Journal articles on the topic 'TZM - SiC'
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Portelli, Marcus, Alessandro Bertarelli, Federico Carra, Michele Pasquali, Nicholas Sammut, and Pierluigi Mollicone. "Numerical and experimental benchmarking of the dynamic response of SiC and TZM specimens in the MultiMat experiment." Mechanics of Materials 138 (November 2019): 103169. http://dx.doi.org/10.1016/j.mechmat.2019.103169.
Nikzad Khangholi, Siamak, Mousa Javidani, Alexandre Maltais, and X. Grant Chen. "Investigation on electrical conductivity and hardness of 6xxx aluminum conductor alloys with different Si levels." MATEC Web of Conferences 326 (2020): 08002. http://dx.doi.org/10.1051/matecconf/202032608002.
Liu, R. J., L. M. Porter, M. J. Kim, R. W. Carpenter, and R. F. Davis. "Microstructure of Cr-B Ohmic and Rectifying Contacts on (0001) 6H Sic." Microscopy and Microanalysis 3, S2 (August 1997): 641–42. http://dx.doi.org/10.1017/s1431927600038484.
Liu, R. J., L. M. Porter, M. J. Kim, R. W. Carpenter, and R. F. Davis. "Microstructure of Cr-B Ohmic and Rectifying Contacts on (0001) 6H Sic." Microscopy and Microanalysis 3, S2 (August 1997): 641–42. http://dx.doi.org/10.1017/s1431927600010096.
Park, K., and C. Sung. "Characterization of SiC fiber-reinforced SiC composites by TEM." Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 632–33. http://dx.doi.org/10.1017/s042482010017089x.
Aoki, Masahiko, Megumi Miyazaki, Taro Nishiguchi, Hiroyuki Kinoshita, and Masahiro Yoshimoto. "TEM Observation of the Polytype Transformation of Bulk SiC Ingot." Materials Science Forum 600-603 (September 2008): 365–68. http://dx.doi.org/10.4028/www.scientific.net/msf.600-603.365.
Wang, E. Y., X. Pan, J. P. Mansfield, T. Kennedy, and S. Hampshire. "TEM Studies of Silicon Nitride-Silicon Carbide Nanocomposites." Microscopy and Microanalysis 3, S2 (August 1997): 411–12. http://dx.doi.org/10.1017/s1431927600008941.
Bertrand, S., C. Droillard, R. Pailler, X. Bourrat, and R. Naslain. "TEM structure of (PyC/SiC)n multilayered interphases in SiC/SiC composites." Journal of the European Ceramic Society 20, no. 1 (January 2000): 1–13. http://dx.doi.org/10.1016/s0955-2219(99)00086-2.
Diot, C., and V. Arnault. "Orientation Anisotropy in SiC Matrix of Unidirectional SiC/SiC Composite." Textures and Microstructures 14 (1991): 389–95. http://dx.doi.org/10.1155/tsm.14-18.389.
Nutt, S. R., and David J. Smith. "High-resolution TEM of thin-film β-SiC interfaces." Proceedings, annual meeting, Electron Microscopy Society of America 44 (August 1986): 408–9. http://dx.doi.org/10.1017/s0424820100143638.
Carter, C. H., J. E. Lane, J. Bentley, and R. F. Davis. "Determination of creep mechanisms in various silicon carbides via TEM." Proceedings, annual meeting, Electron Microscopy Society of America 44 (August 1986): 484–87. http://dx.doi.org/10.1017/s0424820100143973.
Matsuhata, Hirofumi, Junji Senzaki, Ichiro Nagai, and Hirotaka Yamaguchi. "TEM Observation of SiO2/4H-SiC Hetero Interface." Materials Science Forum 600-603 (September 2008): 671–74. http://dx.doi.org/10.4028/www.scientific.net/msf.600-603.671.
Liu, R. J., M. J. Kim, R. W. Carpenter, L. M. Porter, L. P. Scheunemann, and R. F. Davis. "A TEM Study of Cr Based Contacts to (0001) 6H-SiC." Microscopy and Microanalysis 6, S2 (August 2000): 1064–65. http://dx.doi.org/10.1017/s1431927600037818.
Marinova, Maya, Alkyoni Mantzari, Milena Beshkova, Mikael Syväjärvi, Rositza Yakimova, and Efstathios K. Polychroniadis. "TEM Investigation of the 3C/6H-SiC Transformation Interface in Layers Grown by Sublimation Epitaxy." Solid State Phenomena 163 (June 2010): 97–100. http://dx.doi.org/10.4028/www.scientific.net/ssp.163.97.
Perić Gavrančić, Sanja. "Sic etiam Croati." Povijesni prilozi 39, no. 58 (2020): 7–28. http://dx.doi.org/10.22586/pp.v39i58.10115.
Borysiuk, Jolanta, Wlodek Strupiński, Rafał Bożek, Andrzej Wysmolek, and Jacek M. Baranowski. "TEM Investigations of Graphene on 4H-SiC(0001)." Materials Science Forum 615-617 (March 2009): 207–10. http://dx.doi.org/10.4028/www.scientific.net/msf.615-617.207.
Plummer, H. K., S. E. Shinozaki, B. N. Juterbock, and R. M. Williams. "TEM Observation of a Mechanically Thinned SiC Material." Proceedings, annual meeting, Electron Microscopy Society of America 43 (August 1985): 232–33. http://dx.doi.org/10.1017/s0424820100118084.
Gkanatsiou, Alexandra, Christos B. Lioutas, Nikolaos Frangis, Narendraraj Chandraraj, Efstathios K. Polychroniadis, Pawel Prystawko, and Mike Leszczynski. "TEM Study of AlGaN/GaN on Hexagonal SiC Substrates." Advanced Materials Research 936 (June 2014): 656–60. http://dx.doi.org/10.4028/www.scientific.net/amr.936.656.
Marinova, Maya, Georgios Zoulis, Teddy Robert, Frédéric Mercier, Alkyoni Mantzari, Irina G. Galben-Sandulache, Olivier Kim-Hak, et al. "TEM and LTPL Investigations of 3C-SiC Layers Grown by LPE on (100) and (111) 3C-SiC Seeds." Materials Science Forum 645-648 (April 2010): 383–86. http://dx.doi.org/10.4028/www.scientific.net/msf.645-648.383.
Kameda, Toshimasa, Atsuo Tomita, Takaaki Matsui, and Toshiyuki Isshiki. "TEM Observation of Defect Structure of Low-Energy Ion Implanted SiC." Materials Science Forum 778-780 (February 2014): 350–53. http://dx.doi.org/10.4028/www.scientific.net/msf.778-780.350.
Elizalde, M. R., E. Paris, and J. Gil-Sevillano. "La intercara fibra-matriz de un compuesto CMC de SiC-SiC: Comparación de imágenes SEM, TEM y AFM." Revista de Metalurgia 34, Extra (May 30, 1998): 226–31. http://dx.doi.org/10.3989/revmetalm.1998.v34.iextra.743.
Swiderska-Sroda, Anna, J. A. Kozubowski, A. Maranda-Niedbala, Ewa Grzanka, Bogdan F. Palosz, A. Presz, Stanislaw Gierlotka, et al. "Investigation of the Microstructure of SiC-Zn Nanocomposites by Microscopic Methods: SEM, AFM and TEM." Solid State Phenomena 101-102 (January 2005): 151–56. http://dx.doi.org/10.4028/www.scientific.net/ssp.101-102.151.
Rossi, Francesca, Filippo Fabbri, Giovanni Attolini, Matteo Bosi, Bernard Enrico Watts, and Giancarlo Salviati. "TEM and SEM-CL Studies of SiC Nanowires." Materials Science Forum 645-648 (April 2010): 387–90. http://dx.doi.org/10.4028/www.scientific.net/msf.645-648.387.
Ruterana, P., B. Beaumont, P. Gibart, and Y. Melnik. "A TEM study of GaN grown by ELO on (0001) 6H-SiC." MRS Internet Journal of Nitride Semiconductor Research 5, S1 (2000): 76–82. http://dx.doi.org/10.1557/s1092578300004105.
Borysiuk, Jolanta, Rafał Bożek, Wlodek Strupiński, and Jacek M. Baranowski. "Graphene Growth on C and Si-Face of 4H-SiC – TEM and AFM Studies." Materials Science Forum 645-648 (April 2010): 577–80. http://dx.doi.org/10.4028/www.scientific.net/msf.645-648.577.
Liu, J. Q., M. Skowronski, P. G. Neudeck, and J. A. Powell. "TEM Observation on Single Defect in SiC." Microscopy and Microanalysis 8, S02 (August 2002): 1180–81. http://dx.doi.org/10.1017/s143192760210777x.
Danishevskii, A. M., M. V. Zamoryanskaya, A. A. Sitnikova, V. B. Shuman, and A. A. Suvorova. "TEM and cathodoluminescence studies of porous SiC." Semiconductor Science and Technology 13, no. 10 (October 1, 1998): 1111–16. http://dx.doi.org/10.1088/0268-1242/13/10/010.
Alani, R., and P. R. Swann. "TEM specimen preparation of individual SiC/C composite (SCS-6) fibers." Proceedings, annual meeting, Electron Microscopy Society of America 49 (August 1991): 1104–5. http://dx.doi.org/10.1017/s0424820100089834.
Lee, B.-T., D.-K. Kim, C.-K. Moon, J. K. Kim, Y. H. Seo, K. S. Nahm, H. J. Lee, et al. "Microstructural investigation of low temperature chemical vapor deposited 3C-SiC/Si thin films using single-source precursors." Journal of Materials Research 14, no. 1 (January 1999): 24–28. http://dx.doi.org/10.1557/jmr.1999.0006.
Bow, J. S., F. Shaapur, M. J. Kim, and R. W. Carpenter. "Preparation of thin-film-metal/6H-SiC TEM specimens by RPR ion milling." Proceedings, annual meeting, Electron Microscopy Society of America 51 (August 1, 1993): 714–15. http://dx.doi.org/10.1017/s0424820100149404.
Mantzari, Alkyoni, Christos B. Lioutas, and Efstathios K. Polychroniadis. "A TEM Study of Inversion Domain Boundaries Annihilation Mechanism in 3C-SiC during Growth." Materials Science Forum 615-617 (March 2009): 331–34. http://dx.doi.org/10.4028/www.scientific.net/msf.615-617.331.
Yano, Toyohiko, Yoo Yamamoto, and K. Yoshida. "TEM Investigation and Fracture Behavior of SiC/SiC Composites Fabricated by Hot-Pressing." Key Engineering Materials 166 (April 1999): 135–38. http://dx.doi.org/10.4028/www.scientific.net/kem.166.135.
Zhou, W. L., F. Namavar, P. C. Colter, M. Yoganathan, M. W. Leksono, and J. I. Pankove. "Characterization of GaN Grown on SiC on Si/SiO2/Si by Metalorganic Chemical Vapor Deposition." Journal of Materials Research 14, no. 4 (April 1999): 1171–74. http://dx.doi.org/10.1557/jmr.1999.0155.
Lebedev, Sergey P., Alexander A. Lebedev, Alla A. Sitnikova, Demid A. Kirilenko, Natasha V. Seredova, Alla S. Tregubova, and Mikhail P. Scheglov. "Heteroepitaxial Growth of 3C-SiC on Polar Faces of 6H-SiC Substrates, TEM Investigations." Materials Science Forum 740-742 (January 2013): 267–70. http://dx.doi.org/10.4028/www.scientific.net/msf.740-742.267.
Giannuzzi, L. A., C. A. Lewinsohn, C. E. Bakis, and R. E. Tressler. "TEM of grain growth and phase transformations during creep of SCS-6 silicon carbide fibers." Proceedings, annual meeting, Electron Microscopy Society of America 53 (August 13, 1995): 350–51. http://dx.doi.org/10.1017/s0424820100138129.
Cabibbo, Marcello. "Strengthening Evaluation in a Composite Mg-RE Alloy Using TEM." Materials Science Forum 678 (February 2011): 75–84. http://dx.doi.org/10.4028/www.scientific.net/msf.678.75.
Bow, J. S., M. J. Kim, and R. W. Carpenter. "Comparative Oxidation Studies of Polycrystalline HP and CVD Silicon Carbides by TEM." Proceedings, annual meeting, Electron Microscopy Society of America 49 (August 1991): 938–39. http://dx.doi.org/10.1017/s0424820100089007.
Das, G., and R. E. Omlor. "TEM characterization of reaction zone in a SiC fiber-reinforced titanium alloy." Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 738–39. http://dx.doi.org/10.1017/s0424820100105758.
Burke, M. G., M. N. Gungor, and P. K. Liaw. "TEM examination of 2014-SiC metal matrix composite." Proceedings, annual meeting, Electron Microscopy Society of America 46 (1988): 726–27. http://dx.doi.org/10.1017/s0424820100105692.
Olivier, E. J., and J. H. Neethling. "TEM analysis of planar defects in β-SiC." International Journal of Refractory Metals and Hard Materials 27, no. 2 (March 2009): 443–48. http://dx.doi.org/10.1016/j.ijrmhm.2008.09.013.
Pirouz, P., and J. W. Yang. "Polytypic transformations in SiC: the role of TEM." Ultramicroscopy 51, no. 1-4 (June 1993): 189–214. http://dx.doi.org/10.1016/0304-3991(93)90146-o.
Sitnikova, A. A., E. N. Mokhov, and E. I. Radovanova. "TEM Investigation of Radiation Defects in SiC Crystals." Physica Status Solidi (a) 135, no. 2 (February 16, 1993): K45—K49. http://dx.doi.org/10.1002/pssa.2211350232.
More, K. L. "An investigation of ion beam and pulsed laser Ni-SiC mixed surface structures by cross-sectional TEM." Proceedings, annual meeting, Electron Microscopy Society of America 44 (August 1986): 512–13. http://dx.doi.org/10.1017/s0424820100144073.
YOON, HAN-KI, HO-JUN CHO, AKIRA KOHYAMA, and TETSUJI NODA. "R&D OF SICF/SIC COMPOSITE FOR FUSION REACTOR MATERIAL." International Journal of Modern Physics B 25, no. 31 (December 20, 2011): 4212–15. http://dx.doi.org/10.1142/s021797921106660x.
Shibayama, T., H. Takahashi, M. Kawasaki, and A. Kohyama. "Interface structure analysis of SiC fibres reinforced SiC matrix composites by energy filtering TEM." Journal of Electron Microscopy 48, no. 6 (January 1, 1999): 893–97. http://dx.doi.org/10.1093/oxfordjournals.jmicro.a023762.
Husnayani, Ihda, and Muzakkiy Putra Muhammad Akhir. "COLLISION CASCADE AND PRIMARY RADIATION DAMAGE IN SILICON CARBIDE: A MOLECULAR DYNAMICS STUDY." JURNAL TEKNOLOGI REAKTOR NUKLIR TRI DASA MEGA 24, no. 3 (November 9, 2022): 131. http://dx.doi.org/10.17146/tdm.2022.24.3.6702.
Yasui, Kanji, T. Kurimoto, Masasuke Takata, and Tadashi Akahane. "SiCOI Structure Fabricated by Hot-Mesh Chemical Vapor Deposition." Advanced Materials Research 11-12 (February 2006): 257–60. http://dx.doi.org/10.4028/www.scientific.net/amr.11-12.257.
Chien, F. R., S. R. Nutt, W. S. Yoo, T. Kimoto, and H. Matsunami. "Terrace growth and polytype development in epitaxial β-SiC films on α-SiC (6H and 15R) substrates." Journal of Materials Research 9, no. 4 (April 1994): 940–54. http://dx.doi.org/10.1557/jmr.1994.0940.
Fang, J., H. M. Chan, and M. P. Harmer. "TEM investigations of surface residual stress relaxation in A12O3 and Al2O3-SiC nanocomposite." Proceedings, annual meeting, Electron Microscopy Society of America 52 (1994): 628–29. http://dx.doi.org/10.1017/s0424820100170876.
Gokhman, Aleksandr R., Andreas Ulbricht, Uwe Birkenheuer, and Frank Bergner. "Cluster Dynamics Study of Neutron Irradiation Induced Defects in Fe-12.5at%Cr Alloy." Solid State Phenomena 172-174 (June 2011): 449–57. http://dx.doi.org/10.4028/www.scientific.net/ssp.172-174.449.