Relevant bibliographies by topics / X-RAY SPECTROMETERS

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  1. Journal articles
  2. Dissertations / Theses
  3. Books
  4. Book chapters
  5. Conference papers
  6. Reports

Academic literature on the topic 'X-RAY SPECTROMETERS'

Author: Grafiati
Published: 4 June 2021
Last updated: 8 February 2022

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Journal articles on the topic "X-RAY SPECTROMETERS"

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Lund, Mark W. "More Than One Ever Wanted To Know About X-ray Detectors Part V: Wavelength - The "Other" Spectroscopy." Microscopy Today 3, no. 4 (May 1995): 8–9. http://dx.doi.org/10.1017/s1551929500063537.

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The use of x-ray spectrometry in electron microscopy has been a powerful market driver not only for electron microscopes but also for x-ray spectrometers. More x-ray spectrometers are sold with electron microscopes than in any other configuration. A general name for the combination is AEM, or analytical electron microscope, though in modern times AEM can include other instrumentation such as electron energy loss spectroscopy and visible light spectroscopy. In previous articies I have discussed energy dispersive spectrometers (EDS). These use semiconductor crystals to detect the x-rays and measure the energy deposited in the crystal. A second type of x-ray spectrometer measures the wavelength of the x-rays, and so is called "wavelength dispersive spectrometry" (WDS).
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Wittry, David B., and Nicholas C. Barbi. "X-ray Crystal Spectrometers and Monochromators in Microanalysis." Microscopy and Microanalysis 7, no. 2 (March 2001): 124–41. http://dx.doi.org/10.1007/s100050010080.

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Abstract Castaing’s successful implementation and application of the electron probe microanalyzer in 1950 stimulated a flurry of development activity around the world. The later versions of this instrument represented a truly international effort, with significant contributions by scientists from Europe, Asia, and North America. If the probe-forming system of the instrument was its heart, the X-ray wavelength spectrometer was its soul. This article reviews some of the history of spectrometer developments—lthrough the “golden years” of microprobe development, namely the dozen or so years following the publication of Castaing’s thesis, to the present. The basic physics of spectrometer and crystal design is reviewed. Early experimental devices, such as those developed by Castaing, Borovskii, Wittry, Duncumb, and Ogilvie are reported. Examples of commercial spectrometers such as those by ARL, MAC, Microspec, and Peak are described. Recent developments such as the combination of grazing-incidence optics with flat crystal spectrometers are noted, and the properties and uses of doubly curved crystals are discussed. Finally, the continued development of doubly curved crystal configurations, such as the “Wittry geometry” for scanning monochromators, and point-to-point focusing diffractors for producing small monochromatic X-ray probes to provide improved detection limits for microanalysis are considered.
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Lyman, C. E., D. B. Williams, and J. I. Goldstein. "X-ray detectors and spectrometers." Ultramicroscopy 28, no. 1-4 (April 1989): 137–49. http://dx.doi.org/10.1016/0304-3991(89)90286-6.

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Campbell, J. L. "X-ray spectrometers for PIXE." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 49, no. 1-4 (April 1990): 115–25. http://dx.doi.org/10.1016/0168-583x(90)90227-l.

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Wollman, D. A., G. C. Hilton, K. D. Irwin, L. L. Dulcie, Dale E. Newbury, and John M. Martinis. "High-Energy-Resolution Microcalorimeter Spectrometer for EDS X-ray Micro Analysis." Microscopy and Microanalysis 3, S2 (August 1997): 1073–74. http://dx.doi.org/10.1017/s1431927600012253.

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Si(Li) and Ge Energy Dispersive Spectroscopy (EDS) detectors are commonly used for x-ray microanalysis because they are easy to use, inexpensive to operate, and offer both rapid qualitative evaluation of chemical composition and accurate quantitative analysis. Unfortunately, they are limited by energy resolutions on the order of 100 eV, which is insufficient to resolve many important overlapping x-ray peaks in materials of industrial interest, such as the Si Kα and W Mα peak overlap in WSi2. Although WDS spectrometers with excellent energy resolution (typically 2 eV to 10 eV) can resolve most peak overlaps, qualitative WDS analysis is limited by the need to serially scan over the entire energy range using multiple diffraction crystals. There is a need for a new generation of x-ray spectrometers for microanalysis that combines the excellent energy resolution of WDS spectrometers with the ease of use and the parallel energy detection capability of EDS spectrometers.We are developing a high-energy-resolution x-ray microcalorimeter spectrometer for use in x-ray microanalysis. Our microcalorimeter spectrometer consists of a superconducting transition-edge microcalorimeter cooled to an operating temperature of 100 mK by a compact adiabatic demagnetization refrigerator mounted on a SEM column, read-out SQUID (Superconducting Quantum Interference Device) electronics followed by pulse-shaping amplifiers and pile-up rejection circuitry, and a multichannel analyzer with real-time computer interface.
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Hayakawa, Shinjiro, Shunji Goto, Takashi Shoji, Eiji Yamada, and Yohichi Gohshi. "X-ray microprobe system for XRF analysis and spectroscopy at SPring-8 BL39XU." Journal of Synchrotron Radiation 5, no. 3 (May 1, 1998): 1114–16. http://dx.doi.org/10.1107/s090904959701892x.

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An X-ray microprobe system for X-ray fluorescence (XRF) analysis and spectroscopy has been developed at SPring-8 BL39XU; it comprises an X-ray focusing or collimation system, energy-dispersive (ED) and wavelength-dispersive (WD) XRF spectrometers, and a sample-scanning system. The conventional ED spectrometer will be utilized for qualitative and quantitative trace-element analysis, and the WD spectrometer will be used both for trace-element analysis and XRF spectroscopy. A combination of monochromated undulator radiation and the WD spectrometer will enable resonant XRF spectroscopy using brilliant hard X-ray undulator radiation.
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Segall, K., C. M. Wilson, L. Li, A. K. Davies, R. Lathrop, M. C. Gaidis, D. E. Prober, A. E. Szymkowiak, and S. H. Moseley. "Single photon imaging X-ray spectrometers." IEEE Transactions on Appiled Superconductivity 9, no. 2 (June 1999): 3326–29. http://dx.doi.org/10.1109/77.783741.

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Strüder, L. "High-resolution imaging X-ray spectrometers." Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 454, no. 1 (November 2000): 73–113. http://dx.doi.org/10.1016/s0168-9002(00)00811-1.

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Ascone, Isabella, Wolfram Meyer-Klaucke, and Loretta Murphy. "Experimental aspects of biological X-ray absorption spectroscopy." Journal of Synchrotron Radiation 10, no. 1 (December 24, 2002): 16–22. http://dx.doi.org/10.1107/s0909049502022598.

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Spectroscopic techniques, like X-ray absorption spectroscopy, will provide important input for integrated biological projects in genomics and proteomics. This contribution summarizes technical requirements and typical set-ups for both simple and complex biological XAS experiments. An overview on different strategies for sample preparation is discussed in detail. Present and future BioXAS spectrometers are presented to help potential users in locating the spectrometer required for their biological application.
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Lane, David W., Antony Nyombi, and James Shackel. "Energy-dispersive X-ray diffraction mapping on a benchtop X-ray fluorescence system." Journal of Applied Crystallography 47, no. 2 (February 22, 2014): 488–94. http://dx.doi.org/10.1107/s1600576714000314.

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A method for energy-dispersive X-ray diffraction mapping is presented, using a conventional low-power benchtop X-ray fluorescence spectrometer, the Seiko Instruments SEA6000VX. Hyper spectral X-ray maps with a 10 µm step size were collected from polished metal surfaces, sectioned Bi, Pb and steel shot gun pellets. Candidate diffraction lines were identified by eliminating those that matched a characteristic line for an element and those predicted for escape peaks, sum peaks, and Rayleigh and Compton scattered primary X-rays. The maps showed that the crystallites in the Bi pellet were larger than those observed in the Pb and steel pellets. The application of benchtop spectrometers to energy-dispersive X-ray diffraction mapping is discussed, and the capability for lower atomic number and lower-symmetry materials is briefly explored using multi-crystalline Si and polycrystalline sucrose.
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Dissertations / Theses on the topic "X-RAY SPECTROMETERS"

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Carpenter, Matthew Hollis. "Superconducting X-ray Spectrometers for High-Resolution Synchrotron XAS." Thesis, University of California, Davis, 2015. http://pqdtopen.proquest.com/#viewpdf?dispub=3706565.

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X-ray absorption spectroscopy (XAS) is a powerful technique to determine the structure and function of molecules. It provides element-specific information on geometry, chemical bonding, oxidation state, and spin state, and its applications range from biology to material science. For dilute samples, XAS is measured by partial fluorescence yield (PFY), where the intensity of a weak fluorescence line is recorded as a measure of absorption as the energy of the incident x-ray beam is scanned across an absorption edge of the element of interest. PFY increases the sensitivity for XAS if an x-ray detector is used that can efficiently separate the small fluorescence signal of interest from the x-ray background due to other elements in the sample.

This dissertation describes the development of a high-resolution x-ray detector based on arrays of superconducting tunnel junctions (STJs). It is cooled to its operating temperature below 0.3 K with a liquid-cryogen-free adiabatic demagnetization refrigerator cryostat, and offers more than an order of magnitude improvement in energy resolution over conventional Ge- or Si-based solid state detectors. For operation in XAS experiments at a synchrotron, the STJ detector array is held at the end of a cold finger that can be inserted into an ultra-high vacuum endstation. This dissertation describes the design and performance of the STJ x-ray spectrometer, and demonstrates its use in PFY-XAS experiments in metallo-organic compounds at the Advanced Light Source synchrotron.

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Varney, Andrew John. "Development of x-ray spectrometers and x-ray spectroscopy for the Oxford electron beam ion trap." Thesis, University of Oxford, 1995. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.282196.

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Song, Jungki. "Metrology and mechanics for manufacturing space-based x-ray grating spectrometers." Thesis, Massachusetts Institute of Technology, 2021. https://hdl.handle.net/1721.1/130846.

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Thesis: Ph. D., Massachusetts Institute of Technology, Department of Mechanical Engineering, February, 2021
Cataloged from the official PDF of thesis.
Includes bibliographical references (pages 223-231).
Small errors in critical dimensions (CDs) or deformation of optical components can lead to severe performance degradation in high-resolution imaging and spectroscopy tools. Consistent innovations towards more precise optical elements and assembly procedures have led to high-resolution optical systems in many fields - including telescope, microscopy, lithography, and display technologies. A space x-ray telescope needs more stringent requirements as it observes distant space objects using a limited number of x-ray photons in a harsh space environment. The optical instruments for x-ray telescopes need to be high-resolution, efficient in collecting x-ray photons, and lightweight. Optical elements in x-ray telescopes have large-apertures (typically around 1-2 m²) which are realized by populating them with > 1000 high-quality optical sub-elements (i.e., mirrors or gratings).
In this thesis, we limit our attention to an xray grating spectrometer, one of the essential elements in x-ray telescopes. It is placed downstream of the focusing optics and prior to the x-ray detector to disperse nonmonochromatic x rays from distant sources for space-based x-ray spectroscopy. A critical-angle transmission (CAT) grating, a lightweight, freestanding, high-aspect ratio x-ray grating with 200-nm period and 4 [mu]m depth, is a building block for grating spectrometers. More than 1000 high-quality CAT gratings need to be manufactured and precisely aligned within tolerance to build future CAT grating spectrometers. This thesis attacks this manufacturing challenge through 1) inventing metrologies for characterizing CDs, 2) developing alignment processes, and 3) performing design and analysis of CAT grating structural supports. First, a metrology to characterize period variation of CAT gratings was developed.
Metrology repeatability of 0.004 nm rms was achieved, successfully characterizing period variations of 0.018 nm rms (1 sigma) over large-area CAT gratings patterned with traditional interference lithography. The demonstrated metrology uncertainty and period variations fulfill the requirements for future x-ray telescope missions. Second, alignment metrology and protocols were developed, demonstrating an ability to align multiple CAT gratings to satisfy alignment requirements ( <6 arcmin or 0.1 deg). The developed alignment protocol is reliable and scalable for flight-level alignment, for which a large volume (>1000) of CAT gratings need to be aligned in a fast and accurate manner. Third, a metrology to characterize grating bar tilt variations was developed using small-angle x-ray scattering and a laser setup. The developed metrology demonstrated repeatability of <0.01 deg (1 [sigma]) and accuracy of ~0.08 deg (4.8 arcmin).
It successfully characterized bar tilt angle variations from CAT gratings and results agree well with synchrotron measurements. It enabled us to close the loop in process optimization for CAT grating fabrication, and contributed towards suppressing bar tilt (or blaze) error within tolerance ( <6 arcmin or 0.1 deg). Fourth, analytical and finite element studies were performed to design CAT grating structural supports that minimize x-ray blockage at a given stiffness. In-plane and out-of-plane stiffness of several 2D-lattice topologies were examined. A triangular lattice shows 23-580% on stiffness improvement ( depending on mode of stiffness) over the current hexagonal lattice design for the same open area fraction. Adopting the new 2D lattice design is expected to increase open area fraction by ~5% without compromising stiffness.
by Jungki Song.
Ph. D.
Ph.D. Massachusetts Institute of Technology, Department of Mechanical Engineering
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Hall, David. "Exploring the impact of detection physics in X-ray CCD imagers and spectrometers." Thesis, Open University, 2010. http://oro.open.ac.uk/55088/.

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This thesis is concerned with exploring the way in which the physics of the detection process affects the quality of a CCD-based X-ray detector system. The physical processes which lead to the final images and spectra achieved with a CCD-based camera system are investigated through a combination of simulations and experimental techniques with the aim of improving the detector performance and allowing future detectors to be designed with optimal characteristics. Techniques developed throughout the study and the results of the simulations have wide-ranging impacts on the areas concerned. The study is split into two main sections, the first regarding a high-resolution, high-energy, photon-counting X/γ-ray camera. In medical imaging, X-rays and gamma-rays are often used for the purposes of diagnostic imaging. In many synchrotron based research programmes, such as protein crystallography and X-ray diffraction imaging, X-rays are used, once again, for imaging purposes. In both cases, a high-resolution detector with a high frame-rate is required such that images can be taken with a spatial resolution of the order of micrometers to tens of micrometers. If one is able to distinguish the energy of the incident X-rays and gamma-rays (with energies of 20-200 keV) then these spectral capabilities add to the functionality of the detector, allowing, for example, the removal of fluorescence X-rays. Chapter 2 reviews the relevant detector physics and theory before providing a critical review of current gammacameras. Chapter 3 outlines the feasibility study for the scintillator-coupled EM-CCD detailing the development of a new energy discrimination methodology. Also described is the development of a full system simulation which can be used to troubleshoot problems found when calibrating and optimising the device. Chapter 4 details the characterisation and optimisation of the detector making use of the aforementioned simulations where appropriate. Chapter 5 presents the results of the study, showing how the resolution can be dramatically improved and how energy discrimination can be implemented. The second section of the thesis regards instrument background. The use of CCDs for space borne X-ray detection in scientific satellites is wide-spread. Whilst in-orbit the CCDs are subjected to an incident flux of high energy particles. These particles may be detected, both as the primaries themselves and by means of secondaries produced in the detector shielding, and will produce a background level formed by components indistinguishable from the X-rays for which the mission was designed to detect. Chapter 6 presents an introduction to the theory behind the instrument background experienced by CCD-based detector systems in orbit. A simulation has been developed which is in very good agreement with data received from the spacecrafts, described in Chapter 7. Finally, Chapter 8 summarises the outcomes of these studies and provides insight into future work which will further aid the improvement of gamma-cameras for medical imaging and synchrotron-based research and will allow future CCD-based camera systems to be designed for increased sensitivity in-orbit.
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Tarbutt, Michael Roy. "Spectroscopy of few-electron highly charged ions." Thesis, University of Oxford, 2000. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.365339.

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RABELO, NETO JOSE da S. "Hidroxiapatita sintetica nanoestruturada e esmalte dental aquecidos e irradiados por laser de Er, Cr:YSGG. Caracterizacao por FTIR e por DRX." reponame:Repositório Institucional do IPEN, 2009. http://repositorio.ipen.br:8080/xmlui/handle/123456789/9402.

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Dissertacao (Mestrado)
IPEN/D
Instituto de Pesquisas Energeticas e Nucleares - IPEN-CNEN/SP
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FERREIRA, JUNIOR OSCAR L. "Processos de separação de materiais metálicos e não metálicos na reciclagem de resíduos de placas de circuito impresso de microcomputadores." reponame:Repositório Institucional do IPEN, 2013. http://repositorio.ipen.br:8080/xmlui/handle/123456789/10543.

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IPEN/D
Instituto de Pesquisas Energeticas e Nucleares - IPEN-CNEN/SP
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TEIXEIRA, BRUNA S. "Características de amidos processados pela radiação ionizante." reponame:Repositório Institucional do IPEN, 2016. http://repositorio.ipen.br:8080/xmlui/handle/123456789/26795.

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O amido é um polissacarídeo produzido pelos vegetais para reserva de energia e está disponível em abundância na natureza. Os amidos são preparados a partir de diferentes matérias primas, tais como trigo, cevada, milho, arroz, batata, batata doce ou mandioca. Na dieta humana o amido é utilizado como fonte de energia biológica. Na indústria de alimentos, o amido é utilizado para alterar ou controlar diversas características, como textura, aparência, umidade, consistência e estabilidade. Entretanto, há uma contínua procura por novas tecnologias para o desenvolvimento de novas propriedades funcionais para melhor adequação às necessidades do mercado. A radiação ionizante pode ser aplicada na modificação de macromoléculas como a do amido. O presente trabalho teve como objetivo estudar as características de amidos de batata, milho e mandioca (polvilho azedo) tratados com radiação ionizante e os correspondentes filmes comestíveis preparados com eles. Os amidos em pó foram submetidos à radiação em fonte de 60Co Gammacell 220 com doses de 0, 1, 5, 10 e 15 kGy, taxa de dose em torno de 1 kGy h-1. Para o estudo dos amidos foram empregadas técnicas de microscopia, análises térmicas, espectroscopia no infravermelho, difração de raios-X e viscosimetria. Para os filmes foram avaliadas propriedades mecânicas, análise instrumental da cor, capacidade de absorção e índice de solubilidade. Constatou-se que a radiação não influenciou a morfologia dos grânulos, a termogravimetria e o padrão de difração de raios-X. A viscosidade dos hidrogéis dos amidos diminuiu com o aumento da dose de radiação e estes apresentaram características de fluidos não-Newtonianos e pseudoplásticos. Na avaliação instrumental da cor dos filmes houve um ligeiro aumento no parâmetro b*(cor amarela). A força de ruptura dos filmes decresceu conforme aumento da dose de radiação aplicada dependendo do tipo de amido empregado na sua fabricação. A capacidade de absorção em água diminuiu e a solubilidade aumentou com a radiação.
Dissertação (Mestrado em Tecnologia Nuclear)
IPEN/D
Instituto de Pesquisas Energeticas e Nucleares - IPEN-CNEN/SP
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PEREIRA, VIVIANE S. "Preparação de suportes de carbono dopados com Nitrogênio (N), Enxofre (S) e Fósforo (P) para aplicação na oxidação eletroquímica do metanol." reponame:Repositório Institucional do IPEN, 2016. http://repositorio.ipen.br:8080/xmlui/handle/123456789/26828.

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Neste trabalho o carbono comercial Vulcan XC72 foi modificado com heteroátomos de N, S e P por meio do tratamento térmico a 800 °C com ureia, ácido sulfúrico e ácido fosfórico, respectivamente. Os carbonos modificados foram utilizados na preparação de eletrocatalisadores Pt/C e PtRu/C e aplicados na oxidação eletroquímica do metanol. Os materiais obtidos foram caracterizados por espectroscopia dispersiva de raios X, difração de raios X, espectroscopia Raman, microscopia eletrônica de transmissão e voltametria cíclica. A oxidação eletroquímica do metanol foi estudada por voltametria cíclica e cronoamperometria. Os espectros Raman mostraram que as razões de intensidades das bandas D e G dos suportes de carbono modificados com heteroátomos foram maiores que a observada para o carbono Vulcan XC72 sugerindo a incorporação na estrutura do carbono. As análises por difração de raios X mostraram para todos os eletrocatalisadores Pt/C a estrutura cúbica de face centrada (cfc) e as micrografias eletrônicas de transmissão que todos materiais apresentaram tamanhos de partícula na faixa 4-5 nm. Para os eletrocatalisadores PtRu/C preparados com os suportes de carbono modificados com N e S, os difratogramas de raios-X apresentaram apenas a fase Pt (cfc) não havendo deslocamento dos picos desta fase. Nestes materiais os picos referentes a fases de Ru não foram identificados sugerindo que o Ru apresenta-se como uma fase amorfa. Por outro lado, para o material modificado com P, observou-se um deslocamento dos picos da fase Pt(cfc) para ângulos maiores, sugerindo a formação de liga Pt-Ru e também foi observado a presença da fase Ru hexagonal compacta. Os eletrocatalisadores Pt/C e PtRu/C preparados com os suportes contendo heteroátomos apresentaram uma melhora significativa na atividade eletrocatalítica quando comparados aos materiais preparados com o suporte não modificado. A melhora na atividade pode estar relacionada a modificações na interação metal-suporte, bem como, as diferentes espécies Pt e Ru presentes no caso do eletrocatalisador PtRu/C preparado utilizando o suporte modificado com P.
Dissertação (Mestrado em Tecnologia Nuclear)
IPEN/D
Instituto de Pesquisas Energeticas e Nucleares - IPEN-CNEN/SP
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SANTORO, THAIS A. de B. "Preparacao e caracterizacao de eletrocatalisadores Pt-terras raras/C para celulas a combustivel do tipo PEMFC." reponame:Repositório Institucional do IPEN, 2009. http://repositorio.ipen.br:8080/xmlui/handle/123456789/9411.

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Tese (Doutoramento)
IPEN/T
Instituto de Pesquisas Energeticas e Nucleares - IPEN-CNEN/SP
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Books on the topic "X-RAY SPECTROMETERS"

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Hewitt, Alan D. Rapid screening of metals using portable high-resolution X-ray fluorescence spectrometers. [Hanover, N.H.]: US Army Corps of Engineers, Cold Regions Research & Engineering Laboratory, 1995.

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Starr, Richard. Annual report for Catholic University co-operative agreement NCC-5-83, 1 April 1997 through 31 March 1998. [Washington, DC: National Aeronautics and Space Administration, 1998.

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Elvis, Martin. The evolution of the quasar continuum: NASA grant NAGW-2201, semiannal report nos. 1, 2, and 3 for the period 1 July 1990 through 31 December 1991. Cambridge, Mass: Smithsonian Institution, Astrophysical Observatory, 1992.

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Elvis, Martin. The evolution of the quasar continuum: NASA grant NAGW-2201, semiannal report nos. 1, 2, and 3 for the period 1 July 1990 through 31 December 1991. Cambridge, Mass: Smithsonian Institution, Astrophysical Observatory, 1992.

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Jenkins, Ron. Quantitative x-ray spectrometry. 2nd ed. New York: M. Dekker, 1995.

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Jenkins, Ron. X-ray fluorescence spectrometry. 2nd ed. New York: Wiley, 1999.

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X-ray fluorescence spectrometry. New York: J. Wiley, 1988.

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Fontenla, Juan M. UVSP & complimentary data anal. & modeling: Final report. [Washington, DC: National Aeronautics and Space Administration, 1994.

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Potts, Philip J., and Margaret West, eds. Portable X-ray Fluorescence Spectrometry. Cambridge: Royal Society of Chemistry, 2008. http://dx.doi.org/10.1039/9781847558640.

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Jenkins, Ronald. An introduction to X-ray spectrometry. Chichester: Wiley, 1986.

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Book chapters on the topic "X-RAY SPECTROMETERS"

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Haschke, Michael. "Main Components of X-ray Spectrometers." In Laboratory Micro-X-Ray Fluorescence Spectroscopy, 19–118. Cham: Springer International Publishing, 2014. http://dx.doi.org/10.1007/978-3-319-04864-2_2.

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Dubrawski, Jules V., and Ken E. Turner. "Variability of Crystal Performance in X-Ray Fluorescence Spectrometers." In Advances in X-Ray Analysis, 981–85. Boston, MA: Springer US, 1992. http://dx.doi.org/10.1007/978-1-4615-3460-0_35.

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Arai, Tomoya, Takashi Shoji, and Richard W. Ryon. "Wavelength Dispersing Devices for Soft and Ultrasoft X-Ray Spectrometers." In Advances in X-Ray Analysis, 137–44. Boston, MA: Springer US, 1985. http://dx.doi.org/10.1007/978-1-4613-2471-3_21.

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Croke, John F., and Joseph A. Nicolosi. "Comparison of Dual-Channel Wavelength and Secondary-Target Energy-Dispersive X-Ray Spectrometers." In Advances in X-Ray Analysis, 225–36. Boston, MA: Springer US, 1987. http://dx.doi.org/10.1007/978-1-4613-1935-1_26.

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Price, B. J., J. Padur, and N. S. Robson. "A Review of the Relative Merits of Low Powered WDXRF and EDXRF Spectrometers for Routine Quantitative Analysis." In Advances in X-Ray Analysis, 193–99. Boston, MA: Springer US, 1991. http://dx.doi.org/10.1007/978-1-4615-3744-1_20.

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Kolesnikov, A. O., A. A. Kuzin, D. V. Negrov, E. N. Ragozin, P. V. Sasorov, A. N. Shatokhin, and E. A. Vishnyakov. "Broadband High-Resolution Imaging Spectrometers for the Soft X-Ray Range." In Springer Proceedings in Physics, 389–93. Cham: Springer International Publishing, 2018. http://dx.doi.org/10.1007/978-3-319-73025-7_58.

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Baron, Alfred Q. R. "High-Resolution Inelastic X-Ray Scattering I: Context, Spectrometers, Samples, and Superconductors." In Synchrotron Light Sources and Free-Electron Lasers, 2131–212. Cham: Springer International Publishing, 2020. http://dx.doi.org/10.1007/978-3-030-23201-6_41.

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Baron, Alfred Q. R. "High-Resolution Inelastic X-Ray Scattering I: Context, Spectrometers, Samples, and Superconductors." In Synchrotron Light Sources and Free-Electron Lasers, 1643–719. Cham: Springer International Publishing, 2016. http://dx.doi.org/10.1007/978-3-319-14394-1_41.

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Baron, Alfred Q. R. "High-Resolution Inelastic X-Ray Scattering I: Context, Spectrometers, Samples, and Superconductors." In Synchrotron Light Sources and Free-Electron Lasers, 1–68. Cham: Springer International Publishing, 2015. http://dx.doi.org/10.1007/978-3-319-04507-8_41-1.

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Baron, Alfred Q. R. "High-Resolution Inelastic X-Ray Scattering I: Context, Spectrometers, Samples, and Superconductors." In Synchrotron Light Sources and Free-Electron Lasers, 1–82. Cham: Springer International Publishing, 2019. http://dx.doi.org/10.1007/978-3-319-04507-8_41-2.

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Conference papers on the topic "X-RAY SPECTROMETERS"

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Kenter, Almus, Ralph Kraft, Thomas Gauron, and Stephen S. Murray. "Monolithic CMOS imaging x-ray spectrometers." In SPIE Astronomical Telescopes + Instrumentation, edited by Andrew D. Holland and James Beletic. SPIE, 2014. http://dx.doi.org/10.1117/12.2054656.

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Novikov, Alexander S., Sergey E. Ulin, Valery Dmitrenko, Irina Chernysheva, Victor Grachev, Kira Krivova, Alexander Shustov, Ziyaetdin Uteshev, and Konstantin Vlasik. "Xenon gamma-ray spectrometers: development and applications." In Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XXI, edited by Arnold Burger, Ralph B. James, and Stephen A. Payne. SPIE, 2019. http://dx.doi.org/10.1117/12.2528753.

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Swanberg, Erik L., Zachary M. Seeley, Patrick R. Beck, Brian Wihl, Nerine J. Cherepy, Stephen A. Payne, Steven L. Hunter, et al. "Recent advances in garnet scintillator gamma spectrometers (Conference Presentation)." In Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XIX, edited by Michael Fiederle, Arnold Burger, Larry Franks, Ralph B. James, and Stephen A. Payne. SPIE, 2017. http://dx.doi.org/10.1117/12.2276517.

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Rehak, Pavel, Gianluigi De Geronimo, Kim Ackley, Gabriella Carini, Wei Chen, Jack Fried, Jeffrey Keister, et al. "ASIC for SDD-based X-ray spectrometers." In 2009 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC 2009). IEEE, 2009. http://dx.doi.org/10.1109/nssmic.2009.5402415.

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Rando, Nicola, Anthony J. Peacock, Clare L. Foden, Axel van Dordrecht, Ralph Engelhardt, John M. Lumley, and Carl Pereira. "Nb tunnel junctions as x-ray spectrometers." In San Diego, '91, San Diego, CA, edited by Oswald H. W. Siegmund and Richard E. Rothschild. SPIE, 1991. http://dx.doi.org/10.1117/12.48352.

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Strueder, Lothar, Gunther Hasinger, Johannes Kollmer, Norbert Krause, Norbert Meidinger, Joachim E. Truemper, Robert Hartmann, et al. "Imaging spectrometers for future x-ray missions." In International Symposium on Optical Science and Technology, edited by Kathryn A. Flanagan and Oswald H. W. Siegmund. SPIE, 2002. http://dx.doi.org/10.1117/12.454230.

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Kenter, Almus T., Thomas Gauron, and Ralph Kraft. "Monolithic CMOS detectors for use as x-ray imaging spectrometers." In Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XX, edited by Michael Fiederle, Arnold Burger, Ralph B. James, and Stephen A. Payne. SPIE, 2018. http://dx.doi.org/10.1117/12.2322175.

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Prettyman, Thomas H., Emmanuel Rowe, Jarrhett Butler, Michael Groza, Arnold Burger, Naoyuki Yamashita, James L. Lambert, et al. "Strontium iodide gamma ray spectrometers for planetary science (Conference Presentation)." In Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XVIII, edited by Michael Fiederle, Arnold Burger, Larry Franks, and Ralph B. James. SPIE, 2016. http://dx.doi.org/10.1117/12.2237919.

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Kenter, Almus T., Ralph P. Kraft, and Thomas M. Gauron. "Monolithic CMOS detectors for use as x-ray imaging spectrometers." In UV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XXI, edited by Oswald H. Siegmund. SPIE, 2019. http://dx.doi.org/10.1117/12.2530000.

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Rocchia, R., J. Y. Deachamps, L. Koch-Miramond, A. Tarrius, N. Coron, G. Artzner, G. Dambier, G. Jegoudez, and J. Leblanc. "Multiplex Coding Imaging Spectrometers For X-Ray Astronomy." In 1985 International Technical Symposium/Europe, edited by J. Leonard Culhane. SPIE, 1986. http://dx.doi.org/10.1117/12.966565.

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Reports on the topic "X-RAY SPECTROMETERS"

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Hermon, H., R. B. James, and E. Cross. Lead iodide X-ray and gamma-ray spectrometers for room and high temperature operation. Office of Scientific and Technical Information (OSTI), February 1997. http://dx.doi.org/10.2172/477612.

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Thorn, Daniel Bristol. Spectroscopic Investigations of Highly Charged Ions using X-Ray Calorimeter Spectrometers. Office of Scientific and Technical Information (OSTI), November 2008. http://dx.doi.org/10.2172/945508.

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McGregor, Douglas S., Elsa Ariesanti, and Bridget Corcoran. Horizontal Ampoule Growth and Characterization of Mercuric Iodide at Controlled Gas Pressures for X-Ray and Gamma Ray Spectrometers. Office of Scientific and Technical Information (OSTI), April 2004. http://dx.doi.org/10.2172/825722.

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Drury, Owen Byron. Development of High Resolution X-Ray spectrometers for the Investigation of Bioinorganic Chemistry in Metalloproteins. Office of Scientific and Technical Information (OSTI), January 2007. http://dx.doi.org/10.2172/957593.

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Kozimor, Stosh Anthony. New X-Ray Spectrometer Developed. Office of Scientific and Technical Information (OSTI), April 2019. http://dx.doi.org/10.2172/1508538.

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Southworth, S. H., R. D. Deslattes, M. A. MacDonald, and T. LeBrun. Electron-ion-x-ray spectrometer system. Office of Scientific and Technical Information (OSTI), October 1993. http://dx.doi.org/10.2172/10188662.

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Smith, Kevin E. High Resolution Soft X-Ray Fluorescence Spectrometer. Fort Belvoir, VA: Defense Technical Information Center, March 1997. http://dx.doi.org/10.21236/ada324710.

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M. Bitter, K. Hill, L. Roquemore, P. Beiersdorfer, D. Thorn, and Ming Feng Gu. Results from the NSTX X-ray Crystal Spectrometer. Office of Scientific and Technical Information (OSTI), January 2003. http://dx.doi.org/10.2172/809961.

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Espy, Michelle A., and Amanda E. Gehring. Measuring x-ray spectra with a Compton electron spectrometer. Office of Scientific and Technical Information (OSTI), January 2014. http://dx.doi.org/10.2172/1115546.

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Isaacson, C., L. Koppel, Robert H. Hamstra, Cirigliano Jr., and R. Digital Interface Modules for Active-Readout X-Ray Spectrometer. Fort Belvoir, VA: Defense Technical Information Center, March 1985. http://dx.doi.org/10.21236/ada183438.

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