Books on the topic 'Thin film interconnects'
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International Symposium on Thin Film Materials, Processes, and Reliability (2003 Paris, France). Thin film materials, processes, and reliability: Plasma processing for the 100 nm node and copper interconnects with low-k inter-level dielectric films : proceedings of the international symposium. Edited by Mathad G. S, Electrochemical Society. Dielectric Science and Technology Division., Electrochemical Society Electronics Division, and Electrochemical Society Meeting. Pennington, NJ: Electrochemical Society, 2003.
Find full textRee, Moonhor. Low-k nanoporous interdielectrics: Materials, thin film fabrications, structures and properties. Hauppauge, N.Y: Nova Science Publishers, 2010.
Find full textS, Ho P., ed. Stress-induced phenomena in metallization: Seventh International Workshop on Stress-Induced Phenomena in Metallization, Austin, Texas, 14-16 June 2004. Melville, N.Y: American Institute of Physics, 2004.
Find full textR, Besser Paul, and Materials Research Society. Meeting Symposium B, eds. Materials, technology and reliability for advanced interconnects--2005: Symposium held March 28-April 1, 2005, San Francisco, California, U.S.A. Warrendale, Pa: Materials Research Society, 2005.
Find full textT, Chen Ray, and Society of Photo-optical Instrumentation Engineers., eds. Optoelectronic interconnects: 18-20 January 1993, Los Angeles, California. Bellingham, Wash., USA: SPIE, 1993.
Find full text1948-, Carter R. J., Materials Research Society Meeting, and Symposim on Materials, Technology and Reliability for Advanced Interconnects and Low-k Dielectrics (2004 : San Francisco, Calif.), eds. Materials, technology, and reliability for advanced interconnects and low-k dielectrics--2004: Symposium held April 13-15, 2004, San Francisco, California, U.S.A. Warrendale, Pa: Materials Research Society, 2004.
Find full textElectromigration in thin films and electronic devices: Materials and reliability. Oxford: Woodhead Publishing, 2011.
Find full textGuynes, Sean, and Dan Hassler-Forest, eds. Star Wars and the History of Transmedia Storytelling. NL Amsterdam: Amsterdam University Press, 2017. http://dx.doi.org/10.5117/9789462986213.
Full text(Editor), Paul S. Ho, Shefford P. Baker (Editor), Tomoji Nakamura (Editor), and Cynthia A. Volkert (Editor), eds. Stress-Induced Phenomena in Metallization: Seventh International Workshop on Stress-Induced Phenomena in Metallization (AIP Conference Proceedings / AIP ... Phenomena Metallizat.). American Institute of Physics, 2004.
Find full textVLSI and Post-CMOS Electronics: Devices, Circuits and Interconnects. Institution of Engineering & Technology, 2019.
Find full textDhiman, Rohit, and Rajeevan Chandel. VLSI and Post-CMOS Electronics: Devices, Circuits and Interconnects, Volume 2. Institution of Engineering & Technology, 2019.
Find full textOgawa, S., K. Maex, G. S. Oehrlein, J. T. Wetzel, and Y. C. Joo. Materials, Technology and Reliability for Advanced Interconnects and Low-K Dielectrics: Volume 612. University of Cambridge ESOL Examinations, 2014.
Find full textCarter, R. J., C. S. Hau-Riege, G. M. Kloster, T. M. Lu, and S. E. Schulz. Materials, Technology and Reliability for Advanced Interconnects and Low-K Dielectrics - 2004. University of Cambridge ESOL Examinations, 2014.
Find full textCarter, R. J. Materials, Technology and Reliability for Advanced Interconnects and Low-K Dielectrics--2004: Symposium Held April 13-15, 2004, San Francisco, Califor. Materials Research Society, 2004.
Find full textKim, Choong-Un. Electromigration in Thin Films and Electronic Devices: Materials and Reliability. Woodhead Publishing, 2016.
Find full textAdvanced Technologies for Next Generation Integrated Circuits. Institution of Engineering & Technology, 2020.
Find full textStead, Lisa. Reframing Vivien Leigh. Oxford University Press, 2021. http://dx.doi.org/10.1093/oso/9780190906504.001.0001.
Full textWagoner, Brady, ed. Handbook of Culture and Memory. Oxford University Press, 2017. http://dx.doi.org/10.1093/oso/9780190230814.001.0001.
Full textFleury, James, Bryan Hikari Hartzheim, and Stephen Mamber, eds. The Franchise Era. Edinburgh University Press, 2019. http://dx.doi.org/10.3366/edinburgh/9781474419222.001.0001.
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