Journal articles on the topic 'Thermal imaging microscopy'

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1

Oesterschulze, E., and M. Stopka. "Photothermal imaging by scanning thermal microscopy." Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 14, no. 3 (May 1996): 1172–77. http://dx.doi.org/10.1116/1.580261.

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2

Boudreau, B. D., J. Raja, R. J. Hocken, S. R. Patterson, and J. Patten. "Thermal imaging with near-field microscopy." Review of Scientific Instruments 68, no. 8 (August 1997): 3096–98. http://dx.doi.org/10.1063/1.1148248.

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3

Smallwood, R., P. Metherall, D. Hose, M. Delves, H. Pollock, A. Hammiche, C. Hodges, V. Mathot, and P. Willcocks. "Tomographic imaging and scanning thermal microscopy: thermal impedance tomography." Thermochimica Acta 385, no. 1-2 (March 2002): 19–32. http://dx.doi.org/10.1016/s0040-6031(01)00705-5.

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4

NAKABEPPU, Osamu. "Quantitative Temperature Imaging by Scanning Thermal Microscopy." Journal of the Visualization Society of Japan 23, no. 90 (2003): 151–56. http://dx.doi.org/10.3154/jvs.23.151.

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5

Thomas, R. L., and L. D. Favro. "From Photoacoustic Microscopy to Thermal-Wave Imaging." MRS Bulletin 21, no. 10 (October 1996): 47–52. http://dx.doi.org/10.1557/s088376940003164x.

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Photoacoustic spectroscopy is a technique in which the absorption of periodically intensity-modulated light is detected by the sound that it produces at the (acoustic) modulation frequency in a closed volume of gas or liquid in thermal contact with the material absorbing the light. The spectroscopic aspect of the technique relies on the ability to scan the wavelength of the light that stimulates the sound. Thus one can determine the absorption as a function of wavelength through the conversion of absorbed energy to heat and thence to sound. The acoustic detection is carried out synchronously with respect to the imposed intensity-modulation frequency on the light, making it possible to use narrow-band noise reduction. The existence of this technique for detecting sound generated by the absorption of light led Wong and co-workers to investigate the possibility of using the same techniques for microscopy.
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6

Zhang, Hao F., Konstantin Maslov, George Stoica, and Lihong V. Wang. "Imaging acute thermal burns by photoacoustic microscopy." Journal of Biomedical Optics 11, no. 5 (2006): 054033. http://dx.doi.org/10.1117/1.2355667.

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7

Hammiche, A., H. M. Pollock, M. Song, and D. J. Hourston. "Sub-surface imaging by scanning thermal microscopy." Measurement Science and Technology 7, no. 2 (February 1, 1996): 142–50. http://dx.doi.org/10.1088/0957-0233/7/2/004.

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8

Suzuki, Yoshihiko. "Novel Microcantilever for Scanning Thermal Imaging Microscopy." Japanese Journal of Applied Physics 35, Part 2, No. 3A (March 1, 1996): L352—L354. http://dx.doi.org/10.1143/jjap.35.l352.

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9

Keuren, Edward Van, David Littlejohn, and Wolfgang Schrof. "Three-dimensional thermal imaging using two-photon microscopy." Journal of Physics D: Applied Physics 37, no. 20 (September 30, 2004): 2938–43. http://dx.doi.org/10.1088/0022-3727/37/20/024.

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10

Nakabeppu, O., M. Chandrachood, Y. Wu, J. Lai, and A. Majumdar. "Scanning thermal imaging microscopy using composite cantilever probes." Applied Physics Letters 66, no. 6 (February 6, 1995): 694–96. http://dx.doi.org/10.1063/1.114102.

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11

Kwon, Ohmyoung, Li Shi, and Arun Majumdar. "Scanning Thermal Wave Microscopy (STWM)." Journal of Heat Transfer 125, no. 1 (January 29, 2003): 156–63. http://dx.doi.org/10.1115/1.1518492.

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This paper presents a technique, scanning thermal wave microscopy (STWM), which can image the phase lag and amplitude of thermal waves with sub-micrometer resolution by scanning a temperature-sensing nanoscale tip across a sample surface. Phase lag measurements during tip-sample contact showed enhancement of tip-sample heat transfer due to the presence of a liquid film. The measurement accuracy of STWM is proved by a benchmark experiment and comparison to theoretical prediction. The application of STWM for sub-surface imaging of buried structures is demonstrated by measuring the phase lag and amplitude distributions of an interconnect via sample. The measurement showed excellent agreement with a finite element analysis offering the promising prospects of three-dimensional thermal probing of micro and nanostructures. Finally, it was shown that the resolving power of thermal waves for subsurface structures improves as the wavelengths of the thermal waves become shorter at higher modulation frequencies.
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12

Chen, Zixuan, Xiaonan Shan, Yan Guan, Shaopeng Wang, Jun-Jie Zhu, and Nongjian Tao. "Imaging Local Heating and Thermal Diffusion of Nanomaterials with Plasmonic Thermal Microscopy." ACS Nano 9, no. 12 (October 12, 2015): 11574–81. http://dx.doi.org/10.1021/acsnano.5b05306.

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13

Cannara, Rachel J., Abu Sebastian, Bernd Gotsmann, and Hugo Rothuizen. "Scanning Thermal Microscopy for Fast Multiscale Imaging and Manipulation." IEEE Transactions on Nanotechnology 9, no. 6 (November 2010): 745–53. http://dx.doi.org/10.1109/tnano.2010.2045232.

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14

Martinek, Jan, Miroslav Valtr, Václav Hortvík, Petr Grolich, Danick Briand, Marjan Shaker, and Petr Klapetek. "Large area scanning thermal microscopy and infrared imaging system." Measurement Science and Technology 30, no. 3 (February 14, 2019): 035010. http://dx.doi.org/10.1088/1361-6501/aafa96.

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15

Gadre, Chaitanya A., Xingxu Yan, Qichen Song, Jie Li, Lei Gu, Huaixun Huyan, Toshihiro Aoki, et al. "Nanoscale imaging of phonon dynamics by electron microscopy." Nature 606, no. 7913 (June 8, 2022): 292–97. http://dx.doi.org/10.1038/s41586-022-04736-8.

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AbstractSpatially resolved vibrational mapping of nanostructures is indispensable to the development and understanding of thermal nanodevices1, modulation of thermal transport2 and novel nanostructured thermoelectric materials3–5. Through the engineering of complex structures, such as alloys, nanostructures and superlattice interfaces, one can significantly alter the propagation of phonons and suppress material thermal conductivity while maintaining electrical conductivity2. There have been no correlative experiments that spatially track the modulation of phonon properties in and around nanostructures due to spatial resolution limitations of conventional optical phonon detection techniques. Here we demonstrate two-dimensional spatial mapping of phonons in a single silicon–germanium (SiGe) quantum dot (QD) using monochromated electron energy loss spectroscopy in the transmission electron microscope. Tracking the variation of the Si optical mode in and around the QD, we observe the nanoscale modification of the composition-induced red shift. We observe non-equilibrium phonons that only exist near the interface and, furthermore, develop a novel technique to differentially map phonon momenta, providing direct evidence that the interplay between diffuse and specular reflection largely depends on the detailed atomistic structure: a major advancement in the field. Our work unveils the non-equilibrium phonon dynamics at nanoscale interfaces and can be used to study actual nanodevices and aid in the understanding of heat dissipation near nanoscale hotspots, which is crucial for future high-performance nanoelectronics.
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16

Bodzenta, Jerzy, and Anna Kaźmierczak-Bałata. "Scanning thermal microscopy and its applications for quantitative thermal measurements." Journal of Applied Physics 132, no. 14 (October 14, 2022): 140902. http://dx.doi.org/10.1063/5.0091494.

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For more than 30 years, scanning thermal microscopy (SThM) has been used for thermal imaging and quantitative thermal measurements. It has proven its usefulness for investigations of the thermal transport in nanoscale devices and structures. However, because of the complexity of the heat transport phenomena, a quantitative analysis of the experimental results remains a non-trivial task. This paper shows the SThM state-of-art, beginning with the equipment and methodology of the measurements, through its theoretical background and ending with selected examples of its applications. Every section concludes with considerations on the future development of the experimental technique. Nowadays, SThM has passed from its childhood into maturity from the development stage to its effective practical use in materials research.
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17

Hammiche, A. "Scanning thermal microscopy: Subsurface imaging, thermal mapping of polymer blends, and localized calorimetry." Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 14, no. 2 (March 1, 1996): 1486. http://dx.doi.org/10.1116/1.589124.

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18

Pai, Jing-Hong, Tianqing Liu, Hung-Yao Hsu, A. Bruce Wedding, Benjamin Thierry, and Pierre O. Bagnaninchi. "Molecular photo-thermal optical coherence phase microscopy using gold nanorods." RSC Adv. 4, no. 51 (2014): 27067–73. http://dx.doi.org/10.1039/c4ra03041a.

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19

Majumdar, A., J. Lai, M. Chandrachood, O. Nakabeppu, Y. Wu, and Z. Shi. "Thermal imaging by atomic force microscopy using thermocouple cantilever probes." Review of Scientific Instruments 66, no. 6 (June 1995): 3584–92. http://dx.doi.org/10.1063/1.1145474.

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20

Bagani, Kousik. "Scanning SQUID-on-tip Magnetic and Thermal Microscopy." Science Dialectica 01, no. 1 (September 17, 2021): 1–3. http://dx.doi.org/10.54162/sd01-25201/01.

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Scanning magnetic and thermal imaging using Superconducting Quantum Interference Device (SQUID) fabricated on the apex of a sharp tip has attracted great attention because of its record magnetic sensitivity, thermal sensitivity and nanoscale spatial resolution. Many interesting phenomena like vortex dynamics in a superconductor, quantum hall state, and heat dissipation in graphene etc. has been investigated using scanning SQUID on tip microscopy. This is one of the most powerful tool for the investigation of a wide variety of quantum systems and novel materials.
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21

Oesterschulze, E., and M. Stopka. "Imaging of thermal properties and topography by combined scanning thermal and scanning tunneling microscopy." Microelectronic Engineering 31, no. 1-4 (February 1996): 241–48. http://dx.doi.org/10.1016/0167-9317(95)00347-9.

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22

Ashida, Koji, Toru Aiso, Manabu Okamoto, Hirokazu Seki, Makoto Kitabatake, and Tadaaki Kaneko. "Low Energy Electron Channeling Contrast Imaging from 4H-SiC Surface by SEM and its Comparison with CDIC-OM and PL Imaging." Materials Science Forum 897 (May 2017): 193–96. http://dx.doi.org/10.4028/www.scientific.net/msf.897.193.

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Low energy electron channeling contrast imaging (LE-ECCI) by scanning electron microscopy (SEM) was adopted to evaluate both the direction and length of the topmost hexagonal stacking sequence of the Si–C bilayers on 4H-SiC (0001). LE-ECCI revealed the change in the dangling bond configuration at step edges depending on SiC thermal etching rate, which was difficult to be detected by optical microscope (OM) and even by atomic force microscopy (AFM). Furthermore, LE-ECCI was applied to evaluate the atomic structure of polytype inclusions in commercially available 3-inch diameter 4o off-axis 4H-SiC (0001) epitaxial wafer. The validity of LE-ECCI was discussed by comparing the one with two kinds of widely used wafer inspection methods: confocal OM with differential interference contrast (CDIC-OM) and photoluminescence (PL) imaging.
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23

Majumdar, A., and J. Varesi. "Nanoscale Temperature Distributions Measured by Scanning Joule Expansion Microscopy." Journal of Heat Transfer 120, no. 2 (May 1, 1998): 297–305. http://dx.doi.org/10.1115/1.2824245.

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This paper introduces scanning Joule expansion microscopy (SJEM), which is a new thermal imaging technique with lateral resolution in the range of 10–50 nm. Based on the atomic force microscope (AFM), SJEM measures the thermal expansion of Joule-heated elements with a vertical resolution of 1 pm, and provides an expansion map of the scanned sample. Sunmicron metal interconnect lines as well as 50-nm-sized single grains of an indium tin oxide resistor were images using SJEM. Since the local expansion signal is a convolution of local material properties, sample height, and as temperature rise, extraction of the thermal image requires deconvolution. This was experimentally achieved by coating the sample with a uniformly thick polymer film, resulting in direct measurement of the sample temperature distribution. A detailed thermal analysis of the metal wire and the substrate showed that the predicted temperature distribution was in good agreement with the measurements of the polymer-coated sample. However, the frequency response of the expansion signal agreed with theoretical predictions only below 30 KHZ, suggesting that contilever dynamics may play a significant role at higher frequencies. The major advantage of SJEM over previously developed submicron thermal imaging techniques is that it eliminates the need to nanofabricate specialized probes and requires only a standard AFM and simple electronics.
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24

Sedmak, Ivan, Iztok Urbančič, Rok Podlipec, Janez Štrancar, Michel Mortier, and Iztok Golobič. "Submicron thermal imaging of a nucleate boiling process using fluorescence microscopy." Energy 109 (August 2016): 436–45. http://dx.doi.org/10.1016/j.energy.2016.04.121.

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25

Ulrich, Georg, Emanuel Pfitzner, Arne Hoehl, Jung-Wei Liao, Olga Zadvorna, Guillaume Schweicher, Henning Sirringhaus, et al. "Thermoelectric nanospectroscopy for the imaging of molecular fingerprints." Nanophotonics 9, no. 14 (August 21, 2020): 4347–54. http://dx.doi.org/10.1515/nanoph-2020-0316.

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AbstractWe present a nanospectroscopic device platform allowing simple and spatially resolved thermoelectric detection of molecular fingerprints of soft materials. Our technique makes use of a locally generated thermal gradient converted into a thermoelectric photocurrent that is read out in the underlying device. The thermal gradient is generated by an illuminated atomic force microscope tip that localizes power absorption onto the sample surface. The detection principle is illustrated using a concept device that contains a nanostructured strip of polymethyl methacrylate (PMMA) defined by electron beam lithography. The platform’s capabilities are demonstrated through a comparison between the spectrum obtained by on-chip thermoelectric nanospectroscopy with a nano-FTIR spectrum recorded by scattering-type scanning near-field optical microscopy at the same position. The subwavelength spatial resolution is demonstrated by a spectral line scan across the edge of the PMMA layer.
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26

Kaźmierczak-Bałata, Anna, Justyna Juszczyk, Dominika Trefon-Radziejewska, and Jerzy Bodzenta. "Influence of probe-sample temperature difference on thermal mapping contrast in scanning thermal microscopy imaging." Journal of Applied Physics 121, no. 11 (March 21, 2017): 114502. http://dx.doi.org/10.1063/1.4977101.

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27

D’Acunto, M., and O. Salvetti. "Pattern recognition methods for thermal drift correction in Atomic Force Microscopy imaging." Pattern Recognition and Image Analysis 21, no. 1 (March 2011): 9–19. http://dx.doi.org/10.1134/s1054661811010056.

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28

Holstein, W. L. "Imaging of thermal and elastic surface properties by scanning electron acoustic microscopy." Journal of Electron Microscopy Technique 5, no. 1 (January 1987): 91–103. http://dx.doi.org/10.1002/jemt.1060050110.

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29

Barbosa, Nicholas, and Andrew J. Slifka. "Spatially and temporally resolved thermal imaging of cyclically heated interconnects by use of scanning thermal microscopy." Microscopy Research and Technique 71, no. 8 (August 2008): 579–84. http://dx.doi.org/10.1002/jemt.20589.

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30

Curry, Erin B., Kaitlin C. Lyszak, Donal Sheets, Lauren M. Gorman, Rainer J. Hebert, and Jason N. Hancock. "Broadband infrared confocal imaging for applications in additive manufacturing." Review of Scientific Instruments 93, no. 12 (December 1, 2022): 123702. http://dx.doi.org/10.1063/5.0124817.

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We address new measurement challenges relating to 3D printing in metal powder using the powder bed fusion technique. Using a combination of confocal microscopy principles and fast, sensitive mid-infrared collection techniques, we present a compact and versatile method of measuring and analyzing broadband thermal emissions from the vicinity of the molten metal pool during the additive manufacturing process. We demonstrate the benefits of this instrumentation and potential for scientific research as well as in situ monitoring. Our compact microscope collection optics can be implemented in various powder bed fusion machines under vacuum or inert atmospheric environments to enable extensions such as multi-color pyrometry or spectroscopic studies of additive manufacturing processes.
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31

Vöpel, Tobias, Rebecca Scholz, Luca Davico, Magdalena Groß, Steffen Büning, Sabine Kareth, Eckhard Weidner, and Simon Ebbinghaus. "Infrared laser triggered release of bioactive compounds from single hard shell microcapsules." Chemical Communications 51, no. 32 (2015): 6913–16. http://dx.doi.org/10.1039/c4cc09745a.

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32

LU, KECHENG, SHUANGMU ZHUO, ZHIBIN HONG, GUANNAN CHEN, XINGSHAN JIANG, LIQIN ZHENG, and JIANXIN CHEN. "NON-LINEAR SPECTRAL IMAGING MICROSCOPY STUDIES OF HUMAN HYPERTROPHIC SCAR." Journal of Innovative Optical Health Sciences 02, no. 01 (January 2009): 61–66. http://dx.doi.org/10.1142/s1793545809000395.

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Skin scar is unique to humans, the major significant negative outcome sustained after thermal injuries, traumatic injuries, and surgical procedures. Hypertrophic scar in human skin is investigated using non-linear spectral imaging microscopy. The high contrast images and spectroscopic intensities of collagen and elastic fibers extracted from the spectral imaging of normal skin tissue, and the normal skin near and far away from the hypertrophic scar tissues in a 10-year-old patient case are obtained. The results show that there are apparent differences in the morphological structure and spectral characteristics of collagen and elastic fibers when comparing the normal skin with the hypertrophic scar tissue. These differences can be good indicators to differentiate the normal skin and hypertrophic scar tissue and demonstrate that non-linear spectral imaging microscopy has potential to noninvasively investigate the pathophysiology of human hypertrophic scar.
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33

Zhou, Li, Shen, He, Zhang, Yu, and Tornari. "Tip Crack Imaging on Transparent Materials by Digital Holographic Microscopy." Journal of Imaging 5, no. 10 (October 1, 2019): 80. http://dx.doi.org/10.3390/jimaging5100080.

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With this study, we propose a method to image the tip crack on transparent materials by using digital holographic microscopy. More specifically, an optical system based on Mach–Zehnder interference along with an inverted microscopy (Olympus CKX53) was used to image the tip crack of Dammar Varnish transparent material under thermal excitation. A series of holograms were captured and reconstructed for the observation of the changes of the tip crack. The reconstructed holograms were also compared temporally to compute the temporal changes, showing the crack propagation phenomena. Results show that the Dammar Varnish is sensitive to the ambient temperature. Our research demonstrates that digital holographic microscopy is a promising technique for the detection of the fine tip crack and propagation in transparent materials.
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34

Hull, R., J. Demarest, D. Dunn, E. A. Stach, and Q. Yuan. "Applications of Ion Microscopy and In Situ Electron Microscopy to the Study of Electronic Materials and Devices." Microscopy and Microanalysis 4, no. 3 (June 1998): 308–16. http://dx.doi.org/10.1017/s143192769898031x.

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We discuss the application of ion microscopy and in situ electron microscopy to the study of electronic and optical materials and devices. We demonstrate how the combination of in situ transmission electron microscopy and focused ion beam microscopy provides new avenues for the study for such structures, enabling extension of these techniques to the study of dopant distributions, nanoscale stresses, three-dimensional structural and chemical reconstruction, and real-time evolution of defect microstructure. We also discuss in situ applications of thermal, mechanical, electrical, and optical stresses during transmission electron microscopy imaging.
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35

Baral, Susil, Ali Rafiei Miandashti, and Hugh H. Richardson. "Near-field thermal imaging of optically excited gold nanostructures: scaling principles for collective heating with heat dissipation into the surrounding medium." Nanoscale 10, no. 3 (2018): 941–48. http://dx.doi.org/10.1039/c7nr08349a.

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36

Garcia, V. G., and M. Farzaneh. "Transient thermal imaging of a vertical cavity surface-emitting laser using thermoreflectance microscopy." Journal of Applied Physics 119, no. 4 (January 28, 2016): 045105. http://dx.doi.org/10.1063/1.4940710.

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37

Zhang, Jing, Yu Huang, Chin-Jung Chuang, Mariya Bivolarska, Chung W. See, Michael G. Somekh, and Mark C. Pitter. "Polarization modulation thermal lens microscopy for imaging the orientation of non-spherical nanoparticles." Optics Express 19, no. 3 (January 27, 2011): 2643. http://dx.doi.org/10.1364/oe.19.002643.

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38

Johnson, Lili L. "Atomic Force Microscopy (AFM) for Rubber." Rubber Chemistry and Technology 81, no. 3 (July 1, 2008): 359–83. http://dx.doi.org/10.5254/1.3548214.

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Abstract In this review, first, the development of atomic force microscopy as an imaging technique, as a surface force apparatus, and as a nanoindenter was illustrated using experimental studies. The experimental analysis of atomic force microscopy emphasizes the empirical methods of achieving high resolution imaging through controlled forces between tip and sample interactions. Second, mapping mechanical properties on nanometer scale by atomic force microscopy is presented with both experimental investigations and selection of elastic models. Elastomer crosslink density was mapped using atomic force microscopy combined with elastic theories. The force — penetration depth investigation of crosslink density for elastomer by AFM shows linear correction with both experimental studies using Dynamic Mechanical Thermal Analysis (DMTA) and classic swelling method and calculation using statistical rubber elasticity theory. Last, the focus is on the understanding of atomic force microscopy for practical applications. Filler dispersion and blends structure are demonstrated for automotive applications. Micro phase separation was intensely studied for film industries. Morphology of composites is investigated for the applications of tire, automotive and foaming industries.
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39

Franceschi, J. L., R. Murillo, A. Bastié, M. Ez-Zejjari, H. El Abdary, and N. Boughanmi. "In Situ Scanning Electron Acoustic Microscopy." Proceedings, annual meeting, Electron Microscopy Society of America 48, no. 1 (August 12, 1990): 408–9. http://dx.doi.org/10.1017/s0424820100180793.

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A mini scanning electron microscope, the MEBIS [1] (“Microscope Electronique à Balayage In situ”) is used to inspect “in situ” bulk specimens. The electron-optical column which has been made small and light, can be placed just over the sample. With a specially designed control circuitry, a chopped electron beam is used as a source of thermoelastic waves at the surface of specimen. The induced thermal and ultrasonic waves are used for detection and, by combining this acoustic signal with the scanned electron beam, imaging of the subsurface is possible.The accelerating potential used is 10 kV and the equivalent source of thermoelastic waves is less than one micrometre in metals. Below the megahertz range for the chopped beam (frequency f), the wavelength of sound λa is greater than that of the thermal waves λg. Approximately, only thermal waves determines the spatial resolution [2]. These waves are damped with an experimental decay dT = Cte.f−1/2, and the spatial resolution is similar to dT, typically five micrometres in metals for the beam modulation frequency of 100 kHz, with linear signal detection [3]. Above the MHz range, submicronic spatial resolution is possible. But the sensitivity is also a function of the frequency. The signal to noise ratio (S/N) is proportionnal to f−1 (low frequency). A compromise must be made between S/N ratio and satisfactory spatial resolution, since for bulk specimens the signal decays with the thickness [4].
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40

Steinbach, Gábor, and Radek Kaňa. "Automated Microscopy: Macro Language Controlling a Confocal Microscope and its External Illumination: Adaptation for Photosynthetic Organisms." Microscopy and Microanalysis 22, no. 2 (April 2016): 258–63. http://dx.doi.org/10.1017/s1431927616000556.

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AbstractPhotosynthesis research employs several biophysical methods, including the detection of fluorescence. Even though fluorescence is a key method to detect photosynthetic efficiency, it has not been applied/adapted to single-cell confocal microscopy measurements to examine photosynthetic microorganisms. Experiments with photosynthetic cells may require automation to perform a large number of measurements with different parameters, especially concerning light conditions. However, commercial microscopes support custom protocols (throughTime Controlleroffered by Olympus orExperiment Designeroffered by Zeiss) that are often unable to provide special set-ups and connection to external devices (e.g., for irradiation). Our new system combining an Arduino microcontroller with theCell⊕Findersoftware was developed for controlling Olympus FV1000 and FV1200 confocal microscopes and the attached hardware modules. Our software/hardware solution offers (1) a text file-based macro language to control the imaging functions of the microscope; (2) programmable control of several external hardware devices (light sources, thermal controllers, actuators) during imaging via the Arduino microcontroller; (3) theCell⊕Findersoftware with ergonomic user environment, a fast selection method for the biologically important cells and precise positioning feature that reduces unwanted bleaching of the cells by the scanning laser.Cell⊕Findercan be downloaded fromhttp://www.alga.cz/cellfinder. The system was applied to study changes in fluorescence intensity inSynechocystissp. PCC6803 cells under long-term illumination. Thus, we were able to describe the kinetics of phycobilisome decoupling. Microscopy data showed that phycobilisome decoupling appears slowly after long-term (>1 h) exposure to high light.
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41

Mikolaszek, Barbara, Marzena Jamrógiewicz, Krystyna Mojsiewicz-Pieńkowska, and Małgorzata Sznitowska. "Microscopic and Spectroscopic Imaging and Thermal Analysis of Acrylates, Silicones and Active Pharmaceutical Ingredients in Adhesive Transdermal Patches." Polymers 14, no. 14 (July 16, 2022): 2888. http://dx.doi.org/10.3390/polym14142888.

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Dermal or transdermal patches are increasingly becoming a noteworthy alternative as carriers for active pharmaceutical ingredients (APIs), which makes their detailed physicochemical evaluation essential for pharmaceutical development. This paper demonstrates mid-infrared (FTIR) and Raman spectroscopy with complementary microscopic methods (SEM, optical and confocal Raman microscopy) and differential scanning calorimetry (DSC) as tools for the identification of the state of model API (testosterone TST, cytisine CYT or indomethacin IND) in selected adhesive matrices. Among the employed spectroscopic techniques, FTIR and Raman may be used not only as standard methods for API identification in the matrix, but also as a means of distinguishing commercially available polymeric materials of a similar chemical structures. A novel approach for the preparation of adhesive polymers for the FTIR analysis was introduced. In silicone matrices, all three APIs were suspended, whereas in the case of the acrylic PSA, Raman microscopy confirmed that only IND was dissolved in all three acrylic matrices, and the dissolved fraction of the CYT differed depending on the matrix type. Moreover, the recrystallization of TST was observed in one of the acrylates. Interestingly, a DSC analysis of the acrylic patches did not confirm the presence of the API even if the microscopic images showed suspended particles.
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42

Zech, M., C. Boedefeld, F. Otto, and D. Andres. "Magnetic Imaging on the Nanometer Scale Using Low-Temperature Scanning Probe Techniques." Microscopy Today 19, no. 6 (October 28, 2011): 34–38. http://dx.doi.org/10.1017/s1551929511001180.

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Multiple techniques now exist for the investigation of nanoscale magnetic properties, extending from Lorentz microscopy and magneto-optical imaging (MOKE) to scanning probe microscopy approaches (see Figure 1 for an overview). Among the latter, the most widely used techniques offering both high spatial and high magnetic-field resolution are magnetic force microscopy (MFM) and scanning Hall probe microscopy (SHPM). Both techniques are well known for their versatility and ease of use and can be further adapted for operation in cryogenic conditions. This property is crucial for all areas of research where high magnetic fields are required and where the influence of thermal energy/broadening needs to be suppressed. For example, much of today's fundamental research on superconductivity, spintronics, and magnetic data storage is taking place at low temperatures.
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43

HSUEH, CHIU-MEI, WEN LO, SUNG-JAN LIN, TSUNG-JEN WANG, FUNG-RUNG HU, HSIN-YUAN TAN, and CHEN-YUAN DONG. "MULTIPHOTON MICROSCOPY: A NEW APPROACH, IN PHYSIOLOGICAL STUDIES AND PATHOLOGICAL DIAGNOSIS FOR OPHTHALMOLOGY." Journal of Innovative Optical Health Sciences 02, no. 01 (January 2009): 45–60. http://dx.doi.org/10.1142/s1793545809000309.

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Multiphoton microscopy (MPM), with the advantages of improved penetration depth, decreased photo-damage, and optical sectioning capability, has become an indispensable tool for biomedical imaging. The combination of multiphoton fluorescence (MF) and second-harmonic generation (SHG) microscopy is particularly effective in imaging tissue structures of the ocular surface. This work is intended to be a review of advances that MPM has made in ophthalmic imaging. The MPM not only can be used for the label-free imaging of ocular structures, it can also be applied for investigating the morphological alterations in corneal pathologies, such as keratoconus, infected keratitis, and corneal scar. Furthermore, the corneal wound healing process after refractive surgical procedures such as conductive keratoplasty (CK) can also be studied with MPM. Finally, qualitative and quantitative SHG microscopy is effective for characterizing corneal thermal denaturation. With additional development, multiphoton imaging has the potential to be developed into an effective imaging technique for in vivo studies and clinical diagnosis in ophthalmology.
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44

Ivanov, Konstantin. "Characteristic Features and Thermal Stability of Molybdenum Processed by Different Ways of Severe Plastic Deformation." Materials Science Forum 584-586 (June 2008): 917–22. http://dx.doi.org/10.4028/www.scientific.net/msf.584-586.917.

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Characteristic features and thermal stability of the structure of molybdenum processed by high pressure torsion, equal-channel angular pressing or multy-step forging have been investigated using transmission electron microscopy, X-ray diffraction analysis and orientation imaging microscopy. The structural factors responsible for the strengthening and thermal stability of molybdenum processed have been obtained. It has been demonstrated that only high pressure torsion is an effective method to refine molybdenum structure (down to 0.2 µm). Recrystallization occurs during the others investigated processing disabling significant grain size reduction.
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45

Pereira, Maria J., Joao S. Amaral, Nuno J. O. Silva, and Vitor S. Amaral. "Nano-Localized Thermal Analysis and Mapping of Surface and Sub-Surface Thermal Properties Using Scanning Thermal Microscopy (SThM)." Microscopy and Microanalysis 22, no. 6 (November 21, 2016): 1270–80. http://dx.doi.org/10.1017/s1431927616011867.

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AbstractDetermining and acting on thermo-physical properties at the nanoscale is essential for understanding/managing heat distribution in micro/nanostructured materials and miniaturized devices. Adequate thermal nano-characterization techniques are required to address thermal issues compromising device performance. Scanning thermal microscopy (SThM) is a probing and acting technique based on atomic force microscopy using a nano-probe designed to act as a thermometer and resistive heater, achieving high spatial resolution. Enabling direct observation and mapping of thermal properties such as thermal conductivity, SThM is becoming a powerful tool with a critical role in several fields, from material science to device thermal management. We present an overview of the different thermal probes, followed by the contribution of SThM in three currently significant research topics. First, in thermal conductivity contrast studies of graphene monolayers deposited on different substrates, SThM proves itself a reliable technique to clarify the intriguing thermal properties of graphene, which is considered an important contributor to improve the performance of downscaled devices and materials. Second, SThM’s ability to perform sub-surface imaging is highlighted by thermal conductivity contrast analysis of polymeric composites. Finally, an approach to induce and study local structural transitions in ferromagnetic shape memory alloy Ni–Mn–Ga thin films using localized nano-thermal analysis is presented.
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46

Zakgeim, A. L., G. L. Kuryshev, M. N. Mizerov, V. G. Polovinkin, I. V. Rozhansky, and A. E. Chernyakov. "A study of thermal processes in high-power InGaN/GaN flip-chip LEDs by IR thermal imaging microscopy." Semiconductors 44, no. 3 (March 2010): 373–79. http://dx.doi.org/10.1134/s1063782610030176.

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47

Zhang, Xiao Feng. "Enabling Lab-in-Gap Transmission Electron Microscopy at Atomic Resolution." Microscopy Today 24, no. 1 (January 2016): 24–29. http://dx.doi.org/10.1017/s1551929515000930.

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Abstract: Hitachi Lab-in-Gap transmission electron microscopy (TEM) technologies are introduced. The term Lab-in-Gap refers to a special function that allows in situ and in operando TEM studies of materials in gas or liquid environments while stimulations, such as thermal or electrical fields, are applied to the specimen sitting in the pole piece gap in a TEM system. Physical or chemical process can be activated and imaged in real time using TEM or other imaging modes. The new generation environmental TEM platform with large pole piece gap and advanced aberration correctors opens wide possibilities for integrating multiple stimuli sources as well as large-area, sub-Å resolution live imaging for dynamic structural changes.
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48

Gyollai, Ildikó, Ildikó Gyollai, Szaniszló Bérczi, Krisztián Fintor, Szabolcs Nagy, and Arnold Gucsik. "Thermal metamorphism of the Mócs meteorite (L6) revealed by optical microscopy and BSE imaging." Central European Geology 58, no. 4 (December 2015): 321–33. http://dx.doi.org/10.1556/24.58.2015.4.3.

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Xie, Xu, Kyle L. Grosse, Jizhou Song, Chaofeng Lu, Simon Dunham, Frank Du, Ahmad E. Islam, et al. "Quantitative Thermal Imaging of Single-Walled Carbon Nanotube Devices by Scanning Joule Expansion Microscopy." ACS Nano 6, no. 11 (October 22, 2012): 10267–75. http://dx.doi.org/10.1021/nn304083a.

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50

Zhang, Y., P. S. Dobson, and J. M. R. Weaver. "High temperature imaging using a thermally compensated cantilever resistive probe for scanning thermal microscopy." Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena 30, no. 1 (January 2012): 010601. http://dx.doi.org/10.1116/1.3664328.

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