Relevant bibliographies by topics / Thin films – Analysis

Academic literature on the topic 'Thin films – Analysis'

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Published: 4 June 2021
Last updated: 1 February 2022

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Journal articles on the topic "Thin films – Analysis"

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Peng, J., V. Ji, W. Seiler, A. Levsque, A. Bouteville, and C. Braham. "OS04W0010 GIXRD residual stress analysis on CVD Tantalum thin films." Abstracts of ATEM : International Conference on Advanced Technology in Experimental Mechanics : Asian Conference on Experimental Mechanics 2003.2 (2003): _OS04W0010. http://dx.doi.org/10.1299/jsmeatem.2003.2._os04w0010.

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Serizawa, Kazufumi, Keisuke Tanaka, Yoshiaki Akiniwa, and Hirohisa Kimachi. "OS06W0448 Finite element analysis of elastic properties of textured thin films." Abstracts of ATEM : International Conference on Advanced Technology in Experimental Mechanics : Asian Conference on Experimental Mechanics 2003.2 (2003): _OS06W0448. http://dx.doi.org/10.1299/jsmeatem.2003.2._os06w0448.

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Kobayashi, T., S. Takamiya, T. Fukui, and H. Kanematsu. "ICONE19-43421 Nuclear reaction analysis for composition measurement of BN thin films." Proceedings of the International Conference on Nuclear Engineering (ICONE) 2011.19 (2011): _ICONE1943. http://dx.doi.org/10.1299/jsmeicone.2011.19._icone1943_174.

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ZORGATI, HAMDI. "MODELING THIN CURVED FERROMAGNETIC FILMS." Analysis and Applications 03, no. 04 (October 2005): 373–96. http://dx.doi.org/10.1142/s0219530505000637.

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The behavior of a thin film made of a ferromagnetic material in the absence of an external magnetic field is described by an energy depending on the magnetization of the film verifying the saturation constraint. The free energy consists of an induced magnetostatic energy and an energy term with density including the exchange energy and the anisotropic energy. We study the behavior of this energy when the thickness of the curved film goes to zero. We show that the minimizers of the free energy converge to the minimizers of a local energy depending on a two-dimensional magnetization by Γ-convergence arguments.
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Gaudiello, Antonio, and Rejeb Hadiji. "Junction of ferromagnetic thin films." Calculus of Variations and Partial Differential Equations 39, no. 3-4 (March 30, 2010): 593–619. http://dx.doi.org/10.1007/s00526-010-0327-1.

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Rani.S, Rani S., and Shanthi J. Shanthi.J. "XPS,EDAX and FT-IR Analysis of Annealed Electron Beam Evaporated Cdse Thin Films." International Journal of Scientific Research 3, no. 3 (June 1, 2012): 320–21. http://dx.doi.org/10.15373/22778179/march2014/108.

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Carbone, Luciano, Khaled Chacouche, and Antonio Gaudiello. "Fin junction of ferroelectric thin films." Advances in Calculus of Variations 11, no. 4 (October 1, 2018): 341–71. http://dx.doi.org/10.1515/acv-2016-0047.

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AbstractIn this paper, starting from a non-convex and nonlocal 3D-variational model for the electric polarization in a ferroelectric material, and using an asymptotic process based on dimensional reduction, we analyze junction phenomena for two orthogonal joined ferroelectric thin films. We obtain three different 2D-variational models for joined thin films, depending on how the reduction happens. Indeed, a memory effect of the reduction process appears, and it depends on the competition of the relative thickness of the two films. The guide parameter is the limit of the ratio between these two small thickness.
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Price, C. W., and E. F. Lindsey. "Analysis of electroless nickel thin films." Proceedings, annual meeting, Electron Microscopy Society of America 49 (August 1991): 510–11. http://dx.doi.org/10.1017/s0424820100086854.

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Thickness measurements of thin films are performed by both energy-dispersive x-ray spectroscopy (EDS) and x-ray fluorescence (XRF). XRF can measure thicker films than EDS, and XRF measurements also have somewhat greater precision than EDS measurements. However, small components with curved or irregular shapes that are used for various applications in the the Inertial Confinement Fusion program at LLNL present geometrical problems that are not conducive to XRF analyses but may have only a minimal effect on EDS analyses. This work describes the development of an EDS technique to measure the thickness of electroless nickel deposits on gold substrates. Although elaborate correction techniques have been developed for thin-film measurements by x-ray analysis, the thickness of electroless nickel films can be dependent on the plating bath used. Therefore, standard calibration curves were established by correlating EDS data with thickness measurements that were obtained by contact profilometry.
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KUROSAKI, Kazuo. "Surface analysis of organic thin films." Journal of the Metal Finishing Society of Japan 36, no. 12 (1985): 520–27. http://dx.doi.org/10.4139/sfj1950.36.520.

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NOMAKI, TATSUO, AKIKO YAMANAKA, and KATSUYUKI NAITO. "THERMAL ANALYSIS OF ORGANIC THIN FILMS." Analytical Sciences 7, Supple (1991): 1287–88. http://dx.doi.org/10.2116/analsci.7.supple_1287.

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Dissertations / Theses on the topic "Thin films – Analysis"

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Miller, James R. "Analysis of rectifying molecular thin films." Thesis, Cranfield University, 2005. http://dspace.lib.cranfield.ac.uk/handle/1826/10445.

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The mercury-drop electrode technique, when used to measure the current/voltage characteristics of thin films of molecular rectifiers, is a useful, if awed method of analysis. Current/voltage plots taken from a number of samples confirm previous studies taken using the scanning tunnelling microscope (STM), but indicate significant levels of penetration of the mercury into the sample or stabilising monolayer. Quartz crystal microbalance (QCM) studies of the adsorption of 7,7,8,8°- tetracyanoquinodimethane (TCNQ) onto clean gold indicate small but significant adsorption, with possible formation of a salt, via conversion of TCNQ into the radical anion. This has implications for the results of previous experiments, which indicate alternative sources for the rectification observed from donor-bridge-acceptor systems, but also suggest use of the TCNQ radical anion as a electron donor when used to replace the counterion present in a number of self-assembled systems. Previous STM- based measurements confirming this latter suggestion are supported by mercury-drop studies. The results support conclusions previously drawn by a number of authors, removing much of the ambiguity surrounding their interpretation, whilst clarifying the adsorption characteristics of thiol-based molecules that contain a terminal TCNQ group, and to some extent, TCNQ itself. It is suggested that the mercury-drop technique should never be used in isolation to quantify rectification in monolayers of molecular rectifiers, but that it is suitable for use only i confirming and checking results from more established procedures.
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Pasupuleti, Ajay. "Analysis of effective mechanical properties of thin films used in microelectromechanical systems /." Online version of thesis, 2007. http://hdl.handle.net/1850/5283.

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Sullivan, Brian Thomas. "Spectroscopic ellipsometry of Palladium thin films." Thesis, University of British Columbia, 1987. http://hdl.handle.net/2429/27546.

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Spectroscopic ellipsometry is a nondestructive, ambient surface analysis technique for studying surfaces, interfaces and thin films. To take advantage of this method an automatic spectroscopic ellipsometer was designed and constructed for the microstructural characterization of thin films. This high precision instrument is capable of measuring in real-time the optical properties of bulk or thin film materials over the visible-UV region (1.5 - 6.0 eV). The microstructure of thin films can be determined from an effective medium theory analysis of the spectroellipsometric data to investigate how the film morphology evolves with varying preparation conditions and to determine the optimum deposition parameters. In this thesis the pseudodielectric function of palladium films prepared by dc planar magnetron sputtering was measured while the substrate temperature, argon partial pressure and rf-induced substrate bias were varied independently during deposition. The film data are in excellent agreement with the effective medium theory of Sen, Scala, and Cohen, relevant for a random coated-particle microstructure where the grains are optically isolated from each other. With increasing substrate temperature, the Pd volume fraction in the bulk was found to decrease slightly, while the rms microroughness of the film surface increased in magnitude. At 190° C, the rms microroughness was 80 ± 3 Awith the Pd volume fraction in the bulk region falling slightly to 97 ± 1% relative to the film deposited at 22° C. For argon partial pressures below a transition pressure, Pt≃15 mTorr, the films consisted of densely packed grains, corresponding to the zone T in Thornton's structure zone model. Above this transition pressure, the films developed into a more voided columnar structure, characteristic of the zone 1 region. A microstructural analysis indicated a general trend towards increased porosity and microroughness of the films with higher argon pressures. The zone 1 region was best described optically by a random coated-particle microstructure and the electron microscopy confirmed that for thin films prepared at argon pressures higher than Pt, the grains became isolated by void boundaries. The optical data could not distinguish whether or not the films were 2- or 3-dimensionally isotropic. With increasing rf-induced substrate biasing, the Pd film microstructure was modified in a manner similar to that obtained by varying the substrate temperature alone. Significant resputtering of the Pd films occurred, varying from 2 to 11 A/sec for bias voltages of -550 V to -1375 V, respectively. The measured deposition rate while bias sputtering was significantly higher than that expected upon the measured resputtering rate and several mechanisms were proposed to account for the enhancement in the deposition rate. The films were best characterized by a 2-dimensional isotropy which was supported by the columnar nature of the films observed by electron microscopy. Finally, the dielectric function of the "best" palladium film is compared to optical constants of Pd previously reported in the literature for bulk and thin film specimens. While all the authors quote essentially the same values for the real part of the dielectric function, regardless of the preparation or measurement technique, the imaginary part differs up to a factor of two. Surface microroughness, bulk porosity and oxide layers are unable to account for the difference. A possible grain boundary scattering mechanism is suggested.
Science, Faculty of
Physics and Astronomy, Department of
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Sánchez, Rodríguez Daniel. "Obtaining advanced oxide thin films at low temperatures by chemical methods. Thermal analysis of thin films." Doctoral thesis, Universitat de Girona, 2015. http://hdl.handle.net/10803/328723.

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L'objectiu d'aquest treball és analitzar mètodes químics de baix cost com a ruta per a sintetitzar òxids avançats a baixa temperatura. En particular, hem explorat l'SHS per a la síntesi d'un òxid catalitzador fent servir pólvores de ciano complexes heteronuclears. També hem explorat el transport de calor per a sintetitzar capes via VCS concloent que les capes primes rarament experimentaran una combustió. Per això hem analitzat la condició necessària per que tingui lloc una combustió volumètrica en una mostra sòlida que reacciona sense intercanvi de gasos amb el seu entorn. Per fer-ho, hem ampliat el criteri de Frank-Kaminetskii per a sistemes d'escalfament continu i per a reactors cilíndrics. Per la part experimental em fet servir tècniques l'anàlisi tèrmica (TA). Hem desenvolupat un mètode per a mesurar la conductivitat tèrmica en pólvores per DSC. Finalment, hem desenvolupat dos criteris per a comprovar la fiabilitat en la mesura de la temperatura als experiments de TA.
The aim of this work is to analyse chemical methods as a route to synthesise advanced oxides at low cost and low temperatures. In particular, we have explored the combustion synthesis of a catalytic perovskite-type oxide from heteronuclear cyano complex powders. We have also explored heat transfer to synthesise films via VCS and concluded that thin films will hardly experience combustion. In particular, we have analysed the conditions needed for a thermal explosion to occur in a solid sample reacting without any gas exchange with its surroundings. For that purpose, we have extended the Frank-Kamenetskii relationship to continuous heating systems and to cylindrical reactors. The experimental component of this work is based on thermal analysis methods (TA). We have developed a new method to measure thermal conductivity of powders by DSC. Finally, we have developed two analytical relationships to check the reliability of the sample temperature in TA experiments.
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Hickey, Carolyn Frances. "Optical, chemical, and structural properties of thin films of samarium-sulfide and zinc-sulfide." Diss., The University of Arizona, 1987. http://hdl.handle.net/10150/184263.

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The development of materials for optical thin film application is essential to progress in fields such as optical data storage and signal processing. Samarium sulfide (SmS) thin films were prepared by reactive evaporation of samarium in hydrogen sulfide (H₂S). These displayed optical switching properties despite the presence of large amounts of carbon and oxygen. They are therefore potentially useful for data storage. The semiconductor to metal phase transition was characterized by x-ray diffraction and spectrophotometry. The observed optical response was modelled by a Bruggeman effective medium calculation. Success with this analysis suggests it as a means for predicting performance in subsequent applications. Zinc sulfide (ZnS) thin films were prepared by molecular beam epitaxy (MBE). Implimentation of an H₂S treated silicon surface provided good chemical bond match in addition to a good lattice match. Atomic layer epitaxy was unsuccessfully explored as a means to grow ZnS from zinc and H₂S reactants, therefore other reactants are proposed. Both the MBE and ALE work is directed at the long term goals of producing p-type ZnS, which is suitable for semiconductor lasing at short wavelengths, and high quality SmS thin films.
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Mauthoor, Soumaya. "Structural analysis of molecular nanostructures and thin films." Thesis, Imperial College London, 2010. http://hdl.handle.net/10044/1/6362.

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Phthalocyanines (Pcs) form crystals whose structure and morphology depend on the growth conditions, leading to changes in the physical properties which are still little understood. Pc thin films and nanostructures have already been exploited in optoelectronic applications and could form the basis of spintronic devices but little or contradictory structural information is available because they are challenging systems to study. Hence the precise determination of the molecular order in these systems is of considerable interest both from a fundamental and technological point of view but requires a combination of complementary techniques. Crystalline powders of α-copper phthalocyanine (CuPc), α-metal-free phthalocyanine (H2Pc) and their mixtures are studied using powder X-ray diffraction (XRD) and found to be isomorphous and adopt a triclinic structure first proposed for α-CuPc (Hoshino et al., 2003). This information is used to study highly textured crystalline α-Pc thin films. The texture reduces the available crystallographic information but allows for the manipulation of the anisotropic physical properties. The Pc molecular plane lies 82±11° to the substrate when deposited on a weakly interacting substrate but at 7 or 9±5° when templated by a layer of perylene-3,4,9,10-tetracarboxylic dianhydride (PTCDA). Such an interpretation is different to all those previously given. The change in the texture is confirmed by high resolution transmission electron microscopy (HRTEM) of ultramicrotomed cross-sections of the films. The optimum TEM operating conditions were first determined on sections of CuPc single crystals which demonstrated an information limit of ~5Å with HRTEM. The technique was then applied to the films and the morphology, crystallinity and texturing of the layers is largely retained by the sectioning process. With further refinements it is hoped that this technique could be used to study the properties of interfaces and individual domains in multilayers and blends of organic thin films. Lastly the crystal structure of a new CuPc phase designated as η which forms nanowires as thin as 10nm and shows enhanced absorption in the infra-red (IR) is proposed. XRD, transmission electron diffraction (TED) and lattice potential energy (LPE) minimisation were used to determine the crystal structure: monoclinic P21/a, Z = 2, a = 24.8±0.2Å, b = 3.77±0.02Å, c = 13.2±0.1Å and β = 106±1°. The LPE minimisation was validated by correctly predicting the atomic coordinates of β-CuPc to within 0.05Å.
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Craib, Glenn R. G. "Thin film structural determination and surface analysis." Thesis, University of Aberdeen, 1996. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.320771.

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A combined approach to the use of surface analysis techniques and X-ray diffraction has been introduced. In particular the development of the microstructure of UHV evaporated thin metallic films has been investigated with a view to clarifying influences on microstructure (particularly texture). This study has shown the wide range of experimental parameters which affect the final film structure, such as temperature, oblique incidence and substrate roughness. An automated energy dispersive X-ray diffractometer has been developed for the study of thin film texture. The required corrections for loss of intensity due to sample positioning have been developed and verified. Pole figures have been collected for erbium and nickel thin films (thickness 200-1200 nm) grown on molybdenum or glass substrates. Results for the erbium films show a substantial effect on the texture of the film, contributed by the temperature of the substrate during deposition. The texture varies from mixed fiber at low temperature, to a strong single fiber orientation at around 663 K, to mixed fiber at higher temperatures. The strong orientation at 663 K has been shown to vary from either (002) to (101) depending on as yet unknown experimental conditions. The effect of substrate roughness appears to be only in the degree of orientation and it does not affect the overall nature of the texture of the film. The texture of the nickel films shows a form of "granular epitaxy" at substrate temperatures above 300 K. The presence of tensile stress within one of these nickel thin film samples has been determined and is interpreted to give support to a proposed mode of granular epitaxy.
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Cotier, Bradley Neville. "Fullerene nanostructures, monolayers and thin films." Thesis, University of Nottingham, 2000. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.342471.

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Riedle, Thomas. "Raman spectroscopy for the analysis of thin CuInS2 films." [S.l.] : [s.n.], 2002. http://deposit.ddb.de/cgi-bin/dokserv?idn=964986388.

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Smith, Alastair. "Cavity enhanced spectroscopy methods for analysis of thin films." Thesis, University of Bristol, 2007. http://ethos.bl.uk/OrderDetails.do?uin=uk.bl.ethos.443666.

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Books on the topic "Thin films – Analysis"

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Linke, Felix. Development of ellipsometric microscopy as a quantitative high-resolution technique for the investigation of thin films at glass-water and silicon-air interfaces. Jülich: Forschungszentrum Jülich, 2004.

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Khomchenko, Alexander V. Waveguide spectroscopy of thin films. Amsterdam: Elsevier, 2005.

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In-situ characterization of thin film growth. Cambridge: Woodhead Publishing, 2011.

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1930-, Mayer James W., ed. Fundamentals of surface and thin film analysis. New York: North-Holland, 1986.

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Optical diagnostics for thin film processing. San Diego, CA: Academic Press, 1996.

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Friedbacher, Gernot, and H. Bubert. Surface and thin film analysis: A compendium of principles, instrumentation, and applications. Weinheim: Wiley-VCH, 2011.

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Friedbacher, Gernot, and H. Bubert. Surface and thin film analysis: A compendium of principles, instrumentation, and applications. 2nd ed. Weinheim: Wiley-VCH, 2011.

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Zhang, Wendong, and Chenyang Xue. Ban dao ti bo mo guang pu xue. Bei jing: Ke xue chu ban she, 2008.

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M, Gruen Dieter, Shenderova Olga A, and Vul' Alexander, eds. Synthesis, properties, and applications of ultrananocrystalline diamond. Dordrecht: Springer, 2005.

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Bliznakovska, Blagica. Analysis methods and techniques for hard thin layer-coatings characterization: In particular on titanium nitride. Jülich: Forschungszentrum Jülich, 1993.

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Book chapters on the topic "Thin films – Analysis"

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Cohen, Jerome B. "Stresses in Thin Films." In Advances in X-Ray Analysis, 25–32. Boston, MA: Springer US, 1990. http://dx.doi.org/10.1007/978-1-4613-9996-4_3.

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Coufal, H. "Photothermal Analysis of Thin Films." In Topics in Current Physics, 129–56. Berlin, Heidelberg: Springer Berlin Heidelberg, 1989. http://dx.doi.org/10.1007/978-3-642-83945-0_5.

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Noyan, I. C., and C. C. Goldsmith. "Inhomogeneous Deformation in Thin Films." In Advances in X-Ray Analysis, 627–33. Boston, MA: Springer US, 1997. http://dx.doi.org/10.1007/978-1-4615-5377-9_68.

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Kaufmann, M., M. Mantler, and F. Weber. "Analysis of Thin Films and Multi-Layer Thin Films containing Light Elements by XRF." In Advances in X-Ray Analysis, 701–6. Boston, MA: Springer US, 1997. http://dx.doi.org/10.1007/978-1-4615-5377-9_77.

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Willis, James E. "Characterization of Thin Films Using XRF." In Advances in X-Ray Analysis, 189–95. Boston, MA: Springer US, 1990. http://dx.doi.org/10.1007/978-1-4613-9996-4_21.

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Wang, Qi. "High-Throughput Conductivity Measurements of Thin Films." In High-Throughput Analysis, 395–413. Boston, MA: Springer US, 2003. http://dx.doi.org/10.1007/978-1-4419-8989-5_18.

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Coustumer, Philippe Le, Patrick Chapon, Agnès Tempez, Yuriy Popov, George Thompson, Igor Molchan, Nicolas Trigoulet, et al. "Analysis of thin and thick Films." In Mass Spectrometry Handbook, 943–59. Hoboken, NJ, USA: John Wiley & Sons, Inc., 2012. http://dx.doi.org/10.1002/9781118180730.ch41.

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Gorman, G. L., M. M. Chen, G. Castillo, and R. C. C. Perera. "Density Measurement of Thin Sputtered Carbon Films." In Advances in X-Ray Analysis, 323–30. Boston, MA: Springer US, 1989. http://dx.doi.org/10.1007/978-1-4757-9110-5_41.

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Malič, Barbara, Alja Kupec, and Marija Kosec†. "Thermal Analysis." In Chemical Solution Deposition of Functional Oxide Thin Films, 163–79. Vienna: Springer Vienna, 2013. http://dx.doi.org/10.1007/978-3-211-99311-8_7.

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Bahr, D. F., D. J. Morris, M. C. Robinson, A. L. Olson, C. D. Richards, and R. F. Richards. "Failure Pzt Thin Films in Mems." In Experimental Analysis of Nano and Engineering Materials and Structures, 571–72. Dordrecht: Springer Netherlands, 2007. http://dx.doi.org/10.1007/978-1-4020-6239-1_283.

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Conference papers on the topic "Thin films – Analysis"

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Yacoubian, Araz, Vadim Chuyanov, Sean M. Garner, Hua Zhang, William H. Steier, Albert S. Ren, Galina Todorova, and Larry R. Dalton. "Acoustic spectrum analysis using polymer integrated optics." In Organic Thin Films. Washington, D.C.: OSA, 1999. http://dx.doi.org/10.1364/otf.1999.sad2.

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Berkovic, Garry, G. Meshulam, and Z. Kotler. "Molecular hyperpolarizablilty in the two-photon resonance regime: Measurement and analysis." In Organic Thin Films. Washington, D.C.: OSA, 1999. http://dx.doi.org/10.1364/otf.1999.sub3.

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Baik, Chan-Wook, Jang Hwan Tae, Jaeduck Jang, Jae Kwan Kim, Byonggwon Song, Jeong Yub Lee, Kyung-Sang Cho, and Hyuck Choo. "Wavefront analysis of subwavelength dielectric metalenses." In Nanoengineering: Fabrication, Properties, Optics, Thin Films, and Devices XVII, edited by Wounjhang Park, André-Jean Attias, and Balaji Panchapakesan. SPIE, 2020. http://dx.doi.org/10.1117/12.2567387.

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Fernandes de Oliveira Barros, Ana Juiia, and Vitaly F. Rodriguez-Esquerre. "Analysis of tilted subwavelength periodical waveguides: polarization effects." In Nanoengineering: Fabrication, Properties, Optics, Thin Films, and Devices XVII, edited by Wounjhang Park, André-Jean Attias, and Balaji Panchapakesan. SPIE, 2020. http://dx.doi.org/10.1117/12.2567812.

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Barreto Santos, Kezia, and Vitaly F. Rodriguez-Esquerre. "Thermal effects analysis in photonic crystal resonant cavities." In Nanoengineering: Fabrication, Properties, Optics, Thin Films, and Devices XVII, edited by Wounjhang Park, André-Jean Attias, and Balaji Panchapakesan. SPIE, 2020. http://dx.doi.org/10.1117/12.2568253.

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dos Santos Reis, Adriano, Ana Julia R. F. de Oliveira Barros, and Vitaly Felix Rodriguez-Esquerre. "Polarization effects analysis in tilted subwavelength periodical waveguides." In Nanoengineering: Fabrication, Properties, Optics, Thin Films, and Devices XVIII, edited by Wounjhang Park, André-Jean Attias, and Balaji Panchapakesan. SPIE, 2021. http://dx.doi.org/10.1117/12.2595194.

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Yamaguchi, Tomuo, Ahalapitiya H. Jayatissa, K. Kawanishi, and M. Aoyama. "Spectroellipsometric study of amorphous thin films." In International Symposium on Polarization Analysis and Applications to Device Technology, edited by Toru Yoshizawa and Hideshi Yokota. SPIE, 1996. http://dx.doi.org/10.1117/12.246215.

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Choi, Seong Soo, Myoung Jin S. Park, Yong Min Lee, Hee Eun Kim, Jung Ho Yoo, Byung Seong Bae, Hyun Tae Kim, Ki-In Nam, and Soo Bong Choi. "Fabrication of plasmonic nanoslit aperture platform for biomolecule analysis." In Nanoengineering: Fabrication, Properties, Optics, Thin Films, and Devices XVIII, edited by Wounjhang Park, André-Jean Attias, and Balaji Panchapakesan. SPIE, 2021. http://dx.doi.org/10.1117/12.2592410.

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Li, Jing, and Guirong Weng. "Analysis Image of Multiplayer Thin Films." In 2010 Symposium on Photonics and Optoelectronics (SOPO 2010). IEEE, 2010. http://dx.doi.org/10.1109/sopo.2010.5504184.

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KULKARNI, S. K. "THIN FILMS ANALYSIS USING PHOTOELECTRON SPECTROSCOPY." In Proceedings of the International Workshop. WORLD SCIENTIFIC, 2004. http://dx.doi.org/10.1142/9789812702876_0008.

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Reports on the topic "Thin films – Analysis"

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Schmid, Ansgar. Micro-Raman Analysis of Dielectric Optical Thin Films. Fort Belvoir, VA: Defense Technical Information Center, January 1988. http://dx.doi.org/10.21236/ada191228.

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2

Durbin, S. G., and R. W. Moir. One-Dimensional Heat Transfer Analysis For Thin Films With Applications In Inertial Fusion Energy. Office of Scientific and Technical Information (OSTI), September 2001. http://dx.doi.org/10.2172/15006205.

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3

Baker, Michael Sean, Alex Lockwood Robinson, and Hy D. Tran. Finite-element analysis of the deformation of thin Mylar films due to measurement forces. Office of Scientific and Technical Information (OSTI), January 2012. http://dx.doi.org/10.2172/1034880.

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4

Leyderman, Alexander, and M. Antipin. Electrooptical Effects on Thin Organic Films and X-Ray Diffraction Analysis of 3-Nitroaniline and 2-Cyclo-Octylamino-5-Nitropyridine. Fort Belvoir, VA: Defense Technical Information Center, March 2000. http://dx.doi.org/10.21236/ada379414.

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5

Stoffer, James, George D. Weddill, Thomas O'Keefe, Richard Brow, and Matt O'Keefe. Acquisition of Surface/Thin Film Analysis System. Fort Belvoir, VA: Defense Technical Information Center, January 2002. http://dx.doi.org/10.21236/ada402919.

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6

Collins, W. E., and B. Rambabu. Experimental thin film deposition and surface analysis techniques. Office of Scientific and Technical Information (OSTI), January 1986. http://dx.doi.org/10.2172/5705694.

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7

Nastasi, M. Ion beam analysis and modification of thin-film, high-temperature superconductors. Office of Scientific and Technical Information (OSTI), October 1989. http://dx.doi.org/10.2172/5658129.

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8

Jones, L. Ruthenium-Platinum Thin Film Analysis Using Grazing Incidence X-ray Diffraction. Office of Scientific and Technical Information (OSTI), September 2004. http://dx.doi.org/10.2172/833117.

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9

MacAlpine, Sara, Michael Deceglie, Sarah Kurtz, Birinchi Bora, O. S. Sastry, Yogesh Kumar Singh, Rashmi Singh, and Supriya Rai. Analysis of a Single Year of Performance Data for Thin Film Modules Deployed at NREL and NISE. Office of Scientific and Technical Information (OSTI), August 2016. http://dx.doi.org/10.2172/1313608.

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10

Véliz Gutiérrez, J., A. Velazco Díaz, and S. Salazar Navarro. Cuban stories from this century. Discourse analysis of a purposive sample of fictional films from the last decade. Revista Latina de Comunicación Social, August 2014. http://dx.doi.org/10.4185/rlcs-2014-1023en.

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