Relevant bibliographies by topics / Transmission Electron Microscopy

Academic literature on the topic 'Transmission Electron Microscopy'

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Published: 4 June 2021
Last updated: 7 July 2024

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Journal articles on the topic "Transmission Electron Microscopy"

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Schatten, G., J. Pawley, and H. Ris. "Integrated microscopy resource for biomedical research at the university of wisconsin at madison." Proceedings, annual meeting, Electron Microscopy Society of America 45 (August 1987): 594–97. http://dx.doi.org/10.1017/s0424820100127451.

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The High Voltage Electron Microscopy Laboratory [HVEM] at the University of Wisconsin-Madison, a National Institutes of Health Biomedical Research Technology Resource, has recently been renamed the Integrated Microscopy Resource for Biomedical Research [IMR]. This change is designed to highlight both our increasing abilities to provide sophisticated microscopes for biomedical investigators, and the expansion of our mission beyond furnishing access to a million-volt transmission electron microscope. This abstract will describe the current status of the IMR, some preliminary results, our upcoming plans, and the current procedures for applying for microscope time.The IMR has five principal facilities: 1.High Voltage Electron Microscopy2.Computer-Based Motion Analysis3.Low Voltage High-Resolution Scanning Electron Microscopy4.Tandem Scanning Reflected Light Microscopy5.Computer-Enhanced Video MicroscopyThe IMR houses an AEI-EM7 one million-volt transmission electron microscope.
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Möller, Lars, Gudrun Holland, and Michael Laue. "Diagnostic Electron Microscopy of Viruses With Low-voltage Electron Microscopes." Journal of Histochemistry & Cytochemistry 68, no. 6 (May 21, 2020): 389–402. http://dx.doi.org/10.1369/0022155420929438.

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Diagnostic electron microscopy is a useful technique for the identification of viruses associated with human, animal, or plant diseases. The size of virus structures requires a high optical resolution (i.e., about 1 nm), which, for a long time, was only provided by transmission electron microscopes operated at 60 kV and above. During the last decade, low-voltage electron microscopy has been improved and potentially provides an alternative to the use of high-voltage electron microscopy for diagnostic electron microscopy of viruses. Therefore, we have compared the imaging capabilities of three low-voltage electron microscopes, a scanning electron microscope equipped with a scanning transmission detector and two low-voltage transmission electron microscopes, operated at 25 kV, with the imaging capabilities of a high-voltage transmission electron microscope using different viruses in samples prepared by negative staining and ultrathin sectioning. All of the microscopes provided sufficient optical resolution for a recognition of the viruses tested. In ultrathin sections, ultrastructural details of virus genesis could be revealed. Speed of imaging was fast enough to allow rapid screening of diagnostic samples at a reasonable throughput. In summary, the results suggest that low-voltage microscopes are a suitable alternative to high-voltage transmission electron microscopes for diagnostic electron microscopy of viruses.
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Yase, Kiyoshi. "Transmission Electron Microscopy." Kobunshi 43, no. 2 (1994): 94–97. http://dx.doi.org/10.1295/kobunshi.43.94.

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van der Krift, Theo, Ulrike Ziese, Willie Geerts, and Bram Koster. "Computer-Controlled Transmission Electron Microscopy: Automated Tomography." Microscopy and Microanalysis 7, S2 (August 2001): 968–69. http://dx.doi.org/10.1017/s1431927600030919.

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The integration of computers and transmission electron microscopes (TEM) in combination with the availability of computer networks evolves in various fields of computer-controlled electron microscopy. Three layers can be discriminated: control of electron-optical elements in the column, automation of specific microscope operation procedures and display of user interfaces. The first layer of development concerns the computer-control of the optical elements of the transmission electron microscope (TEM). Most of the TEM manufacturers have transformed their optical instruments into computer-controlled image capturing devices. Nowadays, the required controls for the currents through lenses and coils of the optical column can be accessed by computer software. The second layer of development is aimed toward further automation of instrument operation. For specific microscope applications, dedicated automated microscope-control procedures are carried out. in this paper, we will discuss our ongoing efforts on this second level towards fully automated electron tomography. The third layer of development concerns virtual- or telemicroscopy. Most telemicroscopy applications duplicate the computer-screen (with accessory controls) at the microscope-site to a computer-screen at another site. This approach allows sharing of equipment, monitoring of instruments by supervisors, as well as collaboration between experts at remote locations.Electron tomography is a three-dimensional (3D) imaging method with transmission electron microscopy (TEM) that provides high-resolution 3D images of structural arrangements. with electron tomography a series of images is acquired of a sample that is tilted over a large angular range (±70°) with small angular tilt increments.
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Ischenko, A. A., Yu I. Tarasov, E. A. Ryabov, S. A. Aseyev, and L. Schäfer. "ULTRAFAST TRANSMISSION ELECTRON MICROSCOPY." Fine Chemical Technologies 12, no. 1 (February 28, 2017): 5–25. http://dx.doi.org/10.32362/2410-6593-2017-12-1-5-25.

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Ultrafast laser spectral and electron diffraction methods complement each other and open up new possibilities in chemistry and physics to light up atomic and molecular motions involved in the primary processes governing structural transitions. Since the 1980s, scientific laboratories in the world have begun to develop a new field of research aimed at this goal. “Atomic-molecular movies” will allow visualizing coherent dynamics of nuclei in molecules and fast processes in chemical reactions in real time. Modern femtosecond and picosecond laser sources have made it possible to significantly change the traditional approaches using continuous electron beams, to create ultrabright pulsed photoelectron sources, to catch ultrafast processes in the matter initiated by ultrashort laser pulses and to achieve high spatio-temporal resolution in research. There are several research laboratories all over the world experimenting or planning to experiment with ultrafast electron diffraction and possessing electron microscopes adapted to operate with ultrashort electron beams. It should be emphasized that creating a new-generation electron microscope is of crucial importance, because successful realization of this project demonstrates the potential of leading national research centers and their ability to work at the forefront of modern science.
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Brydson, R., A. Brown, L. G. Benning, and K. Livi. "Analytical Transmission Electron Microscopy." Reviews in Mineralogy and Geochemistry 78, no. 1 (January 1, 2014): 219–69. http://dx.doi.org/10.2138/rmg.2014.78.6.

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Sigle, Wilfried. "ANALYTICAL TRANSMISSION ELECTRON MICROSCOPY." Annual Review of Materials Research 35, no. 1 (August 4, 2005): 239–314. http://dx.doi.org/10.1146/annurev.matsci.35.102303.091623.

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Winey, Mark, Janet B. Meehl, Eileen T. O'Toole, and Thomas H. Giddings. "Conventional transmission electron microscopy." Molecular Biology of the Cell 25, no. 3 (February 2014): 319–23. http://dx.doi.org/10.1091/mbc.e12-12-0863.

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Researchers have used transmission electron microscopy (TEM) to make contributions to cell biology for well over 50 years, and TEM continues to be an important technology in our field. We briefly present for the neophyte the components of a TEM-based study, beginning with sample preparation through imaging of the samples. We point out the limitations of TEM and issues to be considered during experimental design. Advanced electron microscopy techniques are listed as well. Finally, we point potential new users of TEM to resources to help launch their project.
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Urban, K. "Picometer Transmission Electron Microscopy." Microscopy and Microanalysis 17, S2 (July 2011): 1314–15. http://dx.doi.org/10.1017/s1431927611007446.

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BROWN, L. M. "Scanning transmission electron microscopy." Le Journal de Physique IV 03, no. C7 (November 1993): C7–2073—C7–2080. http://dx.doi.org/10.1051/jp4:19937331.

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Dissertations / Theses on the topic "Transmission Electron Microscopy"

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Jin, Liang. "Direct electron detection in transmission electron microscopy." Diss., [La Jolla, Calif.] : University of California, San Diego, 2009. http://wwwlib.umi.com/cr/ucsd/fullcit?p3344737.

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Thesis (Ph. D.)--University of California, San Diego, 2009.
Title from first page of PDF file (viewed April 3, 2009). Available via ProQuest Digital Dissertations. Vita. Includes bibliographical references (p. 148-151).
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Worden, R. H. "Transmission electron microscopy of metamorphic reactions." Thesis, University of Manchester, 1988. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.234381.

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Chan, Yu Fai. "Nanostructure characterization by transmission electron microscopy /." View Abstract or Full-Text, 2002. http://library.ust.hk/cgi/db/thesis.pl?PHYS%202002%20CHAN.

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Thesis (M. Phil.)--Hong Kong University of Science and Technology, 2002.
Includes bibliographical references (leaves 62-63). Also available in electronic version. Access restricted to campus users.
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McKeown, Karen. "Using scanning electron microscopy (SEM) and transmission electron nncroscopy." Thesis, Queen's University Belfast, 2008. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.492019.

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Electron impact excitation collisions are important processes for spectral line formation of plasmas. The work undertaken in this thesis focuses on such collisions involving Li-like ions, important in both astrophysical and magnetically confined plasmas. By having reliable atomic and collisional data, such as energy levels, radiative rates and excitation rate coefficients, it is possible to generate models to describe such plasmas. The atomic data were calculated using the General-Purpose Relativistic Structure Program (GRASP; Dyall et al 1989), for several Li-like ions, namely S XIV, Ar XVI, Ca XVIII, Ti XX, Cr XXII, Fe XXIV and Ni XXVI. Including relativistic effects in the calculations leads to the generation of 24 fine-structure energy levels when orbitals with 11,/ =:; 5 are considered. Oscillator strengths, were generated for all 276 transitions arising amongst these levels when maintaining a frozen core of Is2 • Comparisons were made with both theoretical and experimental data available from the publications of Nahar & Pradhan (1999), Nahar (2002), Whiteford et al (2002) and Del Zanna (2006), along with NIST data. Collisional calculations were performed for Fe XXIV, an abundant ion in solar and fusion plasmas, which has the potential to be employed in photo-pumping schemes for X-ray lasers. The calculations were performed using the Dirac Atomic Relativistic Code (DARC; Ait-Tahar, Grant & Norrington 1996), which is a fully relativistic code based on R-matrix theory. In addition to carrying out these calculations, DARC was further developed to provide a solution to the problem of convergence which affects optically allowed transitions in the above threshold energy region. Comparison of these results was made with data already available in the literature, with discrepancies being highlighted and discussed. The work of Berrington & Tully (1997) did not include the n=5 orbital, and comparisons with the results presented here showed how important these are for low temperatures. Discrepancies between this work and that of Whiteford et al (2002) were also identified. Despite being given access to their unpublished data, the source of the identified discrepancies remains elusive. The problems identified require further investigation which lies beyond the scope and resources of the present work.
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Zhang, Yucheng. "Characterisation of GaN using transmission electron microscopy." Thesis, University of Cambridge, 2008. https://www.repository.cam.ac.uk/handle/1810/252119.

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Findlay, Scott David. "Theoretical aspects of scanning transmission electron microscopy /." Connect to thesis, 2005. http://eprints.unimelb.edu.au/archive/00001057.

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Koda, Nobuko. "Transmission electron microscopy studies of fega alloys." College Park, Md. : University of Maryland, 2003. http://hdl.handle.net/1903/167.

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Thesis (M.S.) -- University of Maryland, College Park, 2003.
Thesis research directed by: Dept. of Material, Science and Engineering. Title from t.p. of PDF. Includes bibliographical references. Published by UMI Dissertation Services, Ann Arbor, Mich. Also available in paper.
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Hetherington, C. "Transmission electron microscopy of GaAs/AlGaAs multilayers." Thesis, University of Oxford, 1987. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.379967.

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Dwyer, C. "Scattering theory for advanced transmission electron microscopy." Thesis, University of Cambridge, 2004. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.598710.

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Aspects of a theoretical and computational basis for the simulation of fast electron scattering in a solid due to elastic, electron-phonon and atomic ionisation events are developed. The primary motivation for this work arises from the need for detailed simulations of fast electron scattering to assist in the quantitative interpretation of experimental data acquired using high-spatial-resolution analytical techniques in the scanning transmission electron microscope. The scattering behaviour of Å-scale electron probes in simple atomic structures is examined with specific reference to the origin of core energy-loss signals and the spatial resolution of annular dark-field images generated by such probes. A multiscale theory of the dynamical elastic and inelastic scattering of fast electrons is then developed. This theory is applicable to many forms of inelastic scattering, and is developed in the form of a multi-dimensional extension of the well-known multislice theory of dynamical elastic scattering of fast electrons. Methods for obtaining the key quantities required for the application of this theory to the inelastic scattering of fast electrons due to atomic ionisation are presented. One of these methods is extended to enable the inclusion of relativistic effects in the ionisation process. A preliminary test of the multislice theory is made by comparing calculated and experimental characteristic-loss electron diffraction patterns acquired from silicon. The treatment of incoherent electron waves using Monte Carlo integration, which in certain circumstances can reduce computation time dramatically, is also demonstrated. Finally, the predictions of the theory are compared with those of approximate methods for calculating the origin of the core energy-loss signal in the scanning transmission electron microscope.
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Whittle, Caroline Kay. "Analytical transmission electron microscopy of authigenic chlorites." Thesis, University of Sheffield, 1985. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.324284.

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Books on the topic "Transmission Electron Microscopy"

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Reimer, Ludwig. Transmission Electron Microscopy. Berlin, Heidelberg: Springer Berlin Heidelberg, 1997. http://dx.doi.org/10.1007/978-3-662-14824-2.

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Reimer, Ludwig. Transmission Electron Microscopy. Berlin, Heidelberg: Springer Berlin Heidelberg, 1993. http://dx.doi.org/10.1007/978-3-662-21556-2.

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Reimer, Ludwig. Transmission Electron Microscopy. Berlin, Heidelberg: Springer Berlin Heidelberg, 1989. http://dx.doi.org/10.1007/978-3-662-21579-1.

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Williams, David B., and C. Barry Carter. Transmission Electron Microscopy. Boston, MA: Springer US, 2009. http://dx.doi.org/10.1007/978-0-387-76501-3.

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Carter, C. Barry, and David B. Williams, eds. Transmission Electron Microscopy. Cham: Springer International Publishing, 2016. http://dx.doi.org/10.1007/978-3-319-26651-0.

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Williams, David B., and C. Barry Carter. Transmission Electron Microscopy. Boston, MA: Springer US, 1996. http://dx.doi.org/10.1007/978-1-4757-2519-3.

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1963-, Zhang Xiao-Feng, and Zhang Ze 1953-, eds. Progress in transmission electron microscopy. Berlin: Springer, 2001.

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Zuo, Jian Min, and John C. H. Spence. Advanced Transmission Electron Microscopy. New York, NY: Springer New York, 2017. http://dx.doi.org/10.1007/978-1-4939-6607-3.

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Pennycook, Stephen J., and Peter D. Nellist, eds. Scanning Transmission Electron Microscopy. New York, NY: Springer New York, 2011. http://dx.doi.org/10.1007/978-1-4419-7200-2.

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Deepak, Francis Leonard, Alvaro Mayoral, and Raul Arenal, eds. Advanced Transmission Electron Microscopy. Cham: Springer International Publishing, 2015. http://dx.doi.org/10.1007/978-3-319-15177-9.

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Book chapters on the topic "Transmission Electron Microscopy"

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Williams, David B., and C. Barry Carter. "Electron Sources." In Transmission Electron Microscopy, 73–89. Boston, MA: Springer US, 2009. http://dx.doi.org/10.1007/978-0-387-76501-3_5.

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Kruit, Pieter. "Electron Sources." In Transmission Electron Microscopy, 1–15. Cham: Springer International Publishing, 2016. http://dx.doi.org/10.1007/978-3-319-26651-0_1.

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Weyland, Matthew, and Paul Midgley. "Electron Tomography." In Transmission Electron Microscopy, 343–76. Cham: Springer International Publishing, 2016. http://dx.doi.org/10.1007/978-3-319-26651-0_12.

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Lehmann, Michael, and Hannes Lichte. "Electron Holography." In Transmission Electron Microscopy, 215–32. Cham: Springer International Publishing, 2016. http://dx.doi.org/10.1007/978-3-319-26651-0_8.

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Williams, David B., and C. Barry Carter. "Electron Sources." In Transmission Electron Microscopy, 67–83. Boston, MA: Springer US, 1996. http://dx.doi.org/10.1007/978-1-4757-2519-3_5.

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Reimer, Ludwig. "Analytical Electron Microscopy." In Transmission Electron Microscopy, 375–430. Berlin, Heidelberg: Springer Berlin Heidelberg, 1993. http://dx.doi.org/10.1007/978-3-662-21556-2_9.

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Reimer, Ludwig. "Analytical Electron Microscopy." In Transmission Electron Microscopy, 375–430. Berlin, Heidelberg: Springer Berlin Heidelberg, 1989. http://dx.doi.org/10.1007/978-3-662-21579-1_9.

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De Graef, Marc. "Transmission Electron Microscopy." In Handbook of Nanoscopy, 9–44. Weinheim, Germany: Wiley-VCH Verlag GmbH & Co. KGaA, 2012. http://dx.doi.org/10.1002/9783527641864.ch1.

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Thomas, John Meurig, and Caterina Ducati. "Transmission Electron Microscopy." In Characterization of Solid Materials and Heterogeneous Catalysts, 655–701. Weinheim, Germany: Wiley-VCH Verlag GmbH & Co. KGaA, 2012. http://dx.doi.org/10.1002/9783527645329.ch16.

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Wen, Jian Guo. "Transmission Electron Microscopy." In Practical Materials Characterization, 189–229. New York, NY: Springer New York, 2014. http://dx.doi.org/10.1007/978-1-4614-9281-8_5.

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Conference papers on the topic "Transmission Electron Microscopy"

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Krajnak, Matus. "Transforming transmission electron microscopy with MerlinEM electron counting detector." In European Microscopy Congress 2020. Royal Microscopical Society, 2021. http://dx.doi.org/10.22443/rms.emc2020.594.

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Leth Larsen, Matthew Helmi. "Deep learning assisted transmission electron microscopy." In European Microscopy Congress 2020. Royal Microscopical Society, 2021. http://dx.doi.org/10.22443/rms.emc2020.924.

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Nicholls, D., A. Robinson, J. Wells, A. Moshtaghpour, M. Bahri, A. Kirkland, and N. Browning. "Compressive Scanning Transmission Electron Microscopy." In ICASSP 2022 - 2022 IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP). IEEE, 2022. http://dx.doi.org/10.1109/icassp43922.2022.9746478.

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Nicholls, Daniel. "Distributing the Electron Dose to Minimise Electron Beam Damage in Scanning Transmission Electron Microscopy." In European Microscopy Congress 2020. Royal Microscopical Society, 2021. http://dx.doi.org/10.22443/rms.emc2020.159.

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Jannis, Daen. "SPECTROSCOPIC COINCIDENCE EXPERIMENTS IN TRANSMISSION ELECTRON MICROSCOPY." In European Microscopy Congress 2020. Royal Microscopical Society, 2021. http://dx.doi.org/10.22443/rms.emc2020.993.

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Nabben, David, Joel Kuttruff, Levin Stolz, Andrey Ryabov, and Peter Baum. "Attosecond Electron Microscopy." In CLEO: Fundamental Science. Washington, D.C.: Optica Publishing Group, 2023. http://dx.doi.org/10.1364/cleo_fs.2023.fth1c.1.

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Pennycook, S. J. "Transmission Electron Microscopy: Overview and Challenges." In CHARACTERIZATION AND METROLOGY FOR ULSI TECHNOLOGY: 2003 International Conference on Characterization and Metrology for ULSI Technology. AIP, 2003. http://dx.doi.org/10.1063/1.1622537.

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Elsner, Kristiane. "Optimization of sample preparation for transmission electron microscopy." In European Microscopy Congress 2020. Royal Microscopical Society, 2021. http://dx.doi.org/10.22443/rms.emc2020.849.

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Hetaba, Walid. "Chemical investigation of contamination in transmission electron microscopy." In European Microscopy Congress 2020. Royal Microscopical Society, 2021. http://dx.doi.org/10.22443/rms.emc2020.1072.

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Henke, Jan-Wilke. "Optical beam shaping in an ultrafast transmission electron microscope using inelastic electron-light scattering." In European Microscopy Congress 2020. Royal Microscopical Society, 2021. http://dx.doi.org/10.22443/rms.emc2020.1462.

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Reports on the topic "Transmission Electron Microscopy"

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Pennycook, S. J., and A. R. Lupini. Image Resolution in Scanning Transmission Electron Microscopy. Office of Scientific and Technical Information (OSTI), June 2008. http://dx.doi.org/10.2172/939888.

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Reed, B., M. Armstrong, K. Blobaum, N. Browning, A. Burnham, G. Campbell, R. Gee, et al. Time Resolved Phase Transitions via Dynamic Transmission Electron Microscopy. Office of Scientific and Technical Information (OSTI), February 2007. http://dx.doi.org/10.2172/902321.

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Dietz, N. L. Transmission electron microscopy analysis of corroded metal waste forms. Office of Scientific and Technical Information (OSTI), April 2005. http://dx.doi.org/10.2172/861616.

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Tosten, M. H. Transmission electron microscopy of Al-Li control rod pins. Office of Scientific and Technical Information (OSTI), September 1992. http://dx.doi.org/10.2172/6282616.

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Tosten, M. H. Transmission electron microscopy of Al-Li control rod pins. Office of Scientific and Technical Information (OSTI), September 1992. http://dx.doi.org/10.2172/10170120.

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Isaacs, H. S., Y. Zhu, R. L. Sabatini, and M. P. Ryan. Transmission electron microscopy of undermined passive films on stainless steel. Office of Scientific and Technical Information (OSTI), June 1999. http://dx.doi.org/10.2172/353181.

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TOSTEN, MICHAEL. Transmission Electron Microscopy Study of Helium-Bearing Fusion Welds(U). Office of Scientific and Technical Information (OSTI), November 2005. http://dx.doi.org/10.2172/882713.

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Scott, Keana C., and Lucille A. Giannuzzi. Strategies for transmission electron microscopy specimen preparation of polymer composites. National Institute of Standards and Technology, September 2015. http://dx.doi.org/10.6028/nist.sp.1200-16.

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Watt, John Daniel. Soft matter and nanomaterials characterization by cryogenic transmission electron microscopy. Office of Scientific and Technical Information (OSTI), January 2020. http://dx.doi.org/10.2172/1593111.

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Batra, Ravi. Transmission Electron Microscopy of Rapidly Solidified Du-5% W Alloy. Fort Belvoir, VA: Defense Technical Information Center, January 1991. http://dx.doi.org/10.21236/ada231449.

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