Journal articles on the topic 'Test device'
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Siswanto, Waluyo Adi, Mohd Norihan Ibrahim, Mohd Amran Madlan, and Siti Mariah Mohamad. "Shaker Table Design for Electronic Device Vibration Test System." International Journal of Engineering and Technology 3, no. 6 (2011): 663–68. http://dx.doi.org/10.7763/ijet.2011.v3.302.
Full textMaeno, Hidesh, and Tetsuo Tada. "4813043 Semiconductor test device." Microelectronics Reliability 29, no. 5 (January 1989): iii. http://dx.doi.org/10.1016/0026-2714(89)90324-7.
Full textDongré, Raj, John D’Angelo, and Steve McMahon. "Development of Superpave Direct Tension Test Device." Transportation Research Record: Journal of the Transportation Research Board 1586, no. 1 (January 1997): 32–39. http://dx.doi.org/10.3141/1586-05.
Full textKusmayanti, Suci, Gilang Yubiliana, Andri Abdurrochman, Muhamad Lutfi Ramdani, and Naufal Hilmi Fauzan. "Effectiveness test of dental hypnosis monitoring device." Padjadjaran Journal of Dentistry 33, no. 1 (March 31, 2021): 26. http://dx.doi.org/10.24198/pjd.vol33no1.22383.
Full textXiao, Yao Zong, Wen Jun Zhang, Bin Wang, and Chun Cheng Tai. "Floatation Column Test Research into Ore Way." Advanced Materials Research 347-353 (October 2011): 1718–21. http://dx.doi.org/10.4028/www.scientific.net/amr.347-353.1718.
Full textMartínez Palmeth, Luis Humberto, María Angelica Gonzalez Carmona, and José Miranda Castro. "Design and Analysis of a Bulge Test Device." Ingeniería e Investigación 41, no. 3 (June 2, 2021): e85756. http://dx.doi.org/10.15446/ing.investig.v41n3.85756.
Full textKRIEGER, JAMES. "Test Device Reduces Exam Anxiety." Chemical & Engineering News 70, no. 28 (July 13, 1992): 37. http://dx.doi.org/10.1021/cen-v070n028.p037.
Full textKniker, William T. "CHOOSING A SKIN TEST DEVICE." Annals of Allergy, Asthma & Immunology 78, no. 5 (May 1997): 524. http://dx.doi.org/10.1016/s1081-1206(10)63243-7.
Full textEngler, David B. "CHOOSING A SKIN TEST DEVICE." Annals of Allergy, Asthma & Immunology 78, no. 5 (May 1997): 524–25. http://dx.doi.org/10.1016/s1081-1206(10)63244-9.
Full textGouge, Edward M. "A flame test demonstration device." Journal of Chemical Education 65, no. 6 (June 1988): 544. http://dx.doi.org/10.1021/ed065p544.
Full textSandor, A., K. L. Holden, J. W. Pace, and L. Martin. "Cursor Control Device Test Battery." Proceedings of the Human Factors and Ergonomics Society Annual Meeting 55, no. 1 (September 1, 2011): 1823–26. http://dx.doi.org/10.1177/1071181311551379.
Full textDeaves, M. "On test [electronic device testing]." Manufacturing Engineer 82, no. 5 (October 1, 2003): 40–41. http://dx.doi.org/10.1049/me:20030508.
Full textVelghe, M. F., and P. Elleaume. "FEL optics coating test device." Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 259, no. 1-2 (September 1987): 83–87. http://dx.doi.org/10.1016/0168-9002(87)90433-5.
Full textBayrakçeken, Hüseyin, Faruk Emre Aysal, and İbrahim Mutlu. "The Design and Manufacturing of Brake‐Suspension Test Device." Afyon Kocatepe University Journal of Sciences and Engineering 16, no. 2 (June 1, 2016): 454–60. http://dx.doi.org/10.5578/fmbd.27861.
Full textBruckhoff, Henning. "Test device for measuring the fit of hearing and related devices." Journal of the Acoustical Society of America 78, no. 2 (August 1985): 822. http://dx.doi.org/10.1121/1.393084.
Full textGreason, W. D., and S. Bulach. "Constant energy device test for electrostatic discharge (ESD) of semiconductor devices." IEEE Transactions on Industry Applications 33, no. 1 (1997): 286–97. http://dx.doi.org/10.1109/28.567133.
Full textJanky, Kristen L., Jessie N. Patterson, Neil T. Shepard, Megan L. A. Thomas, and Julie A. Honaker. "Effects of Device on Video Head Impulse Test (vHIT) Gain." Journal of the American Academy of Audiology 28, no. 09 (October 2017): 778–85. http://dx.doi.org/10.3766/jaaa.16138.
Full textKatoh, Yoshihisa, Shintaro So, Younggun Han, Osamu Horiuchi, Woon Choi, and Hajime Tomokage. "Reliability Test of Embedded Device Substrates." Journal of The Japan Institute of Electronics Packaging 17, no. 5 (2014): 370–75. http://dx.doi.org/10.5104/jiep.17.370.
Full textYang, Shi Liang, Teng Li, Wei Hong Tang, and Ling Dai. "Electrostatic Sensitivity Test of Semiconductor Device." Advanced Materials Research 1030-1032 (September 2014): 1172–75. http://dx.doi.org/10.4028/www.scientific.net/amr.1030-1032.1172.
Full textDu, Wei Ming, Cai Bin Liu, and Guo Hong Liu. "Design of Radar Transmitter Test Device." Advanced Materials Research 791-793 (September 2013): 941–44. http://dx.doi.org/10.4028/www.scientific.net/amr.791-793.941.
Full textJakubovičová, Lenka, Branislav Ftorek, Vladislav Baniari, Alžbeta Sapietová, Tomáš Potoček, and Milan Vaško. "Engineering Design of a Test Device." Procedia Engineering 177 (2017): 520–25. http://dx.doi.org/10.1016/j.proeng.2017.02.255.
Full textKroeger, Michael, Horst Karl, Bernhard Simmler, and Peter Singer. "Viability Test Device for anisakid nematodes." Heliyon 4, no. 3 (March 2018): e00552. http://dx.doi.org/10.1016/j.heliyon.2018.e00552.
Full textGent, A. N., T. T. Thompson, and R. D. Ramsier. "A “Wobble-Plate” Dynamic Test Device." Rubber Chemistry and Technology 76, no. 4 (September 1, 2003): 779–84. http://dx.doi.org/10.5254/1.3547771.
Full textBlad, Börje, Per Wendel, and Per Nilsson. "A simple test device for electrometers." Physics in Medicine and Biology 43, no. 8 (August 1, 1998): 2385–91. http://dx.doi.org/10.1088/0031-9155/43/8/028.
Full textBahl, C. R. H., T. F. Petersen, N. Pryds, and A. Smith. "A versatile magnetic refrigeration test device." Review of Scientific Instruments 79, no. 9 (2008): 093906. http://dx.doi.org/10.1063/1.2981692.
Full text&NA;. "CE Test: Pinpointing intravascular device infections." Nursing Management (Springhouse) 34, no. 6 (June 2003): 42–43. http://dx.doi.org/10.1097/00006247-200306000-00017.
Full textCrane, F. Edward, Scott Davidson, Jack Kane, Charles E. Stroud, and Shianling Wu. "Trends in Digital Device Test Methodologies." AT&T Technical Journal 73, no. 2 (March 4, 1994): 10–18. http://dx.doi.org/10.1002/j.1538-7305.1994.tb00574.x.
Full textLacher, Alexander, Nikolas Juengel, and Utz von Wagner. "Modelling of a pyroshock test device." PAMM 9, no. 1 (December 2009): 291–92. http://dx.doi.org/10.1002/pamm.200910119.
Full textDavid Suits, L., TC Sheahan, A. Hameiri, and RJ Fannin. "A Cyclic Gradient Ratio Test Device." Geotechnical Testing Journal 25, no. 3 (2002): 9921. http://dx.doi.org/10.1520/gtj11097j.
Full textShang, Yujun, Chenglong Wang, Hongmei Xu, Shuang Liu, Wei Jiang, and Jiajun Dong. "Noise Source Identification of the Grain Combining Harvester Based on Acoustic Array Test." Applied Engineering in Agriculture 36, no. 6 (2020): 879–90. http://dx.doi.org/10.13031/aea.14153.
Full textJia, Xiaofei, Wenhao Chen, Bing Ding, and Liang He. "Noise test method for dual-gate MOSFET device." Modern Physics Letters B 33, no. 31 (November 10, 2019): 1950387. http://dx.doi.org/10.1142/s0217984919503871.
Full textHaverkate, Liz, Gerwin Smit, and Dick H. Plettenburg. "Assessment of body-powered upper limb prostheses by able-bodied subjects, using the Box and Blocks Test and the Nine-Hole Peg Test." Prosthetics and Orthotics International 40, no. 1 (October 21, 2014): 109–16. http://dx.doi.org/10.1177/0309364614554030.
Full textZuehlke, Detlef, and Lutz Krauss. "A New and Simple Method and Tool for the Evaluation of Input Devices." Proceedings of the Human Factors and Ergonomics Society Annual Meeting 46, no. 24 (September 2002): 1987–91. http://dx.doi.org/10.1177/154193120204602411.
Full textWang, Li Quan, Yong Dong An, Rong Hua Sun, and Shao Jun An. "Research on Loading Method of High-Speed Closed Power Flow Test System." Key Engineering Materials 419-420 (October 2009): 129–32. http://dx.doi.org/10.4028/www.scientific.net/kem.419-420.129.
Full textMasuda, Hiroyuki. "Long Term Laboratry Test Using New Atmospheric Corrosion Test Device." Journal of the Japan Institute of Metals 70, no. 9 (2006): 780–84. http://dx.doi.org/10.2320/jinstmet.70.780.
Full textOliver, MartinJ. "4727317 Device orientation test method suitable for automatic test equipment." Microelectronics Reliability 28, no. 5 (January 1988): 838. http://dx.doi.org/10.1016/0026-2714(88)90126-6.
Full textZhang, Kui, Hong Dong Zhao, Tong Xi Shen, and Jie Huang. "Research of Probability Distribution of Semiconductor Test Parameter." Advanced Materials Research 1049-1050 (October 2014): 754–61. http://dx.doi.org/10.4028/www.scientific.net/amr.1049-1050.754.
Full textVolobuev, S. V., and V. G. Ryabtsev. "Interface Features of the DDR SDRAM Memory Test Diagnostic Device." Proceedings of Universities. Electronics 26, no. 3-4 (2021): 282–90. http://dx.doi.org/10.24151/1561-5405-2021-26-3-4-282-290.
Full textBrakerski, Zvika, Paul Christiano, Urmila Mahadev, Umesh Vazirani, and Thomas Vidick. "A Cryptographic Test of Quantumness and Certifiable Randomness from a Single Quantum Device." Journal of the ACM 68, no. 5 (October 31, 2021): 1–47. http://dx.doi.org/10.1145/3441309.
Full textKillian, Jacquelin M., Rachel M. Radin, Cubby L. Gardner, Lalon Kasuske, Kylee Bashirelahi, Dominic Nathan, David O. Keyser, Christopher J. Cellucci, David Darmon, and Paul E. Rapp. "Alternative Devices for Heart Rate Variability Measures: A Comparative Test–Retest Reliability Study." Behavioral Sciences 11, no. 5 (May 2, 2021): 68. http://dx.doi.org/10.3390/bs11050068.
Full textIsetta, Valentina, Daniel Navajas, Josep M. Montserrat, and Ramon Farré. "Comparative assessment of several automatic CPAP devices' responses: a bench test study." ERJ Open Research 1, no. 1 (May 2015): 00031–2015. http://dx.doi.org/10.1183/23120541.00031-2015.
Full textBorozenets, A. S., A. V. Proskurin, and A. V. Shlishevskiy. "Evaluation of the Composite Barrier Natural Oscillations Influence on the Generated Shock Loading." Herald of the Bauman Moscow State Technical University. Series Mechanical Engineering, no. 1 (136) (March 2021): 103–13. http://dx.doi.org/10.18698/0236-3941-2021-1-103-113.
Full textPan, Zhi Yong, Sheng Yin Song, Wen Hong Liu, Yao Rong Feng, and Xin Hu Wang. "Research and Application of Expansion Evaluation Device for Solid Expandable Tubular." Advanced Materials Research 339 (September 2011): 579–82. http://dx.doi.org/10.4028/www.scientific.net/amr.339.579.
Full textLi, Hu, Yubo Fan, and Zhou Li. "Fabrication and performance test of biodegradable supercapacitor." MRS Advances 4, no. 37 (2019): 2063–70. http://dx.doi.org/10.1557/adv.2019.253.
Full textPanthawong, Amonrat, Stephen L. Doggett, and Theeraphap Chareonviriyaphap. "The Efficacy of Ultrasonic Pest Repellent Devices against the Australian Paralysis Tick, Ixodes holocyclus (Acari: Ixodidae)." Insects 12, no. 5 (April 30, 2021): 400. http://dx.doi.org/10.3390/insects12050400.
Full textCheng, Ze, Zhao Long Xuan, Wei Wang, and Mao Sen Hao. "Test Method for Electronic Device on Condition of Small Sampling." Applied Mechanics and Materials 347-350 (August 2013): 525–28. http://dx.doi.org/10.4028/www.scientific.net/amm.347-350.525.
Full textKelemenová, Tatiana. "AIRFLOW MEASUREMENT TEST DEVICE FOR AIRFLOW SENSORS." Acta Mechatronica 4, no. 4 (December 31, 2019): 17–21. http://dx.doi.org/10.22306/am.v4i4.52.
Full textSaraogi, Ashish, S. Parthasarathy, VR Hemanth Kumar, and M. Ravishankar. "Improvised device for negative-pressure leak test." Indian Journal of Anaesthesia 56, no. 2 (2012): 201. http://dx.doi.org/10.4103/0019-5049.96311.
Full textHuang Yongjun, 黄勇军, 文光俊 Wen Guangjun, 李天倩 Li Tianqian, and 谢康 Xie Kang. "Test device for negative refractive index materials." High Power Laser and Particle Beams 23, no. 1 (2011): 221–24. http://dx.doi.org/10.3788/hplpb20112301.0221.
Full textLiu, Qiang, Ying Xue Yao, and L. Zhou. "Research on a New Nanohardness Test Device." Applied Mechanics and Materials 10-12 (December 2007): 533–37. http://dx.doi.org/10.4028/www.scientific.net/amm.10-12.533.
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