Books on the topic 'XPS'

Crist, B. Vincent. Handbook of monochromatic XPS spectra. Chichester: John Wiley, 2000.

National Institute of Standards and Technology (U.S.), ed. The NIST X-ray photoelectron spectroscopy (XPS) database. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1991.

National Institute of Standards and Technology (U.S.), ed. The NIST X-ray photoelectron spectroscopy (XPS) database. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1991.

National Institute of Standards and Technology (U.S.), ed. The NIST X-ray photoelectron spectroscopy (XPS) database. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1991.

Puppe, Frank, ed. XPS-99: Knowledge-Based Systems. Survey and Future Directions. Berlin, Heidelberg: Springer Berlin Heidelberg, 1999. http://dx.doi.org/10.1007/b72142.

1948-, Briggs D., ed. High resolution XPS of organic polymers: The Scienta ESCA300 database. Chichester [England]: Wiley, 1992.

V, Pepper Stephen, and United States. National Aeronautics and Space Administration., eds. Interfacial chemistry of a perfluoropolyether lubricant studied by XPS and TDS. [Washington, DC: National Aeronautics and Space Administration, 1992.

IBM Data Management Solutions Education Services. Working with IBM Informix XPS 8.40 features: Course 765, version 2. [United States?]: IBM, 2002.

Petkovic, Dus an. INFORMIX-Universal-Server: Das objekt-relationale Datenbanksystem, mit OnLine-XPS und ODS. Bonn: Addison-Wesley-Longman, 1997.

Deutsche Tagung Expertensysteme (2nd 1993 Hamburg, Germany). Expertensysteme 93: 2. Deutsche Tagung Expertensysteme (XPS-93), Hamburg, 17.-19. Februar 1993. Berlin: Springer-Verlag, 1993.

Informatik, Gesellschaft für. Expertensysteme 93: 2. Deutsche Tagung Expertensysteme (XPS-93) Hamburg, 17.-19. Februar 1993. Berlin, Heidelberg: Springer Berlin Heidelberg, 1993.

Deutsche Expertensystemtagung (3rd 1995 Kaiserslautern, Germany). Expertensysteme 95: Beiträge zur 3. Deutschen Expertensystemtagung (XPS-95), 1.-3. März 1995, Kaiserslautern. Sankt Augustin: Infix, 1995.

Grasserbauer, Manfred, Hans Joachim Dudek, and Maria F. Ebel. Angewandte Oberflächenanalyse mit SIMS Sekundär-Ionen-Massenspektrometrie AES Auger-Elektronen-Spektrometrie XPS Röntgen-Photoelektronen-Spektrometrie. Berlin, Heidelberg: Springer Berlin Heidelberg, 1986. http://dx.doi.org/10.1007/978-3-642-70177-1.

Grasserbauer, M. Angewandte Oberflächenanalyse: Mit SIMS Sekundär-Ionen-Massenspektrometrie, AES Auger-Elektronen-Spektrometrie, XPS Röntgen-Photoelektronen-Spektrometrie. Berlin: Springer-Verlag, 1986.

Australia-Asia, XPS Symposium (1995 Sydney Australia). Papers from Australia-Asia XPS Symposium 1995, Coogee Beach, Sydney, Australia, 14-17 November 1995. Chichester: Wiley, 1996.

Yu, Wei. Ion bombardment induced compositional changes in compound semiconductor surfaces studied by XPS combined with LEISS. Birmingham: Aston University. Department of Electronic Engineering and Applied Physics, 1995.

Pilar, Herrera-Fierro, and United States. National Aeronautics and Space Administration., eds. XPS analysis of 440C steel surfaces lubricated with perfluoropolyethers under sliding conditions in high vacuum. [Washington, DC]: National Aeronautics and Space Administration, 1994.

J, Bozak M., Williams J. R, and United States. National Aeronautics and Space Administration., eds. X-ray photoelectron spectroscopy (XPS), Rutherford back scattering (RBS) studies ...: Final report for NAS8-39131 delivery order 7. [Washington, DC: National Aeronautics and Space Administration, 1993.

J, Bozak M., Williams J. R, and United States. National Aeronautics and Space Administration., eds. X-ray photoelectron spectroscopy (XPS), Rutherford back scattering (RBS) studies ...: Final report for NAS8-39131 delivery order 7. [Washington, DC: National Aeronautics and Space Administration, 1993.

J, Bozak M., Williams J. R, and United States. National Aeronautics and Space Administration., eds. X-ray photoelectron spectroscopy (XPS), Rutherford back scattering (RBS) studies ...: Final report for NAS8-39131 delivery order 7. [Washington, DC: National Aeronautics and Space Administration, 1993.

Sunder, S. XPS, XRD and SEM study of oxidation of UO2 by air in gamma radiation at 150 [degrees] C. Pinawa, Man: Whiteshell Laboratories, 1995.

Deutsche Tagung Wissensbasierte Systeme (4th 1997 Bad Honnef, Germany). Expertensysteme 97: Beiträge zur 4. Deutschen Tagung Wissensbasierte Systeme (XPS-97), 5.-7. März 1997, Bad Honnef am Rhein. Sankt Augustin: Infix, 1997.

Moulder, John F. Handbook of x-ray photoelectron spectroscopy: A reference book of standard spectra for identification and interpretation of XPS data. Eden Prairie, Minn: Perkin-Elmer Corporation, Physical Electronics Division, 1992.

F, Moulder John, and Chastain Jill, eds. Handbook of x-ray photoelectron spectroscopy: A reference book of standard spectra for identification and interpretation of XPS data. Eden Prairie, Minn: Perkin-Elmer Corporatioon, Physical Electronics Division, 1992.

Artymko, John Walter Gerrard. Effect of temperature and relative humidity during fixation of leachability, biodeterioration and XPS spectra CCA-A treated red pine sapwood. Ottawa: National Library of Canada, 1994.

Knote, Harald. Untersuchungen an in wässrigen Elektrolyten gebildeten Passivschichten auf rostfreien Stählen mit der Augerelektronenspektroskopie (AES) und der Photoelektronenspektroskopie (ESCA bzw. [beziehungsweise] XPS). [s.l.]: [s.n.], 1986.

Frank, Puppe, ed. XPS-99: Knowledge-based systems : survey and future directions : 5th biannual German Conference on Knowledge-Based Systems, Würzburg, Germany, March 3-5, 1999 : proceedings. Berlin: Springer, 1999.

Saffarini, Ghassan. X-ray photoelectron spectroscopy (XPS), X-ray diffraction (XRD), differential scanning calorimetry (DSC) and density study of ternary chalcogenide glasses based on Ge-Se and Ge-S. Uxbridge: Brunel University, 1991.

Deighton, Len. XPD. London: HarperCollins, 1994.

Deighton, Len. XPD. Glasgow: HarperCollins, 2009.

Deighton, Len. XPD. London: Grafton Books, 1987.

Deighton, Len. XPD. New York: Sterling, 2012.

Deighton, Len. XPD. Milano: Rizzoli, 1986.

Deighton, Len. XPD. London: HarperCollins, 1994.

Deighton, Len. XPD. London: Grafton, 2002.

Deighton, Len. XPD. London: Harper, 2011.

Faquini, Rui, Roberto Linsker, Fifi Tong, and Ana Augusta Rocha. XPDs: Expedicionários. São Paulo, Brazil]: Auana, 2008.

Cultural heritage materials: An XPS approach. New York: Nova Science Publishers, 2012.

Crist, B. Vincent. Handbook of Monochromatic XPS Spectra, Semiconductors. Wiley, 2000.

The NIST X-ray photoelectron spectroscopy (XPS) database. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1991.

The NIST X-ray photoelectron spectroscopy (XPS) database. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1991.

Wolstenholme, John, and John F. Watts. Introduction to Surface Analysis by XPS and AES. Wiley & Sons, Limited, John, 2019.

The NIST X-ray photoelectron spectroscopy (XPS) database. Gaithersburg, MD: U.S. Dept. of Commerce, National Institute of Standards and Technology, 1991.

Crist, B. Vincent. Handbook of Monochromatic XPS Spectra, 3 Volume Set. Wiley, 2000.

Watts, J. F., John Wolstenholme, and John F. Watts. Introduction to Surface Analysis by XPS and AES. Wiley & Sons, Incorporated, John, 2003.

Wolstenholme, John, and John F. Watts. Introduction to Surface Analysis by XPS and AES. Wiley & Sons, Incorporated, John, 2003.

Wolstenholme, John, and John F. Watts. Introduction to Surface Analysis by XPS and AES. Wiley & Sons, Limited, John, 2019.

Wolstenholme, John, and John F. Watts. Introduction to Surface Analysis by XPS and AES. Wiley & Sons, Incorporated, John, 2005.

Wolstenholme, John, and John F. Watts. Introduction to Surface Analysis by XPS and AES. Wiley & Sons, Incorporated, John, 2019.

Wolstenholme, John, and John F. Watts. Introduction to Surface Analysis by XPS and AES. Wiley & Sons, Incorporated, John, 2019.