Books on the topic 'X-RAY DEVICE'
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S, Swaminathan. Characterisation of III-V quaternary multilayer semiconductor device materials by x-ray diffraction. [s.l.]: typescript, 1985.
Find full textMcGovern, Mark Edward. Monolayer chemistry - interaction of OTS with quartz/glass surfaces in various solvents probed by x-ray photoelectron spectroscopy and surface acoustic wave device. Ottawa: National Library of Canada, 1993.
Find full textM, Ceglio Natale, Dhez Pierre, Society of Photo-optical Instrumentation Engineers., and University of Alabama in Huntsville. Center for Applied Optics., eds. Multilayer structures and laboratory X-ray laser research: 19-20 August 1986, San Diego, California. Bellingham, Wash., USA: SPIE--the International Society for Optical Engineering, 1987.
Find full textUnited States. National Aeronautics and Space Administration., ed. Modifications developed to improve X-ray detection devices. [Washington, D.C: National Aeronautics and Space Administration, 1994.
Find full textStarr, Richard. Annual report for Catholic University co-operative agreement NCC-5-83, 1 April 1997 through 31 March 1998. [Washington, DC: National Aeronautics and Space Administration, 1998.
Find full textUnited States. National Aeronautics and Space Administration., ed. Modifications developed to improve X-ray detection devices. [Washington, D.C: National Aeronautics and Space Administration, 1994.
Find full textF, Marshall Gerald, and Society of Photo-optical Instrumentation Engineers., eds. Applications of thin-film multilayered structures to figured X-ray optics: August 20-22, 1985, San Diego, California. Bellingham, Wash., USA: SPIE--the International Society for Optical Engineering, 1985.
Find full textFranz, Rosenberger, and United States. National Aeronautics and Space Administration., eds. X-ray transmission microscope development: Third semi-annual progress report, NASA contract NAS8-40185. Huntsville, AL: Center for Microgravity and Materials Research, The University of Alabama in Huntsville, 1995.
Find full textFranz, Rosenberger, and United States. National Aeronautics and Space Administration., eds. X-ray transmission microscope development: Third semi-annual progress report, NASA contract NAS8-40185. Huntsville, AL: Center for Microgravity and Materials Research, The University of Alabama in Huntsville, 1995.
Find full textCenter, Goddard Space Flight, ed. Evaluation of a procedure for the measurement of thin film thickness by X-ray reflectivity. Greenbelt, Md: National Aeronautics and Space Administration, Goddard Space Flight Center, 1997.
Find full textWang, Jiajun, ed. Advanced X-ray Imaging of Electrochemical Energy Materials and Devices. Singapore: Springer Singapore, 2021. http://dx.doi.org/10.1007/978-981-16-5328-5.
Full textShvyd'ko, Yuri. X-ray optics: High-energy-resolution applications. Berlin: Springer, 2004.
Find full textSayre, David. X-Ray Microscopy II: Proceedings of the International Symposium, Brookhaven, NY, August 31-September 4, 1987. Berlin, Heidelberg: Springer Berlin Heidelberg, 1988.
Find full textCenter, Goddard Space Flight, ed. Theory and development of position-sensitive quantum calorimeters. Greenbelt, Md: National Aeronautics and Space Administration, Goddard Space Flight Center, 2001.
Find full textHiraoki, Morimoto, Photomask Japan, BACUS (Technical group), and Ōyō Butsuri Gakkai, eds. Photomask and X-ray mask technology VI: 13-14 April, 1999, Yokohama, Japan. Bellingham, Wash., USA: SPIE, 1999.
Find full textVangi, Dario, and Virginio Rivano, eds. Ricostruzione della dinamica degli incidenti stradali. L'ambito giuridico, la strada, il conducente e il veicolo. Florence: Firenze University Press, 2011. http://dx.doi.org/10.36253/978-88-8453-398-2.
Full textHosono, Kunihiro. Photomask and next-generation lithography mask technology XVII: 13-15 April 2010, Yokohama, Japan. Bellingham, Wash: SPIE, 2010.
Find full textD, Holland Andrew, Society of Photo-optical Instrumentation Engineers., and American Astronomical Society, eds. High-energy detectors in astronomy: 22-23 June 2004, Glasgow, Scotland, United Kingdom. Bellingham, Wash: SPIE, 2004.
Find full textHosono, Kunihiro. Photomask and next-generation lithography mask technology XVI: 8-10 April 2009, Yokohama, Japan. Edited by Photomask Japan, BACUS (Technical group), and SPIE (Society). Bellingham, Wash: SPIE, 2009.
Find full textHosono, Kunihiro. Photomask and next-generation lithography mask technology XVII: 13-15 April 2010, Yokohama, Japan. Edited by SPIE (Society) and Photomask Japan. Bellingham, Wash: SPIE, 2010.
Find full textKonishi, Toshio. Photomask and next-generation lithography mask technology XVIII: 13-15 April 2011. Bellingham: SPIE, 2011.
Find full textHiroyoshi, Tanabe, Photomask Japan, BACUS (Technical group), Ōyō Butsuri Gakkai, Semiconductor Equipment and Materials International (Japan), and Society of Photo-optical Instrumentation Engineers., eds. Photomask and next-generation lithography mask technology X: 16-18 April, 2003, Yokohama, Japan. Bellingham, Wash: SPIE, 2003.
Find full textHidehiro, Watanabe, Photomask Japan, BACUS (Technical group), and Society of Photo-optical Instrumentation Engineers., eds. Photomask and next-generation lithography mask technology XIV: 17-19 April 2007, Yokohama, Japan. Bellingham, Wash: SPIE, 2007.
Find full textMorihisa, Hoga, Photomask Japan, BACUS (Technical group), Ōyō Butsuri Gakkai, and Society of Photo-optical Instrumentation Engineers., eds. Photomask and next-generation lithography mask technology XIII: 18-20 April, 2006, Yokohama, Japan. Bellingham, Wash: SPIE, 2006.
Find full textHiroichi, Kawahira, Photomask Japan, BACUS (Technical group), Ōyō Butsuri Gakkai, Semiconductor Equipment and Materials International (Japan), and Society of Photo-optical Instrumentation Engineers., eds. Photomask and next-generation lithography mask technology IX: 23-25 April, 2002, Yokohama, Japan. Bellingham, Wash: SPIE, 2002.
Find full textHiraoki, Morimoto, Photomask Japan, BACUS (Technical group), Society of Photo-optical Instrumentation Engineers., Ōyō Butsuri Gakkai, Seimitsu Kōgakkai, Denki Gakkai (1888), and Semiconductor Equipment and Materials International (Japan), eds. Photomask and next-generation lithography mask technology VII: 12-13 April 2000, Yokohama, Japan. Bellingham, Wash., USA: SPIE, 2000.
Find full textastronomer, Dorn David A., Holland Andrew D, Society of Photo-optical Instrumentation Engineers., and American Astronomical Society, eds. High energy, optical, and infrared detectors for astronomy II: 24-27 May, 2006, Orlando, Florida, USA. Bellingham, Wash: SPIE, 2006.
Find full text(Society), SPIE, ed. High energy, optical, and infrared detectors for astronomy IV: 27-30 June 2010, San Diego, California United States. Bellingham, Wash: SPIE, 2010.
Find full textApplications of synchrotron radiation: Micro beams in cell micro biology and medicine. Berlin: Springer, 2007.
Find full textH, Yock Douglas, ed. Imaging of CNS disease: A CT and MR teaching file. 2nd ed. St. Louis: Mosby Year Book, 1991.
Find full textAmerica, Optical Society of, ed. Fourier transform spectroscopy: February 10-12, 1997, Hilton Hotel, Santa Fe, New Mexico. Washington, DC: The Society, 1997.
Find full textSepowski, Stephen J., ed. The Ultimate Hint Book. Old Saybrook, CT: The Ultimate Game Club Ltd., 1991.
Find full textDevice for Spatially Orienting an X-Ray Optical Unit and Apparatus Having Such a Device: United States Patent 9971121. Independently Published, 2020.
Find full textHughes, Jim. Exposures and image quality. Oxford University Press, 2018. http://dx.doi.org/10.1093/med/9780198813170.003.0004.
Full textMartin, Colin J. Interaction of ionizing radiations with matter. Oxford University Press, 2015. http://dx.doi.org/10.1093/med/9780199655212.003.0002.
Full textNational Aeronautics and Space Administration (NASA) Staff. Modifications Developed to Improve X-Ray Detection Devices. Independently Published, 2018.
Find full textParkhomenko, Alexander, Olga S. Gurjeva, and Tetyana Yalynska. Clinical assessment and monitoring of chest radiographs. Oxford University Press, 2015. http://dx.doi.org/10.1093/med/9780199687039.003.0019.
Full textParkhomenko, Alexander, Olga S. Gurjeva, and Tetyana Yalynska. Clinical assessment and monitoring of chest radiographs. Oxford University Press, 2016. http://dx.doi.org/10.1093/med/9780199687039.003.0019_update_001.
Full textParkhomenko, Alexander, Olga S. Gurjeva, and Tetyana Yalynska. Clinical assessment and monitoring of chest radiographs. Oxford University Press, 2017. http://dx.doi.org/10.1093/med/9780199687039.003.0019_update_002.
Full textParkhomenko, Alexander, Olga S. Gurjeva, and Tetyana Yalynska. Clinical assessment and monitoring of chest radiographs. Oxford University Press, 2018. http://dx.doi.org/10.1093/med/9780199687039.003.0019_update_003.
Full textX-ray transmission microscope development: Final report; NASA contract NAS8-40185; period of performance, 02/28/95-08/31/97. Huntsville, AL: Center for Microgravity and Materials Research, University of Alabama in Huntsville, 1997.
Find full textWang, Jiajun. Advanced X-Ray Imaging of Electrochemical Energy Materials and Devices. Springer Singapore Pte. Limited, 2021.
Find full textWang, Jiajun. Advanced X-Ray Imaging of Electrochemical Energy Materials and Devices. Springer, 2022.
Find full textTiwari, Sandip. Electromagnetic-matter interactions and devices. Oxford University Press, 2017. http://dx.doi.org/10.1093/oso/9780198759874.003.0006.
Full textShvyd'ko, Yuri. X-Ray Optics: High-Energy-Resolution Applications. Springer London, Limited, 2006.
Find full textX-Ray Optics: High-Energy-Resolution Applications. Springer, 2010.
Find full textHolland, Andrew D., and James W. Beletic. High Energy, Optical, and Infrared Detectors for Astronomy V. SPIE, 2012.
Find full textBodenham, Andrew R. Vascular access during anaesthesia. Edited by Michel M. R. F. Struys. Oxford University Press, 2017. http://dx.doi.org/10.1093/med/9780199642045.003.0049.
Full textSayre, David. X-Ray Microscopy II: "Proceedings of the International Symposium, Brookhaven, NY, August 31-September 4, 1987". Springer, 2013.
Find full textSayre, David, Malcolm Howells, and Janos Kirz. X-Ray Microscopy II: Proceedings of the International Symposium, Brookhaven, NY, August 31-September 4, 1987. Springer, 2014.
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