Books on the topic 'X-ray diffraction analyses'

Marchandise, H. Characterisation of corundum (RM 300) and mullite (RM 301) as reference materials for X-ray diffraction analyses. Luxembourg: Commission of the European Communities, 1985.

Baltá-Calleja, F. J. X-ray scattering of synthetic polymers. Amsterdam: Elsevier, 1989.

Spindura, Jillian. Rapid X-ray analysis by X-ray powder diffraction. Manchester: UMIST, 1994.

Kaye, T. J. Rapid x-ray analysis by x-ray powder diffraction. Manchester: UMIST, 1993.

Goudeau, Philippe, and René Guinebretière. X-rays and materials. Hoboken, NJ: ISTE/Wiley, 2012.

Johansson, Sven A. E. PIXE: A novel technique for elemental analysis. Chichester: Wiley, 1988.

Ekosse, Georges-lvo E. X-ray powder diffraction patterns of clays and clay minerals in Botswana. Gaborone, Botswana: X-Ray Diffraction Unit, University of Botswana, 2005.

Snyder, R. L. Defect and microstructure analysis by diffraction. Oxford: Oxford University Press, 1999.

L, Chung Deborah D., ed. X-ray diffraction at elevated temperatures: A method for in situ process analysis. New York: VCH, 1993.

Arsenovic, Peter. Analysis of yttrium-barium-copper-oxide by x-ray diffraction and mechanical characterization. Greenbelt, Md: National Aeronautics and Space Administration, Goddard Space Flight Center, 1992.

Arsenovic, Peter. Analysis of yttrium-barium-copper-oxide by x-ray diffraction and mechanical characterization. Greenbelt, Md: National Aeronautics and Space Administration, Goddard Space Flight Center, 1992.

Arsenovic, Peter. Analysis of yttrium-barium-copper-oxide by x-ray diffraction and mechanical characterization. Greenbelt, Md: National Aeronautics and Space Administration, Goddard Space Flight Center, 1992.

E, Buhrke Victor, Jenkins Ron, and Smith, Deane K. (Deane Kingsley), eds. A practical guide for the preparation of specimens for x-ray fluorescence and x-ray diffraction analysis. New York: Wiley-VCH, 1998.

Ampian, Sarkis G. Crystalline silica overview: Occurrence and analysis. Washington, D.C: U.S. Dept. of the Interior, Bureau of Mines, 1992.

Sherwood, Dennis. Crystals, X-rays, and proteins: Comprehensive protein crystallography. New York: Oxford University Press, 2011.

Moore, Duane Milton. X-ray diffraction and the identification and analysis of clay minerals. 2nd ed. Oxford: Oxford University Press, 1997.

Moore, Duane Milton. X-ray diffraction and the identification and analysis of clay minerals. Oxford [England]: Oxford University Press, 1989.

B, Higgins John, Treacy M. M. J, and International Zeolite Association. Structure Commission., eds. Collection of simulated XRD powder patterns for zeolites. 4th ed. Amsterdam: Elsevier, 2001.

Treacy, M. M. J. Collection of simulated XRD powder patterns for zeolites. 3rd ed. New York: Elsevier, 1996.

C, Jackson John. An X-ray diffraction method for semiquantitative mineralogical analysis of Chilean nitrate ore. [Reston, Va.]: U.S. Dept. of the Interior, U.S. Geological Survey, 1994.

Jackson, John C. An X-ray diffraction method for semiquantitative mineralogical analysis of Chilean nitrate ore. [Reston, Va.]: U.S. Dept. of the Interior, U.S. Geological Survey, 1994.

C, Jackson John. An X-ray diffraction method for semiquantitative mineralogical analysis of Chilean nitrate ore. [Reston, Va.]: U.S. Dept. of the Interior, U.S. Geological Survey, 1994.

C, Jackson John. An X-ray diffraction method for semiquantitative mineralogical analysis of Chilean nitrate ore. [Reston, Va.]: U.S. Dept. of the Interior, U.S. Geological Survey, 1994.

Reynolds, R. C. Computer applications to X-ray powder diffraction analysis of clay minerals. Edited by Reynolds R. C, Walker J. R, and Clay Minerals Society. Boulder, Colo: Clay Minerals Society, 1993.

Reynolds, R. C., J. R. Walker, and R. E. Ferrell, eds. Computer Applications to X-Ray Powder Diffraction Analysis of Clay Minerals. Boulder, CO: Clay Minerals Society, 1993. http://dx.doi.org/10.1346/cms-wls-5.

Howells, M. R. A new treatment of focusing by varied-line-spacing gratings with application to the Peterson PGM system. Villigen: Paul Scherrer Institute, 1996.

Nakhmanson, M. S. Diagnostika sostava materialov rentgenodifrakt͡s︡ionnymi i spektralʹnymi metodami. Leningrad: "Mashinostroenie," Leningradskoe otd-nie, 1990.

1939-, Yang Chuanzheng, ed. Cai liao she xian yan she he san she fen xi: Cailiao shexian yanshe he sanshe fenxi = Analysis of materials by ray-diffration and scattering. Beijing Shi: Gao deng jiao yu chu ban she, 2010.

Satdarova, Faina. DIFFRACTION ANALYSIS OF DEFORMED METALS: Theory, Methods, Programs. xxu: Academus Publishing, 2019. http://dx.doi.org/10.31519/monography_1598.

Canada, Atomic Energy of. Method For Preventing the Rehydration of Heated Smectites During X-Ray Diffraction Analysis. S.l: s.n, 1988.

Dargel-Sulir, Lidia. Rentgenowskie badania stanu uporządkowania atomowego stopów podwójnych Mo[subscript x]Ni₁₀₀₋[subscript x]. Kraków: Akademia Górniczo-Hutnicza im. S. Staszica w Krakowie, 1986.

Eberhart, J. P. Structural and chemical analysis of materials: X-ray, electron and neutron diffraction; X-ray, electron and ion spectrometry; electron microscopy. Chichester, West Sussex, England: Wiley, 1991.

service), SpringerLink (Online, ed. Applications of synchrotron light to scattering and diffraction in materials and life sciences. Berlin: Springer, 2009.

Japan) Foton Fakutorī Kenkyūkai (2011 Tsukuba-shi. "GISAS-hō no tenkai" yōshishū: PF Kenkyūkai. Tsukuba-shi, Ibaraki-ken, Japan: High Energy Accelerator Research Organization, 2011.

Guest, Jodie. An evaluation of Standardless Rietveld Refinement for quantitative analysis of binary mixtures by X-Ray powder diffraction. Wolverhampton: University of Wolverhampton, 2000.

Barrett, Charles. Advances in X-Ray Analysis. Springer, 2013.

Barrett, Charles. Advances in X-Ray Analysis: Volume 15. Springer, 2012.

Fay, Marie, William M. Mueller, and Gavin Mallet. Advances in X-Ray Analysis: Volume 8. Springer, 2012.

Barrett, Charles. Advances in X-Ray Analysis: Volume 15. Springer London, Limited, 2013.

Newkirk, John B., and Gavin R. Mallett. Advances in X-Ray Analysis: Volume 10. Springer, 2012.

Mueller, William M. Advances in X-Ray Analysis: Proceedings of the Tenth Annual Conference on Application of X-Ray Analysis Held August 7-9, 1961. Springer, 2012.

Newkirk, John B., Gavin R. Mallett, and Heinz G. Pfeiffer. Advances in X-ray Analysis: Proceedings of the Sixteenth Annual Conference on Applications of X-Ray Analysis Held August 9–11, 1967 Volume 11. Springer, 2013.

Fay, Marie, William M. Mueller, and Gavin R. Mallett. Advances in X-Ray Analysis: Volume 7 Proceedings of the Twelfth Annual Conference on Applications of X-Ray Analysis Held August 7–9, 1963. Springer, 2013.

Mueller, William M. Advances in X-Ray Analysis: Volume 4 Proceedings of the Ninth Annual Conference on Application of X-Ray Analysis Held August 10–12 1960. Springer, 2013.

Mueller, William M. Advances in X-Ray Analysis: Volume 2 Proceedings of the Seventh Annual Conference on Applications of X-Ray Analysis Held August 13-15, 1958. Springer, 2013.

Fay, Marie, William M. Mueller, and Gavin R. Mallett. Advances in X-Ray Analysis: Volume 9 Proceedings of the Fourteenth Annual Conference on Applications of X-Ray Analysis Held August 25-27 1965. Springer London, Limited, 2013.

Fay, Marie, William M. Mueller, and Gavin R. Mallett. Advances in X-Ray Analysis: Volume 9 Proceedings of the Fourteenth Annual Conference on Applications of X-Ray Analysis Held August 25-27 1965. Springer, 2012.

Mueller, William M. Advances in X-Ray Analysis: Volume 3 Proceedings of the Eighth Annual Conference on Applications of X-Ray Analysis Held August 12-14, 1959. Springer, 2012.

Advances in X-Ray Analysis. Springer, 1999.

Advances in X-Ray Analysis. Springer, 1988.