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1

Weyerer, Manfred. Testability of electronic circuits. Munich: Carl Hanser Verlag, 1992.

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2

United States. Environmental Protection Agency. Transportation and Climate Division. OBD readiness testability issues. 2nd ed. Washington, D.C.]: Transportation and Climate Division, Office of Transportation and Air Quality, U.S. Environmental Protection Agency, 2012.

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3

Weyerer, Manfred. Testability of electronic circuits. Munich: C. Hanser, 1991.

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4

Tsui, Frank F. LSI/VLSI testability design. New York: McGraw-Hill, 1987.

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5

M, Voas Jeffrey, ed. Software assessment: Reliability, safety, testability. New York: Wiley, 1995.

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6

Beenker, F. P. M., R. G. Bennetts, and A. P. Thijssen. Testability Concepts for Digital ICs. Boston, MA: Springer US, 1995. http://dx.doi.org/10.1007/978-1-4615-2365-9.

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7

Digital circuit testing and testability. San Diego: Academic Press, 1997.

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8

Logic testing and design for testability. Cambridge, Mass: MIT Press, 1985.

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9

Huhn, Sebastian, and Rolf Drechsler. Design for Testability, Debug and Reliability. Cham: Springer International Publishing, 2021. http://dx.doi.org/10.1007/978-3-030-69209-4.

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10

Engineering design: Reliability, maintainability, and testability. Blue Ridge Summit, PA: TAB Professional and Reference Books, 1988.

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11

Jones, James V. Engineering design: Reliability, maintainability, and testability. Blue Ridge Summit, PA: Tab Books, 1988.

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12

C, Morris K., and National Institute of Standards and Technology (U.S.), eds. Testability of product data management interfaces. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1999.

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13

C, Morris K., and National Institute of Standards and Technology (U.S.), eds. Testability of product data management interfaces. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1999.

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14

The testability of distributed real-time systems. Boston: Kluwer Academic Publishers, 1993.

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15

Petlin, Oleg Alexandrovich. Design for testability of asynchronous VLSI circuits. Manchester: University of Manchester, 1996.

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16

1943-, Elmasry Mohamed I., ed. Optimal VLSI architectural synthesis: Area, performance, and testability. Boston: Kluwer Academic Publishers, 1992.

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17

Elbably, Mohammed E. On the testability and diagnosability of digital systems. Uxbridge: Brunel University, 1988.

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18

Larsson, Erik. An integrated system-level design for testability methodology. Linköping: Department of Computer and Information Science, Linköping University, 2000.

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19

López, Roberto Téllez-Girón. Testability analysis: A survey on methods and applications. Köln: Verlag TÜV Rheinland, 1987.

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20

Gebotys, Catherine H. Optimal VLSI Architectural Synthesis: Area, Performance and Testability. Boston, MA: Springer US, 1992.

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21

Beenker, F. P. M. Testability Concepts for Digital ICs: The Macro Test Approach. Boston, MA: Springer US, 1995.

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22

Language system and its change: On theory and testability. Berlin: Mouton de Gruyter, 1985.

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23

Miles, John Richard. Cost modelling for VLSI circuit conversion to aid testability. Uxbridge: Brunel University, 1988.

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24

G, Bennetts R., and Thijssen A. P, eds. Testability concepts for digital ICs: The macro test approach. Dordrecht: Kluwer Academic Publishers, 1995.

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25

Voas, Jeffrey M. A testability-based assertion placement tool for object-oriented software. Gaithersburg, MD: The Institute, 1998.

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26

Huertas, José L. Test and Design-for-Testability in Mixed-Signal Integrated Circuits. Boston, MA: Springer US, 2004.

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27

Huertas, José L., ed. Test and Design-for-Testability in Mixed-Signal Integrated Circuits. Boston, MA: Springer US, 2004. http://dx.doi.org/10.1007/978-0-387-23521-9.

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28

Voas, Jeffrey M. A testability-based assertion placement tool for object-oriented software. Gaithersburg, MD: The Institute, 1998.

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29

Huertas, José L. Test and Design-for-Testability in Mixed-Signal Integrated Circuits. Boston, MA: Springer US, 2004.

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30

Matthew, Schmid, Schatz Michael, Wallace Dolores R, and National Institute of Standards and Technology (U.S.), eds. A testability-based assertion placement tool for object-oriented software. Gaithersburg, MD: The Institute, 1998.

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31

Voas, Jeffrey M. A testability-based assertion placement tool for object-oriented software. Gaithersburg, MD: The Institute, 1998.

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32

Matthew, Schmid, Schatz Michael, Wallace Dolores R, and National Institute of Standards and Technology (U.S.), eds. A testability-based assertion placement tool for object-oriented software. Gaithersburg, MD: The Institute, 1998.

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33

Standardization, Great Britain Ministry of Defence Directorate of. Guide to the achievement of testability in electronic and allied equipment. Glasgow: MOD, 1985.

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34

Davidson, John Carl. Implementation of a Design for Testability strategy using the Genesil silicon compiler. Monterey, California: Naval Postgraduate School, 1989.

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35

International Workshop on Testability Assessment (1st 2004 Rennes, France). IWoTA 2004: 1st International Workshop on Testability Assessment : proceedings : 2 November, 2004, Rennes, France. Piscataway, N.J: IEEE, 2004.

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36

U.S. Nuclear Regulatory Commission. Division of Safety Issue Resolution., Idaho National Engineering Laboratory, and EG & G Idaho., eds. Technical findings related to resolution of generic safety issue 120, online testability of protection systems. Washington, DC: Division of Safety Issue Resolution, Office of Nuclear Regulatory Research, U.S. Nuclear Regulatory Commission, 1992.

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37

Petrov, Andrei Nikolaevich, ed. Ekspluatatsionno-tekhnicheskie kharakteristiki i obespechenie ekspluatatsii aviatsionnoĭ tekhniki: 50 let nauchnoi deiatel'nosti otdeleniia № 4 Letno-issledovatel'skogo instituta im. M.M. Gromova 1962-2012. Moskva, Russia (Federation): Shirokij vzglyad, 2012.

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38

Loureiro, G. V. Digital systems design for testability based on a reed-muller tree-circuit approach: Design and application of a CAD system for the minimization design and fault simulation of reed-muller tree-circuits. Manchester: UMIST, 1993.

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39

Pfleeger, Shari Lawrence. Software engineering: Theory and practice. Upper Saddle River, N.J: Prentice Hall, 1998.

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40

Software engineering: Theory and practice. Upper Saddle River, NJ: Prentice Hall, 1998.

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41

Software engineering: The production of quality software. 2nd ed. New York: Macmillan Pub. Co., 1991.

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42

Winter, Ash, and Rob Meaney. Team Guide to Software Testability: Better Software Through Greater Testability. Conflux Digital Ltd., 2021.

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43

Guidelines for assuring testability. London: Institution of Electrical Engineers, 1988.

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44

Vlsi Design for (Self- Testability). CRC, 1996.

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45

Digital Circuit Testing and Testability. Elsevier Science & Technology Books, 1997.

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46

Fujiwara, Hideo. Logic Testing and Design for Testability. The MIT Press, 1985. http://dx.doi.org/10.7551/mitpress/4317.001.0001.

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47

Tripathi, Suman Lata, Sobhit Saxena, and Sushanta Kumar Mohapatra. Advanced VLSI Design and Testability Issues. Taylor & Francis Group, 2020.

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48

Testability of product data management interfaces. Gaithersburg, MD: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, 1999.

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49

Dick, John Henry, C. Dislis, I. D. Dear, and A. P. Ambler. Test Economics and Design for Testability. Prentice Hall, 1995.

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50

Tripathi, Suman Lata, Sobhit Saxena, and Sushanta Kumar Mohapatra. Advanced VLSI Design and Testability Issues. Taylor & Francis Group, 2022.

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