vlimant. Automatic log analysis with NLP for the CMS workflow handling. Office of Scientific and Technical Information (OSTI), noviembre de 2019. http://dx.doi.org/10.2172/1637601.
Texto completoGu, Xinyu, Chongbo Zhao y Jianying Xi. The clinical manifestations and treatment strategies of congenital myasthenic syndrome associated with endplate development and maintenance deficiency: a systematic review and meta-analysis of case reports and case series. INPLASY - International Platform of Registered Systematic Review and Meta-analysis Protocols, marzo de 2023. http://dx.doi.org/10.37766/inplasy2023.3.0085.
Texto completoPeters, Valerie A., Alistair Ogilvie y Paul S. Veers. Wind energy Computerized Maintenance Management System (CMMS) : data collection recommendations for reliability analysis. Office of Scientific and Technical Information (OSTI), septiembre de 2009. http://dx.doi.org/10.2172/985499.
Texto completoPeters, Valerie A. y Alistair B. Ogilvie. Wind energy Computerized Maintenance Management System (CMMS) : data collection recommendations for reliability analysis. Office of Scientific and Technical Information (OSTI), enero de 2012. http://dx.doi.org/10.2172/1035328.
Texto completoArhin, Stephen, Babin Manandhar y Adam Gatiba. Influence of Pavement Conditions on Commercial Motor Vehicle Crashes. Mineta Transportation Institute, diciembre de 2023. http://dx.doi.org/10.31979/mti.2023.2343.
Texto completoSvynarenko, Radion, Theresa L. Profant y Lisa C. Lindley. Effectiveness of concurrent care to improve pediatric and family outcomes at the end of life: An analytic codebook. Pediatric End-of-Life (PedEOL) Care Research Group, College of Nursing, University of Tennessee, Knoxville, 2022. http://dx.doi.org/10.7290/m5fbbq.
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