Journal articles on the topic 'Wafer-Scale mapping'
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Tajima, Michio, E. Higashi, Toshihiko Hayashi, Hiroyuki Kinoshita, and Hiromu Shiomi. "Characterization of SiC Wafers by Photoluminescence Mapping." Materials Science Forum 527-529 (October 2006): 711–16. http://dx.doi.org/10.4028/www.scientific.net/msf.527-529.711.
Mackenzie, David M. A., Kristoffer G. Kalhauge, Patrick R. Whelan, Frederik W. Østergaard, Iwona Pasternak, Wlodek Strupinski, Peter Bøggild, Peter U. Jepsen, and Dirch H. Petersen. "Wafer-scale graphene quality assessment using micro four-point probe mapping." Nanotechnology 31, no. 22 (March 13, 2020): 225709. http://dx.doi.org/10.1088/1361-6528/ab7677.
Miner, C. J. "Wafer-scale temperature mapping for molecular beam epitaxy and chemical beam epitaxy." Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 11, no. 3 (May 1993): 998. http://dx.doi.org/10.1116/1.586910.
Buron, Jonas D., David M. A. Mackenzie, Dirch H. Petersen, Amaia Pesquera, Alba Centeno, Peter Bøggild, Amaia Zurutuza, and Peter U. Jepsen. "Terahertz wafer-scale mobility mapping of graphene on insulating substrates without a gate." Optics Express 23, no. 24 (November 16, 2015): 30721. http://dx.doi.org/10.1364/oe.23.030721.
Crovetto, Andrea, Patrick Rebsdorf Whelan, Ruizhi Wang, Miriam Galbiati, Stephan Hofmann, and Luca Camilli. "Nondestructive Thickness Mapping of Wafer-Scale Hexagonal Boron Nitride Down to a Monolayer." ACS Applied Materials & Interfaces 10, no. 30 (July 6, 2018): 25804–10. http://dx.doi.org/10.1021/acsami.8b08609.
Meshot, Eric R., Sei Jin Park, Steven F. Buchsbaum, Melinda L. Jue, Tevye R. Kuykendall, Eric Schaible, Leonardus Bimo Bayu Aji, Sergei O. Kucheyev, Kuang Jen J. Wu, and Francesco Fornasiero. "High-yield growth kinetics and spatial mapping of single-walled carbon nanotube forests at wafer scale." Carbon 159 (April 2020): 236–46. http://dx.doi.org/10.1016/j.carbon.2019.12.023.
Tian, Mengchuan, Ben Hu, Haifang Yang, Chengchun Tang, Mengfei Wang, Qingguo Gao, Xiong Xiong, et al. "Wafer Scale Mapping and Statistical Analysis of Radio Frequency Characteristics in Highly Uniform CVD Graphene Transistors." Advanced Electronic Materials 5, no. 4 (February 13, 2019): 1800711. http://dx.doi.org/10.1002/aelm.201800711.
Yao, Yong Zhao, Yukari Ishikawa, Koji Sato, Yoshihiro Sugawara, Katsunori Danno, Hiroshi Suzuki, and Takeshi Bessho. "Large-Area Mapping of Dislocations in 4H-SiC from Carbon-Face (000-1) by Using Vaporized KOH Etching near 1000 °C." Materials Science Forum 740-742 (January 2013): 829–32. http://dx.doi.org/10.4028/www.scientific.net/msf.740-742.829.
Shih, Po-Chou, Chun-Chin Hsu, and Fang-Chih Tien. "Automatic Reclaimed Wafer Classification Using Deep Learning Neural Networks." Symmetry 12, no. 5 (May 2, 2020): 705. http://dx.doi.org/10.3390/sym12050705.
Lang, Simon, Alexandra Schewski, Ignaz Eisele, Christoph Kutter, and Wilfried Lerch. "(Best Paper Award) Aluminum Josephson Junction Formation on 200mm Wafers Using Different Oxidation Techniques." ECS Meeting Abstracts MA2023-01, no. 29 (August 28, 2023): 1791. http://dx.doi.org/10.1149/ma2023-01291791mtgabs.
Yates, Luke, Andrew T. Binder, Anthony Rice, Andrew M. Armstrong, Jeffrey Steinfeldt, Vincent M. Abate, Michael L. Smith, et al. "(Invited) Recent Progress in Medium-Voltage Vertical GaN Power Devices." ECS Meeting Abstracts MA2023-02, no. 35 (December 22, 2023): 1682. http://dx.doi.org/10.1149/ma2023-02351682mtgabs.
Yang, Dongxun, Jesse Henri Laarman, and Masayoshi Tonouchi. "Sensitive Characterization of the Graphene Transferred onto Varied Si Wafer Surfaces via Terahertz Emission Spectroscopy and Microscopy (TES/LTEM)." Materials 17, no. 7 (March 26, 2024): 1497. http://dx.doi.org/10.3390/ma17071497.
Abid, Poonam Sehrawat, Christian M. Julien, and Saikh S. Islam. "Interface Kinetics Assisted Barrier Removal in Large Area 2D-WS2 Growth to Facilitate Mass Scale Device Production." Nanomaterials 11, no. 1 (January 16, 2021): 220. http://dx.doi.org/10.3390/nano11010220.
Wadhwa, Riya, Sanjeev Thapa, Sonia Deswal, Pradeep Kumar, and Mukesh Kumar. "Wafer-scale controlled growth of MoS2 by magnetron sputtering: from in-plane to inter-connected vertically-aligned flakes." Journal of Physics: Condensed Matter, January 19, 2023. http://dx.doi.org/10.1088/1361-648x/acb4d1.
Chen, Fu Der, Ankita Sharma, David A. Roszko, Tianyuan Xue, Xin Mu, Xianshu Luo, Hongyao Chua, Patrick Guo-Qiang Lo, Wesley D. Sacher, and Joyce Poon. "Development of wafer-scale multifunctional nanophotonic neural probes for brain activity mapping." Lab on a Chip, 2024. http://dx.doi.org/10.1039/d3lc00931a.
Lagowski, Jacek, and Piotr Edelman. "Non-Contact Mapping of Fe Contamination in Oxidized Si Wafers with Sensitivity in Part-Per-Trillion Range." MRS Proceedings 428 (1996). http://dx.doi.org/10.1557/proc-428-449.
Dinh, Khac Huy, Kevin Robert, Joelle Thuriot-Roukos, Marielle Huvé, Pardis Simon, David Troadec, Christophe Lethien, and Pascal Roussel. "Wafer-Scale Performance Mapping of Magnetron-Sputtered Ternary Vanadium Tungsten Nitride for Microsupercapacitors." Chemistry of Materials, October 13, 2023. http://dx.doi.org/10.1021/acs.chemmater.3c01803.
Faifer, Vladimir N., Michael I. Current, Wojtek Walecki, Vitali Souchkov, Georgy Mikhaylov, Phuc Van, Tim Wong, et al. "Non-contact Electrical Measurements of Sheet Resistance and Leakage Current Density for Ultra-shallow (and other) Junctions." MRS Proceedings 810 (2004). http://dx.doi.org/10.1557/proc-810-c11.9.
Lee, Brian, Duane S. Boning, Winthrop Baylies, Noel Poduje, and John Valley. "Modeling and Mapping of Nanotopography Interactions with CMP." MRS Proceedings 732 (2002). http://dx.doi.org/10.1557/proc-732-i1.5.
Edelman, Piotr, Jacek Lagowski, and Lubek Jastrzebski. "Surface Charge Imaging in Semiconductor Wafers by Surface Photovoltage (SPV)." MRS Proceedings 261 (1992). http://dx.doi.org/10.1557/proc-261-223.
Su, Chanmin, Shuiqing Hu, Yan Hu, Natalia Erina, and Andrea Slade. "Quantitative Mechanical Mapping of Biomolecules in Fluid." MRS Proceedings 1261 (2010). http://dx.doi.org/10.1557/proc-1261-u01-05.
Whelan, Patrick R., Domenico De Fazio, Iwona Pasternak, Joachim D. Thomsen, Steffen Zelzer, Martin O. Mikkelsen, Timothy J. Booth, et al. "Mapping nanoscale carrier confinement in polycrystalline graphene by terahertz spectroscopy." Scientific Reports 14, no. 1 (February 7, 2024). http://dx.doi.org/10.1038/s41598-024-51548-z.
Pearton, S. J., K. M. Lee, N. M. Haegel, C. J. Huang, S. Nakahara, F. Ren, V. Scarpelli, K. T. Short, and S. M. Vernon. "Material and Device Properties of 3” Diameter GaAs-on-Si with Buried P-type Layers." MRS Proceedings 144 (1988). http://dx.doi.org/10.1557/proc-144-317.
Zhuang, Qiuna, Kuanming Yao, Mengge Wu, Zhuogui Lei, Fan Chen, Jiyu Li, Quanjing Mei, et al. "Wafer-patterned, permeable, and stretchable liquid metal microelectrodes for implantable bioelectronics with chronic biocompatibility." Science Advances 9, no. 22 (June 2, 2023). http://dx.doi.org/10.1126/sciadv.adg8602.
Marinskiy, D., J. Lagowski, M. Wilson, A. Savtchouk, L. Jastrzebski, and D. DeBusk. "Small Signal AC-Surface Photovoltage Technique for Non-Contact Monitoring of Near Surface Doping and Recombination-Generation in the Depletion Layer." MRS Proceedings 591 (1999). http://dx.doi.org/10.1557/proc-591-225.
Fu, Wai Yuen, and Hoi Wai Choi. "Development of chipscale InGaN RGB displays using strain-relaxed nanosphere-defined nanopillars." Nanotechnology, April 2, 2022. http://dx.doi.org/10.1088/1361-6528/ac6399.
Alcer, David, Lukas Hrachowina, Dan Hessman, and Magnus T. Borgström. "Processing and Characterization of Large Area InP Nanowire Photovoltaic Devices." Nanotechnology, April 12, 2023. http://dx.doi.org/10.1088/1361-6528/accc37.
Chu, Jinn P., Yi-Jui Yeh, Chih-Yu Liu, Yi-Xiang Yang, Alfreda Krisna Altama, Ting-Hao Chang, Wei-Hung Chiang, Pakman Yiu, and Kuo-Lun Tung. "Core-shell metallic nanotube arrays for highly sensitive surface-enhanced Raman scattering (SERS) detection." Journal of Vacuum Science & Technology A 41, no. 6 (October 17, 2023). http://dx.doi.org/10.1116/6.0003055.
Biswas, Sujit K., Sandra B. Schujman, Robert Vajtai, Bingqing Wei, Allen Parker, Leo J. Schowalter, and Pulickel M. Ajayan. "AFM-based Electrical Characterization of Nano-structures." MRS Proceedings 738 (2002). http://dx.doi.org/10.1557/proc-738-g9.2.
Biswas, Sujit K., Sandra B. Schujman, Robert Vajtai, Bingqing Wei, Allen Parker, Leo J. Schowalter, and Pulickel M. Ajayan. "AFM-based Electrical Characterization of Nano-structures." MRS Proceedings 761 (2002). http://dx.doi.org/10.1557/proc-761-nn6.2/g9.2.
Yama, Nicholas S., I‐Tung Chen, Srivatsa Chakravarthi, Bingzhao Li, Christian Pederson, Bethany E. Matthews, Steven R. Spurgeon, et al. "Silicon‐Lattice‐Matched Boron‐Doped Gallium Phosphide: A Scalable Acousto‐Optic Platform." Advanced Materials, September 3, 2023. http://dx.doi.org/10.1002/adma.202305434.
Snure, Michael, Eric W. Blanton, Vitali Soukhoveev, Timothy Vogt, Andrei Osinsky, Timothy Prusnick, W. Joshua Kennedy, and Nicholas R. Glavin. "Spalling induced van der Waals lift-off and transfer of 4-in. GaN epitaxial films." Journal of Applied Physics 134, no. 2 (July 14, 2023). http://dx.doi.org/10.1063/5.0153634.
Ji, Yihong, Martin Frentrup, Xiaotian Zhang, Jakub Pongrácz, Simon M. Fairclough, Yingjun Liu, Tongtong Zhu, and Rachel A. Oliver. "Porous pseudo-substrates for InGaN quantum well growth: Morphology, structure, and strain relaxation." Journal of Applied Physics 134, no. 14 (October 10, 2023). http://dx.doi.org/10.1063/5.0165066.
Lihachev, Grigory, Johann Riemensberger, Wenle Weng, Junqiu Liu, Hao Tian, Anat Siddharth, Viacheslav Snigirev, et al. "Low-noise frequency-agile photonic integrated lasers for coherent ranging." Nature Communications 13, no. 1 (June 20, 2022). http://dx.doi.org/10.1038/s41467-022-30911-6.
Wachtendorf, B., R. Beccard, D. Schmitz, H. Jürgensen, O. Schön, M. Heuken, and E. Woelk. "Reliable, Reproducible and Efficient MOCVD of III-Nitrides in Production Scale Reactors." MRS Proceedings 468 (1997). http://dx.doi.org/10.1557/proc-468-7.