Journal articles: 'Thin solid film measurement'

1

van der Poel, C. J. "Rapid crystallization of thin solid films." Journal of Materials Research 3, no. 1 (February 1988): 126–32. http://dx.doi.org/10.1557/jmr.1988.0126.

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Laser-beam-controlled heating appears to be an excellent technique for driving isothermal transformations in a thin solid film on a thick substrate. The transformation is detected by the change in optical properties of the film as it evolves from the initial to the final state. Results are presented for the amorphous-to-crystalline transition in 100 nm thick films of InSb and of some Te alloys on thick glass substrates. Discrimination between interface growth and homogeneous crystallization can be made from the data. The crystallization of InSb films can be desribed by an Avrami equation with a single activation energy of 154 ± 6 kJ/mol over the full range of measured crystallization times between 100μs and 1000s. For low temperatures the results are consistent with differential scanning calorimetry (DSC) measurements. For Te-alloy films, the large temperature interval covered by the experimental method enables clear observation of the curvature of the temperature-time-transmission (T–t–t) plot.

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Buffeteau, Thierry, François Lagugné-Labarthet, and Claude Sourisseau. "Vibrational Circular Dichroism in General Anisotropic Thin Solid Films: Measurement and Theoretical Approach." Applied Spectroscopy 59, no. 6 (June 2005): 732–45. http://dx.doi.org/10.1366/0003702054280568.

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In this study, the measurement of the true vibrational circular dichroism (VCD) spectrum is considered from an experimental and theoretical approach for any general anisotropic thin solid sample exhibiting linear as well as circular birefringence (LB, CB) and dichroism (LD, CD) properties. For this purpose, we have made use of a simple model α-helix polypeptide, namely, the poly(γ-benzyl-L-glutamate) or PBLG, reference sample possessing a well-known VCD spectrum and giving rise to slightly oriented films by deposition onto a solid substrate. Also, we have used a different Fourier transform infrared modulation of polarization (PM-FTIR) optical setup with two-channel electronic processing in order to record the PM-VLD and PM-VCD spectra for various sample orientations in its film plane. All the corresponding general relations of the expected intensities in these experiments and the related properly designed calibration measurements were established using the Stokes–Mueller formalism; in addition, the residual birefringence of the optical setup and the transmittance anisotropy of the detector were estimated. From a comparative study of the results obtained in solution and in the solid state, we then propose a simple new experimental procedure to extract the true VCD spectrum of an oriented PBLG thin film: its consists of calculating the half-sum of two spectra recorded at θ and at θ ± 90° sample orientations. Moreover, the complete linear and circular birefringence and dichroism properties of the ordered PBLG thin film are estimated in the amide I and amide II vibrational regions. This allows us to establish for any sample orientation various theoretical simulations of the VCD spectra that agree nicely with the observed experimental results; this confirms that the measurement of LD and LB is in this case a prerequisite in simulating the true VCD spectrum of a partly oriented anisotropic sample. This validates our combined experimental and theoretical approach and opens the route to promising future vibrational CD studies on other macroscopic anisotropic thin film samples.

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Suzuki, N. "XPS Measurement of Organic Thin Film on Solid Surface and its Application." Journal of Surface Analysis 16, no. 1 (2009): 12–19. http://dx.doi.org/10.1384/jsa.16.12.

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Moon, Seung Jae. "In Situ Fast Temperature Measurement of Silicon Thin Films during the Excimer Laser Annealing." Key Engineering Materials 326-328 (December 2006): 195–98. http://dx.doi.org/10.4028/www.scientific.net/kem.326-328.195.

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The formation and growth mechanism of polysilicon grains in thin films via laser annealing of amorphous silicon thin films are studied. The complete understanding of the mechanism is crucial to improve the thin film transistors used as switches in the active matrix liquid crystal displays. To understand the recrystallization mechanism, the temperature history and liquidsolid interface motion during the excimer laser annealing of 50-nm thick amorphous and polysilicon films on fused quartz substrates are intensively investigated via in-situ time-resolved thermal emission measurements, optical reflectance and transmittance measurements at near infrared wavelengths. The front transmissivity and reflectivity are measured to obtain the emissivity at the 1.52 μm wavelength of the probe IRHeNe laser to improve the accuracy of the temperature measurement. The melting point of amorphous silicon is higher than that of crystalline silicon of 1685 K by 100-150 K. This is the first direct measurement of the melting temperature of amorphous silicon thin films. It is found that melting of polysilicon occurs close to the melting point of crystalline silicon. Also the optical properties such as reflectance and transmittance are used to determine the melt duration by the detecting the difference of the optical properties of liquid silicon and solid silicon.

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Xu, Zhi Qiang. "Research on Material Thickness and Material Properties with Application of Sensors." Advanced Materials Research 1021 (August 2014): 33–36. http://dx.doi.org/10.4028/www.scientific.net/amr.1021.33.

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With the wide application of thin film technology and optoelectronic devices, optical films have been widely used in the development and production of weapons and special devices for basic research. Faced with constantly updated status quo and development of optical thin film precision measurement of various parameters on a higher requirements, the film thickness is one of the key parameters in film design and manufacturing process. Particularly with the rapid development of nanoscale thin-film technology, the film thickness becomes a hot issue in the research field. For solid film thickness, the main measuring means are screw micrometer, microscopy, interferometry and polarization. Conventional Michelson interferometer can measure thin film thickness which is transparent and known, and the devices with sensors performance better.

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Feng, X., Y. Huang, and A. J. Rosakis. "On the Stoney Formula for a Thin Film/Substrate System With Nonuniform Substrate Thickness." Journal of Applied Mechanics 74, no. 6 (January 14, 2007): 1276–81. http://dx.doi.org/10.1115/1.2745392.

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Current methodologies used for the inference of thin film stress through system curvature measurements are strictly restricted to stress and curvature states which are assumed to remain uniform over the entire film/substrate system. Recently Huang, Rosakis, and co-workers [Acta Mech. Sinica, 21, pp. 362–370 (2005); J. Mech. Phys. Solids, 53, 2483–2500 (2005); Thin Solid Films, 515, pp. 2220–2229 (2006); J. Appl. Mech., in press; J. Mech. Mater. Struct., in press] established methods for the film/substrate system subject to nonuniform misfit strain and temperature changes. The film stresses were found to depend nonlocally on system curvatures (i.e., depend on the full-field curvatures). These methods, however, all assume uniform substrate thickness, which is sometimes violated in the thin film/substrate system. Using the perturbation analysis, we extend the methods to nonuniform substrate thickness for the thin film/substrate system subject to nonuniform misfit strain.

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Barylo, G. I., R. L. Holyaka, T. A. Marusenkova, and M. S. Ivakh. "Structure and 3-D Model of a Solid State Thin-Film Magnetic Sensor." Physics and Chemistry of Solid State 22, no. 3 (August 31, 2021): 444–52. http://dx.doi.org/10.15330/pcss.22.3.444-452.

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Vector 3-D magnetic sensors form the basis of measurement devices for magnetic field mapping and magnetic tracking. Typically, such sensors utilize specific constructions based on split Hall structures (SHS). An SHS-based 3-D magnetic sensor is a bulk semiconductor integrated structure with 8 or more contacts. Combining current flow directions through the contacts and measuring the corresponding voltages, one defines projections BX, BY, BZ of the magnetic field vector. This work presents a novel design of 3-D solid state magnetic sensors that requires no insulation by p-n junctions and can be implemented by thin-film technology traditionally used for fabrication of Hall sensors including those based on InSb films. Besides, a SPICE model of the 3-D magnetic sensor is provided, which helps design the proposed sensor and refine techniques of its calibration.

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Zhu, Bei, Cheng Jun Zhu, Shan Chang, Yong Wen Zhang, and Chao Zheng Wang. "Fabrication and Characterization of CIASSe Thin Film Photovoltaic Absorbers Using CIAS Nanocrystals." Advanced Materials Research 512-515 (May 2012): 39–42. http://dx.doi.org/10.4028/www.scientific.net/amr.512-515.39.

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Cu(In0.8Al0.2)(SSe)2 (CIASSe) absorber layers of thin film solar cell were prepared by selenization of Cu(In0.8Al0.2)S2(CIAS) nanocrystals. The CIAS nanocrystals were synthesized by a new solution-based technique and successfully deposited on Mo-coated glass substrates in a one-step process. The phase structure, optical and electrical properties of CIASSe thin films were characterized by power X-ray diffraction (XRD), ultraviolet-visible (UV-Vis) spectrophotometer and the Hall Effect Measurement system. The results showed that single-phase CIASSe solid solution was successfully obtained for a selenization temperature of above 400oC. And the diffraction peaks shifted to the lower angle with an increase in selenization time and selenization temperature. The films selenized at 500oC were found to be p-type and the resistivity was only 0.9484×10-4Ω cm. The optical band gap of the films is 1.508eV and the optical absorption coefficient is over 104cm-1.

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Sato, Morihiro, Takayuki Yamamoto, Munekazu Motoyama, and Yasutoshi Iriyama. "In-situ electronic conductivity measurements of LiNi0.45Mn1.485Cr0.05O4 thin films using all-solid-state thin-film batteries." Electrochemistry Communications 87 (February 2018): 31–34. http://dx.doi.org/10.1016/j.elecom.2017.12.021.

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Aloui, Fethi, Lamia Gaied, Wafik Abassi, Marc Lippert, and Maxence Bigerelle. "Conductimetry technique for the measurement of thin liquid film thickness between two solid surfaces in relative motion: hydrodynamic lubrication." Mechanics & Industry 20, no. 6 (2019): 601. http://dx.doi.org/10.1051/meca/2019035.

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This paper presents an approach for the measurement of a liquid film thickness in contact with a rough surface, based on electrical conductance sensor. This type of sensor consists of two electrodes mounted flush on a wall and using an electrolyte solution representing the liquid film. Assessing of the generated current between a pair of electrode is used as a measure of the film thickness. The liquid film is contained between two parallel surfaces that one of which is coated with a certain roughness, while the other is smooth. The electrical probes are placed on the smooth surface and the facing rough surface is removable allowing a free move of the wall. In this way, a rotational or a sliding motion is imposed on the rough wall allowing a browse of an entire surface relative to the electrode, in order to determine the influence of roughness on the film thickness measurements. In addition, series of signal acquisition were carried out with imposed pressures on the upper plate for the characterization of the effect of the film compression on the measured thicknesses. The principle of this electrochemical technique is briefly explained, as well as how the lateral distance between the electrodes impacts the measuring range limit. The experimental setup is described and used to study the liquid film flow with several configurations of the wall surface. The obtained results demonstrated the feasibility of this type of non-intrusive estimation, as it was possible to estimate the variable film thickness which is depending on the peaks and valleys of the rough surface. This is promising, because measuring this parameter remains difficult. Finally, the results analysis allows to synthesize the advantages and limitations of this method.

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Tang, B., and A. H. W. Ngan. "Nanoindentation Measurement of Mechanical Properties of Soft Solid Covered By a Thin Liquid Film." Soft Materials 5, no. 4 (December 2007): 169–81. http://dx.doi.org/10.1080/15394450701538919.

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12

Zhang, Xurui, Plamen Tchoukov, Rogerio Manica, Louxiang Wang, Qingxia Liu, and Zhenghe Xu. "Simultaneous measurement of dynamic force and spatial thin film thickness between deformable and solid surfaces by integrated thin liquid film force apparatus." Soft Matter 12, no. 44 (2016): 9105–14. http://dx.doi.org/10.1039/c6sm02067d.

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13

Hodak, Satreerat K., T. Seppänen, and Sukkaneste Tungasmita. "Growth of (Zr,Ti)N Thin Films by Ion-Assisted Dual D.C. Reactive Magnetron Sputtering." Solid State Phenomena 136 (February 2008): 133–38. http://dx.doi.org/10.4028/www.scientific.net/ssp.136.133.

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The ternary nitride (Zr,Ti)N thin films were grown on silicon substrates by ion-assisted dual d.c. reactive magnetron sputtering technique. The substrates were exposed to ion bombardment with varying kinetic energy in the range of 3-103 eV under N/Ar ratio of 1:3. The (Zr0.6Ti0.4)N was formed at all growth conditions. X-ray diffraction measurement indicates the presence of (Zr,Ti)N solid solution with (111) and (200) preferred orientations. The (200) orientation is only present when the films are grown at ion bombardment energies higher than 33 eV. Optimum conditions for film growth produced hardness in the range of 27-29 GPa.

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Gorman, B. P., V. Petrovsky, H. U. Anderson, and T. Petrovsky. "Optical characterization of ceramic thin films: Applications in low-temperature solid oxide fuel-cell materials research." Journal of Materials Research 19, no. 2 (February 2004): 573–78. http://dx.doi.org/10.1557/jmr.2004.19.2.573.

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Characterization of thin film solid oxide fuel-cell materials can be difficult due to the range of porosities in electrodes and electrolytes as well as the nano-sized pores and particles. In this study, optical characterization techniques such as ultraviolet–visible transmission and reflection spectrophotometry are illustrated as methods for achieving information about the film density from the film refractive index as well as the film thickness. These techniques were used to investigate the sintering process of colloidal CeO2 on sapphire substrates and polymeric precursor-derived ZrO2:16%Y (YSZ) thin films on silicon over the temperature range 400–1000 °C, and the results were compared with traditional characterization techniques such as electron microscopy, profilometry, ellipsometry, and x-ray diffraction line broadening analyses. Most of the techniques were in good agreement with the CeO2 grain size changing from 5–65 nm and the film thickness changing from 0.8–0.5 μm. Comparisons of transmission and reflection spectrophotometry with ellipsometry illustrated that scattering effects from the porous CeO2 films caused an overestimation of the refractive index from ellipsometry, but allowed for accurate grain size measurements from transmission and reflection data. Both techniques were in good agreement during the sintering of the YSZ thin films, with the density changing from 90–100% theoretical after heating between 400 and 800 °C.

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Wang, Zhouling, Wenwu Wang, Ya Yang, Wei Li, Lianghuan Feng, Jingquan Zhang, Lili Wu, and Guanggen Zeng. "The Structure and Stability of Molybdenum Ditelluride Thin Films." International Journal of Photoenergy 2014 (2014): 1–6. http://dx.doi.org/10.1155/2014/956083.

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Molybdenum-tellurium alloy thin films were fabricated by electron beam evaporation and the films were annealed in different conditions in N2ambient. The hexagonal molybdenum ditelluride thin films with well crystallization annealed at 470°C or higher were obtained by solid state reactions. Thermal stability measurements indicate the formation of MoTe2took place at about 350°C, and a subtle weight-loss was in the range between 30°C and 500°C. The evolution of the chemistry for Mo-Te thin films was performed to investigate the growth of the MoTe2thin films free of any secondary phase. And the effect of other postdeposition treatments on the film characteristics was also investigated.

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Lim, Hyung-Tae, and Anil V. Virkar. "Measurement of oxygen chemical potential in thin electrolyte film, anode-supported solid oxide fuel cells." Journal of Power Sources 180, no. 1 (May 2008): 92–102. http://dx.doi.org/10.1016/j.jpowsour.2008.01.068.

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Torikai, Naoya. "In-Situ Neutron Reflectometry on Polymer Thin Films in Different Environments." Acta Crystallographica Section A Foundations and Advances 70, a1 (August 5, 2014): C880. http://dx.doi.org/10.1107/s2053273314091190.

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Neutron reflectometry is indispensable for the studies on material interfaces and thin films, since it can probe the interfaces non-destructively with a quite high depth resolution. Here, the interfacial structures of polymer thin films in different environments: hot and wet, were examined by means of in-situ neutron reflectometry. The neutron reflectivity measurements were performed on a time-of-flight reflectometer SOFIA [1, 2] at the Japan Proton Accelerator Research Complex (J-PARC). The depth distribution of components was investigated for binary blend thin films of polystyrenes with different molecular weights to clarify the mechanism of de-wetting suppression effect by blending a small amount of the longer homologue. It was found by static measurements that the longer chains deplete from the air surface of the film, while they slightly localize at the interface with the substrate. The time evolution of the component distribution was also examined by in-situ measurements above the glass transition temperature in a vacuum. The structural change of lamellarly-ordered styrene-2-vinylpyridine (PS-P2VP) diblock copolymer thin film in contact with solvent was explored by in-situ neutron reflectometry with a conventional solid/liquid cell. During the block copolymer thin film was in contact with methanol, which is selective for P2VP, some of methanol penetrated into the film causing the structural change. However, the original structure was almost recovered after drying, though annealing effect was slightly observed. When toluene was made contact, which is selective for PS, the block copolymer thin film was immediately dissolved into, and never recovered.

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Zaien, Mustafa, Naser Mahmoud Ahmed, and Hassan Zainuriah. "A Study of Properties of the Nanocrystalline CdO Thin Film Prepared by Solid-Vapor Deposition Method." Materials Science Forum 756 (May 2013): 54–58. http://dx.doi.org/10.4028/www.scientific.net/msf.756.54.

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A nanocrystalline CdO thin film was successfully synthesized on p-type silicon substrate with approximately 370 nm thickness by a vapor transport process (solid-vapor deposition) for Cd powder at 1274 K with argon and oxygen flows in a tube furnace. Scanning electronmicroscopy revealed that the product was a CdO nanocrystalline. X-raydiffraction and energy dispersive X-ray techniques were used to characterize structural properties. The grown nanocrystalline thin film had a grain size of 38 nm. Photoluminescence spectroscopy was conducted to investigate the optical properties of the nanocrystalline CdO thin film. A strong emission peak was observed at 511 nm (2.43 eV), which is ascribable to the near-band-edge emission of CdO with a full-width and half maximum of approximately 124 nm. The sheet resistance and the resistivity of the CdO thin film were measured using a four-point probe; RS= 16.2 Ω/sqand ρ = 5.82×10-4Ω.cm.Carrier concentration and Hall mobility were obtained by Hall-effect measurement system; n= 1.53×1020cm-3and μH= 42.3cm2/Vs.

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Lee, Ki Myung, Chang-Dong Yeo, and Andreas A. Polycarpou. "Relationship between scratch hardness and yield strength of elastic perfectly plastic materials using finite element analysis." Journal of Materials Research 23, no. 8 (August 2008): 2229–37. http://dx.doi.org/10.1557/jmr.2008.0279.

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With thin solid film usage expanding in numerous technologies, reliable measurements of material properties such as yield strength become important. However, for thin solid films the measurement of yield strength is not readily available, and an alternative method to obtain this property is to measure hardness and convert it to yield strength. Tabor suggested dividing hardness by ∼3 to obtain yield strength, which has been used extensively, despite its shortcomings. Since the pioneering work of Tabor, researchers have performed numerical and experimental studies to investigate the relationships between hardness, yield strength, and elastic modulus, using the indentation technique. In this study, finite element analysis was performed to simulate the nanoscratch technique. Specifically, the nanoscratch finite element analysis was used to validate a previously developed analytical scratch hardness model. A full-factorial design-of-experiments was performed to determine the significant variables for the ratio of calculated scratch hardness to yield strength and a simple analytical prediction model for the ratio of hardness to yield strength was proposed.

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B Gite, Anil, G. E. Patil, and G. H. Jain. "Spray Pyrolysis Technique for the deposition of Lead Oxide (PbO) Thin Films; its Electrochemical behaviour and Structural and optical Properties." Material Science Research India 15, no. 2 (July 25, 2018): 134–40. http://dx.doi.org/10.13005/msri/150204.

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Thin film of Lead oxide (PbO) was prepared by spray pyrolysis technique on glass substrate at 250°C. The cyclic voltammetry measurement was carried out to study the oxidation reduction reactions of non-aqueous lead ions at various molar concentrations which is from 0.01M to 0.09M. Elecrochemical studies were carried out with Ag/AgCl as a reference electrode , Pt as working electrode while platinum mesh as counter electrode.Lead oxide appears to be poisonous yellow or reddish yellow solid. Structural characterization of films was analyze with X- ray diffraction (XRD) and optical band gap was determined by UV-Vis Spectroscopy.

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Lin, Jie, Jian Lai Guo, Chang Liu, and Hang Guo. "A 3D All-Solid-State Thin Film Microbattery with Inverted Pyramid Arrays." Key Engineering Materials 645-646 (May 2015): 1170–74. http://dx.doi.org/10.4028/www.scientific.net/kem.645-646.1170.

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A 3D all-solid-state thin film lithium-ion microbattery (TFLM) with inverted pyramid arrays is fabricated by microfabrication technology. Compared with 2D TFLMs, the effective area of this 3D TFLM increases more than 30%. The 3D TFLM prepared by magnetron sputtering is composed of LiCoO2 cathode, LiPON solid electrolyte, and copper doped SnOx anode. The 3D TFLM is tested by electrochemical measurements, and the results show that it has reliable capacity and excellent performance.

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McGuiggan, P. M., S. M. Hsu, W. Fong, D. Bogy, and C. S. Bhatia. "Friction Measurements of Ultra-Thin Carbon Overcoats in Air." Journal of Tribology 124, no. 2 (December 14, 1999): 239–44. http://dx.doi.org/10.1115/1.1387035.

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The friction force as a function of humidity was measured between thin carbon films coated onto mica surfaces. The friction force was found to be proportional to the area of contact. The shear stress at 0 percent, 33 percent, and 100 percent relative humidity was measured to be 26 MPa±5 MPa,12 MPa±2 MPa, and 5 MPa±0.5 MPa, respectively, and was independent of the applied pressure for pressures less than 20 MPa. Water acts as a lubricant decreasing the friction between the carbon surfaces. The shear stress at 0 percent relative humidity corresponds to the shear stress of a solid paraffin film, and suggests that the shear may be dominated by a thin organic film adsorbed from air, at least at the pressures less than 20 MPa and a velocity of 1 μm/s. At 100 percent relative humidity, the shear stress for carbon coated surfaces was about double that for mica surfaces, indicating a stronger influence of the water for the more hydrophilic mica surface than the more hydrophobic carbon surface. The friction between one uncoated mica and one carbon coated mica surface resulted in immediate damage and generation of wear debris.

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Guangteng, G., M. Smeeth, P. M. Cann, and H. A. Spikes. "Measurement and Modelling of Boundary Film Properties of Polymeric Lubricant Additives." Proceedings of the Institution of Mechanical Engineers, Part J: Journal of Engineering Tribology 210, no. 1 (March 1996): 1–15. http://dx.doi.org/10.1243/pime_proc_1996_210_473_02.

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Experimental work using ultrathin film interferometry has shown that some polymer solutions in oil form much thicker films at slow speeds in rolling, concentrated contacts than predicted from elastohydrodynamic (EHD) theory. This behaviour can be interpreted as resulting from the polymers forming adsorbed, surface layers of enhanced concentration on the two solid surfaces. Such layers, which are typically 20 nm thick, would be significantly more viscous that the bulk solution and thus produce thicker EHD films. This concept has been supported by modelling the elastohydrodynamic point contact using control volume analysis with a layered surface viscosity. The film thickness behaviour predicted computationally using this technique is quite similar to that found experimentally using polymer solutions.

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Ziger, David H. "In situ capacitance studies of thin polymer films during compressed fluid extraction." Journal of Materials Research 2, no. 6 (December 1987): 884–94. http://dx.doi.org/10.1557/jmr.1987.0884.

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Supercritical and compressed liquid CO2 extraction of thin solid organic films was studied using in situ capacitance monitoring. Parallel plate and fringe field capacitors were fabricated using organic films as principal dielectric media. Supercritical and compressed liquid CO2 extraction of these films at 100 bar and 30–45°C caused compositional and physical changes in the host polymer matrix that were correlated to capacitance history. As a result of these studies, film damage during extraction was attributed to explosive decompression of the CO2 solvent. In addition, a mechanism for supercritical fluid extraction of nonvolatile solutes from thin films, which is consistent with these capacitance measurements, is discussed.

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Keltner, N. R., B. L. Bainbridge, and J. V. Beck. "Rectangular Heat Source on a Semi-infinite Solid—An Analysis for a Thin Film Heat Flux Gage Calibration." Journal of Heat Transfer 110, no. 1 (February 1, 1988): 42–48. http://dx.doi.org/10.1115/1.3250470.

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For a thin film heat flux gage designed to provide both rapid response and long use time, initial calibrations using standard techniques indicated differences between the literature and the estimated properties. In order to estimate thermophysical properties and subsequently the gage sensitivity, an analytical model of the response to a step change in heating current was developed. Starting from a Green’s function description, the model is reduced to three algebraic expressions, which correspond to the early, middle, and late time regimes. These expressions provide a framework for least-squares estimates of gage parameters. This provides an in-situ, nondestructive measurement of the thermal impedance of the substrate. There is very good agreement between the model and the experimental data. The estimated parameter values demonstrated good to excellent repeatability and good agreement with both new literature data and results from destructive property measurements.

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Nafarizal, Nayan, Mohd Zainizan Sahdan, Riyaz Ahmad Mohamad Ali, Sharifah Amira, Salwa Omar, Mohamad Hafiz Mamat, Mohammad Rusop, Uda Hashim, and Mohamad Rusop Mahmood. "Electron and Ion Densities Measurement in Reactive Magnetron Zinc Sputtering Plasma." Advanced Materials Research 832 (November 2013): 344–49. http://dx.doi.org/10.4028/www.scientific.net/amr.832.344.

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Abstract. Investigation on the plasma properties is an essential fundamental works in order to precisely control the growth of nanoscale thin film. In the present work, we produced and study the reactive magnetron sputtering plasma in Ar+O2 ambient using a solid Zn target as sputter source. We evaluate the electron temperature, electron density and ion density using Langmuir probe measurement as a function of O2 flow rate and working pressure. We found that the electron temperature increased spontaneously with the oxygen flow rate. The electron temperature was almost doubled when O2 flow rate increased from 0 sccm to 10 sccm. The electron and ion densities increased with the oxygen flow rate between 0 sccm and 5 sccm. However, after 5 sccm of O2 flow rate which is approximately 11% of O2/(O2+Ar) flow rate ratio the electron density decreased drastically. This is due to the electron attachment and the production of negative ion species in Ar+O2 plasma environment. In addition, we found that the ion flux increase monotonically with the O2 flow rate thus will increase the ion bombardment effect on the deposited thin film and eventually damage the thin film. Our experimental results suggest that the O2 flow rate and the working pressure would have a significant influence on ion bombardment effect on deposited thin film.

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Makogon, Yu N., O. P. Pavlova, G. Beddies, A. V. Mogilatenko, and O. V. Chukhrai. "Solid-State Reactions in Ni(10 nm)/C(2 nm)/Si(001) Thin Film System." Defect and Diffusion Forum 264 (April 2007): 155–58. http://dx.doi.org/10.4028/www.scientific.net/ddf.264.155.

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Annealing environment effect on the phase formation in Ni(10 nm)/C(2 nm)/Si(001) thin film system produced by sequential sputtering of C and Ni targets without vacuum breaking was under investigation. The specimens were annealed 30 s in vacuum of 1.3·10-4 Pa and in nitrogen flow in the temperature range of 450 - 1000°C. The temperature stimulated solid-state reactions that occur as the result of interdiffusion processes between layers of the thin film system under investigations were examined by X-ray - and electron diffractions, resistivity measurements and Rutherford backscattering. It was established that an annealing environment has a strong impact on the development of the solid-state reactions in Ni(10 nm)/C(2 nm)/Si(001) thin film system.

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Mchedlidze, Teimuraz, J. Hendrik Zollondz, and Martin Kittler. "Characterization of Traps in Crystalline Silicon on Glass Film Using Deep-Level Transient Spectroscopy." Solid State Phenomena 178-179 (August 2011): 100–105. http://dx.doi.org/10.4028/www.scientific.net/ssp.178-179.100.

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Thin crystalline silicon films on glass substrate, fabricated using solid phase crystallization for application in thin-film solar cells, were investigated by deep level transient spectroscopy (DLTS). The analyses of the DLTS spectra obtained during temperature scans revealed presence of carrier traps related to dislocations in silicon. Other carrier traps of yet unknown nature were detected as well. Variations of electrical activity of the traps were achieved applying variations in the process of the film formation. These changes were also detected during DLTS measurements, suggesting a possibility for applying of DLTS for the investigation and characterization of the thin-film Si material on glass.

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Torres-Torres, C., L. Castañeda, M. Trejo-Valdez, A. Maldonado, and R. Torres-Martínez. "Participation of the Third Order Optical Nonlinearities in Nanostructured Silver Doped Zinc Oxide Thin Solid Films." Journal of Nanomaterials 2012 (2012): 1–5. http://dx.doi.org/10.1155/2012/353061.

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We report the transmittance modulation of optical signals in a nanocomposite integrated by two different silver doped zinc oxide thin solid films. An ultrasonic spray pyrolysis approach was employed for the preparation of the samples. Measurements of the third-order nonlinear optical response at a nonresonant 532 nm wavelength of excitation were performed using a vectorial two-wave mixing. It seems that the separated contribution of the optical nonlinearity associated with each film noticeable differs in the resulting nonlinear effects with respect to the additive response exhibited by the bilayer system. An enhancement of the optical Kerr nonlinearity is predicted for prime number arrays of the studied nanoclusters in a two-wave interaction. We consider that the nanostructured morphology of the thin solid films originates a strong modification of the third-order optical phenomena exhibited by multilayer films based on zinc oxide.

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Weis, Martin, Katarína Gmucová, Daniel Haško, and Jarmila Müllerová. "Structural and electronic properties of pentacene/pentacenequinone thin films prepared by Langmuir–Blodgett technique." Collection of Czechoslovak Chemical Communications 74, no. 4 (2009): 565–79. http://dx.doi.org/10.1135/cccc2008210.

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Structural and electronic properties of pentacene/pentacenequinone thin films prepared on various solid-state substrates by the Langmuir–Blodgett technique are reported. Amorphous structure of the prepared films has been proved by XRD measurements. Oxygen-related defects have been identified in the Langmuir–Blodgett films as a consequence of the exposure of pentacene Langmuir layer to air. Crystallization induced by thermal treatment of the prepared amorphous thin films has been observed. Electronic properties of pentacene/ pentacenequinone Langmuir–Blodgett films have been investigated in the contact-less architecture using electrochemical techniques. The energy band diagram of the amorphous pentacene/pentacenequinone Langmuir–Blodgett film on a metallic surface was constructed from the obtained electrochemical data.

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Djamal, Mitra, and Ramli. "Thin Film of Giant Magnetoresistance (GMR) Material Prepared by Sputtering Method." Advanced Materials Research 770 (September 2013): 1–9. http://dx.doi.org/10.4028/www.scientific.net/amr.770.1.

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In recent decades, a new magnetic sensor based on magnetoresistance effect is highly researched and developed intensively. GMR material has great potential as next generation magnetic field sensing devices. It has also good magnetic and electric properties, and high potential to be developed into various applications of electronic devices such as: magnetic field sensor, current measurements, linear and rotational position sensor, data storage, head recording, and non-volatile magnetic random access memory. GMR material can be developed to be solid state magnetic sensors that are widely used in low field magnetic sensing applications. A solid state magnetic sensor can directly convert magnetic field into resistance, which can be easily detected by applying a sense current or voltage. Generally, there are many sensors for measuring the low magnetic field, such as: fluxgate sensor, Hall sensor, induction coil, GMR sensor, and SQUID sensor. Compared to other low magnetic field sensing techniques, solid state sensors have demonstrated many advantages, such as: small size (<0.1mm2), low power, high sensitivity (~0.1Oe) and good compatibility with CMOS technology. The thin film of GMR is usually prepared using: sputtering, electro deposition or molecular beam epitaxy (MBE) techniques. But so far, not many researchers reported the manufacture of thin film of GMR by dc-Opposed Target Magnetron Sputtering (dc-OTMS). In this paper, we inform the development of GMR thin film with sandwich and spin valve structures using dc-OTMS method. We have also developed organic GMR with Alq3 as a spacer layer.

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Zainun, A. R., Mohamad Hafiz Mamat, U. M. Noor, and Mohamad Rusop. "Characterization of Copper (I) Iodide (CuI) Thin Film using TMED for Dye-Sensitized Solar Cells." Advanced Materials Research 667 (March 2013): 447–51. http://dx.doi.org/10.4028/www.scientific.net/amr.667.447.

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Solid state dye-sensitized solar cells (DSSCs) were first reported in 1991 without employing p-type as hole conductor. The p-type as hole conductor was first introduced in 1995 and CuI is preferred among others p-type semiconductors. However, in 2003 utilizing of CuI based DSSC was found unstable by the excessive iodine strongly decreased the photocurrent of the cell. Later then, the stability of CuI based DSSCs was reported can be improved by added small amount of triethylamine hydrothiocyanate (THT) in the CuI coating solution. Following to that, in this work new chemical is introduce as an option to present situation which can give equally or better effective for fabrication of solid-state DSSCs. The chemical is called tetramethylethylenediamine (TMED), is employed to CuI in sol-gel process and their characterizations have been studied. The CuI coating solution was prepared by dissolved CuI powder with acetonitrile and added in 0.5mL TMED. Using spin coating technique the sol then deposited onto glass and silicon substrate at room temperature. The film were analyzed by their particles conductivity using pH meter, surface morphology using Field Emission Scanning Electron Microscope (FE-SEM) and optical properties using ultraviolet visible spectroscopy (UV-Vis) and photoluminescence (PL) measurement. The results of this sol-gel were compared with other CuI sol-gel which prepared by dissolved CuI powder with acetonitrile only. The optical transmittance within ultra-violet range exhibited that thin film is transparent and it optical band gap have been studied. Further clarification and measurements need to be done in order to prove that the proposed chemical can be used as an option.

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Gerlach, Frank, Kristina Ahlborn, and Winfried Vonau. "New electrochemical and physical measurements on sensitive glasses in thin-film technology." Journal of Electrochemical Science and Engineering 10, no. 2 (March 9, 2020): 177–84. http://dx.doi.org/10.5599/jese.720.

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All-solid-state sensors have several advantages compared to conventional ones. These include, e.g., miniaturization, planar design, location independence and an uncomplicated realization of sensors for high pressure and high temperature. Therefore, a number of physical sensors, such as temperature sensors, pressure sensors, rotation angle sensors and force sensors are available in thin-film techniques. The presented paper shows the advantages to combination of thin and thick film techniques to manufacture electrochemical sensors, especially using pulsed laser ablation to create amorphous layers of glass. Furthermore, it investigates the range of possibilities for characterization of bulk and surface properties with electrochemical methods and specialized techniques with thermally stimulated currents (TSC).

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Rayanasukha, Yossawat, Supanit Porntheeraphat, Win Bunjongpru, Narathon Khemasiri, Apirak Pankiew, Wutthinan Jeamsaksiri, Awirut Srisuwan, et al. "High Sensitive Nanocrystal Titanium Nitride EG-FET pH Sensor." Advanced Materials Research 802 (September 2013): 232–36. http://dx.doi.org/10.4028/www.scientific.net/amr.802.232.

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Solid state pH-sensor device with high efficiency has successfully prepared by using TiN thin film as sensing membrane of extended gate field effect transistor (EG-FET) device. This research has described the physical properties and sensing characteristics of TiN membrane thin film which deposited on SiO2/Si substrate through reactive D.C. magnetron sputtering system. Thenanocrytal-TiNwith anatasestructure depended on substrate heating conditions was revealed from glancing angle x-ray diffraction. The IDS-VGS measurement in the standard buffer solutions showed that the sensitivity of fabricated TiN-EGFET pH deviceis 59.82mV/pH.

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35

Escobedo-Cousin, Enrique, Konstantin Vassilevski, Irina P. Nikitina, Nicolas G. Wright, Anthony G. O'Neill, Alton B. Horsfall, and Jonathan P. Goss. "Local Solid Phase Epitaxy of Few-Layer Graphene on Silicon Carbide." Materials Science Forum 717-720 (May 2012): 629–32. http://dx.doi.org/10.4028/www.scientific.net/msf.717-720.629.

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Patterned Few Layers Graphene (FLG) films were grown by local solid phase epitaxy from nickel silicide supersaturated with carbon. The process was realised by annealing of thin Ni films deposited on the carbon-terminated surface of 6H-SiC semi-insulating wafer followed by wet processing to remove the resulting nickel silicide. Raman spectroscopy was used to investigate both the formation and subsequent removal of nickel silicide during processing. Characterisation of the resulting FLG films was carried out by Raman spectroscopy and Atomic Force Microscopy (AFM). The thickness of the final FLG film estimated from the Raman spectra varied from 1 to 3 monolayers for initial Ni layers varying from 3 to 20 nm thick. AFM observations revealed process-induced surface roughening in FLG films, however, electrical conductivity measurements by Transmission Line Model (TLM) structures confirmed that roughness does not compromise the film sheet resistance.

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Zhang, Yue, Shachi Katira, Andrew Lee, Andrew T. Lambe, Timothy B. Onasch, Wen Xu, William A. Brooks, et al. "Kinetically controlled glass transition measurement of organic aerosol thin films using broadband dielectric spectroscopy." Atmospheric Measurement Techniques 11, no. 6 (June 19, 2018): 3479–90. http://dx.doi.org/10.5194/amt-11-3479-2018.

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Abstract. Glass transitions from liquid to semi-solid and solid phase states have important implications for reactivity, growth, and cloud-forming (cloud condensation nuclei and ice nucleation) capabilities of secondary organic aerosols (SOAs). The small size and relatively low mass concentration of SOAs in the atmosphere make it difficult to measure atmospheric SOA glass transitions using conventional methods. To circumvent these difficulties, we have adapted a new technique for measuring glass-forming properties of atmospherically relevant organic aerosols. Aerosol particles to be studied are deposited in the form of a thin film onto an interdigitated electrode (IDE) using electrostatic precipitation. Dielectric spectroscopy provides dipole relaxation rates for organic aerosols as a function of temperature (373 to 233 K) that are used to calculate the glass transition temperatures for several cooling or heating rates. IDE-enabled broadband dielectric spectroscopy (BDS) was successfully used to measure the kinetically controlled glass transition temperatures of aerosols consisting of glycerol and four other compounds with selected cooling and heating rates. The glass transition results agree well with available literature data for these five compounds. The results indicate that the IDE-BDS method can provide accurate glass transition data for organic aerosols under atmospheric conditions. The BDS data obtained with the IDE-BDS technique can be used to characterize glass transitions for both simulated and ambient organic aerosols and to model their climate effects.

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Moffitt, Chris, Jonathan Counsell, and Simon Hutton. "Advances in surface chemical analysis of thin film solid-state battery materials and development of operando measurement capability." Microscopy and Microanalysis 27, S1 (July 30, 2021): 3448. http://dx.doi.org/10.1017/s1431927621011855.

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38

Wang, J. J., A. B. Limanov, Ying Wang, and James S. Im. "Observation of Superheating of Si at the Si/SiO2 Interface in Pulsed-laser irradiated Si Thin Films." MRS Proceedings 1770 (2015): 43–48. http://dx.doi.org/10.1557/opl.2015.727.

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ABSTRACTSubstantial superheating of single-crystal Si films at and near the bottom Si/SiO2 interface was observed. This was accomplished via back-side irradiation of a (100) single-crystal Si film on a quartz substrate using an excimer-laser pulse. The spatiotemporal details of the melting transition were tracked in situ using surface-side and substrate-side transient reflectance measurements, and the one-dimensional thermal profile evolution within the solid film during the heating period was numerically computed using the experimentally extracted temporal profile of the incident beam and temperature-dependent optical and thermal parameters of the materials. A simple lower-bound estimation identifies that superheating in excess of 100 K was attained within Si along the bottom (100)-Si/SiO2 interface even at moderate beam energy densities.

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39

Jiang, Guojun, and Sheng Xie. "Comparison of AFM Nanoindentation and Gold Nanoparticle Embedding Techniques for Measuring the Properties of Polymer Thin Films." Polymers 11, no. 4 (April 3, 2019): 617. http://dx.doi.org/10.3390/polym11040617.

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The surfaces of polymer and interfaces between polymer and inorganic particles are of particular importance for the properties of polymers and composites. However, the determination of the properties of surfaces and interfaces poses many challenges due to their extremely small dimensions. Herein, polystyrene and polymethyl methacrylate thin film on silicon wafer was used as a model system for the measurement of the properties of the polymer near free surface and at the polymer-solid interface. Two different methods, i.e., nanoindentation using atomic force microscopy (AFM) and the gold nanoparticle embedding technique, were used for these measurements. The results showed the elastic modulus of PS near the free surface determined by nanoindentation was lower than the bulk value. Based on contact mechanics analysis, nanoparticle embedding also revealed the existence of a lower-modulus, non-glassy layer near the free surface at temperatures below the bulk glass transition temperature (Tg). However, near the polymer-solid interface, the AFM nanoindentation method is not applicable due to the geometry confinement effect. On the other hand, the nanoparticle embedding technique can still correctly reflect the interactions between the polymer and the substrate when compared to the ellipsometry results.

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VanderHart, David L., Vivek M. Prabhu, Kristopher A. Lavery, Cindi L. Dennis, Ashwin B. Rao, and Eric K. Lin. "Thin-film solid-state proton NMR measurements using a synthetic mica substrate: Polymer blends." Journal of Magnetic Resonance 201, no. 1 (November 2009): 100–110. http://dx.doi.org/10.1016/j.jmr.2009.08.010.

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41

Macrelli, G., E. Poli, H. Demiryont, and R. Götzelmann. "Optical measurements and modeling of an all solid state inorganic thin film electrochromic system." Journal of Non-Crystalline Solids 218 (September 1997): 296–301. http://dx.doi.org/10.1016/s0022-3093(97)00204-4.

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42

Theron, C. C., J. A. Mars, C. L. Churms, J. Farmer, and R. Pretorius. "In situ, real-time RBS measurement of solid state reaction in thin films." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 139, no. 1-4 (April 1998): 213–18. http://dx.doi.org/10.1016/s0168-583x(97)00946-4.

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43

Belouschek, P., S. Maier, M. Suppa, U. Sattler, and D. Lorenz. "Measurement and Calculation of Solvation Forces in Thin Films between Two Solid Bodies." Materials Science Forum 25-26 (January 1988): 145–66. http://dx.doi.org/10.4028/www.scientific.net/msf.25-26.145.

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44

Chen, Xiaomin, Huanqi Cao, Hao Yu, Hao Zhu, Huanping Zhou, Liying Yang, and Shougen Yin. "Large-area, high-quality organic–inorganic hybrid perovskite thin films via a controlled vapor–solid reaction." Journal of Materials Chemistry A 4, no. 23 (2016): 9124–32. http://dx.doi.org/10.1039/c6ta03180c.

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45

Kvítek, Ondřej, Peter Konrád, and Václav Švorčík. "Time dependence and mechanism of Au nanostructure transformation during annealing." Functional Materials Letters 07, no. 03 (June 2014): 1450022. http://dx.doi.org/10.1142/s1793604714500222.

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Melting point of thin nanostructured materials decreases with decreasing particle size. This can influence thermal stability of thin films used in electronic applications and compromise their function. Therefore it is desirable to explore connection between metal film thickness and its thermal stability. Thin films of Au were sputtered for 10–300 s (2–60 nm thick layers). Post deposition annealing was carried out at 150–300°C for 15–180 min. Sheet electrical resistance measurements were employed to investigate electrical continuousness of the Au film. A significant leap in percolation threshold was found between samples annealed at 250°C and 300°C. This suggests that phase transition occurs during annealing, however, annealing for different times suggests the structural modification is a gradual and slow process, which is a sign of diffusion in a solid state. This was further supported by UV–Vis measurements which showed slow evolution of plasmon resonance peak. Convincing direct evidence of the surface morphology evolution was obtained by AFM microscopy.

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46

Sugimura, Y., I. Cohen-Karni, P. McCluskey, and J. J. Vlassak. "Stress Evolution in Sputter-deposited Fe–Pd Shape-memory Thin Films." Journal of Materials Research 20, no. 9 (September 2005): 2279–87. http://dx.doi.org/10.1557/jmr.2005.0283.

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Fe–Pd films with Pd content varying between 26 and 30 at.% have been deposited by means of magnetron sputtering of elemental Fe and Pd targets. As-deposited films are highly supersaturated solid solutions of Pd in Fe that have a body-centered-cubic crystal structure and a very fine grain size. Substrate curvature measurements indicate that the films undergo an irreversible densification when heated above 100 °C. This densification is attributed to a structural change that is also observed in other supersaturated systems with a substantial atomic size difference between the constituents. It is possible to retain the high-temperature austenite phase at low temperature by annealing the films at 900 °C followed by rapid cooling. Depending on film composition, this metastable austenitic phase transforms to either a body-centered tetragonal (bct) or a face-centered tetragonal (fct) martensite around room temperature. Substrate curvature measurements show that formation of the fct martensite is reversible, while that of bct martensite is not. The fct transformation occurs at lower Pd content and higher temperature than reported for bulk materials. Both the fct and the fcc phase show a strong Invar effect at lower temperature and Pd content than observed in the bulk.

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47

Takaoka, Akio, Taoka Hiroshi, and Ura Katsumi. "Temperature Measurement on Micro-Area of Polycrystalline Film with TEM." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (August 12, 1990): 128–29. http://dx.doi.org/10.1017/s0424820100179397.

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With a focused laser beam, we can heat a specimen in TEM locally (∼5 μm), and rapidly (∼10 μs) and also at a high temperature (>1000°C)[1]. For such heating, a new method for temperature measurement is necessary. By using the thermal diffuse scattering in the TEM specimen, the temperature in a local area (∼1 μm) can be measured rapidly (<10 μs)[2]. Figure 1 is the schematic diagram of the local heating system by a laser diode and the temperature measuring system.The intensity of transmission beam through a specimen depends on (1) temperature T, (2) thickness d, (3) material of specimen, (4) Bragg condition, (5) accelerating voltage and (6) detection angle at the detector. If the conditions for (3)-(6) are fixed, the transmission is represented by τ(T,d). With two wave approximation, the transmission through a thin crystal is theoretically shown by Hall, Hirsch[3] and Kamiya. In the case of polycrystal, the transmission is given by the statistical average of transmission for each crystallite. In Fig.2(a), the solid lines are the calculated values for polycrystalline Al films, while the circles are the measured values for evaporated Al films with a heating specimen holder. Here, the transmission is normalized with the value at room temperature. Some disagreement exists in both values, because the some assumed conditions are not valid in the experiment.

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Tezel, Fatma Meydaneri, and İ. Afşin Kariper. "Effect of pH on the structural and optical properties of polycrystalline ZnSe thin films produced by CBD method." International Journal of Modern Physics B 33, no. 05 (February 20, 2019): 1950024. http://dx.doi.org/10.1142/s0217979219500243.

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In this study, zinc selenide (ZnSe) thin films were produced on glass substrate by using chemical bath deposition (CBD) method at 80[Formula: see text]C, from aqueous solutions of zinc sulphate and sodium selenosulphide, which were produced using solid selenium as the selenium source. The optical and structural properties of ZnSe thin films were investigated at room-temperature. The pH of the chemical bath, in which ZnSe thin films were immersed, were changed between pH:8–11. Optical properties of the films, including extinction coefficient, refractive index, reflectance, absorbance, transmittance, dielectric constants and optical density values were calculated using absorbance and transmittance measurements determined using a Hach Lange 500 spectrophotometer, in 300–1100 nm wavelength range. Optical bandgap values were obtained from transmittance and absorbance spectra ranged between 2.12 and 2.49 eV. According to XRD results, it was found that the films have polycrystalline structure and they exhibited different film thicknesses depending on phase and pH changes.

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Wang, Y. C., T. Hoechbauer, J. G. Swadener, A. Misra, R. G. Hoagland, and M. Nastasi. "Mechanical Fatigue Measurement via a Vibrating Cantilever Beam for Self-Supported Thin Solid Films." Experimental Mechanics 46, no. 4 (May 1, 2006): 503–17. http://dx.doi.org/10.1007/s11340-006-7556-4.

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50

Floriot, Johan, Fabien Lemarchand, Laetitia Abel-Tiberini, and Michel Lequime. "High accuracy measurement of the residual air gap thickness of thin-film and solid-spaced filters assembled by optical contacting." Optics Communications 260, no. 1 (April 2006): 324–28. http://dx.doi.org/10.1016/j.optcom.2005.10.015.

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Journal articles on the topic 'Thin solid film measurement'

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