Books on the topic 'Thin films – Analysis'

Linke, Felix. Development of ellipsometric microscopy as a quantitative high-resolution technique for the investigation of thin films at glass-water and silicon-air interfaces. Jülich: Forschungszentrum Jülich, 2004.

Khomchenko, Alexander V. Waveguide spectroscopy of thin films. Amsterdam: Elsevier, 2005.

In-situ characterization of thin film growth. Cambridge: Woodhead Publishing, 2011.

1930-, Mayer James W., ed. Fundamentals of surface and thin film analysis. New York: North-Holland, 1986.

Optical diagnostics for thin film processing. San Diego, CA: Academic Press, 1996.

Friedbacher, Gernot, and H. Bubert. Surface and thin film analysis: A compendium of principles, instrumentation, and applications. Weinheim: Wiley-VCH, 2011.

Friedbacher, Gernot, and H. Bubert. Surface and thin film analysis: A compendium of principles, instrumentation, and applications. 2nd ed. Weinheim: Wiley-VCH, 2011.

Zhang, Wendong, and Chenyang Xue. Ban dao ti bo mo guang pu xue. Bei jing: Ke xue chu ban she, 2008.

M, Gruen Dieter, Shenderova Olga A, and Vul' Alexander, eds. Synthesis, properties, and applications of ultrananocrystalline diamond. Dordrecht: Springer, 2005.

Bliznakovska, Blagica. Analysis methods and techniques for hard thin layer-coatings characterization: In particular on titanium nitride. Jülich: Forschungszentrum Jülich, 1993.

Kirovskai͡a, I. A. Poverkhnostnye svoĭstva almazopodobnykh poluprovodnikov, khimicheskiĭ sostav poverkhnosti, kataliz. Irkutsk: Izd-vo Irkutskogo universiteta, 1988.

Owen, G. Suppression of interference effects in spectroscopy using an integrating sphere. Palo Alto, CA: Hewlett-Packard Laboratories, Technical Publications Department, 1996.

Rubinstein, Israel, and Allen J. Bard. Electroanalytical chemistry. 2nd ed. New York: Marcel Dekker, 2003.

Abraham, Thomas. Diamond, diamond-like carbon/CBN films and coated products: Technology analysis. Norwalk, CT: Business Communications Co., 2002.

Abraham, Thomas. Diamond, diamond-like, and CBN films and coated products: Market analysis. Norwalk, CT: Business Communications Co., 2002.

Govier, R. D. X-ray fluorescence analysis of superalloy leach liquors using a thin-film technique. Washington, D.C: U.S. Dept. of the Interior, Bureau of Mines, 1989.

Sloof, Willem Gerrit. Internal stresses and microstructure of layer/substrate assemblies: Analysis of TiC and TiN coatings chemically vapour deposited on various substrates. Delft, Netherlands: Delft University Press, 1996.

Faghri, Amir. Numerical and experimental analysis of a thin liquid film on a rotating disk related to development of a spacecraft absorption cooling system. [Washington, DC]: National Aeronautics and Space Administration, 1990.

Abraham, Thomas. Diamond, diamond-like, and CBN films and coated products: A technical analysis including emerging technologies, new developments, and patents. Norwalk, CT: Business Communications Co., 1997.

Lessard, Victor R. Low speed analysis of mission adaptive flaps on a high speed civil transport configuration. Hampton, Va: National Aeronautics and Space Administration, Langley Research Center, 1999.

Lessard, Victor R. Low speed analysis of mission adaptive flaps on a high speed civil transport configuration. Hampton, Va: National Aeronautics and Space Administration, Langley Research Center, 1999.

James, Howe, and SpringerLink (Online service), eds. Transmission Electron Microscopy and Diffractometry of Materials. 4th ed. Berlin, Heidelberg: Springer Berlin Heidelberg, 2013.

Friedbacher, Gernot, and Henning Bubert, eds. Surface and Thin Film Analysis. Weinheim, Germany: Wiley-VCH Verlag GmbH & Co. KGaA, 2011. http://dx.doi.org/10.1002/9783527636921.

Choe, Steve. Sovereign Violence. NL Amsterdam: Amsterdam University Press, 2018. http://dx.doi.org/10.5117/9789463725507.

Norris, David John. RBS and TEM analyses of laser-ablated heteroepitaxial YBa[inferior two]Cu[inferior three]O[inferior seven-delta] thin films. Birmingham: University of Birmingham, 1999.

Hoagland, Joseph John. Spectroscopic and morphological analysis of copper 7,7,8,8-tetracyanoquinodimethane (CuTCNQ) thin films. 1992.

Fundamentals of Surface Thin Film Analysis. Prentice Hall PTR, 1986.

Oechsner, Hans. Thin Film and Depth Profile Analysis. Springer, 2012.

1964-, Berakdar J., and Kirschner Jürgen, eds. Correlation spectroscopy of surfaces, thin films, and nanostructures. Weinheim: Wiley-VCH, 2004.

(Editor), Jamal Berakdar, and Jürgen Kirschner (Editor), eds. Correlation Spectroscopy of Surfaces, Thin Films, and Nanostructures. Wiley-VCH, 2004.

Birkholz, Mario. Thin Film Analysis by X-Ray Scattering. Wiley & Sons, Incorporated, John, 2006.

Birkholz, Mario. Thin Film Analysis by X-Ray Scattering. Wiley-VCH Verlag GmbH, 2006.

Thin Film Analysis by X-Ray Scattering. Wiley-VCH, 2006.

H, Bubert, and Jenett H, eds. Surface and thin film analysis: Principles, instrumentation, applications. Weinheim: Wiley-VCH, 2002.

Friedbacher, Gernot, and Henning Bubert. Surface and Thin Film Analysis: A Compendium of Principles, Instrumentation, and Applications. Wiley & Sons, Limited, John, 2011.

Friedbacher, Gernot, and Henning Bubert. Surface and Thin Film Analysis: A Compendium of Principles, Instrumentation, and Applications. Wiley & Sons, Incorporated, John, 2011.

(Editor), Henning Bubert, and Holger Jenett (Editor), eds. Surface and Thin Film Analysis: A Compendium of Principles, Instrumentation, and Applications. Wiley-VCH, 2002.

United States. National Aeronautics and Space Administration., ed. Analysis of hard thin film coating: Final report for NASA-UAH contract NAS8-38609, D.O. 59 : funding level, $19,000 (total). [Washington, DC: National Aeronautics and Space Administration, 1998.

Analysis of hard thin film coating: Final report for NASA-UAH contract NAS8-38609, D.O. 59 : funding level, $19,000 (total). [Washington, DC: National Aeronautics and Space Administration, 1998.

Feldman, L. C., James W. Mayer, and Terry L. Alford. Fundamentals of Nanoscale Film Analysis. Springer, 2008.

Fundamentals of Nanoscale Film Analysis. Springer, 2007.

Theoretical Concepts of XRay Nanoscale Analysis Springer Series in Materials Science. Springer-Verlag Berlin and Heidelberg GmbH &, 2013.

M, Senthilkumar, and Bhabha Atomic Research Centre, eds. A self-learning approach based on artificial neural network (ANN) for the characterization, analysis and inverse synthesis of thin film optical coatings. Mumbai: Bhabha Atomic Research Centre, 2001.

Stenzel, Olaf. The Physics of Thin Film Optical Spectra: An Introduction. Springer, 2015.

Stenzel, Olaf. The Physics of Thin Film Optical Spectra: An Introduction. Springer, 2010.

Ayers, Brian. Laser induced gratings in a-As[subscript x]Seb1-s[subscript x] thin films. 1993.

The Physics of Thin Film Optical Spectra: An Introduction (Springer Series in Surface Sciences). Springer, 2005.

Spectroscopic analysis of perfluoropolyether lubricant degradation during boundary lubrication. Washington, DC: National Aeronautics and Space Administration, 1997.

A, Shogrin Bradley, Jones William R, and United States. National Aeronautics and Space Administration., eds. Spectroscopic analysis of perfluoropolyether lubricant degradation during boundary lubrication. Washington, DC: National Aeronautics and Space Administration, 1997.

(Editor), Olga A. Shenderova, and Dieter M. Gruen (Editor), eds. Ultrananocrystalline Diamond: Synthesis, Properties, and Applications. William Andrew Publishing, 2006.