Books on the topic 'X-rays Instruments Industrial applications'

Neil, White, and Augousti A. T, eds. Sensors and their applications X: Proceedings of the tenth Conference on Sensors and Their Applications, held in Cardiff, Wales, 5-8 September 1999. Bristol, UK: Institute of Physics Pub., 1999.

Erko, A. I. Diffraction X-ray optics. Philadelphia, PA: Institute of Physics Pub., 1996.

L, Chung Deborah D., ed. X-ray diffraction at elevated temperatures: A method for in situ process analysis. New York: VCH, 1993.

Zevin, Lev S. Quantitative X-Ray Diffractometry. New York, NY: Springer US, 1995.

International Conference on X-ray and Related Techniques in Research and Industry (2010 Langkawi Island, Kedah, Malaysia). X-ray and related techniques: Selected, peer reviewed papers from the International Conference on X-ray and Related Techniques in Research and Industry (IXCRI [sic] 2010) held at Langkawi Island, Malaysia from 9th to 10th of June 2010. Stafa-Zurich, Switzerland: Trans Tech Publications, 2011.

Two-dimensional X-ray diffraction. Hoboken, N.J: Wiley, 2009.

G, Michette Alan, and Buckley C. J. 1955-, eds. X-ray science and technology. Bristol: Institute of Physics Pub., 1993.

Gubicza, Jeno. X-ray line profile analysis in materials science. Hershey, PA: Engineering Science Reference, an imprint of IGI global, 2014.

Eric, Lifshin, ed. X-ray characterization of materials. Weinheim: Wiley-VCH, 1999.

Vavilov, S. P. Impulʹsnoe rentgenovskoe izluchenie v defektoskopii. Moskva: Ėnergoatomizdat, 1985.

Turcu, I. C. E. X-rays from laser plasmas: Generation and applications. Chichester: Wiley, 1999.

Attwood, David T. Soft x-rays and extreme ultraviolet radiation: Principles and applications. Cambridge: Cambridge University Press, 2000.

José, Baruchel, and Workshop on the Application of X-Ray Tomography in Material Science (1999 : Villeurbanne, France)., eds. X-ray tomography in material science. Paris: Hermes Science, 2000.

Barrett, Charles S. Advances in X-Ray Analysis: Volume 33. Boston, MA: Springer US, 1990.

XTRI-2003, (2003 Defence Metallurgical Research Laboratory Hyderabad India). Advanced x-ray techniques in research and industry. Amsterdam: IOS Press, 2005.

Kraus, Ivo. Rentgenová tenzometrie. Praha: Academia, 1988.

Bekrenev, A. N. Malouglovai͡a︡ rentgenografii͡a︡ deformat͡s︡ii i razrushenii͡a︡ materialov. Moskva: Izd-vo Moskovskogo universiteta, 1991.

X She xian shi jue zi dong jian ce ji shu ji ying yong. Beijing Shi: Guo fang gong ye chu ban she, 2012.

Sharma, Reena. Facility for testing and certification of medical X-Ray films at BARC. Mumbai: Bhabha Atomic Research Centre, 2006.

Kosenkov, V. M. Rentgenografii͡a︡ v reaktornom materialovedenii. Moskva: Ėnergoatomizdat, 1985.

Zevin, Lev S. Quantitative X-ray diffractometry. New York: Springer, 1995.

Kozlovskiĭ, V. N. Informat︠s︡ii︠a︡ v impulʹsnoĭ rentgenografii. Snez︠h︡insk: RFI︠A︡T︠S︡-VNIITF, 2006.

Senczyk, Dominik. Pomiary makronaprężeń metodami rentgenograficznymi w materiałach polikrystalicznych. Poznań: Wydawn. Politechniki Poznańskiej, 1988.

Maharaj, H. P. Requirements for the safe use of baggage X-ray inspection systems. Ottawa, Ont: Environmental Health Directorate, 1993.

A, Kyrala George, Gauthier Jean-Claude J, Society of Photo-optical Instrumentation Engineers., and SPIE Conference on X Rays Generated from Laser and Other Bright Sources (1997 : San Diego, Calif.), eds. Applications of X rays generated from lasers and other bright sources: 31 July-1 August 1997, San Diego, California. Bellingham, Wash., USA: SPIE, 1997.

Orest, Tatchyn Roman, Society of Photo-optical Instrumentation Engineers., and Conference on Ultrafast X-ray Detectors and Applications (2003 : San Diego, Calif.), eds. Fourth-generation x-ray sources and ultrafast x-ray detectors: 4 and 6 August 2003, San Diego, California, USA. Bellingham, Wash., USA: SPIE, 2004.

L, Engelstad Roxann, Society of Photo-optical Instrumentation Engineers., Semiconductor Equipment and Materials International., and International SEMATECH, eds. Emerging lithographic technologies VII: 25-27 February, 2003, Santa Clara, California, USA. Bellingham, Wash: SPIE, 2003.

Pająk, Lucjan. Nanostruktura wybranych porowatych materiałów badana metodą małokątowego rozpraszania promieni rentgenowskich (SAXS). Katowice: Wydawn. Uniwersytetu Śląskiego, 1998.

Barrett, Charles S. Advances in X-Ray Analysis: Volume 35B. Boston, MA: Springer US, 1992.

Gilfrich, John V. Advances in X-Ray Analysis: Volume 37. Boston, MA: Springer US, 1994.

International Congress on X-ray Optics and Microanalysis. (12th 1989 Cracow, Poland). 12th International Congress on X-ray Optics and Microanalysis: 28 Aug-1 Sept 1989 Cracow : 12 ICXOM. Cracow: Academy of Mining and Metallurgy, 1989.

Ultrafast x-ray sources and detectors. [S.l.]: Spie, 2007.

B, Hoover Richard, and Society of Photo-Optical Instrumentation Engineers., eds. X-ray detector physics and applications: 23-24 July 1992, San Diego, California. Bellingham, Wash., USA: SPIE, 1993.

J, Orphan V., and Society of Photo-optical Instrumentation Engineers., eds. X-ray detector physics and applications II: 13-14 July 1993, San Diego, California. Bellingham, Wash: SPIE, 1993.

Peter, Jackson, and Geir Anton Johansen. Radioisotope Gauges for Industrial Process Measurements. Wiley & Sons, Limited, John, 2005.

Peter, Jackson, and Geir Anton Johansen. Radioisotope Gauges for Industrial Process Measurements. Wiley & Sons, Incorporated, John, 2004.

Jackson, Peter, and Geir Anton Johansen. Radioisotope Gauges for Industrial Process Measurements (Measurement Science and Technology). Wiley, 2004.

U.S. Nuclear Regulatory Commission. Office of Nuclear Regulatory Research. Division of Regulatory Applications. and K.E.M.P. Corporation., eds. Large area self-powered gamma ray detector: Phase II development of a source position monitor for use on industrial radiographic units. Washington, DC: Division of Regulatory Applications, Office of Nuclear Regulatory Research, U.S. Nuclear Regulatory Commission, 1994.

Large area self-powered gamma ray detector: Phase II development of a source position monitor for use on industrial radiographic units. Washington, DC: Division of Regulatory Applications, Office of Nuclear Regulatory Research, U.S. Nuclear Regulatory Commission, 1994.

U.S. Nuclear Regulatory Commission. Office of Nuclear Regulatory Research. Division of Regulatory Applications. and K.E.M.P. Corporation., eds. Large area self-powered gamma ray detector: Phase II development of a source position monitor for use on industrial radiographic units. Washington, DC: Division of Regulatory Applications, Office of Nuclear Regulatory Research, U.S. Nuclear Regulatory Commission, 1994.

Sensors and their Applications X (Sensors Series). Taylor & Francis, 1999.

Industrial Applications of X-Ray Diffraction. CRC, 1999.

Smith, Frank. Industrial Applications of X-Ray Diffraction. Taylor & Francis Group, 1999.

Smith, Frank. Industrial Applications of X-Ray Diffraction. Taylor & Francis Group, 1999.

Smith, Frank. Industrial Applications of X-Ray Diffraction. Taylor & Francis Group, 1999.

X-Ray Imaging: Fundamentals, Industrial Techniques, and Applications. CRC, 2009.

Martz, Harry E., Clint M. Logan, Daniel J. Schneberk, and Peter J. Shull. X-Ray Imaging: Fundamentals, Industrial Techniques and Applications. Taylor & Francis Group, 2016.

Martz, Harry E., Clint M. Logan, Daniel J. Schneberk, and Peter J. Shull. X-Ray Imaging: Fundamentals, Industrial Techniques and Applications. Taylor & Francis Group, 2016.

Martz, Harry E., Clint M. Logan, Daniel J. Schneberk, and Peter J. Shull. X-Ray Imaging: Fundamentals, Industrial Techniques and Applications. Taylor & Francis Group, 2016.

Martz, Harry E., Clint M. Logan, Daniel J. Schneberk, and Peter J. Shull. X-Ray Imaging: Fundamentals, Industrial Techniques and Applications. Taylor & Francis Group, 2016.