Dissertations / Theses on the topic 'Titanium Carbide Thin Films'
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Dedigamuwa, Gayan S. "Formation of nanocoatings by laser-assisted spray pyrolysis and laser ablation on 2d gold nanotemplates." [Tampa, Fla.] : University of South Florida, 2005. http://purl.fcla.edu/fcla/etd/SFE0001205.
Full textGuest, Andrew John. "Precursors for doped boron carbide thin films." Thesis, University of Salford, 2010. http://usir.salford.ac.uk/26700/.
Full textWilhelmsson, Ola. "Synthesis and Characterization of Ternary Carbide Thin Films." Doctoral thesis, Uppsala : Acta Universitatis Upsaliensis Acta Universitatis Upsaliensis, 2007. http://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-8265.
Full textTengstrand, Olof. "Transition metal carbide nanocomposite and amorphous thin films." Doctoral thesis, Linköpings universitet, Tunnfilmsfysik, 2014. http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-104929.
Full textDeva, Reddy Jayadeep. "Mechanical properties of Silicon Carbide (SiC) thin films." [Tampa, Fla] : University of South Florida, 2008. http://purl.fcla.edu/usf/dc/et/SFE0002615.
Full textScabarozi, Theodore H. Jr Barsoum M. W. "Combinatorial investigation of nanolaminate ternary carbide thin films /." Philadelphia, Pa. : Drexel University, 2009. http://hdl.handle.net/1860/3189.
Full textDeva, Reddy Jayadeep. "Mechanical Properties of Silicon Carbide (SiC) Thin Films." Scholar Commons, 2007. https://scholarcommons.usf.edu/etd/210.
Full textTan, Keng Ean. "Quantum mechanical modelling of refractory transition metal carbide films." Thesis, University of Oxford, 1995. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.294188.
Full textFolkenant, Matilda. "Synthesis and Characterization of Amorphous Carbide-based Thin Films." Doctoral thesis, Uppsala universitet, Oorganisk kemi, 2015. http://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-247282.
Full textLai, Chung-Chuan. "Phase Formation of Nanolaminated Transition Metal Carbide Thin Films." Doctoral thesis, Linköpings universitet, Tunnfilmsfysik, 2017. http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-137367.
Full textGan, Wee Yong Chemical Sciences & Engineering Faculty of Engineering UNSW. "Synthesis and characterization of titanium dioxide thin films." Publisher:University of New South Wales. Chemical Sciences & Engineering, 2009. http://handle.unsw.edu.au/1959.4/43310.
Full textKandasamy, Ispran S. "Metalorganic chemical vapour deposited titanium dioxide thin films." Thesis, Brunel University, 1988. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.235909.
Full textDesai, Amit Y. "Fabrication and characterization of titanium-doped hydroxyapatite thin films." Thesis, University of Cambridge, 2007. http://www.dspace.cam.ac.uk/handle/1810/194740.
Full textLeClair, Patrick R. (Patrick Royce) 1976. "Titanium nitride thin films by the electron shower process." Thesis, Massachusetts Institute of Technology, 1998. http://hdl.handle.net/1721.1/50025.
Full textValente, João Pedro Mire Dores Pulido. "Calcium copper titanium oxide thin films for microelectronic applications." Master's thesis, Universidade de Aveiro, 2010. http://hdl.handle.net/10773/7612.
Full textRecent research has shown that the perovskite-related body-centred cubic material CaCu3Ti4O12 (CCTO) exhibit extraordinarily giant dielectric constant at room temperature (ε ≈ 104-105). Besides, these high dielectric constants were found to be nearly constant in the temperature range between 100 and 500K [1, 2]; which makes it even more attractive from the technological point of view. These properties are very important for device implementation and make CCTO a promising candidate for microelectronic applications (like decoupling capacitors, random access memories), microwave devices (for applications in mobile phones), antennas (for example, planar micro-strip antenna on CCTO substrate for 3-GHz operation) [3]. In the microelectronics device field, homogeneous and smooth thin films with colossal dielectric constant and with low dielectric loss are desirable. In the literature, only five reports on undoped CCTO films on silicon based substrates prepared by sol-gel method can be found. The majority of these authors did not present the dielectric and microstructural properties of the produced CCTO films. In this work, thin films of CCTO were prepared by sol-gel method by spin coating a nontoxic chemical solution on typical microelectronic substrates, Si (wafer) / SiO2 (300 nm) / TiO2 (20 nm) / Pt (150 nm). Two different precursor solutions were studied and optimized for film production. These two solutions differ mainly on the titanium precursor, although some preparation parameters where changed as well. One of the main objectives of the thesis was to develop nontoxic precursors for CSD method and accordingly, solutions were prepared without methoxyethanol (highly toxic). This constitutes a great improvement considering the good properties obtained for the 300-400 nm thick CCTO films prepared in this work: dielectric permittivity, ε of 500 and dielectric loss, tan of 0.19, for films derived from titanium butoxide precursor solutions (BUT-CCTO) and ε ≈ 620 and dielectric loss 0.18 for those derived from titanium isopropoxide precursor solutions (ISO-CCTO), all values at 1 kHz. In literature, toxic precursor solution of CCTO leads to films with values for dielectric permittivity of 1000-2000 and dielectric loss between 0.5 – 0.04 [52]. Best reports on nontoxic solutions for spin coating method presented dielectric constant (≈ 150-250) and losses around 0.2-0.5 [45]. The physical properties of the films were characterised. The structural and microstructural characterization was conducted via X-Ray Diffraction (XRD), Scanning Electron Microscopy (SEM) and Atomic Force Microscopy (AFM). [CALCIUM COPPER TITANIUM OXIDE THIN FILMS FOR MICROELECTRONIC APPLICATIONS] 10 For the electrical characterization the dielectric constant and dielectric losses were measured at room temperature in the range 100 Hz-1 MHz. AFM microstructure and especially potential images, confirmed IBLC model for conduction, since grain and grain boundaries presented different potentials due to their different electrical behaviour. This result was obtained for every sample made with both solutions. Grain size has a considerable influence on the dielectric properties of the thin films. grain films present high dielectric constant and high dielectric loss. Small grain origins lower dielectric constant but also low dielectric loss. In this work and based on IBLC model, it was found that grain and high grain boundaries density will guarantee good permittivity according with [6, 9], although with grain size increase, grain boundaries density decrease. An intermediate stage for grain size must be achieved depending on the solution used. Considering the dielectric loss, it was found to respect mainly to grain boundaries. High density of grain boundaries promotes second phase segregation (TiO2) due to low temperature heat treatments and worst insulator behaviour [18,24]. For one side, high density will lower dielectric loss confirming [6,13], on the other side, second phase segregation will increase it, as reported in [18, 24]. A compromise between the capacity of the semiconductor grains to admit charges and the resistivity of the insulator grain boundaries must be achieved to obtain good quality CCTO thin films. The admission of charges by the grain is controlled by the grain size (heat treatment procedure) meanwhile the current density of the grain boundaries is controlled by second phase segregation (solution procedure) and grain boundaries density (heat treatment procedure). As a final output of this work a new non-toxic precursor solution was developed as an alternative way for preparing CCTO thin films of high dielectric constant for microelectronic applications.
Johnson, Saccha Ellen. "Atmospheric pressure chemical vapour deposition of titanium nitride from titanium tetrachloride and ammonia." Thesis, University of Southampton, 1996. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.242208.
Full textNedfors, Nils. "Synthesis and Characterization of Multifunctional Carbide- and Boride-based Thin Films." Doctoral thesis, Uppsala universitet, Oorganisk kemi, 2014. http://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-219040.
Full textRaghavan, Srikanth. "Comparative studies of 6H-SiC surface preparation." Morgantown, W. Va. : [West Virginia University Libraries], 2008. https://eidr.wvu.edu/etd/documentdata.eTD?documentid=5766.
Full textTitle from document title page. Document formatted into pages; contains xii, 56 p. : ill. (some col.). Includes abstract. Includes bibliographical references (p. 51-53).
Thomas, T. "Chemical vapour deposition of titanium and vanadium arsenide thin films." Thesis, University College London (University of London), 2011. http://discovery.ucl.ac.uk/1310479/.
Full textGulses, Alkan Ali. "Ellipsometric And Uv-vis Transmittance Analysis Of Amorphous Silicon Carbide Thin Films." Master's thesis, METU, 2004. http://etd.lib.metu.edu.tr/upload/12605589/index.pdf.
Full text) on the ellipsometric variables are experimentally studied
the optimum procedures have been determined. Hydrogenated amorphous silicon carbide (a-Si1-xCx:H) thin films are produced by plasma enhanced chemical vapor deposition (PECVD) technique with a circular reactor, in a way that RF power and carbon contents are taken as variables. These samples are analyzed using multiple angle of incidence ellipsometer and uv-vis spectrometer. These measurements have inhomogeneities in optical constants, such as thicknesses, refractive indices and optical energy gaps along the radial direction of the reactor electrode for different power and carbon contents.
Künle, Matthias [Verfasser]. "Silicon carbide single and multilayer thin films for photovoltaic applications / Matthias Künle." München : Verlag Dr. Hut, 2011. http://d-nb.info/1017353514/34.
Full textHögström, Jonas. "Corrosion and Surface Studies of Stainless Steel and Chromium Carbide Thin-Films." Doctoral thesis, Uppsala universitet, Institutionen för kemi - Ångström, 2013. http://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-208410.
Full textKhoele, Joshua Relebogile. "Deposition and structural properties of silicon carbide thin films for solar cell applications." University of the Western Cape, 2014. http://hdl.handle.net/11394/4345.
Full textThe growth of hydrogenated amorphous silicon carbide (a-SiC:H) thin films deposited by Hot- Wire Chemical Vapour Deposition (HWCVD) for solar cell applications has been studied. The films were characterized for structural properties using Fourier Transform Infrared Spectroscopy FTIR, Elastic Recoil Detection Analysis (ERDA), X-ray Diffraction (XRD), Transmission Electron Microscopy (TEM) and Raman Spectroscopy (RS). A low temperature of the substrate heater maintained at 280 °C was used in this thesis due to the demand of low-cost solar cells based on cheap substrate that require deposition at such low temperatures. In this thesis, we showed that the structural properties of a-SiC:H films are dependent on the filament temperature and also on the CH4 gas flow rate. It was shown that in non-stoichiometric a-SiC:H, hydrogen content throughout the deposited films varies with depth. An attempt is done in this study to determine, for the first time the absorption strength of the C-Hn bonds in the 950 -1050 cm-1 band of the FTIR spectrum. Real-time ERDA was used to determine the hydrogen kinetics parameters in a single temperature ramp; a model based on the solution of the diffusion equation is used for this effect.
Ahmed, Fatema. "Structural properties and optical modelling of SiC thin films." University of the Western Cape, 2020. http://hdl.handle.net/11394/7284.
Full textAmorphous silicon carbide (a-SiC) is a versatile material due to its interesting mechanical, chemical and optical properties that make it a candidate for application in solar cell technology. As a-SiC stoichiometry can be tuned over a large range, consequently is its bandgap. In this thesis, amorphous silicon carbide thin films for solar cells application have been deposited by means of the electron-beam physical vapour deposition (e-beam PVD) technique and have been isochronally annealed at varying temperatures. The structural and optical properties of the films have been investigated by Fourier transform Infrared and Raman spectroscopies, X-ray diffraction, Scanning Electron Microscopy, Energy Dispersive X-ray Spectroscopy and UV-VIS-NIR spectroscopy. The effect of annealing is a gradual crystallization of the amorphous network of as-deposited silicon carbide films and consequently the microstructural and optical properties are altered. We showed that the microstructural changes of the as-deposited films depend on the annealing temperature. High temperature enhances the growth of Si and SiC nanocrystals in amorphous SiC matrix. Improved stoichiometry of SiC comes with high band gap of the material up to 2.53 eV which makes the films transparent to the visible radiation and thus they can be applied as window layer in solar cells.
Taylor, Matthew Bruce, and matthew taylor@rmit edu au. "A Study of Aluminium Nitride and Titanium Vanadium Nitride Thin Films." RMIT University. Applied Science, 2007. http://adt.lib.rmit.edu.au/adt/public/adt-VIT20080529.151820.
Full textHyde, Robert H. "Hollow-electrode pulsed plasma deposition of titanium and carbon thin films." [Tampa, Fla] : University of South Florida, 2006. http://purl.fcla.edu/usf/dc/et/SFE0001856.
Full textAhuja, Rajiv. "The synthesis, structure and properties of titanium-aluminum multilayered thin films /." The Ohio State University, 1994. http://rave.ohiolink.edu/etdc/view?acc_num=osu1487849696966896.
Full textHu, Xiao. "Ultra-thin oxide films." Thesis, University of Oxford, 2016. https://ora.ox.ac.uk/objects/uuid:d7373376-84f1-459e-bffb-f16ce43f02b7.
Full textGold, Jeffrey Stephen. "Characterization of a novel methyl radical source and related thin film growth studies." Morgantown, W. Va. : [West Virginia University Libraries], 2000. http://etd.wvu.edu/templates/showETD.cfm?recnum=1787.
Full textTitle from document title page. Document formatted into pages; contains xi, 108 p. : ill. (some col.) + appendix; 37 p. : ill. Includes abstract. Includes bibliographical references (p. 103-108; p. A-37).
Ribeiro, A. Tome. "A study of the i-transition in rf-sputtered titanium nitride films." Thesis, Cranfield University, 1990. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.386196.
Full textShort, Eugene L. "Growth of oxide thin films on 4H- silicon carbide in an afterglow reactor." [Tampa, Fla] : University of South Florida, 2006. http://purl.fcla.edu/usf/dc/et/SFE0001839.
Full textCrocker, Janina. "Measurement of the Young's modulus of Hexoloy silicon carbide thin films using nanoindentation." Thesis, McGill University, 2007. http://digitool.Library.McGill.CA:80/R/?func=dbin-jump-full&object_id=18414.
Full textDes structures formées de couches minces métalliques et céramiques sont couramment utilisées dans la conception de microsystèmes électromécaniques (MEMS). Ces derniers se retrouvent dans plusieurs domaines, tels que les capteurs, les vidéoprojecteurs et les systèmes de génération d'énergie portable. Pour concevoir des MEMS fiables, les propriétés mécaniques de ces couches minces doivent êtres connues précisément. Le but de cette thèse est d'utiliser la méthode de nanoindentation pour déterminer les propriétés mécaniques des couches minces de carbure de silicium Hexoloy-SG. Ce matériel à été développé pour des microsystèmes opérant dans des conditions thermiques et chimiques extrêmes. La nanoindentation a été réalisée par le système TriboIndenter® de Hysitron équipé d'une pointe Berkovich en diamant, de forme pyramidale à base triangulaire. Chaque indentation comprend un cycle charge/décharge durant lequel la pointe indentatrice est enfoncée et retirée du matériel par une force calibrée, tandis que la profondeur de l'indentation est surveillée continuellement au nanomètre près. La première partie de cette thèse décrit une procédure détaillée pour la nanoindentation avec le système TriboIndenter®, incluant la calibration de l'instrument utilisant une norme en quartz monolithique. Également, l'identification d'erreurs expérimentales reliées au système de nanoindentation dues à la dérive, aux vibrations et à la rugosité de l'échantillon et leurs mesures correctrices sont présentées. Par après, cette méthodologie a été utilisée pour tester les propriétés mécaniques d'une couche mince de Hexoloy-SG mesurant 2.1 µm d'épaisseur, déposée sur un substrat de silicium monocristallin comptant 500 µm d'épaisseur. La force exercée par l'indentateur sur l'échantillon varie de 1,000 µN à 11,000 µN, pour que la profondeur de l'indentation demeure en deçà de 10% de l'épaisseur totale de la co
Yakovlev, A. V., and A. V. Vinogradov. "Colloids for Inkjet Printing of Highly Photoactive Thin Films." Thesis, Sumy State University, 2015. http://essuir.sumdu.edu.ua/handle/123456789/42615.
Full textTengdelius, Lina. "Growth and Characterization of ZrB2 Thin Films." Licentiate thesis, Linköpings universitet, Tunnfilmsfysik, 2013. http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-98308.
Full textWorbs, Peter. "Wetting behavior of titanium carbide films for carbon-copper braze joints in high heat flux components." kostenfrei, 2009. http://mediatum2.ub.tum.de/node?id=823480.
Full textSchmidt, Diedrich A. "Titanium dioxide thin films : understanding nanoscale oxide heteroepitaxy for silicon-based applications /." Thesis, Connect to this title online; UW restricted, 2005. http://hdl.handle.net/1773/9756.
Full textAlfredsson, Ylvi. "Electronic and Structural Properties of Thin Films of Phthalocyanines and Titanium Dioxide." Doctoral thesis, Uppsala : Acta Universitatis Upsaliensis : Univ.-bibl. [distributör], 2005. http://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-4802.
Full textJain, Rakhi. "Biological interactions of fibroblasts with smooth microtextured commercially-pure titanium thin films /." The Ohio State University, 2002. http://rave.ohiolink.edu/etdc/view?acc_num=osu1486457871784368.
Full textSchulz, Meghan E. "Nitrogen- and carbon-doped titanium dioxide thin films for solar hydrogen generation." Access to citation, abstract and download form provided by ProQuest Information and Learning Company; downloadable PDF file, 95 p, 2009. http://proquest.umi.com/pqdweb?did=1896914051&sid=4&Fmt=2&clientId=8331&RQT=309&VName=PQD.
Full textShelberg, Daniel Thomas. "PHYSICAL AND CHEMICAL PROPERTIES OF AMBIENT TEMPERATURE SPUTTERED SILICON CARBIDE FILMS." Cleveland, Ohio : Case Western Reserve University, 2010. http://rave.ohiolink.edu/etdc/view?acc_num=case1269963941.
Full textDepartment of Chemical Engineering Title from PDF (viewed on 2010-05-25) Includes abstract Includes bibliographical references and appendices Available online via the OhioLINK ETD Center
Goyal, Amita. "Titanium dioxide-germanium nanocomposites for photovoltaic applications." Access to citation, abstract and download form provided by ProQuest Information and Learning Company; downloadable PDF file Mb., 104 p, 2006. http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&res_dat=xri:pqdiss&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&rft_dat=xri:pqdiss:1435250.
Full textZiemer, Katherine S. "Studies of the initial stage of silicon carbide growth on silicon." Morgantown, W. Va. : [West Virginia University Libraries], 2001. http://etd.wvu.edu/templates/showETD.cfm?recnum=1815.
Full textTitle from document title page. Document formatted into pages; contains xvi, 217, 2 p. : ill. (some col.). Vita. Includes abstract. Includes bibliographical references (p. 198-207).
Ge, Xiang. "Electrochemical deposition of fluoridated calcium phosphate on titanium substrates /." View abstract or full-text, 2008. http://library.ust.hk/cgi/db/thesis.pl?MECH%202008%20GE.
Full textPalmquist, Jens-Petter. "Carbide and MAX-Phase Engineering by Thin Film Synthesis." Doctoral thesis, Uppsala : Acta Universitatis Upsaliensis : Univ.-bibl. [distributör], 2004. http://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-3972.
Full textRichards, Mark Rowse. "Process development for IrAl coated SiC-C functionally graded material for the oxidation protection of graphite /." Thesis, Connect to this title online; UW restricted, 1996. http://hdl.handle.net/1773/10574.
Full textDusatko, Tomas A. "Silicon carbide RF-MEM resonators." Thesis, McGill University, 2006. http://digitool.Library.McGill.CA:80/R/?func=dbin-jump-full&object_id=100250.
Full textSeveral different clamped-clamped beam resonator designs were successfully fabricated and tested using a custom built vacuum system, with measured frequencies ranging from 5MHz to 25MHz. A novel thermal tuning method is also demonstrated, using integrated heaters directly on the resonant structure to exploit the temperature dependence of the Young's modulus and thermally induced stresses.
Ratclifife, Peter John. "Plasma assisted deposition of thin films using molecular titanium alkoxide and amido precursors." Thesis, Durham University, 1995. http://etheses.dur.ac.uk/5445/.
Full textEdusi, C. "Aerosol assisted chemical vapour deposition of titanium dioxide and tungsten oxide thin films." Thesis, University College London (University of London), 2014. http://discovery.ucl.ac.uk/1434745/.
Full textLin, Wen-Bin, and 林文彬. "Titanium carbide thin films grown by reactive r.f. magnetron sputtering." Thesis, 1993. http://ndltd.ncl.edu.tw/handle/06076245950028682073.
Full text國立交通大學
電子研究所
81
The experiments were performed in a diode magnetron r.f. sputtering unit. The deposition rate, composition, diffraction spectra, depth profile, cross section and surface microstructure of the TiC thin films, obtained by sputtering in CH4 pressure range from 0.25 * 10-3 to 0.98 * 10-3 Torr, have been measured. The results of deposition rate and composition measurements show that the amount of reactive constituents incorporated into the growing films depends on whether a TiC compound has been formed on the surface of the target. At low CH4 partial pressure (<0.36 mT) the system operated under conditions such that pure Ti was sputtered. At CH4 partial pressure higher than 0.36mT species originating from the target determine the composition of the coatings. The result of depth profile measurement show that the depth of C penetration into the interfacial region is less than that of Ti , and the study of diffraction spectra of the flms show that the films are single TiC phase at PCH4 = 0.87 to 0.91 mT. The important process parameter was found to be the partial pressure ratio of reactive gases CH4 to the sputtering gases Ar.
Kiran, Vankayala. "Physicochemical, Electrical and Electrochemical Studies on Titanium Carbide-Based Nanostructures." Thesis, 2013. http://etd.iisc.ac.in/handle/2005/3325.
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