Artículos de revistas sobre el tema "3-D metrology"
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Poon, Ting-Chung, Yaping Zhang, Liangcai Cao y Hiroshi Yoshikawa. "Editorial on Special Issue “Holography, 3-D Imaging and 3-D Display”". Applied Sciences 10, n.º 20 (11 de octubre de 2020): 7057. http://dx.doi.org/10.3390/app10207057.
Texto completoHärter, Daniel. "3-D metrology system with internal calibration". Optical Engineering 50, n.º 1 (1 de enero de 2011): 013604. http://dx.doi.org/10.1117/1.3530130.
Texto completoClarke, Tim y Richard Gooch. "Real‐time 3‐D metrology for aerospace manufacture". Sensor Review 19, n.º 2 (junio de 1999): 113–15. http://dx.doi.org/10.1108/02602289910266304.
Texto completoSid-Ahmed, M. A. y M. T. Boraie. "Dual camera calibration for 3-D machine vision metrology". IEEE Transactions on Instrumentation and Measurement 39, n.º 3 (junio de 1990): 512–16. http://dx.doi.org/10.1109/19.106283.
Texto completoMurakami, Hiroshi, Akio Katsuki, Hiromichi Onikura, Takao Sajima, Norio Kawagoishi, Eiji Kondo y Tomohiro Honda. "An Optical Fiber Probe for 3-D Micro Metrology". Key Engineering Materials 447-448 (septiembre de 2010): 524–28. http://dx.doi.org/10.4028/www.scientific.net/kem.447-448.524.
Texto completoValade, Charles, Jérôme Hazart, Sébastien Bérard-Bergery, Elodie Sungauer, Maxime Besacier y Cécile Gourgon. "Tilted beam scanning electron microscopy, 3-D metrology for microelectronics industry". Journal of Micro/Nanolithography, MEMS, and MOEMS 18, n.º 03 (19 de agosto de 2019): 1. http://dx.doi.org/10.1117/1.jmm.18.3.034001.
Texto completoLiu, Xiao-li, A.-meng Li, Xiao-bo Zhao, Peng-dong Gao, Jin-dong Tian y Xiang Peng. "Model-based optical metrology and visualization of 3-D complex objects". Optoelectronics Letters 3, n.º 2 (marzo de 2007): 115–18. http://dx.doi.org/10.1007/s11801-007-7018-y.
Texto completoZhang, Song, Rongguang Liang y Lianxiang Yang. "Special Section Guest Editorial: High-Speed 3-D Optical Metrology and Applications". Optical Engineering 53, n.º 11 (14 de octubre de 2014): 112201. http://dx.doi.org/10.1117/1.oe.53.11.112201.
Texto completoZhang, Xianzhu. "Analysis of 3-D surface waviness on standard artifacts by retroreflective metrology". Optical Engineering 39, n.º 1 (1 de enero de 2000): 183. http://dx.doi.org/10.1117/1.602350.
Texto completoShaw, Jonathan, Tuo-Hung Hou, Hassan Raza y Edwin Chihchuan Kan. "Statistical Metrology of Metal Nanocrystal Memories With 3-D Finite-Element Analysis". IEEE Transactions on Electron Devices 56, n.º 8 (agosto de 2009): 1729–35. http://dx.doi.org/10.1109/ted.2009.2024108.
Texto completoLe Cunff, Delphine, Gilles Fresquet, Thierry Raymond y Dirk K. de Vries. "Uniformity Control of 3-D Stacked ICs: Optical Metrology and Statistical Analysis". IEEE Transactions on Semiconductor Manufacturing 28, n.º 4 (noviembre de 2015): 448–53. http://dx.doi.org/10.1109/tsm.2015.2468086.
Texto completoGroßmann, Constanze, Ute Gawronski, Martin Breitbarth, Judith Baumgarten, Gunther Notni y Andreas Tünnermann. "18.3: 3-D Metrology System based on a Bi-directional OLED Microdisplay". SID Symposium Digest of Technical Papers 43, n.º 1 (junio de 2012): 237–39. http://dx.doi.org/10.1002/j.2168-0159.2012.tb05757.x.
Texto completoEiríksson, E. R., J. Wilm, D. B. Pedersen y H. Aanæs. "PRECISION AND ACCURACY PARAMETERS IN STRUCTURED LIGHT 3-D SCANNING". ISPRS - International Archives of the Photogrammetry, Remote Sensing and Spatial Information Sciences XL-5/W8 (7 de abril de 2016): 7–15. http://dx.doi.org/10.5194/isprs-archives-xl-5-w8-7-2016.
Texto completoAmoah, Papa K., Christopher E. Sunday, Chukwudi Okoro, Jungjoon Ahn, Lin You, Dmitry Veksler, Joseph Kopanski y Yaw Obeng. "(Invited) Towards the Physical Reliability of 3D-Integrated Systems: Broadband Dielectric Spectroscopic (BDS) Studies of Material Evolution and Reliability in Integrated Systems". ECS Meeting Abstracts MA2022-02, n.º 17 (9 de octubre de 2022): 859. http://dx.doi.org/10.1149/ma2022-0217859mtgabs.
Texto completoTai, Bruce L., David A. Stephenson y Albert J. Shih. "Improvement of surface flatness in face milling based on 3-D holographic laser metrology". International Journal of Machine Tools and Manufacture 51, n.º 6 (junio de 2011): 483–90. http://dx.doi.org/10.1016/j.ijmachtools.2011.02.006.
Texto completoStarikov, Alexander y Yi-sha Ku. "Special Section Guest Editorial: Metrology and Inspection for 3-D Integrated Circuits and Interconnects". Journal of Micro/Nanolithography, MEMS, and MOEMS 13, n.º 1 (25 de marzo de 2014): 011201. http://dx.doi.org/10.1117/1.jmm.13.1.011201.
Texto completoTakacs, Peter Z., Haizhang Li, Xiaodan Li y Manfred W. Grindel. "3‐D x‐ray mirror metrology with a vertical scanning long trace profiler (abstract)". Review of Scientific Instruments 67, n.º 9 (septiembre de 1996): 3368–69. http://dx.doi.org/10.1063/1.1146917.
Texto completoOrtiz-Sanz, J. P., M. Gil-Docampo, T. Rego-Sanmartín, M. Arza-García, G. Tucci, E. I. Parisi, V. Bonora y F. Mugnai. "D3MOBILE METROLOGY WORLD LEAGUE: TRAINING SECONDARY STUDENTS ON SMARTPHONE-BASED PHOTOGRAMMETRY". ISPRS - International Archives of the Photogrammetry, Remote Sensing and Spatial Information Sciences XLIII-B5-2020 (24 de agosto de 2020): 235–41. http://dx.doi.org/10.5194/isprs-archives-xliii-b5-2020-235-2020.
Texto completoPan, C. T., P. J. Cheng, Yeong-Maw Hwang, M. F. Chen, H. S. Chuang y C. T. Yang. "Three-Dimensional Micro-Flow Measurement in a Capillary with a Diode Laser Micro-Particle Image Velocitometry". Materials Science Forum 505-507 (enero de 2006): 343–48. http://dx.doi.org/10.4028/www.scientific.net/msf.505-507.343.
Texto completoRuss, J. Christian y John C. Russ. "3-D image analysis of serial focal sections from confocal scanning laser microscopy". Proceedings, annual meeting, Electron Microscopy Society of America 47 (6 de agosto de 1989): 152–53. http://dx.doi.org/10.1017/s0424820100152732.
Texto completoGong, Yuanzheng, Richard S. Johnston, C. David Melville y Eric J. Seibel. "Axial-Stereo 3-D Optical Metrology for Inner Profile of Pipes Using a Scanning Laser Endoscope". International Journal of Optomechatronics 9, n.º 3 (24 de junio de 2015): 238–47. http://dx.doi.org/10.1080/15599612.2015.1059535.
Texto completoXue, F., S. Filin, B. Elnashef y W. Jin. "SHAPE FROM POLARIZATION FOR FEATURELESS AND SPECULAR OBJECTS". International Archives of the Photogrammetry, Remote Sensing and Spatial Information Sciences XLVIII-2/W2-2022 (8 de diciembre de 2022): 143–48. http://dx.doi.org/10.5194/isprs-archives-xlviii-2-w2-2022-143-2022.
Texto completoGarrido-Castro, J. L., I. C. Aranda-Valera, P. Gardiner, P. Machado, J. Condell, C. Gonzalez-Navas y E. Collantes Estevez. "POS0952 RESPONSIVENESS OF SPINAL MOBILITY MEASUREMENTS IN AXIAL SPONDYLOARTHRITIS USING CONVENTIONAL AND ADVANCED METROLOGY: A PILOT STUDY". Annals of the Rheumatic Diseases 80, Suppl 1 (19 de mayo de 2021): 740.1–740. http://dx.doi.org/10.1136/annrheumdis-2021-eular.562.
Texto completoLenz, R. K. y R. Y. Tsai. "Techniques for calibration of the scale factor and image center for high accuracy 3-D machine vision metrology". IEEE Transactions on Pattern Analysis and Machine Intelligence 10, n.º 5 (septiembre de 1988): 713–20. http://dx.doi.org/10.1109/34.6781.
Texto completoMehendale, M., L. Hou, R. Mair, M. Kotelyanskii, M. Liebens, J. Derakhshandeh, P. Mukundhan, A. Miller, E. Beyne y T. Kryman. "Non-destructive In-line IMC Thickness Measurement Using Acoustic Metrology for 3D Stacking". International Symposium on Microelectronics 2019, n.º 1 (1 de octubre de 2019): 000274–79. http://dx.doi.org/10.4071/2380-4505-2019.1.000274.
Texto completoWolovich, William, Hassan Albakri y Hulya Yalcin. "The Precise Measurement of Free-Form Surfaces1". Journal of Manufacturing Science and Engineering 124, n.º 2 (29 de abril de 2002): 326–32. http://dx.doi.org/10.1115/1.1430677.
Texto completoZhang, Xi, Yuanzhi Xu, Haichao Li, Lijing Zhu, Xin Wang y Wei Li. "Flexible method for accurate calibration of large-scale vision metrology system based on virtual 3-D targets and laser tracker". International Journal of Advanced Robotic Systems 16, n.º 6 (1 de noviembre de 2019): 172988141989351. http://dx.doi.org/10.1177/1729881419893516.
Texto completoChe, Chenggang y Jun Ni. "A ball-target-based extrinsic calibration technique for high-accuracy 3-D metrology using off-the-shelf laser-stripe sensors". Precision Engineering 24, n.º 3 (julio de 2000): 210–19. http://dx.doi.org/10.1016/s0141-6359(00)00031-3.
Texto completoKumar, Upputuri Paul, U. Somasundaram, M. P. Kothiyal y Nandigana Krishna Mohan. "Microscopic TV Holography for Microsystems Metrology". Defence Science Journal 61, n.º 5 (30 de agosto de 2011): 491. http://dx.doi.org/10.14429/dsj.61.908.
Texto completoDaakir, M., M. Pierrot-Deseilligny, P. Bosser, F. Pichard, C. Thom y Y. Rabot. "STUDY OF LEVER-ARM EFFECT USING EMBEDDED PHOTOGRAMMETRY AND ON-BOARD GPS RECEIVER ON UAV FOR METROLOGICAL MAPPING PURPOSE AND PROPOSAL OF A FREE GROUND MEASUREMENTS CALIBRATION PROCEDURE". ISPRS - International Archives of the Photogrammetry, Remote Sensing and Spatial Information Sciences XL-3/W4 (17 de marzo de 2016): 65–70. http://dx.doi.org/10.5194/isprs-archives-xl-3-w4-65-2016.
Texto completoDaakir, M., M. Pierrot-Deseilligny, P. Bosser, F. Pichard, C. Thom y Y. Rabot. "STUDY OF LEVER-ARM EFFECT USING EMBEDDED PHOTOGRAMMETRY AND ON-BOARD GPS RECEIVER ON UAV FOR METROLOGICAL MAPPING PURPOSE AND PROPOSAL OF A FREE GROUND MEASUREMENTS CALIBRATION PROCEDURE". ISPRS - International Archives of the Photogrammetry, Remote Sensing and Spatial Information Sciences XL-3/W4 (17 de marzo de 2016): 65–70. http://dx.doi.org/10.5194/isprsarchives-xl-3-w4-65-2016.
Texto completoRahman, Anis y Aunik K. Rahman. "Nanoscale Metrology of Line Patterns on Semiconductor by Continuous Wave Terahertz Multispectral Reconstructive 3-D Imaging Overcoming the Abbe Diffraction Limit". IEEE Transactions on Semiconductor Manufacturing 32, n.º 1 (febrero de 2019): 7–13. http://dx.doi.org/10.1109/tsm.2018.2865167.
Texto completoAmoah, Papa K., Engelbert Redel, Helmut Baumgart y Yaw Obeng. "Impact of Flushing Agents in Broadband Dielectric Spectroscopy (BDS) Study of Ethanol Detection By HKUST-1 Metal-Organic Frameworks". ECS Meeting Abstracts MA2022-01, n.º 52 (7 de julio de 2022): 2133. http://dx.doi.org/10.1149/ma2022-01522133mtgabs.
Texto completoChernyshenko, A. A. y Yu I. Kamenskikh. "Vacuum system of Watt-balance: development aspects". Measurement Standards. Reference Materials 17, n.º 4 (17 de enero de 2022): 5–12. http://dx.doi.org/10.20915/2077-1177-2021-17-4-5-12.
Texto completoMURAKAMI, Hiroshi, Akio KATSUKI, Takao SAJIMA y Mitsuyoshi FUKUDA. "S1320101 Development of a System for 3-D Micro Metrology Using an Ultra-Small Diameter Optical Fiber Probe : Influence of the surface force". Proceedings of Mechanical Engineering Congress, Japan 2015 (2015): _S1320101——_S1320101—. http://dx.doi.org/10.1299/jsmemecj.2015._s1320101-.
Texto completoChandler, Clive. "In Situ Delineation Etch Reveals Subtle Detail in SEM Images of Ion Milled Cross Sections Enabling In-Fab 3-D Metrology and Characterization". Microscopy Today 8, n.º 2 (marzo de 2000): 36–39. http://dx.doi.org/10.1017/s1551929500057497.
Texto completoGarrido-Castro, J. L., F. Torres Vidal, M. Ladehesa Pineda, M. D. C. Castro Villegas, I. C. Aranda-Valera, R. Ortega Castro, C. Gonzalez-Navas y E. Collantes Estevez. "FRI0578 DEVELOPMENT OF A MOBILE APP AND WIRELESS SENSORS SYSTEM TO ASSESS SPINAL MOBILITY IN AXIAL SPONDYLOARTHRITIS: PRELIMINARY RESULTS." Annals of the Rheumatic Diseases 79, Suppl 1 (junio de 2020): 892.1–893. http://dx.doi.org/10.1136/annrheumdis-2020-eular.2137.
Texto completoNovak, James I. y Jonathon O’Neill. "A design for additive manufacturing case study: fingerprint stool on a BigRep ONE". Rapid Prototyping Journal 25, n.º 6 (8 de julio de 2019): 1069–79. http://dx.doi.org/10.1108/rpj-10-2018-0278.
Texto completoPRETLOVE, J. R. G. y G. A. PARKER. "THE SURREY ATTENTIVE ROBOT VISION SYSTEM". International Journal of Pattern Recognition and Artificial Intelligence 07, n.º 01 (febrero de 1993): 89–107. http://dx.doi.org/10.1142/s0218001493000066.
Texto completoPustelny, Tadeusz Piotr. "Electroluminescent optical fiber sensor for detection of a high intensity electric field". Photonics Letters of Poland 12, n.º 1 (31 de marzo de 2020): 19. http://dx.doi.org/10.4302/plp.v12i1.980.
Texto completoShalyt, Eugene, Michael Pavlov, Danni Lin, Michael MacEwan, Helen Lu y Paul Okagbare. "Process Control for Advanced Packaging Metallization". Additional Conferences (Device Packaging, HiTEC, HiTEN, and CICMT) 2019, DPC (1 de enero de 2019): 1–23. http://dx.doi.org/10.4071/2380-4491-2019-dpc-presentation_tha2_022.
Texto completoTai, C. K., R. Ahmad, H. M. Akil y M. M. Ratnam. "Effect of Alkali Treatment and Molding Temperature on Flexural and Impact Properties of Coir-Fibre-Epoxy Composite". Advanced Composites Letters 24, n.º 4 (julio de 2015): 096369351502400. http://dx.doi.org/10.1177/096369351502400403.
Texto completoTada, Eisuke. "Special Issue on Robotics and Mechatronics for Fusion Experimental Reactor (ITER)". Journal of Robotics and Mechatronics 10, n.º 2 (20 de abril de 1998): 69–70. http://dx.doi.org/10.20965/jrm.1998.p0069.
Texto completoListewnik, Paulina y Adam Mazikowski. "Automatic system for optical parameters measurements of biological tissues". Photonics Letters of Poland 10, n.º 3 (1 de octubre de 2018): 91. http://dx.doi.org/10.4302/plp.v10i3.846.
Texto completoLee, Dong Hun, Yuxuan Zhang, Kwangsoo No, Han Wook Song y Sunghwan Lee. "(Digital Presentation) Multimodal Encapsulation of p-SnOx to Engineer the Carrier Density for Thin Film Transistor Applications". ECS Meeting Abstracts MA2022-02, n.º 15 (9 de octubre de 2022): 821. http://dx.doi.org/10.1149/ma2022-0215821mtgabs.
Texto completoLee, Sunghwan, Donghun Lee, Fei Qin, Yuxuan Zhang, Molly Rothschild, Han Wook Song y Kwangsoo No. "(Invited) Oxide Electronics and Recent Progress in Bipolar Applications". ECS Meeting Abstracts MA2022-01, n.º 19 (7 de julio de 2022): 1071. http://dx.doi.org/10.1149/ma2022-01191071mtgabs.
Texto completoÖz, N., A. Ozer y M. T. Duruöz. "AB1064 THE RELATIONSHIP BETWEEN DISEASE ACTIVITY AND CENTRAL SENSITIZATION IN SPONDYLOARTHROPATHY PATIENTS RECEIVING BIOLOGICAL TREATMENT". Annals of the Rheumatic Diseases 82, Suppl 1 (30 de mayo de 2023): 1753.2–1754. http://dx.doi.org/10.1136/annrheumdis-2023-eular.1785.
Texto completoSaraç, D. C., S. Bayram, N. G. Tore, F. Sarİ, D. Oskay, A. Avanoğlu Güler y A. Tufan. "THU0633-HPR CORE MUSCLE ENDURANCE IN PATIENTS WITH ANKYLOSING SPONDYLITIS". Annals of the Rheumatic Diseases 79, Suppl 1 (junio de 2020): 561.2–562. http://dx.doi.org/10.1136/annrheumdis-2020-eular.5685.
Texto completoZhou, W., M. He, R. Zhao, C. Dong y Z. Gu. "AB1331-HPR ACTIVE DISEASE ACTIVITY IN ANKYLOSIS SPONDYLITIS: WORSE OUTCOMES AND POORER HR-QOL". Annals of the Rheumatic Diseases 79, Suppl 1 (junio de 2020): 1954.2–1954. http://dx.doi.org/10.1136/annrheumdis-2020-eular.6288.
Texto completoHu, L., X. Ji y F. Huang. "THU0389 OBESITY IS A STRONG PREDICTOR OF WORSE CLINICAL OUTCOMES AND TREATMENT RESPONSES TO BIOLOGICS IN PATIENTS WITH ANKYLOSING SPONDYLITIS". Annals of the Rheumatic Diseases 79, Suppl 1 (junio de 2020): 429.2–429. http://dx.doi.org/10.1136/annrheumdis-2020-eular.4445.
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