Journal articles on the topic 'Test input'
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Keramati, Hossein, and Seyed-Hassan Mirian-Hosseinabadi. "Generating semantically valid test inputs using constrained input grammars." Information and Software Technology 57 (January 2015): 204–16. http://dx.doi.org/10.1016/j.infsof.2014.09.007.
Full textAndresen, BernhardH, and StanleyC Keeney. "4612499 Test input demultiplexing circuit." Microelectronics Reliability 27, no. 2 (January 1987): 396. http://dx.doi.org/10.1016/0026-2714(87)90316-7.
Full textVisser, Willem, Corina S. Pǎsǎreanu, and Sarfraz Khurshid. "Test input generation with java PathFinder." ACM SIGSOFT Software Engineering Notes 29, no. 4 (July 2004): 97–107. http://dx.doi.org/10.1145/1013886.1007526.
Full textPhan, Quoc-Sang. "Test input generation using separati logic." ACM SIGSOFT Software Engineering Notes 43, no. 4 (January 2, 2019): 55. http://dx.doi.org/10.1145/3282517.3302418.
Full textPomeranz, Irith. "Low-power test sets under test-related primary input constraints." International Journal of Critical Computer-Based Systems 4, no. 3 (2013): 265. http://dx.doi.org/10.1504/ijccbs.2013.058396.
Full textPomeranz, I., and S. M. Reddy. "Random Test Generation With Input Cube Avoidance." IEEE Transactions on Very Large Scale Integration (VLSI) Systems 17, no. 1 (January 2009): 45–54. http://dx.doi.org/10.1109/tvlsi.2008.2001943.
Full textWang, Zhiyu, Sihan Xu, Xiangrui Cai, and Hua Ji. "Test Input Selection for Deep Neural Networks." Journal of Physics: Conference Series 1693 (December 2020): 012017. http://dx.doi.org/10.1088/1742-6596/1693/1/012017.
Full textMA, Xiaoxing, Jue WANG, Chang XU, Yanyan JIANG, and Jian LU. "Automatic test-input generation for Android applications." SCIENTIA SINICA Informationis 49, no. 10 (October 1, 2019): 1234–66. http://dx.doi.org/10.1360/n112019-00003.
Full textCseppentő, Lajos, and Zoltán Micskei. "Evaluating code-based test input generator tools." Software Testing, Verification and Reliability 27, no. 6 (February 6, 2017): e1627. http://dx.doi.org/10.1002/stvr.1627.
Full textCelik, Ahmet, Sreepathi Pai, Sarfraz Khurshid, and Milos Gligoric. "Bounded exhaustive test-input generation on GPUs." Proceedings of the ACM on Programming Languages 1, OOPSLA (October 12, 2017): 1–25. http://dx.doi.org/10.1145/3133918.
Full textFleurey, Franck, Benoit Baudry, Pierre-Alain Muller, and Yves Le Traon. "Qualifying input test data for model transformations." Software & Systems Modeling 8, no. 2 (November 28, 2007): 185–203. http://dx.doi.org/10.1007/s10270-007-0074-8.
Full textRoy, Asim. "The hardest test for a theory of cognition: The input test." Behavioral and Brain Sciences 26, no. 5 (October 2003): 618–19. http://dx.doi.org/10.1017/s0140525x03350137.
Full textWhite, Justin P., and Alessia Martini. "Frequency of Input." Instructed Second Language Acquisition 3, no. 1 (April 15, 2019): 3–27. http://dx.doi.org/10.1558/isla.36273.
Full textYASUDA, Chiaki, Hiroyuki FUYAMA, Shinichiro KAJII, and Makoto SAKUNO. "224 Computation of Input Energy to Test Structure on Shaking Table Test." Proceedings of the Dynamics & Design Conference 2003 (2003): _224–1_—_224–5_. http://dx.doi.org/10.1299/jsmedmc.2003._224-1_.
Full textBiao, Wu, and Qi-Wei Ge. "Test Input Data Generation for Choiceless Program Nets." ECTI Transactions on Computer and Information Technology (ECTI-CIT) 14, no. 1 (March 28, 2020): 37–45. http://dx.doi.org/10.37936/ecti-cit.2020141.197859.
Full textHeyes, C. M. "Imagination and imitation: Input, acid test, or alchemy?" Behavioral and Brain Sciences 19, no. 1 (March 1996): 131–32. http://dx.doi.org/10.1017/s0140525x0004190x.
Full textSchroeder, Patrick J., and Bogdan Korel. "Black-box test reduction using input-output analysis." ACM SIGSOFT Software Engineering Notes 25, no. 5 (September 2000): 173–77. http://dx.doi.org/10.1145/347636.349042.
Full textPomeranz, I., and S. M. Reddy. "Test data compression based on input-output dependence." IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 22, no. 10 (October 2003): 1450–55. http://dx.doi.org/10.1109/tcad.2003.818122.
Full textKao, Tzu‐Cheng, Chung‐Yu Hung, Jian‐Hsing Lee, Chen‐Hsin Lien, Chien‐Wei Chiu, Kuo‐Hsuan Lo, Hung‐Der Su, and Wu‐Te Weng. "Failure mechanism for input buffer under CDM test." Electronics Letters 50, no. 9 (April 2014): 667–69. http://dx.doi.org/10.1049/el.2013.4094.
Full textRinger, Talia, Dan Grossman, Daniel Schwartz-Narbonne, and Serdar Tasiran. "A solver-aided language for test input generation." Proceedings of the ACM on Programming Languages 1, OOPSLA (October 12, 2017): 1–24. http://dx.doi.org/10.1145/3133915.
Full textRosner, Nicolás, Valeria Bengolea, Pablo Ponzio, Shadi Abdul Khalek, Nazareno Aguirre, Marcelo F. Frias, and Sarfraz Khurshid. "Bounded exhaustive test input generation from hybrid invariants." ACM SIGPLAN Notices 49, no. 10 (December 31, 2014): 655–74. http://dx.doi.org/10.1145/2714064.2660232.
Full textFatimah, Khusnul Umi, Tarno Tarno, and Abdul Hoyyi. "PEMILIHAN INPUT MODEL ADAPTIVE FUZZY INFERENCE SYSTEM (ANFIS) BERBASIS LAGRANGE MULTIPLIER TEST DILENGKAPI GUI MATLAB (Aplikasi pada Data Harga Beras Kualitas Rendah di Indonesia Periode Januari 2013 – Februari 2019)." Jurnal Gaussian 8, no. 4 (November 29, 2019): 451–61. http://dx.doi.org/10.14710/j.gauss.v8i4.26725.
Full textSheng, Xiaoqin, Hans Kerkhoff, Amir Zjajo, and Guido Gronthoud. "ADC Multi-Site Test Based on a Pre-test with Digital Input Stimulus." Journal of Electronic Testing 28, no. 4 (August 2012): 393–404. http://dx.doi.org/10.1007/s10836-012-5309-0.
Full textYubai, Kazuhiro, Shinya Terada, and Junji Hirai. "Stability Test for Multivariable NCbT Using Input/Output Data." IEEJ Transactions on Electronics, Information and Systems 131, no. 4 (2011): 773–80. http://dx.doi.org/10.1541/ieejeiss.131.773.
Full textOKITA, Tsuyoshi, Yasuhide KOBAYASHI, and Shogo TANAKA. "Adaptive Control for Linear Systems by Using Test Input." Transactions of the Society of Instrument and Control Engineers 27, no. 12 (1991): 1358–65. http://dx.doi.org/10.9746/sicetr1965.27.1358.
Full textPomeranz, Irith. "Sequential Test Generation Based on Preferred Primary Input Cubes." IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 36, no. 2 (February 2017): 351–55. http://dx.doi.org/10.1109/tcad.2016.2568210.
Full textPomeranz, Irith. "Reducing the input test data volume under transparent scan." IET Computers & Digital Techniques 8, no. 1 (January 2014): 1–10. http://dx.doi.org/10.1049/iet-cdt.2013.0067.
Full textWANG, X. A., Y. F. XU, and W. C. LOU. "Solar Collector Parameter Identification by Step Input Test Procedure." International Journal of Solar Energy 4, no. 6 (January 1986): 327–34. http://dx.doi.org/10.1080/01425918608909868.
Full textSun, Hanqiu. "A behavioural test-bed using a dataglove input device." Virtual Reality 1, no. 2 (December 1995): 109–16. http://dx.doi.org/10.1007/bf02009727.
Full textDel Grosso, C., G. Antoniol, E. Merlo, and P. Galinier. "Detecting buffer overflow via automatic test input data generation." Computers & Operations Research 35, no. 10 (October 2008): 3125–43. http://dx.doi.org/10.1016/j.cor.2007.01.013.
Full textKuhn, D. Richard, Raghu N. Kacker, and Yu Lei. "Measuring and specifying combinatorial coverage of test input configurations." Innovations in Systems and Software Engineering 12, no. 4 (November 14, 2015): 249–61. http://dx.doi.org/10.1007/s11334-015-0266-2.
Full textPage, RobertE. "4658209 Universal test board, serial input (for synthesizer testing)." Microelectronics Reliability 27, no. 6 (January 1987): 1041. http://dx.doi.org/10.1016/0026-2714(87)90888-2.
Full textDodier, Robert H., and Gregor P. Henze. "Statistical Analysis of Neural Networks as Applied to Building Energy Prediction." Journal of Solar Energy Engineering 126, no. 1 (February 1, 2004): 592–600. http://dx.doi.org/10.1115/1.1637640.
Full textToma, Alexandru, and Cristian Morarescu. "Detection of Short-Step Pulses Using Practical Test-Functions and Resonance Aspects." Mathematical Problems in Engineering 2008 (2008): 1–15. http://dx.doi.org/10.1155/2008/543457.
Full textSmallwood, David. "Minimum Input Trace for Multiple Input Multiple Output Linear Systems." Journal of the IEST 56, no. 2 (October 1, 2013): 57–67. http://dx.doi.org/10.17764/jiet.56.2.41344333010617q6.
Full textProvost, Julien, Jean-Marc Roussel, and Jean-Marc Faure. "Generation of Single Input Change Test Sequences for Conformance Test of Programmable Logic Controllers." IEEE Transactions on Industrial Informatics 10, no. 3 (August 2014): 1696–704. http://dx.doi.org/10.1109/tii.2014.2315972.
Full textPomeranz, Irith. "Use of input necessary assignments for test generation based on merging of test cubes." IET Computers & Digital Techniques 9, no. 2 (March 2015): 106–12. http://dx.doi.org/10.1049/iet-cdt.2014.0009.
Full textPomeranz, Irith. "Combined input test data volume reduction for mixed broadside and skewed‐load test sets." IET Computers & Digital Techniques 10, no. 3 (May 2016): 138–45. http://dx.doi.org/10.1049/iet-cdt.2015.0117.
Full textMiropolsky, S., and S. Frei. "Reproducing system-level bulk current injection test in direct power injection setup for multiple-port DUTs." Advances in Radio Science 11 (July 4, 2013): 177–82. http://dx.doi.org/10.5194/ars-11-177-2013.
Full textAzizi, Arash. "Effects of Non-negotiated Pre-modified Input, Negotiation of Input without Output, and Negotiation of Input plus Pushed Output on EFL Learners’ Vocabulary Learning." Journal of Language Teaching and Research 7, no. 4 (July 1, 2016): 773. http://dx.doi.org/10.17507/jltr.0704.19.
Full textWatanabe, Yuichi. "INPUT, INTAKE, AND RETENTION." Studies in Second Language Acquisition 19, no. 3 (September 1997): 287–307. http://dx.doi.org/10.1017/s027226319700301x.
Full textZhang, Xin, and Xiu Li Du. "Operational Modal Test of an Arch Bridge." Advanced Materials Research 446-449 (January 2012): 3233–38. http://dx.doi.org/10.4028/www.scientific.net/amr.446-449.3233.
Full textShelke, Sneha, and Sangeeta Nagpure. "Generation of String Test Input from Web using Regular Expression." International Journal of Computer Applications 99, no. 18 (August 20, 2014): 44–46. http://dx.doi.org/10.5120/17476-8375.
Full textKnudsen, Torben. "Preliminary Test for Nonlinear Input Output Relations in SISO Systems." IFAC Proceedings Volumes 33, no. 15 (June 2000): 175–80. http://dx.doi.org/10.1016/s1474-6670(17)39746-x.
Full textMorelli, Eugene A. "Flight Test Validation of Optimal Input Design Using Pilot Implementation." IFAC Proceedings Volumes 27, no. 8 (July 1994): 1007–12. http://dx.doi.org/10.1016/s1474-6670(17)47840-2.
Full textZhang, Boyan, Deyu Li, and Chunlei Li. "Seismic input model of high slope and its test verification." IOP Conference Series: Earth and Environmental Science 304, no. 4 (September 18, 2019): 042010. http://dx.doi.org/10.1088/1755-1315/304/4/042010.
Full textPark, Ho Cheol, Su Whan Sung, and Jietae Lee. "Modeling of Hammerstein−Wiener Processes with Special Input Test Signals." Industrial & Engineering Chemistry Research 45, no. 3 (February 2006): 1029–38. http://dx.doi.org/10.1021/ie050540a.
Full textBehnamfar, Farhad, and Mohammadreza Najar. "Combined Dynamic Actuator–Shake Table Test with Optimized Input Energy." Journal of Engineering Mechanics 144, no. 3 (March 2018): 04018004. http://dx.doi.org/10.1061/(asce)em.1943-7889.0001376.
Full textBosscher, Peter J., and Dale R. Showers. "Effect of Soil Type on Standard Penetration Test Input Energy." Journal of Geotechnical Engineering 113, no. 4 (April 1987): 385–89. http://dx.doi.org/10.1061/(asce)0733-9410(1987)113:4(385).
Full textDuque-Carrillo, J. F., and R. Perez-Aloe. "High-bandwidth CMOS test buffer with very small input capacitance." Electronics Letters 26, no. 25 (1990): 2084. http://dx.doi.org/10.1049/el:19901343.
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