Literatura académica sobre el tema "Analyse des circuits"
Crea una cita precisa en los estilos APA, MLA, Chicago, Harvard y otros
Consulte las listas temáticas de artículos, libros, tesis, actas de conferencias y otras fuentes académicas sobre el tema "Analyse des circuits".
Junto a cada fuente en la lista de referencias hay un botón "Agregar a la bibliografía". Pulsa este botón, y generaremos automáticamente la referencia bibliográfica para la obra elegida en el estilo de cita que necesites: APA, MLA, Harvard, Vancouver, Chicago, etc.
También puede descargar el texto completo de la publicación académica en formato pdf y leer en línea su resumen siempre que esté disponible en los metadatos.
Artículos de revistas sobre el tema "Analyse des circuits"
Flatscher, Matthias, Markus Neumayer, Thomas Bretterklieber y Hannes Wegleiter. "Transmission Lines in Capacitance Measurement Systems: An Investigation of Receiver Structures". Sensors 23, n.º 3 (19 de enero de 2023): 1148. http://dx.doi.org/10.3390/s23031148.
Texto completoFouad Hanna, Victor, Joseph Achkar, Odile Picon, Jacques Citerne, M’hamed Drissi y Chakir Amrani. "Analyse de Circuits Passifs en Technologie Microruban Suspendu". Annales Des Télécommunications 47, n.º 11-12 (noviembre de 1992): 515–29. http://dx.doi.org/10.1007/bf02998314.
Texto completoARYA, SUNIL, MORDECAI J. GOLIN y KURT MEHLHORN. "On the Expected Depth of Random Circuits". Combinatorics, Probability and Computing 8, n.º 3 (mayo de 1999): 209–28. http://dx.doi.org/10.1017/s096354839900382x.
Texto completoMihaylenko, V., J. Chunyak y V. Bachinskiy. "Analysis of processes in converter with eleven zone regulation output voltage". POWER ENGINEERING: economics, technique, ecology, n.º 3 (6 de abril de 2020): 35–40. http://dx.doi.org/10.20535/1813-5420.3.2020.228610.
Texto completoLi, Quan. "To Prosecute or Not to Prosecute, That is the Question: Agency Litigation under the Influence of Appellate Courts". Canadian Journal of Political Science 45, n.º 1 (marzo de 2012): 185–205. http://dx.doi.org/10.1017/s0008423911000953.
Texto completoMarani, R. y A. G. Perri. "Review—Thermal Effects in the Design of CNTFET-Based Digital Circuits". ECS Journal of Solid State Science and Technology 11, n.º 4 (1 de abril de 2022): 041006. http://dx.doi.org/10.1149/2162-8777/ac63e6.
Texto completoQuinones, Gloria y Iris Duhn. "Circuits of sympathy: Posthuman child, vibrant forces, things and places". Contemporary Issues in Early Childhood 23, n.º 3 (septiembre de 2022): 237–52. http://dx.doi.org/10.1177/14639491221117223.
Texto completoKhatibi, Mahmood y Hasan Modir Shanechi. "Using a modified Modal Series to analyse weakly nonlinear circuits". International Journal of Electronics 102, n.º 9 (25 de noviembre de 2014): 1457–74. http://dx.doi.org/10.1080/00207217.2014.982212.
Texto completoBremer, J. K., C. Zemko, J. Schmackers y W. Mathis. "Analyse und Entwurf von hochbitratigen Clock-and-Data-Recovery Schaltungen in CMOS-Technologie". Advances in Radio Science 5 (13 de junio de 2007): 215–19. http://dx.doi.org/10.5194/ars-5-215-2007.
Texto completoМihaylenko, V., J. Chunyak, K. Trubitsin y V. Bachynskiy. "MATHEMATICAL MODEL OF A TWELVE-PULSE CONVERTER WITH SIXTEEN ZONE CONTROL OF THE OUTPUT VOLTAGE AND ACTIVE-INDUCTIVE LOADS". Collection of scholarly papers of Dniprovsk State Technical University (Technical Sciences) 2, n.º 37 (23 de abril de 2021): 68–72. http://dx.doi.org/10.31319/2519-2884.37.2020.13.
Texto completoTesis sobre el tema "Analyse des circuits"
Melcher, Elmar. "Analyse temporelle de circuits combinatoires /". Paris : Ecole nationale supérieure des télécommunications, 1993. http://catalogue.bnf.fr/ark:/12148/cb355884954.
Texto completoOndo, Ossa Albert. "Analyse des circuits financiers au Gabon". Nancy 2, 1985. http://www.theses.fr/1985NAN20005.
Texto completoBENBOUDJEMA, KAMEL. "Analyse symbolique des circuits micro-ondes". Paris 6, 1995. http://www.theses.fr/1995PA066524.
Texto completoOrdas, Thomas. "Analyse des émissions électromagnétiques des circuits intégrés". Thesis, Montpellier 2, 2010. http://www.theses.fr/2010MON20001.
Texto completoIn the area of secure integrated circuits, such as smart cards, circuit designers are always looking to innovate to find new countermeasures against attacks by the various side channels that exist today. Indeed, side channels attacks such as the analysis of electromagnetic emissions permit to extract secret information contained in circuits. Based on this observation, in this thesis, we focused on the study of electromagnetic analysis to observe the analysis possibilities. This manuscript is organized as follows. Initially, we presented a measurement system for electromagnetic emissions in time domain, and the results obtained on different circuits. From these results, a summary of opportunities, relating to the security threat, posed by electromagnetic analysis, is proposed as well as solutions proposals to reduce electromagnetic radiations of integrated circuits. In a second step, we are interested in the simulation of electromagnetic emissions. A state of the art of simulation tools which exist today, has allowed us to demonstrate that none of them allowed to have a fine enough resolution in terms of electromagnetic emissions. To fill this gap, a simulation tool has been developed and to validate this flow, a comparison between measurement results and simulation results was performed
Romefort, Dominique Villedieu. "Analyse statistique des circuits intégrès : caractérisation des modèles". Toulouse 3, 1990. http://www.theses.fr/1990TOU30087.
Texto completoDehbaoui, Amine. "Analyse Sécuritaire des Émanations Électromagnétiques des Circuits Intégrés". Thesis, Montpellier 2, 2011. http://www.theses.fr/2011MON20020.
Texto completoThe integration of cryptographic primitives in different electronic devices is widely used today incommunications, financial services, government services or PayTV.Foremost among these devices include the smart card. According to a report published in August 2010, IMS Research forecasts that the smart card market will reach 5.8 billion units sold in this year. The vast majority is used in telecommunications (SIM) and banking.The smart card incorporates an integrated circuit which can be a dedicated processor for cryptographic calculations. Therefore, these integrated circuits contain secrets such as secret or private keys used by the symmetric or asymmetric cryptographic algorithms. These keys must remain absolutely confidential to ensure the safety chain.Therefore the robustness of smart cards against attacks is crucial. These attacks can be classifiedinto three main categories: invasive, semi-invasive and non-invasive.Non-invasive attacks can be considered the most dangerous, since this kind of attack can be achieved without any contact with the circuit.Indeed, while using electronic circuits that compose them are subjected to variations in current and voltage. These variations generate an electromagnetic radiation propagating in the vicinity of the circuit.These radiations are correlated with secret information (eg a secret key used for authentication). Several attacks based on these leakages were published by the scientific community.This thesis aims to: (a) understand the different sources of electromagnetic emanations of integrated circuits, and propose a localized near field attack to test the robustness of a cryptographic circuit and (b) propose counter-measures to these attacks
Laurent, Jacques. "Projet ACIME analyse des circuits intégrés par microscopie électronique /". S.l. : Université Grenoble 1, 2008. http://tel.archives-ouvertes.fr/tel-00311762.
Texto completoKALFANE, ANISHA. "Analyse de la sensibilite technologique des circuits integres gaas". Université Louis Pasteur (Strasbourg) (1971-2008), 1993. http://www.theses.fr/1993STR13215.
Texto completoRebaï, Mohamed Mehdi. "Analyse des circuits intégrés par laser en mode sonde". Thesis, Bordeaux, 2014. http://www.theses.fr/2014BORD0362/document.
Texto completoThe main objective of the presented research work in this PhD thesis is to help to understand the different mechanisms and phenomena involved in the interaction of a laser with a semiconductor in the analysis of a submicron integrated circuit. The aim is to master and improve the Electro Optical Probing techniques. Miniaturization and densification of electronic components lead the failure analysis techniques using Laser to their limits. Knowing the impact of different physical, optical and electrical parameters on a probing analysis is a key to improve the understanding the measured EOP signals. These studies also show the significant effect of temperature on the EOP techniques
Yahya, Eslam. "Modélisation, analyse et optimisation des performances des circuits asynchrones multi-protocoles". Grenoble INPG, 2009. http://www.theses.fr/2009INPG0145.
Texto completoAsynchronous circuits show potential interest from many aspects. However modeling, analysis and optimization of asynchronous circuits are stumbling blocks to spread this technology on commercial level. This thesis concerns the development of asynchronous circuit modeling method which is based on analytical models for the underlying handshaking protocols. Based on this modeling method, a fast and accurate circuit analysis method is developed. This analysis provides a full support for statistically variable delays and is able to analyze different circuit structures (Linear/Nonlinear, Unconditional/Conditional). In addition, it enables the implementation of timing analysis, power analysis and process-effect analysis for asynchronous circuits. On top of these modeling and analysis methods, an optimization technique has been developed. This optimization technique is based on selecting the minimum number of asynchronous registers required for satisfying the performance constraints. By using the proposed methods, the asynchronous handshaking protocol effect on speed, power consumption distribution and effect of process variability is studied. For validating the proposed methods, a group of tools is implemented using C++, Java and Matlab. These tools show high efficiency, high accuracy and fast time response
Libros sobre el tema "Analyse des circuits"
Analyse de circuits: Introduction. 2a ed. Montréal: Éditions du Renouveau pédagogique, 1985.
Buscar texto completoMange, Daniel. Analyse et synthèse des systèmes logiques. 4a ed. Lausanne: Presses Polytechniques Romandes, 1987.
Buscar texto completoBoylestad's circuit analysis. 3a ed. Toronto: Pearson Prentice Hall, 2004.
Buscar texto completoParanjothi, S. R. Electric Circuit Analysis. 3a ed. London: New Academic Science, 2010.
Buscar texto completoA, Bell David. Fundamentals of electric circuits. 7a ed. Don Mills, Ont: Oxford University Press, 2009.
Buscar texto completoIrwin, J. David. Basic engineering circuit analysis. 5a ed. Upper Saddle River, N.J: Prentice Hall, 1996.
Buscar texto completoIrwin, J. David. Basic engineering circuit analysis. 3a ed. New York: Macmillan, 1989.
Buscar texto completoM, Nelms R., ed. Basic engineering circuit analysis. 8a ed. Hoboken, NJ: J. Wiley & Sons, 2005.
Buscar texto completoBasic engineering circuit analysis. 2a ed. New York: Macmillan Pub. Co., 1987.
Buscar texto completoIrwin, J. David. Basic engineering circuit analysis. 4a ed. New York: Macmillan, 1993.
Buscar texto completoCapítulos de libros sobre el tema "Analyse des circuits"
Zheng, Yang, Wushuang Liu, Xuan Zhou, Wanying Liu y Qijuan Chen. "Complex Frequency-Domain Oscillation Analysis of the Pumped-Storage Systems". En Lecture Notes in Civil Engineering, 439–44. Singapore: Springer Nature Singapore, 2023. http://dx.doi.org/10.1007/978-981-99-2532-2_37.
Texto completoLakin, Matthew R., Carlo Spaccasassi y Andrew Phillips. "Computational Design of Nucleic Acid Circuits: Past, Present, and Future". En Natural Computing Series, 311–46. Singapore: Springer Nature Singapore, 2023. http://dx.doi.org/10.1007/978-981-19-9891-1_18.
Texto completoKaufmann, Daniela y Armin Biere. "AMulet 2.0 for Verifying Multiplier Circuits". En Tools and Algorithms for the Construction and Analysis of Systems, 357–64. Cham: Springer International Publishing, 2021. http://dx.doi.org/10.1007/978-3-030-72013-1_19.
Texto completoTakhar, Gourav, Ramesh Karri, Christian Pilato y Subhajit Roy. "HOLL: Program Synthesis for Higher Order Logic Locking". En Tools and Algorithms for the Construction and Analysis of Systems, 3–24. Cham: Springer International Publishing, 2022. http://dx.doi.org/10.1007/978-3-030-99524-9_1.
Texto completoCraig, Edwin C. "Integrated Circuits". En Electronics via Waveform Analysis, 237–78. New York, NY: Springer New York, 1993. http://dx.doi.org/10.1007/978-1-4612-4338-0_12.
Texto completoBáez-Lópe, David y Félix E. Guerrero-Castro. "Digital Circuits". En Circuit Analysis with Multisim, 159–80. Cham: Springer International Publishing, 2011. http://dx.doi.org/10.1007/978-3-031-79840-5_6.
Texto completoBrzozowski, Janusz A. y Carl-Johan H. Seger. "Symbolic Analysis". En Asynchronous Circuits, 275–311. New York, NY: Springer New York, 1995. http://dx.doi.org/10.1007/978-1-4612-4210-9_14.
Texto completoMorris, Noel M. "Polyphase Circuits". En Electrical Circuit Analysis and Design, 144–70. London: Macmillan Education UK, 1993. http://dx.doi.org/10.1007/978-1-349-22560-6_7.
Texto completoGlisson, Tildon H. "Equivalent Circuits". En Introduction to Circuit Analysis and Design, 83–112. Dordrecht: Springer Netherlands, 2010. http://dx.doi.org/10.1007/978-90-481-9443-8_4.
Texto completoMay, Colin. "DC Circuits". En Passive Circuit Analysis with LTspice®, 41–100. Cham: Springer International Publishing, 2020. http://dx.doi.org/10.1007/978-3-030-38304-6_2.
Texto completoActas de conferencias sobre el tema "Analyse des circuits"
Sharma, Vijender Kumar, Jai Narayan Tripathi y Hitesh Shrimali. "An Inspection Based Method to Analyse Deterministic Noise in N-port Circuits". En 2020 IEEE 29th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS). IEEE, 2020. http://dx.doi.org/10.1109/epeps48591.2020.9231394.
Texto completoKorotyeyev, Igor y Marius Klytta. "Analyse of steady-state process in circuits with incommensurable frequencies of voltage sources". En 2016 2nd International Conference on Intelligent Energy and Power Systems (IEPS). IEEE, 2016. http://dx.doi.org/10.1109/ieps.2016.7521846.
Texto completoReig, Càndid y María-Dolores Cubells-Beltrán. "Circuit simulators for circuit analysis in graduate engineering courses". En Fourth International Conference on Higher Education Advances. Valencia: Universitat Politècnica València, 2018. http://dx.doi.org/10.4995/head18.2018.8030.
Texto completoCui, Qiang, Yan Han, Juin J. Liou y Shurong Dong. "Analyse of Protection Devices' Speed Performance against ESD under CDM Using TCAD". En 2007 IEEE Conference on Electron Devices and Solid-State Circuits. IEEE, 2007. http://dx.doi.org/10.1109/edssc.2007.4450166.
Texto completoRammohan, Rathi Adarshi, Jeevan Medikonda y Dan Issac Pothiyil. "Speech Signal-Based Modelling of Basic Emotions to Analyse Compound Emotion: Anxiety". En 2020 IEEE International Conference on Distributed Computing, VLSI, Electrical Circuits and Robotics (DISCOVER). IEEE, 2020. http://dx.doi.org/10.1109/discover50404.2020.9278094.
Texto completoKeyes, Edward y Jason Abt. "An Advanced Integrated Circuit Analysis System". En ISTFA 2006. ASM International, 2006. http://dx.doi.org/10.31399/asm.cp.istfa2006p0398.
Texto completoHuang, Jiang, Junsheng Yu, Nana Wang y Yadong Jiang. "Energy losing analyse of organic solar cells based on pentacene and C60". En 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA). IEEE, 2009. http://dx.doi.org/10.1109/ipfa.2009.5232573.
Texto completoWen, Gaojie, Xiaocui Li, Li Tian y Jun Ren. "Dynamic current monitoring and probe laser simulation strategy to analyse complicated functional failure on mixed signal integrated circuit". En 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA). IEEE, 2017. http://dx.doi.org/10.1109/ipfa.2017.8060073.
Texto completoNguyen, Dat, Bob Davis y Corey Lewis. "Copper Bond Over Active Circuit (BOAC) and Copper Over Anything (COA) Failure Analysis". En ISTFA 2003. ASM International, 2003. http://dx.doi.org/10.31399/asm.cp.istfa2003p0076.
Texto completoSedykh, Sergey, Dmitriy Gadashev y Alexandr Drakin. "METHODS OF REDUCING PULSATIONS OF LIGHT FLOW IN LED LIGHT SOURCES". En CAD/EDA/SIMULATION IN MODERN ELECTRONICS 2019. Bryansk State Technical University, 2019. http://dx.doi.org/10.30987/conferencearticle_5e028213f33ad1.39341792.
Texto completoInformes sobre el tema "Analyse des circuits"
Shonhe, Toendepi. Covid-19 and the Political Economy of Tobacco and Maize Commodity Circuits: Makoronyera, the ‘Connected’ and Agrarian Accumulation in Zimbabwe. Institute of Development Studies (IDS), marzo de 2021. http://dx.doi.org/10.19088/apra.2021.009.
Texto completoBlakely, Scott. Probabilistic Analysis for Reliable Logic Circuits. Portland State University Library, enero de 2000. http://dx.doi.org/10.15760/etd.1859.
Texto completoBurns, Steven M. y Alain J. Martin. Performance Analysis and Optimization of Asynchronous Circuits. Fort Belvoir, VA: Defense Technical Information Center, enero de 1990. http://dx.doi.org/10.21236/ada447734.
Texto completoROME AIR DEVELOPMENT CENTER GRIFFISS AFB NY. Automated Sneak Circuit Analysis Technique. Fort Belvoir, VA: Defense Technical Information Center, junio de 1990. http://dx.doi.org/10.21236/ada279354.
Texto completoLippmann, B. A. Equivalent circuit analysis of sled. Office of Scientific and Technical Information (OSTI), mayo de 1986. http://dx.doi.org/10.2172/5596307.
Texto completoWheat, Jr., Robert M. Chaos in Electronic Circuits: Nonlinear Time Series Analysis. Office of Scientific and Technical Information (OSTI), julio de 2003. http://dx.doi.org/10.2172/821547.
Texto completoBacon, L. D. y R. P. Toth. LineCAP (Line/Circuit Analysis Program): Cross-coupling on PC (printed circuit) board traces including discontinuities and circuit elements. Office of Scientific and Technical Information (OSTI), junio de 1989. http://dx.doi.org/10.2172/6038898.
Texto completoBrandt, Howard E. Quantum Computer Circuit Analysis and Design. Fort Belvoir, VA: Defense Technical Information Center, febrero de 2009. http://dx.doi.org/10.21236/ada494934.
Texto completoRELIABILITY ANALYSIS CENTER GRIFFISS AFB NY. Worst Case Circuit Analysis Application Guidelines. Fort Belvoir, VA: Defense Technical Information Center, enero de 1993. http://dx.doi.org/10.21236/ada278216.
Texto completoOler, Kiri J. y Carl H. Miller. Reverse Engineering Integrated Circuits Using Finite State Machine Analysis. Office of Scientific and Technical Information (OSTI), abril de 2016. http://dx.doi.org/10.2172/1417449.
Texto completo