Journal articles: 'Synchrotron Diffraction Studies'

1

Brückel, Th. "Synchrotron Radiation Diffraction Studies of Magnetic Materials." Acta Physica Polonica A 91, no. 4 (April 1997): 669–79. http://dx.doi.org/10.12693/aphyspola.91.669.

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Di Mitri, Simone. "One way only to synchrotron light sources upgrade?" Journal of Synchrotron Radiation 25, no. 5 (August 14, 2018): 1323–34. http://dx.doi.org/10.1107/s160057751800810x.

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The last decade has seen a renaissance of machine-physics studies and technological advancements that aim to upgrade at least 15 synchrotron light sources worldwide to diffraction-limited storage rings. This is expected to improve the average spectral brightness and transversally coherent fraction of photons by several orders of magnitude in the soft- and hard-X-ray wavelength range, at the expense of pulse durations longer than ∼80 ps FWHM. This paper discusses the compatibility of schemes for the generation of sub-picosecond photon-pulse durations in synchrotron light sources with standard multi-bunch user operation and, in particular, diffraction-limited electron optics design. The question of this compatibility is answered taking into consideration the storage ring beam energy and the constraint of existing synchrotrons' infrastructure. An alternative scheme for the upgrade of medium-energy synchrotron light sources to diffraction-limited storage rings and the simultaneous production of picosecond-long photon pulses in a high-gain free-electron laser scheme are illustrated.

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Dutta, Pulak. "Studies of monolayers using synchrotron X-ray diffraction." Current Opinion in Solid State and Materials Science 2, no. 5 (October 1997): 557–62. http://dx.doi.org/10.1016/s1359-0286(97)80044-7.

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Sosnowska, I. M., and M. Shiojiri. "Oxides: neutron and synchrotron X-ray diffraction studies." Journal of Electron Microscopy 48, no. 6 (January 1, 1999): 681–87. http://dx.doi.org/10.1093/oxfordjournals.jmicro.a023736.

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Hatcher, Lauren E., and Paul R. Raithby. "Dynamic single-crystal diffraction studies using synchrotron radiation." Coordination Chemistry Reviews 277-278 (October 2014): 69–79. http://dx.doi.org/10.1016/j.ccr.2014.02.021.

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Katsumata, Koichi, Akiko Kikkawa, Yoshikazu Tanaka, Susumu Shimomura, Shuji Ebisu, and Shoichi Nagata. "Synchrotron X-ray Diffraction Studies of α-Gd2S3." Journal of the Physical Society of Japan 74, no. 5 (May 15, 2005): 1598–601. http://dx.doi.org/10.1143/jpsj.74.1598.

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Fitch, A. N., and J. K. Cockcroft. "Low-temperature powder diffraction studies using synchrotron radiation." Phase Transitions 39, no. 1-4 (September 1992): 161–70. http://dx.doi.org/10.1080/01411599208203479.

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Cox, D. E. "Synchrotron X-Ray Powder Diffraction." MRS Bulletin 12, no. 1 (February 1987): 16–20. http://dx.doi.org/10.1557/s088376940006869x.

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X-ray powder diffraction is one of the most widely used techniques by scientists engaged in the synthesis, analysis, and characterization of solids. It is estimated that there are now about 25,000 users throughout the world, of which about one third are in the United States. Any single-phase polycrystalline material gives an x-ray pattern which can be regarded as a unique “fingerprint,” and modern automated search-and-match techniques used in conjunction with the Powder Diffraction File (maintained by the International Center for Diffraction Data, Swarthmore, PA) allow routine analysis of samples in minutes. From an x-ray pattern of good quality it is possible to determine unit cell parameters with high accuracy and impurity concentrations of 1-5%, so that powder techniques are extremely valuable in phase equilibrium studies and residual stress measurements, for example. In addition, a detailed analysis of line shapes gives information about physical properties such as the size and shape of the individual crystallites, microscopic strain, and stacking disorder.In the early days of crystallography many simple (and some not-so-simple) structures were solved from x-ray powder diffraction patterns, but the obvious limitations to the number of individual reflection intensities which can be estimated and the increasing sophistication of single-crystal techniques resulted in a decline in the importance of this application in the 1950s and 1960s.

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Als-Nielsen, Jens. "X-ray powder diffraction for charge density studies." Acta Crystallographica Section A Foundations and Advances 70, a1 (August 5, 2014): C1339. http://dx.doi.org/10.1107/s2053273314086604.

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Issues concerning optimal powder diffraction at synchrotron sources for charge density studies will be discussed. These include beam qualities (energy, bandwidth, brillance, flux) as well as sample environmnet (vaccuum, capillary, temperature) and detector type (image plate, crystal analyzer). Simple on-line analysis in obtaining structure factors will be presented.

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Harford, Jeffrey, and John Squire. "Time-resolved diffraction studies of muscle using synchrotron radiation." Reports on Progress in Physics 60, no. 12 (December 1, 1997): 1723–87. http://dx.doi.org/10.1088/0034-4885/60/12/005.

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Sikolenko, V., A. Sazonov, V. Efimov, V. Krivencov, N. Darowski, and D. Vyalikh. "Neutron diffraction and synchrotron radiation studies of magnetic properties." Journal of Magnetism and Magnetic Materials 310, no. 2 (March 2007): e181-e183. http://dx.doi.org/10.1016/j.jmmm.2006.10.130.

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Noguchi, K., and K. Okuyama. "Fiber diffraction studies on polymers using synchrotron radiation source." Acta Crystallographica Section A Foundations of Crystallography 58, s1 (August 6, 2002): c164. http://dx.doi.org/10.1107/s0108767302091572.

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Reid, Joel. "Application of synchrotron powder diffraction to research and issues in mining." Acta Crystallographica Section A Foundations and Advances 70, a1 (August 5, 2014): C950. http://dx.doi.org/10.1107/s2053273314090494.

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Powder diffraction (PXRD) is an important tool for synergistic synchrotron studies of mining issues. Quantitative phase analysis with powder diffraction often provides basic information required to guide additional studies such as X-ray absorption (XAS) or micro-diffraction (μ-XRD). Elemental speciation in dilute and complex mineralogical systems with X-ray absorption near edge structure (XANES) spectroscopy is critically dependent on high quality phase pure standards, which are generally appraised using PXRD. This talk will examine the powder diffraction capabilities at the CLS, and discuss application of PXRD to mining issues as part of a combined synchrotron approach using examples.

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Brand, Helen E. A., Nicola V. Y. Scarlett, Ian E. Grey, Robert B. Knott, and Nigel Kirby. "In situSAXS studies of the formation of sodium jarosite." Journal of Synchrotron Radiation 20, no. 4 (June 1, 2013): 626–34. http://dx.doi.org/10.1107/s0909049513013939.

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This paper reports the results of time-resolved synchrotron small-angle scattering and powder diffraction experiments where natrojarosites were synthesizedin situin order to observe the species produced at the earliest stages of nucleation. The sample temperatures were 333, 353 and 368 K. These compounds were synthesized by co-precipitation from solution on the Small and Wide Angle Scattering and Powder Diffraction beamlines at the Australian Synchrotron. Scattering data were collected continuously throughout the syntheses. The results presented here show that the first particles to form in solution appear to be amorphous and nucleate on the walls of the reaction vessel. Crucially, there is a single nucleation event which forms particles with an elliptical disc morphology which then grow uniformly before natrojarosite crystallization is observed in complementary powder diffraction data. This nucleation event may represent the key to controlling the growth of jarosites in industrial and environmental settings.

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15

Parrish, William. "Advances in Synchrotron X-ray Polycrystalline Diffraction." Australian Journal of Physics 41, no. 2 (1988): 101. http://dx.doi.org/10.1071/ph880101.

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The advantages of synchrotron radiation for X-ray polycrystalline diffraction are illustrated by a number of examples. The plane wave parallel-beam X-ray optics uses a Si(lll) channel monochromator for easy wavelength selection and a set of long parallel slits to define the diffracted beam. The constant simple instrument function and the high resolution symmetrical profiles (FWHM 0.05") greatly simplify the data analysis and add a new dimension to profile broadening studies. The geometry permits uncoupling the 6-26 sample-detector relationship without changing the profile shape and makes possible new applications such as grazing angle incidence depth analysis of thin films. The same instrumentation is used for high resolution energy dispersive diffraction (BOD) by step-scanning the monochromator. The resolution is two orders of magnitude better than conventional BOD and can be used at high count rates. The easy wavelength selection yields diffraction patterns with the highest PI B and permits anomalous scattering studies.

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Nishibori, E., M. Takata, M. Sakata, and H. Shinohara. "Structural studies of endohedral metallofullerenes by synchrotron radiation powder diffraction." Journal of Synchrotron Radiation 5, no. 3 (May 1, 1998): 977–79. http://dx.doi.org/10.1107/s0909049597016816.

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The endohedral natures of the metallofullerenes Y@C82 and Sc2@C84 are described based on synchrotron radiation powder diffraction experiments. For structural analysis, a combination of the maximum-entropy method (MEM) and Rietveld refinement was employed to analyse the complicated powder pattern. The obtained MEM charge densities show a clear distinction of the endohedral natures of the mono- and dimetallofullerenes.

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Scarlett, Nicola V. Y., Ian C. Madsen, and Barry I. Whittington. "Time-resolved diffraction studies into the pressure acid leaching of nickel laterite ores: a comparison of laboratory and synchrotron X-ray experiments." Journal of Applied Crystallography 41, no. 3 (April 8, 2008): 572–83. http://dx.doi.org/10.1107/s0021889808006894.

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This paper compares time-resolved diffraction experiments that have been performed using laboratory and synchrotron X-ray sources. The experiments investigated the mechanism and kinetics of pressure acid leaching of nickel laterite ores. The sample environment was a purpose-built capillary reaction vessel, and extensive method development was conducted in the laboratory using Mo Kα radiation prior to repeating and extending the experiments at the Daresbury Synchrotron Radiation Source, beamline MPW6.2. In general, the synchrotron results confirmed the findings from previously reported laboratory work and also confirmed the presence of a minor phase that had been ambiguous in the laboratory experiments,i.e.the formation of hematite in the pressure acid leaching of saprolite. The synchrotron measurements also extended the experimental programme to include poorly diffracting laterite components that could not be examined in the laboratory,e.g.nontronite. The results from these components supported the reaction mechanisms determined fromex-situanalyses conducted in larger scale autoclaves.

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Jørgensen, Mads R. V., Venkatesha R. Hathwar, Niels Bindzus, Nanna Wahlberg, Yu-Sheng Chen, Jacob Overgaard, and Bo B. Iversen. "Contemporary X-ray electron-density studies using synchrotron radiation." IUCrJ 1, no. 5 (August 29, 2014): 267–80. http://dx.doi.org/10.1107/s2052252514018570.

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Synchrotron radiation has many compelling advantages over conventional radiation sources in the measurement of accurate Bragg diffraction data. The variable photon energy and much higher flux may help to minimize critical systematic effects such as absorption, extinction and anomalous scattering. Based on a survey of selected published results from the last decade, the benefits of using synchrotron radiation in the determination of X-ray electron densities are discussed, and possible future directions of this field are examined.

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Cernik, R. J. "X-ray diffraction studies using synchrotron radiation at Daresbury Laboratory." Acta Crystallographica Section A Foundations of Crystallography 43, a1 (August 12, 1987): C265. http://dx.doi.org/10.1107/s010876738707836x.

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Hriljac, Joseph A. "High-pressure synchrotron X-ray powder diffraction studies of zeolites." Crystallography Reviews 12, no. 2 (April 2006): 181–93. http://dx.doi.org/10.1080/08893110600772032.

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21

Knapp, G. S., M. A. Beno, G. Jennings, M. Engbretson, and M. Ramanathan. "Synchrotron and Laboratory Studies Utilizing a New Powder Diffraction Technique." Advances in X-ray Analysis 36 (1992): 653–61. http://dx.doi.org/10.1154/s0376030800019315.

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AbstractWe have developed a new type of powder diffractometer. The diffractometer has the potential of both high count rates and very high resolution when used at a synchrotron source. The laboratory based instrument can achieve an order of magnitude improvement in count rate over existing methods with proper optics. The method uses a focusing diffracted beam monochromator in combination with a multichannel detector. The incident x-rays fall on a flat plate or capillary sample and are intercepted by a bent focusing monochromator which has the focus of the bend at the sample surface. The powder diffraction lines emerging from the bent crystal monochromator are detected by a linear or 2-dimensional detector. This allows us to eliminate the background from fluorescence or other scattering and to take data over a range of 3° to 4° instead of one angle at a time thereby providing a large improvement over conventional diffractometers.

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Frings, P., J. Vanacken, C. Detlefs, F. Duc, J. E. Lorenzo, M. Nardone, J. Billette, A. Zitouni, W. Bras, and G. L. J. A. Rikken. "Synchrotron x-ray powder diffraction studies in pulsed magnetic fields." Review of Scientific Instruments 77, no. 6 (June 2006): 063903. http://dx.doi.org/10.1063/1.2216914.

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Contreras, L., X. Turrillas, M. J. Mas-Guindal, G. B. M. Vaughan, Å. Kvick, and M. A. Rodríguez. "Synchrotron diffraction studies of TiC/FeTi cermets obtained by SHS." Journal of Solid State Chemistry 178, no. 5 (May 2005): 1595–600. http://dx.doi.org/10.1016/j.jssc.2005.03.011.

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Zhou, Qingdi, and Brendan J. Kennedy. "High-temperature powder synchrotron diffraction studies of synthetic cryolite Na3AlF6." Journal of Solid State Chemistry 177, no. 3 (March 2004): 654–59. http://dx.doi.org/10.1016/j.jssc.2003.08.012.

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Matsudaira, P., J. Bordas, and M. H. Koch. "Synchrotron x-ray diffraction studies of actin structure during polymerization." Proceedings of the National Academy of Sciences 84, no. 10 (May 1, 1987): 3151–55. http://dx.doi.org/10.1073/pnas.84.10.3151.

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Maurizio, C., F. Gonella, E. Cattaruzza, P. Mazzoldi, and F. D’Acapito. "Implanted dielectrics: Synchrotron radiation studies by absorption and diffraction techniques." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 200 (January 2003): 126–37. http://dx.doi.org/10.1016/s0168-583x(02)01708-1.

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Sosnowska, Izabela M., and Makoto Shiojiri. "ChemInform Abstract: Oxides: Neutron and Synchrotron X-Ray Diffraction Studies." ChemInform 31, no. 25 (June 8, 2010): no. http://dx.doi.org/10.1002/chin.200025270.

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Caciuffo, Roberto, and Gerard H. Lander. "X-ray synchrotron radiation studies of actinide materials." Journal of Synchrotron Radiation 28, no. 6 (November 1, 2021): 1692–708. http://dx.doi.org/10.1107/s1600577521009413.

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By reviewing a selection of X-ray diffraction (XRD), resonant X-ray scattering (RXS), X-ray magnetic circular dichroism (XMCD), resonant and non-resonant inelastic scattering (RIXS, NIXS), and dispersive inelastic scattering (IXS) experiments, the potential of synchrotron radiation techniques in studying lattice and electronic structure, hybridization effects, multipolar order and lattice dynamics in actinide materials is demonstrated.

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Fitch, Andrew N. "Applications of High-Resolution Powder X-Ray Diffraction." Solid State Phenomena 130 (December 2007): 7–14. http://dx.doi.org/10.4028/www.scientific.net/ssp.130.7.

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The highly-collimated, intense X-rays produced by a synchrotron radiation source can be harnessed to build high-resolution powder diffraction instruments with a wide variety of applications. The general advantages of using synchrotron radiation for powder diffraction are discussed and illustrated with reference to the structural characterisation of crystalline materials, atomic PDF analysis, in-situ and high-throughput studies where the structure is evolving between successive scans, and the measurement of residual strain in engineering components.

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Brigitte Krause, H. "Electron microscope studies on Nd2-xCexCuO4." Proceedings, annual meeting, Electron Microscopy Society of America 49 (August 1991): 1100–1101. http://dx.doi.org/10.1017/s0424820100089810.

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The crystal structure of Nd2-xCexCuO4, as determined from neutron powder diffraction and high resolution synchrotron radiation, has been reported in the literature. The space group was found to be Immm. The ratio of the tetragonal unit cell was reported to vary as a function of the compositions with two separate branches resulting in two different ratios for each composition. In addition, commensurate superlattices have been observed and related to ordering, of atoms or vacancies. The present work deals with electron diffraction data on the same samples used for the neutron diffraction work at Argonne National Laboratory. The samples were kindly supplied by Dr. Bogdan Dabrowski.

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MIZUKI, Junichiro. "Synchrotron Radiation. III. Measurement by Synchrotron Radiation. 7. Surface Structure Studies by X-Ray Diffraction." RADIOISOTOPES 47, no. 4 (1998): 344–52. http://dx.doi.org/10.3769/radioisotopes.47.344.

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Suchomel, Matthew, Gregory Halder, and Lynn Ribaud. "Synchrotron powder diffraction simplified; management of an APS mail-in program." Acta Crystallographica Section A Foundations and Advances 70, a1 (August 5, 2014): C789. http://dx.doi.org/10.1107/s2053273314092109.

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Synchrotrons have revolutionized powder diffraction. They enable rapid collection of data with tremendous angular resolution and exceptional statistics. High resolution powder diffraction beamlines employing multiple single crystal analyzer detectors routinely reveal subtle crystallographic distortions undetectable on other powder instruments, and are an important tool at most modern synchrotrons for structural studies of a diverse range of materials. Beamline 11-BM at the Advanced Photon Source (APS) is a dedicated high resolution (ΔQ/Q ~2×10-4) powder diffraction instrument which uses vertical and horizontal beam focusing capabilities and a counting system consisting of twelve perfect crystal analyzers paired with scintillator detectors. This APS beamline supports both traditional on-site experiments and a highly successfully rapid access mail-in program mode. This mail-in program has greatly simplified access for a growing user community (> 250 in 2013) to world-class synchrotron quality powder data for their research and resulting publications (> 100 11-BM citations in 2013). The presentation will provide an overview of 11-BM's unique mail-in program. It will be presented both from the view of an external remote user, and will also highlight the numerous alignment, calibration, correction and merging software routines needed to efficiently and accurately reduce the numerous multi-bank detector datasets associated with a high throughput user program. An integrated web interface has been developed to serve as a user-friendly relational database interface for tracking of samples and datasets throughout all stages of the measurements; from the initial user request to sample disposal. The database and software tools critical for this high-throughput synchrotron powder diffraction program will be discussed in detail. More information about the 11-BM and its mail-in program can be found on the beamline webpage: http://11bm.xray.aps.anl.gov

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Nelmes, Richard J., and Malcolm I. McMahon. "High-Pressure Powder Diffraction Using an Image-Plate Area Detector." Advances in X-ray Analysis 37 (1993): 419–32. http://dx.doi.org/10.1154/s0376030800015949.

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Modern synchrotron sources, and recent developments in experimental techniques, are allowing significant: progress to be made at present in the quality of crystal-structure infonnation at high pressure. Though there are exciting prospects for single-crystal work, especially using Laue techniques, most of the recent advances have been made in powder diffraction. In any case, high-pressure diffraction studies often require powder techniques because single crystals fail to survive the large density changes that accompany many pressure-induced phase transitions. In this paper, we focus on angle-dispersive (AD) powder diffraction on synchrotron sources.

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Hall, G. "Silicon pixel detectors for X-ray diffraction studies at synchrotron sources." Quarterly Reviews of Biophysics 28, no. 1 (February 1995): 1–32. http://dx.doi.org/10.1017/s0033583500003127.

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Customized silicon diode detectors are widely used for elementary particle detection for their good spatial resolution. Silicon detectors are also excellent X-ray detectors in the energy range of interest for applications in synchrotron radiation experiments and, with small elements laid out in a two-dimensional array, may provide high performance imaging devices for future diffraction experiments.

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Remédios, C. M. R., and J. M. Sasaki. "Formation studies of NiO by X-ray powder diffraction." Powder Diffraction 23, S1 (March 2008): S56—S58. http://dx.doi.org/10.1154/1.2903510.

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Nickel oxide nanopowder was prepared by a simple method and analyzed by X-ray powder diffraction. A solution of gelatin and NiCl2⋅6H2O salt were prepared and sintered in sequence. Using a synchrotron light source for X-ray powder diffraction analysis, the synthesized material was characterized as a function of temperature in the interval of 375 to 600 °C. Results from thermogravimetric analysis confirm the temperature loss of the organic substance during the sintering process and show that the temperature for NiO attainment is 600 °C.

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Murray, Claire A., Jonathan Potter, Sarah J. Day, Annabelle R. Baker, Stephen P. Thompson, Jon Kelly, Christopher G. Morris, Sihai Yang, and Chiu C. Tang. "New synchrotron powder diffraction facility for long-duration experiments." Journal of Applied Crystallography 50, no. 1 (February 1, 2017): 172–83. http://dx.doi.org/10.1107/s1600576716019750.

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A new synchrotron X-ray powder diffraction instrument has been built and commissioned for long-duration experiments on beamline I11 at Diamond Light Source. The concept is unique, with design features to house multiple experiments running in parallel, in particular with specific stages for sample environments to study slow kinetic systems or processes. The instrument benefits from a high-brightness X-ray beam and a large area detector. Diffraction data from the commissioning work have shown that the objectives and criteria are met. Supported by two case studies, the results from months of measurements have demonstrated the viability of this large-scale instrument, which is the world's first dedicated facility for long-term studies (weeks to years) using synchrotron radiation.

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Ren, Zhe, Francesca Mastropietro, Anton Davydok, Simon Langlais, Marie-Ingrid Richard, Jean-Jacques Furter, Olivier Thomas, et al. "Scanning force microscope forin situnanofocused X-ray diffraction studies." Journal of Synchrotron Radiation 21, no. 5 (August 6, 2014): 1128–33. http://dx.doi.org/10.1107/s1600577514014532.

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A compact scanning force microscope has been developed forin situcombination with nanofocused X-ray diffraction techniques at third-generation synchrotron beamlines. Its capabilities are demonstrated on Au nano-islands grown on a sapphire substrate. The newin situdevice allows forin situimaging the sample topography and the crystallinity by recording simultaneously an atomic force microscope (AFM) image and a scanning X-ray diffraction map of the same area. Moreover, a selected Au island can be mechanically deformed using the AFM tip while monitoring the deformation of the atomic lattice by nanofocused X-ray diffraction. Thisin situapproach gives access to the mechanical behavior of nanomaterials.

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Ishizawa, N., Y. Matsushima, M. Hayashi, and M. Ueki. "Synchrotron radiation study of yttria-stabilized zirconia, Zr0.758Y0.242O1.879." Acta Crystallographica Section B Structural Science 55, no. 5 (October 1, 1999): 726–35. http://dx.doi.org/10.1107/s0108768199005108.

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The fluorite-related cubic structure of yttria-stabilized zirconia, Zr0.75 8Y0.24 2O1.87 9, has been studied by single-crystal X-ray diffraction using synchrotron radiation and by EXAFS. Two diffraction data sets obtained at X-ray energies of 512 and 10 eV below the Y K edge revealed that in the average structure Zr atoms are displaced from the origin of the space group Fm3¯m along 〈111〉 by 0.19 Å, while Y atoms reside at the origin. Approximately 48% of the O atoms occupy the ideal position in the fluorite-type structure, while 43% of O atoms are displaced from the ideal position along 〈001〉 by 0.31 Å. The remaining 9% of O atoms are presumably sited at interstitial positions. Local structures around Zr and Y are investigated by combining the results of single-crystal X-ray diffraction and EXAFS studies.

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Wenk, H. R., and S. Grigull. "Synchrotron texture analysis with area detectors." Journal of Applied Crystallography 36, no. 4 (July 19, 2003): 1040–49. http://dx.doi.org/10.1107/s0021889803010136.

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The wide availability of X-ray area detectors provides an opportunity for using synchrotron radiation based X-ray diffraction for the determination of preferred crystallite orientation in polycrystalline materials. These measurements are very fast compared to other techniques. Texture is immediately recognized as intensity variations along Debye rings in diffraction images, yet in many cases this information is not used because the quantitative treatment of texture information has not yet been developed into a standard technique. In special cases it is possible to interpret the texture information contained in these intensity variations intuitively. However, diffraction studies focused on the effects of texture on materials properties often require the full orientation distribution function (ODF) which can be obtained from spherical tomography analysis. In cases of high crystal symmetry (cubic and hexagonal) an approximation to the full ODF can be reconstructed from single diffraction images, as is demonstrated for textures in rolled copper and titanium sheets. Combined with area detectors, the reconstruction methods make the measurements fast enough to study orientation changes during phase transformations, recrystallization and deformationin situ, and even in real time, at a wide range of temperature and pressure conditions. The present work focuses on practical aspects of texture measurement and data processing procedures to make the latter available for the growing community of synchrotron users. It reviews previous applications and highlights some opportunities for synchrotron texture analysis based on case studies on different materials.

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Nagem, R. A. P., E. A. L. Martins, V. M. Gonçalves, R. Aparício, and I. Polikarpov. "Crystallization and preliminary X-ray diffraction studies of human catalase." Acta Crystallographica Section D Biological Crystallography 55, no. 9 (September 1, 1999): 1614–15. http://dx.doi.org/10.1107/s0907444999009695.

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The enzyme catalase (H2O2–H2O2 oxidoreductase; E.C. 11.1.6) was purified from haemolysate of human placenta and crystallized using the vapour-diffusion technique. Synchrotron-radiation diffraction data have been collected to 1.76 Å resolution. The enzyme crystallized in the space group P212121, with unit-cell dimensions a = 83.6, b = 139.4, c = 227.5 Å. A molecular-replacement solution of the structure has been obtained using beef liver catalase (PDB code 4blc) as a search model.

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Scarlett, Nicola V. Y., Ian C. Madsen, John S. O. Evans, Alan A. Coelho, Katherine McGregor, Matthew Rowles, Marshall R. Lanyon, and Andrew J. Urban. "Energy-dispersive diffraction studies of inert anodes." Journal of Applied Crystallography 42, no. 3 (May 2, 2009): 502–12. http://dx.doi.org/10.1107/s0021889809008681.

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A tomographic study of electrochemical cells to observe scales formed on inert anodes has been conducted using energy-dispersive synchrotron X-ray diffraction. This study is preparatory to an investigation that will observe this formationin situduring the cells' operation. The purpose of the current work was to determine whether this technique would be appropriate for such a study in terms of its sensitivity and whether the results could be quantified satisfactorily. A method has been developed for the quantitative phase analysis of energy-dispersive data using crystal-structure-based Rietveld refinement. This has been tested with standard materials and found to be comparable in accuracy to results obtained from traditional angular-dispersive diffraction. The lower limits of detection of the method have not been established quantitatively but qualitative differences can be seen between cells that have been cycled at different times. These differences indicate a linear relationship between scale formation and electrolysis time.

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Gu, Qinfen, Helen Brand, and Justin Kimpton. "Battery research using synchrotron powder X-ray diffraction." Acta Crystallographica Section A Foundations and Advances 70, a1 (August 5, 2014): C951. http://dx.doi.org/10.1107/s2053273314090482.

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Research and development of rechargeable batteries is critical to meet the worldwide demand for clean and sustainable energy collection and storage. A vital part of this research is to get clear understanding of how the crystal structures of electrode materials affect the the resulting properties of the batteries. As structural changes in both the anode and cathode materials play an important role in overall battery performance, synchrotron powder X-ray diffraction (PXRD), with high beam flux and resolution, is an extremely useful tool for studying the battery both in-situ and ex-situ. Several simple in-situ cell designs have been designed for synchrotron PXRD measurement. The cell is available for researchers in the field of battery research. The effectiveness and simplicity of the cell design have been demonstrated at Powder Diffraction Beamline at Australian Synchrotron for several user groups. Case studies of analysis of the lithium insertion reaction for Li0.18Sr0.66Ti0.5Nb0.5O3 defect perovskite [1], crystal structure of Li4Ti5O12–xBrx electrode material [2] and LiNi1/3Mn1/3Co1/3O2 (NMC) as a new synthesized cathode material [3] will be discussed, respectively.

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SAKATA, Osami. "Synchrotron X-ray Diffraction Studies of Nanoscale Thin Films and Wires." Nihon Kessho Gakkaishi 55, no. 3 (2013): 171–79. http://dx.doi.org/10.5940/jcrsj.55.171.

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Nagem, R. A. P., K. W. Lucchesi, D. Colau, L. Dumoutier, J. C. Renauld, and I. Polikarpov. "Crystallization and synchrotron X-ray diffraction studies of human interleukin-22." Acta Crystallographica Section D Biological Crystallography 58, no. 3 (February 21, 2002): 529–30. http://dx.doi.org/10.1107/s0907444902001063.

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Ryan, Kate R., Lynn Trahey, John S. Okasinski, Anthony K. Burrell, and Brian J. Ingram. "In situ synchrotron X-ray diffraction studies of lithium oxygen batteries." Journal of Materials Chemistry A 1, no. 23 (2013): 6915. http://dx.doi.org/10.1039/c3ta10361g.

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Tamura, K., M. Inui, I. Nakaso, Y. Oh'ishi, K. Funakoshi, and W. Utsumi. "X-ray diffraction studies of expanded fluid mercury using synchrotron radiation." Journal of Physics: Condensed Matter 10, no. 49 (December 14, 1998): 11405–17. http://dx.doi.org/10.1088/0953-8984/10/49/027.

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Braun, Wolfgang, and Klaus H. Ploog. "In situ studies of semiconductor growth by synchrotron X-ray diffraction." Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 246, no. 1 (May 2006): 50–57. http://dx.doi.org/10.1016/j.nimb.2005.12.009.

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BRAUN, WOLFGANG, and KLAUS H. PLOOG. "IN SITU STUDIES OF EPITAXIAL GROWTH BY SYNCHROTRON X-RAY DIFFRACTION." Surface Review and Letters 13, no. 02n03 (April 2006): 155–66. http://dx.doi.org/10.1142/s0218625x06008256.

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X-rays are ideal to study the structure of crystals due to their weak interaction with matter and in most cases allow a quantitative analysis using kinematical theory. To study the incorporation of atoms during crystal growth and to analyze the kinetics on the crystal surface high primary beam intensities available at synchrotrons are required. Our studies of the molecular beam epitaxy growth of III–V semiconductors reveal that, despite their similarity in crystal structure, the surface kinetics of GaAs (001), InAs (001) and GaSb (001) differ strongly. GaAs shows an unexpectedly large coarsening exponent outside the predicted range of Ostwald ripening models during recovery. GaSb exhibits dramatically different surface morphology variations during growth and recovery. Overgrowth of GaAs by epitaxial MnAs demonstrates the ability of X-ray diffraction to follow an interface as it is buried during heteroepitaxy, which is not possible by reflection high-energy electron diffraction.

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Brown, B., G. F. Clark, C. Dineen, B. J. Isherwood, E. Pantos, K. J. Roberts, and T. Scheffen-Lauenroth. "The application of synchrotron radiation to X-ray multiple-diffraction studies." Journal of Applied Crystallography 22, no. 3 (June 1, 1989): 201–4. http://dx.doi.org/10.1107/s0021889888013925.

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Newsam, J. M., and K. S. Liang. "Synchrotron X-ray diffraction studies of inorganic materials and heterogeneous catalysts." International Reviews in Physical Chemistry 8, no. 4 (October 1989): 289–338. http://dx.doi.org/10.1080/01442358909353232.

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Journal articles on the topic 'Synchrotron Diffraction Studies'

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