Relevant bibliographies by topics / Xeogl

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  1. Journal articles
  2. Dissertations / Theses
  3. Book chapters
  4. Conference papers

Academic literature on the topic 'Xeogl'

Author: Grafiati
Published: 29 June 2021
Last updated: 10 February 2022

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Journal articles on the topic "Xeogl"

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Piamonteze, Cinthia, Yoav William Windsor, Sridhar R. V. Avula, Eugenie Kirk, and Urs Staub. "Soft X-ray absorption of thin films detected using substrate luminescence: a performance analysis." Journal of Synchrotron Radiation 27, no. 5 (August 24, 2020): 1289–96. http://dx.doi.org/10.1107/s1600577520009972.

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X-ray absorption spectroscopy of thin films is central to a broad range of scientific fields, and is typically detected using indirect techniques. X-ray excited optical luminescence (XEOL) from the sample's substrate is one such detection method, in which the luminescence signal acts as an effective transmission measurement through the film. This detection method has several advantages that make it versatile compared with others, in particular for insulating samples or when a probing depth larger than 10 nm is required. In this work a systematic performance analysis of this method is presented with the aim of providing guidelines for its advantages and pitfalls, enabling a wider use of this method by the thin film community. The efficiency of XEOL is compared and quantified from a range of commonly used substrates. These measurements demonstrate the equivalence between XEOL and X-ray transmission measurements for thin films. Moreover, the applicability of XEOL to magnetic studies is shown by employing XMCD sum rules with XEOL-generated data. Lastly, it is demonstrated that above a certain thickness XEOL shows a saturation-like effect, which can be modelled and corrected for.
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Lin, Bi-Hsuan, Yu-Hao Wu, Xiao-Yun Li, Hsu-Cheng Hsu, Yu-Cheng Chiu, Chien-Yu Lee, Bo-Yi Chen, et al. "Capabilities of time-resolved X-ray excited optical luminescence of the Taiwan Photon Source 23A X-ray nanoprobe beamline." Journal of Synchrotron Radiation 27, no. 1 (January 1, 2020): 217–21. http://dx.doi.org/10.1107/s1600577519013675.

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Time-resolved X-ray excited optical luminescence (TR-XEOL) was developed successfully for the 23A X-ray nanoprobe beamline located at the Taiwan Photon Source (TPS). The advantages of the TR-XEOL facility include (i) a nano-focused X-ray beam (<60 nm) with excellent spatial resolution and (ii) a streak camera that can simultaneously record the XEOL spectrum and decay time. Three time spans, including normal (30 ps to 2 ns), hybrid (30 ps to 310 ns) and single (30 ps to 1.72 µs) bunch modes, are available at the TPS, which can fulfil different experimental conditions involving samples with various lifetimes. It is anticipated that TR-XEOL at the TPS X-ray nanoprobe could provide great characterization capabilities for investigating the dynamics of photonic materials.
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Hill, D. A., R. F. Pettifer, S. Gardeiis, B. Hamilton, A. D. Smith, and D. Teehan. "XEOL Studies of Porous Silicon." Le Journal de Physique IV 7, no. C2 (April 1997): C2–553—C2–555. http://dx.doi.org/10.1051/jp4/1997094.

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Ma, Jinjin, Qianting Yao, John A. McLeod, Lo-Yueh Chang, Chih-Wen Pao, Jiatang Chen, Tsun-Kong Sham, and Lijia Liu. "Investigating the luminescence mechanism of Mn-doped CsPb(Br/Cl)3 nanocrystals." Nanoscale 11, no. 13 (2019): 6182–91. http://dx.doi.org/10.1039/c9nr00143c.

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Rosenberg, R. A. "Defect specific luminescence dead layers in CdS and CdSe." Canadian Journal of Chemistry 95, no. 11 (November 2017): 1141–45. http://dx.doi.org/10.1139/cjc-2017-0126.

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CdS and CdSe are often used in optoelectronic devices whose effectiveness may be dictated by defects in the near surface region. Luminescence is one of the main tools for studying such defects. The energy dependence of the X-ray excited optical luminescence (XEOL) spectra of these materials enables the extraction of the depth dependence of the defect distribution. Normal and time-gated XEOL spectra were obtained from these materials in the energy range 600–1500 eV. We find that the results can best be understood in terms of a luminescence dead layer whose width depends on the position of the defect level in the band gap.
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Lin, Bi-Hsuan, Shao-Chin Tseng, Xiao-Yun Li, Dai-Jie Lin, Hsu-Cheng Hsu, Yen-Ting Li, Yu-Cheng Chiu, et al. "Developing the XEOL and TR-XEOL at the X-ray Nanoprobe at Taiwan Photon Source." Microscopy and Microanalysis 24, S2 (August 2018): 200–201. http://dx.doi.org/10.1017/s143192761801334x.

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Ko, JY Peter, Franziskus Heigl, Yun Mui Yiu, Xing-Tai Zhou, Tom Regier, Robert I. R. Blyth, and Tsun-Kong Sham. "Soft X-ray excited colour-centre luminescence and XANES studies of calcium oxide." Canadian Journal of Chemistry 85, no. 10 (October 1, 2007): 853–58. http://dx.doi.org/10.1139/v07-109.

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In this study, we show that colour centres can be produced by irradiating calcium oxide with soft X-rays from a synchrotron radiation source. Using the X-ray excited optical luminescence (XEOL) technique, two colour centres, F-centre, and F+-centre can be identified. These colour centres emit photons at characteristic wavelengths. In addition, by performing time-resolved XEOL (TRXEOL), we are able to reveal timing and decay characteristics of the colour centres. We also present X-ray absorption near-edge structure (XANES) spectra collected across oxygen K-edge, calcium L3,2-edge, and calcium K-edge. Experimental results are compared with density functional theory (DFT) calculations.Key words: calcium oxide, colour centre, synchrotron, X-ray excited optical luminescence, X-ray absorption near-edge structure.
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Rezende, Marcos V. dos S., Paulo J. R. Montes, Adriano B. Andrade, Zelia S. Macedo, and Mário E. G. Valerio. "Mechanism of X-ray excited optical luminescence (XEOL) in europium doped BaAl2O4 phosphor." Physical Chemistry Chemical Physics 18, no. 26 (2016): 17646–54. http://dx.doi.org/10.1039/c6cp01183g.

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This paper reports a luminescence mechanism in Eu-doped BaAl2O4 excited with monochromatic X-rays (also known as X-ray excited optical luminescence – XEOL) from synchrotron radiation.
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Wang, Zhiqiang, Jian Wang, Tsun-Kong Sham, and Shaoguang Yang. "Origin of luminescence from ZnO/CdS core/shell nanowire arrays." Nanoscale 6, no. 16 (2014): 9783–90. http://dx.doi.org/10.1039/c4nr02231a.

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Chemical imaging, electronic structure and optical properties of ZnO/CdS nano-composites have been investigated using scanning transmission X-ray microscopy (STXM), X-ray absorption near-edge structure (XANES) and X-ray excited optical luminescence (XEOL) spectroscopy.
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Ward, M. J., J. G. Smith, T. Z. Regier, and T. K. Sham. "2D XAFS-XEOL Spectroscopy – Some recent developments." Journal of Physics: Conference Series 425, no. 13 (March 22, 2013): 132009. http://dx.doi.org/10.1088/1742-6596/425/13/132009.

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Dissertations / Theses on the topic "Xeogl"

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Kastman, Pål. "Development of a 3D viewer for showing of house models in a web browser : A usability evaluation of navigation techniques." Thesis, Linköpings universitet, Interaktiva och kognitiva system, 2021. http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-177362.

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The architectural industry today struggles with how to best show their models to interested suitors opposite the construction industry which have the advantage of the fact that they can build physical models of houses which they can then show. This is where BIM comes into the picture. By extracting the graphics fromthese models and visualising them in a web browser this studyhas by creating a viewer with different navigation techniques sought to find out which techniques where most efficient for navigating models in the viewer. This was done with the help of user tests which results show that when it comes to projections, users were more efficient with perspective projection than orthogonal projections, however, user interviews show that users could still find a use for orthographic projection as it was better for displaying floor plans. Egocentric perspective were more efficient than allocentric perspective, but most users preferred egocentric perspective inside the models and allocentric projection outside of it. As for clipping objects and using clip planes, it is a closer race as users completed the task faster with clip plane but to a greater extent with culling of objects. However, most users wanted to use both technologies at the same time so that they could complement each other.
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Taylor, Richard Peter. "The development of X-ray Excited Optical Luminescence (XEOL) spectroscopic techniques for mineralogical and petrological applications." Thesis, University of St Andrews, 2013. http://hdl.handle.net/10023/3739.

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This thesis investigates the use of X-ray Excited Optical Luminescence (XEOL) and Time Resolved X-ray Excited Optical Luminescence (TR XEOL) within the Earth sciences. The project contains two primary objectives, the first of which is the design and building of a high-resolution luminescence spectroscopy facility. This includes the installation and commissioning of the facility on the I18 microfocus beamline at Diamond, the UK's national synchrotron facility. In describing the system's design and commissioning, I explore many implications of the technique. The second objective is using this new facility to investigate a suite of minerals to develop new analytical techniques utilizing XEOL and TR XEOL spectroscopy for applications within the Earth sciences. An aspect of this investigation is to explore the potential of Time Resolved Optically Derived X-ray Absorption Spectroscopy (TR OD XAS) of substitute trace elements in minerals. To date CW OD XAS has been shown to have very limited application within the Earth sciences. (Soderholm et al., 1998-120) The thesis explores differences between photoluminescence (PL) and XEOL responses in mineral systems, and investigates how these differences can be exploited. Luminescence, the phenomenon upon which the thesis is based, is a complex and poorly utilised phenomena within Earth sciences, it is however, orders of magnitude more sensitive, than many of the more accepted techniques used for the detection of trace elements, on this basis alone I would suggest it deserves further consideration. Luminescence techniques have developed much further in other disciplines; I therefore have incorporated many descriptions, models, and interpretations from other disciplines in order to identify methodologies and techniques that have the potential to be utilized in the study and interpretation of luminescence within the Earth sciences. The thesis demonstrates that luminescence in minerals with measured lifetimes, as fast as ~ 20 ps exist. Previously the recorded luminescent lifetimes, for minerals, in the literature are measured in ns. This finding leads to the novel concept that the measurement of TR XEOL with ps resolution combined with the measurement of the intensity of a luminescent signal as a function of excitation can provide significant new insights into the nature of the emission and the luminescent processes. I explore and demonstrate the potential of using dose dependence techniques of continuous wave and TR XEOL as a new analytical technique. I also demonstrate the use of a technique used extensively within Biology has an application with Earth sciences. The methodology incorporates the calculation of the natural lifetime of an emission through the relationship between the absorption and emission coefficients. (Strickler and Berg, 1962). I discuss how knowledge of the natural lifetime of an emission allows quantification of luminescence through measurement of a modified lifetime of emission. The quantification of a luminescent emission has significant potential within the geosciences one example being the identification of disputed emissions. I also consider the potential to use TR XEOL techniques in mapping complex heterogeneous rocks and minerals.
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Hill, Deborah Ann. "X-ray excited optical luminescence (XEOL) and its application to porous silicon." Thesis, University of Warwick, 1998. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.302693.

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Dehlinger, Maël. "XAS-XEOL and XRF spectroscopies using Near-Field Microscope probes for high-resolution photon collection." Phd thesis, Aix-Marseille Université, 2013. http://tel.archives-ouvertes.fr/tel-00880623.

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Les microscopes en champ proche permettent d'obtenir la topographie d'un échantillon avec une résolution pouvant atteindre la résolution atomique. Ces techniques permettent également d'accéder à certaines propriétés locales de la surface telles que le potentiel, l'élasticité, la densité d'états... Ces spectroscopies locales sont de type 'contraste' et ne permettent pas de dresser la cartographie chimique de la surface sans connaissance a priori des éléments qui la composent. Les spectroscopies de rayons-X sont des méthodes de caractérisation puissantes qui permettent de déterminer la composition et la structure élémentaire de l'échantillon avec une précision inférieure à l'Ångström. La résolution latérale est essentiellement limitée par la taille du faisceau primaire, couramment de plusieurs μm². Deux voies sont possibles pour l'améliorer: - réduire l'étendue du faisceau primaire excitateur; - limiter la collecte du rayonnement émis à une portion du volume excité, tout en approchant le détecteur au maximum pour garder un rapport signal/bruit suffisant. C'est cette deuxième option que nous avons choisi de développer. Pour cela nous avons collecté localement la luminescence visible issue de l'échantillon par la pointe-sonde d'un microscope à force de cisaillement, constituée d'une fibre optique effilée de faible ouverture. Cette technique a été utilisée pour caractériser des échantillons semiconducteurs micro- et nano-structurés afin d'en obtenir simultanément la topographie et la cartographie de luminescence locale. Ces résultats ont été obtenus non seulement sur une ligne synchrotron mais également à l'aide d'une microsource de laboratoire équipée d'une lentille polycapillaire. Afin de pouvoir étendre ce concept à d'autres types de matériaux, la faisabilité de la collecte de la fluorescence X locale a été évaluée avec la microsource. Pour cela la fluorescence X émise par un échantillon de cobalt a été collectée par un capillaire cylindrique équipant un détecteur EDX. L'influence du diamètre du capillaire sur le niveau de signal a été mesurée. Une simulation numérique a été développée afin d'estimer le niveau de signal obtenu en utilisant un capillaire de 1 μm de diamètre et d'optimiser la géométrie du système. En couplant la microscopie en champ proche et l'analyse XRF, à la lumière de ces résultats, il sera possible d'atteindre 100 nm de résolution latérale en environnement synchrotron et moins de 1 μm à l'aide d'une source de laboratoire. Il serait alors possible de sélectionner un objet particulier sur une surface et d'en faire l'analyse élémentaire.
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Dehlinger, Mael. "XAS-XEOL and XRF spectroscopies using near field microscope probes for high-resolution photon collection." Thesis, Aix-Marseille, 2013. http://www.theses.fr/2013AIXM4048/document.

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Les microscopes en champ proche permettent d'obtenir la topographie d'un échantillon avec une résolution pouvant atteindre la résolution atomique. Les spectroscopies de rayons-X sont des méthodes de caractérisation qui permettent de déterminer la composition et la structure élémentaire de l'échantillon avec une précision inférieure à l'Ångström. Nous avons choisi de coupler ces deux techniques en collectant localement la luminescence visible issue de l'échantillon par la pointe-sonde d'un microscope à force de cisaillement, constituée d'une fibre optique effilée de faible ouverture. Cette technique a été utilisée pour caractériser des échantillons semiconducteurs micro- et nano-structurés afin d'en obtenir simultanément la topographie et la cartographie de luminescence locale. Afin de pouvoir étendre ce concept à d'autres types de matériaux, la faisabilité de la collecte de la fluorescence X locale a été évaluée avec la microsource. Pour cela la fluorescence X émise par un échantillon a été collectée par un capillaire cylindrique équipant un détecteur EDX. L'influence du diamètre du capillaire sur le niveau de signal a été mesurée. Une simulation numérique a été développée afin d'estimer le niveau de signal obtenu en utilisant un capillaire de 1 µm de diamètre et d'optimiser la géométrie du système. En couplant la microscopie en champ proche et l'analyse XRF, à la lumière de ces résultats, il sera possible d'atteindre 100 nm de résolution latérale en environnement synchrotron et moins de 1 µm à l'aide d'une source de laboratoire. Il serait alors possible de sélectionner un objet particulier sur une surface et d'en faire l'analyse élémentaire
Scanning Probe Microscopes allow to obtain sample topography up to atomic resolution. X-ray spectroscopies allow elemental and structural analysis of a sample with accuracy better than 1 Å. The lateral resolution is limited by the primary beam diameter, currently a few µm². We have chosen to couple this two technics. Local sample visible luminescence is collected through a low aperture sharp optical fibre, probe of a shear force microscope. This technique was used to characterize microstructured semiconducting samples to achieve simultaneously the surface topography and luminescence mapping. The results were obtained using either synchrotron radiation or a laboratory microsource equipped with a polycapillary lens. To extend this concept to a wider variety of materials, local XRF collection by an EDX detector equipped with a cylindrical X-ray capillary was tested. A cobalt sample irradiated with the microsource was used for technique evaluation. The signal magnitude dependence with the capillary diameter was measured. Modelling and numerical calculations were developed to estimate the signal magnitude that could be detected using a 1 µm diameter capillary. The optimal system geometry was determined. Scanning Probe Microscopy combined to XRF analysis could thereby lead to simultaneous acquisition of sample topography and chemical mapping. The expected lateral resolution using synchrotron radiation is 100 nm while sub 1 µm resolution is realistic with a laboratory source. This technique would allow to point a peculiar micro- or nano-object on the surface and to perform its chemical analysis
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Yoshida, Tomoko, Shunsuke Muto, and Tetsuo Tanabe. "Measurement of Soft X-Ray Excited Optical Luminescence of a Silica Glass." American Institite of Physics, 2007. http://hdl.handle.net/2237/11985.

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França, Leonardo Vinícius da Silva. "Development of a Thermoluminescence - Radioluminescence Spectrometer." Universidade de São Paulo, 2018. http://www.teses.usp.br/teses/disponiveis/59/59135/tde-29052018-162229/.

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In this work, initially the radioluminescence (RL) and thermoluminescence (TL) techniques are presented. The radioluminescence is the prompt luminescence emitted by a material under ionizing radiation exposure. The thermoluminescence is the luminescence emitted by a material previously exposed to ionizing radiation when excited by heat. Enegy bands concepts, defects in crystals and the different processes of ionization that take place in matter when exposed to ionizing radiation are briefly discussed in order to present the mechanisms involved in RL and TL processes. The usage of the techniques in characterization of materials and dosimetry is reported, legitimating the importance of the instrument developed. Mechanical and structural parts as well as a description of each component of the instrument are fairly described. The implemented algorithm for controlling the instrument and acquiring data is also discussed. The development of the instrument enabled us to generate temperature ramps with a quite good performance, reaching temperatures up to 500 °C with deviations up to 2 °C, having used heating rates between 0.5 °C/s and 5 °C/s. Calibrations of optical spectrometer used in light collection and irradiation system were carried out. Lastly, TL and RL spectra tests were performed. The RL tests were carried out using several materials which emission spectra are well known by literature, namely, carbon-doped aluminium oxide Al2O3:C, terbium-doped gadolinium oxysulphide Gd2O2S:Tb, europium-doped yttrium oxide Y2O3:Eu and dysprosium-doped calcium borate CaB6O10:Dy. For the TL spectra test, the aluminium oxide doped with carbon Al2O3:C was used. The results of RL and TL spectra tests showed a good agreement with the literature, pointing out that the instrument developed in this work is comparable to others instruments in operation from others research groups, making our results reliable.
Nesse trabalho, inicialmente as técnicas de radioluminescência (RL) e termolumi- nescência (TL) são apresentadas. A radioluminescência é a luminescência imediata emitida por um material quando exposto à radiaçao ionizante. A termoluminescência é a luminescência emitida por um material previamente exposto à radiação quando este é aquecido. Conceitos de bandas de energia, defeitos em cristais e os diferentes processos de ionização que ocorrem na matéria quando exposta à radiação ionizante são brevemente discutidos a fim de apresentar os mecanismos envolvidos na RL e TL. A utilização das técnicas na caracterização de materiais e na dosimetria é reportada, justificando a importância do instrumento desenvolvido. As partes mecânicas/estruturais e uma descrição de cada componente do instrumento são descritos. O algoritmo implementado para controle do instrumento e aquisição de dados é também descrito. O desenvolvimento do instrumento possibilitou a geração de rampas de temperatura com uma boa performance, atingindo até 500 °C com variações de até 2 °C ao utilizar taxas de aquecimento entre 0.5 °C/s e 5 °C/s. Calibrações do espectrômetro óptico utilizado na aquisição da luminescência e do sistema de irradiação foram executadas. Por fim, testes de aquisição de espectros de RL e TL foram realizados. Os testes de RL foram realizados utilizando vários materiais cujos espectros de emissão são bem conhecidos pela literatura, a saber, óxido de alumínio dopado com carbono Al2O3:C , oxisulfeto de gadolínio dopado com térbio Gd2O2S:Tb , óxido de ítrio dopado com európio Y2O3:Eu e borato de cálcio dopado com disprósio CaB6O10:Dy. Para o teste dos espectros de TL, o Al2O3:C foi utilizado. Os resultados dos espectros de RL e TL mostraram concordância com a literatura, indicando que o instrumento desenvolvido é comparável a outros instrumentos em operação de outros grupos, tornando os nossos resultados confiáveis.
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Tola, Pascal. "Détection visible de l'EXAFS : une nouvelle méthode de détection de la structure fine des spectres d'absorption X." Nancy 1, 1992. http://www.theses.fr/1992NAN10002.

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La détection visible de l'EXAFS (extended x-ray absorption fine structure) est une méthode spectroscopique récente qui permet dans certains cas de l'enregistrement du spectre de photoabsorption X et de ses oscillations fines. Le principal avantage escompté est la sélectivité de sites cristallochimiques, qui n'est pas obtenue par les méthodes classiques. Comme l'EXAFS, elle requiert l'emploi du rayonnement synchrotron monochromatisé, et le montage expérimental s'apparente aux techniques XEOL (x-ray emission optical luminescence). Après un rappel de la théorie mise en jeu dans les techniques d'absorption et de fluorescence X. Une analyse XEOL de quelques composés (semiconducteurs, terres rares, porphyrines) est proposée dans une partie expérimentale dont le critère principal est la recherche d'une grande intensité dans les pannes d'émission. Les premiers résultats montrent que l'on a bien également accès, par transformée de Fourier du spectre d'excitation de luminescence, aux distances entre proches voisins dans les systèmes étudies. La sélectivité de site recherchée est atteinte dans l'exemple caractéristique du mélange hétérogène zno/zn tpp. Un transfert d'énergie cohérent est détecté dans certains cas (ex. Zns: tm). Les conditions expérimentales de mesure ont été trouvées déterminantes (échantillons minces, mode réflexion). De plus, la corrélation responsable de la forme exacte du spectre obtenu en détection visible avec les spectres d'absorption ne semble pas élémentaire. Il pourrait donc subsister d'autres limitations a cette méthode.
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King, Georgina. "Fundamental and sedimentological controls on luminescence behaviour in quartz and feldspar." Thesis, University of St Andrews, 2012. http://hdl.handle.net/10023/2586.

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The optically stimulated luminescence (OSL) characteristics of a suite of quartz and feldspar samples from a range of modern glaciofluvial sediments have been explored to determine the use of OSL as a depositional pathway tracer. Paraglacial and subglacial source material and various glaciofluvial deposits have been analysed from the glacial catchments of Bergsetbreen, Fåbergstølsbreen, and Nigardsbreen as well as the Fåbergstølsgrandane sandur, Jostedalen, Norway. The OSL distribution signatures have been characterised through exploration of sample skewness, kurtosis and overdispersion, and dose distributions of the different depositional settings and source materials are distinct for both quartz and feldspar. Residual ages are greatest for feldspar, indicating significant potential age overestimation where feldspar is used to date glaciofluvial deposits. Sample dose distributions and overdispersion characteristics are driven by source sediment properties, whereas residual ages are controlled by transport and depositional processes. Those transport and depositional processes which result in significant light exposure, also influence dose distributions, and processes that sort sediments least effectively have the highest residual doses. Sample OSL characteristics, transport distance and grain size distributions have been investigated using factor analysis, as a means of predicting sediment source, facies, depositional process and deposit type. Although the depositional processes of the quartz samples can be clearly differentiated based upon OSL characteristics, factor analyses of feldspar and grain size characteristics are inconclusive. The application of quartz OSL to the Norwegian samples was limited by its very poor luminescence sensitivity. Quartz is the preferred mineral for OSL, however, despite the plethora of successful quartz OSL applications, the precise origin of the UV/blue luminescence emission, measured during OSL, remains unclear. The origins of this emission and controls on its intensity were explored using a variety of spectroscopic techniques including photoluminescence, cathodoluminescence, radioluminescence (RL), ionoluminescence (IL) and x-ray excited optical luminescence (XEOL). Exciting sample luminescence at a range of energies enables exploration of the different donor centres responsible for the luminescence emission. Cathodoluminescence and RL emission spectra are similar, comprising broad emissions at 1.5, 2.0 and 2.7 eV (detection in the UV part of the spectrum was not possible for these experiments). Ionoluminescence emission spectra were dominated by the ~ 3.3 eV emission, which is a component of the signal conventionally monitored during OSL. This emission depleted as a function of dose, to the benefit of the red emission (1.8-2.0 eV) for all samples throughout IL, and similar observations were made for the 3.4 eV emission observed from the XEOL emission spectra. The XEOL spectra are dominated by an emission at ~ 3.8 eV, not widely reported for quartz, which has tentatively been attributed to peroxy linkages. Differences between the IL and XEOL emission spectra are interpreted as evidence for the presence of multiple excited states.
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Book chapters on the topic "Xeogl"

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Soderholm, L., G. K. Liu, M. R. Antonio, and M. F. Reid. "Characterization of Materials: XEOL/XAFS." In Encyclopedia of Materials: Science and Technology, 1140–42. Elsevier, 2001. http://dx.doi.org/10.1016/b0-08-043152-6/00213-8.

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Conference papers on the topic "Xeogl"

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Sham, T. K., Robert A. Gordon, R. Garrett, I. Gentle, K. Nugent, and S. Wilkins. "RIXS, XEOL and XEOL Imaging of Rare-earth Phosphors at the L[sub 3,2]-edges." In SRI 2009, 10TH INTERNATIONAL CONFERENCE ON RADIATION INSTRUMENTATION. AIP, 2010. http://dx.doi.org/10.1063/1.3463158.

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Kochubey, Vyacheslav I., Julia G. Konyukhova, and Ol'ga V. Chugunova. "Features of recording and calculating XEOL spectra." In Saratov, Russia, edited by Vladimir L. Derbov, Leonid A. Melnikov, and Lev M. Babkov. SPIE, 2005. http://dx.doi.org/10.1117/12.636988.

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Zhou, J. G., X. H. Sun, X. T. Zhou, M. Murphy, F. Heigl, Z. F. Ding, and T. K. Sham. "XAFS and XEOL Studies of CdSe Nanostructures." In X-RAY ABSORPTION FINE STRUCTURE - XAFS13: 13th International Conference. AIP, 2007. http://dx.doi.org/10.1063/1.2644671.

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Murphy, Michael, Xing-Tai Zhou, Franziskus Heigl, Tom Regier, and Tsun-Kong Sham. "An X-Ray Excited Optical Luminescence (XEOL) Analysis of Mn2+ Doped ZnS Nanostructures." In X-RAY ABSORPTION FINE STRUCTURE - XAFS13: 13th International Conference. AIP, 2007. http://dx.doi.org/10.1063/1.2644657.

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Verma, Ravi S., Praveen K. Yadav, and Mukesh P. Joshi. "Development of soft X-ray excited optical luminescence (XEOL) measurement setup at beamline 4 in INDUS-1 synchrotron radiation source." In DAE SOLID STATE PHYSICS SYMPOSIUM 2019. AIP Publishing, 2020. http://dx.doi.org/10.1063/5.0017420.

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Ko, J. Y. Peter, Xing-Tai Zhou, Franziskus Heigl, Tom Regier, Robert Blyth, and Tsun-Kong Sham. "X-Ray Absorption Near-Edge Structure (XANES) of Calcium L3,2 Edges of Various Calcium Compounds and X-Ray Excited Optical Luminescence (XEOL) Studies of Luminescent Calcium Compounds." In X-RAY ABSORPTION FINE STRUCTURE - XAFS13: 13th International Conference. AIP, 2007. http://dx.doi.org/10.1063/1.2644585.

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