Dissertations / Theses on the topic 'Transmission Electron Microscopy'
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Jin, Liang. "Direct electron detection in transmission electron microscopy." Diss., [La Jolla, Calif.] : University of California, San Diego, 2009. http://wwwlib.umi.com/cr/ucsd/fullcit?p3344737.
Full textTitle from first page of PDF file (viewed April 3, 2009). Available via ProQuest Digital Dissertations. Vita. Includes bibliographical references (p. 148-151).
Worden, R. H. "Transmission electron microscopy of metamorphic reactions." Thesis, University of Manchester, 1988. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.234381.
Full textChan, Yu Fai. "Nanostructure characterization by transmission electron microscopy /." View Abstract or Full-Text, 2002. http://library.ust.hk/cgi/db/thesis.pl?PHYS%202002%20CHAN.
Full textIncludes bibliographical references (leaves 62-63). Also available in electronic version. Access restricted to campus users.
McKeown, Karen. "Using scanning electron microscopy (SEM) and transmission electron nncroscopy." Thesis, Queen's University Belfast, 2008. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.492019.
Full textZhang, Yucheng. "Characterisation of GaN using transmission electron microscopy." Thesis, University of Cambridge, 2008. https://www.repository.cam.ac.uk/handle/1810/252119.
Full textFindlay, Scott David. "Theoretical aspects of scanning transmission electron microscopy /." Connect to thesis, 2005. http://eprints.unimelb.edu.au/archive/00001057.
Full textKoda, Nobuko. "Transmission electron microscopy studies of fega alloys." College Park, Md. : University of Maryland, 2003. http://hdl.handle.net/1903/167.
Full textThesis research directed by: Dept. of Material, Science and Engineering. Title from t.p. of PDF. Includes bibliographical references. Published by UMI Dissertation Services, Ann Arbor, Mich. Also available in paper.
Hetherington, C. "Transmission electron microscopy of GaAs/AlGaAs multilayers." Thesis, University of Oxford, 1987. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.379967.
Full textDwyer, C. "Scattering theory for advanced transmission electron microscopy." Thesis, University of Cambridge, 2004. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.598710.
Full textWhittle, Caroline Kay. "Analytical transmission electron microscopy of authigenic chlorites." Thesis, University of Sheffield, 1985. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.324284.
Full textCardoch, Sebastian. "Studying Atomic Vibrations by Transmission Electron Microscopy." Thesis, Uppsala universitet, Materialteori, 2016. http://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-305370.
Full textMeng, Ting, and Yating Yu. "Deconvolution algorithms of 2D Transmission Electron Microscopy images." Thesis, KTH, Optimeringslära och systemteori, 2012. http://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-110096.
Full textSoundararajah, Queenie Yoganandhi. "Characterization of InGaN nanorods using transmission electron microscopy." Thesis, University of Bristol, 2016. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.720816.
Full textNellist, Peter David. "Image resolution improvement in scanning transmission electron microscopy." Thesis, University of Cambridge, 1995. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.361613.
Full textChang, Michael Ming Yuen. "A computer-controlled system in transmission electron microscopy." Thesis, University of Cambridge, 1988. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.292941.
Full textStrobel, Julian [Verfasser]. "Transmission Electron Microscopy on Memristive Devices / Julian Strobel." Kiel : Universitätsbibliothek Kiel, 2019. http://d-nb.info/1185485244/34.
Full textTIYYAGURA, MADHAVI. "TRANSMISSION ELECTRON MICROSCOPY STUDIES IN SHAPE MEMORY ALLOYS." Master's thesis, University of Central Florida, 2005. http://digital.library.ucf.edu/cdm/ref/collection/ETD/id/3913.
Full textM.S.M.E.
Department of Mechanical, Materials and Aerospace Engineering;
Engineering and Computer Science
Materials Science and Engineering
Batstone, J. L. "Cathodoluminescence and transmission electron microscopy characterization of ZnSe." Thesis, University of Bristol, 1985. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.355952.
Full textHolsgrove, Kristina. "Transmission electron microscopy study of domains in ferroelectrics." Thesis, Queen's University Belfast, 2017. https://pure.qub.ac.uk/portal/en/theses/transmission-electron-microscopy-study-of-domains-in-ferroelectrics(e83e215a-bcf7-465b-bab9-31442486bb71).html.
Full textRamasse, Quentin Mathieu. "Diagnosis of aberrations in scanning transmission electron microscopy." Thesis, University of Cambridge, 2005. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.615070.
Full textWebster, Richard Francis. "Transmission electron microscopy of indium gallium nitride nanorods." Thesis, University of Bristol, 2016. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.690381.
Full textLöfgren, André. "Detection of electron vortex beams : Using a scanning transmission electron microscope." Thesis, Uppsala universitet, Materialteori, 2015. http://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-255330.
Full textElektronvirvelstrålar (EVS) är elektronstrålar med en munk-liknande intensitetsprofil. Dessa bär på rörelsemängdsmoment på grund av sin fasdistribution. När de används i ett elektronmikroskop förväntas de vara effektiva för detektering av magnetiska signaler. I denna uppsats har jag undersökt high angle annular dark field (HAADF) bilder som erhållits med hjälp av EVS. Detta gjordes för 300 K och 5K. För 5 K, jämförde jag även HAADF bilder från en vanlig elektronstråle med HAADF bilder från en elektronvirvelstråle. Vad jag fann var att EVS producerade en munkformad intensitetsfördelning runt atomerna. Men när hänsyn till storleken på elektronkällan togs i beaktande kunde inte detta fenomen observeras längre. När bilder från EVS jämfördes med bilder från vanliga elektronstrålar, fann jag att intensiteten av spridda elektroner runt atomkolumnerna var bredare för EVS. Detta kunde observeras även efter att jag tagit hänsyn till elektronkällans storlek.
Bücker, Kerstin. "Characterization of pico- and nanosecond electron pulses in ultrafast transmission electron microscopy." Thesis, Strasbourg, 2017. http://www.theses.fr/2017STRAE014/document.
Full textThis thesis presents a study of ultrashort electron pulses by using the new ultrafast transmission electron microscope (UTEM) in Strasbourg. The first part focuses on the stroboscopic operation mode which works with trains of picosecond multi-electron pulses in order to study ultrafast, reversible processes. A detailed parametric study was carried out, revealing fundamental principles of electron pulse dynamics. New mechanisms were unveiled which define the pulse characteristics. These are trajectory effects, limiting the temporal resolution, and chromatic filtering, which acts on the energy distribution and signal intensity. Guidelines can be given for optimum operation conditions adapted to different experimental requirements. The second part starts with the setup of the single-shot operation mode, based on intense nanosecond electron pulses for the investigation of irreversible processes. Having the first ns-UTEM equipped with an electron energy loss spectrometer, the influence of chromatic aberration was studied and found to be a major limitation in imaging. It has to be traded off with spherical aberration and signal intensity. For the first time, the feasibility of core-loss EELS with one unique ns-electron pulse is demonstrated. This opens a new field of time-resolved experiments
Tao, Shizhong. "High-resolution transmission electron microscopy of copper-oxide compounds /." [S.l.] : [s.n.], 1994. http://e-collection.ethbib.ethz.ch/show?type=diss&nr=10775.
Full textPretorius, Angelika. "Transmission electron microscopy of GaN based, doped semiconductor heterostructures." [S.l.] : [s.n.], 2006. http://deposit.ddb.de/cgi-bin/dokserv?idn=981822002.
Full textHashimoto, Richard Y. "Analytical transmission electron microscopy studies on copper-alumina interfaces." Thesis, Monterey, Calif. : Springfield, Va. : Naval Postgraduate School ; Available from National Technical Information Service, 1999. http://handle.dtic.mil/100.2/ADA362728.
Full textLiberti, Emanuela. "Transmission electron microscopy of titanium dioxide nanoplatelets and nanorods." Thesis, Imperial College London, 2013. http://hdl.handle.net/10044/1/40093.
Full textCherns, Peter David. "A transmission electron microscopy study of AlGaN/GaN heterostructures." Thesis, University of Cambridge, 2007. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.597581.
Full textKuang, Qie. "Structural studies of membrane proteins using transmission electron microscopy." Doctoral thesis, KTH, Strukturell bioteknik, 2015. http://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-161721.
Full textQC 20150320
Wisnet, Andreas. "1D TiO2 nanostructures probed by 2D transmission electron microscopy." Diss., Ludwig-Maximilians-Universität München, 2014. http://nbn-resolving.de/urn:nbn:de:bvb:19-179430.
Full textSmith, Jaqueline Margaret. "Microcharacterisation of halogenated copper phthalocyanines using transmission electron microscopy." Thesis, University of Glasgow, 1997. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.241835.
Full textMurdoch, Susan Jane Tara. "Transmission electron microscopy study of advanced magnetic sensor films." Thesis, University of Glasgow, 2001. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.410170.
Full textTrevor, Colin. "Transmission electron microscopy of chemical vapour deposited diamond films." Thesis, University of Bristol, 1996. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.295064.
Full textJian, Nan. "Scanning transmission electron microscopy of atomic structure of nanoparticle." Thesis, University of Birmingham, 2016. http://etheses.bham.ac.uk//id/eprint/7131/.
Full textKong, Lisa (Lisa Fanzhen). "High-resolution transmission electron microscopy of III-V FinFETs." Thesis, Massachusetts Institute of Technology, 2018. http://hdl.handle.net/1721.1/119065.
Full textCataloged from PDF version of thesis.
Includes bibliographical references (pages 47-50).
III-V materials have great potential for integration into future complementary metal-oxide-semiconductor technology due to their outstanding electron transport properties. InGaAs n-channel metal-oxide-semiconductor field-effect transistors have already demonstrated promising characteristics, and the antimonide material system is emerging as a candidate for p-channel devices. As transistor technology scales down to the sub-10-nm regime, only devices with a 3D configuration can deliver the necessary performance. III-V fin field-effect transistors (finFETs) have displayed impressive characteristics but have shown degradation in performance as the fin width is scaled to the sub-10-nm regime. In this work, we use high-resolution transmission electron microscopy (HRTEM) in an effort to understand how interfacial properties between the channel and high-k dielectric affect device performance. At the interface between the channel material, such as InGaSb or InGaAs, and the high-k gate dielectric, properties of interest include defect density, interdiffusion between the semiconductor and dielectric, and roughness of the dielectric - semiconductor interface. Using HRTEM, we can directly study this interface and try to understand how it is affected by different processing conditions and its correlation with device characteristics. In this thesis, we have analyzed both InGaAs and InGaSb finFETs with state-of-the-art fin widths. Analysis of TEM images was combined with electrical data to correlate interfacial properties with device performance. We compared the materials properties of InGaAs and InGaSb and also explored the impact of processing steps on interfacial properties.
by Lisa Kong.
S.B.
Liu, Chuan-Pu. "Characterisation of ultrathin semiconductor layers using transmission electron microscopy." Thesis, University of Cambridge, 1999. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.624121.
Full textMartín, Malpartida Gemma. "Combined Transmission Electron Microscopy and In-Situ Scanning Tunneling Microscopy Characterization of Nanomaterials." Doctoral thesis, Universitat de Barcelona, 2018. http://hdl.handle.net/10803/663184.
Full textEn aquesta Tesi, s'ha emprat una tècnica de Microscopia Electrònica de Transmissió (TEM, Transmission Electron Microscopy en anglès) in-situ que permet realitzar mesures elèctriques utilitzant una sonda de microscòpia d'efecte túnel (STM, Scanning Tunneling Microscopy en anglès), tot combinant-la amb imatge TEM i tècniques d'espectroscòpia. A més, aquest sistema no només s'ha utilitzat per a mesurar les propietats elèctriques, sinó també per a dur a terme experiments in-situ amb escalfament per efecte Joule o aplicant una tensió mecànica a la superfície de la mostra. D'aquesta manera s'han pogut caracteritzar nanomaterials, des de nanoestructures 2D, estudiant l’efecte del pas de corrent a través d'un sol full d'òxid de grafè, fins a dispositius completament funcionals, com la caracterització piezoelèctrica i ferroelèctrica de capes primes d'òxids funcionals lliures de plom, l'estudi de l’anisotropia en la conductivitat d’estructures ternàries III-V ordenades utilitzades en cèl·lules solars tàndem multicapa i l'estudi amb TEM de la formació de filaments conductors (CF) i del mecanisme de commutació resistiva en tres dispositius ReRAM diferents. En els diferents capítols d'aquesta tesi s'ha donat resposta a problemes de ciència de materials amb l'ajut d'una tècnica de TEM in-situ tot combinant-la amb altres tècniques d'espectroscòpia i difracció. El desenvolupament d'aquesta tècnica ha permès caracteritzar les propietats del materials a nivell nano.
Pierce, William Renton. "High-resolution transmission electron microscopy and electron energy loss spectroscopy of doped nanocarbons." Thesis, University of Manchester, 2014. https://www.research.manchester.ac.uk/portal/en/theses/highresolution-transmission-electron-microscopy-and-electron-energy-loss-spectroscopy-of-doped-nanocarbons(dd1340ba-4a31-49e5-a421-9dd47ea35256).html.
Full textJohnson, Lars. "Nanoindentation in situ a Transmission Electron Microscope." Thesis, Linköping University, Department of Physics, Chemistry and Biology, 2007. http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-8333.
Full textThe technique of Nanoindentation in situ Transmission Electron Microscope has been implemented on a Philips CM20. Indentations have been performed on Si and Sapphire (α-Al2O3) cut from wafers; Cr/Sc multilayers and Ti3SiC2 thin films. Different sample geometries and preparation methods have been evaluated. Both conventional ion and Focused Ion Beam milling were used, with different ways of protecting the sample during milling. Observations were made of bending and fracture of samples, dislocation nucleation and dislocation movement. Basal slip was observed upon unloading in Sapphire. Dislocation movement constricted along the basal planes were observed in Ti3SiC2. Post indentation electron microscopy revealed kink formation in Ti3SiC2 and layer rotation and slip across layers in Cr/Sc multilayer stacks. Limitations of the technique are presented and discussed.
Tanaka, N., H. Iwai, K. Kakushima, E. Okunishi, J. Yamasaki, and S. Inamoto. "Annealing effects on a high-k lanthanum oxide film on Si (001) analyzed by aberration-corrected transmission electron microscopy/scanning transmission electron microscopy and electron energy loss spectroscopy." American Institute of Physics, 2010. http://hdl.handle.net/2237/14189.
Full textRoventa, Elena. "Transmission electron microscopy investigations of the CdSe based quantum structures." [S.l.] : [s.n.], 2006. http://deposit.ddb.de/cgi-bin/dokserv?idn=982375115.
Full textChand, Gopal. "Aberration determination and compensation in high resolution transmission electron microscopy." Thesis, University of Cambridge, 1995. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.362968.
Full textTurnbull, Susan B. "Characterisation of focused ion beam nanostructures by transmission electron microscopy." Thesis, University of Glasgow, 2009. http://theses.gla.ac.uk/572/.
Full textJohnston, Alan Biggar. "Investigation of magnetic microstructures using novel transmission electron microscopy techniques." Thesis, University of Glasgow, 1995. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.294166.
Full textMoulding, Keith M. "Transmission electron microscopy of nonlinear optical glasses and optical fibres." Thesis, University of Essex, 1991. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.279411.
Full textHawkridge, Michael Edward. "Transmission electron microscopy of threading dislocations in gallium nitride epilayers." Thesis, University of Bristol, 2007. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.435731.
Full textRansom, Sara L. (Sara Louise) 1976. "Investigation of phase separation in GaInAsSb using transmission electron microscopy." Thesis, Massachusetts Institute of Technology, 1998. http://hdl.handle.net/1721.1/50484.
Full textLiu, Zhenyu. "Advanced transmission electron microscopy of GaN-based materials and devices." Thesis, University of Cambridge, 2011. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.609893.
Full textKarlsson, Linda. "Transmission Electron Microscopy of 2D Materials : Structure and Surface Properties." Doctoral thesis, Linköpings universitet, Tunnfilmsfysik, 2016. http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-127526.
Full textTey, Chun Maw. "Advanced transmission electron microscopy studies of III-V semiconductor nanostructures." Thesis, University of Sheffield, 2006. http://etheses.whiterose.ac.uk/14901/.
Full text