Academic literature on the topic 'X-ray Raman scattering'
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Journal articles on the topic "X-ray Raman scattering"
Huotari, Simo. "X-ray Raman scattering spectroscopy." Acta Crystallographica Section A Foundations and Advances 70, a1 (August 5, 2014): C219. http://dx.doi.org/10.1107/s2053273314097800.
Full textGel'mukhanov, Faris, and Hans Ågren. "Resonant X-ray Raman scattering." Physics Reports 312, no. 3-6 (May 1999): 87–330. http://dx.doi.org/10.1016/s0370-1573(99)00003-4.
Full textGel’mukhanov, Faris, Paweł Sałek, Timofei Privalov, and Hans Ågren. "Duration of x-ray Raman scattering." Physical Review A 59, no. 1 (January 1, 1999): 380–89. http://dx.doi.org/10.1103/physreva.59.380.
Full textTohji, Kazuyuki, and Yasuo Udagawa. "Observation of X-ray Raman scattering." Physica B: Condensed Matter 158, no. 1-3 (June 1989): 550–52. http://dx.doi.org/10.1016/0921-4526(89)90384-0.
Full textHuotari, S., Ch J. Sahle, Ch Henriquet, A. Al-Zein, K. Martel, L. Simonelli, R. Verbeni, et al. "A large-solid-angle X-ray Raman scattering spectrometer at ID20 of the European Synchrotron Radiation Facility." Journal of Synchrotron Radiation 24, no. 2 (February 16, 2017): 521–30. http://dx.doi.org/10.1107/s1600577516020579.
Full textHarada, Y., H. Ishii, M. Fujisawa, Y. Tezuka, S. Shin, M. Watanabe, Y. Kitajima, and A. Yagishita. "Spectrometer for polarized soft X-ray Raman scattering." Journal of Synchrotron Radiation 5, no. 3 (May 1, 1998): 1013–15. http://dx.doi.org/10.1107/s0909049597019481.
Full textSałek, P., A. Baev, F. Gel'mukhanov, and H. Ågren. "Dynamical properties of X-ray Raman scattering." Phys. Chem. Chem. Phys. 5, no. 1 (2003): 1–11. http://dx.doi.org/10.1039/b209717f.
Full textGel’mukhanov, Faris, Paweł Sałek, Anatoly Shalagin, and Hans Ågren. "X-ray Raman scattering under pulsed excitation." Journal of Chemical Physics 112, no. 13 (April 2000): 5593–603. http://dx.doi.org/10.1063/1.481134.
Full textKrisch, M. H., F. Sette, C. Masciovecchio, and R. Verbeni. "X-ray resonant Raman scattering from Gd3Fe5O12." Journal of Electron Spectroscopy and Related Phenomena 86, no. 1-3 (August 1997): 159–64. http://dx.doi.org/10.1016/s0368-2048(97)00062-5.
Full textGel'mukhanov, F. K., and H. Ågren. "Nuclear dynamics in X-ray Raman scattering." Applied Physics A: Materials Science & Processing 65, no. 2 (August 1, 1997): 123–30. http://dx.doi.org/10.1007/s003390050553.
Full textDissertations / Theses on the topic "X-ray Raman scattering"
Sun, Yu-Ping. "Spontaneous and stimulated X-ray Raman scattering." Doctoral thesis, KTH, Teoretisk kemi (stängd 20110512), 2011. http://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-32859.
Full textQC 20110426
Minkov, Ivaylo. "Nuclear Dynamics in X-ray Absorption and Raman Scattering." Doctoral thesis, Stockholm : Theoretical Chemistry, Royal Institute of Technology, 2006. http://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-3902.
Full textFeng, Yejun. "Exciton spectroscopy using non-resonant x-ray Raman scattering /." Thesis, Connect to this title online; UW restricted, 2003. http://hdl.handle.net/1773/9642.
Full textBassi, Andrea Li. "X-ray and light scattering from nanostructured thin films." Thesis, Durham University, 2000. http://etheses.dur.ac.uk/4631/.
Full textPrivalov, Timofei. "Electronic and nuclear dynamics of X-ray processes." Doctoral thesis, Stockholm : Tekniska högsk, 2001. http://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-3189.
Full textAlexandre, Thais Levatti. "Espectrometria de raios-X aliada a quimiometria no estudo de vegetais." [s.n.], 2006. http://repositorio.unicamp.br/jspui/handle/REPOSIP/248802.
Full textTese (doutorado) - Universidade Estadual de Campinas, Instituto de Quimica
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Resumo: O uso da região de espalhamento na espectrometria de raios-X (XRS, do inglês, X-Ray Spectrometry) aliada à quimiometria é uma aplicação recente que tem mostrado bons resultados na discriminação de amostras orgânicas. Nesse trabalho, a proposta de se utilizar XRS para solucionar um problema de classificação taxonômica de Lantana sp, utilizando-se folhas desse vegetal não foi alcançada devido à reconhecida evolução contínua desta espécie. No entanto, o estudo de espécies do gênero Musa e das famílias Polemoniaceae, Asteraceae e Portulacaceae, utilizando-se pseudofrutos e sementes, respectivamente foi bem sucedido. A análise de componentes principais (PCA) realizada com os espectros obtidos da irradiação dos pseudofrutos e das sementes mostrou boa correlação entre a disposição das amostras e a classificação nos níveis gênero, espécies e variedades. Variáveis que poderiam justificar a discriminação obtida desses vegetais foram estudadas como exemplo o estudo envolvendo a utilização de carboidratos. Foram realizadas: a regressão de sacarose, frutose e glicose em solução aquosa e frutose e glicose em suco, com bons coeficientes de linearidade (0,998; 0,995; 0,998; 0,994 e 0,991, respectivamente); a discriminação de carboidratos; a regressão do índice de doçura e a rotação específica da luz polarizada de carboidratos; e a regressão da inversão da sacarose. Além da discriminação dos vegetais e do estudo de carboidratos, esse trabalho também apresenta a fundamentação teórica para explicar o surgimento desta técnica e um provável potencial que ela poderá apresenta para o futuro
Abstract: The use of scattering on X-ray Spectrometry (XRS) allied to chemometrics is a new application that is showing good results in discrimination of organics. In the present work the proposal of applying XRS to solve the taxonomic classification of Lantana sp species, using leafs of these plants was not reached due to the evolution process this plant is still undergoing. Nevertheless, this motivated a discrimination study of species of Musa genus (banana) and species of Polemoniaceae, Portulacaceae and Asteraceae families, using fruits and seeds, respectively. Principal component analysis of spectra of fruits and seeds show good correlation between sample arrangement and taxonomic classification in genus, species and varieties. Looking for variables that could justify the discriminations obtained, studies were developed involving carbohydrates. It was realized: sucrose, fructose and glucose regression in aqueous solutions and fructose and glucose calibration in juice solutions with good linear coefficients (0.998; 0.995; 0.998; 0.994 e 0.991, respectively); carbohydrates discrimination; X-ray spectra correlation with sweetness degrees and specific rotation of polarized light of carbohydrates; and regression of kinetics of sucrose inversion. Besides the vegetable classifications and the carbohydrate studies, this work presents a theorical basis to explain the XRS characteristics, the history before the arising of this method and its potentialities for the future
Doutorado
Quimica Analitica
Mestre em Química
Delhommaye, Steven. "Single-particle modelling of X-ray Absorption and X-ray Raman Scattering spectra : from the impact of vibrations on multipole transition channels to the implementation of L2,3 edges." Electronic Thesis or Diss., Sorbonne université, 2022. http://www.theses.fr/2022SORUS076.
Full textThis thesis work focuses on core level spectroscopies and their modelling by Quantum ESPRESSO, an open-source suite of codes. In particular this work focuses on X-Ray absorption spectroscopy (XAS), already well established, and X-Ray Raman Scattering (XRS), proving to be an increasingly popular alternative to XAS, for example under harsh experimental conditions. The first objective of this work was to study the impact of the thermal vibrations of nuclei on the multipole contributions available in XAS and XRS. Indeed, the QHA model used in this work to account for these vibration effects has been used to study light oxides before, but never to assess these effects on the secondary contribution channels of XAS (quadrupole) and XRS (monopole). The study relies on comparison between calculation and experimental data on two well-known reference compounds, rutile TiO2 and α-Al2O3. Moreover, a flaw of the QHA model when trying to reproduce subtle angular dependence signals was discovered and corrected using group theory. The second objective of the thesis was to implement calculation of XRS L2,3 edges in the XSpectra module of Quantum ESPRESSO. It was inspired by the previous implementations of XAS L2,3 edges and XRS K edges calculations in XSpectra. The monopole and dipole contributions were implemented up to the first order of the expansion of the XRS transition operator. It was tested by comparing calculation and measured data on various sulphur compounds. Good agreement with data could be produced, but was found very sensitive to the chosen core hole approximation
Fürsich, Katrin [Verfasser], and Bernhard [Akademischer Betreuer] Keimer. "X-ray and Raman scattering studies of novel phases in 3d and 4d transition metal oxides / Katrin Fürsich ; Betreuer: Bernhard Keimer." Stuttgart : Universitätsbibliothek der Universität Stuttgart, 2020. http://d-nb.info/1223928926/34.
Full textBizuti, Ariathemis Moreno. "Ordem local na transição a-Si:H - uc-Si." [s.n.], 2005. http://repositorio.unicamp.br/jspui/handle/REPOSIP/278123.
Full textDissertação (mestrado) - Universidade Estadual de Campinas, Instituto de Fisica Gleb Wataghin
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Resumo: Silício amorfo hidrogenado (a-Si:H) é um material amplamente usado na indústria microeletrônica. Ele é normalmente preparado a partir da decomposição do silano (SiH4). A diluição do silano em hidrogênio (H2) resulta em a-Si:H com propriedades eletrônicas superiores devido ao ataque químico preferencial às ligações mal-formadas. Níveis elevados de diluição resultam na formação de silício microcristalino (µc-Si). O objetivo deste trabalho é estudar o ordenamento da vizinhança química do silício através da transição a-Si:H ® µc-Si por espectroscopia de absorção de raios-X (XAS). Como a maior parte da desordem em a-Si:H manifesta-se na forma de variações nos ângulos de ligação, é necessário estudar o regime de espalhamento múltiplo (XANES), que corresponde às primeiras dezenas de energia (eV) acima da borda de absorção. Filmes finos de silício próximo à transição amorfo-microcristalino foram preparadas por HWCVD a partir de SiH4 diluido em H2. Nas condições utilizadas, a nucleação de µc-Si ocorre a partir de uma espessura crítica de aproximadamente 100 nm. Depositando-se amostras em forma de cunha é possível obter uma superfície de a-Si:H de um lado da amostra e de µc-Si do outro. Também foram investigadas amostras preparadas por PECVD em condições próximas à formação de pó no reator (chamadas de silício polimorfo, ou seja, entre amorfo e policristalino). Em princípio elas poderiam ter uma estrutura local mais ordenada
Abstract: Hydrogenated amorphous silicon (a-Si:H) is a material very used in the microelectronics industry. It is usually prepared starting from the decomposition of the silane (SiH4). Hydrogen dilution of the silane source gas is used to grow a-Si:H with superior electronics properties due to the preferential chemical attack to the bad formed bonding. High hydrogen levels induce the growth of microcrystalline silicon (µc-Si). The objective this work is study the order of the chemical neighborhood of the silicon through the transition a-Si:H ® µc-Si for x-ray-absorption Spectroscopy (XAS). As most of the disorder in the a-Si:H shows in the form of bonding angles variation, it is necessary to study the multiple scattering regime (XANES), that corresponds to the first dozens of energy (eV) above the absorption edge. Thin silicon films close the transition amorphous-microcrystalline was prepared for hot-wire chemical vapor deposition (HWCVD). For these conditions, the nucleation of the µc-Si oc-curs at a critical thickness of approximately 100 nm. Deposited the samples in the wedge form, it is possible to get a-Si:H surface in the one side and µc-Si in the other side. Also prepared samples were investigated for PECVD in close conditions to the powder formation in the reactor (calls of silicon polymorphous, a silicon sample between amorphous and polycrystalline) with the local order structure
Mestrado
Física da Matéria Condensada
Mestre em Física
Nyrow, Alexander [Verfasser], Metin [Akademischer Betreuer] Tolan, and Max [Gutachter] Wilke. "Iron containing compounds of the inner earth: X-ray Raman scattering from ambient to extreme conditions / Alexander Nyrow. Betreuer: Metin Tolan. Gutachter: Max Wilke." Dortmund : Universitätsbibliothek Dortmund, 2014. http://d-nb.info/1104947420/34.
Full textBooks on the topic "X-ray Raman scattering"
L, Ederer D., McGuire J. H. 1942-, and Raman Emission by X-rays Workshop (1995 : New Orleans, La.), eds. Raman emission by x-ray scattering: Proceedings of the workshop. Singapore: World Scientific, 1996.
Find full textBook chapters on the topic "X-ray Raman scattering"
Fister, Timothy T. "Nonresonant Inelastic X-ray Scattering and X-ray Raman Scattering." In XAFS Techniques for Catalysts, Nanomaterials, and Surfaces, 237–50. Cham: Springer International Publishing, 2016. http://dx.doi.org/10.1007/978-3-319-43866-5_17.
Full textRohringer, N., V. Kimberg, C. Weninger, A. Sanchez-Gonzalez, A. Lutman, T. Maxwell, C. Bostedt, et al. "Stimulated X-Ray Raman Scattering with Free-Electron Laser Sources." In Springer Proceedings in Physics, 201–7. Cham: Springer International Publishing, 2015. http://dx.doi.org/10.1007/978-3-319-19521-6_26.
Full textEdwards-Gayle, Charlotte J. C., and Jacek K. Wychowaniec. "Characterization of Peptide-Based Nanomaterials." In Peptide Bionanomaterials, 255–308. Cham: Springer International Publishing, 2023. http://dx.doi.org/10.1007/978-3-031-29360-3_8.
Full textTu, C. S., C. C. Huang, S. C. Lee, R. R. Chien, V. H. Schmidt, and J. Liang. "Phase Diagram of Proton-Conducting Ba(Zr0.8-xCexY0.2)O2.9 Ceramics by in Situ Micro-Raman Scattering and X-Ray Diffraction." In Advances in Solid Oxide Fuel Cells VI, 113–20. Hoboken, NJ, USA: John Wiley & Sons, Inc., 2010. http://dx.doi.org/10.1002/9780470943984.ch12.
Full textZhou, Yu, Hua Ke, De Chang Jia, W. Wang, and J. C. Rao. "X-Ray Diffraction and Raman Scattering Study of Sr1-xBi2+yTa2O9 Nanoparticles." In Materials Science Forum, 3539–42. Stafa: Trans Tech Publications Ltd., 2005. http://dx.doi.org/10.4028/0-87849-960-1.3539.
Full textSchülke, Winfried. "Nonresonant inelastic X-ray scattering: Regime of core-electron excitation (X-ray Raman scattering)." In Electron Dynamics by Inelastic X-ray Scattering, 186–236. Oxford University PressOxford, 2007. http://dx.doi.org/10.1093/oso/9780198510178.003.0003.
Full textSchülke, Winfried. "Resonant inelastic X-ray scattering (RIXS)." In Electron Dynamics by Inelastic X-ray Scattering, 377–485. Oxford University PressOxford, 2007. http://dx.doi.org/10.1093/oso/9780198510178.003.0005.
Full textCloizeaux, Jacques des, and Gerard Jannink. "Study of the Structure of a Solution by Small-Angle Scattering." In Polymers in Solution, 244–87. Oxford University PressOxford, 1991. http://dx.doi.org/10.1093/oso/9780198520368.003.0007.
Full textKrishnan, Kannan M. "Bonding and Spectra of Molecules and Solids." In Principles of Materials Characterization and Metrology, 147–219. Oxford University Press, 2021. http://dx.doi.org/10.1093/oso/9780198830252.003.0003.
Full textKenyon, Ian R. "Phonons." In Quantum 20/20, 55–74. Oxford University Press, 2019. http://dx.doi.org/10.1093/oso/9780198808350.003.0004.
Full textConference papers on the topic "X-ray Raman scattering"
Carra, Paolo. "X-ray resonant Raman scattering." In X-RAY AND INNER-SHELL PROCESSES: 18th International Conference. AIP, 2000. http://dx.doi.org/10.1063/1.1302759.
Full textEderer, D. L., and J. H. McGuire. "Raman Emission by X-Ray Scattering." In Proceedings of the Workshop. WORLD SCIENTIFIC, 1996. http://dx.doi.org/10.1142/9789814530620.
Full textHudis, E., P. L. Shkolnikov, and A. E. Kaplan. "X-Ray Stimulated Electronic Raman Scattering in Non-Ionized Gases." In Shortwavelength V: Physics with Intense Laser Pulses. Washington, D.C.: Optica Publishing Group, 1993. http://dx.doi.org/10.1364/swv.1993.xrlaxr235.
Full textAttenkofer, K. "Instrumentation for Time-Dependent X-Ray Resonant Raman Scattering." In SYNCHROTRON RADIATION INSTRUMENTATION: Eighth International Conference on Synchrotron Radiation Instrumentation. AIP, 2004. http://dx.doi.org/10.1063/1.1758000.
Full textSoininen, J. A., J. J. Rehr, A. Mattila, S. Galambosi, and K. Hämäläinen. "Recent Developments in the Analysis of X-Ray Raman Scattering." In X-RAY ABSORPTION FINE STRUCTURE - XAFS13: 13th International Conference. AIP, 2007. http://dx.doi.org/10.1063/1.2644441.
Full textAbbamonte, Peter, P. M. Champion, and L. D. Ziegler. "The Effective Fine Structure Constant of Graphene, Measured with Inelastic X-Ray Scattering." In XXII INTERNATIONAL CONFERENCE ON RAMAN SPECTROSCOPY. AIP, 2010. http://dx.doi.org/10.1063/1.3482300.
Full textGangrskaia, Elizaveta, Alessandra Bellissimo, Valentina Shumakova, Sarah Pulikottil Alex, Ignác Bugár, Lorenz Grünewald, Sebastian Mai, et al. "Spectrally Selective Excitation of Electric Dipole and Magnetic Dipole Transitions in Eu3+Y2O3 Nanostructures." In Compact EUV & X-ray Light Sources. Washington, D.C.: Optica Publishing Group, 2024. http://dx.doi.org/10.1364/euvxray.2024.jtu4a.3.
Full textVilleneuve, D. M., B. La Fontaine, H. A. Baldis, J. Dunn, G. D. Enright, M. D. Rosen, P. E. Young, and D. L. Matthews. "Temperature Determination in X-ray Laser Plasmas by Thomson Scattering." In Short Wavelength Coherent Radiation: Generation and Applications. Washington, D.C.: Optica Publishing Group, 1991. http://dx.doi.org/10.1364/swcr.1991.tud2.
Full textMackonis, Paulius, Augustinas Petrulėnas, Augustė Černeckytė, and Aleksej M. Rodin. "Amplification of Supercontinuum Seed Pulses at 1.1–1.4 m by Cascade Rotational SRS in Compressed Hydrogen." In Compact EUV & X-ray Light Sources. Washington, D.C.: Optica Publishing Group, 2024. http://dx.doi.org/10.1364/euvxray.2024.jtu4a.20.
Full textNazarkin, Alexander, I. Uschmann, E. Förster, and R. Sauerbrey. "High-order Raman scattering of X-rays by optical phonons and generation of ultrafast X-ray transients." In International Quantum Electronics Conference. Washington, D.C.: OSA, 2004. http://dx.doi.org/10.1364/iqec.2004.itun3.
Full textReports on the topic "X-ray Raman scattering"
Jia, J. J., T. A. Callcott, J. A. Carlisle, L. J. Terminello, A. Asfaw, D. L. Ederer, F. J. Himpsel, and R. C. C. Perera. X-ray Raman scattering in H-BN observed by soft x-ray fluorescence spectroscopy. Office of Scientific and Technical Information (OSTI), March 1995. http://dx.doi.org/10.2172/70794.
Full textReynolds, K. Testing of High-Resolution Si and Ge Analyzers for X-ray Emission Spectroscopy and X-ray Raman Scattering. Office of Scientific and Technical Information (OSTI), September 2004. http://dx.doi.org/10.2172/833118.
Full textZhou, L., T. A. Callcott, and J. J. Jia. Electronic Raman scattering with excitation between localized states observed in the zinc M{sub 2,3} soft x-ray spectra of ZnS. Office of Scientific and Technical Information (OSTI), April 1997. http://dx.doi.org/10.2172/603565.
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