Literatura académica sobre el tema "AFM PROCESS"
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Artículos de revistas sobre el tema "AFM PROCESS"
Walia, R. S., H. S. Shan y P. Kumar. "Enhancing AFM process productivity through improved fixturing". International Journal of Advanced Manufacturing Technology 44, n.º 7-8 (4 de febrero de 2009): 700–709. http://dx.doi.org/10.1007/s00170-008-1893-7.
Texto completoFite, Kelby, E. Thomas Smiley, John McIntyre y Christina Wells. "Evaluation of a Soil Decompaction and Amendment Process for Urban Trees". Arboriculture & Urban Forestry 37, n.º 6 (1 de noviembre de 2011): 293–300. http://dx.doi.org/10.48044/jauf.2011.038.
Texto completoBao, Tim. "Traceable Dimension Metrology by AFM for Nanoscale Process Control". Key Engineering Materials 381-382 (junio de 2008): 549–52. http://dx.doi.org/10.4028/www.scientific.net/kem.381-382.549.
Texto completoMangesh, Gharat Saurabh y Aviral Misra. "Finite element analysis of viscoelastic media used in abrasive flow machining process". IOP Conference Series: Materials Science and Engineering 1248, n.º 1 (1 de julio de 2022): 012005. http://dx.doi.org/10.1088/1757-899x/1248/1/012005.
Texto completoMekid, Samir. "In-Process Atomic-Force Microscopy (AFM) Based Inspection". Sensors 17, n.º 6 (31 de mayo de 2017): 1194. http://dx.doi.org/10.3390/s17061194.
Texto completoBabicz, S., A. Zieliński, J. Smulko y K. Darowicki. "Corrosion process monitoring by AFM higher harmonic imaging". Measurement Science and Technology 28, n.º 11 (18 de octubre de 2017): 114001. http://dx.doi.org/10.1088/1361-6501/aa844a.
Texto completoCambel, V., J. Martaus, J. Šoltýs, R. Kúdela y D. Gregušová. "AFM nanooxidation process – Technology perspective for mesoscopic structures". Surface Science 601, n.º 13 (julio de 2007): 2717–23. http://dx.doi.org/10.1016/j.susc.2006.12.058.
Texto completoHu, Xiaodong y Xiaotang Hu. "Analysis of the process of anodization with AFM". Ultramicroscopy 105, n.º 1-4 (noviembre de 2005): 57–61. http://dx.doi.org/10.1016/j.ultramic.2005.06.018.
Texto completoSato, Takashi, Stephen Wan y Yu Jing Ang. "Study of Process Characteristics of Abrasive Flow Machining (AFM) for Ti-6Al-4V and Validation with Process Model". Advanced Materials Research 797 (septiembre de 2013): 411–16. http://dx.doi.org/10.4028/www.scientific.net/amr.797.411.
Texto completoGupta, Ravi, Rahul O. Vaishya, Dr R. S. Walia Dr. R.S Walia y Dr P. K. Kalra Dr. P.K Kalra. "Experimental Study of Process Parameters On Material Removal Mechanism in Hybrid Abrasive Flow Machining Process (AFM)". International Journal of Scientific Research 2, n.º 6 (1 de junio de 2012): 234–37. http://dx.doi.org/10.15373/22778179/june2013/75.
Texto completoTesis sobre el tema "AFM PROCESS"
Al-Musawi, Raheem. "Theoretical and experimental investigations about the AFM tip-based nanomachining process". Thesis, Cardiff University, 2016. http://orca.cf.ac.uk/99795/.
Texto completoCOSENTINO, MICHELA. "AFM-STED correlative nanoscopy provides a new view on the formation process of misfolded protein aggregates". Doctoral thesis, Università degli studi di Genova, 2019. http://hdl.handle.net/11567/939919.
Texto completoDHULL, SACHIN. "INVESTIGATION OF HYBRID ELECTROCHEMICAL AND MAGNETIC FIELD ASSISTED ABRASIVE FLOW FINISHING PROCESS". Thesis, DELHI TECHNOLOGICAL UNIVERSITY, 2021. http://dspace.dtu.ac.in:8080/jspui/handle/repository/18780.
Texto completoPIANIGIANI, MICHELE. "Nano Imprinting Lithography Ultrafast process and its chemical and physical effects on advanced plastic materials". Doctoral thesis, Università degli Studi di Trieste, 2017. http://hdl.handle.net/11368/2908135.
Texto completoHoward, Mitchell James. "Development of a machine-tooling-process integrated approach for abrasive flow machining (AFM) of difficult-to-machine materials with application to oil and gas exploration componenets". Thesis, Brunel University, 2014. http://bura.brunel.ac.uk/handle/2438/9262.
Texto completoSörensen, Malin Helena. "Mesostructured particulate silica materials with tunable pore size : Synthesis, characterization and applications". Doctoral thesis, KTH, Ytkemi (stängd 20081231), 2009. http://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-10089.
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Martin, Lucile. "Etude de l'oxyde de cuivre CuO, matériau de conversion en film mince pour microbatteries au lithium : caractérisation des processus électrochimiques et chimiques en cyclage". Thesis, Pau, 2013. http://www.theses.fr/2013PAUU3027/document.
Texto completoThe miniaturization of electronic components and the increasing number of their functionalities lead to the development of suitable energy microsources, among which lithium microbatteries appear. Despite the excellent performances of these all-solid-state electrochemical power sources, one main limitation that remains is their surface capacity. Its value being intrinsically connected to the nature of electrode materials, we chose to focus on CuO thin films which are characterized by a theoretical volumetric capacity (426 µAh .cm-2.µm-1) in far larger than the one of conventional intercalation materials used today. Indeed, this material reacts with lithium according to a particular mechanism, referred as conversion reaction, inducing the formation of a multiphase nanostructured system with a high complexity. In the framework of this study, understanding of electrochemical and chemical mechanisms which take place during the cycling of copper oxide thin films (CuO) was the main objective. This one has required a fine characterization of the electrode active material and the generated interfaces (solid/solid interfaces and solid/electrolyte interface). These studies have been mainly carried out with X-ray Photoelectron Spectroscopy (XPS), Atomic Force Microscopy (AFM) and theoretical approaches based on quantum chemistry methods. The chemical and morphological properties of the cycled CuO thin films have been linked to their electrochemical behavior. An important influence of their initial structure and morphology was then evidenced
Combes, Julien. "Etude de l'adhésion d'ostéoblastes sur substituts apatitiques par microscopie à force atomique". Phd thesis, Ecole Nationale Supérieure des Mines de Saint-Etienne, 2009. http://tel.archives-ouvertes.fr/tel-00445705.
Texto completoDoskočilová, Veronika. "Využití agentů v business procesech". Master's thesis, Vysoká škola ekonomická v Praze, 2011. http://www.nusl.cz/ntk/nusl-124783.
Texto completoDario, Alan de Genaro. "Processos de Cox com intensidade difusiva afim". Universidade de São Paulo, 2011. http://www.teses.usp.br/teses/disponiveis/45/45133/tde-01052013-111713/.
Texto completoThis Thesis deals with the Cox Process when its intensity belongs to a family of affine diffusions. The form of the probability density function of the Cox process is obtained when the density is described by an arbitrary d-dimensional affine diffusion. Coupling and convergence results are also addressed for a general Cox process with affine intensity. We adopted the Feller diffusion for driving the underlying intensity of the Cox Process to illustrate our results. Additionally the parameters of the underlying intensity processes are estimated by means of the Kalman Filter in conjunction with Quasi-Maximum Likelihood estimation.
Libros sobre el tema "AFM PROCESS"
editor, Malik Lokendra y Arora Manish editor, eds. The chief justice speaks: Selected judicial and extra-judicial reflections of Justice A.M. Ahmadi. Gurgaon, Haryana, India: Universal Law Publishing, an imprint of LexisNexis, 2016.
Buscar texto completoMaryLynn, Jacobs y Austin Noelle, eds. Splinting the hand and upper extremity: Principles and process. Baltimore, Md: Lippincott Williams & Wilkins, 2003.
Buscar texto completoUnited States. Department of Justice, ed. Address of the Honorable Edwin Meese III, Attorney General of the United States before the American Bar Association, 10: 30 A.M., Tuesday, July 9, 1985, Sheraton Washington Hotel, Washington, D.C. [Washington, D.C.?]: Department of Justice, 1985.
Buscar texto completoMeese, Edwin. Address of the Honorable Edwin Meese III, Attorney General of the United States before the American Bar Association, 10:30 A.M., Tuesday, July 9, 1985, Sheraton Washington Hotel, Washington, D.C. [Washington, D.C.?]: Dept. of Justice, 1985.
Buscar texto completoSaral, Melek. Turkey's 'Self' and 'Other' Definitions in the Course of the EU Accession Process. NL Amsterdam: Amsterdam University Press, 2017. http://dx.doi.org/10.5117/9789462981171.
Texto completoBabalis, Dimitra, ed. Ecological design for an effective urban regeneration. Florence: Firenze University Press, 2004. http://dx.doi.org/10.36253/88-8453-146-2.
Texto completoLangbein, Hermann. Auschwitz przed sądem: Proces w Frankfurcie nad Menem 1963-1965 : dokumentacja. Wrocław: Via Nova, 2011.
Buscar texto completoUnited States. National Aeronautics and Space Administration., ed. Final test report for the qualification of the gristblast assembly and process for the inside diameter of the RSRM forward and aft domes. Brigham City, UT: Thiokol Corporation Space Operations, 1992.
Buscar texto completoCompliance review process and missile defense: Hearing before the Subcommittee on International Security, Proliferation, and Federal Services of the Committee on Governmental Affairs, United States Senate, One Hundred Fifth Congress, first session, July 21, 1997. Washington: U.S. G.P.O., 1997.
Buscar texto completoConference on Thermal Analysis of Molten Aluminum (1984 Rosemont, Ill.). Thermal analysis of molten aluminum: A new in-process technique for quality control : proceedings of the AFS/CMI Conference, December 11-12, 1984, Sheraton International at O'Hare, Rosemont, Illinois. Des Plaines, IL: Cast Metals Institute, 1985.
Buscar texto completoCapítulos de libros sobre el tema "AFM PROCESS"
Yan, Yong Da, Tao Sun y Shen Dong. "Study on Effects of the Feed on AFM-Based Nanomachining Process". En Materials Science Forum, 257–60. Stafa: Trans Tech Publications Ltd., 2006. http://dx.doi.org/10.4028/0-87849-421-9.257.
Texto completoMatsumoto, Kazuhiko. "Room-Temperature Single-Electron Devices formed by AFM Nano-Oxidation Process". En Applied Scanning Probe Methods, 459–67. Berlin, Heidelberg: Springer Berlin Heidelberg, 2004. http://dx.doi.org/10.1007/978-3-642-35792-3_16.
Texto completoYan, Yong Da, Tao Sun, Shen Dong y Ying Chun Liang. "MD Analysis on Tip Geometry Effects in AFM-Based Lithography Process". En Progress of Precision Engineering and Nano Technology, 228–33. Stafa: Trans Tech Publications Ltd., 2007. http://dx.doi.org/10.4028/0-87849-430-8.228.
Texto completoKim, Y. S., S. O. Choi, S. R. Lee y J. Kim. "An Atomic Simulation of AFM-Based Nano Lithography Process for Nano Patterning". En Solid Mechanics and its Applications, 331–41. Dordrecht: Springer Netherlands, 2004. http://dx.doi.org/10.1007/978-1-4020-2111-4_32.
Texto completoChaturvedi, Rishabh y Pankaj Kumar Singh. "Analysis of the Factors Affecting MRR in AFM and Centrifugal Process Using Taguchi Method". En Lecture Notes in Mechanical Engineering, 393–99. Singapore: Springer Nature Singapore, 2023. http://dx.doi.org/10.1007/978-981-99-1328-2_36.
Texto completoKrüger, Daniel, Roger Rousseau, Dominik Marx, Harald Fuchs y Michele Parrinello. "Car-Parrinello Density Functional Calculations of the Bond Rupture Process of Thiolate on Gold in AFM Measurements: Progress and First Results". En High Performance Computing in Science and Engineering 2000, 257–72. Berlin, Heidelberg: Springer Berlin Heidelberg, 2001. http://dx.doi.org/10.1007/978-3-642-56548-9_20.
Texto completoSem, Helle Frisak, Steinar Carlsen y Gunnar John Coll. "On Two Approaches to ACM". En Business Process Management Workshops, 12–23. Berlin, Heidelberg: Springer Berlin Heidelberg, 2013. http://dx.doi.org/10.1007/978-3-642-36285-9_3.
Texto completoSwenson, Keith D. "Position: BPMN Is Incompatible with ACM". En Business Process Management Workshops, 55–58. Berlin, Heidelberg: Springer Berlin Heidelberg, 2013. http://dx.doi.org/10.1007/978-3-642-36285-9_7.
Texto completoGroßmann, K., A. Hardtmann, H. Wiemer, L. Penter y S. Kriechenbauer. "Advanced Forming Process Model - AFPM". En Lecture Notes in Production Engineering, 383–401. Berlin, Heidelberg: Springer Berlin Heidelberg, 2013. http://dx.doi.org/10.1007/978-3-642-32448-2_17.
Texto completoTran Thi Kim, Thanh, Erhard Weiss, Christoph Ruhsam, Christoph Czepa, Huy Tran y Uwe Zdun. "Embracing Process Compliance and Flexibility Through Behavioral Consistency Checking in ACM". En Business Process Management Workshops, 43–54. Cham: Springer International Publishing, 2016. http://dx.doi.org/10.1007/978-3-319-42887-1_4.
Texto completoActas de conferencias sobre el tema "AFM PROCESS"
Kizu, Ryosuke, Ichiko Misumi, Akiko Hirai y Satoshi Gonda. "Photoresist shrinkage observation by a metrological tilting-AFM". En Metrology, Inspection, and Process Control XXXVII, editado por John C. Robinson y Matthew J. Sendelbach. SPIE, 2023. http://dx.doi.org/10.1117/12.2655566.
Texto completovan Reijzen, Maarten E., Mehmet S. Tamer, Maarten H. van Es, Martijn M. C. J. M. van Riel, Sasan Keyvani, Hamed Sadeghian y Marco van der Lans. "Improved sub-surface AFM using photothermal actuation". En Metrology, Inspection, and Process Control for Microlithography XXXIII, editado por Ofer Adan y Vladimir A. Ukraintsev. SPIE, 2019. http://dx.doi.org/10.1117/12.2515441.
Texto completoHu, Z. J., Y. D. Yan, Y. H. Zhang, T. Sun y S. Dong. "Penetrating Process Analysis of AFM Diamond Tip". En 2007 First International Conference on Integration and Commercialization of Micro and Nanosystems. ASMEDC, 2007. http://dx.doi.org/10.1115/mnc2007-21109.
Texto completoPromyoo, Rapeepan, Hazim El-Mounayri y Kody Varahramyan. "AFM-Based Nanoindentation Process: A Comparative Study". En ASME 2012 International Manufacturing Science and Engineering Conference collocated with the 40th North American Manufacturing Research Conference and in participation with the International Conference on Tribology Materials and Processing. American Society of Mechanical Engineers, 2012. http://dx.doi.org/10.1115/msec2012-7356.
Texto completoBreton, Mary A., Jennifer Fullam, Lan Yu, Dexin Kong, Daniel Schmidt, Andrew Greene, Liying Jiang, Sean Hand y Jason Osborne. "AFM characterization for Gate-All-Around (GAA) devices". En Metrology, Inspection, and Process Control for Microlithography XXXIV, editado por Ofer Adan y John C. Robinson. SPIE, 2020. http://dx.doi.org/10.1117/12.2551931.
Texto completoCao, Zhenle, Wyatt Sullivan, Benjamin D. Bunday y David Morris. "Parallel MEMS AFM for high-throughput semiconductor metrology and inspection". En Metrology, Inspection, and Process Control XXXVII, editado por John C. Robinson y Matthew J. Sendelbach. SPIE, 2023. http://dx.doi.org/10.1117/12.2658485.
Texto completoCerbu, Dorin, Kristof Paredis, Alain Moussa, Anne-Laure Charley y Philippe Leray. "Deep learning-enabled vertical drift artefact correction for AFM images". En Metrology, Inspection, and Process Control XXXVI, editado por John C. Robinson y Matthew J. Sendelbach. SPIE, 2022. http://dx.doi.org/10.1117/12.2614029.
Texto completoCao, Zhenle, Wyatt Sullivan, Benjamin D. Bunday y David Morris. "Parallel MEMS AFM for high-throughput semiconductor metrology and inspection (Erratum)". En Metrology, Inspection, and Process Control XXXVII, editado por John C. Robinson y Matthew J. Sendelbach. SPIE, 2023. http://dx.doi.org/10.1117/12.3005374.
Texto completoLiu, Hao-Chih, David Fong, Gregory A. Dahlen, Marc Osborn, Sean Hand y Jason R. Osborne. "Carbon nanotube AFM probes for microlithography process control". En SPIE 31st International Symposium on Advanced Lithography, editado por Chas N. Archie. SPIE, 2006. http://dx.doi.org/10.1117/12.656807.
Texto completoKizu, Ryosuke, Ichiko Misumi, Akiko Hirai y Satoshi Gonda. "Comparison of SEM and AFM performances for LER reference metrology". En Metrology, Inspection, and Process Control for Microlithography XXXIV, editado por Ofer Adan y John C. Robinson. SPIE, 2020. http://dx.doi.org/10.1117/12.2551468.
Texto completoInformes sobre el tema "AFM PROCESS"
Hedgecock, Nancy S. Hexavalent Chromium Reduction Pretreatment Process Evaluation, Randolph AFB, Texas. Fort Belvoir, VA: Defense Technical Information Center, septiembre de 1990. http://dx.doi.org/10.21236/ada228805.
Texto completoSisterson, Douglas. ARM Lead Mentor Selection Process and Key Roles and Responsibilities. Office of Scientific and Technical Information (OSTI), enero de 2018. http://dx.doi.org/10.2172/1418462.
Texto completoBaca, Ana. Assessment of AFM - KPFM and SSRM for Measuring and Characterizing Materials Aging Processes. Office of Scientific and Technical Information (OSTI), noviembre de 2020. http://dx.doi.org/10.2172/1733233.
Texto completoSmith, F. G. Am/Cm Vitrification Process: Vitrification Material Balance Calculations. Office of Scientific and Technical Information (OSTI), febrero de 2001. http://dx.doi.org/10.2172/775070.
Texto completoSmith, F. G. Am/Cm Vitrification Process: Pretreatment Material Balance Calculations. Office of Scientific and Technical Information (OSTI), febrero de 2001. http://dx.doi.org/10.2172/775071.
Texto completoSmith, F. G. Am/Cm Vitrification Process: Vitrification Material Balance Calculations. Office of Scientific and Technical Information (OSTI), agosto de 2000. http://dx.doi.org/10.2172/760271.
Texto completoSmith, F. G. Am/Cm Vitrification Process: Pretreatment Material Balance Calculations. Office of Scientific and Technical Information (OSTI), agosto de 2000. http://dx.doi.org/10.2172/760272.
Texto completoMcHale, James, Timothy A. Chick y Eugene Miluk. Implementation Guidance for the Accelerated Improvement Method (AIM). Software Engineering Process Management: Special Report. Fort Belvoir, VA: Defense Technical Information Center, diciembre de 2010. http://dx.doi.org/10.21236/ada536176.
Texto completoKroll, Joshua A. ACM TechBrief: Facial Recognition Technology. ACM, febrero de 2022. http://dx.doi.org/10.1145/3520137.
Texto completoDooraghi, Michael R., Afshin M. Andreas, Mark C. Kutchenreiter, Ibrahim M. Reda, Marta Stoddard, Manajit Sengupta y Aron M. Habte. Broadband Outdoor Radiometer Calibration (BORCAL) Process for the Atmospheric Radiation Measurement (ARM) Program: Second Edition. Office of Scientific and Technical Information (OSTI), febrero de 2019. http://dx.doi.org/10.2172/1494284.
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