Relevant bibliographies by topics / Tip-sample-substrate interaction

Academic literature on the topic 'Tip-sample-substrate interaction'

Author: Grafiati
Published: 14 March 2023

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Journal articles on the topic "Tip-sample-substrate interaction"

1

Jaafar, Miriam, Oscar Iglesias-Freire, Luis Serrano-Ramón, Manuel Ricardo Ibarra, Jose Maria de Teresa, and Agustina Asenjo. "Distinguishing magnetic and electrostatic interactions by a Kelvin probe force microscopy–magnetic force microscopy combination." Beilstein Journal of Nanotechnology 2 (September 7, 2011): 552–60. http://dx.doi.org/10.3762/bjnano.2.59.

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The most outstanding feature of scanning force microscopy (SFM) is its capability to detect various different short and long range interactions. In particular, magnetic force microscopy (MFM) is used to characterize the domain configuration in ferromagnetic materials such as thin films grown by physical techniques or ferromagnetic nanostructures. It is a usual procedure to separate the topography and the magnetic signal by scanning at a lift distance of 25–50 nm such that the long range tip–sample interactions dominate. Nowadays, MFM is becoming a valuable technique to detect weak magnetic fields arising from low dimensional complex systems such as organic nanomagnets, superparamagnetic nanoparticles, carbon-based materials, etc. In all these cases, the magnetic nanocomponents and the substrate supporting them present quite different electronic behavior, i.e., they exhibit large surface potential differences causing heterogeneous electrostatic interaction between the tip and the sample that could be interpreted as a magnetic interaction. To distinguish clearly the origin of the tip–sample forces we propose to use a combination of Kelvin probe force microscopy (KPFM) and MFM. The KPFM technique allows us to compensate in real time the electrostatic forces between the tip and the sample by minimizing the electrostatic contribution to the frequency shift signal. This is a great challenge in samples with low magnetic moment. In this work we studied an array of Co nanostructures that exhibit high electrostatic interaction with the MFM tip. Thanks to the use of the KPFM/MFM system we were able to separate the electric and magnetic interactions between the tip and the sample.
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2

Chan, Nicholas, Carrie Lin, Tevis Jacobs, Robert W. Carpick, and Philip Egberts. "Quantitative determination of the interaction potential between two surfaces using frequency-modulated atomic force microscopy." Beilstein Journal of Nanotechnology 11 (May 6, 2020): 729–39. http://dx.doi.org/10.3762/bjnano.11.60.

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The interaction potential between two surfaces determines the adhesive and repulsive forces between them. It also determines interfacial properties, such as adhesion and friction, and is a key input into mechanics models and atomistic simulations of contacts. We have developed a novel methodology to experimentally determine interaction potential parameters, given a particular potential form, using frequency-modulated atomic force microscopy (AFM). Furthermore, this technique can be extended to the experimental verification of potential forms for any given material pair. Specifically, interaction forces are determined between an AFM tip apex and a nominally flat substrate using dynamic force spectroscopy measurements in an ultrahigh vacuum (UHV) environment. The tip geometry, which is initially unknown and potentially irregularly shaped, is determined using transmission electron microscopy (TEM) imaging. It is then used to generate theoretical interaction force–displacement relations, which are then compared to experimental results. The method is demonstrated here using a silicon AFM probe with its native oxide and a diamond sample. Assuming the 6-12 Lennard-Jones potential form, best-fit values for the work of adhesion (W adh) and range of adhesion (z 0) parameters were determined to be 80 ± 20 mJ/m2 and 0.6 ± 0.2 nm, respectively. Furthermore, the shape of the experimentally extracted force curves was shown to deviate from that calculated using the 6-12 Lennard-Jones potential, having weaker attraction at larger tip–sample separation distances and weaker repulsion at smaller tip–sample separation distances. This methodology represents the first experimental technique in which material interaction potential parameters were verified over a range of tip–sample separation distances for a tip apex of arbitrary geometry.
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Gilliss, Shelley R., Jeffrey K. Fairer, N. Ravishankar, Mark G. Schwabel, and C. Barry Carter. "Microanalysis of AFM Tips Coated with Cerium Oxide." Microscopy and Microanalysis 7, S2 (August 2001): 1236–37. http://dx.doi.org/10.1017/s1431927600032256.

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Cerium oxide is widely used for chemomechanical polishing (CMP) of silicate glasses. Uses include finishing of optical elements and planarizing dielectrics in the semiconductor industry. This study is designed to investigate the fundamentals of the cerium oxide/silica CMP process by measuring the interaction force between silicate glasses and cerium oxide. Surface forces involved in the polishing of glass by a cerium oxide abrasive can be studied in a controlled manner by measuring sample-tip interactions between a glass substrate and a cerium oxide tip in an atomic force microscope (AFM). Commercially available AFM tips have been coated with thin, uniform films of cerium oxide. By using a square pyramid tip as a template for the shape of the cerium oxide film, challenges related to irregular or blunt tip shape can be overcome. However, complete characterization of structure, shape and chemical composition is required before useful information can be obtained using the AFM.
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Yamanishi, Junsuke, Hidemasa Yamane, Yoshitaka Naitoh, Yan Jun Li, and Yasuhiro Sugawara. "Local spectroscopic imaging of a single quantum dot in photoinduced force microscopy." Applied Physics Letters 120, no. 16 (April 18, 2022): 161601. http://dx.doi.org/10.1063/5.0088634.

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Analysis of environmentally sensitive materials is essential for developing and optimizing nanostructured photochemical materials and devices. Photoinduced force microscopy (PiFM) is a promising local spectroscopic technique to visualize nanoscale local optical responses by measuring the optical forces between the scanning tip and sample. In this study, we examined isolated single quantum dots (QDs) with ligands on a gold substrate via PiFM under ultra-high vacuum to characterize the QD adsorption state on the basis of the optical force. The strong self-consistent optical interaction through the tip-substrate plasmonic gap induced by laser light modulates the PiFM image depending on QD crystal existence in the gap. This observation clarified the QD absorption situation on the substrate, and the crystal position in the QDs was determined even though the ligand walls covered the crystal. This insight concerning force spectroscopy can aid further research on the photochemistry of nanostructured materials and molecular spectroscopy.
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Keivanidis, Panagiotis E., Andrea di Donato, Davide Mencarelli, Alessandro Esposito, Tengling Ye, Guglielmo Lanzani, Giuseppe Venanzoni, Tiziana Pietrangelo, Antonio Morini, and Marco Farina. "Determining the Efficiency of Fast Ultrahigh-density Writing of Low-Conductivity Patterns on Semiconducting Polymers." MRS Proceedings 1729 (2015): 125–30. http://dx.doi.org/10.1557/opl.2015.81.

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ABSTRACTWe present a nano-patterning process for semiconducting polymeric composites that could potentially be utilized for the development of polymer-based data storage devices. Nano-patterning (writing) operates on the basis of the mechanical interaction between the electrically unbiased tip of an atomic force microscope and the surface of polymeric composite films. Via friction forces, the tip/sample interaction produces a local increase of molecular disorder in the polymer matrix, inducing a localized lowering in the conductivity of the organic semiconductor. Herein we suggest a figure of merit for quantifying the efficiency of pattern formation and we address the dependence of the writing process on the thermal annealing temperature of the composite film. Control experiments on composite films deposited on substrates with different roughness suggest that the writing effect is invariant to the roughness of the substrate. The potential storage density of the writing process depends on the tip curvature.
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Kheirodin, Mohsen, Hossein Nejat Pishkenari, Ali Moosavi, and Ali Meghdari. "Study of Biomolecules Imaging Using Molecular Dynamics Simulations." Nano 10, no. 07 (October 2015): 1550096. http://dx.doi.org/10.1142/s1793292015500964.

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The process of imaging a biomolecule by atomic force microscope (AFM) is modeled using molecular dynamics (MD) simulations. Since the large normal force exerted by the tip on the biosample in contact and tapping modes may damage the sample structure and produce irreversible deformation, the noncontact mode of AFM (NC-AFM) is employed as the operating mode. The biosample is scanned using a carbon nanotube (CNT) as the AFM probe. CNTs because of their small diameter, high aspect ratio and high mechanical resistance attract many attentions for imaging purposes. The tip–sample interaction is simulated by the MD method. The protein, which has been considered as the biomolecule, is ubiquitin and a graphene sheet is used as the substrate. The effects of CNT's geometric parameters such as the CNT height, the diameter, the tilt angle, the flexibility and the number of layers on the image quality have been evaluated.
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CZAJKA, R., A. KASUYA, A. WAWRO, N. HORIGUCHI, and Y. NISHINA. "FORMATION AND MODIFICATION OF MESOSCOPIC STRUCTURES ON GRAPHITE (HOPG) AND SILICON SURFACES BY MEANS OF SCANNING TUNNELING MICROSCOPY." Surface Review and Letters 03, no. 01 (February 1996): 961–67. http://dx.doi.org/10.1142/s0218625x96001728.

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This paper presents results of our experimental investigations of the adsorption and interaction of microclusters on some crystalline surfaces to form regular arrangements. Microclusters were produced and deposited up to a monolayer coverage on the c-plane of graphite (HOPG) or Si(111) substrates by thermal evaporation, laser ablation, or deposition from STM tip. A rectangular lattice arrangement of Se n(n=5–8) ring cluster has been fabricated for the first time on the HOPG. Also, arrays of Au clusters with a well-controlled diameter, desired periodicity, and size have been obtained by applying a sequence of voltage pulses between the STM tip and the substrate. A variety of carbon clusters have been produced by laser modification of C 60 fullerenes, and observed by means of scanning tunneling microscope (STM). Finally, various nanometer-scale structures have been modified by applying different bias voltages (between tip probe and sample) or induced by thermal treatment.
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Leite, F. L., E. C. Ziemath, O. N. Oliveira Jr., and P. S. P. Herrmann. "Adhesion Forces for Mica and Silicon Oxide Surfaces Studied by Atomic Force Spectroscopy (AFS)." Microscopy and Microanalysis 11, S03 (December 2005): 130–33. http://dx.doi.org/10.1017/s1431927605051068.

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The possibility of analyzing surfaces at the nanoscale provided by atomic force microscopy [1] (AFM) has been explored for various materials, including polymers [2], biological materials [3] and clays [4]. Further uses of AFMs involved nanomanipulation [5] and measurements of interaction forces, where the latter has been referred to as atomic force spectroscopy (AFS) [6]. Measurements of surface-surface interactions at the nanoscale are important because many materials have their properties changed at this range [7]. For samples in air, the interactions with the tip are a superimposition of van der Waals, electrostatic and capillary forces. A number of surface features can now be monitored with AFS, such as adsorption processes and contamination from the environment. Many implications exist for soil sciences and other areas, because quantitative knowledge of particle adhesion is vital for understanding technological processes, including particle aggregation in mineral processing, quality of ceramics and adhesives. In this paper, we employ AFS to measure adhesion (pull-off force) between the AFM tip and two types of substrate. Adhesion maps are used to illustrate sample regions that had been contaminated with organic compounds.
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Meyer, G., and K. H. Rieder. "Lateral Manipulation of Single Adsorbates and Substrate Atoms With the Scanning Tunneling Microscope." MRS Bulletin 23, no. 1 (January 1998): 28–32. http://dx.doi.org/10.1557/s0883769400031432.

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The stability and precision of modern scanning-tunneling-microscope (STM) systems allow positioning of the tip on a subnanometer scale. This advancement has stimulated diverse efforts on surface modifications in the nanometer and even atomic range, as recently reviewed by Avouris. The lateral movement of individual adatoms and molecules in a controlled manner on solid surfaces and the construction of structures on a nanoscale were first demonstrated by Eigler and collaborators at 4 K. The reason for operating the STM at low temperatures (apart from increased stability and sensitivity of the STM setup itself) is the necessity to freeze the motion of single adsorbates, which are very often mobile at ambient temperatures. By selecting strongly bonded adsorbate/substrate combinations and large molecules, it was possible to extend the lateral manipulation technique even to room temperature. In the case of large molecules, not only their translational motion but also internal flexure of the molecule during the positioning process must be considered. In general, different physical and chemical interaction mechanisms between tip and sample can be exploited for atomic-scale manipulation. We will concentrate in the following on lateral manipulation where solely the forces that act on the adsorbate because of the proximity of the tip are used. This means that long-range van der Waals and short-range chemical forces can be used to move atoms or molecules along the surface. No bias voltage or tunneling current is necessary. Apart from this technique, additional advances using the effects caused by the electric field generated by the bias voltage between tip and sample and by the current flowing through the gap region can be used for atomic or molecular modification.
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Cruz Valeriano, Edgar, José Juan Gervacio Arciniega, Christian Iván Enriquez Flores, Susana Meraz Dávila, Joel Moreno Palmerin, Martín Adelaido Hernández Landaverde, Yuri Lizbeth Chipatecua Godoy, Aime Margarita Gutiérrez Peralta, Rafael Ramírez Bon, and José Martín Yañez Limón. "Stochastic excitation for high-resolution atomic force acoustic microscopy imaging: a system theory approach." Beilstein Journal of Nanotechnology 11 (May 4, 2020): 703–16. http://dx.doi.org/10.3762/bjnano.11.58.

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In this work, a high-resolution atomic force acoustic microscopy imaging technique is developed in order to obtain the local indentation modulus at the nanoscale level. The technique uses a model that gives a qualitative relationship between a set of contact resonance frequencies and the indentation modulus. It is based on white-noise excitation of the tip–sample interaction and uses system theory for the extraction of the resonance modes. During conventional scanning, for each pixel, the tip–sample interaction is excited with a white-noise signal. Then, a fast Fourier transform is applied to the deflection signal that comes from the photodiodes of the atomic force microscopy (AFM) equipment. This approach allows for the measurement of several vibrational modes in a single step with high frequency resolution, with less computational cost and at a faster speed than other similar techniques. This technique is referred to as stochastic atomic force acoustic microscopy (S-AFAM), and the frequency shifts of the free resonance frequencies of an AFM cantilever are used to determine the mechanical properties of a material. S-AFAM is implemented and compared with a conventional technique (resonance tracking-atomic force acoustic microscopy, RT-AFAM). A sample of a graphite film on a glass substrate is analyzed. S-AFAM can be implemented in any AFM system due to its reduced instrumentation requirements compared to conventional techniques.
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Conference papers on the topic "Tip-sample-substrate interaction"

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Landolsi, Fakhreddine, Fathi H. Ghorbel, and James B. Dabney. "An AFM-Based Nanomanipulation Model Describing the Atomic Two Dimensional Stick-Slip Behavior." In ASME 2007 International Mechanical Engineering Congress and Exposition. ASMEDC, 2007. http://dx.doi.org/10.1115/imece2007-42529.

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A new AFM-based nanomanipulation model describing the relevant physics and dynamics at the nanoscale is presented. The nanomanipulation scheme consists of integrated subsystems that are identified in a modular approach. The model subsystems define the AFM cantilever-sample dynamics, the AFM tip-sample interactions, the contact mechanics and the friction between the sample and the substrate. The coupling between these different subsystems is emphasized. The main contribution of the proposed nanomanipulation model is the use of a new 2D dynamic friction model based on a generalized bristle interpretation of one asperity contact. The efficacy of the proposed model to reproduce experimental data is demonstrated via numerical simulations. In fact, the model is shown to describe the 2D stick-slip behavior with the substrate lattice periodicity. The proposed nanomanipulation model facilitates the improvement and extension of each subsystem to further take into account the complex interactions at the nanoscale.
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Lee, Sang M., M. Abdelmaksoud, and J. Krim. "Nano-Scale Tribology Study of Organic Adlayer-Metal Interface Using Quartz Crystal Microbalance Combined With Scanning Tunneling Microscopy." In World Tribology Congress III. ASMEDC, 2005. http://dx.doi.org/10.1115/wtc2005-63732.

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A quartz crystal microbalance combined with scanning tunneling microscopy (STM-QCM) was used to investigate the interactions between organic adlayers (C6H6 and C6H5I) on Cu surfaces and a metallic STM tip. STM images of C6H6 covered Cu surface improved when the QCM was simultaneously oscillated during the imaging. In contrast, STM images of C6H5I covered surfaces became noisy when the sample was oscillated. The two systems moreover exhibited frequency changes of opposite signs in response to STM tip contact, indicative of different physical phenomena at the surface. The dependence of the STM image quality and the frequency shift were interpreted in terms of the adsorbate-substrate chemical and physical interactions, and different levels of frictional heating at the interface.
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Schwarz, Udo D., Claudia Ritter, Markus Heyde, and Klaus Rademann. "Adhesion and Friction on the Nanometer Scale: Energy Dissipation During Sliding of Antimony Islands on Graphite and MoS2." In World Tribology Congress III. ASMEDC, 2005. http://dx.doi.org/10.1115/wtc2005-63898.

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Antimony nanoparticles grown on highly oriented pyrolytic graphite and molybdenum disulfide were used as a model system to investigate the contact area dependence of frictional forces. Controlled translation of the antimony nanoparticles was induced by the action of the oscillating tip in a dynamic force microscope. During manipulation, the power dissipated due to tip-sample interactions was recorded. We found that the threshold value of the power dissipation needed for translation depends linearly on the contact area between the antimony particles and the substrate. Assuming a linear relationship between dissipated power and frictional forces implies a direct proportionality between friction and contact area. Particles smaller than 10000 nm2, however, were found to show dissipation close to zero. To explain the observed behavior, we suggest that structural lubricity might be the reason for the low dissipation in the small particles, while elastic multistabilities might dominate energy dissipation in the larger particles.
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