Books on the topic 'Test digitali'
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Cortner, J. Max. Digital test engineering. New York: Wiley, 1987.
Find full textLoeblein, James T. A digital hardware test system analysis with test vector translation. Monterey, Calif: Naval Postgraduate School, 1992.
Find full textNavabi, Zainalabedin. Digital System Test and Testable Design. Boston, MA: Springer US, 2011. http://dx.doi.org/10.1007/978-1-4419-7548-5.
Full textNorth Atlantic Treaty Organization. Advisory Group for Aerospace Research and Development., ed. Digital signal conditioning for flight test. Neuilly sur Seine, France: AGARD, 1991.
Find full textNorth Atlantic Treaty Organization. Advisory Group for Aerospace Research and Development. Digital signal conditioning for flight test. Neuilly-sur-Seine: AGARD, 1991.
Find full textBever, G. A. Digital signal conditioning for flight test. Neuilly sur Seine: Agard, 1991.
Find full textWojtkowiak, Hans. Test und Testbarkeit digitaler Schaltungen. Wiesbaden: Vieweg+Teubner Verlag, 1988. http://dx.doi.org/10.1007/978-3-322-96665-0.
Full textWojtkowiak, Hans. Test und Testbarkeit digitaler Schaltungen. Stuttgart: B.G. Teubner, 1988.
Find full textCTL for test information of digital ICs. Boston: Kluwer Academic Publishers, 2003.
Find full textFacility, Dryden Flight Research, ed. Digital signal conditioning for flight test instrumentation. Edwards, Calif: NASA Ames Resarch Center, Dryden Flight Research Facility, 1991.
Find full textF, Coombs Clyde, and Coombs Catherine Ann, eds. Communications network: Test and measurement handbook. New York: McGraw-Hill, 1998.
Find full textJervan, Gert. Hybrid built-in self-test and test generation techniques for digital systems. Linko ping: Dept. of Computer and Information Science, Univ., 2005.
Find full textWrixon, Adrian. D-A converter test optimisation. Dublin: University College Dublin, 1996.
Find full textJervan, Gert. High-level test generation and built-in self-test techniques for digital systems. Linköping: Department of Computer and Information Science, Linköpings universitet, 2002.
Find full textIEEE Standards Coordinating Committee 20 on Test and Diagnosis for Electronic Systems. and IEEE-SA Standards Board, eds. IEEE standard for digital test interchange format (DTIF). New York: Institute of Electrical and Electronics Engineers, 1999.
Find full textLee, Mike Tien-Chien. High-level test synthesis of digital VLSI circuits. Boston: Artech House, 1997.
Find full textC), International Test Conference (25th 1994 Washington D. Proceedings: International Test Conference, 1994. Altoona, PA: The Conference, 1994.
Find full textButler, Kenneth M. Assessing fault model and test quality. Boston: Kluwer Academic, 1992.
Find full textInstitute of Electrical and Electronics Engineers., IEEE Standards Association, IEEE Standards Board, and IEEE Standards Coordinating Committee 20., eds. IEEE guide for digital test interchange format (DTIF) application. New York: Institute of Electrical and Electronics Engineers, 2001.
Find full textBeenker, F. P. M. Testability Concepts for Digital ICs: The Macro Test Approach. Boston, MA: Springer US, 1995.
Find full textG, Bennetts R., and Thijssen A. P, eds. Testability concepts for digital ICs: The macro test approach. Dordrecht: Kluwer Academic Publishers, 1995.
Find full textInternational Test Conference (33rd 2002 Baltimore, Maryland). Proceedings International Test Conference 2002. Washington, D.C: International Test Conference, 2002.
Find full textWunderlich, Hans-Joachim. Probabilistische Verfahren für den Test hochintegrierter Schaltungen. Berlin: Springer-Verlag, 1987.
Find full textKelly, David. Parallel test pattern generation for programmable logic devices. Dublin: University College Dublin, 1995.
Find full textKiselev, V. V. Avtomatizat͡s︡ii͡a︡ poiska defektov v t͡s︡ifrovykh ustroĭstvakh. Leningrad: Ėnergoatomizdat, Leningradskoe otd-nie, 1986.
Find full textMagherini, Simone, ed. Strale – le poesie di Aldo Palazzeschi. Firenze: SEF - Centro Studi Palazzeschi, 2022. http://dx.doi.org/10.35948/9788860326058.
Full textInternational Test Conference (30th 1999 Atlantic City, N.J.). Proceedings, International Test Conference 1999. Washington, D.C: International Test Conference, 1999.
Find full textGuleng, Mai Britt. eMunch.no: Tekst og bilde. Oslo: Munch-museet, 2011.
Find full textRaik, Jaan. Hierarchical test generation for digital circuits represented by decision diagrams. Tallinn: Tallinn Technical University, 2001.
Find full textDennis, Derickson, and Muller Marcus, eds. Digital communications test and measurement: High-speed physical layer characterization. Upper Saddle River, NJ: Prentice Hall, 2008.
Find full textE, Brooks David, Frantz Brian D, and United States. National Aeronautics and Space Administration., eds. ATM quality of service tests for digitized video using ATM over satellite: Laboratory tests. [Washington, D.C: National Aeronautics and Space Administration, 1997.
Find full textMohammed, Tijjani. Test item file to accompany Digital systems: Principles and applications, eighth edition. Upper Saddle River, N.J: Prentice Hall, 2001.
Find full textP, Myers Lawrence, and Dryden Flight Research Facility, eds. Test and evaluation of the HIDEC engine uptrim algorithm. Edwards, Calif: National Aeronautics and Space Administration, Ames Research Center, Dryden Flight Research Facility, 1986.
Find full textP, Myers Lawrence, and Dryden Flight Research Facility, eds. Test and evaluation of the HIDEC engine uptrim algorithm. Edwards, Calif: National Aeronautics and Space Administration, Ames Research Center, Dryden Flight Research Facility, 1986.
Find full textTest, Digital. Digital Ebook Test. HarperCollins Publishers Limited, 2018.
Find full textInternational Test Conference 1990: Changing the Philosophy of Tests (International Test Conference//Proceedings). Ieee Computer Society, 1990.
Find full textFey, Görschwin, Stephan Eggersglüß, and Ilia Polian. Test Digitaler Schaltkreise. de Gruyter GmbH, Walter, 2014.
Find full textFey, Görschwin, Stephan Eggersglüß, and Ilia Polian. Test Digitaler Schaltkreise. de Gruyter GmbH, Walter, 2014.
Find full textFey, Görschwin, Stephan Eggersglüß, and Ilia Polian. Test Digitaler Schaltkreise. de Gruyter GmbH, Walter, 2014.
Find full textFey, Görschwin, Stephan Eggersglüß, and Ilia Polian. Test Digitaler Schaltkreise. de Gruyter GmbH, Walter, 2014.
Find full textMaasen, Sabine, and Jan-Hendrik Passoth, eds. Soziologie des Digitalen - Digitale Soziologie? Nomos Verlagsgesellschaft mbH & Co. KG, 2020. http://dx.doi.org/10.5771/9783845295008.
Full textBajohr, Hannes, and Annette Gilbert, eds. Digitale Literatur II. edition text + kritik im Richard Boorberg Verlag, 2021. http://dx.doi.org/10.5771/9783967075496.
Full textWorkshop Bi-Digital O-Ring Test (Workshop Bi-Digital O-Ring Test (VIDEO-CD). TVMED, 2002.
Find full textNAVABI. Digital System Test and Testable Design. SPRINGER INDIA, 2014.
Find full textNavabi, Zainalabedin. Digital System Test and Testable Design. Springer, 2011.
Find full textManning, Jimmie, and Katherine Denker. Test Bank ForInterpersonal Communication: Digital First. Pearson Education, Limited, 2029.
Find full textTest und Testbarkeit digitaler Schaltungen. Wiesbaden: Vieweg+Teubner Verlag, 1988.
Find full textMano and Abigail Steel. Digital Design-Text Only. HarperCollins Publishers Limited, 2020.
Find full textCoombs, Clyde F., and Catherine Ann Coombs. Communications Network Test & Measurement Handbook. McGraw-Hill Professional, 1997.
Find full textCoombs, Clyde F., and Catherine Ann Coombs. Communications Network Test & Measurement Handbook. McGraw-Hill Professional, 1997.
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