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Journal articles on the topic 'Transmission Electron Microscopy'

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Published: 4 June 2021

Last updated: 7 July 2024

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1

Schatten, G., J. Pawley, and H. Ris. "Integrated microscopy resource for biomedical research at the university of wisconsin at madison." Proceedings, annual meeting, Electron Microscopy Society of America 45 (August 1987): 594–97. http://dx.doi.org/10.1017/s0424820100127451.

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The High Voltage Electron Microscopy Laboratory [HVEM] at the University of Wisconsin-Madison, a National Institutes of Health Biomedical Research Technology Resource, has recently been renamed the Integrated Microscopy Resource for Biomedical Research [IMR]. This change is designed to highlight both our increasing abilities to provide sophisticated microscopes for biomedical investigators, and the expansion of our mission beyond furnishing access to a million-volt transmission electron microscope. This abstract will describe the current status of the IMR, some preliminary results, our upcoming plans, and the current procedures for applying for microscope time.The IMR has five principal facilities: 1.High Voltage Electron Microscopy2.Computer-Based Motion Analysis3.Low Voltage High-Resolution Scanning Electron Microscopy4.Tandem Scanning Reflected Light Microscopy5.Computer-Enhanced Video MicroscopyThe IMR houses an AEI-EM7 one million-volt transmission electron microscope.

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2

Möller, Lars, Gudrun Holland, and Michael Laue. "Diagnostic Electron Microscopy of Viruses With Low-voltage Electron Microscopes." Journal of Histochemistry & Cytochemistry 68, no. 6 (May 21, 2020): 389–402. http://dx.doi.org/10.1369/0022155420929438.

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Diagnostic electron microscopy is a useful technique for the identification of viruses associated with human, animal, or plant diseases. The size of virus structures requires a high optical resolution (i.e., about 1 nm), which, for a long time, was only provided by transmission electron microscopes operated at 60 kV and above. During the last decade, low-voltage electron microscopy has been improved and potentially provides an alternative to the use of high-voltage electron microscopy for diagnostic electron microscopy of viruses. Therefore, we have compared the imaging capabilities of three low-voltage electron microscopes, a scanning electron microscope equipped with a scanning transmission detector and two low-voltage transmission electron microscopes, operated at 25 kV, with the imaging capabilities of a high-voltage transmission electron microscope using different viruses in samples prepared by negative staining and ultrathin sectioning. All of the microscopes provided sufficient optical resolution for a recognition of the viruses tested. In ultrathin sections, ultrastructural details of virus genesis could be revealed. Speed of imaging was fast enough to allow rapid screening of diagnostic samples at a reasonable throughput. In summary, the results suggest that low-voltage microscopes are a suitable alternative to high-voltage transmission electron microscopes for diagnostic electron microscopy of viruses.

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3

Yase, Kiyoshi. "Transmission Electron Microscopy." Kobunshi 43, no. 2 (1994): 94–97. http://dx.doi.org/10.1295/kobunshi.43.94.

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4

van der Krift, Theo, Ulrike Ziese, Willie Geerts, and Bram Koster. "Computer-Controlled Transmission Electron Microscopy: Automated Tomography." Microscopy and Microanalysis 7, S2 (August 2001): 968–69. http://dx.doi.org/10.1017/s1431927600030919.

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The integration of computers and transmission electron microscopes (TEM) in combination with the availability of computer networks evolves in various fields of computer-controlled electron microscopy. Three layers can be discriminated: control of electron-optical elements in the column, automation of specific microscope operation procedures and display of user interfaces. The first layer of development concerns the computer-control of the optical elements of the transmission electron microscope (TEM). Most of the TEM manufacturers have transformed their optical instruments into computer-controlled image capturing devices. Nowadays, the required controls for the currents through lenses and coils of the optical column can be accessed by computer software. The second layer of development is aimed toward further automation of instrument operation. For specific microscope applications, dedicated automated microscope-control procedures are carried out. in this paper, we will discuss our ongoing efforts on this second level towards fully automated electron tomography. The third layer of development concerns virtual- or telemicroscopy. Most telemicroscopy applications duplicate the computer-screen (with accessory controls) at the microscope-site to a computer-screen at another site. This approach allows sharing of equipment, monitoring of instruments by supervisors, as well as collaboration between experts at remote locations.Electron tomography is a three-dimensional (3D) imaging method with transmission electron microscopy (TEM) that provides high-resolution 3D images of structural arrangements. with electron tomography a series of images is acquired of a sample that is tilted over a large angular range (±70°) with small angular tilt increments.

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5

Ischenko, A. A., Yu I. Tarasov, E. A. Ryabov, S. A. Aseyev, and L. Schäfer. "ULTRAFAST TRANSMISSION ELECTRON MICROSCOPY." Fine Chemical Technologies 12, no. 1 (February 28, 2017): 5–25. http://dx.doi.org/10.32362/2410-6593-2017-12-1-5-25.

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Ultrafast laser spectral and electron diffraction methods complement each other and open up new possibilities in chemistry and physics to light up atomic and molecular motions involved in the primary processes governing structural transitions. Since the 1980s, scientific laboratories in the world have begun to develop a new field of research aimed at this goal. “Atomic-molecular movies” will allow visualizing coherent dynamics of nuclei in molecules and fast processes in chemical reactions in real time. Modern femtosecond and picosecond laser sources have made it possible to significantly change the traditional approaches using continuous electron beams, to create ultrabright pulsed photoelectron sources, to catch ultrafast processes in the matter initiated by ultrashort laser pulses and to achieve high spatio-temporal resolution in research. There are several research laboratories all over the world experimenting or planning to experiment with ultrafast electron diffraction and possessing electron microscopes adapted to operate with ultrashort electron beams. It should be emphasized that creating a new-generation electron microscope is of crucial importance, because successful realization of this project demonstrates the potential of leading national research centers and their ability to work at the forefront of modern science.

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6

Brydson, R., A. Brown, L. G. Benning, and K. Livi. "Analytical Transmission Electron Microscopy." Reviews in Mineralogy and Geochemistry 78, no. 1 (January 1, 2014): 219–69. http://dx.doi.org/10.2138/rmg.2014.78.6.

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7

Sigle, Wilfried. "ANALYTICAL TRANSMISSION ELECTRON MICROSCOPY." Annual Review of Materials Research 35, no. 1 (August 4, 2005): 239–314. http://dx.doi.org/10.1146/annurev.matsci.35.102303.091623.

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8

Winey, Mark, Janet B. Meehl, Eileen T. O'Toole, and Thomas H. Giddings. "Conventional transmission electron microscopy." Molecular Biology of the Cell 25, no. 3 (February 2014): 319–23. http://dx.doi.org/10.1091/mbc.e12-12-0863.

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Researchers have used transmission electron microscopy (TEM) to make contributions to cell biology for well over 50 years, and TEM continues to be an important technology in our field. We briefly present for the neophyte the components of a TEM-based study, beginning with sample preparation through imaging of the samples. We point out the limitations of TEM and issues to be considered during experimental design. Advanced electron microscopy techniques are listed as well. Finally, we point potential new users of TEM to resources to help launch their project.

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9

Urban, K. "Picometer Transmission Electron Microscopy." Microscopy and Microanalysis 17, S2 (July 2011): 1314–15. http://dx.doi.org/10.1017/s1431927611007446.

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10

BROWN, L. M. "Scanning transmission electron microscopy." Le Journal de Physique IV 03, no. C7 (November 1993): C7–2073—C7–2080. http://dx.doi.org/10.1051/jp4:19937331.

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11

O'Keefe, Michael A., John H. Turner, John A. Musante, Crispin J. D. Hetherington, A. G. Cullis, Bridget Carragher, Ron Jenkins, et al. "Laboratory Design for High-Performance Electron Microscopy." Microscopy Today 12, no. 3 (May 2004): 8–17. http://dx.doi.org/10.1017/s1551929500052093.

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Since publication of the classic text on the electron microscope laboratory by Anderson, the proliferation of microscopes with field emission guns, imaging filters and hardware spherical aberration correctors (giving higher spatial and energy resolution) has resulted in the need to construct special laboratories. As resolutions iinprovel transmission electron microscopes (TEMs) and scanning transmission electron microscopes (STEMs) become more sensitive to ambient conditions. State-of-the-art electron microscopes require state-of-the-art environments, and this means careful design and implementation of microscope sites, from the microscope room to the building that surrounds it. Laboratories have been constructed to house high-sensitive instruments with resolutions ranging down to sub-Angstrom levels; we present the various design philosophies used for some of these laboratories and our experiences with them. Four facilities are described: the National Center for Electron Microscopy OAM Laboratory at LBNL; the FEGTEM Facility at the University of Sheffield; the Center for Integrative Molecular Biosciences at TSRI; and the Advanced Microscopy Laboratory at ORNL.

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12

Bendersky, L. A., and F. W. Gayle. "Electron diffraction using transmission electron microscopy." Journal of Research of the National Institute of Standards and Technology 106, no. 6 (November 2001): 997. http://dx.doi.org/10.6028/jres.106.051.

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13

Lichte, Hannes. "Electron Holography Improving Transmission Electron Microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (August 12, 1990): 208–9. http://dx.doi.org/10.1017/s0424820100179798.

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Generally, the electron object wave o(r) is modulated both in amplitude and phase. In the image plane of an ideal imaging system we would expect to find an image wave b(r) that is modulated in exactly the same way, i. e. b(r) =o(r). If, however, there are aberrations, the image wave instead reads as b(r) =o(r) * FT(WTF) i. e. the convolution of the object wave with the Fourier transform of the wave transfer function WTF . Taking into account chromatic aberration, illumination divergence and the wave aberration of the objective lens, one finds WTF(R) = Echrom(R)Ediv(R).exp(iX(R)) . The envelope functions Echrom(R) and Ediv(R) damp the image wave, whereas the effect of the wave aberration X(R) is to disorder amplitude and phase according to real and imaginary part of exp(iX(R)) , as is schematically sketched in fig. 1.Since in ordinary electron microscopy only the amplitude of the image wave can be recorded by the intensity of the image, the wave aberration has to be chosen such that the object component of interest (phase or amplitude) is directed into the image amplitude. Using an aberration free objective lens, for X=0 one sees the object amplitude, for X= π/2 (“Zernike phase contrast”) the object phase. For a real objective lens, however, the wave aberration is given by X(R) = 2π (.25 Csλ3R4 + 0.5ΔzλR2), Cs meaning the coefficient of spherical aberration and Δz defocusing. Consequently, the transfer functions sin X(R) and cos(X(R)) strongly depend on R such that amplitude and phase of the image wave represent only fragments of the object which, fortunately, supplement each other. However, recording only the amplitude gives rise to the fundamental problems, restricting resolution and interpretability of ordinary electron images:

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14

Ross, Frances M. "Materials Science in the Electron Microscope." MRS Bulletin 19, no. 6 (June 1994): 17–21. http://dx.doi.org/10.1557/s0883769400036691.

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This issue of the MRS Bulletin aims to highlight the innovative and exciting materials science research now being done using in situ electron microscopy. Techniques which combine real-time image acquisition with high spatial resolution have contributed to our understanding of a remarkably diverse range of physical phenomena. The articles in this issue present recent advances in materials science which have been made using the techniques of transmission electron microscopy (TEM), including holography, scanning electron microscopy (SEM), low-energy electron microscopy (LEEM), and high-voltage electron microscopy (HVEM).The idea of carrying out dynamic experiments involving real-time observation of microscopic phenomena has always had an attraction for materials scientists. Ever since the first static images were obtained in the electron microscope, materials scientists have been interested in observing processes in real time: we feel that we obtain a true understanding of a microscopic phenomenon if we can actually watch it taking place. The idea behind “materials science in the electron microscope” is therefore to use the electron microscope—with its unique ability to image subtle changes in a material at or near the atomic level—as a laboratory in which a remarkable variety of experiments can be carried out. In this issue you will read about dynamic experiments in areas such as phase transformations, thin-film growth, and electromigration, which make use of innovative designs for the specimen, the specimen holder, or the microscope itself. These articles speak for themselves in demonstrating the power of real-time analysis in the quantitative exploration of reaction mechanisms.The first transmission electron microscopes operated at low accelerating voltages, up to about 100 kV. This placed a severe limitation on the thickness of foils that could be examined: Heavy elements, for example, had to be made into foils thinner than 0.1 μm. It was felt that any phenomenon whose “mean free path” was comparable to the foil thickness would be significantly affected by the foil surfaces, and therefore would be unsuitable for study in situ. However, technology quickly generated ever higher accelerating voltages, culminating in the giant 3 MeV electron microscopes. At these voltages, electrons can penetrate materials as thick as 6–9 μm for light elements such as Si and Al, and 1 μm for very heavy ones such as Au and U.

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15

Dingley, David J. "Orientation Imaging Microscopy for the Transmission Electron Microscope." Microchimica Acta 155, no. 1-2 (June 6, 2006): 19–29. http://dx.doi.org/10.1007/s00604-006-0502-4.

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16

Ring, Elisabeth A., and Niels de Jonge. "Microfluidic System for Transmission Electron Microscopy." Microscopy and Microanalysis 16, no. 5 (August 31, 2010): 622–29. http://dx.doi.org/10.1017/s1431927610093669.

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AbstractWe present a microfluidic system that maintains liquid flow in a specimen chamber for scanning transmission electron microscope (STEM) imaging. The specimen chamber consists of two ultrathin silicon nitride windows supported by silicon microchips. They are placed in a specimen holder that seals the sample from the vacuum in the electron microscope and incorporates tubing to and from the sample connected to a syringe pump outside the microscope. Using results obtained from fluorescence microscopy of microspheres flowing through the system, an equation to characterize the liquid flow through the system was calibrated. Gold nanoparticles of diameters of 30 and 100 nm moving in liquid were imaged with a 200 kV STEM. It was concluded that despite strong influences from Brownian motion, and sensitivity to small changes in the depth of the bypass channel, the electron microscopy flow data matched the calculated flow speed within an order of magnitude. The system allows for rapid (within a minute) liquid exchange, which can potentially be used, for example, to investigate the response of specimens, e.g., eukaryotic or bacterial cells, to certain stimuli.

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Youngblom, J. H., J. Wilkinson, and J. J. Youngblom. "Telepresence Confocal Microscopy." Microscopy Today 8, no. 10 (December 2000): 20–21. http://dx.doi.org/10.1017/s1551929500054146.

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The advent of the Internet has allowed the development of remote access capabilities to a growing variety of microscopy systems. The Materials MicroCharacterization Collaboratory, for example, has developed an impressive facility that provides remote access to a number of highly sophisticated microscopy and microanalysis instruments, While certain types of microscopes, such as scanning electron microscopes, transmission electron microscopes, scanning probe microscopes, and others have already been established for telepresence microscopy, no one has yet reported on the development of similar capabilities for the confocal laser scanning microscope.

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18

Moldovan, G., X. Li, P. Wilshaw, and AI Kirkland. "Counting Electrons in Transmission Electron Microscopes." Microscopy and Microanalysis 14, S2 (August 2008): 912–13. http://dx.doi.org/10.1017/s1431927608084912.

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19

O’Keefe, M. A., J. Taylor, D. Owen, B. Crowley, K. H. Westmacott, W. Johnston, and U. Dahmen. "Remote On-Line Control of a High-Voltage in situ Transmission Electron Microscope with A Rational User Interface." Proceedings, annual meeting, Electron Microscopy Society of America 54 (August 11, 1996): 384–85. http://dx.doi.org/10.1017/s0424820100164386.

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Remote on-line electron microscopy is rapidly becoming more available as improvements continue to be developed in the software and hardware of interfaces and networks. Scanning electron microscopes have been driven remotely across both wide and local area networks. Initial implementations with transmission electron microscopes have targeted unique facilities like an advanced analytical electron microscope, a biological 3-D IVEM and a HVEM capable of in situ materials science applications. As implementations of on-line transmission electron microscopy become more widespread, it is essential that suitable standards be developed and followed. Two such standards have been proposed for a high-level protocol language for on-line access, and we have proposed a rational graphical user interface. The user interface we present here is based on experience gained with a full-function materials science application providing users of the National Center for Electron Microscopy with remote on-line access to a 1.5MeV Kratos EM-1500 in situ high-voltage transmission electron microscope via existing wide area networks. We have developed and implemented, and are continuing to refine, a set of tools, protocols, and interfaces to run the Kratos EM-1500 on-line for collaborative research. Computer tools for capturing and manipulating real-time video signals are integrated into a standardized user interface that may be used for remote access to any transmission electron microscope equipped with a suitable control computer.

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20

Zimmerman, S. E., and E. M. Unit. "An overview of transmission electron microscopy: Processing, sectioning, transmission electron microscope operation and photography." Pathology 25 (1993): 3. http://dx.doi.org/10.1016/s0031-3025(16)35723-3.

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21

Martone, Maryann E. "Bridging the Resolution Gap: Correlated 3D Light and Electron Microscopic Analysis of Large Biological Structures." Microscopy and Microanalysis 5, S2 (August 1999): 526–27. http://dx.doi.org/10.1017/s1431927600015956.

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One class of biological structures that has always presented special difficulties to scientists interested in quantitative analysis is comprised of extended structures that possess fine structural features. Examples of these structures include neuronal spiny dendrites and organelles such as the Golgi apparatus and endoplasmic reticulum. Such structures may extend 10's or even 100's of microns, a size range best visualized with the light microscope, yet possess fine structural detail on the order of nanometers that require the electron microscope to resolve. Quantitative information, such as surface area, volume and the micro-distribution of cellular constituents, is often required for the development of accurate structural models of cells and organelle systems and for assessing and characterizing changes due to experimental manipulation. Performing estimates of such quantities from light microscopic data can result in gross inaccuracies because the contribution to total morphometries of delicate features such as membrane undulations and excrescences can be quite significant. For example, in a recent study by Shoop et al, electron microscopic analysis of cultured chick ciliary ganglion neurons showed that spiny projections from the plasmalemma that were not well resolved in the light microscope effectively doubled the surface area of these neurons.While the resolution provided by the electron microscope has yet to be matched or replaced by light microscopic methods, one drawback of electron microscopic analysis has always been the relatively small sample size and limited 3D information that can be obtained from samples prepared for conventional transmission electron microscopy. Reconstruction from serial electron micrographs has provided one way to circumvent this latter problem, but remains one of the most technically demanding skills in electron microscopy. Another approach to 3D electron microscopic imaging is high voltage electron microscopy (HVEM). The greater accelerating voltages of HVEM's allows for the use of much thicker specimens than conventional transmission electron microscopes.

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22

Synek, S., and L. Pac. "Transmission electron microscopy of the vitreous body tissue in chronic hemophthalmos." Veterinární Medicína 50, No. 3 (March 28, 2012): 136–38. http://dx.doi.org/10.17221/5606-vetmed.

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Haemolytic products arising in chronic hemophthalmos cause cellular infiltration, necrosis of the vitreous structure, and fibrous membrane formation. In this process, retinal pigment epithelium plays an important role for its antioxidant properties and the capability to phagocyte the decay products.

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23

Begum, Ashrafi, Paul A. Broady, and Brian A. Fineran. "Hot fixation for transmission electron microscopy: applications to coccoid xanthophycean algae." Algological Studies/Archiv für Hydrobiologie, Supplement Volumes 112 (May 1, 2004): 177–84. http://dx.doi.org/10.1127/1864-1318/2004/0112-0177.

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24

Amouric, Marc, and Juan Olives. "Illitization of smectite as seen by high-resolution transmission electron microscopy." European Journal of Mineralogy 3, no. 5 (October 2, 1991): 831–36. http://dx.doi.org/10.1127/ejm/3/5/0831.

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25

Kucheriavyi, Y. P. "TRANSMISSION ELECTRON MICROSCOPY FOR THE DIRECT ANALYSIS OF FIBRIN CLOT STRUCTURE." Biotechnologia Acta 16, no. 2 (April 28, 2023): 30–31. http://dx.doi.org/10.15407/biotech16.02.030.

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The aim of our study was to compare the structure of clots formed as a result of thrombin-induced fibrin polymerization in the presence or absence of monoclonal fibrin-specific antibodies fragments as factors that change the clot structure. We concentrated on the final stage of fibrin clot formation at maximal turbidity point for every sample. Methods. Fibrin polymerization was studied by transmission electron microscopy (TEM) of negatively contrasted samples on H-600 Transmission Electron Microscope (“Hitachi”,Japan); 1% water solution of uranyl acetate (“Merck”, Germany) was used as a negative contrast. For sample preparation, in sterile glass tubes were sequentially added 0.32 mg/mL human fibrinogen, 0.025 M CaCl2 in 0.05 M ammonium formiate buffer (pH 7.9), and a total sample volume was 0.22 mL. The polymerization of fibrin was initiated by the introduction of thrombin at a final concentration of 0.25 NIH/mL. After 180 s, aliquots were taken from the polymerization medium. Each aliquot was diluted to a final fibrinogen concentration of 0.07 mg/mL; 0.01 mL probes of fibrinogen solution were transferred to a carbon lattice, which was treated with a 1% uranyl acetate solution after 2 minutes. Investigations were per-formed using an H-600 electron microscope at 75 kV. Electron microscopic images were obtained at magnification of 20,000 -50,000. Results. Two monoclonal antibodies fragments were obtained towards the mixture of separated Aα-, Bβ- and γ-chains of fibrinogen. Antibodies fragments that were marked as III-1D and I-4A, had different epitopes within fragment Аα105-206 of D-region of fibrinogen. It was shown that addition of antibody fragment I-4A lead to formation of abnormal fibrils that were thinner than in the control sample and were organized in the dense network (Figure). Control sample exhibited the thick fibrils with well-structured classically organized network. The difference between control and I-4A samples demonstrated that antibody I-4A disrupted the structure of polymerized fibrin. In the same time the fibrils obtained in the presence of antibody fragment III-1D were closer to the control ones. Conclusions. TEM is an informative method for the study of the fibrin network formation. Its application allows to estimate the disruption in fi brin formation directly. In a combination with turbidity study and other functional tests TEM can provide important information about molecular mechanisms of clot formation.

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Gibson, J. M. "High Resolution Transmission Electron Microscopy." MRS Bulletin 16, no. 3 (March 1991): 27–33. http://dx.doi.org/10.1557/s0883769400057377.

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The transmission electron microscope (TEM) has had a major impact on materials science in the last five decades, despite the fact that it is necessary to prepare thin samples in order to use the technique. The primary reason for this effectiveness is the ability to access both real space and diffraction data in the same instrument, and to filter in one and observe the effect in the other. This is possible because of the wave nature of electrons and the existence of effective magnetic lenses for focusing. Abbe showed that any lens has the ability to Fourier transform its input wavefield in its focal plane, and to provide a second Fourier transform in the image plane. This is schematically shown in Figure 1. A crystalline object will diffract only in certain directions, with Bragg angles (θB) depending on the inverse of the interplanar spacing. The diffraction pattern is a series of spots in the Fourier, or focal, plane of the lens. A filter placed in the focal plane serves to limit the resolution by limiting the bandwidth of the image, but it also can serve to select certain parts of the Fourier spectrum in the image. The simplest examples of this, as used in optical microscopy, are bright-field and dark-field imaging. In the former the un-scattered beam is allowed to reach the image, in the latter it is not.

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27

Shiojiri, Makoto. "Basic electron microscopy in transmission." Journal of Japan Institute of Light Metals 65, no. 1 (January 30, 2015): 28–40. http://dx.doi.org/10.2464/jilm.65.28.

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Ferreira, P. J., K. Mitsuishi, and E. A. Stach. "In Situ Transmission Electron Microscopy." MRS Bulletin 33, no. 2 (February 2008): 83–90. http://dx.doi.org/10.1557/mrs2008.20.

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AbstractThe articles in this issue of MRS Bulletin provide a sample of what is novel and unique in the field of in situ transmission electron microscopy (TEM). The advent of improved cameras and continued developments in electron optics and stage designs have enabled scientists and engineers to enhance the capabilities of previous TEM analyses. Currently, novel in situ experiments observe and record the behavior of materials in various heating, cooling, straining, or growth environments. In situ TEM techniques are invaluable for understanding and characterizing dynamic microstructural changes. They can validate static TEM experiments and inspire new experimental approaches and new theories.

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29

Liao, Hong-Gang, and Haimei Zheng. "Liquid Cell Transmission Electron Microscopy." Annual Review of Physical Chemistry 67, no. 1 (May 27, 2016): 719–47. http://dx.doi.org/10.1146/annurev-physchem-040215-112501.

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30

MATSUI, Yoshio. "High-resolution transmission electron microscopy." Hyomen Kagaku 10, no. 10 (1989): 719–25. http://dx.doi.org/10.1380/jsssj.10.719.

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KATO, Atsushi, Shinzo KOHJIYA, and Yuko IKEDA. "Three-Dimensional Electron Transmission Microscopy." Kobunshi 55, no. 8 (2006): 616–19. http://dx.doi.org/10.1295/kobunshi.55.616.

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32

FITZGERALD, M., R. MULCAHY, S. MURPHY, C. KEANE, D. COAKLEY, and T. SCOTT. "Transmission electron microscopy studies of." FEMS Immunology and Medical Microbiology 23, no. 1 (January 1999): 57–66. http://dx.doi.org/10.1016/s0928-8244(98)00121-7.

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33

Nakamura, Eiichi, Nico A. J. M. Sommerdijk, and Haimei Zheng. "Transmission Electron Microscopy for Chemists." Accounts of Chemical Research 50, no. 8 (August 15, 2017): 1795–96. http://dx.doi.org/10.1021/acs.accounts.7b00318.

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34

Thomas, Edwin L. "Transmission electron microscopy of polymers." Proceedings, annual meeting, Electron Microscopy Society of America 45 (August 1987): 422–25. http://dx.doi.org/10.1017/s0424820100126901.

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Transmission electron microscopy continues to play a major role in micro-structural characterization of polymers. Additionally, as evidenced by the special symposium on electron crystallography at this EMSA meeting, electron diffraction, as applied to polymer crystals, is also a vigorous area of research. Because many of the interesting morphological features of polymer systems are at and below the micron scale, TEM is a most fruitful technique. Applications range from simple assessment of dispersed phase particle size in blends to HREM molecular imaging of defects in crystals. Thus polymer scientists probe structures over about 4 orders of magnitude in size, and the versatility of the TEM in such endeavors is evident from its essentially ubiquitous appearance in all modern physical sciences laboratories.While there are a host of standard and advanced texts on the application of TEM to metals and to biology, there are only a few review papers on polymer microscopy and one just-published book.

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35

Gulik-Krzywicki, Thaddée. "Freeze-fracture transmission electron microscopy." Current Opinion in Colloid & Interface Science 2, no. 2 (April 1997): 137–44. http://dx.doi.org/10.1016/s1359-0294(97)80017-9.

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36

Muller, David A. "Practical Scanning Transmission Electron Microscopy." Microscopy and Microanalysis 10, S02 (August 2004): 116–17. http://dx.doi.org/10.1017/s1431927604883703.

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37

Crozier, PA, RW Carpenter, DJ Smith, and K. Weiss. "Teaching Advanced Transmission Electron Microscopy." Microscopy and Microanalysis 14, S2 (August 2008): 878–79. http://dx.doi.org/10.1017/s1431927608086418.

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Wang, Z. L., P. Poncharal, and W. A. de Heer. "Nanomeasurements in Transmission Electron Microscopy." Microscopy and Microanalysis 6, no. 3 (May 2000): 224–30. http://dx.doi.org/10.1017/s1431927600000374.

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AbstractNanomaterials have attracted a great deal of research interest recently. The small size of nanostructures constrains the applications of well-established testing and measurement techniques, thus new methods and approaches must be developed for quantitative measurement of the properties of individual nanostructures. This article reports our progress in using in situ transmission electron microscopy to measure the electrical, mechanical, and field-emission properties of individual carbon nanotubes whose microstructure is well-characterized. The bending modulus of a single carbon nanotube has been measured by an electric field-induced resonance effect. A nanobalance technique is demonstrated that can be applied to measure the mass of a tiny particle as light as 22 fg (1 fg = 10−15 g), the smallest balance in the world. Quantum conductance was observed in defect-free nanotubes, which led to the transport of a superhigh current density at room temperature without heat dissipation. Finally, the field-emission properties of a single carbon nanotube are observed, and the field-induced structural damage is reported.

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Schliep, Karl B., P. Quarterman, Jian-Ping Wang, and David J. Flannigan. "Picosecond Fresnel transmission electron microscopy." Applied Physics Letters 110, no. 22 (May 29, 2017): 222404. http://dx.doi.org/10.1063/1.4984586.

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MATTEUCCI, G., G. POZZI, and A. TONOMURA. "Holography and transmission electron microscopy." Le Journal de Physique IV 03, no. C7 (November 1993): C7–2063—C7–2072. http://dx.doi.org/10.1051/jp4:19937330.

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STRUNK, H. P., M. ALBRECHT, and H. SCHEEL. "Cathodoluminescence in transmission electron microscopy." Journal of Microscopy 224, no. 1 (October 2006): 79–85. http://dx.doi.org/10.1111/j.1365-2818.2006.01670.x.

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Giannuzzi, L. A., P. R. Howell, H. W. Pickering, and W. R. Bitler. "Transmission electron microscopy of electrodeposits." Journal of Electronic Materials 22, no. 6 (June 1993): 639–44. http://dx.doi.org/10.1007/bf02666410.

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43

Wang, Z. L., P. Poncharal, and W. A. de Heer. "Nanomeasurements in Transmission Electron Microscopy." Microscopy and Microanalysis 6, no. 3 (May 2000): 224–30. http://dx.doi.org/10.1007/s1000599100023.

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Abstract:

Abstract Nanomaterials have attracted a great deal of research interest recently. The small size of nanostructures constrains the applications of well-established testing and measurement techniques, thus new methods and approaches must be developed for quantitative measurement of the properties of individual nanostructures. This article reports our progress in using in situ transmission electron microscopy to measure the electrical, mechanical, and field-emission properties of individual carbon nanotubes whose microstructure is well-characterized. The bending modulus of a single carbon nanotube has been measured by an electric field-induced resonance effect. A nanobalance technique is demonstrated that can be applied to measure the mass of a tiny particle as light as 22 fg (1 fg = 10−15 g), the smallest balance in the world. Quantum conductance was observed in defect-free nanotubes, which led to the transport of a superhigh current density at room temperature without heat dissipation. Finally, the field-emission properties of a single carbon nanotube are observed, and the field-induced structural damage is reported.

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44

Wright, Robin. "Transmission electron microscopy of yeast." Microscopy Research and Technique 51, no. 6 (2000): 496–510. http://dx.doi.org/10.1002/1097-0029(20001215)51:6<496::aid-jemt2>3.0.co;2-9.

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Robertson, Ian M., and D. Teter. "Controlled environment transmission electron microscopy." Microscopy Research and Technique 42, no. 4 (September 15, 1998): 260–69. http://dx.doi.org/10.1002/(sici)1097-0029(19980915)42:4<260::aid-jemt5>3.0.co;2-u.

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46

Sanders, J. V. "Transmission electron microscopy of catalysts." Journal of Electron Microscopy Technique 3, no. 1 (1986): 67–93. http://dx.doi.org/10.1002/jemt.1060030108.

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O’Keefe, M. A., E. C. Nelson, J. H. Turner, and A. Thust. "Sub-Ångstrom Transmission Electron Microscopy at 300keV." Microscopy and Microanalysis 7, S2 (August 2001): 898–99. http://dx.doi.org/10.1017/s1431927600030567.

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Sub-Ångstrom TEM to a resolution of 0.78Å has been demonstrated by the one-Ångstrom microscope (OÅM) project at the National Center for Electron Microscopy. The OÅM combines a modified CM300FEG-UT with computer software able to generate sub-Angstrom images from experimental image series.Sub-Ångstrom HREM is gaining in importance as researchers design and build artificially-structured nanomaterials such as semiconductor devices, ceramic coatings, and nanomachines. Commonly, such nanostructures include atoms with bond lengths shorter in projection than the point resolution of a mid-voltage HREM. in addition, image simulations have shown that structure determinations of defects such as dislocation cores require sub-Angstrom resolution, as will hold true for grain boundaries and other interfaces.Sub-Ångstrom microscopy with a transmission electron microscope requires meticulous attention to detail. As resolution is improved, resolution-limiting parameters need to be reduced. in particular, aberrations must be minimized, power supplies must be stabilized, and the microscope environment optimized to reduce acoustic and electromagnetic noise in addition to vibration.

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Dumančić, Ena, Lea Vojta, and Hrvoje Fulgosi. "Beginners guide to sample preparation techniques for transmission electron microscopy." Periodicum Biologorum 125, no. 1-2 (October 25, 2023): 123–31. http://dx.doi.org/10.18054/pb.v125i1-2.25293.

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Background purpose: The revolution in microscopy came in 1930 with the invention of electron microscope. Since then, we can study specimens on ultrastructural and even atomic level. Besides transmission electron microscopy (TEM), for which specimen preparation techniques will be described in this article, there are also other types of electron microscopes that are not discussed in this review. Materials and methods: Here, we have described basic procedures for TEM sample preparation, which include tissue sample preparation, chemical fixation of tissue with fixatives, cryo-fixation performed by quick freezing, dehydration with ethanol, infiltration with transitional solvents, resin embedding and polymerization, processing of embedded specimens, sectioning of samples with ultramicrotome, positive and negative contrasting of samples, immunolabeling, and imaging. Conclusion: Such collection of methods can be useful for novices in transmission electron microscopy.

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Brodu, Etienne, Emmanuel Bouzy, Jean Jacques Fundenberger, Benoit Beausir, Lydia Laffont, and Jacques Lacaze. "Crystallography of Growth Blocks in Spheroidal Graphite." Materials Science Forum 925 (June 2018): 54–61. http://dx.doi.org/10.4028/www.scientific.net/msf.925.54.

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A better understanding of spheroidal graphite growth is expected in a near future thanks to widespread use of transmission electron microscopy. However, common transmission electron microscopy is quite time consuming and new indexing techniques are being developed, among them is transmission Kikuchi diffraction in a scanning electron microscope, a recent technique derived from electron backscatter diffraction. In the present work, on-axis transmission Kikuchi diffraction in scanning electron microscope, completed by transmission electron microscopy, was used with the objective of producing new observations on the microstructure of spheroidal graphite. This study shows that disorientations between blocks and sectors in spheroidal graphite are quite large in the early growth stage, which may be indicative of a competition process selecting the best orientations for achieving radial growth along thecdirection of graphite.

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Liu, J., and J. R. Ebner. "Nano-Characterization of Industrial Heterogeneous Catalysts." Microscopy and Microanalysis 4, S2 (July 1998): 740–41. http://dx.doi.org/10.1017/s1431927600023825.

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Catalyst characterization plays a vital role in new catalyst development and in troubleshooting of commercially catalyzed processes. The ultimate goal of catalyst characterization is to understand the structure-property relationships associated with the active components and supports. Among many characterization techniques, only electron microscopy and associated analytical techniques can provide local information about the structure, chemistry, morphology, and electronic properties of industrial heterogeneous catalysts. Three types of electron microscopes are usually used for characterizing industrial supported catalysts: 1) scanning electron microscope (SEM), 2) scanning transmission electron microscope (STEM), and 3) transmission electron microscope (TEM). Each type of microscope has its unique capabilities. However, the integration of all electron microscopic techniques has proved invaluable for extracting useful information about the structure and the performance of industrial catalysts.Commercial catalysts usually have a high surface area with complex geometric structures to enable reacting gases or fluids to access as much of the active surface of the catalyst as possible.

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